S
1
D
1
G1S
2
msd901
D
2
G
2
PMGD780SN
Dual N-channel μ TrenchMOS standard level FET
Rev. 02 — 19 April 2010 Product data sheet
1. Product profile
1.1 General description
Dual N-channel enhancement mode field-effect transistor in a small SOT363 (SC-88)
Surface-Mounted Device (SMD) plastic package using TrenchMOS technology.
1.2 Features and benefits
Surface-mounted package Footprint 40 % smaller than SOT23
Standard level threshold voltage Fast switching
Low on-state resistance Dual device
1.3 Applications
Driver circuits Switching in portable appliances
1.4 Quick reference data
V
P
≤ 60 V ID≤ 0.49 A
DS
≤ 0.41 W R
tot
2. Pinning information
Table 1. Pinning - SOT363 (SC-88), simplified outline and symbol
Pin Description Simplified outline Graphic symbol
1 source1 (S1)
2 gate1 (G1)
3 drain2 (D2)
4 source2 (S2)
5 gate2 (G2)
6 drain1 (D1)
≤ 920 mΩ
DSon
SOT363 (SC-88)
NXP Semiconductors
3. Ordering information
PMGD780SN
Dual N-channel μ TrenchMOS standard level FET
Table 2. Ordering information
Type number Package
PMGD780SN SC-88 plastic surface-mounted package; 6 leads SOT363
Name Description Ver s ion
4. Limiting values
Table 3. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
DS
V
DGR
V
GS
I
D
I
DM
P
tot
T
stg
T
j
Source-drain diode
I
S
I
SM
drain-source voltage 25 °C ≤ T j≤ 150 °C- 6 0 V
drain-gate voltage 25 °C ≤ T j≤ 150 °C; RGS=20kΩ -6 0V
gate-source voltage - ±20 V
drain current Tsp=25° C; VGS=10V; Figure 2 and 3
peak drain current Tsp=25° C; pulsed; tp≤ 10 μs; Figure 3
total power dissipation Tsp=25°C; Figure 1 -0 . 4 1 W
storage temperature −55 +150 °C
junction temperature −55 +150 °C
source current Tsp=25°C
peak source current Tsp=25° C; pulsed; tp≤ 10 μs
[1]
-0 . 4 9 A
=100°C; V GS=10V; Figure 2
T
sp
[1]
-0 . 3 1 A
[1]
-0 . 9 9 A
[1]
-0 . 3 4 A
[1]
-0 . 6 9 A
[1] Single device conducting.
PMGD780SN_2 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 02 — 19 April 2010 2 of 14
NXP Semiconductors
Tsp (° C)
0 200 150 50 100
03aa17
40
80
120
P
der
(%)
0
Tsp (° C)
0 200 150 50 100
03aa25
40
80
120
I
der
(%)
0
P
der
P
tot
P
tot 25 C°()
------------ -----------
100%×=
I
der
I
D
I
D25C
°
()
------------ -------
100%×=
03an22
10
-3
10
-2
10
-1
1
10
10
-1
1 10 10
2
VDS(V)
I
D
(A)
DC
10 ms
Limit R
DSon
= V
DS
/ I
D
1 ms
tp = 10 μs
100 ms
100 μs
PMGD780SN
Dual N-channel μ TrenchMOS standard level FET
Fig 1. Normalized total power dissipation as a
function of solder point temperature
Fig 2. Normalized continuous drain current as a
function of solder point temperature
Tsp=25° C; IDM is single pulse; VGS=10V
Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage
PMGD780SN_2 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 02 — 19 April 2010 3 of 14
NXP Semiconductors
03an28
1
10
10
2
10
3
10
-4
10
-3
10
-2
10
-1
1 10
tp (s)
Z
th(j-sp)
(K/W)
single pulse
δ
= 0.5
0.2
0.1
0.05
0.02
t
p
t
p
T
P
t
T
δ =
5. Thermal characteristics
PMGD780SN
Dual N-channel μ TrenchMOS standard level FET
Table 4. Thermal characteristics
Symbol Parameter Conditions Min Typ Max Unit
R
th(j-sp)
thermal resistance from junction to solder point Figure 4 - - 300 K/W
Fig 4. Transient thermal impedance from junction to solder point as a function of pulse duration
PMGD780SN_2 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 02 — 19 April 2010 4 of 14
NXP Semiconductors
6. Characteristics
PMGD780SN
Dual N-channel μ TrenchMOS standard level FET
Table 5. Characteristics
=25°C unless otherwise specified.
T
j
Symbol Parameter Conditions Min Typ Max Unit
Static characteristics
V
(BR)DSS
V
GS(th)
drain-source breakdown voltage ID= 250 μ A; VGS=0V
=25° C 6 0--V
T
j
= − 55 ° C 5 5--V
T
j
gate-source threshold voltage ID= 0.25 mA; VDS=VGS; Figure 9
Tj=25° C 122 . 5V
=150° C0 . 6−−V
T
j
= − 55 ° C −− 3.5 V
T
j
I
DSS
I
GSS
R
DSon
drain leakage current VDS=60V; VGS=0V
=25° C- 0 . 0 5 1μA
T
j
=150° C - - 100 μA
T
j
gate leakage current VGS= ± 20 V; VDS= 0 V - 10 100 nA
drain-source on-state resistance VGS=10V; ID=0.3A; Figure 7 and 8
Tj=25° C - 780 920 mΩ
=150° C - 1445 1700 mΩ
T
V
GS
j
= 4.5 V; ID=0.075A; Figure 7 and 8 -1 1 0 0 1 4 0 0 mΩ
Dynamic characteristics
Q
Q
Q
C
C
C
t
d(on)
t
r
t
d(off)
t
f
G(tot)
GS
GD
iss
oss
rss
total gate charge ID=1A; VDD=30V; VGS=10V; Figure 13 -1 . 0 5 -n C
gate-source charge - 0.2 - nC
gate-drain charge - 0.22 - nC
input capacitance VGS=0V; VDS= 30 V; f = 1 MHz; Figure 11 -2 3-p F
output capacitance - 5 - pF
reverse transfer capacitance - 3.5 - pF
turn-on delay time VDD=30V; RL=30Ω ; VGS=10V; RG=6Ω -2-n s
rise time -4-n s
turn-off delay time - 5 - ns
fall time -2 . 2-n s
Source-drain diode
V
SD
source-drain voltage IS= 0.3 A; VGS=0V; Figure 12 - 0.83 1.2 V
PMGD780SN_2 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 02 — 19 April 2010 5 of 14