NXP AN12898 User Manual

AN12898
JN5189-Power Consumption Analysis
Rev. 1 — 01/2021

Contents

1 Introduction

This application note describes the power consumption analysis on a DK6 board with a JN5189 module fitted.
To perform low-power measurements, the DK6 board is modified. This minimizes the leaking current and allows to measure very low currents. The modifications are described in the
Guide
As a reference for the measurements, the power-down and active currents are presented in the data sheet. They are compared to the measurements results.
Firstly, the power-down and RF-static currents are measured using the Customer Module Evaluation Tool (CMET/AN1242).
Secondly, they are measured from a profile based on a Zigbee event.
The CMET version is 2038 and its radio driver version is 2085. The static measurements are based on this radio driver.
The Zigbee event currents are based on the radio driver 2088. The software is a part of the SDK.
IoT-ZTB-DK006 Development Kit User
1 Introduction......................................1
2 Power consumption measurement
........................................................ 1
3 Power profile measurement............ 5
4 Conclusion.....................................20
5 Revision history.............................21
Application Note
Figure 1. DK6 board with JN5189 module

2 Power consumption measurement

2.1 Test setup description

2.1.1 Hardware configuration

The test setup is composed of:
NXP Semiconductors
Power consumption measurement
• One JN5189 module on a mezzanine board
• One modified DK6 board, as described in IoT-ZTB-DK006 Development Kit user guide UM11393
The test equipment chosen is a source/measure unit SMU (Keysight B2902A for instance). It is a power supply capable of measuring low currents.
Test setup block diagram is shown in Figure 2.
Figure 2. Test setup block diagram for static measurements
The VBAT supplies the JN5189 device under the test while the VDDTRGT is used to supply the rest of the board. The purpose is to measure the current on the JN5189 independently of the board consumption.
From a supply standpoint, VBAT = VDDTRGT.
The test connections are shown in Figure 3.
JN5189-Power Consumption Analysis, Rev. 1, 01/2021
Application Note 2 / 22
NXP Semiconductors
Power consumption measurement
JN5189-Power Consumption Analysis, Rev. 1, 01/2021
Application Note 3 / 22
NXP Semiconductors
Power consumption measurement

2.1.2 Software configuration

CMET is the software tool used for the power consumption measurement. It can be downloaded from the NXP website (CMET/AN1242).
As described in
AN1242), the low-power modes are shown in Table 1.
Table 1. Power down currents description
Power mode CPU CPU clock RAM Wake-up source
PM_DEEP_DOWN OFF OFF OFF Hardware reset, I/O event
PM_DOWN OFF OFF Variable size Retention HW reset, I/O event, wake-up timer
PM_SLEEP ON OFF ON Any interrupt
For this test, the CMET version used is shown in Figure 4.
Figure 4. CMET version
High Performance M68HC11 System Design Using The WSI PSD4XX and PSD5XX Families
(document

2.2 Power consumption in low-power modes

The power-down and deep power-down modes are covered by these measurements.
The currents measured with the CMET are shown in Table 2.
Table 2. CMET current measurements
Symbol Parameter Conditions
IDD Supply
current
Deep power-down (everything is powered off, wakeup on hardware reset only)
Deep power-down-IO (everything is powered off, wakeup on hardware reset only or an event on any of the 22 GPIOs and the NTAG interrupt)
Power-down (wakeup on hardware reset or an IO event, wake-up timer on, 32 kHz FRO on, no SRAM retention)
Table continues on the next page...
(datasheet)
Type
250 235 nA
350 360 nA
800 880 nA
Measure with
CMET @VBAT
3 V
Units
JN5189-Power Consumption Analysis, Rev. 1, 01/2021
Application Note 4 / 22
NXP Semiconductors
Table 2. CMET current measurements (continued)
Power profile measurement
Symbol Parameter Conditions
Power-down-4K (wakeup on hardware reset or an IO event, wake-up timer on, 32 kHz FRO on, with 4 KB SRAM retention)
Power-down-8K (wakeup on hardware reset or an IO event, wake-up timer on, 32 kHz FRO on, with 8 KB SRAM retention)
(datasheet)

2.3 Power consumption in the Active mode

The RF currents are measured with the CMET and the results are shown in Table 3.
Table 3. Active current results with CMET
Parameter Conditions
Supply current
Radio in RX mode (IEEE 802.15.4) 4.30 6.84 mA
Radio in TX mode (IEEE 802.15.4), output power 0 dBm
Requirement typical @Vbat 3 V
(CPU current not included)
7.36 10.15 mA
Type
1025 1085 nA
1120 1170 nA
CMET measurement @Vbat 3 V
(CPU current included)
Measure with
CMET @VBAT
3 V
Units
Units
Radio in TX mode (IEEE 802.15.4), output power +3 dBm
Radio in TX mode (IEEE 802.15.4), output power +10 dBm
The gap compared to the data sheet is due to the CPU current that is already a part of the CMET measurements.
9.44 12.21 mA
20.28 21.75 mA
NOTE

3 Power profile measurement

3.1 Hardware prerequisites

The setup is composed of the IOTZTB-DK006 kit content: a control bridge, a light node, and a switch device made of the JN5189 fitted on a DK6 board. Similarly to the previous chapters, the DK6 of the switch device is modified for power measurement.
The JN5189 fitted on a modified DK6 board is called “the switch device” further on in this document.
The block diagram of the test setup is shown in Figure 5.
JN5189-Power Consumption Analysis, Rev. 1, 01/2021
Application Note 5 / 22
NXP Semiconductors
Power profile measurement
Figure 5. Test setup block diagram
The modified DK6 with the JN5189 module fitted is shown in Figure 6.
JN5189-Power Consumption Analysis, Rev. 1, 01/2021
Application Note 6 / 22
NXP Semiconductors
Power profile measurement
Figure 6. Modified DK6 and JN5189 module fitted
The Zigbee control bridge and the light node are shown in Figure 7 and Figure 8.
Figure 7. Zigbee control bridge
JN5189-Power Consumption Analysis, Rev. 1, 01/2021
Application Note 7 / 22
Loading...
+ 15 hidden pages