ON Semiconductor NB4N11MDTEVB User Manual

© Semiconductor Components Industries, LLC, 2012
February, 2012 − Rev. 1
1 Publication Order Number:
EVBUM2071/D
NB4N11MDTEVB
Evaluation Board User's Manual for NB4N11M
ON Semiconductor has developed an evaluation board for the NB4N11M device as a convenience for the customers interested in performing their own device engineering assessment. This board provides a high bandwidth 50 W controlled impedance environment. The pictures in Figure 1 show the top and bottom view of the evaluation board, which can be configured in several different ways.
This NB4N11M evaluation board manual contains:
Appropriate Lab Setup
Assembly Instructions
Bill of Materials
This manual should be used in conjunction with the NB4N11M device data sheet, which contains full technical details on the device specifications and operation.
Board LayUp
The NB4N11M evaluation board is implemented in four layers with split (dual) power supplies (Figure 7, Evaluation Board Lay−up). For standard lab setup, a split (dual) power supply is essential to enable the 50 W internal impedance in the oscilloscope as a devices termination. The first layer or primary trace layer is 0.005 thick Rogers RO4003 material, which is designed to have equal electrical length on all signal traces from the device under the test (DUT) to the sense output. The second layer is the 1.0 oz copper ground plane. The FR4 dielectric material is placed between second and third layer and between third and fourth layer. The third layer is also 1.0 oz copper ground plane. The fourth layer is the secondary trace layer.
Top View Bottom View
Figure 1. Top and Bottom View of the NB4N11M Evaluation Board
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EVAL BOARD USER’S MANUAL
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Figure 2. Top & Bottom Layers (Top View)
V
EE
SMA_GND
V
CC
TOP LAYER BOTTOM LAYER
V
EE
SMA_GND
V
CC
Figure 3. Evaluation Board Lay−up
Connecting Power and Ground Planes
The side launch 9 pin power supply connector is wired as
shown in Figure 4. Test points can be soldered on the top of
the PCB to accommodated easier connections. Exact values that need to be applied can be found in Table 1.
Table 1. Power Supply Levels
Power Supply Span V
TT
(Termination)
V
CC
(Pin 8)
VEE / GND
(Pin 5)
SMA_GND
(PCB SMA Ground)
3.3 V 1.8 V 1.5 V 1.8 V 0 V
3.3 V 2.5 V 0.8 V 2.5 V 0 V
3.3 V 3.3 V 0 V 3.3 V 0 V
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V
CC
SMA_GND
V
EE
Figure 4. Power Supply Connector − 9 Pin Side
View (Left) and PCB Top View (Right)
NC
NC
V
CC
V
EE
V
CC
V
EE
SMA_GND
C3 = 10 mF; C4 = 10 mF
Stimulus (Generator) Termination
All ECL outputs need to be terminated to V
TT
(VTT =
V
CC
– 2.0 V = GND) via a 50 W resistor. The current board
design utilizes the space for placement of the external termination resistors. (More information on termination is provided in AN8020). The 0402 chip resistor pads are
provided on the bottom side of the evaluation board. Solder the chip resistors to the bottom side of the board between the appropriate input of the device pin pads and the ground pads as shown in Figure 5 (for split power supply setup, PCB is assembled in this configuration).
Figure 5. Expanded Bottom View
C1 = 0.01 mF
C2 = 0.01 mF
R2 = 50 W
R1 = 50 W
Likewise for CML outputs, CML stimulus signal need to
be terminated to V
CC
via a 50 W resistor. To accomplish this
configuration the external termination resistor has to be moved from SMA_GND ring to V
CC
ring on the bottom of
the board.
For the LVDS configuration Input pin pads of the D0 or
D1 input has to be shorted using 100 W resistor across differential lines.
DUT Termination
For standard lab setup and test, a split (dual) power supply
is required enabling the 50 W internal impedance in the
oscilloscope to be used as a termination of the signals (in split power supply setup SMA_GND as a system ground, V
CC
, and VEE are varied; see Table 1, Power Supply Levels).
Board Components Configuration
The NB4N11MDTEVB evaluation board requires six side SMA connectors. Placement locations are described in the Table 2 below.
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Table 2. SMA Connector and Jumper Placement
Device J1/Q0 J2/Q0 J3/Q1 J4/Q1 J5 J6/D J7/D J8
Pin # 1 2 3 4 5 6 7 8
Connector Yes Ye s Ye s Ye s No Ye s Yes No
Resistor (bottom)
0402*
50 W
0402*
50 W
0402*
50 W
0402*
50 W
0402
0.01 mF
0402 50 W
0402 50 W
0402
0.01 mF
Wire No No No No to V
EE
No No to V
CC
*Optional components for 25 W load. Not populated in production
.
Figure 6. Lab Setup
Z = 50 W
Z = 50 W
Z = 50 W
Z = 50 W
Z = 50 W
Z = 50 W
IN2
IN3
OUT1
OUT2
OUT3
OUT4
PIN 1
D
D
Q0
Q0
Q1
Q1
SIGNAL
GENERATOR
OSCILLOSCOPE
(50 W Scope Head)
1. Connect appropriate power supplies to VCC, VEE, and SMA_GND (See Table 1)
2. Connect a signal generator to the input SMA connectors via matched cables. Setup input signal according to the device data sheet
3. Connect a test measurement device on the device output SMA connectors via matched cables.
NOTE: The test measurement device must contain 50 W
termination.
Figure 7. PCB Schematic for 50 W Load
(PCB is assembled in this configuration)
SMA
SMA
SMA
SMA
SMA
SMA
C1
0.01 mF
C3
10 mF
C2
0.01 mF
C4
10 mF
V
CC
R1
50 W
R2
50 W
NB4N11M
1
2
3 4
7
6
5
8
V
EE
Z = 50 W
Z = 50 W
Z = 50 W
Z = 50 W
Z = 50 W
Z = 50 W
SIGNAL
GENERATOR
OSCILLOSCOPE
(50 W Scope Head)
D
D
Q0
Q0
Q1
Q1
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Figure 8. PCB Schematic for 25 W Load
(50 W output resistors (Q0, Q0
, Q1, Q1) not assembled )
SMA
SMA
SMA
SMA
SMA
SMA
0.01 mF10 mF
0.01 mF
10 mF
V
CC
50 W
50 W
NB4N11M
1
2
3 4
7
6
5
8
V
EE
Z = 50 W
Z = 50 W
Z = 50 W
Z = 50 W
Z = 50 W
Z = 50 W
SIGNAL
GENERATOR
OSCILLOSCOPE
(50 W Scope Head)
D
D
Q0
Q0
Q1
Q1
50 W*
*50 W resistors must be added for 25 W load configuration
50 W*
50 W*
50 W*
Table 3. Bill of Materials
Components Manufacturer Description Part Number Qty. Web Site
SMA
Connector
Johnson* SMA Connector Side
Launch
1420701851 6 http://www.johnsoncomponents.com
9 Pin DSub
Receptacle
Amphenol Connector, Female,
9Pin, Right Angle
7887961 1 http://www.amphenol.com
Surface Mount
Test Points{
Keystone*
SMT Miniature Test
Point
5015
3 http://www.keyelco.com
SMT Compact Test
Point
5016
Chip
Capacitor
AVC
Corporation*
0402 0.01 mF " 10%
04025C103KAT2A 2 http://www.avxcorp.com
10 mF " 10%
T491C106K016AS 2
Chip Resistor Panasonic*
0402 50 W " 1%
Precision Thick Film
Chip Resistor
ERJ2RKF49R9X 2 http://www.panasonic.com
Evaluation
Board
ON
Semiconductor
Micro10 Evaluation
Board
N/A 1 http://www.onsemi.com
Device
Samples
ON
Semiconductor
Micro10 Package
Device
NB4N11MM 1 http://www.onsemi.com
*Components are available through most distributors, i.e. www.newark.com, www.Digikey.com †Surface Mount Test Points can be used for power supply connection in place of power supply cable connector. See Figure 4 for test point
placement.
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PACKAGE DIMENSIONS
Micro10
CASE 846B−03
ISSUE D
S
B
M
0.08 (0.003) A
S
T
DIM MIN MAX MIN MAX
INCHESMILLIMETERS
A 2.90 3.10 0.114 0.122 B 2.90 3.10 0.114 0.122 C 0.95 1.10 0.037 0.043 D 0.20 0.30 0.008 0.012 G 0.50 BSC 0.020 BSC H 0.05 0.15 0.002 0.006 J 0.10 0.21 0.004 0.008 K 4.75 5.05 0.187 0.199 L 0.40 0.70 0.016 0.028
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION “A” DOES NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. MOLD FLASH, PROTRUSIONS OR GATE BURRS SHALL NOT EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION “B” DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION. INTERLEAD FLASH OR PROTRUSION SHALL NOT EXCEED 0.25 (0.010) PER SIDE.
5. 846B01 OBSOLETE. NEW STANDARD 846B02
B
A
D
K
G
PIN 1 ID
8 PL
0.038 (0.0015)
T
SEATING PLANE
C
H
J
L
ǒ
mm
inches
Ǔ
SCALE 8:1
10X 10X
8X
1.04
0.041
0.32
0.0126
5.28
0.208
4.24
0.167
3.20
0.126
0.50
0.0196
*For additional information on our PbFree strategy and soldering
details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
SOLDERING FOOTPRINT*
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