Stresses at or above those listed in Maximum Ratings table may cause permanent damage to the device. This is a stress only rating and
operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Also,
due to variations in test equipment, stresses shown above are averages.
ELECTRICAL CHARACTERISTICS
Device Name
Device
Marking
I
PP (A)
(8 x 20
m
s)
V
RWM
(V)
Breakdown Voltage
V
I
R
@ V
RWM
A)
V@ IT (mA)VC (V)IPP (A)
BR
MaxMaxMinNomMaxMinMax
VC @ I
(8 x 20
NSPU5201AZ20121.722.723.7114031.5110
NSPU5221A2
201
22235120
2425261120
33100
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
PP
m
s)
ELECTRICAL CHARACTERISTICS (NSPU5221)
V
Clamp Voltage
CLAMP
24 A IEC61000−4−5 Surge (8/20 ms) from IO to GND, VIN = 0 V before
surge, 25°C
40 A IEC61000−4−5 Surge (8/20 ms) from IO to GND, VIN = 0 V before
surge, 25°C
35 A IEC61000−4−5 Surge (8/20 ms) from IO to GND, VIN = V
before surge, TA = 125°C
DescriptionMinTypMaxUnit
26.828.5V
28.330V
RWM
29.431V
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3
Page 4
NSPU5201, NSPU5221 Series
TYPICAL CHARACTERISTICS
40
35
30
25
20
15
Vpk @ Ipk (V)
10
5
0
Voltage vs. Peak Pulse Current (t
6040200
Ipk (A)
14012010080160
Figure 1. NSPU5021 Positive Clamping
= 8/20 s)
p
100
Peak
Value
40
35
30
25
20
15
Vpk @ Ipk (V)
10
5
0
Figure 2. NSPU5221 Positive Clamping
Voltage vs. Peak Pulse Current (t
tr = rise time to peak value [8 ms]
t
= decay time to half value [20 ms]
f
6040200
Ipk (A)
14012010080160
= 8/20 s)
p
50
Ipp - PEAK PULSE CURRENT - %Ipp
0
Half Value
t
0
r
t
f
TIME (ms)
Figure 3. IEC61000−4−5 8/20 s Pulse
Waveform
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4
Page 5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SCALE 4:1
A
B
E
A3
A
A1
C
SEATING
PLANE
0.10 C
4
2X
E2
0.10 C
5
e1
REFERENCE
2X
2X
6X
NOTE 4
PIN ONE
0.10 C
0.10 C
0.05 C
0.05 C
DETAIL A
6X
L
TOP VIEW
DETAIL B
SIDE VIEW
2X
D2
1
6
e1/2
BOTTOM VIEW
D
UDFN6, 1.8x2, 0.4P
CASE 517CS
ISSUE O
DETAIL B
ALTERNATE
CONSTRUCTION
L1
DETAIL A
ALTERNATE
CONSTRUCTIONS
e/2
e
1
6
e2
SUPPLEMENTAL
BOTTOM VIEW
4
5
DATE 30 APR 2013
MOLD CMPDEXPOSED Cu
L
L
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME
Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED TERMINALS
AND IS MEASURED BETWEEN 0.15 AND 0.30mm
FROM THE TERMINAL TIP.
4. COPLANARITY APPLIES TO THE EXPOSED PAD
AS WELL AS THE TERMINALS.
MILLIMETERS
DIMAMINMAX
0.450.55
A10.000.05
A30.125 REF
b0.150.25
1.80 BSC
D
0.350.55
D2
E
2.00 BSC
0.740.94
E2
e
0.40 BSC
e1
0.80 BSC
e2
0.95 BSC
0.200.40
L
L1
---
0.15
GENERIC
MARKING DIAGRAM*
6X
b
0.05 C
A0.07 C
B
NOTE 3
XX = Specific Device Code
M= Date Code
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
1
XX M
G
RECOMMENDED
MOUNTING FOOTPRINT*
0.95
0.40
PITCH
2X
0.55
6X
0.48
PACKAGE
OUTLINE
6X
0.25
DIMENSIONS: MILLIMETERS
0.40
PITCH
2X
0.94
2.20
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
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