The NCN4555 is a level shifter analog circuit designed to translate
the voltages between a SIM Card and an external microcontroller or
MPU. A built−in LDO−type DC−DC converter makes the NCN4555
useable to drive 1.8 V and 3.0 V SIM card. The device fulfills the
ISO7816−3 smart card interface standard as well as GSM 11.11 and
related (11.12 and 11.18) and 3G mobile requirements (IMT−2000/3G
UICC standard). With the STOP
be activated making the battery life longer. The Card power supply
voltage (SIM_V
Features
) is selected using a single pin (MOD_VCC).
CC
• Supports 1.8 V or 3.0 V Operating SIM Card
• The LDO is able to Supply More than 50 mA under 1.8 V and 3.0 V
• Built−in Pullup Resistor for I/O Pin in Both Directions
• All Pins are Fully ESD Protected According to ISO−7816
Specifications – ESD Protection on SIM Pins in Excess of 7 kV
(Human Body Model)
• Supports up to More than 5 MHz Clock
• Low−Profile 3x3 QFN−16 Package
• These are Pb−Free Devices*
Typical Applications
• SIM Card Interface Circuit for 2G, 2.5G and 3G Mobile Phones
• Identification Module
• Smart Card Readers
• Wireless PC Cards
1.6 V to 5.5 V 2.7 V to 5.5 V
0.1mF0.1mF
V
BB
GND
pin a low current shutdown mode can
5
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MARKING
DIAGRAM
16
1
QFN−16
MN SUFFIX
1
(Note: Microdot may be in either location)
CASE 488AK
A= Assembly Location
L= Wafer Lot
Y= Year
W = Work Week
G= Pb−Free Package
NCN
4555
ALYWG
G
ORDERING INFORMATION
DevicePackageShipping
NCN4555MNGQFN−16
(Pb−Free)
NCN4555MNR2GQFN−16
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
123 Units / Rail
3000/Tape & Reel
†
3
V
DD
1
STOP
2
14
13
15
MOD_V
RST
CLK
I/O
P3
P2
P1
P0
MPU or Microcontroller
SIM Card
Detect
GND
CC
GND
10
SIM_V
SIM_RST
NCN4555
SIM_CLK
SIM_I/O
CC
1
2
3
4
1mF
V
CC
RST
CLK
C4
DETDET
GND
7
9
11
8
GND
I/O
C8
5
6
7
8
Figure 1. Typical Interface Application
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
INPUTThe signal present on this pin programs the SIM_VCC value:
POWERThis pin is connected to the system controller power supply. It configures the level shifter input
4NCNo Connect
5V
BAT
POWERDC−DC converter supply input. The input voltage ranges from 2.7V up to 5.5V. This pin has to be
6NCNo Connect
7SIM_V
CC
POWERThis pin is connected to the SIM card power supply pin. An internal LDO converter is
8SIM_I/OINPUT/
OUTPUT
9SIM_RSTOUTPUTThis pin is connected to the RESET pin of the card connector. A level translator adapts the
10GNDGROUNDThis pin is the GROUND reference for the integrated circuit and associated signals. Care must be
11SIM_CLKOUTPUTThis pin is connected to the CLOCK pin of the card connector. The CLOCK (CLK) signal comes
12NCNo Connect
13CLKINPUTThe clock signal, coming from the external controller, must have a Duty Cycle within the Min/Max
14RSTINPUTThe RESET signal present at this pin is connected to the SIM card through the internal level
15I/OINPUT/
OUTPUT
16NCNo Connect
STOP
= Low ³ Low current shutdown mode activated
STOP
= High ³ Normal Operation
A Low level on this pin resets the SIM interface, switching off the SIM_V
MOD_V
MOD_V
= Low ³ SIM_VCC = 1.8 V
CC
= High ³ SIM_V
CC
CC
= 3 V
CC
.
stage to accept the signals coming from the microprocessor. A 0.1 mF capacitor shall be used to
bypass the power supply voltage. When V
NCN4555 comes into a shutdown mode.
is below 1.1 V typical the SIM_VCC is disabled. The
DD
bypass by a 0.1 mF capacitor.
programmable by the external MPU to supply either 1.8 V or 3.0 V output voltage. An external
1.0 mF minimum ceramic capacitor recommended must be connected across SIM_V
During a normal operation, the SIM_VCC voltage can be set to 1.8 V followed by a 3.0 V value, or
and GND.
CC
can start directly to any of these two values.
This pin handles the connection to the serial I/O of the card connector. A bidirectional level
translator adapts the serial I/O signal between the card and the micro controller. A 14 kW (typical)
pullup resistor provides a High impedance state for the SIM card I/O link.
external Reset (RST) signal to the SIM card.
taken to avoid voltage spikes when the device operates in a normal operation.
from the external clock generator, the internal level shifter being used to adapt the voltage defined
for the SIM_V
CC
.
values defined by the specification (typically 50%). The built−in level shifter translates the input
signal to the external SIM card CLK input.
shifter which translates the level according to the SIM_V
programmed value.
CC
This pin is connected to an external microcontroller or cellular phone management unit. A
bidirectional level translator adapts the serial I/O signal between the smart card and the external
controller. A built−in constant 18 kW (typical) resistor provides a high impedance state when not
activated.
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3
NCN4555
ATTRIBUTES
CharacteristicsValues
ESD protection
HBM, SIM card pins (7, 8, 9, 10 & 11) (Note 1)
HBM, All other pins (Note 1)
MM, SIM card pins (7, 8, 9, 10 & 11) (Note 2)
MM, All other pins (Note 2)
CDM, SIM card pins (7, 8, 9, 10 & 11) (Note 3)
CDM , All other pins (Note 3)
Moisture sensitivity (Note 4) QFN−16Level 1
Flammability RatingOxygen Index: 28 to 34UL 94 V−0 @ 0.125 in
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. Human Body Model, R =1500 W, C = 100 pF.
2. Machine Model.
3. CDM, Charged Device Model.
4. For additional information, see Application Note AND8003/D.
MAXIMUM RATINGS(Note 5)
Rating
LDO Power Supply VoltageV
Power Supply from Microcontroller SideV
External Card Power SupplySIM_V
Digital Input PinsV
Digital Output PinsV
SIM card Output PinsV
QFN−16 Low Profile package
Power Dissipation @ T
Thermal Resistance Junction−to−Air
= + 85°C
A
Operating Ambient Temperature RangeT
Operating Junction Temperature RangeT
Maximum Junction TemperatureT
Storage Temperature RangeT
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
5. Maximum electrical ratings are defined as those values beyond which damage to the device may occur at T
SymbolValueUnit
BAT
DD
CC
in
I
in
out
I
out
out
I
out
P
D
R
q
JA
A
J
Jmax
stg
> 7 kV
> 2 kV
> 600 V
> 200 V
> 2 kV
> 600 V
−0.5 ≤ V
≤ 6V
BAT
−0.5 ≤ VDD ≤ 6V
−0.5 ≤ SIM_VCC ≤ 6V
−0.5 ≤ Vin ≤V
but < 6.0
DD
+ 0.5
±5
−0.5 ≤ V
≤ VDD + 0.5
out
but < 6.0
±10
−0.5 ≤ V
≤ SIM_VCC + 0.5
out
but < 6.0
15 (internally limited)
440
90
−40 to +85°C
−40 to +125°C
+125°C
−65 to + 150°C
= +25°C
A
V
mA
V
mA
V
mA
mW
°C/W
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