NSC 100353FMQB, 100353FM-MLS, 100353DMQB Datasheet

100353 Low Power 8-Bit Register
General Description
The 100353 contains eight D-type edge triggered, master/ slave flip-flops with individual inputs (D
n
), true outputs (Qn), a clock input (CP), and a common clock enable pin (CEN). Data enters the master when CP is LOW and transfers to the slave when CP goes HIGH. When the CEN input goes HIGH it overrides allotherinputs,disablestheclock,and the Q out­puts maintain the last state.
The 100353 output drivers are designed to drive 50termi­nation to −2.0V.All inputs have 50 kpull-down resistors.
Features
n Low power operation n 2000V ESD protection n Voltage compensated operating range=−4.2V to −5.7V n Available to MIL-STD-883
Logic Symbol
Pin Names Description
D
0–D7
Data Inputs
CEN
Clock Enable Input CP Clock Input (Active Rising Edge) Q
0–Q7
Data Outputs NC No Connect
DS100316-4
August 1998
100353 Low Power 8-Bit Register
© 1998 National Semiconductor Corporation DS100316 www.national.com
Connection Diagrams
Logic Diagram
Truth Table
Inputs Outputs
D
n
CEN CP Q
n
LL
N
L
HL
N
H XXL NC XXH NC XHX NC
H
=
HIGH Voltage Level L=LOW Voltage Level X=Don’t Care NC=No Change
N
=
LOW to HIGH Transition
24-Pin DIP
DS100316-1
24-Pin Quad Cerpak
DS100316-2
DS100316-5
www.national.com 2
Absolute Maximum Ratings (Note 1)
Above which the useful life may be impared Storage Temperature (T
STG
) −65˚C to +150˚C
Maximum Junction Temperature (T
J
)
Ceramic +175˚C
V
EE
Pin Potential to Ground Pin −7.0V to +0.5V
Input Voltage (DC) V
EE
to + 0.5V
Output Current (DC Output HIGH) −50 mA
ESD (Note 2) 2000V
Recommended Operating Conditions
Case Temperature (TC)
Military −55˚C to +125˚C
Supply Voltage (V
EE
) −5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the de­vice may be damaged or have its useful life impaired. Functional operation under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
=
−4.2V to −5.7V, V
CC
=
V
CCA
=
GND, T
C
=
−55˚C to +125˚C
Symbol Parameter Min Max Units T
C
Conditions Notes
V
OH
Output HIGH Voltage −1025 −870 mV 0˚C to
+125˚C
−1085 −870 mV −55˚C V
IN
=
V
IH
(Max) Loading with (Notes 3, 4, 5)
V
OL
Output LOW Voltage −1830 −1620 mV 0˚C to or VIL(Min) 50to −2.0V
+125˚C
−1830 −1555 mV −55˚C
V
OHC
Output HIGH Voltage −1035 mV 0˚C to
+125˚C
−1085 mV −55˚C V
IN
=
V
IH
(Min) Loading with (Notes 3, 4, 5)
V
OLC
Output LOW Voltage −1610 mV 0˚C to or VIL(Max) 50to −2.0V
+125˚C
−1555 mV −55˚C
V
IH
Input HIGH Voltage −1165 −870 mV −55˚C to Guaranteed HIGH Signal for all Inputs (Notes 3, 4, 5, 6)
+125˚C
V
IL
Input LOW Voltage −1830 −1475 mV −55˚C to Guaranteed LOW Signal for all Inputs (Notes 3, 4, 5, 6)
+125˚C
I
IL
Input LOW Current 0.50 µA −55˚C to V
EE
=
−4.2V (Notes 3, 4, 5)
+125˚C V
IN
=
V
IL
(Min)
I
IH
Input HIGH Current 240 µA 0˚C to V
EE
=
−5.7V
V
IN
=
V
IH
(Max)
(Notes 3, 4, 5)
+125˚C
340 µA −55˚C
I
EE
Power Supply Current −55˚C to Inputs Open
−132 −42 mA +125˚C V
EE
=
−4.2V to −5.7V (Notes 3, 4, 5)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 4: Screen tested 100%on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing V
OH/VOL
.
AC Electrical Characteristics
V
EE
=
−4.2V to −5.7V, V
CC
=
V
CCA
=
GND
Symbol Parameter T
C
=
−55˚C T
C
=
+25˚C T
C
=
+125˚C Units Conditions Notes
Min Max Min Max Min Max
f
max
Toggle Frequency 400 400 400 MHz
Figures 1, 2
(Note 10)
www.national.com3
Loading...
+ 5 hidden pages