The CD4511BM/CD4511BC BCD-to-seven segment latch/
decoder/driver is constructed with complementary MOS
(CMOS) enhancement mode devices and NPN bipolar output drivers in a single monolithic structure. The circuit provides the functions of a 4-bit storage latch, an 8421 BCD-toseven segment decoder, and an output drive capability.
Lamp test (LT), blanking (BI), and latch enable (LE) inputs
are used to test the display, to turn-off or pulse modulate
the brightness of the display, and to store a BCD code,
respectively. It can be used with seven-segment light emitting diodes (LED), incandescent, fluorescent, gas discharge,
or liquid crystal readouts either directly or indirectly.
Applications include instrument (e.g., counter, DVM, etc.)
display driver, computer/calculator display driver, cockpit
display driver, and various clock, watch, and timer uses.
Connection Diagram
Dual-In-Line Package
TL/F/5991– 1
Top View
Order Number CD4511B
Segment Identification
Features
Y
Low logic circuit power dissipation
Y
High current sourcing outputs (up to 25 mA)
Y
Latch storage of code
Y
Blanking input
Y
Lamp test provision
Y
Readout blanking on all illegal input combinations
*Depends upon the BCD code applied during the 0 to 1 transition of LE.
Display
TL/F/5991– 3
TL/F/5991– 2
C
1995 National Semiconductor CorporationRRD-B30M105/Printed in U. S. A.
TL/F/5991
Page 2
Absolute Maximum Ratings (Notes1&2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
DC Supply Voltage (V
DD
)
Input Voltage (VIN)
Storage Temperature Range (T
)
S
b
0.5V toa18V
b
0.5V to V
b
65§Ctoa150§C
DD
a
Power Dissipation (PD)
Dual-In-Line700 mW
Small Outline500 mW
Lead Temperature (T
(Soldering, 10 seconds)260
)
L
DC Electrical Characteristics CD4511BM
SymbolParameterConditions
I
DD
V
OL
QuiescentV
Supply Current V
Output Voltage V
Logical ‘‘0’’V
LevelV
V
OH
Output Voltage V
Logical ‘‘1’’V
LevelV
V
V
V
IL
IH
OH
Low LevelV
Input VoltageV
High LevelV
Input VoltageV
OutputV
(Source) DriveV
VoltageV
I
OL
I
IN
Low LevelV
Output Current V
Input CurrentV
Note 1: Devices should not be connected with power on.
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SEMICONDUCTOR CORPORATION. As used herein:
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systems which, (a) are intended for surgical implantsupport device or system whose failure to perform can
into the body, or (b) support or sustain life, and whosebe reasonably expected to cause the failure of the life
failure to perform, when properly used in accordancesupport device or system, or to affect its safety or
with instructions for use provided in the labeling, caneffectiveness.
be reasonably expected to result in a significant injury
to the user.
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