ON Semiconductor NCN4555 User Manual

NCN4555
1.8V / 3V SIM Card Power Supply and Level Shifter
The NCN4555 is a level shifter analog circuit designed to translate the voltages between a SIM Card and an external microcontroller or MPU. A builtin LDOtype DCDC converter makes the NCN4555 useable to drive 1.8 V and 3.0 V SIM card. The device fulfills the ISO78163 smart card interface standard as well as GSM 11.11 and related (11.12 and 11.18) and 3G mobile requirements (IMT2000/3G UICC standard). With the STOP be activated making the battery life longer. The Card power supply voltage (SIM_V
Features
) is selected using a single pin (MOD_VCC).
CC
Supports 1.8 V or 3.0 V Operating SIM Card
The LDO is able to Supply More than 50 mA under 1.8 V and 3.0 V
Builtin Pullup Resistor for I/O Pin in Both Directions
All Pins are Fully ESD Protected According to ISO7816
Specifications – ESD Protection on SIM Pins in Excess of 7 kV (Human Body Model)
Supports up to More than 5 MHz Clock
LowProfile 3x3 QFN16 Package
These are PbFree Devices*
Typical Applications
SIM Card Interface Circuit for 2G, 2.5G and 3G Mobile Phones
Identification Module
Smart Card Readers
Wireless PC Cards
1.6 V to 5.5 V 2.7 V to 5.5 V
0.1mF0.1mF
V
BB
GND
pin a low current shutdown mode can
5
http://onsemi.com
MARKING DIAGRAM
16
1
QFN16
MN SUFFIX
1
(Note: Microdot may be in either location)
CASE 488AK
A = Assembly Location L = Wafer Lot Y = Year W = Work Week G = Pb−Free Package
NCN 4555
ALYWG
G
ORDERING INFORMATION
Device Package Shipping
NCN4555MNG QFN16
(PbFree)
NCN4555MNR2G QFN16
(PbFree)
†For information on tape and reel specifications,
including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D.
123 Units / Rail
3000/Tape & Reel
3
V
DD
1
STOP
2
14
13
15
MOD_V
RST
CLK
I/O
P3
P2
P1
P0
MPU or Microcontroller
SIM Card
Detect
GND
CC
GND
10
SIM_V
SIM_RST
NCN4555
SIM_CLK
SIM_I/O
CC
1 2 3 4
1mF
V
CC
RST CLK C4
DET DET
GND
7
9
11
8
GND
I/O C8
5 6 7 8
Figure 1. Typical Interface Application
*For additional information on our PbFree strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
© Semiconductor Components Industries, LLC, 2010
October, 2010 Rev. 3
1 Publication Order Number:
NCN4555/D
NCN4555
NC I/O RST CLK
16 15 14 13
Exposed Pad (EP)
STOP
MOD_V
CC
V
DD
(1.6 V to 5.5 V)
STOP
MOD_V
CC
1
2
12
11
NC
SIM_CLK
NCN4555
V
DD
NC
3
4
10
9
GND
SIM_RST
5678
V
NC SIM_VCCSIM_I/O
BAT
Figure 2. QFN16 Pinout (Top View)
(2.7 V to 5.5 V)
V
BAT
5
GND
7
SIM_V
CC
1
50 mA LDO
1.8 V
/3.0 V
2
3
RST
CLK
I/O
14
13
15
GND
18 kW
I/O
DATADATA
I/O
GND
Figure 3. NCN4555 Block Diagram
14 kW
GND
GND
GND
9
11
8
10
SIM_RST
SIM_CLK
SIM_I/O
GND
http://onsemi.com
2
NCN4555
PIN DESCRIPTIONS
PIN Name Type Description
1 STOP INPUT Power Down Mode pin:
2 MOD_V
3 V
DD
CC
INPUT The signal present on this pin programs the SIM_VCC value:
POWER This pin is connected to the system controller power supply. It configures the level shifter input
4 NC No Connect
5 V
BAT
POWER DCDC converter supply input. The input voltage ranges from 2.7V up to 5.5V. This pin has to be
6 NC No Connect
7 SIM_V
CC
POWER This pin is connected to the SIM card power supply pin. An internal LDO converter is
8 SIM_I/O INPUT/
OUTPUT
9 SIM_RST OUTPUT This pin is connected to the RESET pin of the card connector. A level translator adapts the
10 GND GROUND This pin is the GROUND reference for the integrated circuit and associated signals. Care must be
11 SIM_CLK OUTPUT This pin is connected to the CLOCK pin of the card connector. The CLOCK (CLK) signal comes
12 NC No Connect
13 CLK INPUT The clock signal, coming from the external controller, must have a Duty Cycle within the Min/Max
14 RST INPUT The RESET signal present at this pin is connected to the SIM card through the internal level
15 I/O INPUT/
OUTPUT
16 NC No Connect
STOP
= Low ³ Low current shutdown mode activated
STOP
= High ³ Normal Operation
A Low level on this pin resets the SIM interface, switching off the SIM_V
MOD_V MOD_V
= Low ³ SIM_VCC = 1.8 V
CC
= High ³ SIM_V
CC
CC
= 3 V
CC
.
stage to accept the signals coming from the microprocessor. A 0.1 mF capacitor shall be used to bypass the power supply voltage. When V NCN4555 comes into a shutdown mode.
is below 1.1 V typical the SIM_VCC is disabled. The
DD
bypass by a 0.1 mF capacitor.
programmable by the external MPU to supply either 1.8 V or 3.0 V output voltage. An external
1.0 mF minimum ceramic capacitor recommended must be connected across SIM_V During a normal operation, the SIM_VCC voltage can be set to 1.8 V followed by a 3.0 V value, or
and GND.
CC
can start directly to any of these two values.
This pin handles the connection to the serial I/O of the card connector. A bidirectional level translator adapts the serial I/O signal between the card and the micro controller. A 14 kW (typical) pullup resistor provides a High impedance state for the SIM card I/O link.
external Reset (RST) signal to the SIM card.
taken to avoid voltage spikes when the device operates in a normal operation.
from the external clock generator, the internal level shifter being used to adapt the voltage defined for the SIM_V
CC
.
values defined by the specification (typically 50%). The builtin level shifter translates the input signal to the external SIM card CLK input.
shifter which translates the level according to the SIM_V
programmed value.
CC
This pin is connected to an external microcontroller or cellular phone management unit. A bidirectional level translator adapts the serial I/O signal between the smart card and the external controller. A built−in constant 18 kW (typical) resistor provides a high impedance state when not activated.
http://onsemi.com
3
NCN4555
ATTRIBUTES
Characteristics Values
ESD protection HBM, SIM card pins (7, 8, 9, 10 & 11) (Note 1) HBM, All other pins (Note 1) MM, SIM card pins (7, 8, 9, 10 & 11) (Note 2) MM, All other pins (Note 2) CDM, SIM card pins (7, 8, 9, 10 & 11) (Note 3) CDM , All other pins (Note 3)
Moisture sensitivity (Note 4) QFN16 Level 1
Flammability Rating Oxygen Index: 28 to 34 UL 94 V0 @ 0.125 in
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. Human Body Model, R =1500 W, C = 100 pF.
2. Machine Model.
3. CDM, Charged Device Model.
4. For additional information, see Application Note AND8003/D.
MAXIMUM RATINGS (Note 5)
Rating
LDO Power Supply Voltage V
Power Supply from Microcontroller Side V
External Card Power Supply SIM_V
Digital Input Pins V
Digital Output Pins V
SIM card Output Pins V
QFN16 Low Profile package Power Dissipation @ T Thermal Resistance JunctiontoAir
= + 85°C
A
Operating Ambient Temperature Range T
Operating Junction Temperature Range T
Maximum Junction Temperature T
Storage Temperature Range T
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
5. Maximum electrical ratings are defined as those values beyond which damage to the device may occur at T
Symbol Value Unit
BAT
DD
CC
in
I
in
out
I
out
out
I
out
P
D
R
q
JA
A
J
Jmax
stg
> 7 kV
> 2 kV > 600 V > 200 V
> 2 kV > 600 V
0.5 ≤ V
6 V
BAT
0.5 VDD 6 V
0.5 SIM_VCC 6 V
0.5 Vin V
but < 6.0
DD
+ 0.5
±5
0.5 ≤ V
VDD + 0.5
out
but < 6.0
±10
0.5 ≤ V
SIM_VCC + 0.5
out
but < 6.0
15 (internally limited)
440
90
40 to +85 °C
40 to +125 °C
+125 °C
65 to + 150 °C
= +25°C
A
V
mA
V
mA
V
mA
mW
°C/W
http://onsemi.com
4
Loading...
+ 9 hidden pages