ON Semiconductor ESD5581 User Manual

ESD5581
s
ESD Protection Diode
Micro−Packaged Diodes for ESD Protection
The ESD5581 is designed to protect voltage sensitive components that require low capacitance from ESD and transient voltage events. Excellent clamping capability, low capacitance, low leakage, and fast response time, make these parts ideal for ESD protection on designs where board space is at a premium.
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Features
Low Clamping Voltage
Small Body Outline Dimensions: 0.62 mm x 0.32 mm
Low Body Height: 0.3 mm
Stand−off Voltage: 5 V
IEC61000−4−2 Level 4 ESD Protection
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
Typical Applications
mSD Card Protection
Audio Line Protection
GPIO
MAXIMUM RATINGS
Rating Symbol Value Unit
IEC 61000−4−2 (ESD) Contact
Total Power Dissipation on FR−5 Board (Note 1) @ TA = 25°C Thermal Resistance, Junction−to−Ambient
Junction and Storage Temperature Range TJ, T Lead Solder Temperature − Maximum
(10 Second Duration)
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.
1. FR−5 = 1.0 x 0.75 x 0.62 in.
Air
°P
R
°
D
q
JA
stg
T
L
±30 ±30
250 400
−55 to +150 °C 260 °C
kV
mW
°C/W
1
X3DFN2
CASE 152AF
5 = Specific Device Code M = Date Code
X2DFN2
CASE 714AB
YC = Specific Device Code M = Date Code
ORDERING INFORMATION
Device Package Shipping
ESD5581MXT5G X3DFN2
(Pb−Free)
ESD5581N2T5G X2DFN2
(Pb−Free)
2
MARKING DIAGRAM
PIN 1
5
M
YC M
10000 / Tape &
Reel
8000 / Tape &
Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD801 1/D.
See Application Note AND8308/D for further description of survivability specs.
© Semiconductor Components Industries, LLC, 2017
September, 2018 − Rev. 8
1 Publication Order Number:
ESD5581/D
ESD5581
VOLTAGE (V)
60
10
0
ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise noted)
Symbol
V
I
PP
V
RWM
I
V
I
Maximum Reverse Peak Pulse Current Clamping Voltage @ I
C
Working Peak Reverse Voltage Maximum Reverse Leakage Current @ V
R
Breakdown Voltage @ I
BR
Test Current
T
*See Application Note AND8308/D for detailed explanations of
Parameter
PP
RWM
T
VCV
V
RWM
BR
Bi−Directional
I
I
PP
I
T
I
R
I
V
RWM
V
R
I
T
I
PP
BR
V
V
C
datasheet parameters.
ELECTRICAL CHARACTERISTICS (T
Parameter
Reverse Working Voltage V Breakdown Voltage (Note 2) V Reverse Leakage Current I Clamping Voltage (Note 3) V Clamping Voltage (Note 3) V Clamping Voltage (Note 3) V Clamping Voltage (Note 4) V Peak Pulse Current (Note 3) I Clamping Voltage
TLP (Note 5) Dynamic Resistance R
Junction Capacitance C
Symbol Conditions Min Typ Max Unit
RWM
BR R
PP
V
DYN
= 25°C unless otherwise specified)
A
IT = 1 mA 5.2 6.2 7.5 V V
= 5 V 0.1
RWM
IPP = 1 A 8.0 V
C
IPP = 4 A 10 V
C
IPP = 6 A 10.3 12 V
C
IEC61000−4−2, ±8 kV Contact See Figures 1 & 2 V
C
6.0 A 11 V
C
tP = 8/20 ms
IPP = 16 A
IEC 61000−4−2 Level 4 equivalent (±8 kV Contact, ±15 kV Air)
TLP Pulse 0.22 VR = 0 V, f = 1 MHz 10 pF
J
5.0 V
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions.
2. Breakdown voltage is tested from pin 1 to 2 and pin 2 to 1.
3. Non−repetitive current pulse at T
4. For test procedure see Figure 10 and application note AND8307/D.
= 25°C, per IEC61000−4−5 waveform. (See Figure 12)
A
5. ANSI/ESD STM5.5.1 − Electrostatic Discharge Sensitivity Testing using Transmission Line Pulse (TLP) Model. TLP conditions: Z
= 50 W, tp = 100 ns, tr = 4 ns, averaging window; t1 = 30 ns to t2 = 60 ns.
0
TYPICAL CHARACTERISTICS
mA
W
40
30
20
10
0
−10
−20 0 20 40 60 80 10050120 140 TIME (ns)
Figure 1. ESD Clamping Voltage Screenshot
Positive 8 kV Contact per IEC61000−4−2
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−10
−20
−30
VOLTAGE (V)
−40
−50
−60
−20 0 20 40 60 80 1000120 14 TIME (ns)
Figure 2. ESD Clamping Voltage Screenshot
Negative 8 kV Contact per IEC61000−4−2
2
ESD5581
TYPICAL CHARACTERISTICS
1.E−02
1.E−03
1.E−04
1.E−05
1.E−06
I1 (A)
1.E−07
1.E−08
1.E−09
1.E−10
1.E−11
−8 −6 −4 −2 0 2 4 V1 (V)
Figure 3. IV Characteristics Figure 4. CV Characteristics
16 14 12 10
9 8 7 6 5 4
C (pF)
3 2 1 0
−5 −4 −3 −2 −1 0 1 2 368 45 VBias (V)
8 6
CAPACITANCE (pF)
4 2 0
0.00 0.25 0.50 0.75 1.00 1.25 1.50 FREQUENCY (GHz)
Figure 5. Capacitance over Frequency
20 18 16 14 12 10
8 6
TLP CURRENT (A)
4 2 0
048121620
2 6 10 14 18 0 4 8 12 16 202 6 10 14 18
VC, VOLTAGE (V)
Figure 6. Positive TLP I−V Curve Figure 7. Negative TLP I−V Curve
−20
−18
−16
−14
−12
−10
−8
−6
TLP CURRENT (A)
−4
−2 0
1.75 2.00
VC, VOLTAGE (V)
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