ON Semiconductor NSP4201MR6 User Manual

NSP4201MR6
ESD and Surge Protection Device
Low Clamping Voltage Surge Protection Diode Array
The NSP4201MR6 surge protector is designed to protect high speed
data lines from ESD, EFT, and lightning surges.
Features
Protection for the Following IEC Standards:
IEC 61000−4−2 (ESD) ±30 kV (Contact) IEC 61000−4−5 (Lightning) 25 A (8/20 ms)
Low Clamping Voltage
Low Leakage
UL Flammability Rating of 94 V−0
SZ Prefix for Automotive and Other Applications Requiring Unique
Site and Control Change Requirements; AEC−Q101 Qualified and PPAP Capable
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
Typical Applications
High Speed Communication Line Protection
USB 1.1 and 2.0 Power and Data Line Protection
Digital Video Interface (DVI)
Monitors and Flat Panel Displays
MAXIMUM RATINGS (T
Rating
Peak Power Dissipation 8/20 ms @ T
Operating Junction Temperature Range T Storage Temperature Range T Lead Solder Temperature −
Maximum (10 Seconds) IEC 61000−4−2 Air (ESD)
IEC 61000−4−2 Contact (ESD) IEC 61000−4−4 (5/50 ns) EFT 40 A
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.
1. Non−repetitive current pulse per Figure 1 (Pin 5 to Pin 2)
= 25°C (Note 1)
A
See Application Note AND8308/D for further description of survivability specs.
= 25°C unless otherwise noted)
J
Symbol Value Unit
P
pk
J
stg
T
L
ESD ±30
500 W
−40 to +125 °C
−55 to +150 °C
260 °C
kV
±30
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6
1
TSOP−6
CASE 318G
MARKING DIAGRAM
42 MG
G
42 = Specific Device Code M = Date Code G = Pb−Free Package
(Note: Microdot may be in either location)
*Date Code orientation may vary
depending upon manufacturing location.
PIN CONFIGURATION AND SCHEMATIC
I/O 1
V
N
I/O 3
2
6 I/O
5 V
4 I/O
P
ORDERING INFORMATION
Device Package Shipping
NSP4201MR6T1G TSOP−6
(Pb−Free)
SZNSP4201MR6T1G TSOP−6
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D.
3000 / Tape &
Reel
3000 / Tape &
Reel
© Semiconductor Components Industries, LLC, 2017
June, 2017 − Rev. 1
1 Publication Order Number:
NSP4201MR6/D
NSP4201MR6
ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise noted)
Symbol Parameter
I V
V
RWM
V
V
P
*See Application Note AND8308/D for detailed explanations of
datasheet parameters.
ELECTRICAL CHARACTERISTICS (T
Reverse Working Voltage V Breakdown Voltage V Reverse Leakage Current I Clamping Voltage
= 8/20 ms per Figure 1)
(t
p
Junction Capacitance C Junction Capacitance C
2. Surge protection devices are normally selected according to the working peak reverse voltage (V than the DC or continuous peak operating voltage level.
3. V
Maximum Reverse Peak Pulse Current
PP
Clamping Voltage @ I
C
PP
Working Peak Reverse Voltage
I
Maximum Reverse Leakage Current @ V
R
Breakdown Voltage @ I
BR
I
Test Current
T
I
Forward Current
F
Forward Voltage @ I
F
Peak Power Dissipation
pk
T
F
C Capacitance @ VR = 0 and f = 1.0 MHz
=25°C unless otherwise specified)
J
Parameter
Symbol Conditions Min Typ Max Unit
RWM
V
(Note 2) 5.0 V IT=1 mA, (Note 3) 6.0 V
BR
V
R
C
RWM
IPP = 1 A, Any I/O to GND 8.5 IPP = 5 A, Any I/O to GND 9.0 IPP = 8 A, Any I/O to GND 10 IPP = 25 A, Any I/O to GND 12 VR = 0 V, f=1 MHz between I/O Pins and GND 3.0 5.0 pF
J
VR = 0 V, f=1 MHz between I/O Pins 1.5 3.0 pF
J
is measured at pulse test current IT.
BR
V
VCV
RWM
BR
RWM
Uni−Directional Surge Protection
= 5 V 1.0
I
I
F
I
V
R
F
I
T
I
PP
), which should be equal or greater
RWM
V
mA
V
100
90 80 70 60 50
t
r
PEAK VALUE I
HALF VALUE I
@ 8 ms
RSM
PULSE WIDTH (tP) IS DEFINED AS THAT POINT WHERE THE PEAK CURRENT DECAY = 8 ms
/2 @ 20 ms
RSM
40 30 20
% OF PEAK PULSE CURRENT
10
0
t
P
020406080
t, TIME (ms)
Figure 1. IEC61000−4−5 8/20 ms Pulse Waveform
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20 18 16 14 12 10
I/O−GND
8 6 4
CLAMPING VOLTAGE (V)
2 0
05
10 15 20 25
PEAK PULSE CURRENT (A)
Figure 2. Clamping Voltage vs. Peak Pulse Current
(t
= 8/20 ms per Figure 1)
p
2
30
NSP4201MR6
100
80
60
40
VOLTAGE (V)
20
0
−20
−20 0 20 40 60 80 100 120 140 TIME (ns)
Figure 3. IEC61000−4−2 +8 kV Contact Clamping
Voltage
IEC 61000−4−2 Spec.
Test Volt-
Level
age (kV)
1 2 7.5 4 2 2 4 15 8 4 3 6 22.5 12 6 4 8 30 16 8
First Peak
Current
(A)
Current at
30 ns (A)
Current at
60 ns (A)
20
0
−20
−40
VOLTAGE (V)
−60
−80
−100
−20 0 20 40 60 80 100 120 140 TIME (ns)
Figure 4. IEC61000−4−2 −8 kV Contact Clamping
Voltage
IEC61000−4−2 Waveform
I
peak
100%
90%
I @ 30 ns
I @ 60 ns
Figure 5. IEC61000−4−2 Spec
ESD Gun
Surge Protection
Oscilloscope
50 W
Cable
Figure 6. Diagram of ESD Test Setup
The following is taken from Application Note AND8308/D − Interpretation of Datasheet Parameters for ESD Devices.
ESD Voltage Clamping
For sensitive circuit elements it is important to limit the voltage that an IC will be exposed to during an ESD event to as low a voltage as possible. The ESD clamping voltage is the voltage drop across the ESD protection diode during an ESD event per the IEC61000−4−2 waveform. Since the IEC61000−4−2 was written as a pass/fail spec for larger
10%
tP = 0.7 ns to 1 ns
50 W
systems such as cell phones or laptop computers it is not clearly defined in the spec how to specify a clamping voltage at the device level. ON Semiconductor has developed a way to examine the entire voltage waveform across the ESD protection diode over the time domain of an ESD pulse in the form of an oscilloscope screenshot, which can be found on the datasheets for all ESD protection diodes. For more information on how ON Semiconductor creates these screenshots and how to interpret them please refer to AND8307/D.
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3
TYPICAL PERFORMANCE CURVES
5.0
5
PEAK POWER DISSIPATION (%)
(TJ = 25°C unless otherwise noted)
100
90
80
70
60
50
40
30
20
10
0
0 25 50 75 100 125 150 175 200
T
, AMBIENT TEMPERATURE (°C)
A
Figure 7. Pulse Derating Curve
NSP4201MR6
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
JUNCTION CAPACITANCE (pF)
0.5
0.0 01
Figure 8. Junction Capacitance vs Reverse Voltage
I/O−GND
I/O−I/O
234
, REVERSE VOLTAGE (V)
V
BR
Figure 9. RF Insertion Loss
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4
NSP4201MR6
TYPICAL APPLICATIONS
RJ45
Connector
PHY Ethernet (10/100)
TX+
TX−
RX+
RX−
V
CC
GND
Coupling
Transformers
NSP4201MR6
N/C N/C
Figure 10. Protection for Ethernet 10/100 (Differential mode)
R1
RTIP
R3
RRING
V
CC
R2
TX+
TX−
RX+
RX−
T1
T1/E1
TRANCEIVER
TTIP
TRING
NSP4201MR6
R4
R5
T2
Figure 11. TI/E1 Interface Protection
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5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
1
SCALE 2:1
D
456
E1
NOTE 5
0.05
A1
23
1
e
E
b
A
DETAIL Z
c
CASE 318G02
H
L
M
DETAIL Z
TSOP−6
ISSUE V
L2
GAUGE
PLANE
SEATING
C
PLANE
DATE 12 JUN 2012
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD FINISH. MINIMUM LEAD THICKNESS IS THE MINIMUM THICKNESS OF BASE MATERIAL.
4. DIMENSIONS D AND E1 DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR GATE BURRS. MOLD FLASH, PROTRUSIONS, OR GATE BURRS SHALL NOT EXCEED 0.15 PER SIDE. DIMENSIONS D AND E1 ARE DETERMINED AT DATUM H.
5. PIN ONE INDICATOR MUST BE LOCATED IN THE INDICATED ZONE.
DIMAMIN NOM MAX
A1 0.01 0.06 0.10
b 0.25 0.38 0.50 c 0.10 0.18 0.26
D 2.90 3.00 3.10
E 2.50 2.75 3.00
E1
e 0.85 0.95 1.05 L 0.20 0.40 0.60
L2
M
MILLIMETERS
0.90 1.00 1.10
1.30 1.50 1.70
0.25 BSC
0° 10°
STYLE 1:
PIN 1. DRAIN
2. DRAIN
3. GATE
4. SOURCE
5. DRAIN
6. DRAIN
STYLE 7:
PIN 1. COLLECTOR
2. COLLECTOR
3. BASE
4. N/C
5. COLLECTOR
6. EMITTER
STYLE 13:
PIN 1. GATE 1
2. SOURCE 2
3. GATE 2
4. DRAIN 2
5. SOURCE 1
6. DRAIN 1
STYLE 2:
PIN 1. EMITTER 2
2. BASE 1
3. COLLECTOR 1
4. EMITTER 1
5. BASE 2
6. COLLECTOR 2
STYLE 8:
PIN 1. Vbus
2. D(in)
3. D(in)+
4. D(out)+
5. D(out)
6. GND
STYLE 14:
PIN 1. ANODE
2. SOURCE
3. GATE
4. CATHODE/DRAIN
5. CATHODE/DRAIN
6. CATHODE/DRAIN
STYLE 3:
PIN 1. ENABLE
2. N/C
3. R BOOST
4. Vz
5. V in
6. V out
STYLE 9:
PIN 1. LOW VOLTAGE GATE
2. DRAIN
3. SOURCE
4. DRAIN
5. DRAIN
6. HIGH VOLTAGE GATE
STYLE 15:
PIN 1. ANODE
2. SOURCE
3. GATE
4. DRAIN
5. N/C
6. CATHODE
RECOMMENDED
SOLDERING FOOTPRINT*
6X
0.60
3.20
DIMENSIONS: MILLIMETERS
*For additional information on our PbFree strategy and soldering
details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
98ASB14888C
TSOP−6
6X
0.95
0.95 PITCH
STYLE 4:
PIN 1. N/C
2. V in
3. NOT USED
4. GROUND
5. ENABLE
6. LOAD
STYLE 10:
PIN 1. D(OUT)+
2. GND
3. D(OUT)
4. D(IN)
5. VBUS
6. D(IN)+
STYLE 16:
PIN 1. ANODE/CATHODE
2. BASE
3. EMITTER
4. COLLECTOR
5. ANODE
6. CATHODE
STYLE 5:
PIN 1. EMITTER 2
2. BASE 2
3. COLLECTOR 1
4. EMITTER 1
5. BASE 1
6. COLLECTOR 2
STYLE 11:
PIN 1. SOURCE 1
2. DRAIN 2
3. DRAIN 2
4. SOURCE 2
5. GATE 1
6. DRAIN 1/GATE 2
STYLE 17:
PIN 1. EMITTER
2. BASE
3. ANODE/CATHODE
4. ANODE
5. CATHODE
6. COLLECTOR
STYLE 6:
PIN 1. COLLECTOR
2. COLLECTOR
3. BASE
4. EMITTER
5. COLLECTOR
6. COLLECTOR
STYLE 12:
PIN 1. I/O
2. GROUND
3. I/O
4. I/O
5. VCC
6. I/O
GENERIC
MARKING DIAGRAM*
XXXAYWG
G
1
XXX = Specific Device Code A =Assembly Location Y = Year
XXX = Specific Device Code M = Date Code
G = Pb−Free Package W = Work Week G = Pb−Free Package
*This information is generic. Please refer to device data sheet
for actual part marking. PbFree indicator, “G” or microdot “ G”, may or may not be present.
Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
XXX MG
G
1
STANDARDIC
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