The CM1216 family of diode arrays provide sESD protection for
electronic components or sub−systems requiring minimal capacitive
loading. These devices are ideal for protecting systems with high data
and clock rates or for circuits requiring low capacitive loading. Each
ESD channel consists of a pair of diodes in series which steer the
positive or negative ESD current pulse to either the positive (V
negative (V
up to
N) supply rail. The CM1216 protects against ESD pulses
±15 kV per the IEC 61000−4−2 standard.
This device is particularly well−suited for protecting systems using
high−speed ports such as USB2.0, IEEE1394 (Firewire
Serial ATA, DVI, HDMI and corresponding ports in removable
storage, digital camcorders, DVD−RW drives and other applications
where extremely low loading capacitance with ESD protection are
required in a small package footprint.
Features
• Six and Eight Channels of ESD Protection
• Provides ±15 kV ESD Protection on Each Channel per the
IEC 61000−4−2 ESD Requirements
• Channel Loading Capacitance of 1.6 pF Typical
• Channel I/O to GND Capacitance Difference of 0.04 pF Typical
• Mutual Capacitance of 0.13 pF Typical
• Minimal Capacitance Change with Temperature and Voltage
• Each I/O Pin Can Withstand Over 1000 ESD Strikes
• SOIC and MSOP Packages
• These Devices are Pb−Free and are RoHS Compliant
Applications
• IEEE1394 Firewire
®
Ports at 400 Mbps / 800 Mbps
• DVI Ports, HDMI Ports in Notebooks, Set Top Boxes, Digital TVs,
LCD Displays
• Serial ATA Ports in Desktop PCs and Hard Disk Drives
• PCI Express Ports
• General Purpose High−Speed Data Line ESD Protection
®
, iLinkt),
P) or
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SOIC−8
SM SUFFIX
CASE 751AC
CH6V
CH1 CH2CH3
CH8V
MARKING DIAGRAM
XXXXX
AYWWG
G
ORDERING INFORMATION
DevicePackageShipping
CM1216−06SMSOIC
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
MSOP−8
MR SUFFIX
CASE 846AD
BLOCK DIAGRAM
CH5 CH4
P
V
N
CM1216−06SM
CM1216−06MR
CH7CH6 CH5
CH2CH1CH4CH3
XXXXXX = Specific Device Code
A= Assembly Location
Y= Year
WW= Work Week
G= Pb−Free Package
DC Voltage at any Channel Input(VN−0.5) to (VP+0.5)V
Operating Temperature Range
Ambient
Junction
−40 to +85
−40 to +125
Storage Temperature Range−40 to +150°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. All parameters specified at TA = −40°C to +85°C unless otherwise noted.
2. Standard IEC 61000−4−2 with C
3. From I/O pins to V
Parameter
Operating Supply Voltage
P
(V
)
P−VN
Operating Supply Current(VP−VN) = 3.3 V8
P
Diode Forward Voltage
F
Top Diode
IF = 20 mA; T
Bottom Diode
Channel Leakage CurrentT
Channel Input CapacitanceAt 1 MHz, V
IN
Channel Input Capacitance Matching0.04pF
IN
= 25°C; V
A
(Note 2)
Mutual Capacitance(VP−VN) = 3.3 V0.13pF
ESD Protection
Peak Discharge Voltage at any
T
= 25°C
A
(Notes 2 and 3)
channel input, in system,
contact discharge per
IEC 61000−4−2 standard
Channel Clamp Voltage
Positive Transients
I
PP
= 1 A, t
Negative Transients
Dynamic Resistance
Positive transients
I
PP
= 1 A, t
Negative transients
or V
only. VP bypassed to V
P
N
Discharge
= 150 pF, R
N
with low ESR 0.2 mF ceramic capacitor.
= 330 W, VP = 3.3 V, VN grounded.
Discharge
A
P
= 3.3 V, V
P
= 8/20 mS; T
P
= 8/20 mS; T
P
Conditions
= 25°C
= 5 V, V
MinTypMaxUnits
3.35.5V
0.6
0.8
0.6
0.8
= 0 V±0.1±1.0
N
= 0 V, V
N
= 1.65 V
IN
1.62.0pF
±15
= 25°C
A
+9.0
−1.5
= 25°C
A
0.6
0.4
mA
V
0.95
0.95
mA
kV
V
W
PERFORMANCE CHARACTERISTICS
Figure 1. Typical Variation of CIN vs. V
(f = 1 MHz, VP= 3.3 V, VN = 0 V, 0.1 mF Chip Capacitor between VP and VN, TA = 255C)
IN
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3
CM1216
APPLICATION INFORMATION
Design Considerations
In order to realize the maximum protection against ESD pulses, care must be taken in the PCB layout to minimize parasitic
series inductances on the Supply/Ground rails as well as the signal trace segment between the signal input (typically
a connector) and the ESD protection device. Refer to Application of Positive ESD Pulse between Input Channel and Ground,
which illustrates an example of a positive ESD pulse striking an input channel. The parasitic series inductance back to the power
supply is represented by L
and L2. The voltage VCL on the line being protected is:
1
V
where I
= Fwd voltage drop of D
CL
is the ESD current pulse, and V
ESD
1
+ V
SUPPLY
SUPPLY
+ L1 x d(I
) / dt + L2 x d(I
ESD
is the positive supply voltage.
ESD
) / dt
An ESD current pulse can rise from zero to its peak value in a very short time. As an example, a level 4 contact discharge
per the IEC61000−4−2 standard results in a current pulse that rises from zero to 30 Amps in 1 ns. Here d(I
approximated by DI
increment in V
CL
/Dt, or 30/(1x10−9). So just 10 nH of series inductance (L
ESD
!
Similarly for negative ESD pulses, parasitic series inductance from the V
1
pin to the ground rail will lead to drastically
N
andL
combined) will lead to a 300 V
2
)/dt can be
ESD
increased negative voltage on the line being protected.
The CM1213 has an integrated Zener diode between V
L
on VCL by clamping VP at the breakdown voltage of the Zener diode. However, for the lowest possible VCL, especially when
2
V
is biased at a voltage significantly below the Zener breakdown voltage, it is recommended that a 0.22 μF ceramic chip
P
capacitor be connected between V
and the ground plane.
P
and VN. This greatly reduces the effect of supply rail inductance
P
As a general rule, the ESD Protection Array should be located as close as possible to the point of entry of expected
electrostatic discharges. The power supply bypass capacitor mentioned above should be as close to the V
pin of the Protection
P
Array as possible, with minimum PCB trace lengths to the power supply, ground planes and between the signal input and the
ESD device to minimize stray series inductance.
Additional Information
See also ON Semiconductor Application Note, “Design Considerations for ESD Protection”, in the Applications section.
L
1
POSITIVE SUPPLY
PATH OF ESD CURRENT PULSE (IESD)
D
1
C
ONE
1
CHANNEL
D
2
CHANNEL
INPUT
LINE BEING
PROTECTED
GROUND RAIL
SYSTEM OR
CIRCUITRY
BEING
PROTECTED
CHASSIS GROUND
Figure 2. Application of Positive ESD Pulse between Input Channel and Ground
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4
CM1216
PACKAGE DIMENSIONS
SOIC−8 EP
CASE 751AC−01
ISSUE B
2 X
LOCATION
8 X
SEATING
PLANE
C0.10
PIN ONE
C
D
A
E1
D
14
e
B
TOP VIEW
C0.10
C0.10
SIDE VIEW
SOLDERING FOOTPRINT*
2 X
A-B
C0.10
D
58
EXPOSED
PAD
F
58
E
8 X b
C
2 X
C0.20
BOTTOM VIEW
A-B0.25D
14
DETAIL A
G
AA
END VIEW
c
GAUGE
PLANE
H
b1
A
A2
L
A1
0.25
(L1)
DETAIL A
q
c1
SECTION A−A
NOTES:
1. DIMENSIONS AND TOLERANCING PER
ASME Y14.5M, 1994.
2. DIMENSIONS IN MILLIMETERS (ANGLES
IN DEGREES).
3. DIMENSION b DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE
0.08 MM TOTAL IN EXCESS OF THE “b”
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
4. DATUMS A AND B TO BE DETERMINED
AT DATUM PLANE H.
MILLIMETERS
h
(b)
DIM MINMAX
A1.351.75
A10.000.10
A21.351.65
b0.310.51
b10.280.48
c0.170.25
c10.170.23
D4.90 BSC
E6.00 BSC
E13.90 BSC
e1.27 BSC
L0.401.27
L11.04 REF
F2.243.20
G1.552.51
h0.250.50
q0 8
__
2.72
0.107
1.52
0.060
Exposed
Pad
7.0
0.275
0.024
2.03
0.08
0.6
4.0
0.155
1.270
0.050
SCALE 6:1
ǒ
inches
mm
Ǔ
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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5
CM1216
PACKAGE DIMENSIONS
MSOP 8, 3x3
CASE 846AD−01
ISSUE O
SYMBOL
A
A1
A2
b
c
E1E
D
E
E1
e
L
L10.95 REF
L2
θ
TOP VIEW
D
A2
A
MINNOMMAX
1.10
0.05
0.75
0.22
0.13
2.90
4.80
2.90
0.40
0.10
0.85
3.00
4.90
3.00
0.65 BSC
0.60
0.25 BSC
0.15
0.95
0.38
0.23
3.10
5.00
3.10
0.80
0º6º
DETAIL A
A1eb
SIDE VIEWEND VIEW
Notes:
(1) All dimensions are in millimeters. Angles in degrees.
(2) Complies with JEDEC MO-187.
c
q
L2
L
L1
DETAIL A
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6
CM1216
PACKAGE DIMENSIONS
MSOP 10, 3x3
CASE 846AE−01
ISSUE O
SYMBOLMINNOMMAX
A
A1
A2
b
c
E1E
D
E
E1
0.00
0.75
0.17
0.13
2.90
4.75
2.90
e
L
0.40
0.05
0.85
3.00
4.90
3.00
0.50 BSC
0.60
L10.95 REF
L2
θ
0º8º
0.25 BSC
1.10
0.15
0.95
0.27
0.23
3.10
5.05
3.10
0.80
DETAIL A
TOP VIEW
D
A2
A
c
END VIEW
A1eb
q
SIDE VIEW
L2
Notes:
(1) All dimensions are in millimeters. Angles in degrees.
(2) Complies with JEDEC MO-187.
L
L1
DETAIL A
FireWire is a registered trademark of Apple Computer. Inc.
iLink is a trademark of S. J. Electro Systems, Inc.
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867Toll Free USA/Canada
Email: orderlit@onsemi.com
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5773−3850
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7
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
CM1216/D
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