5.5V ESD Protection Diodes
Micro−packaged Diodes for ESD
Protection
ESDM1051
The ESDM1051 Series is designed to protect voltage sensitive
components from ESD. Excellent clamping capability, low leakage,
and fast response time provide best in class protection on designs that
are exposed to ESD. Because of its small size, it is suited for use in
smartphone, smart−watch, or many other portable / wearable
applications where board space comes at a premium.
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Features
• Low Capacitance (22 pF Typ, I/O to GND)
• Small Body Outline Dimensions − 01005 Size: 0.445 x 0.240 mm
• Protection for the Following IEC Standards:
IEC 61000−4−2 (Level 4)
• Low ESD Clamping Voltage
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
MAXIMUM RATINGS (T
Rating
Operating Junction Temperature Range T
Storage Temperature Range T
Lead Solder Temperature −
Maximum (10 Seconds)
ESDM1051:
IEC 61000−4−2 Contact
IEC 61000−4−2 Air
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
See Application Note AND8308/D for further description of
survivability specs.
= 25°C unless otherwise noted)
J
Symbol Value Unit
J
stg
T
L
ESD
−55 to +125 °C
−55 to +150 °C
260 °C
±30
±30
kV
kV
X4DFN2 (01005)
CASE 718AA
MARKING DIAGRAM
LM
L = Specific Device Code
M = Date Code
PIN CONFIGURATION
AND SCHEMATIC
12
ORDERING INFORMATION
See detailed ordering and shipping information on page 2 of
this data sheet.
© Semiconductor Components Industries, LLC, 2016
March, 2021 − Rev. 0
1 Publication Order Number:
ESDM1051/D
ESDM1051
ELECTRICAL CHARACTERISTICS (T
Parameter
Reverse Working Voltage V
Breakdown Voltage V
Reverse Leakage Current I
Clamping Voltage
TLP (Note 1)
Symbol Conditions Min Ty p Max Unit
RWM
BR
R
V
= 25°C unless otherwise specified)
A
I/O Pin to GND 5.5 V
IT = 1 mA, I/O Pin to GND 6.1 6.8 8.2 V
V
= 5.5 V, I/O Pin to GND 0.1
RWM
IPP = 8 A IEC 61000−4−2 Level 2 equivalent
C
7.5
(±4 kV Contact, ±8 kV Air)
IPP = 16 A
IEC 61000−4−2 Level 2 equivalent
8.4
mA
V
(±8 kV Contact, ±16 kV Air)
Reverse Peak Pulse Current I
Clamping Voltage V
Dynamic Resistance R
Junction Capacitance C
PP
C
DYN
J
IEC61000−4−5 (8x20 ms)
IPP = 11 A, (8/20 ms pulse)
100 ns TLP Pulse 0.11
VR = 0 V, f = 1 MHz 22 25 pF
11 13 A
8.0 8.8 V
W
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
1. ANSI/ESD STM5.5.1 − Electrostatic Discharge Sensitivity Testing using Transmission Line Pulse (TLP) Model.
TLP conditions: Z
= 50 W, tp = 100 ns, tr = 1 ns, averaging window; t1 = 70 ns to t2 = 90 ns.
0
ORDERING INFORMATION
Device Package Shipping
ESDM1051MX4T5G X4DFN2 (01005)
10,000 / Tape & Reel
(Pb−Free)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
†
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2
ESDM1051
TYPICAL CHARACTERISTICS
30
25
20
15
10
Voltage (V)
5
0
−5
−10
−20
0 20 40 60 80 100 120 140
Time (ns)
Figure 1. ESD Clamping Voltage
Positive 8 kV Contact per IEC61000−4−2
20 10
18 9
16 8
14 7
12 6
(A)
10 5
TLP
I
84
63
42
21
0
0
1234567891011121314
V
(V)
CTLP
0
10
5
0
−5
−10
Voltage (V)
−15
−20
−25
−30
−20
0 20 40 60 80 100 120 140
Time (ns)
Figure 2. ESD Clamping Voltage
Negative 8 kV Contact per IEC61000−4−2
−20 10
−18 9
−16 8
−14 7
−12 6
(A)
−10 5
Eq (kV)
TLP
I
−84
IEC
V
−63
−42
−21
0
0
1234567891011121314
V
(V)
CTLP
Figure 3. Positive TLP I−V Curve Figure 4. Negative TLP I−V Curve
0
Eq (kV)
IEC
V
10
9
8
7
6
(A)
PK
5
@ I
4
C
V
3
2
1
0
0
2 4 6 8 10 12 14
135791113
IPK (A)
Figure 5. Positive Clamping Voltage vs. Peak
Pulse Current (tp = 8/20 ms)
10
9
8
7
6
(A)
PK
5
@ I
4
C
V
3
2
1
0
0
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3
2 4 6 8 10 12 14
135791113
IPK (A)
Figure 6. Negative Clamping Voltage vs. Peak
Pulse Current (tp = 8/20 ms)