NPN/PNP general-purpose transistor pair in a very small SOT363 (SC-88)
Surface-Mounted Device (SMD) plastic package.
1.2 Features
n Low collector capacitance
n Low collector-emitter saturation voltage
n Closely matched current gain
n Reduces number of components and board space
n No mutual interference between the transistors
1.3 Applications
n General-purpose switching and amplification
1.4 Quick reference data
Table 1.Quick reference data
SymbolParameterConditionsMinTypMaxUnit
Per transistor; for the PNP transistor with negative polarity
V
I
h
CEO
C
FE
collector-emitter voltage open base--45V
collector current--100mA
DC current gainVCE=5V; IC= 2 mA200-450
Product data sheetRev. 04 — 18 February 20092 of 14
NXP Semiconductors
BC847BPN
45 V, 100 mA NPN/PNP general-purpose transistor
(1) FR4 PCB, mounting pad for collector 1 cm
(2) FR4 PCB, standard footprint
Fig 1.Per device: Power derating curves SOT363 (SC-88)
6.Thermal characteristics
500
P
tot
(mW)
400
300
200
100
0
−751751252575−25
006aab419
(1)
(2)
T
(°C)
amb
2
Table 6.Thermal characteristics
SymbolParameterConditionsMinTypMaxUnit
Per transistor
R
th(j-a)
R
th(j-sp)
thermal resistance from
junction to ambient
thermal resistance from
in free air
[1]
--568K/W
[2]
--500K/W
--230K/W
junction to solder point
Per device
R
th(j-a)
thermal resistance from
in free air
junction to ambient
[1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.
[2] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for collector 1cm2.
Product data sheetRev. 04 — 18 February 200912 of 14
NXP Semiconductors
12. Legal information
12.1Data sheet status
BC847BPN
45 V, 100 mA NPN/PNP general-purpose transistor
Document status
Objective [short] data sheetDevelopmentThis document contains data from the objective specification for product development.
Preliminary [short] data sheet QualificationThis document contains data from the preliminary specification.
Product [short] data sheetProductionThis document contains the product specification.
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product statusof device(s) described in this document mayhave changedsince this document was published and may differ incase of multiple devices. The latest product status
information is available on the Internet at URL
[1][2]
Product status
12.2Definitions
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[3]
http://www.nxp.com.
Definition
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
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representation or warranty that such applications will be suitable for the
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Limiting values — Stress above one or more limiting values (as defined in
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values for extended periods may affect device reliability.
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