ON Semiconductor ESDM1051 User Manual

5.5V ESD Protection Diodes
Micropackaged Diodes for ESD Protection
ESDM1051
www.onsemi.com
Features
Low Capacitance (22 pF Typ, I/O to GND)
Small Body Outline Dimensions 01005 Size: 0.445 x 0.240 mm
Protection for the Following IEC Standards:
IEC 61000−4−2 (Level 4)
Low ESD Clamping Voltage
These Devices are PbFree, Halogen Free/BFR Free and are RoHS
Compliant
MAXIMUM RATINGS (T
Rating
Operating Junction Temperature Range T
Storage Temperature Range T
Lead Solder Temperature Maximum (10 Seconds)
ESDM1051: IEC 61000−4−2 Contact IEC 61000−4−2 Air
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.
See Application Note AND8308/D for further description of survivability specs.
= 25°C unless otherwise noted)
J
Symbol Value Unit
J
stg
T
L
ESD
55 to +125 °C
55 to +150 °C
260 °C
±30 ±30
kV kV
X4DFN2 (01005)
CASE 718AA
MARKING DIAGRAM
LM
L = Specific Device Code M = Date Code
PIN CONFIGURATION
AND SCHEMATIC
12
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of this data sheet.
© Semiconductor Components Industries, LLC, 2016
March, 2021 Rev. 0
1 Publication Order Number:
ESDM1051/D
ESDM1051
ELECTRICAL CHARACTERISTICS (T
Parameter
Reverse Working Voltage V
Breakdown Voltage V
Reverse Leakage Current I
Clamping Voltage TLP (Note 1)
Symbol Conditions Min Ty p Max Unit
RWM
BR
R
V
= 25°C unless otherwise specified)
A
I/O Pin to GND 5.5 V
IT = 1 mA, I/O Pin to GND 6.1 6.8 8.2 V
V
= 5.5 V, I/O Pin to GND 0.1
RWM
IPP = 8 A IEC 61000−4−2 Level 2 equivalent
C
7.5
(±4 kV Contact, ±8 kV Air)
IPP = 16 A
IEC 61000−4−2 Level 2 equivalent
8.4
mA
V
(±8 kV Contact, ±16 kV Air)
Reverse Peak Pulse Current I
Clamping Voltage V
Dynamic Resistance R
Junction Capacitance C
PP
C
DYN
J
IEC61000−4−5 (8x20 ms)
IPP = 11 A, (8/20 ms pulse)
100 ns TLP Pulse 0.11
VR = 0 V, f = 1 MHz 22 25 pF
11 13 A
8.0 8.8 V
W
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions.
1. ANSI/ESD STM5.5.1 − Electrostatic Discharge Sensitivity Testing using Transmission Line Pulse (TLP) Model. TLP conditions: Z
= 50 W, tp = 100 ns, tr = 1 ns, averaging window; t1 = 70 ns to t2 = 90 ns.
0
ORDERING INFORMATION
Device Package Shipping
ESDM1051MX4T5G X4DFN2 (01005)
10,000 / Tape & Reel
(PbFree)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
www.onsemi.com
2
ESDM1051
TYPICAL CHARACTERISTICS
30
25
20
15
10
Voltage (V)
5
0
5
10
20
0 20 40 60 80 100 120 140
Time (ns)
Figure 1. ESD Clamping Voltage
Positive 8 kV Contact per IEC61000−4−2
20 10
18 9
16 8
14 7
12 6
(A)
10 5
TLP
I
84
63
42
21
0
0
1234567891011121314
V
(V)
CTLP
0
10
5
0
5
10
Voltage (V)
15
20
25
30
20
0 20 40 60 80 100 120 140
Time (ns)
Figure 2. ESD Clamping Voltage
Negative 8 kV Contact per IEC61000−4−2
20 10
18 9
16 8
14 7
12 6
(A)
10 5
Eq (kV)
TLP
I
84
IEC
V
63
42
21
0
0
1234567891011121314
V
(V)
CTLP
Figure 3. Positive TLP IV Curve Figure 4. Negative TLP I−V Curve
0
Eq (kV)
IEC
V
10
9
8
7
6
(A)
PK
5
@ I
4
C
V
3
2
1
0
0
2 4 6 8 10 12 14
135791113
IPK (A)
Figure 5. Positive Clamping Voltage vs. Peak
Pulse Current (tp = 8/20 ms)
10
9
8
7
6
(A)
PK
5
@ I
4
C
V
3
2
1
0
0
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3
2 4 6 8 10 12 14
135791113
IPK (A)
Figure 6. Negative Clamping Voltage vs. Peak
Pulse Current (tp = 8/20 ms)
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