The M29DW323D is a 32 Mbit (4Mb x8 or 2Mb
x16) non-volatile memory that can be read, erased
and reprogrammed. These operations can be performed using a single low voltage (2.7 to 3.6V)
supply. On power-up the memory defaults to its
Read mode.
The device features an asymmetrical block architecture. The M29DW323D has an array of 8 parameter and 63 main blocks and is divided into two
Banks, A and B, providing Dual Bank operations.
While programming or erasing in Bank A, read operations are possible in Bank B and vice versa.
Only one bank at a time is allowed to be in program or erase mode. The bank architecture is
summarized in Table 2. M29DW323DT locates the
Parameter Blocks at the top of the memory address space while the M29DW323DB locates the
Parameter Blocks starting from the bottom.
M29DW323D has an extra 32 KWord (x16 mode)
or 64 KByte (x8 mode) block, the Extended Block,
that can be accessed using a dedicated command. The Extended Block can be protected and
so is useful for storing security information. How-
Figure 2. Logic DiagramTable 1. Signal Names
VPP/WP
V
CC
A0-A20
RP
21
W
M29DW323DT
E
M29DW323DB
G
V
SS
15
DQ0-DQ14
DQ15A–1
BYTE
RB
AI05523
ever the protection is irreversible, once protected
the protection cannot be undone.
Each block can be erased independently so it is
possible to preserve valid data while old data is
erased. The blocks can be protected to prevent
accidental Program or Erase commands from
modifying the memory. Program and Erase commands are written to the Command Interface of
the memory. An on-chip Program/Erase Controller
simplifies the process of programming or erasing
the memory by taking care of all of the special operations that are required to update the memory
contents. The end of a program or erase operation
can be detected and any error conditions identified. The command set required to control the
memory is consistent with JEDEC standards.
Chip Enable, Output Enable and Write Enable signals control the bus operation of the memory.
They allow simple connection to most microprocessors, often without additional logic.
The memory is offered in TSOP48 (12x20mm), and
TFBGA48 (6x8mm, 0.8mm pitch) packages. The
memory is supplied with all the bits erased (set to
’1’).
A0-A20Address Inputs
DQ0-DQ7Data Inputs/Outputs
DQ8-DQ14Data Inputs/Outputs
DQ15A–1Data Input/Output or Address Input
E
G
W
RP
RB
BYTE
V
CC
VPP/WP
V
SS
NCNot Connected Internally
Chip Enable
Output Enable
Write Enable
Reset/Block Temporary Unprotect
Ready/Busy Output
Byte/Word Organization Select
Supply Voltage
VPP/Write Protect
Ground
6/51
Figure 3. TSOP Connections
M29DW323DT, M29DW323DB
1
A15
48
A14
A13
A12
A11
A10DQ14
A9
A8
A19
A20
W
RP
NC
M29DW323DT
M29DW323DB
12
13
37
36
VPP/WP
RB
A18
A17
A7
A6
A5
A4
A3
A2
A1
2425
A16
BYTE
V
SS
DQ15A–1
DQ7
DQ6
DQ13
DQ5
DQ12
DQ4
V
CC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
G
V
SS
E
A0
AI05524
7/51
M29DW323DT, M29DW323DB
Figure 4. TFBGA48 Connections (Top view through package)
RB
A
B
C
A3
A7
A17
A6
V
PP
A18
A4
A2
W
/
WP
RP
A10
NC
654321
A13
A9
A8
A12
A14
D
E
F
G
H
A1
A5A20
DQ0
A0
E
G
V
SS
DQ8
DQ9
DQ1
DQ10
DQ11
DQ2
DQ3
A19
DQ5
DQ12
V
CC
DQ4
A11
DQ7
DQ14
DQ13
DQ6
A15
A16
BYTE
DQ15
A–1
V
SS
Table 2. Bank Architecture
BankBank Size
A8 Mbit8 8KByte/ 4 KWord15 64KByte/ 32 KWord
B24 Mbit-4864KByte/ 32 KWord
Parameter BlocksMain Blocks
No. of BlocksBlock SizeNo. of BlocksBlock Size
AI08084
8/51
Figure 5. Block Addresses (x8)
M29DW323DT, M29DW323DB
Top Boot Block (x8)
Address lines A20-A0, DQ15A-1
000000h
00FFFFh
Bank B
2F0000h
2FFFFFh
300000h
30FFFFh
3E0000h
Bank A
Note 1. Used as Extended Block Addresses in Extended Block mode.
Note: Also see APPENDIX A., Table 23. and Table 24. for a full listing of the Block Addresses.
3EFFFFh
3F0000h
3F1FFFh
3FE000h
3FFFFFh
64 KByte or
32 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
8 KByte or
4 KWord
8 KByte or
4 KWord
Total of 48
Main Blocks
Total of 15
Main Blocks
Total of 8
Parameter
(1)
Blocks
Bank A
Bank B
Address lines A20-A0, DQ15A-1
000000h
001FFFh
00E000h
00FFFFh
010000h
01FFFFh
0F0000h
0FFFFFh
100000h
10FFFFh
3F0000h
3FFFFFh
Bottom Boot Block (x8)
8 KByte or
4 KWord
8 KByte or
4 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
Total of 8
Parameter
(1)
Blocks
Total of 15
Main Blocks
Total of 48
Main Blocks
AI05556
9/51
M29DW323DT, M29DW323DB
Figure 6. Block Addresses (x16)
Top Boot Block (x16)
Address lines A20-A0
000000h
007FFFh
Bank B
178000h
17FFFFh
180000h
187FFFh
1F0000h
Bank A
Note 1. Used as Extended Block Addresses in Extended Block mode.
Note: Also see APPENDIX A., Table 23. and Table 24. for a full listing of the Block Addresses.
1F7FFFh
1F8000h
1F8FFFh
1FF000h
1FFFFFh
64 KByte or
32 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
8 KByte or
4 KWord
8 KByte or
4 KWord
Total of 48
Main Blocks
Total of 15
Main Blocks
Total of 8
Parameter
(1)
Blocks
Bank A
Bank B
000000h
000FFFh
007000h
007FFFh
008000h
00FFFFh
078000h
07FFFFh
080000h
087FFFh
1F8000h
1FFFFFh
Bottom Boot Block (x16)
Address lines A20-A0
8 KByte or
4 KWord
8 KByte or
4 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
64 KByte or
32 KWord
Total of 8
Parameter
(1)
Blocks
Total of 15
Main Blocks
Total of 48
Main Blocks
AI05555
10/51
SIGNAL DESCRIPTIONS
See Figure 2., Logic Diagram, and Table
1., Signal Names, for a brief overview of the sig-
nals connected to this device.
Address Inputs (A0-A20). The Address Inputs
select the cells in the memory array to access during Bus Read operations. During Bus Write operations they control the commands sent to the
Command Interface of the Program/Erase Controller.
Data Inputs/Outputs (DQ0-DQ7). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation. During Bus Write
operations they represent the commands sent to
the Command Interface of the Program/Erase
Controller.
Data Inputs/Outputs (DQ8-DQ14). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation when BYTE
. When BYTE is Low, VIL, these pins are not
V
IH
used and are high impedance. During Bus Write
operations the Command Register does not use
these bits. When reading the Status Register
these bits should be ignored.
Data Input/Output or Address Input (DQ15A–1).
When BYTE
is High, VIH, this pin behaves as a
Data Input/Output pin (as DQ8-DQ14). When
is Low, VIL, this pin behaves as an address
BYTE
pin; DQ15A–1 Low will select the LSB of the addressed Word, DQ15A–1 High will select the MSB.
Throughout the text consider references to the
Data Input/Output to include this pin when BYTE
High and references to the Address Inputs to include this pin when BYTE
is Low except when
stated explicitly otherwise.
Chip Enable (E
). The Chip Enable, E, activates
the memory, allowing Bus Read and Bus Write operations to be performed. When Chip Enable is
High, V
Output Enable (G
, all other pins are ignored.
IH
). The Output Enable, G, con-
trols the Bus Read operation of the memory.
Write Enable (W
). The Write Enable, W, controls
the Bus Write operation of the memory’s Command Interface.
Write Protect (VPP/WP). The VPP/Write
V
PP/
pin provides two functions. The VPP func-
Protect
tion allows the memory to use an external high
voltage power supply to reduce the time required
for Program operations. This is achieved by bypassing the unlock cycles and/or using the Double Word or Quadruple Byte Program commands.
The Write Protect function provides a hardware
method of protecting the two outermost boot
blocks.
When V
protects the two outermost boot blocks; Program
/Write Protect is Low, VIL, the memory
PP
is High,
M29DW323DT, M29DW323DB
and Erase operations in these blocks are ignored
while V
at V
When V
reverts to the previous protection status of the two
outermost boot blocks. Program and Erase operations can now modify the data in these blocks unless the blocks are protected using Block
Protection.
When V
ory automatically enters the Unlock Bypass mode.
When V
mal operation resumes. During Unlock Bypass
Program operations the memory draws I
the pin to supply the programming circuits. See the
description of the Unlock Bypass command in the
Command Interface section. The transitions from
V
than t
Never raise V
mode except Read mode, otherwise the memory
may be left in an indeterminate state.
The V
or unconnected or the device may become unreliable. A 0.1µF capacitor should be connected between the V
Ground pin to decouple the current surges from
the power supply. The PCB track widths must be
sufficient to carry the currents required during
Unlock Bypass Program, I
is
Reset/Block Temporary Unprotect (RP
Reset/Block Temporary Unprotect pin can be
used to apply a Hardware Reset to the memory or
to temporarily unprotect all Blocks that have been
protected.
Note that if V
most boot blocks will remain protected even if RP
is at V
A Hardware Reset is achieved by holding Reset/
Block Temporary Unprotect Low, V
t
PLPX
goes High, V
Read and Bus Write operations after t
t
RHEL
Output section, Table 19. and Figure 16., Reset/
Block Temporary Unprotect AC Waveforms, for
more details.
Holding RP
protected Blocks in the memory. Program and
Erase operations on all blocks will be possible.
The transition from V
t
PHPHH
Ready/Busy Output (RB
is an open-drain output that can be used to identify
when the device is performing a Program or Erase
/Write Protect is Low, even when RP is
PP
.
ID
/Write Protect is High, VIH, the memory
PP
/Write Protect is raised to V
PP
/Write Protect returns to VIH or VIL nor-
PP
to VPP and from VPP to VIH must be slower
IH
, see Figure 17.
VHVPP
/Write Protect pin must not be left floating
PP
.
ID
/Write Protect to VPP from any
PP
/Write Protect pin and the V
PP
.
PP
/WP is at VIL, then the two outer-
PP
. After Reset/Block Temporary Unprotect
, the memory will be ready for Bus
IH
, whichever occurs last. See the Ready/Busy
at VID will temporarily unprotect the
to VID must be slower than
.
IH
). The Ready/Busy pin
the mem-
PP
from
PP
). The
, for at least
IL
PHEL
SS
or
11/51
M29DW323DT, M29DW323DB
operation. During Program or Erase operations
Ready/Busy is Low, V
pedance during Read mode, Auto Select mode
. Ready/Busy is high-im-
OL
and Erase Suspend mode.
After a Hardware Reset, Bus Read and Bus Write
operations cannot begin until Ready/Busy becomes high-impedance. See Table 19. and Figure
16., Reset/Block Temporary Unprotect AC Waveforms.
The use of an open-drain output allows the Ready/
Busy pins from several memories to be connected
to a single pull-up resistor. A Low will then indicate
that one, or more, of the memories is busy.
Byte/Word Organization Select (BYTE
). The
Byte/Word Organization Select pin is used to
switch between the x8 and x16 Bus modes of the
memory. When Byte/Word Organization Select is
Low, V
High, V
, the memory is in x8 mode, when it is
IL
, the memory is in x16 mode.
IH
V
Supply Voltage (2.7V to 3.6V). VCC pro-
CC
vides the power supply for all operations (Read,
Program and Erase).
The Command Interface is disabled when the V
Supply Voltage is less than the Lockout Voltage,
. This prevents Bus Write operations from ac-
V
LKO
cidentally damaging the data during power up,
CC
power down and power surges. If the Program/
Erase Controller is programming or erasing during
this time then the operation aborts and the memory contents being altered will be invalid.
A 0.1µF capacitor should be connected between
Supply Voltage pin and the VSS Ground
the V
CC
pin to decouple the current surges from the power
supply. The PCB track widths must be sufficient to
carry the currents required during Program and
Erase operations, I
Ground. VSS is the reference for all voltage
V
SS
measurements. The device features two V
which must be both connected to the system
CC3
.
pins
SS
ground.
12/51
BUS OPERATIONS
There are five standard bus operations that control
the device. These are Bus Read, Bus Write, Output Disable, Standby and Automatic Standby.
The Dual Bank architecture of the M29DW323 allows read/write operations in Bank A, while read
operations are being executed in Bank B or vice
versa. Write operations are only allowed in one
bank at a time.
See Tables 3 and 4, Bus Operations, for a summary. Typically glitches of less than 5ns on Chip Enable or Write Enable are ignored by the memory
and do not affect bus operations.
Bus Read. Bus Read operations read from the
memory cells, or specific registers in the Command Interface. A valid Bus Read operation involves setting the desired address on the Address
Inputs, applying a Low signal, V
and Output Enable and keeping Write Enable
High, V
value, see Figure 11., Read Mode AC Waveforms,
. The Data Inputs/Outputs will output the
IH
and Table 15., Read AC Characteristics, for details of when the output becomes valid.
Bus Write. Bus Write operations write to the
Command Interface. A valid Bus Write operation
begins by setting the desired address on the Address Inputs. The Address Inputs are latched by
the Command Interface on the falling edge of Chip
Enable or Write Enable, whichever occurs last.
The Data Inputs/Outputs are latched by the Command Interface on the rising edge of Chip Enable
or Write Enable, whichever occurs first. Output Enable must remain High, V
Write operation. See Figures 12 and 13, Write AC
Waveforms, and Tables 16 and 17, Write AC
Characteristics, for details of the timing requirements.
Output Disable. The Data Inputs/Outputs are in
the high impedance state when Output Enable is
High, V
.
IH
Standby. When Chip Enable is High, V
memory enters Standby mode and the Data Inputs/Outputs pins are placed in the high-imped-
, to Chip Enable
IL
, during the whole Bus
IH
IH
, the
M29DW323DT, M29DW323DB
ance state. To reduce the Supply Current to the
Standby Supply Current, I
be held within V
level see Table 14., DC Characteristics.
± 0.2V. For the Standby current
CC
During program or erase operations the memory
will continue to use the Program/Erase Supply
Current, I
til the operation completes.
, for Program or Erase operations un-
CC3
Automatic Standby. If CMOS levels (V
are used to drive the bus and the bus is inactive for
300ns or more the memory enters Automatic
Standby where the internal Supply Current is reduced to the Standby Supply Current, I
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Special Bus Operations
Additional bus operations can be performed to
read the Electronic Signature and also to apply
and remove Block Protection. These bus operations are intended for use by programming equipment and are not usually used in applications.
They require V
to be applied to some pins.
ID
Electronic Signature. The memory has two
codes, the manufacturer code and the device
code, that can be read to identify the memory.
These codes can be read by applying the signals
listed in Tables 3 and 4, Bus Operations.
Block Protect and Chip Unprotect.
blocks can be protected against accidental Program or Erase. The Protection Groups are shown
in APPENDIX A., Tables 23 and 24, Block Ad-
dresses. The whole chip can be unprotected to allow the data inside the blocks to be changed.
The V
the two outermost boot blocks. When V
Protect
protected and remain protected regardless of the
/Write Protect pin can be used to protect
PP
is at V
the two outermost boot blocks are
IL
Block Protection Status or the Reset/Block Temporary Unprotect pin status.
Block Protect and Chip Unprotect operations are
described in APPENDIX D.
, Chip Enable should
CC2
CC
Groups of
± 0.2V)
. The
CC2
/Write
PP
13/51
M29DW323DT, M29DW323DB
Table 3. Bus Operations, BYTE = V
OperationEGW
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Extended Memory
Block Verify Code
Note: X = VIL or VIH.
V
ILVIL
V
ILVIH
V
IH
V
XXXHi-ZHi-Z
IH
V
VILV
IL
V
VILV
IL
VILV
V
IL
Table 4. Bus Operations, BYTE = V
OperationE
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Extended Memory
Block Verify Code
Note: X = VIL or VIH.
GW
V
V
IL
IL
V
V
IL
IH
V
IHVIH
V
XXXHi-Z
IH
V
V
IL
IL
V
V
IL
IL
V
V
IL
IL
IL
Address Inputs
DQ15A–1, A0-A20
V
Cell AddressHi-ZData Output
IH
V
Command AddressHi-ZData Input
IL
V
XHi-ZHi-Z
IH
A0 = VIL, A1 = VIL, A9 = VID,
IH
Others V
A0 = VIH, A1 = VIL,
IH
A9 = V
A0 = VIH, A1 = VIH, A6 = VIL,
IH
A9 = V
IH
or V
IL
IH
, Others VIL or V
ID
, Others VIL or V
ID
IH
IH
Address Inputs
A0-A20
V
Cell AddressData Output
IH
V
Command AddressData Input
IL
Data Inputs/Outputs
DQ14-DQ8DQ7-DQ0
Hi-Z20h
Hi-Z
Hi-Z
5Eh (M29DW323DT)
5Fh (M29DW323DB)
01h (not factory locked)
Data Inputs/Outputs
DQ15A–1, DQ14-DQ0
XHi-Z
A0 = VIL, A1 = VIL, A9 = VID,
V
IH
Others V
A0 = VIH, A1 = VIL, A9 = VID,
V
IH
Others V
A0 = VIH, A1 = VIH, A6 = VIL,
V
IH
A9 = V
or V
IL
IH
or V
IL
IH
, Others VIL or V
ID
225Eh (M29DW323DT)
225Fh (M29DW323DB)
81h (factory locked)
IH
01h (not factory locked)
81h (factory locked)
0020h
14/51
COMMAND INTERFACE
All Bus Write operations to the memory are interpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. Failure to observe a valid sequence of Bus
Write operations will result in the memory returning to Read mode. The long command sequences
are imposed to maximize data security.
The address used for the commands changes depending on whether the memory is in 16-bit or 8bit mode. See either Table 5, or 6, depending on
the configuration that is being used, for a summary
of the commands.
Read/Reset Command
The Read/Reset command returns the memory to
its Read mode. It also resets the errors in the Status Register. Either one or three Bus Write operations can be used to issue the Read/Reset
command.
The Read/Reset command can be issued, between Bus Write cycles before the start of a program or erase operation, to return the device to
read mode. If the Read/Reset command is issued
during the time-out of a Block erase operation then
the memory will take up to 10µs to abort. During
the abort period no valid data can be read from the
memory. The Read/Reset command will not abort
an Erase operation when issued while in Erase
Suspend.
Auto Select Command
The Auto Select command is used to read the
Manufacturer Code, the Device Code, the Block
Protection Status and the Extended Memory Block
Verify Code. It can be addressed to either Bank.
Three consecutive Bus Write operations are required to issue the Auto Select command. The final Write cycle must be addressed to one of the
Banks. Once the Auto Select command is issued
Bus Read operations to the Bank where the command was issued output the Auto Select data. Bus
Read operations to the other Bank will output the
contents of the memory array. The memory remains in Auto Select mode until a Read/Reset or
CFI Query command is issued.
In Auto Select mode the Manufacturer Code can
be read using a Bus Read operation with A0 = V
and A1 = VIL and A19-A20 = Bank Address. The
other address bits may be set to either V
The Device Code can be read using a Bus Read
operation with A0 = V
= Bank Address. The other address bits may be
set to either V
IL
and A1 = VIL and A19-A20
IH
or VIH.
The Block Protection Status of each block can be
read using a Bus Read operation with A0 = V
A1 = V
specifying the address of the block inside the
, A19-A20 = Bank Address and A12-A18
IH
or VIH.
IL
M29DW323DT, M29DW323DB
Bank. The other address bits may be set to either
or VIH. If the addressed block is protected then
V
IL
01h is output on Data Inputs/Outputs DQ0-DQ7,
otherwise 00h is output.
Read CFI Query Command
The Read CFI Query Command is used to read
data from the Common Flash Interface (CFI)
Memory Area. This command is valid when the device is in the Read Array mode, or when the device
is in Auto Select mode.
One Bus Write cycle is required to issue the Read
CFI Query Command. Once the command is issued subsequent Bus Read operations read from
the Common Flash Interface Memory Area.
The Read/Reset command must be issued to return the device to the previous mode (the Read Array mode or Auto Select mode). A second Read/
Reset command would be needed if the device is
to be put in the Read Array mode from Auto Select
mode.
See APPENDIX B., Tables 25, 26, 27, 28, 29 and
30 for details on the information contained in the
Common Flash Interface (CFI) memory area.
Program Command
The Program command can be used to program a
value to one address in the memory array at a
time. The command requires four Bus Write operations, the final write operation latches the address and data, and starts the Program/Erase
Controller.
If the address falls in a protected block then the
Program command is ignored, the data remains
unchanged. The Status Register is never read and
no error condition is given.
During the program operation the memory will ignore all commands. It is not possible to issue any
command to abort or pause the operation. After
programming has started, Bus Read operations in
the Bank being programmed output the Status
Register content, while Bus Read operations to
the other Bank output the contents of the memory
array. See the section on the Status Register for
more details. Typical program times are given in
Table 7.
IL
After the program operation has completed the
memory will return to the Read mode, unless an
error has occurred. When an error occurs Bus
Read operations to the Bank where the command
was issued will continue to output the Status Register. A Read/Reset command must be issued to
reset the error condition and return to Read mode.
Note that the Program command cannot change a
,
IL
bit set at ’0’ back to ’1’. One of the Erase Commands must be used to set all the bits in a block or
in the whole memory from ’0’ to ’1’.
15/51
M29DW323DT, M29DW323DB
Fast Program Commands
There are two Fast Program commands available
to improve the programming throughput, by writing
several adjacent words or bytes in parallel. The
Quadruple Byte Program command is available for
x8 operations, while the Double Word Program
command is available for x16 operations.
Only one bank can be programmed at any one
time. The other bank must be in Read mode or
Erase Suspend.
Fast Program commands should not be attempted
when V
because applying a 12V V
WP
WP is not at VPP. Care must be taken
PP/
pin will temporarily unprotect any protected
voltage to the VPP/
PP
block.
After programming has started, Bus Read opera-
tions in the Bank being programmed output the
Status Register content, while Bus Read operations to the other Bank output the contents of the
memory array.
After the program operation has completed the
memory will return to the Read mode, unless an
error has occurred. When an error occurs Bus
Read operations to the Bank where the command
was issued will continue to output the Status Register. A Read/Reset command must be issued to
reset the error condition and return to Read mode.
Note that the Fast Program commands cannot
change a bit set at ’0’ back to ’1’. One of the Erase
Commands must be used to set all the bits in a
block or in the whole memory from ’0’ to ’1’.
Typical Program times are given in Table
7., Program, Erase Times and Program, Erase
Endurance Cycles.
Quadruple Byte Program Command. The Quadruple Byte Program command is used to write a
page of four adjacent Bytes in parallel. The four
bytes must differ only for addresses A0, DQ15A-1.
Five bus write cycles are necessary to issue the
Quadruple Byte Program command.
■ The first bus cycle sets up the Quadruple Byte
Program Command.
■ The second bus cycle latches the Address and
the Data of the first byte to be written.
■ The third bus cycle latches the Address and
the Data of the second byte to be written.
■ The fourth bus cycle latches the Address and
the Data of the third byte to be written.
■ The fifth bus cycle latches the Address and the
Data of the fourth byte to be written and starts
the Program/Erase Controller.
Double Word Program Command. The Double
Word Program command is used to write a page
of two adjacent words in parallel. The two words
must differ only for the address A0.
Three bus write cycles are necessary to issue the
Double Word Program command.
■ The first bus cycle sets up the Double Word
Program Command.
■ The second bus cycle latches the Address and
the Data of the first word to be written.
■ The third bus cycle latches the Address and
the Data of the second word to be written and
starts the Program/Erase Controller.
Unlock Bypass Command
The Unlock Bypass command is used in conjunction with the Unlock Bypass Program command to
program the memory faster than with the standard
program commands. When the cycle time to the
device is long, considerable time saving can be
made by using these commands. Three Bus Write
operations are required to issue the Unlock Bypass command.
Once the Unlock Bypass command has been issued the bank enters Unlock Bypass mode. When
in Unlock Bypass mode, only the Unlock Bypass
Program and Unlock Bypass Reset commands
are valid. The Unlock Bypass Program command
can be issued to program addresses within the
bank, and the Unlock Bypass Reset command to
return the bank to Read mode. In Unlock Bypass
mode the memory can be read as if in Read mode.
When V
the memory automatically enters the Unlock By-
is applied to the VPP/Write Protect pin
PP
pass mode and the Unlock Bypass Program command can be issued immediately. Care must be
taken because applying a 12V V
VPP/WP
pin will temporarily unprotect any protect-
voltage to the
PP
ed block.
Unlock Bypass Program Command
The Unlock Bypass Program command can be
used to program one address in the memory array
at a time. The command requires two Bus Write
operations, the final write operation latches the address and data, and starts the Program/Erase
Controller.
The Program operation using the Unlock Bypass
Program command behaves identically to the Program operation using the Program command. The
operation cannot be aborted, a Bus Read operation to the Bank where the command was issued
outputs the Status Register. See the Program
command for details on the behavior.
Unlock Bypass Reset Command
The Unlock Bypass Reset command can be used
to return to Read/Reset mode from Unlock Bypass
Mode. Two Bus Write operations are required to
issue the Unlock Bypass Reset command. Read/
Reset command does not exit from Unlock Bypass
Mode.
16/51
M29DW323DT, M29DW323DB
Chip Erase Command
The Chip Erase command can be used to erase
the entire chip. Six Bus Write operations are required to issue the Chip Erase Command and start
the Program/Erase Controller.
If any blocks are protected then these are ignored
and all the other blocks are erased. If all of the
blocks are protected the Chip Erase operation appears to start but will terminate within about 100µs,
leaving the data unchanged. No error condition is
given when protected blocks are ignored.
During the erase operation the memory will ignore
all commands, including the Erase Suspend command. It is not possible to issue any command to
abort the operation. Typical chip erase times are
given in Table 7. All Bus Read operations during
the Chip Erase operation will output the Status
Register on the Data Inputs/Outputs. See the section on the Status Register for more details.
After the Chip Erase operation has completed the
memory will return to the Read Mode, unless an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read Mode.
The Chip Erase Command sets all of the bits in unprotected blocks of the memory to ’1’. All previous
data is lost.
Block Erase Command
The Block Erase command can be used to erase
a list of one or more blocks in a Bank. It sets all of
the bits in the unprotected selected blocks to ’1’.
All previous data in the selected blocks is lost.
Six Bus Write operations are required to select the
first block in the list. Each additional block in the
list can be selected by repeating the sixth Bus
Write operation using the address of the additional
block. All blocks must belong to the same Bank; if
a block belonging to the other Bank is given it will
not be erased. The Block Erase operation starts
the Program/Erase Controller after a time-out period of 50µs after the last Bus Write operation.
Once the Program/Erase Controller starts it is not
possible to select any more blocks. Each additional block must therefore be selected within 50µs of
the last block. The 50µs timer restarts when an additional block is selected. After the sixth Bus Write
operation a Bus Read operation within the same
Bank will output the Status Register. See the Status Register section for details on how to identify if
the Program/Erase Controller has started the
Block Erase operation.
If any selected blocks are protected then these are
ignored and all the other selected blocks are
erased. If all of the selected blocks are protected
the Block Erase operation appears to start but will
terminate within about 100µs, leaving the data unchanged. No error condition is given when protected blocks are ignored.
During the Block Erase operation the memory will
ignore all commands except the Erase Suspend
command and the Read/Reset command which is
only accepted during the 50µs time-out period.
Typical block erase times are given in Table 7.
After the Erase operation has started all Bus Read
operations to the Bank being erased will output the
Status Register on the Data Inputs/Outputs. See
the section on the Status Register for more details.
After the Block Erase operation has completed the
memory will return to the Read Mode, unless an
error has occurred. When an error occurs Bus
Read operations to the Bank where the command
was issued will continue to output the Status Register. A Read/Reset command must be issued to
reset the error condition and return to Read mode.
Erase Suspend Command
The Erase Suspend Command may be used to
temporarily suspend a Block Erase operation and
return the memory to Read mode. The command
requires one Bus Write operation.
The Program/Erase Controller will suspend within
the Erase Suspend Latency time of the Erase Suspend Command being issued. Once the Program/
Erase Controller has stopped the memory will be
set to Read mode and the Erase will be suspended. If the Erase Suspend command is issued during the period when the memory is waiting for an
additional block (before the Program/Erase Controller starts) then the Erase is suspended immediately and will start immediately when the Erase
Resume Command is issued. It is not possible to
select any further blocks to erase after the Erase
Resume.
During Erase Suspend it is possible to Read and
Program cells in blocks that are not being erased;
both Read and Program operations behave as
normal on these blocks. If any attempt is made to
program in a protected block or in the suspended
block then the Program command is ignored and
the data remains unchanged. The Status Register
is not read and no error condition is given. Reading from blocks that are being erased will output
the Status Register.
It is also possible to issue the Auto Select, Read
CFI Query and Unlock Bypass commands during
an Erase Suspend. The Read/Reset command
must be issued to return the device to Read Array
mode before the Resume command will be accepted.
During Erase Suspend a Bus Read operation to
the Extended Block will output the Extended Block
data.
17/51
M29DW323DT, M29DW323DB
Erase Resume Command
The Erase Resume command must be used to restart the Program/Erase Controller after an Erase
Suspend. The device must be in Read Array mode
before the Resume command will be accepted. An
erase can be suspended and resumed more than
once.
Enter Extended Block Command
The M29DW323D has an extra 64KByte block
(Extended Block) that can only be accessed using
the Enter Extended Block command. Three Bus
write cycles are required to issue the Extended
Block command. Once the command has been issued the device enters Extended Block mode
where all Bus Read or Program operations to the
Boot Block addresses access the Extended Block.
The Extended Block (with the same address as
the boot block) cannot be erased, and can be
treated as one-time programmable (OTP) memory. In Extended Block mode the Boot Blocks are
not accessible. In Extended Block mode dual op-
mapped in Bank A. When in Extended Block
mode, Erase Commands in Bank A are not allowed.
To exit from the Extended Block mode the Exit Extended Block command must be issued.
The Extended Block can be protected, however
once protected the protection cannot be undone.
Exit Extended Block Command
The Exit Extended Block command is used to exit
from the Extended Block mode and return the device to Read mode. Four Bus Write operations are
required to issue the command.
Block Protect andChip Unprotect Commands
Groups of blocks can be protected against acci-
dental Program or Erase. The Protection Groups
are shown in APPENDIX A., Tables 23 and 24,
Block Addresses. The whole chip can be unprotected to allow the data inside the blocks to be
changed. Block Protect and Chip Unprotect operations are described in APPENDIX D.
erations are possible, with the Extended Block
Table 5. Commands, 16-bit mode, BYTE
Command
Read/Reset
Auto Select3555AA2AA55
Program4555AA2AA55555A0PAPD
Double Word Program355550PA0 PD0PA1PD1
Unlock Bypass3555AA2AA5555520
Unlock Bypass
Program
Unlock Bypass Reset2X90X00
Chip Erase6555AA2AA5555580555AA2AA5555510
Block Erase6+ 555AA2AA5555580555AA2AA55BA30
Erase Suspend1 BKAB0
Erase Resume1 BKA30
Read CFI Query15598
Enter Extended Block3555AA2AA5555588
Exit Extended Block4555AA2AA5555590X00
Note: X Don’t Care, PA Program Address, PD Program Data, BA Any address in the Block, BKA Bank Address. All values in the table are in
hexadecimal.
The Command Interface only uses A–1, A0-A10 and DQ0-DQ7 to verify the commands; A11-A20, DQ8-DQ14 and DQ15 are Don’t
Care. DQ15A–1 is A–1 when BYTE is VIL or DQ15 when BYTE is VIH.
1st2nd3rd4th5th6th
Length
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
1X F0
3555 AA 2AA 55 X F0
2X A0PAPD
= V
IH
Bus Write Operations
(BKA)
90
555
18/51
M29DW323DT, M29DW323DB
Table 6. Commands, 8-bit mode, BYTE = V
IL
Bus Write Operations
Command
Read/Reset
Auto Select3 AAAAA55555
1st2nd3rd4th5th6th
Length
Add Data Add DataAdd Data Add Data Add Data Add Data
1X F0
3 AAAAA55555XF0
(BKA)
90
AAA
Program4 AAAAA55555AAAA0PAPD
Quadruple Byte Program 5 AAA55PA0 PD0PA1PD1 PA2 PD2 PA3 PD3
Unlock Bypass3 AAAAA55555AAA20
Unlock Bypass Program2XA0PAPD
Unlock Bypass Reset2X90X00
Chip Erase6 AAAAA55555AAA80AAAAA55555AAA10
Block Erase6+ AAAAA55555AAA80AAAAA55555BA30
Erase Suspend1 BKAB0
Erase Resume1 BKA30
Read CFI Query1AA98
Enter Extended Block3 AAAAA55555AAA88
Exit Extended Block4 AAAAA55555AAA90X00
Note: X Don’t Care, PA Program Address, PD Program Data, BA Any address in the Block. All values in the table are in hexadecimal.
The Command Interface only uses A–1, A0-A10 and DQ0-DQ7 to verify the commands; A11-A20, DQ8-DQ14 and DQ15 are Don’t
Care. DQ15A–1 is A–1 when BYTE is VIL or DQ15 when BYTE is VIH.
Table 7. Program, Erase Times and Program, Erase Endurance Cycles
ParameterMin
Typ
(1, 2)
Chip Erase40
Block Erase (64 KBytes)0.8
Erase Suspend Latency Time
Program (Byte or Word)10
Double Word Program (Byte or Word)10
Chip Program (Byte by Byte)40
Chip Program (Word by Word)20
Chip Program (Quadruple Byte or Double Word)10
Program/Erase Cycles (per Block)100,000cycles
Data Retention20years
Note: 1. Typical values measured at room temperature and nominal voltages.
2. Sampled, but not 100% tested.
3. Maximum value measured at worst case conditions for both temperature and VCC after 100,00 program/erase cycles.
4. Maximum value measured at worst case conditions for both temperature and VCC.
Max
200
6
50
200
200
200
100
100
(2)
(3)
(3)
(4)
(4)
(3)
(3)
(3)
(3)
Unit
s
s
µs
µs
µs
s
s
s
19/51
M29DW323DT, M29DW323DB
STATUS REGISTER
The M29DW323D has a Status Register that provides information on the current or previous Program or Erase operations executed in each bank.
The various bits convey information and errors on
the operation. Bus Read operations from any address within the Bank, always read the Status
Register during Program and Erase operations. It
is also read during Erase Suspend when an address within a block being erased is accessed.
The bits in the Status Register are summarized in
Table 8., Status Register Bits.
Data Polling Bit (DQ7). The Data Polling Bit can
be used to identify whether the Program/Erase
Controller has successfully completed its operation or if it has responded to an Erase Suspend.
The Data Polling Bit is output on DQ7 when the
Status Register is read.
During Program operations the Data Polling Bit
outputs the complement of the bit being programmed to DQ7. After successful completion of
the Program operation the memory returns to
Read mode and Bus Read operations from the address just programmed output DQ7, not its complement.
During Erase operations the Data Polling Bit outputs ’0’, the complement of the erased state of
DQ7. After successful completion of the Erase operation the memory returns to Read Mode.
In Erase Suspend mode the Data Polling Bit will
output a ’1’ during a Bus Read operation within a
block being erased. The Data Polling Bit will
change from a ’0’ to a ’1’ when the Program/Erase
Controller has suspended the Erase operation.
Figure 7., Data Polling Flowchart, gives an exam-
ple of how to use the Data Polling Bit. A Valid Address is the address being programmed or an
address within the block being erased.
Toggle Bit (DQ6). The Toggle Bit can be used to
identify whether the Program/Erase Controller has
successfully completed its operation or if it has responded to an Erase Suspend. The Toggle Bit is
output on DQ6 when the Status Register is read.
During Program and Erase operations the Toggle
Bit changes from ’0’ to ’1’ to ’0’, etc., with successive Bus Read operations at any address. After
successful completion of the operation the memory returns to Read mode.
During Erase Suspend mode the Toggle Bit will
output when addressing a cell within a block being
erased. The Toggle Bit will stop toggling when the
Program/Erase Controller has suspended the
Erase operation.
Figure 8., Toggle Flowchart, gives an example of
how to use the Data Toggle Bit. Figures 14 and 15
describe Toggle Bit timing waveform.
Error Bit (DQ5). The Error Bit can be used to
identify errors detected by the Program/Erase
Controller. The Error Bit is set to ’1’ when a Program, Block Erase or Chip Erase operation fails to
write the correct data to the memory. If the Error
Bit is set a Read/Reset command must be issued
before other commands are issued. The Error bit
is output on DQ5 when the Status Register is read.
Note that the Program command cannot change a
bit set to ’0’ back to ’1’ and attempting to do so will
set DQ5 to ‘1’. A Bus Read operation to that address will show the bit is still ‘0’. One of the Erase
commands must be used to set all the bits in a
block or in the whole memory from ’0’ to ’1’.
Erase Timer Bit (DQ3). The Erase Timer Bit can
be used to identify the start of Program/Erase
Controller operation during a Block Erase command. Once the Program/Erase Controller starts
erasing the Erase Timer Bit is set to ’1’. Before the
Program/Erase Controller starts the Erase Timer
Bit is set to ’0’ and additional blocks to be erased
may be written to the Command Interface. The
Erase Timer Bit is output on DQ3 when the Status
Register is read.
Alternative Toggle Bit (DQ2). The Alternative
Toggle Bit can be used to monitor the Program/
Erase controller during Erase operations. The Alternative Toggle Bit is output on DQ2 when the
Status Register is read.
During Chip Erase and Block Erase operations the
Toggle Bit changes from ’0’ to ’1’ to ’0’, etc., with
successive Bus Read operations from addresses
within the blocks being erased. A protected block
is treated the same as a block not being erased.
Once the operation completes the memory returns
to Read mode.
During Erase Suspend the Alternative Toggle Bit
changes from ’0’ to ’1’ to ’0’, etc. with successive
Bus Read operations from addresses within the
blocks being erased. Bus Read operations to addresses within blocks not being erased will output
the memory cell data as if in Read mode.
After an Erase operation that causes the Error Bit
to be set the Alternative Toggle Bit can be used to
identify which block or blocks have caused the error. The Alternative Toggle Bit changes from ’0’ to
’1’ to ’0’, etc. with successive Bus Read Operations from addresses within blocks that have not
erased correctly. The Alternative Toggle Bit does
not change if the addressed block has erased correctly.
Figures 14 and 15 describe Alternative Toggle Bit
timing waveform.
20/51
M29DW323DT, M29DW323DB
Table 8. Status Register Bits
OperationAddressDQ7DQ6DQ5DQ3DQ2RB
ProgramBank AddressDQ7Toggle0––0
Program During Erase
Suspend
Bank AddressDQ7
Program ErrorBank AddressDQ7
Chip EraseAny Address0Toggle01Toggle0
Block Erase before
timeout
Block Erase
Erase Suspend
Erase Error
Note: Unspecified data bits should be ignored.
Erasing Block0Toggle00Toggle0
Non-Erasing Block0Toggle00No Toggle0
Erasing Block0Toggle01Toggle0
Non-Erasing Block0Toggle01No Toggle
Erasing Block1No Toggle0–ToggleHi-Z
Non-Erasing BlockData read as normalHi-Z
Good Block Address0Toggle11No ToggleHi-Z
Faulty Block Address0Toggle11ToggleHi-Z
Figure 7. Data Polling FlowchartFigure 8. Toggle Flowchart
Toggle0––0
Toggle1––Hi-Z
0
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
NO
DQ5
= 1
YES
READ DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
FAILPASS
AI90194
START
READ DQ6
ADDRESS = BA
READ
DQ5 & DQ6
ADDRESS = BA
DQ6
=
TOGGLE
NO
Note: BA = Address of Bank being Programmed or Erased.
YES
DQ5
= 1
YES
READ DQ6
TWICE
ADDRESS = BA
DQ6
=
TOGGLE
YES
FAIL
NO
NO
PASS
AI08929b
21/51
M29DW323DT, M29DW323DB
DUAL OPERATIONS AND MULTIPLE BANK ARCHITECTURE
The Multiple Bank Architecture of the
M29DW323DT and M29DW323DB gives greater
flexibility for software developers to split the code
and data spaces within the memory array. The
Dual Operations feature simplifies the software
management of the device by allowing code to be
executed from one bank while the other bank is
being programmed or erased.
The Dual Operations feature means that while programming or erasing in one bank, read operations
are possible in the other bank with zero latency.
Only one bank at a time is allowed to be in program or erase mode.
Table 9. Dual Operations Allowed In the Other Bank
Status of First
(1)
Bank
IdleYes
ProgrammingYesNoNoNo––NoNo
ErasingYesNoNoNo––NoNo
Erase SuspendedYesYesYesYesYesNo-Yes
Note: 1. If one bank is involved in a program or erase operation, then the other bank is available for dual operations.
2. Only after an Erase operation in that bank.
3. Only after an Erase Suspend command in that bank.
Read
Array
Read Status
Register
Ye s
Commands allowed in the Other Bank
Read
(6)
Query
(2)
If a read operation is required in a bank, which is
programming or erasing, the program or erase operation can be suspended.
Also if the suspended operation was erase then a
program command can be issued to another
block, so the device can have one block in Erase
Suspend mode, one programming and other
banks in read mode.
By using a combination of these features, read operations are possible at any moment.
Table 9. and Table 10. show the dual operations
possible in other banks and in the same bank.
Note that only the commonly used commands are
represented in these tables.
(1)
CFI
YesYesYesYes
Auto
Select
Program Erase
Erase
Suspend
Ye s
Erase
Resume
(2)
Ye s
(3)
Table 10. Dual Operations Allowed In Same Bank
Commands allowed in same bank
(1)
Read
Status
Register
(5)
Ye s
(4)
Read
CFI Query
Ye sYe s
Auto
Select
ProgramErase
(1)
Ye s
No-
Erase
Suspend
(2)
Ye s
(5)
Ye s
Resume
Status of bank
I d l eYe sYe sYe sYe sYe sYe s
ProgrammingNoYesNoNo––No-
ErasingNoYesNoNo–No
Erase Suspended
Note: 1. Not allowed in the Block or Word that is being erased or programmed.
2. Only after an Erase operation in that bank.
3. Only after an Erase Suspend command in that bank.
4. Read Status Register is not a command. The Status Register can be read during a block program or erase operation.
5. The Status Register can be read by addressing the block being erase suspended.
22/51
Read
Array
Ye s
Erase
(3)
Ye s
-
(4)
Ye s
M29DW323DT, M29DW323DB
MAXIMUM RATING
Stressing the device above the rating listed in the
Absolute Maximum Ratings table may cause permanent damage to the device. Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability. These are
Table 11. Absolute Maximum Ratings
SymbolParameterMinMaxUnit
T
BIAS
T
STG
T
LEAD
V
IO
V
CC
V
ID
V
PP
Note: 1. Compliant with the JEDEC Std J-STD-020B (for small body, Sn-Pb or Pb assembly), and the European directive on Restrictions on
Hazardous Substances (RoHS) 2002/95/EU.
2. Minimum voltage may undershoot to –2V during transition and for less than 20ns during transitions.
3. Maximum voltage may overshoot to VCC +2V during transition and for less than 20ns during transitions.
4. VPP must not remain at 12V for more than a total of 80hrs.
Temperature Under Bias–50125°C
Storage Temperature –65150°C
Lead Temperature during Soldering
Input or Output Voltage
(2,3)
Supply Voltage–0.64V
Identification Voltage–0.613.5V
(4)
Program Voltage–0.613.5V
stress ratings only and operation of the device at
these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Refer also to the Numonyx SURE Program and other relevant quality documents.
–0.6
(1)
+0.6
V
CC
°C
V
23/51
M29DW323DT, M29DW323DB
DC AND AC PARAMETERS
This section summarizes the operating measurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Table 12. Operating and AC Measurement Conditions
Param eter
Supply Voltage
V
CC
Ambient Operating Temperature–4085°C
Load Capacitance (C
)
L
Input Rise and Fall Times10ns
Input Pulse Voltages
Input and Output Timing Ref. Voltages
Figure 9. AC Measurement I/O WaveformFigure 10. AC Measurement Load Circuit
Conditions summarized in Table 12., Operating
and AC Measurement Conditions. Designers
should check that the operating conditions in their
circuit match the operating conditions when relying on the quoted parameters.
M29DW323D
Unit70ns
MinMax
2.73.6V
30pF
0 to V
CC
/2
V
CC
V
V
V
V
CC
VCC/2
0V
AI05557
V
PP
CC
DEVICE
UNDER
0.1µF
0.1µF
CL includes JIG capacitance
TEST
Table 13. Device Capacitance
SymbolParameterTest ConditionMinMaxUnit
= 0V
C
IN
C
OUT
Note: Sampled only, not 100% tested.
Input Capacitance
Output Capacitance
24/51
V
IN
V
= 0V
OUT
6pF
12pF
V
CC
Ω
25k
Ω
25k
C
L
AI05558
M29DW323DT, M29DW323DB
Table 14. DC Characteristics
SymbolParameterTest ConditionMinMaxUnit
I
Input Leakage Current
LI
I
Output Leakage Current
LO
(2)
I
CC1
I
CC3
Note: 1. Sampled only, not 100% tested.
Supply Current (Read)
I
Supply Current (Standby)
CC2
Supply Current (Program/
(1,2)
Erase)
V
Input Low Voltage–0.50.8V
IL
V
Input High Voltage
IH
Voltage for V
V
PP
Acceleration
Current for V
I
PP
Acceleration
V
Output Low Voltage
OL
V
Output High Voltage
OH
V
Identification Voltage11.512.5V
ID
Program/Erase Lockout Supply
V
LKO
Voltage
2. In Dual operations the Supply Current will be the sum of I
/WP Program
PP
/WP Program
PP
Program/Erase
Controller active
V
V
≤ V
0V ≤ V
IN
≤ V
0V ≤ V
OUT
E
= VIL, G = VIH,
f = 6MHz
E
= VCC ±0.2V,
= VCC ±0.2V
RP
V
= 2.7V ±10%
CC
= 2.7V ±10%
CC
= 1.8mA
I
OL
I
= –100µA
OH
(read) and I
CC1
CC
CC
V
PP
V
IL
/WP = V
PP
/WP =
or V
IH
PP
(program/erase).
CC3
±1
±1
10mA
100
20mA
20mA
CC
VCC +0.3
0.7V
11.512.5V
15mA
0.45V
–0.4
V
CC
1.82.3V
µA
µA
µA
V
V
25/51
M29DW323DT, M29DW323DB
Figure 11. Read Mode AC Waveforms
A0-A20/
A–1
E
G
DQ0-DQ7/
DQ8-DQ15
BYTE
tAVQVtAXQX
tELQV
tELQXtEHQZ
tBHQV
tELBL/tELBHtBLQZ
tAVAV
VALID
tGLQXtGHQX
tGLQV
tGHQZ
VALID
tEHQX
Table 15. Read AC Characteristics
SymbolAltParameterTest ConditionM29DW323D Unit
E
t
AVAV
t
AVQ V
t
ELQX
t
ELQV
t
GLQX
t
GLQV
t
EHQZ
t
GHQZ
t
EHQX
t
GHQX
t
AXQX
t
ELBL
t
ELBH
t
BLQZ
t
BHQV
Note: 1. Sampled only, not 100% tested.
t
Address Valid to Next Address Valid
RC
t
Address Valid to Output Valid
ACC
(1)
(1)
(1)
t
Chip Enable Low to Output Transition
LZ
t
Chip Enable Low to Output Valid
CE
t
Output Enable Low to Output Transition
OLZ
t
Output Enable Low to Output Valid
OE
t
Chip Enable High to Output Hi-Z
HZ
(1)
t
Output Enable High to Output Hi-Z
DF
Chip Enable, Output Enable or Address
t
OH
Transition to Output Transition
t
ELFL
Chip Enable to BYTE Low or HighMax5ns
t
ELFH
t
BYTE Low to Output Hi-ZMax25ns
FLQZ
t
BYTE High to Output ValidMax30ns
FHQV
= VIL,
= V
G
E
= VIL,
= V
G
G
= V
= V
G
= V
E
= V
E
= V
G
E
= V
Min70ns
IL
Max70ns
IL
Min0ns
IL
Max70ns
IL
Min0ns
IL
Max30ns
IL
Max25ns
IL
Max25ns
IL
Min0ns
AI05559
26/51
Figure 12. Write AC Waveforms, Write Enable Controlled
tAVAV
A0-A20/
A–1
E
G
W
DQ0-DQ7/
DQ8-DQ15
V
CC
RB
tAVWL
tELWL
tVCHEL
VALID
tWLWHtGHWL
tDVWH
M29DW323DT, M29DW323DB
tWLAX
tWHEH
tWHGL
tWHWL
tWHDX
VALID
tWHRL
AI05560
Table 16. Write AC Characteristics, Write Enable Controlled
SymbolAltParameterM29DW323DUnit
t
AVAV
t
ELWL
t
WLWH
t
DVW H
t
WHDX
t
WHEH
t
WHWL
t
AVW L
t
WLAX
t
GHWL
t
WHGL
(1)
t
WHRL
t
VCHEL
Note: 1. Sampled only, not 100% tested.
t
Address Valid to Next Address ValidMin70ns
WC
t
Chip Enable Low to Write Enable LowMin0ns
CS
t
Write Enable Low to Write Enable HighMin45ns
WP
t
Input Valid to Write Enable HighMin45ns
DS
t
Write Enable High to Input TransitionMin0ns
DH
t
Write Enable High to Chip Enable HighMin0ns
CH
t
Write Enable High to Write Enable LowMin30ns
WPH
t
Address Valid to Write Enable LowMin0ns
AS
t
Write Enable Low to Address TransitionMin45ns
AH
Output Enable High to Write Enable LowMin0ns
t
Write Enable High to Output Enable LowMin0ns
OEH
t
Program/Erase Valid to RB LowMax30ns
BUSY
t
VCSVCC
High to Chip Enable Low
Min50µs
27/51
M29DW323DT, M29DW323DB
Figure 13. Write AC Waveforms, Chip Enable Controlled
tAVAV
A0-A20/
A–1
W
G
E
DQ0-DQ7/
DQ8-DQ15
V
CC
RB
tAVEL
tWLEL
tVCHWL
VALID
tELEHtGHEL
tDVEH
tELAX
tEHWH
tEHGL
tEHEL
tEHDX
VALID
tEHRL
AI05561
Table 17. Write AC Characteristics, Chip Enable Controlled
SymbolAltParameterM29DW323DUnit
t
AVAV
t
WLEL
t
ELEH
t
DVEH
t
EHDX
t
EHWH
t
EHEL
t
AVEL
t
ELAX
t
GHEL
t
EHGL
(1)
t
EHRL
t
VCHWL
Note: 1. Sampled only, not 100% tested.
28/51
t
Address Valid to Next Address ValidMin70ns
WC
t
Write Enable Low to Chip Enable LowMin0ns
WS
t
Chip Enable Low to Chip Enable HighMin45ns
CP
t
Input Valid to Chip Enable HighMin45ns
DS
t
Chip Enable High to Input TransitionMin0ns
DH
t
Chip Enable High to Write Enable HighMin0ns
WH
t
Chip Enable High to Chip Enable LowMin30ns
CPH
t
Address Valid to Chip Enable LowMin0ns
AS
t
Chip Enable Low to Address TransitionMin45ns
AH
Output Enable High Chip Enable LowMin0ns
t
Chip Enable High to Output Enable LowMin0ns
OEH
t
Program/Erase Valid to RB LowMax30ns
BUSY
t
VCSVCC
High to Write Enable Low
Min50µs
M29DW323DT, M29DW323DB
Figure 14. Toggle and Alternative Toggle Bits Mechanism, Chip Enable Controlled
A0-A20
E
G
(1)
DQ2
Note: 1. The Toggle bit is output on DQ6.
2. The Alternative Toggle bit is output on DQ2.
Address Outside the Bank
Being Programmed or Erased
(2)
/DQ6
Read Operation outside the Bank
Being Programmed or Erased
DataData
Address in the Bank
Being Programmed or Erased
tAXEL
tELQV
Alternative Toggle/
Toggle Bit
Read Operation in the Bank
Being Programmed or Erased
tELQV
Alternative Toggle/
Address Outside the Bank
Being Programmed or Erased
Toggle Bit
Read Operation Outside the Bank
Being Programmed or Erased
Figure 15. Toggle and Alternative Toggle Bits Mechanism, Output Enable Controlled
A0-A20
G
E
(1)
DQ2
Address Outside the Bank
Being Programmed or Erased
(2)
/DQ6
Address in the Bank
Being Programmed or Erased
tAXGL
tGLQV
DataData
Alternative Toggle/
Toggle Bit
tGLQV
Alternative Toggle/
Address Outside the Bank
Being Programmed or Erased
Toggle Bit
AI08914c
Read Operation outside the Bank
Being Programmed or Erased
Note: 1. The Toggle bit is output on DQ6.
2. The Alternative Toggle bit is output on DQ2.
Read Operation in the Bank
Being Programmed or Erased
Read Operation Outside the Bank
Being Programmed or Erased
Table 18. Toggle and Alternative Toggle Bits AC Characteristics
SymbolAltParameterM29DW323DUnit
Note: t
t
AXEL
t
AXGL
ELQV
and t
GLQV
Address Transition to Chip Enable LowMin10ns
Address Transition to Output Enable LowMin10ns
value s are presented in Table 15., Read AC Characteristics.
AI08915c
29/51
M29DW323DT, M29DW323DB
Figure 16. Reset/Block Temporary Unprotect AC Waveforms
E, G
W,
tPHWL, tPHEL, tPHGL
RB
tRHWL, tRHEL, tRHGL
RP
Table 19. Reset/Block Temporary Unprotect AC Characteristics
SymbolAltParameterM29DW323DUnit
(1)
t
PHWL
t
PHEL
(1)
t
PHGL
(1)
t
RHWL
(1)
t
RHEL
(1)
t
RHGL
t
PLPX
t
PLYH
(1)
t
PHPHH
(1)
t
VHVPP
Note: 1. Sampled only, not 100% tested.
t
RH
t
RB
t
RP
t
READY
t
VIDR
tPLPX
tPHPHH
tPLYH
AI02931B
RP High to Write Enable Low, Chip Enable Low,
Output Enable Low
RB High to Write Enable Low, Chip Enable Low,
Output Enable Low
Min50ns
Min0ns
RP Pulse WidthMin500ns
RP Low to Read ModeMax50µs
RP Rise Time to V
ID
VPP Rise and Fall Time
Min500ns
Min250ns
Figure 17. Accelerated Program Timing Waveforms
V
VPP/WP
30/51
PP
V
or V
IL
IH
tVHVPP
tVHVPP
AI05563
M29DW323DT, M29DW323DB
PACKAGE MECHANICAL
Figure 18. TSOP48 Lead Plastic Thin Small Outline, 12x20 mm, Bottom View Package Outline
1
48
e
D1
24
E1
B
25
L1
A2
E
DIE
LA1α
C
CP
Note: Drawing not to scale.
TSOP-G
Table 20. TSOP48 Lead Plastic Thin Small Outline, 12x20 mm, Package Mechanical Data
N = TSOP48: 12 x 20 mm
ZE = TFBGA48: 6 x 8mm, 0.8mm pitch
Temperature Range
1 = 0 to 70 °C
6 = –40 to 85 °C
Option
Blank = Standard Packing
T = Tape & Reel Packing
E = Lead-free Package, Standard Packing
F = Lead-free Package, Tape & Reel Packing
Note: This product is also available with the Extended Block factory locked. For further details and ordering
information contact your nearest Numonyx sales office.
Devices are shipped from the factory with the memory content bits erased to ’1’.
For a list of available options (Speed, Package, etc.) or for further information on any aspect of this device,
please contact the Numonyx Sales Office nearest to you.
Note: 1. Used as the Extended Block Addresses in Extended Block mode.
(Kbytes/
Kwords)
Protection Block
Group
380000h-38FFFFh1C0000h–1C7FFFh
Protection Group
3C0000h-3CFFFFh1E0000h–1E7FFFh
Protection Group
(x8)(x16)
39/51
M29DW323DT, M29DW323DB
APPENDIX B. COMMON FLASH INTERFACE (CFI)
The Common Flash Interface is a JEDEC approved, standardized data structure that can be
read from the Flash memory device. It allows a
system software to query the device to determine
various electrical and timing parameters, density
information and functions supported by the memory. The system can interface easily with the device, enabling the software to upgrade itself when
necessary.
When the CFI Query Command is issued the device enters CFI Query mode and the data structure
Table 25. Query Structure Overview
Address
x16x8
10h20hCFI Query Identification StringCommand set ID and algorithm data offset
1Bh36hSystem Interface InformationDevice timing & voltage information
61hC2hSecurity Code Area64 bit unique device number
Note: Query data are always presented on the lowest order data outputs.
Primary Algorithm-specific Extended
Query table
Sub-section NameDescription
Table 26. CFI Query Identification String
Address
x16x8
10h20h0051h“Q”
11h22h0052hQuery Unique ASCII String "QRY""R"
12h24h0059h"Y"
13h26h0002h
14h28h0000h
15h2Ah0040h
16h2Ch0000h
17h2Eh0000h
18h30h0000h
19h32h0000h
1Ah34h0000h
Note: Query data are always presented on the lowest order data outputs (DQ7-DQ0) only. DQ8-DQ15 are ‘0’.
DataDescriptionValue
Primary Algorithm Command Set and Control Interface ID code 16 bit
ID code defining a specific algorithm
Address for Primary Algorithm extended Query table (see Table 29.)P = 40h
Alternate Vendor Command Set and Control Interface ID Code second
vendor - specified algorithm supported
Address for Alternate Algorithm extended Query table
is read from the memory. Tables 25, 26, 27, 28, 29
and 30 show the addresses used to retrieve the
data.
The CFI data structure also contains a security
area where a 64 bit unique security number is written (see Table 30., Security Code Area). This area
can be accessed only in Read mode by the final
user. It is impossible to change the security number after it has been written by Numonyx.
Additional information specific to the Primary
Algorithm (optional)
AMD
Compatible
NA
NA
40/51
Table 27. CFI Query System Interface Information
Address
x16x8
1Bh36h0027h
1Ch38h0036h
1Dh3Ah00B5h
1Eh3Ch00C5h
1Fh3Eh0004h
20h40h0000h
21h42h000Ah
22h44h0000h
23h46h0004h
24h48h0000h
25h4Ah0003h
26h4Ch0000h
DataDescriptionValue
V
Logic Supply Minimum Program/Erase voltage
CC
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
Logic Supply Maximum Program/Erase voltage
V
CC
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
V
[Programming] Supply Minimum Program/Erase voltage
PP
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
[Programming] Supply Maximum Program/Erase voltage
V
PP
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
Typical timeout per single byte/word program = 2
Typical timeout for minimum size write buffer program = 2
Typical timeout per individual block erase = 2
Typical timeout for full Chip Erase = 2
Maximum timeout for byte/word program = 2
Maximum timeout for write buffer program = 2
Maximum timeout per individual block erase = 2
Maximum timeout for Chip Erase = 2
M29DW323DT, M29DW323DB
n
µs
n
µs
n
ms
n
ms
n
times typical
n
times typical
n
times typical
n
times typical
2.7V
3.6V
11.5V
12.5V
16µs
NA
1s
NA
256 µs
NA
8s
NA
Table 28. Device Geometry Definition
Address
x16x8
27h4Eh0016h
28h
29h
2Ah
2Bh
50h
52h
54h
56h
2Ch58h0002h
2Dh
2Eh
2Fh
30h
31h
32h
33h
34h
Note: For the M29DW323DB, Region 1 corresponds to addresses 000000h to 007FFFh and Region 2 to addresses 008000h to 1FFFFFh.
For the M29DW323DT, Region 1 corresponds to addresses 1F8000h to 1FFFFFh and Region 2 to addresses 000000h to 1F7FFFh.
5Ah
5Ch
5Eh
60h
62h
64h
66h
68h
DataDescriptionValue
0002h
0000h
0000h
0000h
0007h
0000h
0020h
0000h
003Eh
0000h
0000h
0001h
Device Size = 2
n
in number of bytes
Flash Device Interface Code description
Maximum number of bytes in multi-byte program or page = 2
Number of Erase Block Regions. It specifies the number of
regions containing contiguous Erase Blocks of the same size.
Region 1 Information
Number of Erase Blocks of identical size = 0007h+1
Region 1 Information
Block size in Region 1 = 0020h * 256 byte
Region 2 Information
Number of Erase Blocks of identical size = 003Eh+1
Region 2 Information
Block size in Region 2 = 0100h * 256 byte
00 = required, 01= not required
Silicon Revision Number (bits 7 to 2)
00 = not supported, 01 = Read only, 02 = Read and Write
00 = not supported, x = number of blocks in per group
00 = not supported, 01 = supported
04 = M29DW323D
x = number of blocks in Bank B
Supply Minimum Program/Erase voltage
PP
bit 7 to 4 HEX value in volts
bit 3 to 0 BCD value in 100 mV
Supply Maximum Program/Erase voltage
PP
bit 7 to 4 HEX value in volts
bit 3 to 0 BCD value in 100 mV
02h = Bottom Boot device, 03h = Top Boot device
"P"
Ye s
2
1
Ye s
04
48
11.5V
12.5V
–
Table 30. Security Code Area
Address
x16x8
61hC3h, C2hXXXX
62hC5h, C4hXXXX
63hC7h, C6hXXXX
64hC9h, C8hXXXX
42/51
DataDescription
64 bit: unique device number
APPENDIX C. EXTENDED MEMORY BLOCK
The M29DW323D has an extra block, the Extended Block, that can be accessed using a dedicated
command.
This Extended Block is 32 KWords in x16 mode
and 64 KBytes in x8 mode. It is used as a security
block (to provide a permanent security identification number) or to store additional information.
The Extended Block is either Factory Locked or
Customer Lockable, its status is indicated by bit
DQ7. This bit is permanently set to either ‘1’ or ‘0’
at the factory and cannot be changed. When set to
‘1’, it indicates that the device is factory locked and
the Extended Block is protected. When set to ‘0’, it
indicates that the device is customer lockable and
the Extended Block is unprotected. Bit DQ7 being
permanently locked to either ‘1’ or ‘0’ is another
security feature which ensures that a customer
lockable device cannot be used instead of a factory locked one.
Bit DQ7 is the most significant bit in the Extended
Block Verify Code and a specific procedure must
be followed to read it. See “Extended Memory
Block Verify Code
tions, BYTE = V
, respectively, for details of how to read bit
V
IH
DQ7.
” in Tables 3 and 4, Bus Opera-
and Bus Operations, BYTE =
IL
The Extended Block can only be accessed when
the device is in Extended Block mode. For details
of how the Extended Block mode is entered and
exited, refer to the Enter Extended Block Com-
mand and Exit Extended Block Command para-
graphs, and to Tables 5 and 6, “Commands, 16-bit
mode, BYTE = V
BYTE = V
IL
” and “Commands, 8-bit mode,
IH
”, respectively.
Factory Locked Extended Block
In devices where the Extended Block is factory
locked, the Security Identification Number is written to the Extended Block address space (see Ta-
ble 31., Extended Block Address and Data) in the
factory. The DQ7 bit is set to ‘1’ and the Extended
Block cannot be unprotected.
Customer Lockable Extended Block
A device where the Extended Block is customer
lockable is delivered with the DQ7 bit set to ‘0’ and
the Extended Block unprotected. It is up to the
customer to program and protect the Extended
Block but care must be taken because the protection of the Extended Block is not reversible.
There are two ways of protecting the Extended
Block:
■ Issue the Enter Extended Block command to
■ Issue the Enter Extended Block command to
Once the Extended Block is programmed and protected, the Exit Extended Block command must be
issued to exit the Extended Block mode and return
the device to Read mode.
M29DW323DT, M29DW323DB
place the device in Extended Block mode,
then use the In-System Technique with RP
either at V
In-System Technique and to the
or at V
IH
(refer to APPENDIX D.,
ID
corresponding flowcharts, Figures 22 and 23,
for a detailed explanation of the technique).
place the device in Extended Block mode,
then use the Programmer Technique (refer to
APPENDIX D., Programmer Technique and to
the corresponding flowcharts, Figures 20 and
21, for a detailed explanation of the
technique).
Table 31. Extended Block Address and Data
(1)
Device
M29DW323DT
M29DW323DB
Note: 1. See Tables 23 and 24, Top and Bottom Boot Block Addresses.
3F0000h-3F000Fh1F8000h-1F8007h
3F0010h-3FFFFFh1F8008h-1FFFFFhUnavailable
000000h-00000Fh000000h-000007h
000010h-00FFFFh000008h-007FFFhUnavailable
Address
x8x16Factory LockedCustomer Lockable
Security Identification
Number
Security Identification
Number
Data
Determined by
Customer
Determined by
Customer
43/51
M29DW323DT, M29DW323DB
APPENDIX D. BLOCK PROTECTION
Block protection can be used to prevent any operation from modifying the data stored in the memory. The blocks are protected in groups, refer to
APPENDIX A., Tables 23 and 24 for details of the
Protection Groups. Once protected, Program and
Erase operations within the protected group fail to
change the data.
There are three techniques that can be used to
control Block Protection, these are the Programmer technique, the In-System technique and Temporary Unprotection. Temporary Unprotection is
controlled by the Reset/Block Temporary Unprotection pin, RP
scriptions section.
Programmer Technique
The Programmer technique uses high (V
age levels on some of the bus pins. These cannot
be achieved using a standard microprocessor bus,
therefore the technique is recommended only for
use in Programming Equipment.
To protect a group of blocks follow the flowchart in
Figure 20., Programmer Equipment Group Protect
Flowchart. To unprotect the whole chip it is neces-
sary to protect all of the groups first, then all
groups can be unprotected at the same time. To
unprotect the chip follow Figure 21., Programmer
Equipment Chip Unprotect Flowchart. Table
32., Programmer Technique Bus Operations,
BYTE = V
ation.
The timing on these flowcharts is critical. Care
should be taken to ensure that, where a pause is
; this is described in the Signal De-
) volt-
ID
or VIL, gives a summary of each oper-
IH
specified, it is followed as closely as possible. Do
not abort the procedure before reaching the end.
Chip Unprotect can take several seconds and a
user message should be provided to show that the
operation is progressing.
In-System Technique
The In-System technique requires a high voltage
level on the Reset/Blocks Temporary Unprotect
(1)
pin, RP
. This can be achieved without violating
the maximum ratings of the components on the microprocessor bus, therefore this technique is suitable for use after the memory has been fitted to
the system.
To protect a group of blocks follow the flowchart in
Figure 22., In-System Equipment Group Protect
Flowchart. To unprotect the whole chip it is neces-
sary to protect all of the groups first, then all the
groups can be unprotected at the same time. To
unprotect the chip follow Figure 23., In-System
Equipment Chip Unprotect Flowchart.
The timing on these flowcharts is critical. Care
should be taken to ensure that, where a pause is
specified, it is followed as closely as possible. Do
not allow the microprocessor to service interrupts
that will upset the timing and do not abort the procedure before reaching the end. Chip Unprotect
can take several seconds and a user message
should be provided to show that the operation is
progressing.
Note: 1. RP can be either at V
tem Technique to protect the Extended Block.
IH
or at V
when using the In-Sys-
ID
Table 32. Programmer Technique Bus Operations, BYTE = VIH or V
OperationEGW
Block (Group)
(1)
Protect
Chip Unprotect
Block (Group)
Protection Verify
Block (Group)
Unprotection Verify
Note: 1. Block Protection Groups are shown in APPENDIX A., Tables 23 and 24.
44/51
VILVIDVIL Pulse
V
IDVIDVIL
V
ILVIL
V
ILVIL
Pulse
V
IH
V
IH
A0 = VIL, A1 = VIH, A6 = VIL, A9 = VID,
A0 = VIL, A1 = VIH, A6 = VIH, A9 = VID,
Address Inputs
A0-A20
A9 = V
, A12-A20 Block Address
ID
Others = X
A9 = V
, A12 = VIH, A15 = VIH
ID
Others = X
A12-A20 Block Address
Others = X
A12-A20 Block Address
Others = X
IL
Data Inputs/Outputs
DQ15A–1, DQ14-DQ0
X
X
Pass = XX01h
Retry = XX00h
Retry = XX01h
Pass = XX00h
Figure 20. Programmer Equipment Group Protect Flowchart
START
ADDRESS = GROUP ADDRESS
W = V
IH
n = 0
G, A9 = VID,
E = V
IL
Wait 4µs
W = V
IL
Wait 100µs
W = V
IH
E, G = VIH,
A0, A6 = VIL,
A1 = V
IH
E = V
IL
M29DW323DT, M29DW323DB
Wait 4µs
G = V
IL
VerifyProtectSet-upEnd
Note: Block Protection Groups are shown in APPENDIX D., Tables 23 and 24.
Note: Block Protection Groups are shown in APPENDIX D., Tables 23 and 24.
IH
INCREMENT
CURRENT GROUP
IH
YESNO
NO
LAST
GROUP
YES
RP = V
IH
ISSUE READ/RESET
COMMAND
PASS
AI05577
48/51
M29DW323DT, M29DW323DB
REVISION HISTORY
Table 33. Document Revision History
DateVersionRevision Details
20-Sep-2001-01First Issue (Target Specification)
26-Oct-2001-02Document expanded to full Product Preview
16-Jan-2002-03Corrections made in “Primary Algorithm-Specific Extended Query” Table in Appendix-B
Description of Ready/Busy signal clarified (and Figure 16. modified)
19-Apr-2002-04
24-Apr-2002-05
19-Jul-2002-06
08-Apr-20036.1
07-May-20036.2
25-Jun-20037.0
18-Sep-20037.1
07-Oct-20037.2
07-Nov-20037.3
Clarified allowable commands during block erase
Clarified the mode the device returns to in the CFI Read Query command section
tPLYH (time to reset device) re-specified.
Values for addresses 23h and 25h corrected in CFI Query System Interface Information
table in Appendix B
When in Extended Block mode, the block at the boot block address can be used as OTP.
Data Toggle Flow chart corrected. Document promoted from “Product Preview” to
“Preliminary Data”.
Revision numbering modified: a minor revision will be indicated by incrementing the digit
after the dot, and a major revision, by incrementing the digit before the dot (revision version
06 equals 6.0).
Revision History moved to end of document.
TFBGA48, 6 x 8mm, 0.80mm pitch package added. Identification Current I
Table 14., DC Characteristics. Erase Suspend Latency time and Data Retention
parameters and notes added to Table 7., Program, Erase Times and Program, Erase
Endurance Cycles.
APPENDIX C., EXTENDED MEMORY BLOCK, added. Auto Select Command sued to
read the Extended Memory Block. Extended Memory Block Verify Code row added to
Ta bl e s 3 and 4, Bus Operations, BYTE = V
Address modified in Auto Select Command. Chip Erase Address modified in Table 8.,
Status Register Bits. V
22., Ordering Information Scheme.
Table 20., TSOP48 Lead Plastic Thin Small Outline, 12x20 mm, Package Mechanical
Data, and Figure 18., TSOP48 Lead Plastic Thin Small Outline, 12x20 mm, Bottom View
Package Outline, corrected.
Document promoted from Preliminary Data to full Datasheet status. Packing option added
to Table 22., Ordering Information Scheme.
Status of Ready/Busy signal for Erase Suspend Operation modified in Table 8., Status
Register Bits.
Figures 14 and 15, Toggle and Alternative Toggle Bits Mechanisms added.
Table 18., Toggle and Alternative Toggle Bits AC Characteristics, added.
Note 1 of Table 28., Device Geometry Definition, modified
Figures 14 and 15, Toggle and Alternative Toggle Bits Mechanisms modified and Notes 1
and 2 added.
Table 18., Toggle and Alternative Toggle Bits AC Characteristics modified.
Figure 8. renamed and flowchart modified; Note added.
Status of Ready/Busy signal for Program Error, Chip Erase and Block Erase modified in
Table 8., Status Register Bits.
pin connection to ground clarified. Note added to Table
SS
and Bus Operations, BYTE = VIH. Bank
IL
removed from
ID
49/51
M29DW323DT, M29DW323DB
DateVersionRevision Details
minimum value updated in Table 12., Operating and AC Measurement Conditions.
V
CC
and I
V
PP
Architecture option updated in Table 22. Ordering Information Scheme.