The MC10EL/100EL31 is a D flip-flop with set and reset. The
device is functionally equivalent to the E131 device with higher
performance capabilities. With propagation delays and output
transition times significantly faster than the E131, the EL31 is ideally
suited for those applications which require the ultimate in AC
performance.
Both set and reset inputs are asynchronous, level triggered signals.
Data enters the master portion of the flip-flop when clock is LOW and
is transferred to the slave, and thus the outputs, upon a positive
transition of the clock.
The 100 Series contains temperature compensation.
Features
• 475 ps Propagation Delay
• 2.8 GHz Toggle Frequency
• ESD Protection: > 1 kV Human Body Model,
> 100 V Machine Model
• PECL Mode Operating Range: V
with VEE = 0 V
• NECL Mode Operating Range: V
with VEE = −4.2 V to −5.7 V
• Internal Input Pulldown Resistors on D, CLK, S, and R
• Meets or Exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
• Moisture Sensitivity Level 1
For Additional Information, see Application Note AND8003/D
• Flammability Rating: UL 94 V−0 @ 0.125 in,
Oxygen Index: 28 to 34
• Metastability 125 ps (see Application Note AN1504)
• Transistor Count = 79 devices
• Pb−Free Packages are Available
= 4.2 V to 5.7 V
CC
= 0 V
CC
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1
SOIC−8
D SUFFIX
CASE 751
8
1
TSSOP−8
DT SUFFIX
CASE 948R
DFN8
MN SUFFIX
CASE 506AA
H = MC10
K = MC100
4T = MC10
2I = MC100
A = Assembly Location
8
1
8
1
MARKING
DIAGRAMS*
8
HEL31
ALYW
G
HL31
ALYWG
G
4T M G
14
L = Wafer Lot
Y = Year
W = Work Week
M = Date Code
G = Pb−Free Package
See detailed ordering and shipping information in the package
dimensions section on page 6 of this data sheet.
1Publication Order Number:
MC10EL31/D
MC10EL31, MC100EL31
Table 1. TRUTH TABLE
1
S
8
V
CC
D
S*
R*
CLK
Q
2
D
D
3
45
R
Figure 1. Logic Diagram and Pinout Assignment
Table 3. MAXIMUM RATINGS
S
Q
7
H
X
X
X
L
L
L
H
L
H
L
L
L
H
H
Z
Z
X
X
X
L
H
H
L
Undef
Z = LOW to HIGH Transition
6
QCLK
R
V
EE
* Pins will default low when left open.
Table 2. PIN DESCRIPTION
PIN
FUNCTION
SECL Set Input
DECL Data Input
RECL Reset Input
CLKECL Clock Input
Q, QECL Data Outputs
V
CC
V
EE
Positive Supply
Negative Supply
EP(DFN8 only) Thermal exposed pad
must be connected to a sufficient
thermal conduit. Electrically connect
to the most negative supply (GND) or
leave unconnected, floating open.
SymbolParameterCondition 1Condition 2RatingUnit
V
CC
V
EE
V
I
I
out
T
A
T
stg
q
JA
q
JC
q
JA
q
JC
q
JA
T
sol
q
JC
PECL Mode Power SupplyVEE = 0 V8V
NECL Mode Power SupplyVCC = 0 V−8V
PECL Mode Input Voltage
NECL Mode Input Voltage
Output CurrentContinuous
VEE = 0 V
VCC = 0 V
Surge
VI V
VI V
CC
EE
6
−6
50
100
V
V
mA
mA
Operating Temperature Range−40 to +85°C
Storage Temperature Range−65 to +150°C
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
SOIC−8
SOIC−8
190
130
°C/W
°C/W
Thermal Resistance (Junction−to−Case)Standard BoardSOIC−841 to 44°C/W
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
TSSOP−8
TSSOP−8
185
140
°C/W
°C/W
Thermal Resistance (Junction−to−Case)Standard BoardTSSOP−841 to 44 ± 5%°C/W
Thermal Resistance (Junction−to−Ambient)0 lfpm
500 lfpm
Wave SolderPb
Pb−Free
<2 to 3 sec @ 248°C
<2 to 3 sec @ 260°C
DFN8
DFN8
129
84
265
265
°C/W
°C/W
°C
Thermal Resistance (Junction−to−Case)(Note 1)DFN835 to 40°C/W
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
Output HIGH Voltage (Note 5)392040104110402041054190409041854280mV
Output LOW Voltage (Note 3)305032003350305032103370305032273405mV
Input HIGH Voltage377041103870419039404280mV
Input LOW Voltage305035003050352030503555mV
Input HIGH Current150150150
Input LOW Current0.50.50.3
mA
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
2. Input and output parameters vary 1:1 with VCC. VEE can vary +0.25 V / −0.5 V.
3. Outputs are terminated through a 50 ohm resistor to VCC−2 volts.
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
4. Input and output parameters vary 1:1 with VCC. VEE can vary +0.25 V / −0.5 V.
5. Outputs are terminated through a 50 ohm resistor to VCC−2 volts.
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