NSC 100323FMQB, 100323DMQB Datasheet
100323
Low Power Hex Bus Driver
General Description
The 100323 is a monolithic device containing six bus drivers
capable of driving terminated lines with terminations as low
as 25Ω. To reduce crosstalk, each output has its own respective ground connection. Transition times were designed
to be longer than on other F100K devices. The driver itself
performs the positive logic AND of a data input (D
1–D6
) and
the OR of two select inputs (E and either DE
1
,DE2,orDE3).
Enabling of dataispossible in multiples of two, i.e., 2, 4 or all
6 paths. All inputs have 50 kΩ pull-down resistors.
The output voltage LOW level is designed to be more negative than normal ECL outputs (cut off state). This allows an
emitter-follower output transistor to turn off when the termination supply is −2.0V and thus present a high impedance to
the data bus.
Features
n 50%power reduction of the 100123
n 2000V ESD protection
n −4.2V to −5.7V operating range
n Drives 25Ω load
Logic Symbol
Pin Names Description
D
1–D6
Data Inputs
DE
1
–DE
3
Dual Enable Inputs
E Common Enable Input
O
1–O6
Data Outputs
DS100312-7
August 1998
100323 Low Power Hex Bus Driver
© 1998 National Semiconductor Corporation DS100312 www.national.com
Connection Diagrams
Logic Diagram
Truth Table
EDEnDnD
n+1
O
n
O
n+1
L L X X Cutoff Cutoff
X H L L Cutoff Cutoff
X H L H Cutoff H
X H H L H Cutoff
XH H H H H
H X L L Cutoff Cutoff
H X L H Cutoff H
H X H L H Cutoff
HX H H H H
H
=
High
Cutoff=Lower-than-LOW state
L=Low
X=Don’t Care
24-Pin DIP
DS100312-3
24-Pin Quad Cerpak
DS100312-4
DS100312-1
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature −65˚C to +150˚C
Maximum Junction Temperature
Ceramic +175˚C
V
EE
Pin Potential to Ground Pin −7.0V to +0.5V
Input Voltage (DC) V
EE
to +0.5V
Output Current (DC Output High) −50 mA
ESD ≥2000V
Recommended Operating
Conditions
Case Temperature
Military −55˚C to +125˚C
Supply Voltage (V
EE
) −5.7V to −4.2V
Note 1: Absolutemaximumratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under these
conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
=
−4.2V to −5.7V, V
CC
=
V
CCA
=
GND, T
C
=
−55˚C to +125˚C
Symbol Parameter Min Max Units T
C
Conditions Notes
V
OH
Output HIGH −1025 −870 mV 0˚C to +125˚C V
IN
=
V
IH (max)
Loading with (Notes 3, 4, 5)
Voltage −1085 −870 mV −55˚C or V
IL (min)
25Ω to −2.0V
V
OHC
Output HIGH −1035 mV 0˚C to +125˚C V
IN
=
V
IH (min)
or V
IL (max)
Loading with
25Ω to −2.0V
(Notes 3, 4, 5)
Voltage −1085 mV −55˚C
V
OLC
Output LOW −1610 mV 0˚C to +125˚C
Voltage −1555 MV −55˚C
V
OLZ
Cut-Off LOW −1950 mV 0˚C to +125˚C V
IN
=
V
IH (min)
Loading with (Notes 3, 4, 5)
Voltage −1850 −55˚C or V
IL (max)
25Ω to −2.0V
V
IH
Input HIGH −1165 −870 mV −55˚C to +125˚C Guaranteed HIGH Signal (Notes 3, 4, 5, 6)
Voltage for All Inputs
V
IL
Input LOW −1830 −1475 mV −55˚C to +125˚C Guaranteed LOW Signal (Notes 3, 4, 5, 6)
Voltage for All Inputs
I
IL
Input LOW
Current
0.50 µA −55˚C to +125˚C V
EE
=
4.2V, V
IN
=
V
IL (min)
(Notes 3, 4, 5)
I
IH
Input HIGH 240 µA 0˚C to +125˚C V
EE
=
−5.7V, V
IN
=
V
IH (max)
(Notes 3, 4, 5)
Current 340 µA −55˚C
I
EE
Power Supply Inputs Open
Current −155 −53 mA −55˚C to +125˚C V
EE
=
−4.2V to −5.7V (Notes 3, 4, 5)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100%on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing V
OH/VOL
.
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