ON Semiconductor NCV7450V1GEVB User Manual

NCV7450V1GEVB
NCV7450 System Basis Chip Evaluation Board User's Manual
This document describes the evaluation board for the ON Semiconductor system basis chip (SBC) NCV7450, which contains a CANFD transceiver, 5 V / 250 mA LDO regulator and HS driver. The board provides basic connections for a device evaluation.
Evaluation Board Features
Onerow pin header providing access to all the device pins, enables
easy insertion of the evaluation board into a more complex application setup
Separated supply path for VS1 and VS2
Standard CAN termination
Position for optional ESD protection
LED for RSTN signal activity indication
Jumpers for enable signals
SCHEMATIC
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EVAL BOARD USER’S MANUAL
Figure 1. NCV7450V1GEVB Evaluation Board
© Semiconductor Components Industries, LLC, 2020
June, 2020 Rev. 0
Figure 2. NCV7450 Evaluation Board Schematic
1 Publication Order Number:
EVBUM2737/D
NCV7450V1GEVB
Table 1. ABSOLUTE MAXIMUM RATINGS
Rating Pins Min Max Unit
Battery supply voltage Vbat1, Vbat2 40 40 V
LDO Regulator output voltage VR1 0.3 6 or VS1 + 0.5 V
Digital inputs/outputs voltage TxDC, RxDC, EN_WD, EN_CAN,
EN_HS, HS_DIAG, WDI, RSTN
CAN bus line voltage CANH, CANL 40 40 V
HS Driver output voltage HS
with Cbuf2
without Cbuf2
NCV7450 junction temperature 40 +150
Board temperature 40 +125
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.
0.3 VR1 + 0.3 V V
0.3
0.3
(whichever is lower)
Vbat2
40
Table 2. RECOMMENDED BOARD OPERATING CONDITIONS
Rating Pins Min Max Unit
Battery supply voltage Vbat1, Vbat2 6 18 V
LDO Regulator output current (thermally limited)
Digital inputs/outputs voltage TxDC, RxDC, EN_WD, EN_CAN,
EN_HS, HS_DIAG, WDI, RSTN
CAN bus line voltage CANH, CANL 0 5 V
HS Driver output voltage HS 0 VS2 V
HS Driver output current HS 0 1.7 A
NCV7450 junction temperature 40 +150
Board temperature 40 +125
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability.
VR1 0.1 250 mA
0 5 V
V
V V
°C
°C
°C
°C
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