Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
1. Non−repetitive current pulse per Figure 1 (Pin 5 to Pin 2)
= 25°C (Note 1)
A
See Application Note AND8308/D for further description of
survivability specs.
= 25°C unless otherwise noted)
J
SymbolValueUnit
P
pk
J
stg
T
L
ESD±30
500W
−40 to +125°C
−55 to +150°C
260°C
kV
±30
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6
1
TSOP−6
CASE 318G
MARKING DIAGRAM
42 MG
G
42 = Specific Device Code
M = Date Code
G = Pb−Free Package
(Note: Microdot may be in either location)
*Date Code orientation may vary
depending upon manufacturing location.
PIN CONFIGURATION AND SCHEMATIC
I/O 1
V
N
I/O 3
2
6 I/O
5 V
4 I/O
P
ORDERING INFORMATION
DevicePackageShipping
NSP4201MR6T1GTSOP−6
(Pb−Free)
SZNSP4201MR6T1G TSOP−6
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
*See Application Note AND8308/D for detailed explanations of
datasheet parameters.
ELECTRICAL CHARACTERISTICS (T
Reverse Working VoltageV
Breakdown VoltageV
Reverse Leakage CurrentI
Clamping Voltage
= 8/20 ms per Figure 1)
(t
p
Junction CapacitanceC
Junction CapacitanceC
2. Surge protection devices are normally selected according to the working peak reverse voltage (V
than the DC or continuous peak operating voltage level.
3. V
Maximum Reverse Peak Pulse Current
PP
Clamping Voltage @ I
C
PP
Working Peak Reverse Voltage
I
Maximum Reverse Leakage Current @ V
R
Breakdown Voltage @ I
BR
I
Test Current
T
I
Forward Current
F
Forward Voltage @ I
F
Peak Power Dissipation
pk
T
F
CCapacitance @ VR = 0 and f = 1.0 MHz
=25°C unless otherwise specified)
J
Parameter
SymbolConditionsMinTypMaxUnit
RWM
V
(Note 2)5.0V
IT=1 mA, (Note 3)6.0V
BR
V
R
C
RWM
IPP = 1 A, Any I/O to GND8.5
IPP = 5 A, Any I/O to GND9.0
IPP = 8 A, Any I/O to GND10
IPP = 25 A, Any I/O to GND12
VR = 0 V, f=1 MHz between I/O Pins and GND3.05.0pF
J
VR = 0 V, f=1 MHz between I/O Pins1.53.0pF
J
is measured at pulse test current IT.
BR
V
VCV
RWM
BR
RWM
Uni−Directional Surge Protection
= 5 V1.0
I
I
F
I
V
R
F
I
T
I
PP
), which should be equal or greater
RWM
V
mA
V
100
90
80
70
60
50
t
r
PEAK VALUE I
HALF VALUE I
@ 8 ms
RSM
PULSE WIDTH (tP) IS DEFINED
AS THAT POINT WHERE THE
PEAK CURRENT DECAY = 8 ms
/2 @ 20 ms
RSM
40
30
20
% OF PEAK PULSE CURRENT
10
0
t
P
020406080
t, TIME (ms)
Figure 1. IEC61000−4−5 8/20 ms Pulse Waveform
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20
18
16
14
12
10
I/O−GND
8
6
4
CLAMPING VOLTAGE (V)
2
0
05
10152025
PEAK PULSE CURRENT (A)
Figure 2. Clamping Voltage vs. Peak Pulse Current
(t
= 8/20 ms per Figure 1)
p
2
30
NSP4201MR6
100
80
60
40
VOLTAGE (V)
20
0
−20
−20020406080100120140
TIME (ns)
Figure 3. IEC61000−4−2 +8 kV Contact Clamping
Voltage
IEC 61000−4−2 Spec.
Test Volt-
Level
age (kV)
127.542
241584
3622.5126
4830168
First Peak
Current
(A)
Current at
30 ns (A)
Current at
60 ns (A)
20
0
−20
−40
VOLTAGE (V)
−60
−80
−100
−20020406080100120140
TIME (ns)
Figure 4. IEC61000−4−2 −8 kV Contact Clamping
Voltage
IEC61000−4−2 Waveform
I
peak
100%
90%
I @ 30 ns
I @ 60 ns
Figure 5. IEC61000−4−2 Spec
ESD Gun
Surge Protection
Oscilloscope
50 W
Cable
Figure 6. Diagram of ESD Test Setup
The following is taken from Application Note
AND8308/D − Interpretation of Datasheet Parameters
for ESD Devices.
ESD Voltage Clamping
For sensitive circuit elements it is important to limit the
voltage that an IC will be exposed to during an ESD event
to as low a voltage as possible. The ESD clamping voltage
is the voltage drop across the ESD protection diode during
an ESD event per the IEC61000−4−2 waveform. Since the
IEC61000−4−2 was written as a pass/fail spec for larger
10%
tP = 0.7 ns to 1 ns
50 W
systems such as cell phones or laptop computers it is not
clearly defined in the spec how to specify a clamping voltage
at the device level. ON Semiconductor has developed a way
to examine the entire voltage waveform across the ESD
protection diode over the time domain of an ESD pulse in the
form of an oscilloscope screenshot, which can be found on
the datasheets for all ESD protection diodes. For more
information on how ON Semiconductor creates these
screenshots and how to interpret them please refer to
AND8307/D.
www.onsemi.com
3
TYPICAL PERFORMANCE CURVES
5.0
5
PEAK POWER DISSIPATION (%)
(TJ = 25°C unless otherwise noted)
100
90
80
70
60
50
40
30
20
10
0
0255075100125150175200
T
, AMBIENT TEMPERATURE (°C)
A
Figure 7. Pulse Derating Curve
NSP4201MR6
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
JUNCTION CAPACITANCE (pF)
0.5
0.0
01
Figure 8. Junction Capacitance vs Reverse Voltage
I/O−GND
I/O−I/O
234
, REVERSE VOLTAGE (V)
V
BR
Figure 9. RF Insertion Loss
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4
NSP4201MR6
TYPICAL APPLICATIONS
RJ45
Connector
PHY
Ethernet
(10/100)
TX+
TX−
RX+
RX−
V
CC
GND
Coupling
Transformers
NSP4201MR6
N/CN/C
Figure 10. Protection for Ethernet 10/100 (Differential mode)
R1
RTIP
R3
RRING
V
CC
R2
TX+
TX−
RX+
RX−
T1
T1/E1
TRANCEIVER
TTIP
TRING
NSP4201MR6
R4
R5
T2
Figure 11. TI/E1 Interface Protection
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5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
1
SCALE 2:1
D
456
E1
NOTE 5
0.05
A1
23
1
e
E
b
A
DETAIL Z
c
CASE 318G−02
H
L
M
DETAIL Z
TSOP−6
ISSUE V
L2
GAUGE
PLANE
SEATING
C
PLANE
DATE 12 JUN 2012
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD FINISH. MINIMUM
LEAD THICKNESS IS THE MINIMUM THICKNESS OF BASE MATERIAL.
4. DIMENSIONS D AND E1 DO NOT INCLUDE MOLD FLASH,
PROTRUSIONS, OR GATE BURRS. MOLD FLASH, PROTRUSIONS, OR
GATE BURRS SHALL NOT EXCEED 0.15 PER SIDE. DIMENSIONS D
AND E1 ARE DETERMINED AT DATUM H.
5. PIN ONE INDICATOR MUST BE LOCATED IN THE INDICATED ZONE.
DIMAMINNOMMAX
A10.010.060.10
b0.250.380.50
c0.100.180.26
D2.903.003.10
E2.502.753.00
E1
e0.850.951.05
L0.200.400.60
L2
M
MILLIMETERS
0.901.001.10
1.301.501.70
0.25 BSC
0°10°
−
STYLE 1:
PIN 1. DRAIN
2. DRAIN
3. GATE
4. SOURCE
5. DRAIN
6. DRAIN
STYLE 7:
PIN 1. COLLECTOR
2. COLLECTOR
3. BASE
4. N/C
5. COLLECTOR
6. EMITTER
STYLE 13:
PIN 1. GATE 1
2. SOURCE 2
3. GATE 2
4. DRAIN 2
5. SOURCE 1
6. DRAIN 1
STYLE 2:
PIN 1. EMITTER 2
2. BASE 1
3. COLLECTOR 1
4. EMITTER 1
5. BASE 2
6. COLLECTOR 2
STYLE 8:
PIN 1. Vbus
2. D(in)
3. D(in)+
4. D(out)+
5. D(out)
6. GND
STYLE 14:
PIN 1. ANODE
2. SOURCE
3. GATE
4. CATHODE/DRAIN
5. CATHODE/DRAIN
6. CATHODE/DRAIN
STYLE 3:
PIN 1. ENABLE
2. N/C
3. R BOOST
4. Vz
5. V in
6. V out
STYLE 9:
PIN 1. LOW VOLTAGE GATE
2. DRAIN
3. SOURCE
4. DRAIN
5. DRAIN
6. HIGH VOLTAGE GATE
STYLE 15:
PIN 1. ANODE
2. SOURCE
3. GATE
4. DRAIN
5. N/C
6. CATHODE
RECOMMENDED
SOLDERING FOOTPRINT*
6X
0.60
3.20
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
98ASB14888C
TSOP−6
6X
0.95
0.95
PITCH
STYLE 4:
PIN 1. N/C
2. V in
3. NOT USED
4. GROUND
5. ENABLE
6. LOAD
STYLE 10:
PIN 1. D(OUT)+
2. GND
3. D(OUT)−
4. D(IN)−
5. VBUS
6. D(IN)+
STYLE 16:
PIN 1. ANODE/CATHODE
2. BASE
3. EMITTER
4. COLLECTOR
5. ANODE
6. CATHODE
STYLE 5:
PIN 1. EMITTER 2
2. BASE 2
3. COLLECTOR 1
4. EMITTER 1
5. BASE 1
6. COLLECTOR 2
STYLE 11:
PIN 1. SOURCE 1
2. DRAIN 2
3. DRAIN 2
4. SOURCE 2
5. GATE 1
6. DRAIN 1/GATE 2
STYLE 17:
PIN 1. EMITTER
2. BASE
3. ANODE/CATHODE
4. ANODE
5. CATHODE
6. COLLECTOR
STYLE 6:
PIN 1. COLLECTOR
2. COLLECTOR
3. BASE
4. EMITTER
5. COLLECTOR
6. COLLECTOR
STYLE 12:
PIN 1. I/O
2. GROUND
3. I/O
4. I/O
5. VCC
6. I/O
GENERIC
MARKING DIAGRAM*
XXXAYWG
G
1
XXX = Specific Device Code
A=Assembly Location
Y= Year
XXX = Specific Device Code
M= Date Code
G= Pb−Free Package
W= Work Week
G= Pb−Free Package
*This information is generic. Please refer to device data sheet
for actual part marking. Pb−Free indicator, “G” or microdot “
G”, may or may not be present.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
XXX MG
G
1
STANDARDIC
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