The NBC12439 and NBC12439A are general purpose, PLL based
synthesized clock sources. The VCO will operate over a frequency
range of 400 MHz to 800 MHz. The VCO frequency is sent to the
N--output divider, where it can be configured to provide division ratios
of 1, 2, 4 or 8. The VCO and output frequency can be programmed
using the parallel or serial interfaces to the configuration logic. Output
frequency steps of 16 MHz, 8 MHz, 4 MHz, or 2 MHz can be
achieved using a 16 MHz crystal, depending on the output divider
settings. The PLL loop filter is fully integrated and does not require
any external components.
See detailed ordering and shippinginformation in the package
dimensions section on page 16 of this data sheet.
1Publication Order Number:
NBC12439/D
NBC12439, NBC12439A
XTAL_SEL
FREF_EXT
10--20MHz
S_LOAD
P_LOAD
S_DATA
S_CLOCK
OE
15
28
27
26
PWR_DOWN
2
F
÷ 2
3
4
5
6
7
XTAL1
OSC
XTAL2
REF
7--BIT ÷ M
COUNTER
PHASE
DETECTOR
7--BIT SR
VCO
÷ 2
400--800
LATCH
01
POWER
DOWN
÷ N
(1,2,4,8)
MHz
LATCH
01
2--BIT SR3--BIT SR
+3.3 or 5.0 V
1
PLL_V
CC
LATCH
+3.3 or 5.0 V
21, 25
V
CC
24
23
20
FOUT
FOUT
TEST
Table 1. Output Division
N [1:0]Output Division
00
01
10
11
8 ¤ 14
7
M[6:0]
17, 1822, 19
2
N[1:0]
Figure 1. Block Diagram (28 --Lead PLCC)
Tab l e 2. XTAL _ S E L And O E
Input01
2
4
8
1
PWR_DOWN
XTAL_SEL
OE
F
OUT
FREF_EXT
Outputs Disabled
F
÷ 16
OUT
XTAL
Outputs Enabled
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2
NBC12439, NBC12439A
S_CLOCK
S_DATA
S_LOAD
PLL_V
CC
PWR_DOWN
FREF_EXT
XTAL1
VCCFOUT
25242322212019
26
27
28
1
2
3
4
56 7891011
FOUT
OE
XTAL2
P_LOAD
GND
M[0]
CC
V
M[1]
Figure 2. 28--Lead PLCC (Top View)
TEST
M[2]
GND
18
N[1]
17
N[0]
16
NC
15
XTAL_SEL
14
M[6]
13
M[5]
12
M[4]
M[3]
S_CLOCK
S_DATA
S_LOAD
PLL_V
PLL_V
PWR_DOWN
FREF_EXT
XTAL1
CC
CC
CC
FOUT
FOUT
V
32 31 30 29 28 27 26 25
1
2
3
4
5
6
7
8
910111213141516
GND
VCCV
CC
TEST
GND
24
23
22
21
20
19
18
17
N/C
N[1]
N[0]
NC
XTAL_SEL
M[6]
M[5]
M[4]
S_CLOCK
S_DATA
S_LOAD
PLL_V
CC
PLL_V
CC
PWR_DOWN
FREF_EXT
XTAL1
CC
FOUT
FOUT
V
3231302928272625
1
2
3
4
5
6
7
8
910111213141516
OE
XTAL2
GND
M[0]
P_LOAD
VCCV
M[1]
CC
M[2]
Figure 4. 32--Lead QFN (Top View)
GND
TEST
24
N/C
23
N[1]
22
N[0]
21
NC
20
XTAL_SEL
19
M[6]
18
M[5]
17
M[4]
N/C
M[3]
Exposed Pad (EP)
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3
XTAL2
OE
M[0]
P_LOAD
M[1]
M[2]
M[3]
N/C
Figure 3. 32--Lead LQFP (Top View)
NBC12439, NBC12439A
The following gives a brief description of the functionality of the NBC12439 and NBC12349A Inputs and Outputs. Unless
explicitly stated, all inputs are CMOS/TTL compatible with either pull--up or pulldownresistors. The PECLoutputs are capable
of driving two series terminated 50 Ω transmission lines on the incident edge.
Table 3. PIN FUNCTION DESCRIPTION
Pin NameFunctionDescription
INPUTS
XTAL1, XTAL2 Crystal InputsThese pins form an oscillator when connected to an external series--resonant
S_LOAD*CMOS/TTL Serial Latch Input
S_DATA*CMOS/TTL Serial Data Input
S_CLOCK*CMOS/TTL Serial Clock Input
P_LOAD**CMOS/TTL Parallel Latch Input
M[6:0]**CMOS/TTL PLL Loop Divider
N[1:0]**CMOS/TTL Output Divider Inputs
OE**CMOS/TTL Output Enable Input
FREF_EXT*CMOS/TTL Input
XTAL_SEL**CMOS/TTL Input
PWR_DOWNCMOS/TTL Input
OUTPUTS
FOUT,
FOUTPECL Differential OutputsThese differential, positive--referenced ECL signals (PECL) are the outputs of the
TESTCMOS/TTL OutputThe function of this output is determined by the serial configuration bits T[2:0].
POWER
V
CC
PLL_V
CC
GNDNegative Power SupplyThese pins are the negative supply for the chip and are normally all c onnected to
--Exposed Pad for QFN--32 onlyThe Exposed Pad (EP) on the QFN--32 package bottom is thermally connected to
* When left Open, these inputs will default LOW.
** When left Open, these inputs will default HIGH.
(Internal Pulldown Resistor)
(Internal Pulldown Resistor)
(Internal Pulldown Resistor)
(Internal Pullup Resistor)
Inputs (Internal Pullup Resistor)
(Internal Pullup Resistor)
(Internal Pullup Resistor)
(Internal Pulldown Resistor)
(Internal Pullup Resistor)
(Internal Pulldown Resistor)
Positive Supply for the LogicThe positive supply for the internal logic and output buffer of the chip, and is con-
Positive Supply for the PLLThis is the positive supply for the PLL and is connected to +3.3 V or +5.0 V.
crystal.
This pin loads the configuration latches with the contents of the shift registers. The
latches will be transparent when this signal is HIGH; thus, the data must be stable
on the HIGH--to--LOW transition of S_LOAD for proper operation.
This pin acts as the data input to the serial configuration shift registers.
This pin serves to clock the serial configuration shift registers. Data from S_DATA
is sampled on the rising edge.
This pin loads the configuration latches with the contents of the parallel inputs
.The latches will be transparent when this signal is LOW; therefore, the parallel
data must be stable on the LOW--to--HIGH transition of P_LOAD
tion.
These pins are used to configure the PLL loop divider. They are s ampled on the
LOW--to--HIGH transition of P_LOAD
These pins are used to configure the output divider modulus. They are sampled
on the LOW--to--HIGH transition of P_LOAD
Active HIGH Output Enable. The Enable is synchronous to eliminate possibility of
runt pulse generation on the FOUT output.
This pin can be used as the PLL Reference
This pin selects between the crystal and the FREF_EXT source for the PLL reference signal. A HIGH selects the crystal input.
PWR_DOWN forces the FOUT outputs to synchronously reduce frequency by a
factor of 16.
synthesizer.
nected to +3.3 V or +5.0 V.
ground.
the die for improved heat transfer out of package. The exposed pad must be attached to a heat--sinking conduit. The pad is electrically connected to GND.
. M[6] is the MSB, M[0] is the LSB.
.
for proper opera-
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4
NBC12439, NBC12439A
Table 4. ATTRIBUTES
CharacteristicsValue
Internal Input Pulldown Resistor
Internal Input Pullup Resistor
ESD ProtectionHuman Body Model
Machine Model
Charged Device Model
Moisture Sensitivity (Note 1)Pb PkgPb--Free Pkg
PLCC
LQFP
QFN
Level 1
Level 2
Level 1
Flammability RatingOxygen Index: 28 to 34UL 94 V--0 @ 0.125 in
Transistor Count2269
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, see Application Note AND8003/D.
Table 5. MAXIMUM RATINGS
SymbolParameterCondition 1Condition 2RatingUnit
V
CC
V
I
I
out
T
A
T
stg
θ
JA
θ
JC
θ
JA
θ
JC
θ
JA
θ
JC
T
sol
Stresses exceeding Maximum Ratings may damage the device. Maximu m Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to s tresses above the Recommended Operating Conditions may affect
device reliability.
Positive SupplyGND = 0 V6V
Input VoltageGND = 0 VVI± V
CC
Output CurrentContinuous
Surge
Operating Temperature Range
NB12439
NB12439A
Storage Temperature Range--65 to +150°C
Thermal Resistance (Junction--to--Ambient)0lfpm
500 lfpm
PLCC--28
PLCC--28
Thermal Resistance (Junction--to--Case)Standard BoardPLCC--2822 to 26°C/W
Thermal Resistance (Junction--to--Ambient)0lfpm
500 lfpm
LQFP--32
LQFP--32
Thermal Resistance (Junction--to--Case)Standard BoardLQFP--3212 to 17°C/W
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
2. F
OUT/FOUT
3. F
OUT/FOUT
Table 7. DC CHARACTERISTICS (V
Symbol
V
IH
CMOS/
output levels will vary 1:1 with VCCvariation.
outputs are terminated through a 50 Ω resistor to VCC-- 2.0 volts.
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
4. F
5. F
OUT/FOUT
OUT/FOUT
output levels will vary 1:1 with VCCvariation.
outputs are terminated through a 50 Ω resistor to VCC-- 2.0 volts.
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
6. 10 MHz is the maximum frequency to load the feedback divide registers. S_CLOCK can be switched at higher frequencies when used as
a test clock in TEST_MODE 6.
7. F
OUT/FOUT
8. Maximum frequency on FREF_EXT is a function of setting the appropriate M counter value, 20 ≤ M ≤ 80, for the VCO to operate within
the valid range of 400 MHz ≤ f
9. See applications information section.
outputs are terminated through a 50 Ω resistor to VCC-- 2.0 V. Internal phase detector can handle up to 100 MHz on it’s input.
≤ 800 MHz. (See Table 11)
VCO
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NBC12439, NBC12439A
FUNCTIONAL DESCRIPTION
The internal oscillator uses the external quartz crystal as
the basis of its frequency reference. The output of the
reference oscillator is divided by 2 before being sent to the
phase detector. With a 16 MHz crystal, this provides a
reference frequency of 8 MHz. Although this data sheet
illustrates functionality only for a 16 MHz crystal, Table 9,
any crystal in the 1 0 -- 20 MHz range can be used, Table 11.
The VCO within the PLL operates over a range of 400 to
800 MHz. Its output is scaled by a divider, M divider, that is
configured by either the serial or parallel interfaces. The
output of this loop divider is also applied to the phase
detector.
The phase detector and the loop filter force the VCO
output frequency to be M times the reference frequency by
adjusting the VCO control voltage. Note that for some
values of M (either too high or too low), the PLL will not
achieve loop lock.
The output of the VCO is also passed through an output
divider before being sent to the PECL output driver. This
N outputdivider isconfigured through either the serialor the
parallel interfaces and can provideone of four division ratios
(1, 2, 4, or 8). This divider extends the performance of the
part while providing a 50% duty cycle.
The output driver is driven differentially from the output
divider and is capable of driving a pair of transmission lines
terminated into 50 Ω to V
-- 2.0 V. The positive reference
CC
for the output driver and the internal logic is separated from
the power supply for the phase-- locked loop to minimize
noise induced jitter.
The configuration logic has two sections: serial and
parallel. The parallel interface uses the values at the M[6:0]
and N[1:0] inputs to configure the internal counters.
Normally upon system reset, the P_LOAD
input is held
LOW until sometime after power becomes valid. On the
LOW--to--HIGH transition of P_LOAD
, the parallel inputs
are captured. The parallel interface has priority over the
serial interface. Internal pullup resistors are provided on the
M[6:0] and N[1:0] inputs to reduce component count in the
application of the chip.
The serial interface logic is implemented with a fourteen
bit shift register scheme. The register shifts once per rising
edge of the S_CLOCK input. The serial input S_DATA must
meet setup and hold timing as specified in the AC
Characteristics section of this document. With P_LOAD
held high, the configuration latches will capture the value of
the shift register on the HIGH--to--LOW edge of the
S_LOAD input. See the programming section for more
information.
The TEST output reflects various internal node values and
is controlled by the T[2:0] bits in the serial data stream. See
the programming section for more information.
Table 9. Programming VCO Frequency Function Table with 16 MHz Crystal
VCO
Frequency (MHz )
400250011001
416260011010
432270011011
448280011100
•••••••••
•••••••••
•••••••••
752470101111
768480110000
784490110001
800500110010
M Count Divisor
6432168421
M6M5M4M3M2M1M0
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NBC12439, NBC12439A
PROGRAMMING INTERFACE
Programming the NBC12439 and NBC12439A is
accomplished by properly configuring the internal dividers
to produce the desired frequency at the outputs. The output
frequency can by represented by this formula:
F
OUT
=(F
or FREF_EXT ÷ 2) × 2M÷ N
XTAL
(eq. 1)
This can be simplified to:
F
OUT
where F
=(F
XTAL
or FREF_EXT) × M÷ N
XTAL
is the crystal frequency, M is the loop divider
(eq. 2)
modulus, and N is the output divider modulus. Note that it
is possible to select values of M such that the PLL is unable
to achieve loop lock. Toavoid this, always make sure that M
is selected to be 25 ≤ M ≤ 50 for a 16 MHz input reference.
See Table 11.
Assuming that a 16 MHz reference frequency is used the
above equation reduces to:
F
OUT
= 16M ÷ N
(eq. 3)
Substituting the four values for N (1, 2, 4, 8) yields:
Table 10. Programmable Output Divider Function
Tab l e
Output Fre-
quency
N1N0N DividerF
11÷1M × 16400--80016 MHz
00÷2M × 8200--4008MHz
01÷4M × 4100--2004MHz
10÷8M × 250--1002MHz
*For crystal frequency of 16 MHz.
OUT
Range (MHz)*
F
OUT
Step
The user can identify the proper M and N values for the
desired frequency from the above equations. The four output
frequency ranges established by N are 400--800 MHz,
200 -- 400 MHz,100 -- 200 MHz and50 -- 100 MHz,
respect i v e l y. From these ranges, the user will establish the
value of N required. The value of M can then be calculated
based on Equation 1. For example, if an output frequency of
384 MHz was desired, the following steps would be taken to
identify the appropriate M and N values. 384 MHz falls
within the frequency range set by an N value of 2; thus, N
[1:0]=00.
ForN=2,F
=8MandM=F
OUT
÷ 8. Therefore,
OUT
M = 384 ÷ 8 = 48, so M[6:0] = 0110000.Following this same
procedure, a user can generate a selected frequency. The size
of the programmable frequency steps of F
to F
XT AL
÷ N.
will be equal
OUT
For input reference frequencies other than 16 MHz, see
Table 11, which shows the usable VCO frequency and M
divider range.
The input frequency and the selection of the feedback
divider M is limited by the VCO frequency range and
fXTAL. M must be configured to match the VCO frequency
range of 400 to 800 MHz in order to achieve stable PLL
operation.
M
= f
min
M
max
VCOmin
= f
VCOmax
÷ F
÷ F
XTAL
XTAL
and
(eq. 4)
(eq. 5)
The value for M falls within the constraints set for PLL
stability. If the value for M fell outside of the valid range, a
different N value would be selected to move M in the
appropriate direction.
The M and N counters can be loaded either through a
parallel or serial interface. The parallel interface is
controlled via the P_LOAD
signal such that aLOW to HIGH
transition will latch the information present on the M[6:0]
and N[1:0] inputs into the M and N counters. When the
P_LOAD
signal is LOW, the input latches will be
transparent and any changes on the M[6:0]and N[1:0] inputs
will affect the FOUT output pair. To use the serial port, the
S_CLOCK signal samples the information on the S_DATA
line and loads it into a 12 bit shift register. Note that the
P_LOAD
signal must be HIGH for the serial load operation
to function. The Test register is loaded with the first three
bits, the N register with the next two, and the M register with
the final nine bits of the data stream on the S_DATA input.
For each register, the most significant bit is loaded first (T2,
N1, and M6). The HIGH to LOW transition on the S_LOAD
input will latch the new divide values into the counters. A
pulse on the S_LOAD pin after the shift register is fully
loaded will transfer the divide values into the counters.
Figures 5 and 6 illustrate the timing diagram for both a
parallel and a serial load of the device synthesizer.
M[6:0] and N[1:0] are normally specified after power-- up
through the parallel interface, and then possibly, fine tuned
again through the serial interface. This approach allows the
application to ramp up at one frequency and then change or
fine--tune the clock as the ability to control the serial
interface becomes available.
The TEST output provides visibility for one of the several
internal nodes as determined by the T[2:0] bits in the serial
configuration stream. It is not configurable through the
parallel interface. The T2, T1, and T0 control bits are preset
to ‘000’ when P_LOAD
is LOW so that the PECL FOUT
outputs areas jitter--free as possible. Any active signal on the
TEST output pin will have detrimental affects on the jitter
of the PECL output pair. In normal operations, jitter
specifications are only guaranteed if the TEST output is
static. The serial configuration port can be used to select one
of the alternate functions for this pin.
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NBC12439, NBC12439A
Table 11. Frequency Operating Range
VCO Frequency (MHz) Range for a Crystal Frequency (MHz) of:
Most of the signals available on the TEST output pin are
useful only for performance verification of the device itself.
However, the PLL bypass mode may be of interest at the
board level for functional debug. When T[2:0] is set to 110,
the device is placed in PLL bypass mode. In this mode the
S_CLOCK input is fed directly into the M and N dividers.
The N divider drives the FOUT differential pair and the M
counter drives the TEST output pin. In this mode the
S_CLOCK input could b e used for low speed board level
functional test or debug. Bypassing the PLL and d riving
FOUT directly gives the user more control on the test clocks
sent through the clock tree. Figure 7 shows the functional
setup of the PLL bypass mode. Because the S_CLOCK is a
CMOS level the input frequency is limited to 250 MHz or
less. This means the fastest the FOUT pin can be toggledvia
the S_CLOCK is 250 MHz as the minimum divide ratio of
the N counter is 1. Note that the M counter output on the
TEST output will not be a 50% duty cycle due to the way the
divider is implemented.
S_CLOCK
t
S_DATA
S_LOAD
C1C2C3C4C5C6C7C8C9C10C11C12
s
T2T1T0N1N0M6M5M4M3M2M1M0
First
Bit
S_DATA to S_CLOCK
t
h
T2T1T0TEST OUTPUT
0
0
0
0
1
1
1
1
M[6:0]
N[1:0]
P_LOAD
0
0
1
1
0
0
1
1
0
SHIFT REGISTER OUT
1
HIGH
0
FREF
1
M COUNTER OUT
0
FOUT
1
LOW
0
PLL BYPASS
1
FOUT ÷ 4
VAL I D
t
s
t
h
Figure 5. Parallel Interface Timing Diagram
M, N to P_LOAD
Last
Bit
SCLOCK
SDATA
t
h
t
S_CLOCK to S_LOAD
s
Figure 6. Serial Interface Timing Diagram
FREF_EXT
MCNT
SHIFT
REG
14- -BIT
PLL 12430
M COUNTER
T0
T1
T2
SLOAD
LATCH
Reset
PLOAD
VCO_CLK
DECODE
0
1
(1,2,4,8)
FDIV4
MCNT
LOW
F
OUT
MCNT
FREF
HIGH
N ÷
• T2=T1=1, T0=0: Test Mode
• SCLOCK is selected, MCNT is on TEST output, SCLOCK ÷ NisonFOUTpin.
PLOAD
acts as reset for test pin latch. When latch reset, T2 data is shifted out TEST pin.
(VIA ENABLE GATE)
7
TEST
MUX
0
F
OUT
TEST
Figure 7. Serial Test Clock Block Diagram
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11
NBC12439, NBC12439A
APPLICATIONS INFORMATION
Using the On--Board Crystal Oscillator
The NBC12439 and N BC12439A feature a fully
integrated on--board crystal oscillator to minimize system
implementation costs. The oscillator is a series resonant,
multivibrator type design as opposed to the more common
parallel resonant oscillator design. The series resonant
design provides better stability and eliminates the need for
large on chip capacitors. The oscillator is totally self
contained so that the only external componentrequired is the
crystal. As the oscillator is somewhat sensitive to loading on
its inputs, the u ser is advised to mount the crystal as close to
the device as possible to avoid any board level parasitics. To
facilitateco--location,surfacemountcrystals are
recommended, but not required. Because the series resonant
design is affected by capacitive loading on the crystal
terminals, loading variation introduced by crystals from
differentvendors could bea potential issue. For crystalswith
a higher shunt capacitance, it may be required to place a
resistance across the terminals to suppress the third
harmonic. Although typically not required, it is a good idea
to layout the PCB with the provision of adding this external
resistor. The resistor value will typically be between 500 Ω
and1KΩ.
The oscillator circuit is a series resonant circuit and thus,
for optimum performance, a series resonant crystal should
be used. Unfortunately, most crystals are characterized in a
parallel resonant mode. Fortunately, there is no physical
difference between a series resonant and a parallel resonant
crystal. The d ifference is purely in the way the devices are
characterized. As a result, a parallel resonant crystal can be
used with the device with only a minor error in the desired
frequency. A parallel resonant mode crystal used in a series
resonant circuit will exhibit a frequency of oscillation a few
hundred ppm lower than specified (a few hundred ppm
translates to kHz inaccuracy). Table 12 below specifies the
performance requirements of the crystals to be used with the
device.
Table 12. Crystal Specifications
ParameterValue
Crystal CutFundamental AT Cut
ResonanceSeries Resonance*
Frequency Tolerance±75 ppm at 25°C
Frequency/Temperature Stability±150 ppm 0 to 70°C
Operating Range0to70°C
Shunt Capacitance5--7 pF
Equivalent Series Resistance (ESR)
Correlation Drive Level
Aging5 ppm/Yr
* See accompanying text for series versus parallel resonant
discussion.
50 to 80 Ω
100 mW
(First 3 Years)
Power Supply Filtering
TheNBC12439andNBC12439Aaremixed
analog/digital products and as such, exhibit some
sensitivities that would not necessarily be seen on a fully
digital product. Analog circuitry is naturally susceptible to
random noise, especially if this noise is seen on the power
supply pins. The NBC12439 and NBC1239A provide
separate power supplies for the digital circuitry (V
the internal PLL (PLL_V
) of the device. The purpose of
CC
CC
)and
this design technique is to try and isolate the high switching
noise of the digital outputs from the relatively sensitive
internal analog phase--locked loop. In a controlled
environment such as an evaluation board, this level of
isolation is sufficient. However, in a digital system
environment where it is more difficult to minimize noise on
the power supplies, a second level o f isolation may be
required. The simplest form of isolation is a power supply
filter on the PLL_V
pin for the NBC12439 and
CC
NBC12349A.
Figure 8 illustrates a typical power supply filter scheme.
The NBC12439 and NBC12439A are most susceptible to
noise with spectral content in the 1 KHz to 1 MHz range.
Therefore, the filter should be designed to target this range.
The key parameter that needs to be met in the final filter
design is the DC voltage drop that will be seen between the
V
supply and the PLL_VCCpin of the NBC12439 and
CC
NBC12439A. From the data sheet, the PLL_V
(the current sourced through the PLL_V
pin) is typically
CC
CC
current
23 mA (28 mA maximum). Assuming that a minimum of
2.8 V must be maintained on the PLL_V
DC voltage drop can be tolerated when a 3.3 V V
pin, very little
CC
CC
supply
is used. The resistor shown in Figure 8 must have a
resistance of 10--15 Ω to meet the voltage drop criteria. The
RC filter pictured will provide a broadband filter with
approximately 100:1 attenuation for noise whose spectral
content is above 20 KHz. As the noise frequency crosses the
series resonant point of an individual capacitor, it’s overall
impedance begins to look inductive and thus increases with
increasing frequency. The parallel capacitor combination
shown ensures that a low impedance path to ground exists
for frequencies well above the bandwidth of the PLL.
3.3 V or
5.0 V
L=1000 mH
R=15 Ω
PLL_V
NBC12439
NBC12439A
3.3 V or
5.0 V
RS=10--15Ω
CC
22 m F
0.01 m F
V
CC
0.01 m F
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12
Figure 8. Power Supply Filter
NBC12439, NBC12439A
A higher level of attenuation can be achieved by replacing
the resistor with an appropriate valued inductor. Figure 8
shows a 1000 mH choke. This value choke will show a
significant impedance at 10 KHz frequencies and above.
Because of the current draw and the voltage that must be
maintained on the PLL_V
pin, a low DC resistance
CC
inductor is required (less than 15 Ω). Generally, the
resistor/capacitor filter will be cheaper, easier to implement,
and provide an adequate level of supply filtering.
TheNBC12439andNBC12439Aprovide
sub--nanosecond output edge rates and therefore a good
power supply bypassing scheme is a must. Figure 9 shows
a representative board layout for the NBC12439. There
exists many different potential board layouts and the one
pictured is but one. The important aspect of the layout in
Figure 9 is the low impedance connectionsbetween V
CC
and
GND for the bypass capacitors. Combining good quality
general purpose chip capacitors with good PCB layout
techniques w ill produce effective capacitor resonances at
frequencies adequate to supply the instantaneous switching
current for the NBC12439 and NBC12439A outputs. It is
imperative that low inductance chip capacitors are used. It
is equally important that the board layout not introduce any
of the inductance saved by using the leadless capacitors.
Thin interconnect traces between the capacitor and the
power plane should be avoided and multiple large vias
should be used to tie the capacitors to the buried power
planes. Fat interconnect and large vias will help to minimize
layout induced inductance and thus maximize the series
resonant point of the bypass capacitors.
C1C1
Note the dotted lines circling the crystal oscillator
connection to the device. The oscillator is a series resonant
circuit and the voltage amplitude across the crystal is
relatively small. It is imperative that no actively switching
signals cross under the crystal as crosstalk energy coupled
to these lines could significantly impact the jitter of the
device. Special attention should be paid to the layout of the
crystal to ensure a stable, jitter free interface between the
crystal and the on--board oscillator. Note the provisions for
placing a resistor across the crystal oscillator terminals as
discussed in the crystal oscillator section of this data sheet.
Although the NBC12439 and NBC12439A have several
design features to minimize the susceptibility to power
supply noise (isolated power and grounds and fully
differential PLL), there still may be applications in which
overall performance is being degraded due to system power
supply noise. The power supply filter and bypass schemes
discussed in this section should be adequate to eliminate
power supply noise--related problems in most designs.
Jitter Performance
Jitter is a common parameter associated with clock
generation and distribution. Clock jitter can be defined asthe
deviation in a clock’s output transition from its ideal
position.
Cycle--to--Cycle Jitter (short--term) is the period
variation between adjacentperiods over a defined number of
observed cycles. The number of cycles observed is
application dependent but the JEDEC specification is 1000
cycles. See Figure 10.
R1
1
C3
Xtal
Figure 9. PCB Board Layout for (PLCC--28)
C2
R1 = 10--15 Ω
C1 = 0.01 mF
C2 = 22 mF
C3 = 0.1 mF
the highest and lowest acquired value and is represented as
the width of the Gaussian base. See Figure 11.
=V
CC
=GND
=Via
http://onsemi.com
13
T
0
T
JITTER(cycle--cycle)=T1
Figure 10. Cycle--to--Cycle Jitter
T
1
-- T
0
Random Peak--to--Peak Jitter is the difference between
RMS
or one
Sigma
Jitter Amplitude
Time*
*1,000 -- 10,000 Cycles
Figure 11. Random Peak--to--Peak and RMS Jitter
Jitter
Typical
Gaussian
Distribution
Peak--to--Peak Jitter (8σ)
NBC12439, NBC12439A
There are different ways to measure jitter and often they
are confused with one another. An earlier method of
measuring jitter is to look at the timing signal with an
oscilloscope and observe the variations in period--to--period
or cycle--to--cycle. If the scope is set up to trigger on every
rising or falling edge, set to infinite persistence mode and
allowed to trace sufficient cycles, it is possible to determine
the maximum and minimum periods of the timing signal.
Digital scopes can accumulate a large number of cycles,
create a histogram of the edge placements and record
peak--to--peak as well as standard deviations of the jitter.
Care must be taken that the measured edge is the edge
immediately following the trigger edge. These scopes can
also store a finite number of period durations and
post--processing software can analyze the data to find the
maximum and minimum periods.
Recent hardware and software developments have
resulted in advanced jitter measurement techniques. The
Tektronix TDS--series oscilloscopes have superb jitter
analysis capabilities on non--contiguous clocks with their
histogram and statistics capabilities. The Tektronix
TDSJIT2/3 Jitter Analysis software provides many key
timing parameter measurements and will extend that
capability by making jitter measurements on contiguous
clock and data cycles from single--shot acquisitions.
M1 by Amherst was used as well and both test methods
correlated.
This test process can be correlated to earlier test methods
and are more accurate. All of the jitter data r eported on the
NBC12439 and NBC12439A was collected in this manner.
Figure 12 shows the RMS jitter performance as a function
of the VCO frequency range. The general trend is that as the
VCO frequency is increased, the RMS output jitter will
decrease.
Figure 13 illustrates the RMS jitter performance versus
the output frequency. Note the jitter is a function of both the
output frequency as well as the VCO frequency. However,
the VCO frequency shows a much stronger dependence.
Long--Term Period Jitter is the maximum jitter
observed at the end of a period’s edge when compared to the
position ofthe perfect referenceclock’s edg e and is specified
by the number of cycles over which the jitter is measured.
The number of cycles used to look for the maximum jitter
varies by application but the JEDEC spec is 10,000 observed
cycles.
The NBC12439 and NBC12439A exhibit long term and
cycle--to--cycle jitter, which rivals that of SAW based
oscillators. This jitter performance comes with the added
flexibility associated with a synthesizer over a fixed
frequency oscillator. The jitter data presented should
provide users with enough information to determine the
effect on their overall timing budget. The jitter performance
meets the needs of most system designs while adding the
flexibility of frequency margining and field upgrades. These
features are not available with a fixed frequency SAW
oscillator.
25
20
15
10
N=8
RMS JITTER (ps)
5
N=1
0
400500600700800
Figure 12. Cycle--to --Cycle RMS Jitter vs.
N=4
N=2
VCO FREQUENCY (MHz)
VCO Frequency
25
20
15
10
RMS JITTER (ps)
5
0
800700600500400300200100
OUTPUT FREQUENCY (MHz)
Figure 13. Cycle--to --Cycle RMS Jitter vs.
Output Frequency
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14
S_DATA
S_CLOCK
S_DATA
S_LOAD
NBC12439, NBC12439A
t
t
SET--UP
Figure 14. Setup and Hold
t
SET--UP
HOLD
t
HOLD
F
F
OUT
OUT
M[6:0]
N[1:0]
P_
LOAD
Figure 15. Setup and Hold
t
t
SET--UP
HOLD
Figure 16. Setup and Hold
Pulse Width
t
PERIOD
Figure 17. Output Duty Cycle
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15
DCO =
τpw
τPERIOD
NBC12439, NBC12439A
Zo=50Ω
Zo=50Ω
50 Ω50 Ω
V
VTT=VCC-- 2 . 0 V
TT
D
Receiver
Device
D
Driver
Device
F
F
OUT
OUT
Figure 18. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D -- Termination of ECL Logic Devices.)
ORDERING INFORMATION
DevicePackageShipping
NBC12439FALQFP--32250 Units / Tray
NBC12439FAGLQFP--32
(Pb--Free)
NBC12439FAR2LQFP--322000 / Tape & Reel
NBC12439FAR2GLQFP--32
(Pb--Free)
NBC12439FNPLCC-- 2837 Units / Rail
NBC12439FNGPLCC--28
(Pb--Free)
NBC12439FNR2PLCC--28500 / Tape & Reel
NBC12439FNR2GPLCC--28
(Pb--Free)
NBC12439AFALQFP--32250 Units / Tray
NBC12439AFAGLQFP--32
(Pb--Free)
NBC12439AFAR2LQFP--322000 / Tape & Reel
NBC12439AFAR2GLQFP--32
(Pb--Free)
NBC12439AFNPLCC--2837 Units / Rail
NBC12439AFNGPLCC--28
(Pb--Free)
NBC12439AFNR2PLCC--28500 / Tape & Reel
NBC12439AFNR2GPLCC-- 28
(Pb--Free)
NBC12439AMNGQFN--32
(Pb--Free)
NBC12439AMNR4GQFN--32
(Pb--Free)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
250 Units / Tray
2000 / Tape & Reel
37 Units / Rail
500 / Tape & Reel
250 Units / Tray
2000 / Tape & Reel
37 Units / Rail
500 / Tape & Reel
74 Units / Rail
1000 / Tape & Reel
†
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16
NBC12439, NBC12439A
Resource Reference of Application Notes
AN1405/D-- ECL Clock Distribution Techniques
AN1406/D-- Designing with PECL (ECL at +5.0 V)
AN1503/D--
AN1504/D-- Metastability and the ECLinPS Family
AN1568/D-- Interfacing Between LVDS and ECL
AN1672/D-- The ECL Translator Guide
AND8001/D -- Odd Number Counters Design
AND8002/D -- Marking and Date Codes
AND8020/D -- Termination of ECL Logic Devices
AND8066/D -- Interfacing with ECLinPS
AND8090/D -- AC Characteristics of ECL Devices
ECLinPSt I/O SPiCE Modeling Kit
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17
NBC12439, NBC12439A
PACKAGE DIMENSIONS
PLCC--28
FN SUFFIX
PLASTIC PLCC PACKAGE
CASE 776--02
ISSUE E
-- L --
-- N --
281
Z
C
G
G1
S
0.010 (0.250)N
L--M
T
S
L--M
T
M
S
S
L--M
T
S
Y BRK
0.007 (0.180)N
B
0.007 (0.180)N
U
M
D
Z
-- M --
W
D
V
0.010 (0.250)N
G1X
S
S
L--M
T
S
VIEW D --D
A
0.007 (0.180)N
0.007 (0.180)N
R
E
M
M
S
L--M
T
L--M
T
S
S
S
H
0.007 (0.180)N
M
S
L--M
T
S
K1
0.004 (0.100)
SEATING
J
-- T --
PLANE
VIEW S
S
S
K
VIEW S
0.007 (0.180)N
F
M
S
L--M
T
S
NOTES:
1. DATUMS --L--, --M--, AND --N-- DETERMINED
WHERE TOP OF LEAD SHOULDER EXITS
PLASTIC BODY AT MOLD PARTING LINE.
2. DIMENSION G1, TRUE POSITION TO BE
MEASURED AT DATUM --T--, SEATING PLANE.
3. DIMENSIONS R AND U DO NOT INCLUDE
MOLD FLASH. ALLOWABLE MOLD FLASH IS
0.010 (0.250) PER SIDE.
4. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
5. CONTROLLING DIMENSION: INCH.
6. THEPACKAGETOPMAYBESMALLERTHAN
THEPACKAGEBOTTOMBYUPTO0.012
(0.300). DIMENSIONS R AND U ARE
DETERMINED AT THE OUTERMOST
EXTREMES OF THE PLASTIC BODY
EXCLUSIVE OF MOLD FLASH, TIE BAR
BURRS, GATE BURRS AND INTERLEAD
FLASH, BUT INCLUDING ANY MISMATCH
BETWEEN THE TOP AND BOTTOM OF THE
PLASTIC BODY.
7. DIMENSION H DOES NOT INCLUDE DAMBAR
PROTRUSION OR INTRUSION. THE DAMBAR
PROTRUSION(S) SHALL NOT CAUSE THE H
DIMENSION TO BE GREATER THAN 0.037
(0.940). THE DAMBAR INTRUSION(S) SHALL
NOT CAUSE THE H DIMENSION TO BE
SMALLER THAN 0.025 (0.635).
http://onsemi.com
DIM MINMAXMINMAX
A 0.485 0.495 12.32 12.57
B 0.485 0.495 12.32 12.57
C 0.165 0.1804.204.57
E 0.090 0.1102.292.79
F 0.013 0.0190.330.48
G0.050 BSC1.27 BSC
H 0.026 0.0320.660.81
J 0 . 0 2 0-- -- --0 . 5 1-- -- --
K 0 . 0 2 5-- -- --0 . 6 4-- -- --
R 0.450 0.456 11.43 11.58
U 0.450 0.456 11.43 11.58
V 0.042 0.0481.071.21
W 0.042 0.0481.071.21
X 0.042 0.0561.071.42
Y-- -- -- 0 . 0 2 0-- -- --0 . 5 0
Z210 210
1. DIMENSIONING AND TOLERANCING
PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION:
MILLIMETER.
3. DATUM PLANE --AB-- IS LOCATED AT
BOTTOM OF LEAD AND IS COINCIDENT
WITH THE LEAD WHERE THE LEAD
EXITS THE PLASTIC BODY AT THE
BOTTOM OF THE PARTING LINE.
4. DATUMS --T--, --U--, AND --Z-- TO BE
DETERMINED AT DATUM PLANE -- AB--.
5. DIMENSIONS S AND V TO BE
DETERMINED AT SEATING PLANE -- AC --.
6. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION. ALLOWABLE
PROTRUSION IS 0.250 (0.010) PER SIDE.
DIMENSIONS A AND B DO INCLUDE
MOLD MISMATCH AND ARE
DETERMINED AT DATUM PLANE -- AB--.
7. DIMENSION D DOES NOT INCLUDE
DAMBAR PROTRUSION. DAMBAR
PROTRUSION SHALL NOT CAUSE THE
D DIMENSION TO EXCEED 0.520 (0.020).
8. MINIMUM SOLDER PLATE THICKNESS
SHALL BE 0.0076 (0.0003).
9. EXACT SHAPE OF EACH CORNER MAY
VARY FROM DEPICTION.
DETAIL AD
MILLIMETERS
DIMAMINMAXMIN MAX
7.000 BSC0.276 BSC
A13.500 BSC0.138 BSC
B7.000 BSC0.276 BSC
B13.500 BSC0.138 BSC
C 1.400 1.600 0.055 0.063
D 0.300 0.450 0.012 0.018
E 1.350 1.450 0.053 0.057
F 0.300 0.400 0.012 0.016
G0.800 BSC0.031 BSC
H 0.050 0.150 0.002 0.006
J 0.090 0.200 0.004 0.008
K 0.450 0.750 0.018 0.030
1. DIMENSIONS AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.25 AND 0.30 MM TERMINAL
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
MILLIMETERS
DIM MIN NOM MAX
A 0.800 0.900 1.000
A1 0.000 0.025 0.050
A30.200 REF
b 0.180 0.250 0.300
D5.00 BSC
D2 2.950 3.100 3.250
E5.00 BSC
E2
2.950 3.100 3.250
A
SEATING
PLANE
e0.500 BSC
K 0.200 ------------
L 0.300 0.400 0.500
C
SOLDERING FOOTPRINT*
5.30
3.20
32 X
0.63
3.20
5.30
BOTTOM VIEW
32 X
0.28
DIMENSIONS: MILLIMETERS
28 X
0.50 PITCH
*For additional information on our Pb--Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor andare registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability o f its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals”must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
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Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
NBC12439/D
20
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