Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
CC
in
out
in
out
CC
stg
−0.5 to
+7.0
−0.5 to
VCC +0.5
−0.5 to
VCC +0.5
±20mA
±50mA
±50mA
−65 to
+150
V
V
V
°C
1
14
1
14
1
14
1
SOIC−14
D SUFFIX
CASE 751A
TSSOP−14
DT SUFFIX
CASE 948G
SOEIAJ−14
M SUFFIX
CASE 965
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 5 of this data sheet.
Input Rise and Fall Time (Note 1)
′AC Devices except Schmitt Inputs
Input Rise and Fall Time (Note 2)
′ACT Devices except Schmitt Inputs
Junction Temperature (PDIP)−−140°C
Operating Ambient Temperature Range−402585°C
Output Current − High−−−24mA
Output Current − Low−−24mA
1. Vin from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. Vin from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
DC CHARACTERISTICS
V
Symbol Parameter
V
IH
Minimum High Level
Input Voltage
V
IL
Maximum Low Level
Input Voltage
V
OH
Minimum High Level
Output Voltage
V
OL
Maximum Low Level
Output Voltage
I
IN
Maximum Input
Leakage Current
I
OLD
I
OHD
I
CC
†Minimum Dynamic
Output Current
Maximum Quiescent
Supply Current
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.
CC
(V)
3.01.52.12.1V
4.52.253.153.15Vor VCC − 0.1 V
5.52.753.853.85
3.01.50.90.9V
4.52.251.351.35Vor VCC − 0.1 V
5.52.751.651.65
3.02.992.92.9I
4.54.494.44.4V
5.55.495.45.4
3.0−2.562.46−12 mA
4.5−3.863.76I
5.5−4.864.76−24 mA
3.00.0020.10.1I
4.50.0010.10.1V
5.50.0010.10.1
3.0−0.360.4412 mA
4.5−0.360.44I
5.5−0.360.4424 mA
5.5−±0.1±1.0μAVI = VCC, GND
5.5−−75mAV
5.5−−−75mAV
5.5−4.040μAVIN = VCC or GND
′AC2.05.06.0
′ACT4.55.05.5
CC
VCC @ 3.0 V−150−
VCC @ 4.5 V−40−ns/V
VCC @ 5.5 V−25−
VCC @ 4.5 V−10−
VCC @ 5.5 V−8.0−
74AC74AC
TA =
TA = +25°C
−40°C to
UnitConditions
+85°C
TypGuaranteed Limits
= 0.1 V
OUT
= 0.1 V
OUT
= −50 μA
OUT
*VIN = VIL or V
V
OH
OUT
−24 mA
= 50 μA
*VIN = VIL or V
V
OL
OLD
OHD
24 mA
= 1.65 V Max
= 3.85 V Min
V
V
ns/V
IH
IH
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2
MC74AC02, MC74ACT02
AC CHARACTERISTICS(For Figures and Waveforms − See Section 3 of the ON Semiconductor FACT Data Book, DL138/D)
74AC74AC
SymbolParameter
t
PLH
t
PHL
Propagation Delay
Propagation Delay
VCC*
(V)
3.31.55.07.51.08.0
5.01.54.06.01.06.5
3.31.55.07.51.08.0
5.01.54.56.51.07.0
*Voltage Range 3.3 V is 3.3 V ±0.3 V.
Voltage Range 5.0 V is 5.0 V ±0.5 V.
DC CHARACTERISTICS
V
CC
Symbol Parameter
V
IH
Minimum High Level
Input Voltage
V
IL
Maximum Low Level
Input Voltage
V
OH
Minimum High Level
Output Voltage
V
OL
Maximum Low Level
Output Voltage
I
IN
Maximum Input
Leakage Current
ΔI
I
OLD
I
OHD
I
CC
CCT
Additional Max. ICC/Input5.50.6−1.5mAVI = VCC − 2.1 V
†Minimum Dynamic
Output Current
Maximum Quiescent
Supply Current
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
TA = +25°C
(V)
TypGuaranteed Limits
4.51.52.02.0
5.51.52.02.0or VCC − 0.1 V
4.51.50.80.8
5.51.50.80.8or VCC − 0.1 V
4.54.494.44.4
5.55.495.45.4
4.5−3.863.76V
5.5−4.864.76−24 mA
4.50.0010.10.1
5.50.0010.10.1
4.5−0.360.44V
5.5−0.360.4424 mA
5.5−±0.1±1.0μAVI = VCC, GND
5.5−−75mAV
5.5−−−75mAV
5.5−4.040μAVIN = VCC or GND
TA = +25°C
CL = 50 pF
MinTypMaxMinMax
74ACT74ACT
TA =
−40°C to
+85°C
TA = −40°C
to +85°C
Unit
CL = 50 pF
ns3−5
ns3−5
UnitConditions
V
= 0.1 V
V
I
OUT
OUT
OUT
= 0.1 V
= −50 μA
V
V
V
*VIN = VIL or V
I
OH
I
V
OUT
−24 mA
= 50 μA
*VIN = VIL or V
I
OL
= 1.65 V Max
OLD
= 3.85 V Min
OHD
24 mA
Fig.
No.
IH
IH
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3
MC74AC02, MC74ACT02
AC CHARACTERISTICS(For Figures and Waveforms − See Section 3 of the ON Semiconductor FACT Data Book, DL138/D)
74ACT74ACT
TA = −40°C
to +85°C
CL = 50 pF
Unit
SymbolParameter
t
PLH
t
PHL
*Voltage Range 5.0 V is 5.0 V ±0.5 V.
Propagation Delay5.01.5−8.51.09.0ns3−6
Propagation Delay5.01.5−9.51.010ns3−6
CAPACITANCE
SymbolParameter
C
IN
C
PD
Input Capacitance4.5pF VCC = 5.0 V
Power Dissipation Capacitance30pF VCC = 5.0 V
VCC*
(V)
TA = +25°C
CL = 50 pF
MinTypMaxMinMax
Value
Typ
UnitTest Conditions
Fig.
No.
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4
DEVICE ORDERING INFORMATION
MC74AC02, MC74ACT02
DevicePackageShipping
MC74AC02NPDIP−14
MC74AC02NGPDIP−14
MC74ACT02NPDIP−14
MC74ACT02NGPDIP−14
MC74AC02DSOIC−14
MC74AC02DGSOIC−14
MC74AC02DR2SOIC−14
MC74AC02DR2GSOIC−14
MC74ACT02DSOIC−14
MC74ACT02DGSOIC−14
MC74ACT02DR2SOIC−14
MC74ACT02DR2GSOIC−14
MC74AC02DTTSSOP−14*96 Units/Rail
MC74AC02DTR2TSSOP−14*
MC74AC02DTR2GTSSOP−14*
MC74ACT02DTTSSOP−14*96 Units/Rail
MC74ACT02DTR2TSSOP−14*
MC74ACT02DTR2GTSSOP−14*
MC74AC02MSOEIAJ−1450 Units/Rail
MC74AC02MELSOEIAJ−14
MC74AC02MELGSOEIAJ−14
MC74ACT02MELSOEIAJ−14
MC74ACT02MELG
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
(Pb−Free)
25 Units/Rail
(Pb−Free)
55 Units/Rail
(Pb−Free)
2500/Tape & Reel
(Pb−Free)
55 Units/Rail
(Pb−Free)
2500/Tape & Reel
(Pb−Free)
2500/Tape & Reel
2500/Tape & Reel
(Pb−Free)
2000/Tape & Reel
SOEIAJ−14
(Pb−Free)
†
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5
MC74AC02, MC74ACT02
MARKING DIAGRAMS
PDIP−14SOIC−14TSSOP−14
14
MC74AC02N
AWLYYWWG
1
14
MC74ACT02N
AWLYYWWG
1
14
AC02
AWLYWWG
1
14
ACT02
AWLYWWG
1
A= Assembly Location
WL, L= Wafer Lot
YY, Y= Year
WW, W = Work Week
G or G= Pb−Free Package
(Note: Microdot may be in either location)
14
14
1
1
AC
02
ALYWG
G
ACT
02
ALYWG
G
SOEIAJ−14
14
74AC02
ALYWG
1
14
74ACT02
ALYWG
1
http://onsemi.com
6
−T−
SEATING
PLANE
148
17
N
HG
MC74AC02, MC74ACT02
PACKAGE DIMENSIONS
PDIP−14
CASE 646−06
ISSUE P
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
B
A
F
L
C
D
14 PL
0.13 (0.005)
K
J
M
M
3. DIMENSION L TO CENTER OF LEADS WHEN
FORMED PARALLEL.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.127
(0.005) TOTAL IN EXCESS OF THE D
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
http://onsemi.com
8
MC74AC02, MC74ACT02
PACKAGE DIMENSIONS
TSSOP−14
CASE 948G−01
ISSUE B
0.10 (0.004)
−T−
SEATING
PLANE
14X REFK
S
U
T
S
N
0.25 (0.010)
U0.15 (0.006) T
S
2X L/2
0.10 (0.004)V
14
M
8
M
L
PIN 1
IDENT.
1
S
U0.15 (0.006) T
A
−V−
B
N
−U−
F
7
DETAIL E
K
K1
J
J1
SECTION N−N
C
D
G
H
DETAIL E
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD
FLASH, PROTRUSIONS OR GATE BURRS.
MOLD FLASH OR GATE BURRS SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION SHALL
NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
DIM MIN MAX MIN MAX
A 4.90 5.10 0.193 0.200
B 4.30 4.50 0.169 0.177
C−−− 1.20−−− 0.047
D 0.05 0.15 0.002 0.006
F 0.50 0.75 0.020 0.030
G0.65 BSC0.026 BSC
H 0.50 0.60 0.020 0.024
J0.09 0.20 0.004 0.008
−W−
J1 0.09 0.16 0.004 0.006
K 0.19 0.30 0.007 0.012
K1 0.19 0.25 0.007 0.010
L6.40 BSC0.252 BSC
M0 8 0 8
____
INCHESMILLIMETERS
SOLDERING FOOTPRINT*
7.06
1
14X
0.36
14X
1.26
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
http://onsemi.com
9
0.65
PITCH
148
1
Z
D
e
b
0.13 (0.005)
M
E
7
A
0.10 (0.004)
H
A
1
MC74AC02, MC74ACT02
PACKAGE DIMENSIONS
SOEIAJ−14
CASE 965−01
ISSUE A
L
E
E
VIEW P
_
M
L
DETAIL P
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE
MOLD FLASH OR PROTRUSIONS AND ARE
MEASURED AT THE PARTING LINE. MOLD FLASH
Q
1
c
OR PROTRUSIONS SHALL NOT EXCEED 0.15
(0.006) PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
MILLIMETERS
DIM MINMAXMIN MAX
−−−2.05−−− 0.081
A
A
0.050.20 0.002 0.008
1
0.350.50 0.014 0.020
b
0.100.20 0.004 0.008
c
9.90 10.50 0.390 0.413
D
5.105.45 0.201 0.215
E
1.27 BSC0.050 BSC
e
H
7.408.20 0.291 0.323
E
0.500.85 0.020 0.033
0.50
L
1.101.50 0.043 0.059
E
0
M
_
Q
0.700.90 0.028 0.035
1
−−−1.42−−− 0.056
Z
INCHES
10
_
10
0
_
_
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
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Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
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Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
MC74AC02/D
10
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