NPN/NPN low V
(SC-74) Surface Mounted Device (SMD) plastic package.
PNP/PNP complement: PBSS5160DS.
1.2 Features
Low collector-emitter saturation voltage V
High collector current capability: IC and I
High collector current gain (hFE) at high I
High efficiency due to less heat generation
Smaller required Printed-Circuit Board (PCB) area than for conventional transistors
(BISS) transistor
CEsat
Breakthrough In Small Signal (BISS) transistor pair in a SOT457
[1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.
[2] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for collector 1 cm
[3] Device mounted on a ceramic PCB, Al
, standard footprint.
2O3
[1]
-420mW
[2]
-560mW
[3]
-700mW
2
.
800
(1)
P
tot
(mW)
600
(2)
(3)
400
200
0
01601204080
(1) Ceramic PCB, Al2O3, standard footprint
(2) FR4PCB, mounting pad for collector 1 cm
(3) FR4PCB, standard footprint
Product data sheetRev. 04 — 11 December 2009 3 of 14
NXP Semiconductors
PBSS4160DS
6.Thermal characteristics
Table 6.Thermal characteristics
SymbolParameterConditionsMinTypMaxUnit
Per transistor
R
th(j-a)
R
th(j-sp)
Per device
R
th(j-a)
[1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.
[2] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for collector 1 cm
[3] Device mounted on a ceramic PCB, Al
thermal resistance from
junction to ambient
thermal resistance from
junction to solder point
thermal resistance from
junction to ambient
60 V, 1 A NPN/NPN low V
in free air
in free air
, standard footprint.
2O3
(BISS) transistor
CEsat
[1]
--431K/W
[2]
--338K/W
[3]
--278K/W
--105K/W
[1]
--298K/W
[2]
--223K/W
[3]
--179K/W
2
.
006aaa494
2
10
tp (s)
10
Z
th(j-a)
(K/W)
3
10
δ = 1
0.75
0.50
0.20
0.10
0.05
0.02
0.01
0
0.33
−4
10
−3
10
−2
−1
10
1
1010
2
10
10
1
−5
10
FR4 PCB, standard footprint
Fig 2.T ra nsient thermal impedance from junction to ambient as a function of pulse time; typical values