NSC 100314MW8, 100314MDS Datasheet
100314
Low Power Quint Differential Line Receiver
General Description
The 100314 is a monolithic quint differential line receiver with
emitter-follower outputs. An internal reference supply (V
BB
)
is available for single-ended reception. When used in
single-ended operation the apparent input threshold of the
true inputs is 25 mV to 30 mV higher (positive) than the
threshold of the complementary inputs. Unlike other F100K
ECL devices, the inputs do not have input pull-down resistors.
Active current sources provide common-mode rejection of
1.0V in either the positive or negative direction. A defined
output state exists if both inverting and non-inverting inputs
are at the same potential between V
EE
and VCC. The defined
state is logic HIGH on the O
a–Oe
outputs.
Features
n 35%power reduction of the 100114
n 2000V ESD protection
n Pin/function compatible with 100114
n Voltage compensated operating range=−4.2V to −5.7V
n Standard Microcircuit Drawing
(SMD) 5962-9162901
Logic Symbol
Pin Names Description
D
a–De
Data Inputs
D
a–De
Inverting Data Inputs
O
a–Oe
Data Outputs
O
a–Oe
Complementary Data Outputs
DS100299-1
August 1998
100314 Low Power Quint Differential Line Receiver
© 1998 National Semiconductor Corporation DS100299 www.national.com
Connection Diagrams
24-Pin DIP
DS100299-2
24-Pin Quad Cerpak
DS100299-3
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired (Note 1)
Storage Temperature (T
STG
) −65˚C to +150˚C
Maximum Junction Temperture (T
J
)
Ceramic +175˚C
Pin Potential to Ground Pin (V
EE
) −7.0V to +0.5V
Input Voltage (DC) V
EE
to +0.5V
Output Current (DC Output HIGH) −50 mA
ESD (Note 2) ≥2000V
Recommended Operating
Conditions
Case Temperature (TC)
Military −55˚C to +125˚C
Supply Voltage (V
EE
) −5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
=
−4.2V to −5.7V, V
CC
=
V
CCA
=
GND, T
C
=
−55˚C to +125˚C (Note 5)
Symbol Parameter Min Typ Max Units T
C
Conditions Notes
V
OH
Output HIGH
Voltage
−1025 −870 mV
0˚C to V
IN
=
V
IH
(Max)
or VIL(Min)
Loading with
50Ω to −2.0V
+125˚C
−1085 −870 mV −55˚C (Notes 3, 4, 5)
V
OL
Output LOW Voltage −1830 −1620 mV 0˚C to
+125˚C
−1830 −1555 mV −55˚C
V
OHC
Output HIGH −1035 mV 0˚C to V
IN
=
V
IH
(Max)
or VIL(Min)
Loading with
50Ω to −2.0V
Voltage +125˚C
−1085 mV −55˚C (Notes 3, 4, 5)
V
OLC
Output LOW −1610 mV 0˚C to
Voltage +125˚C
−1555 mV −55˚C
V
BB
Output Reference −1260 mV 0˚C to I
VBB
=
0 µA, V
EE
=
4.2V (Notes 3, 4, 5)
Voltage +125˚C
−1380 −1260 mV 0˚C to I
VBB
=
−250 µA, V
EE
=
−5.7V
+125˚C (Notes 3, 4, 5)
−1396 mV −55˚C I
VBB
=
−350 µA, V
EE
=
−5.7V
V
DIFF
Input Voltage 150 mV −55˚C to Required for Full Output Swing (Notes 3, 4, 5)
Differential +125˚C
V
CM
Common Mode VCC− 2.0 VCC− 0.5 V −55˚C to (Notes 3, 4, 5)
Voltage +125˚C
V
IH
Single-Ended −1165 −870 mV −55˚C to Guaranteed HIGH Signal for All (Notes 3, 4, 5, 6)
Input High Voltage +125˚C Inputs (with D
n
tied to VBB)
V
IL
Single-Ended −1830 −1475 mV −55˚C to Guaranteed LOW Signal for All (Notes 3, 4, 5, 6)
Input Low Voltage +125˚C Inputs (with D
n
tied to VBB)
I
IH
Input HIGH Current 50 µA 0˚C to V
IN
=
V
IH (Max),Da–De
=
V
BB
,
+125˚C D
a–De
=
V
IL (Min)
(Notes 3, 4, 5)
70 µA −55˚C
I
CBO
Input Leakage −10 µA −55˚C to V
IN
=
V
EE,Da–De
=
V
BB
, (Notes 3, 4, 5)
Current +125˚C D
a–De
=
V
IL (Min)
I
EE
Power Supply −65 −25 mA −55˚C to Da–D
e
=
V
BB
, (Notes 3, 4, 5)
Current +125˚C D
a–De
=
V
IL (Min)
Note 3: F100K 300 Seriescoldtemperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100%on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing V
OH/VOL
.
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