See detailed ordering and shipping information in the package
dimensions section on page 4 of this data sheet.
1Publication Order Number:
NL17SZ16/D
NL17SZ16
MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
V
I
I
OK
I
OUT
I
CC
I
GND
T
STG
T
T
q
P
MSLMoisture SensitivityLevel 1
F
ESDESD ClassificationHuman Body Model (Note 3)
I
Latchup
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. IO Absolute Maximum Rating Must be Obtained.
3. Tested to EIA/JESD22−A114−A, rated to EIA/JESD22−A114−B.
4. Tested to EIA/JESD22−A115−A, rated to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
DC Supply Voltage*0.5 to )7.0V
CC
DC Input VoltageOutput in High or Low State (Note 2)*0.5 v VI v )7.0V
I
DC Output VoltageVI < GND*0.5 v VO v )7.0V
O
DC Input Diode CurrentVO < GND*50mA
IK
DC Output Diode Current*50mA
DC Output Sink Current$50mA
DC Supply Current per Supply Pin$100mA
DC Ground per Supply Pin$100mA
Storage Temperature Range*65 to )150°C
Lead Temperature, 1 mm from Case for 10 Seconds260°C
L
Junction Temperature Under Bias)150°C
J
Thermal ResistanceSOT−353
JA
Power Dissipation in Still Air at 85°CSOT−353
D
Flammability RatingOxygen Index: 28 to 34UL 94 V−0 @ 0.125 in
R
SOT−553
SOT−553
350
360
150
180
Class IC
Machine Model (Note 4)
Charged Device Model (Note 5)
Class A
N/A
Latchup PerformanceAbove VCC and Below GND at 85°C (Note 6)$500mA
°C/W
mW
V
RECOMMENDED OPERATING CONDITIONS
SymbolParameterMinMaxUnit
V
V
V
OUT
T
tr, t
DC Supply VoltageOperations Only
CC
DC Input Voltage05.5V
IN
Data Retention
1.65
1.5
DC Output Voltage05.5V
Operating Temperature Range*40)85°C
A
Input Rise and Fall TimeVCC = 2.5 V $0.2 V
f
VCC = 3.0 V $0.3 V
VCC = 5.0 V $0.5 V
0
0
0
5.5
5.5
20
10
5
http://onsemi.com
2
V
ns/V
NL17SZ16
l
t
l
t
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
IOH = −100 mA
IOH = −3 mA
IOH = −8 mA
IOH = −12 mA
IOH = −16 mA
IOH = −24 mA
IOH = −32 mA
Low−Level Output Voltage
VIN = V
or V
IH
OH
IOL = 100 mA
IOL = 4 mA
IOL = 8 mA
IOL = 12 mA
IOL = 16 mA
IOL = 24 mA
IOL = 32 mA
Input Leakage CurrentVIN = VCC or GND0 to 5.5$0.1$1.0
Power Off−Output Leakage
Current
V
= 5.5 V0110
OUT
Quiescent Supply CurrentVIN = VCC or GND5.5110
V
CC
(V)
2.3 to 5.5
2.3 to 5.5
1.65 to 5.5
1.65
2.3
2.7
3.0
3.0
4.5
1.65 to 5.5
1.65
2.3
2.7
3.0
3.0
4.5
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
= 130°C
= 120°C
= 110°C
= 100°C
= 90°C
J
J
J
T
T
J
T
T
= 80°C
J
J
T
T
1
110100
NORMALIZED FAILURE RATE
TIME, YEARS
1000
Figure 3. Failure Rate vs. Time Junction Temperature
TA = 255C*405C v TA v 855C
MinTypMaxMinMax
0.75 V
CC
0.7 V
CC
VCC − 0.1
1.29
1.9
2.2
2.4
2.3
3.8
V
CC
1.52
2.1
2.4
2.7
2.5
4.0
0.0
0.08
0.20
0.22
0.28
0.38
0.42
0.25 V
0.3 V
0.1
0.24
0.3
0.4
0.4
0.55
0.55
CC
CC
0.75 V
CC
0.7 V
CC
VCC − 0.1
1.29
1.9
2.2
2.4
2.3
3.8
0.25 V
0.3 V
0.1
0.24
0.3
0.4
0.4
0.55
0.55
CC
CC
Uni
V
V
V
V
mA
mA
mA
AC ELECTRICAL CHARACTERISTICS t
Symbo
t
PLH
t
PHL
ParameterCondition
Propagation Delay
(Figure 4 and 5)
= tF = 3.0 ns
R
RL = 1 MW, C
RL = 500 W, C
= 15 pF
L
= 50 pF
L
V
CC
(V)
1.65
1.8
2.5 $ 0.2
3.3 $ 0.3
5.0 $ 0.5
3.3 $ 0.3
5.0 $ 0.5
TA = 255C*405C v TA v 855C
MinTypMaxMinMax
2.0
2.0
0.8
0.5
0.5
1.5
0.8
5.3
4.4
2.9
2.1
1.8
2.9
2.4
11.4
9.5
6.5
4.5
3.9
5.0
4.3
2.0
2.0
0.8
0.5
0.5
1.5
0.8
12
10
7.0
4.7
4.1
5.2
4.5
Uni
ns
http://onsemi.com
3
NL17SZ16
CAPACITIVE CHARACTERISTICS
SymbolParameterConditionTypicalUnit
C
C
7. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.
Average operating current can be obtained by the equation: I
power consumption; PD = CPD V
Input CapacitanceVCC = 5.5 V, VI = 0 V or V
IN
Power Dissipation Capacitance
PD
(Note 7)
2
fin + ICC VCC.
CC
10 MHz, VCC = 3.3 V, VI = 0 V or V
10 MHz, VCC = 5.5 V, VI = 0 V or V
= CPD VCC fin + ICC. CPD is used to determine the no−load dynamic
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETERS
3. MAXIMUM LEAD THICKNESS INCLUDES
LEAD FINISH THICKNESS. MINIMUM LEAD
THICKNESS IS THE MINIMUM THICKNESS
OF BASE MATERIAL.
DIMAMINNOMMAXMIN
b0.170.220.270.007
c
D1.501.601.700.059
E1.101.201.300.043
e0.50 BSC
L0.100.200.300.004
H
E
MILLIMETERS
0.500.550.600.020
0.080.130.18
1.501.601.700.0590.0630.067
0.0030.0050.007
INCHES
NOMMAX
0.0220.024
0.0090.011
0.0630.067
0.0470.051
0.020 BSC
0.0080.012
0.45
0.0177
1.0
1.35
0.0394
0.0531
0.5
0.5
0.0197
0.0197
mm
ǒ
SCALE 20:1
inches
Ǔ
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867Toll Free USA/Canada
Email: orderlit@onsemi.com
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5773−3850
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6
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
NL17SZ16/D
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