Absolute Maximum Ratings (Note 1)
Supply Voltage +12V to −0.2V
Output Voltage +V
S
+ 0.6V to
−1.0V
Output Current 10 mA
Storage Temperature −65˚C to +150˚C
Lead Temperature:
SOT Package (Note 2):
Vapor Phase (60 seconds) 215˚C
Infrared (15 seconds) 220˚C
ESD Susceptibility (Note 3):
Human Body Model
Machine Model
2000V
250V
Operating Ratings (Note 1)
Specified Temperature Range
(Note 4) T
MIN
to T
MAX
LM45B, LM45C −20˚C to +100˚C
Operating Temperature Range
LM45B, LM45C −40˚C to +125˚C
Supply Voltage Range (+V
S
) +4.0V to +10V
Electrical Characteristics
Unless otherwise noted, these specifications apply for +VS= +5Vdc and I
LOAD
= +50 µA, in the circuit of
Figure 2
. These
specifications also apply from +2.5˚C to T
MAX
in the circuit of
Figure 1
for +VS= +5Vdc. Boldface limits apply for TA=TJ=
T
MIN
to T
MAX
; all other limits TA=TJ= +25˚C, unless otherwise noted.
Parameter Conditions LM45B LM45C Units
(Limit)
Typical Limit Typical Limit
(Note 5) (Note 5)
Accuracy T
A
=+25˚C
±
2.0
±
3.0 ˚C (max)
(Note 6) T
A=TMAX
±
3.0
±
4.0 ˚C (max)
T
A=TMIN
±
3.0
±
4.0 ˚C (max)
Nonlinearity T
MIN≤TA≤TMAX
±
0.8
±
0.8 ˚C (max)
(Note 7)
Sensor Gain T
MIN≤TA≤TMAX
+9.7 +9.7 mV/˚C (min)
(Average Slope) +10.3 +10.3 mV/˚C (max)
Load Regulation (Note 8) 0≤I
L
≤ +1 mA
±
35
±
35 mV/mA
(max)
Line Regulation +4.0V≤+V
S
≤+10V
±
0.80
±
0.80 mV/V (max)
(Note 8)
±
1.2
±
1.2 mV/V (max)
Quiescent Current +4.0V≤+V
S
≤+10V, +25˚C 120 120 µA (max)
(Note 9) +4.0V≤+V
S
≤+10V 160 160 µA (max)
Change of Quiescent 4.0V≤+V
S
≤10V 2.0 2.0 µA (max)
Current (Note 9)
Temperature Coefficient +2.0 +2.0 µA/˚C
of Quiescent Current
Minimum Temperature In circuit of +2.5 +2.5 ˚C (min)
for Rated Accuracy
Figure 1
,IL=0
Long Term Stability (Note 10) T
J=TMAX
, for 1000 hours
±
0.12
±
0.12 ˚C
Note 1: Absolute Maximum Ratings indicate limitsbeyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its rated operating conditions.
Note 2: See AN-450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in a current National Semiconductor Linear Data Book for other methods of soldering surface mount devices.
Note 3: Human body model, 100 pF discharged through a 1.5 kΩ resistor. Machine model, 200 pF discharged directly into each pin.
Note 4: Thermal resistance of the SOT-23 package is 260˚C/W, junction to ambient when attached to a printed circuit board with 2 oz. foil as shown in
Figure 3
.
Note 5: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 6: Accuracy is defined as the error between the output voltage and 10 mv/˚C times the device’s case temperature, at specified conditions of voltage, current,
and temperature (expressed in ˚C).
Note 7: Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device’s rated temperature
range.
Note 8: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be com-
puted by multiplying the internal dissipation by the thermal resistance.
Note 9: Quiescent current is measured using the circuit of
Figure 1
.
Note 10: For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46
hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur.
LM45
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