The NCN4555 is a level shifter analog circuit designed to translate
the voltages between a SIM Card and an external microcontroller or
MPU. A built−in LDO−type DC−DC converter makes the NCN4555
useable to drive 1.8 V and 3.0 V SIM card. The device fulfills the
ISO7816−3 smart card interface standard as well as GSM 11.11 and
related (11.12 and 11.18) and 3G mobile requirements (IMT−2000/3G
UICC standard). With the STOP
be activated making the battery life longer. The Card power supply
voltage (SIM_V
Features
) is selected using a single pin (MOD_VCC).
CC
• Supports 1.8 V or 3.0 V Operating SIM Card
• The LDO is able to Supply More than 50 mA under 1.8 V and 3.0 V
• Built−in Pullup Resistor for I/O Pin in Both Directions
• All Pins are Fully ESD Protected According to ISO−7816
Specifications – ESD Protection on SIM Pins in Excess of 7 kV
(Human Body Model)
• Supports up to More than 5 MHz Clock
• Low−Profile 3x3 QFN−16 Package
• These are Pb−Free Devices*
Typical Applications
• SIM Card Interface Circuit for 2G, 2.5G and 3G Mobile Phones
• Identification Module
• Smart Card Readers
• Wireless PC Cards
1.6 V to 5.5 V 2.7 V to 5.5 V
0.1mF0.1mF
V
BB
GND
pin a low current shutdown mode can
5
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MARKING
DIAGRAM
16
1
QFN−16
MN SUFFIX
1
(Note: Microdot may be in either location)
CASE 488AK
A= Assembly Location
L= Wafer Lot
Y= Year
W = Work Week
G= Pb−Free Package
NCN
4555
ALYWG
G
ORDERING INFORMATION
DevicePackageShipping
NCN4555MNGQFN−16
(Pb−Free)
NCN4555MNR2GQFN−16
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
123 Units / Rail
3000/Tape & Reel
†
3
V
DD
1
STOP
2
14
13
15
MOD_V
RST
CLK
I/O
P3
P2
P1
P0
MPU or Microcontroller
SIM Card
Detect
GND
CC
GND
10
SIM_V
SIM_RST
NCN4555
SIM_CLK
SIM_I/O
CC
1
2
3
4
1mF
V
CC
RST
CLK
C4
DETDET
GND
7
9
11
8
GND
I/O
C8
5
6
7
8
Figure 1. Typical Interface Application
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
INPUTThe signal present on this pin programs the SIM_VCC value:
POWERThis pin is connected to the system controller power supply. It configures the level shifter input
4NCNo Connect
5V
BAT
POWERDC−DC converter supply input. The input voltage ranges from 2.7V up to 5.5V. This pin has to be
6NCNo Connect
7SIM_V
CC
POWERThis pin is connected to the SIM card power supply pin. An internal LDO converter is
8SIM_I/OINPUT/
OUTPUT
9SIM_RSTOUTPUTThis pin is connected to the RESET pin of the card connector. A level translator adapts the
10GNDGROUNDThis pin is the GROUND reference for the integrated circuit and associated signals. Care must be
11SIM_CLKOUTPUTThis pin is connected to the CLOCK pin of the card connector. The CLOCK (CLK) signal comes
12NCNo Connect
13CLKINPUTThe clock signal, coming from the external controller, must have a Duty Cycle within the Min/Max
14RSTINPUTThe RESET signal present at this pin is connected to the SIM card through the internal level
15I/OINPUT/
OUTPUT
16NCNo Connect
STOP
= Low ³ Low current shutdown mode activated
STOP
= High ³ Normal Operation
A Low level on this pin resets the SIM interface, switching off the SIM_V
MOD_V
MOD_V
= Low ³ SIM_VCC = 1.8 V
CC
= High ³ SIM_V
CC
CC
= 3 V
CC
.
stage to accept the signals coming from the microprocessor. A 0.1 mF capacitor shall be used to
bypass the power supply voltage. When V
NCN4555 comes into a shutdown mode.
is below 1.1 V typical the SIM_VCC is disabled. The
DD
bypass by a 0.1 mF capacitor.
programmable by the external MPU to supply either 1.8 V or 3.0 V output voltage. An external
1.0 mF minimum ceramic capacitor recommended must be connected across SIM_V
During a normal operation, the SIM_VCC voltage can be set to 1.8 V followed by a 3.0 V value, or
and GND.
CC
can start directly to any of these two values.
This pin handles the connection to the serial I/O of the card connector. A bidirectional level
translator adapts the serial I/O signal between the card and the micro controller. A 14 kW (typical)
pullup resistor provides a High impedance state for the SIM card I/O link.
external Reset (RST) signal to the SIM card.
taken to avoid voltage spikes when the device operates in a normal operation.
from the external clock generator, the internal level shifter being used to adapt the voltage defined
for the SIM_V
CC
.
values defined by the specification (typically 50%). The built−in level shifter translates the input
signal to the external SIM card CLK input.
shifter which translates the level according to the SIM_V
programmed value.
CC
This pin is connected to an external microcontroller or cellular phone management unit. A
bidirectional level translator adapts the serial I/O signal between the smart card and the external
controller. A built−in constant 18 kW (typical) resistor provides a high impedance state when not
activated.
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3
NCN4555
ATTRIBUTES
CharacteristicsValues
ESD protection
HBM, SIM card pins (7, 8, 9, 10 & 11) (Note 1)
HBM, All other pins (Note 1)
MM, SIM card pins (7, 8, 9, 10 & 11) (Note 2)
MM, All other pins (Note 2)
CDM, SIM card pins (7, 8, 9, 10 & 11) (Note 3)
CDM , All other pins (Note 3)
Moisture sensitivity (Note 4) QFN−16Level 1
Flammability RatingOxygen Index: 28 to 34UL 94 V−0 @ 0.125 in
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. Human Body Model, R =1500 W, C = 100 pF.
2. Machine Model.
3. CDM, Charged Device Model.
4. For additional information, see Application Note AND8003/D.
MAXIMUM RATINGS(Note 5)
Rating
LDO Power Supply VoltageV
Power Supply from Microcontroller SideV
External Card Power SupplySIM_V
Digital Input PinsV
Digital Output PinsV
SIM card Output PinsV
QFN−16 Low Profile package
Power Dissipation @ T
Thermal Resistance Junction−to−Air
= + 85°C
A
Operating Ambient Temperature RangeT
Operating Junction Temperature RangeT
Maximum Junction TemperatureT
Storage Temperature RangeT
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
5. Maximum electrical ratings are defined as those values beyond which damage to the device may occur at T
SymbolValueUnit
BAT
DD
CC
in
I
in
out
I
out
out
I
out
P
D
R
q
JA
A
J
Jmax
stg
> 7 kV
> 2 kV
> 600 V
> 200 V
> 2 kV
> 600 V
−0.5 ≤ V
≤ 6V
BAT
−0.5 ≤ VDD ≤ 6V
−0.5 ≤ SIM_VCC ≤ 6V
−0.5 ≤ Vin ≤V
but < 6.0
DD
+ 0.5
±5
−0.5 ≤ V
≤ VDD + 0.5
out
but < 6.0
±10
−0.5 ≤ V
≤ SIM_VCC + 0.5
out
but < 6.0
15 (internally limited)
440
90
−40 to +85°C
−40 to +125°C
+125°C
−65 to + 150°C
= +25°C
A
V
mA
V
mA
V
mA
mW
°C/W
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4
NCN4555
POWER SUPPLY SECTION (−40°C to +85°C)
Pin
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
6. As long as V
7. As long as V
8. Guaranteed by design over the operating temperature range specified.
SymbolRatingMinTypMaxUnit
5V
5I
5I
3V
3I
3I
3V
BAT
VBAT
VBAT_SD
DD
VDD
VDD_SD
DD
7SIM_V
7I
SIM_VCC_SC
Power Supply2.75.5V
Operating current – ICC = 0 mA (Note 6)2230
Shutdown current – STOP= Low (Note 7)3.0
Operating Voltage1.65.5V
Operating Current – f
= 1 MHz (Note 8)7.012
CLK
Shutdown Current – STOP = Low1.0
Undervoltage Lockout0.61.5V
MOD_VCC = High, V
CC
MOD_V
MOD_VCC = Low, V
= High, V
CC
= 3.0 V, I
BAT
= 3.3 V to 5.5 V, I
BAT
= 2.7 V to 5.5 V, I
BAT
SIM_VCC
= 50 mA
SIM_VCC
SIM_VCC
= 0 mA to 50 mA
= 0 mA to 50 mA
2.8
1.7
2.8
3.0
1.8
Short –Circuit Current – SIM_VCC shorted to ground , TA=25°C175mA
3.2
1.9
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
BAT
BAT
– V
– V
2.5 V. For V
v
DD
2.5 V.
v
DD
– VDD > 2.5 V the maximum value increases up to 35 mA (typical being in the +25 mA range).
BAT
mA
mA
mA
mA
V
V
V
DIGITAL INPUT/OUTPUT SECTION CLOCK, RESET, I/O, STOP, MOD_V
CC
PinSymbolRatingMinTypMaxUnit
1,2, 13,
14, 15
13, 14V
1, 2V
15V
15R
V
IIH & I
IH
V
IL
IH
V
IL
OH_I/O
V
OL_I/O
I
IH
I
IL
pu_I/O
Input Voltage Range (STOP, MOD_VCC, RST, CLK, I/O)
in
Input Current (STOP
IL
, MOD_VCC, RST, CLK)
High Level Input Voltage (RST, CLK)
Low Level Input Voltage (RST, CLK)
High Level Input Voltage (STOP, MOD_VCC)
Low Level Input Voltage (STOP
, MOD_VCC)
High Level Output Voltage (SIM_I/O = SIM_VCC, I
Low Level Output Voltage (SIM_I/O = 0 V, I
High Level Input Current (I/O)
OH_I/O
= −20 mA)
OH_I/O
= 200 mA)
0
−100
0.7 * V
(Note 9)
0.7 * V
(Note 9)
0
0.7 * V
0
−20
DD
DD
DD
Low Level Input Current (I/O)
I/0 Pullup Resistor121824
V
100
V
0.4
V
0.4
V
0.4
20
1.0
DD
DD
DD
DD
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
9. If 1.6 V ≤ V
≤ 1.8 V then V
DD
IHmin
= 1.26 V.
V
nA
V
V
V
V
V
V
mA
kW
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5
SIM INTERFACE SECTION (Note 10)
Pin
SymbolRatingMinTypMaxUnit
9SIM_RSTSIM_VCC = +3.0 V (MOD_VCC = High)
Output RESET V
Output RESET V
Output RESET Rise Time @ Cout = 30 pF
OH
OL
@ I
@ I
Output RESET Fall Time @ Cout = 30 pF
sim_rst
sim_rst
NCN4555
= −20 mA
= +200 mA
0.9 * SIM_V
0
CC
SIM_V
0.4
1
1
CC
V
V
ms
ms
SIM_V
= +1.8 V (MOD_VCC = Low)
CC
Output RESET V
Output RESET V
Output RESET Rise Time @ Cout = 30 pF
OH
OL
@ I
@ I
sim_rst
sim_rst
= −20 mA
= +200 mA
Output RESET Fall Time @ Cout = 30 pF
0.9 * SIM_V
0
CC
SIM_V
0.4
1
1
CC
11SIM_CLKSIM_VCC = +3.0 V (MOD_VCC = High)
SIM_V
Output Duty Cycle
Max Output Frequency
Output V
Output V
Output SIM_CLK Rise Time @ Cout = 30 pF
OH
OL
@ I
@ I
sim_clk
sim_clk
= −20 mA
= +200 mA
Output SIM_CLK Fall Time @ Cout = 30 pF
= +1.8 V (MOD_VCC = Low)
CC
Output Duty Cycle
Max Output Frequency
Output V
Output V
Output SIM_CLK Rise Time @ Cout = 30 pF
OH
OL
@ I
@ I
sim_clk
sim_clk
= −20 mA
= +200 mA
Output SIM_CLK Fall Time @ Cout = 30 pF
40
5
0.9 * SIM_V
0
40
5
0.9 * SIM_V
0
CC
CC
60
SIM_V
0.4
18
18
60
SIM_V
0.4
18
18
MHz
CC
MHz
CC
8SIM_I/OSIM_VCC = +3.0 V (MOD_VCC = High)
8R
pu_SIM_I/O
Output V
Output VOL @ I
SIM_I/O Rise Time @ C
OH
@ I
SIM_IO
SIM_IO
SIM_I/O Fall Time @ C
SIM_V
Output V
Output VOL @ I
SIM_I/O Rise Time @ C
= +1.8 V (MOD_VCC = High)
CC
@ I
OH
SIM_IO
SIM_IO
SIM_I/O Fall Time @ C
= −20 mA, V
= +1 mA, V
= 30 pF
out
= 30 pF
out
= −20 mA, V
= +1.0 mA, V
= 30 pF
out
= 30 pF
out
I/O
I/O
I/O
= V
= 0 V
=V
= 0 V
I/O
DD
DD
0.8 * SIM_V
0
0.8 * SIM_V
0
CC
CC
Card I/O Pullup Resistor101418
SIM_V
0.4
1
1
SIM_V
0.3
1
1
CC
CC
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
10.All the dynamic specifications (AC specifications) are guaranteed by design over the operating temperature range.
V
V
ms
ms
%
V
V
ns
ns
%
V
V
ns
ns
V
V
ms
ms
V
V
ms
ms
kW
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6
NCN4555
TYPICAL CHARACTERISTICS
100
V
= 5.5 V
V
BAT
BAT
= 2.7 V
90
80
70
IVCC_SC_1.8 V (mA)
60
50
−50−30−101030507090
TEMPERATURE (°C)
Figure 4. Short Circuit Current IVCC_SC vs
Temperature at SIM_V
30
V
= 3.3 V
V
BAT
BAT
= 5.5 V
25
20
= 1.8 V (MOD_VCC = LOW)
CC
100
V
= 5.5 V
90
80
70
IVCC_SC_3.0 V (mA)
60
50
−50−30−101030507090
BAT
V
= 3.3 V
BAT
TEMPERATURE (°C)
Figure 5. Short Circuit Current IVCC_SC vs
Temperature at SIM_V
30
25
20
= 3.0 V (MOD_VCC = HIGH)
CC
V
= 2.7 V
BAT
V
= 5.5 V
BAT
IVCC_SC_3.0 V (mA)
15
10
−50−30−101030507090
TEMPERATURE (°C)
Figure 6. I
vs temperature at 3.0 V
BAT
IVCC_SC_1.8 V (mA)
15
10
−50−30−101030507090
TEMPERATURE (°C)
Figure 7. IV
vs Temperature at 1.8 V
BAT
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7
NCN4555
APPLICATION INFORMATION
CARD SUPPLY CONVERTER
The NCN4555 interface DC−DC converter is a
Low Dropout Voltage Regulator capable of suppling a
current in excess of 50 mA under 1.8 V or 3.0 V. This device
features a very low quiescent current typically lower than
25 mA (Figure 6 and 7). MOD_V
is a select input
CC
allowing a logic level signal to select a regulated voltage of
1.8 V (MOD_V
= LOW) or 3.0 V (MOD_VCC = HIGH).
CC
Additionally, the NCN4555 has a shutdown input allowing
it to turn off or turn on the regulator output. The shutdown
mode power consumption is typically in the range of a few
tens of nA (30 nA Typical). Figure 8 shows a simplified
view of the NCN4555 voltage regulator. The SIM_V
CC
output is internally current limited and protected against
short circuits. The short−circuit current IV
over the temperature and SIM_V
. It varies with V
CC
is constant
CC
BAT
typically in the range of 60 mA to 90 mA (Figure 4 and 5).
V
BAT
I
Q1
lim
In order to guarantee a stable and satisfying operating of
the LDO the SIM_V
output will be connected to a 1.0 mF
CC
bypass ceramic capacitor to the ground. At the input, V
will be bypassed to the ground with a 0.1 mF ceramic
capacitor.
LEVEL SHIFTERS
The level shifters accommodate the voltage difference
that might exist between the microcontroller and the smart
card. The RESET and CLOCK level shifters are
monodirectional and feature both the same architecture.
The bidirectional I/O line provides a way to automatically
adapt the voltage difference between the MCU and the SIM
card in both directions. In addition with the pullup resistor,
an active pullup circuit (Figure 8, Q1 and Q2) provides a fast
charge of the stray capacitance, yielding a rise time fully
within the ISO7816 specifications.
SIM_V
CC
R1
−
BAT
CIN = 0.1 mF
STOP
V
DD
+
+
V
REF
R2
GND
Figure 8. Simplified Block Diagram of the LDO Voltage Regulator
Q1
18 k14 k
200 ns200 ns
GND
Q2
Q3
C
OUT
SIM_V
SIM_I/OI/O
= 1.0 mF
MOD_V
CC
CC
LOGICIO/CONTROL
Figure 9. Basic I/O Line Interface
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8
GND
NCN4555
The typical waveform provided in Figure 10 shows how
the accelerator operates. During the first 200 ns (typical),
the slope of the rise time is solely a function of the pullup
resistor associated with the stray capacitance. During this
period, the PMOS devices are not activated since the input
voltage is below their V
crosses the V
, the opposite one shot is activated,
gsth
threshold. When the input slope
gs
providing a low impedance to charge the capacitance, thus
increasing the rise time as depicted in Figure 10. The same
mechanism applies for the opposite side of the line to make
sure the system is optimum.
INPUT SCHMITT TRIGGERS
All the Logic input pins (excepted I/O and SIM_I/O, See
Figure 3) have built−in Schmitt trigger circuits to prevent
the NCN4555 against uncontrolled operation. The typical
dynamic characteristics of the related pins are depicted
Figure 11.
The output signal is guaranteed to go High when the input
voltage is above 0.7 x V
, and will go Low when the input
DD
voltage is below 0.4 V.
SHUTDOWN OPERATING
In order to save power or for other purpose required by the
application it is possible to put the NCN4555 in a shutdown
mode by setting Low the pin STOP
device enters automatically in a shutdown mode when V
. On the other hand the
DD
becomes lower than 1.1 V typically.
ESD PROTECTION
The NCN4555 SIM interface features an HBM ESD
voltage protection in excess of 7 kV for all the SIM pins
(SIM_IO, SIM_CLK, SIM_RST, SIM_V
and GND). All
CC
the other pins (microcontroller side) sustain at least 2 kV.
These values are guaranteed for the device in its full integrity
without considering the external capacitors added to the
circuit for a proper operating. Consequently in the operating
conditions it is able to sustain much more than 7 kV on its
SIM pins making it perfectly protected against electrostatic
discharge well over the HBM ESD voltages required by the
ISO7816 standard (4 kV).
PRINTED CIRCUIT BOARD LAYOUT
Careful layout routing will be applied to achieve a good
and efficient operating of the device in its mobile or portable
environment and fully exploit its performance.
The bypass capacitors have to be connected as close as
possible to the device pins (SIM_V
, VDD or V
CC
BAT
) in
order to reduce as much as possible parasitic behaviors
(ripple and noise). It is recommended to use
ceramic capacitors.
The exposed pad of the QFN−16 package will be
connected to the ground as well as the unconnected pins
(NC). A relatively large ground plane is recommended.
Figures 12 and 13 shows an example of PCB device
implementation in an evaluation environment.
Figure 10. SIM_IO Typical Rise and Fall Times with
Figure 12. NCN4555 engineering test board schematic diagram
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10
NCN4555
EVALUATION BOARD AND PCB GUIDELINES
Top Layer
Bottom Layer
Figure 13. NCN4555 Printed Circuit Board Layout
(Engineering board)
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11
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
1
SCALE 2:1
16 X
LOCATION
0.10 C
0.08 C
16X
NOTE 5
16X
0.10 C
0.05 C
PIN 1
0.15 C
0.15
L
K
16X
A B
NOTE 3
D
TOP VIEW
C
SIDE VIEW
D2
58
4
1
1613
b
BOTTOM VIEW
(A3)
e
9
12
A
B
E
A1
EXPOSED PAD
QFN16 3*3*0.75 MM, 0.5 P
CASE 488AK−01
ISSUE O
A
SEATING
PLANE
C
E2
DATE 13 SEP 2004
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.25 AND 0.30 MM FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
CONDITION CAN NOT VIOLATE 0.2 MM
5. L
max
SPACING BETWEEN LEAD TIP AND FLAG.
MILLIMETERS
DIM MINMAX
A0.700.80
A1 0.000.05
A30.20 REF
b0.180.30
D3.00 BSC
D2 1.651.85
E3.00 BSC
E2 1.651.85
e0.50 BSC
K0.20−−−
L0.300.50
GENERIC
MARKING DIAGRAM*
16
1
XXXX
XXXX
ALYW
XXXX = Specific Device Code
A= Assembly Location
L= Wafer Lot
Y= Year
W= Work Week
*This information is generic. Please refer
to device data sheet for actual part
marking. Pb−Free indicator, “G”, may
or not be present.
DOCUMENT NUMBER:
DESCRIPTION:
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ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
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