The MC74AC138/74ACT138 is a high−speed 1−of−8
decoder/demultiplexer. This device is ideally suited for high−speed
bipolar memory chip select address decoding.
The multiple input enables allow parallel expansion to a 1−of−24
decoder using just three MC74AC138/74ACT138 devices or a
1−of−32 decoder using four MC74AC138/74ACT138 devices and one
inverter.
• Demultiplexing Capability
• Multiple Input Enable for Easy Expansion
• Active LOW Mutually Exclusive Outputs
• Outputs Source/Sink 24 mA
• ′ACT138 Has TTL Compatible Inputs
w These devices are available in Pb−free package(s). Specifications herein
apply to both standard and Pb−free devices. Please see our website at
www.onsemi.com for specific Pb−free orderable part numbers, or
contact your local ON Semiconductor sales office or representative.
V
O0O1O2O3O4O5O
CC
15161413121110
6
9
16
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1
16
1
16
1
DIP−16
N SUFFIX
CASE 648
SO−16
D SUFFIX
CASE 751B
TSSOP−16
DT SUFFIX
CASE 948F
2134567
3
8
O
GNDA0A1A2E1E2E
7
Figure 1. Pinout: 16−Lead Packages Conductors
(Top View)
A0A1A
2
O1O2O3O4O5O6O
O
0
E1E2E
3
7
Figure 2. Logic Symbol
PIN ASSIGNMENT
PINFUNCTION
A0−A
E1−E
E
3
O0−O
2
2
7
Address Inputs
Enable Inputs
Enable Input
Outputs
EIAJ−16
16
1
M SUFFIX
CASE 966
ORDERING INFORMATION
DevicePackageShipping
MC74AC138N
MC74ACT138N
MC74AC138D
MC74ACT138D
MC74AC138DR22500 Tape & Reel
MC74ACT138DR22500 Tape & Reel
MC74AC138DT
MC74ACT138DT
MC74AC138DTR2
MC74ACT138DTR2
MC74AC138M
MC74ACT138M
MC74AC138MEL
MC74ACT138MEL
PDIP−16
PDIP−16
SOIC−16
SOIC−16
SOIC−16
SOIC−16
TSSOP−16
TSSOP−16
TSSOP−16
TSSOP−16
EIAJ−16
EIAJ−16
EIAJ−16
EIAJ−16
25 Units/Rail
25 Units/Rail
48 Units/Rail
48 Units/Rail
96 Units/Rail
96 Units/Rail
2500 Tape & Reel
2500 Tape & Reel
50 Units/Rail
50 Units/Rail
2000 Tape & Reel
2000 Tape & Reel
DEVICE MARKING INFORMATION
See general marking information in the device marking
section on page 6 of this data sheet.
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
E
A
A
2
3
0
A2O0O1O2O3O
1
HIGH. This multiple enabled function allows easy parallel
expansion of the device to a 1−of−32 (5 lines to 32 lines)
decoder with just four MC74AC138/74ACT138 devices
and one inverter (See Figure 4). The
MC74AC138/74ACT138 can be used as an 8−output
demultiplexer by using one of the active LOW Enable inputs
as the data input and the other Enable inputs as strobes. The
Enable inputs which are not used must be permanently tied
to their appropriate active−HIGH or active−LOW state.
O5O6O
4
7
E
E1E
3
A2A
0
7
NOTE: This diagram is provided only for the understanding of logic
operations and should not be used to estimate propagation
delays.
A
1
0
0
0
6
0
5
4
2
0
0
3
0
2
0
1
0
Figure 3. Logic Diagram
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2
MC74AC138, MC74ACT138
A
0
A
1
A
2
′04
A
3
A
4
A0A1A
2
H
123123123123
E
A0A1A
2
E
A0A1A
2
E
A0A1A
2
E
0
001020304050607
0
0
0
001020304050607
0
001020304050607
0
001020304050607
0
31
Figure 4. Expansion to 1−of−32 Decoding
MAXIMUM RATINGS*
SymbolParameterValueUnit
V
V
V
I
IN
I
OUT
I
CC
T
CC
IN
OUT
stg
DC Supply Voltage (Referenced to GND)−0.5 to +7.0V
DC Input Voltage (Referenced to GND)−0.5 to VCC +0.5V
DC Output Voltage (Referenced to GND)−0.5 to VCC +0.5V
DC Input Current, per Pin±20mA
DC Output Sink/Source Current, per Pin±50mA
DC VCC or GND Current per Output Pin±50mA
Storage Temperature−65 to +150°C
*Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the Recom-
mended Operating Conditions.
RECOMMENDED OPERATING CONDITIONS
SymbolParameterMinTypMaxUnit
V
CC
VIN, V
tr, t
f
tr, t
f
T
J
T
A
I
OH
I
OL
Supply Voltage
DC Input Voltage, Output Voltage (Ref. to GND)0−V
OUT
Input Rise and Fall Time (Note 1)
′AC Devices except Schmitt Inputs
Input Rise and Fall Time (Note 2)
′ACT Devices except Schmitt Inputs
Junction Temperature (PDIP)−−140°C
Operating Ambient Temperature Range−402585°C
Output Current − High−−−24mA
Output Current − Low−−24mA
1. VIN from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. V
IN
′AC2.05.06.0
′ACT4.55.05.5
CC
V
V
VCC @ 3.0 V−150−
VCC @ 4.5 V−40−ns/V
VCC @ 5.5 V−25−
VCC @ 4.5 V−10−
VCC @ 5.5 V−8.0−
ns/V
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3
MC74AC138, MC74ACT138
DC CHARACTERISTICS
V
CC
Symbol Parameter
V
IH
Minimum High Level
Input Voltage
(V)
3.01.52.12.1V
4.52.253.153.15Vor VCC − 0.1 V
5.52.753.853.85
V
IL
Maximum Low Level
Input Voltage
3.01.50.90.9V
4.52.251.351.35Vor VCC − 0.1 V
5.52.751.651.65
V
OH
Minimum High Level
Output Voltage
3.02.992.92.9I
4.54.494.44.4V
5.55.495.45.4
3.0−2.562.46−12 mA
4.5−3.863.76I
5.5−4.864.76−24 mA
V
OL
Maximum Low Level
Output Voltage
3.00.0020.10.1I
4.50.0010.10.1V
5.50.0010.10.1
3.0−0.360.4412 mA
4.5−0.360.44I
5.5−0.360.4424 mA
I
IN
I
OLD
I
OHD
I
CC
Maximum Input
Leakage Current
†Minimum Dynamic
Output Current
Maximum Quiescent
Supply Current
5.5−±0.1±1.0μAVI = VCC, GND
5.5−−75mAV
5.5−−−75mAV
5.5−8.080μAVIN = VCC or GND
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: I
and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.
IN
TA = +25°C
TypGuaranteed Limits
74AC74AC
TA =
−40°C to
+85°C
UnitConditions
= 0.1 V
OUT
= 0.1 V
OUT
= −50 μA
OUT
*VIN = VIL or V
V
OH
OUT
−24 mA
= 50 μA
*VIN = VIL or V
V
OL
OLD
OHD
24 mA
= 1.65 V Max
= 3.85 V Min
IH
IH
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4
MC74AC138, MC74ACT138
AC CHARACTERISTICS(For Figures and Waveforms − See Section 3 of the ON Semiconductor FACT Data Book, DL138/D)
74AC74AC
TA = −40°C
to +85°C
= 50 pF
C
L
Unit
ns3−6
ns3−6
ns3−6
ns3−6
ns3−6
ns3−6
Symbol
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
Propagation Delay
A
to O
n
n
Propagation Delay
A
to O
n
n
Propagation Delay
E
or E2 to O
1
n
Propagation Delay
E
or E2 to O
1
n
Propagation Delay
E
to O
3
n
Propagation Delay
E
to O
3
n
*Voltage Range 3.3 V is 3.3 V ±0.3 V.
*Voltage Range 5.0 V is 5.0 V ±0.5 V.
Parameter
VCC*
(V)
TA = +25°C
C
= 50 pF
L
MinTypMaxMinMax
3.31.58.513.01.515.0
5.01.56.59.51.510.5
3.31.58.012.51.514.0
5.01.56.09.01.510.5
3.31.511.015.01.516.0
5.01.58.011.01.512.0
3.31.59.513.51.515.0
5.01.57.09.51.510.5
3.31.511.015.51.516.5
5.01.58.011.01.512.5
3.31.58.513.01.514.0
5.01.56.08.01.09.5
Fig.
No.
DC CHARACTERISTICS
V
CC
SymbolParameter
V
IH
Minimum High Level
Input Voltage
V
IL
Maximum Low Level
Input Voltage
V
OH
Minimum High Level
Output Voltage
(V)
4.51.52.02.0
5.51.52.02.0or VCC − 0.1 V
4.51.50.80.8
5.51.50.80.8or VCC − 0.1 V
4.54.494.44.4
5.55.495.45.4
4.5−3.863.76V
5.5−4.864.76−24 mA
V
OL
Maximum Low Level
Output Voltage
4.50.0010.10.1
5.50.0010.10.1
4.5−0.360.44V
5.5−0.360.4424 mA
I
IN
ΔI
I
OLD
I
OHD
I
CC
CCT
Maximum Input
Leakage Current
5.5−±0.1±1.0μAVI = VCC, GND
Additional Max. ICC/Input5.50.6−1.5mAVI = VCC − 2.1 V
†Minimum Dynamic
Output Current
Maximum Quiescent
Supply Current
5.5−−75mAV
5.5−−−75mAV
5.5−8.080μAVIN = VCC or GND
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
TA = +25°C
TypGuaranteed Limits
74ACT74ACT
TA =
−40°C to
+85°C
UnitConditions
V
= 0.1 V
V
I
OUT
OUT
OUT
= 0.1 V
= −50 μA
V
V
V
*VIN = VIL or V
OH
OUT
−24 mA
= 50 μA
I
V
I
*VIN = VIL or V
I
OL
OLD
OHD
24 mA
= 1.65 V Max
= 3.85 V Min
IH
IH
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5
MC74AC138, MC74ACT138
AC CHARACTERISTICS(For Figures and Waveforms − See Section 3 of the ON Semiconductor FACT Data Book, DL138/D)
74ACT74ACT
TA = −40°C
to +85°C
= 50 pF
C
L
Unit
Symbol
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
Propagation Delay
A
to O
n
n
Propagation Delay
A
to O
n
n
Propagation Delay
E
or E2 to O
1
Propagation Delay
E
or E2 to O
1
Propagation Delay
E
O
3 to
n
Propagation Delay
E
to O
3
n
Parameter
n
n
*Voltage Range 5.0 V is 5.0 V ± 0.5 V
CAPACITANCE
SymbolParameter
C
IN
C
PD
Input Capacitance4.5pF VCC = 5.0 V
Power Dissipation Capacitance60pF VCC = 5.0 V
VCC*
(V)
TA = +25°C
C
= 50 pF
L
MinTypMaxMinMax
5.01.57.010.51.511.5ns3−6
5.01.56.510.51.511.5ns3−6
5.02.58.011.52.012.5ns3−6
5.02.07.511.52.012.5ns3−6
5.02.58.012.02.013.0ns3−6
5.02.06.510.51.511.5ns3−6
Value
Typ
UnitTest Conditions
Fig.
No.
MARKING DIAGRAMS
DIP−16SO−16TSSOP−16EIAJ−16
MC74AC138N
AWLYYWW
MC74ACT138N
AWLYYWW
AC138
AWLYWW
ACT138
AWLYWW
A= Assembly Location
WL, L= Wafer Lot
YY, Y= Year
WW, W = Work Week
AC
138
ALYW
ACT
138
ALYW
74AC138
ALYW
74ACT138
ALYW
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6
−A−
916
B
18
F
S
H
G
D
16 PL
0.25 (0.010)T
−A−
169
18
G
−T−
SEATING
PLANE
D
16 PL
0.25 (0.010)A
M
T
MC74AC138, MC74ACT138
PACKAGE DIMENSIONS
PDIP−16
N SUFFIX
16 PIN PLASTIC DIP PACKAGE
CASE 648−08
ISSUE R
C
SEATING
−T−
PLANE
K
M
A
J
M
16 PIN PLASTIC SOIC PACKAGE
CASE 751B−05
−B−
K
S
B
8 PLP
0.25 (0.010)B
C
S
L
SO−16
D SUFFIX
ISSUE J
M
R
M
S
X 45
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEADS WHEN
FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE MOLD FLASH.
5. ROUNDED CORNERS OPTIONAL.
DIM MINMAXMIN MAX
A 0.740 0.770 18.80 19.55
B 0.250 0.2706.356.85
C 0.145 0.1753.694.44
D 0.015 0.0210.390.53
F 0.0400.701.021.77
G0.100 BSC2.54 BSC
M
_
J
H0.050 BSC1.27 BSC
J 0.008 0.0150.210.38
K 0.110 0.1302.803.30
L 0.295 0.3057.507.74
M0 10 0 10
S 0.020 0.0400.511.01
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD FLASH.
PROTRUSIONS OR GATE BURRS. MOLD FLASH
OR GATE BURRS SHALL NOT EXCEED 0.15
(0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE INTERLEAD
FLASH OR PROTRUSION. INTERLEAD FLASH OR
PROTRUSION SHALL NOT EXCEED
0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN
EXCESS OF THE K DIMENSION AT MAXIMUM
MATERIAL CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE DETERMINED
AT DATUM PLANE −W−.
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH OR PROTRUSIONS AND ARE MEASURED
1
c
AT THE PARTING LINE. MOLD FLASH OR
PROTRUSIONS SHALL NOT EXCEED 0.15 (0.006)
PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
MILLIMETERS
DIM MINMAXMINMAX
−−−2.05−−− 0.081
A
A
0.050.20 0.002 0.008
1
0.350.50 0.014 0.020
b
0.180.27 0.007 0.011
c
9.90 10.50 0.390 0.413
D
5.105.45 0.201 0.215
E
1.27 BSC0.050 BSC
e
H
7.408.20 0.291 0.323
E
0.500.85 0.020 0.033
L
L
1.101.50 0.043 0.059
E
0
M
_
Q
0.700.90 0.028 0.035
1
−−−0.78−−− 0.031
Z
INCHES
10
_
10
0
_
_
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8
Notes
MC74AC138, MC74ACT138
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9
Notes
MC74AC138, MC74ACT138
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10
Notes
MC74AC138, MC74ACT138
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
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“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
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11
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