Noty an10f Linear Technology

Application Note 10
Methods of Measuring Op Amp Settling Time
Jim Williams
July 1985
Figure 1 shows one way to measure amplifier settling time (see References 1, 2, and 3). The circuit uses the “false sum node” technique. The resistors and amplifier form a bridge-type network. Assuming ideal resistors, the amplifier output will step to –V
when an input pulse is
IN
applied. During slew, the oscilloscope probe is bounded by the diodes, limiting voltage excursion. When settling occurs, the oscilloscope probe voltage should be zero. Note that the resistor divider’s attenuation means the probe’s output will be one-half of the actual settled voltage.
In theory, this circuit allows settling to be observed to small amplitudes. In practice, it cannot be relied upon to produce useful measurements. Several flaws exist. The circuit requires the input pulse to have a flat top within the required measurement limits. Typically, settling within
10mV or less for a 10V step is of interest. No general­purpose pulse generator is meant to hold output amplitude and noise within these limits. Generator output-caused aberration appearing at the oscilloscope probe will be indistinguishable from amplifier output movement, pro­ducing unreliable results. The oscilloscope connection presents additional problems. As probe capacitance rises, AC loading of the resistor junction will influence observed settling waveforms. The 20pF probe shown alleviates this problem but its 10X attenuation sacrifices oscilloscope gain. 1X probes are not suitable because of their excessive input capacitance. An active 1X FET probe will work, but another issue remains.
The clamp diodes at the probe point are intended to reduce swing during amplifier slewing, preventing excessive oscil­loscope overdrive. Unfortunately, oscilloscope overdrive recovery characteristics vary widely among different types and are not usually specified. The diodes’ 600mV drop means the oscilloscope may see an unacceptable overload, bringing displayed results into question (for a discussion of oscilloscope overdrive considerations, see Box SectionA, “Evaluating Oscilloscope Overload Response”).
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SCOPE PROBE 20pF OR LESS
4.99k4.99k
1N4148
V
IN
4.99k
–15V 15V
Figure 1. Typical Settling Time Test Circuit
1N4148
4.99k
AUT
+
0.01
V
0.01
SCOPE VERTICAL 1mV/DIV
V
ERROR
OUT
SCOPE VERTICAL INPUT REFERENCE
AN10 F01
=
VIN – V
OUT
2
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Application Note 10
Figure 2 shows a practical settling time test circuit that ad­dresses the problems discussed. Combined with a careful evaluation of the test oscilloscope used, it permits reliable settling time measurements in the 0.1% to 0.01% region. The input pulse does not drive the amplifier, but switches a Schottky bridge via a clamp. The bridge is biased from two low noise LT1021-10V references. Depending on input pulse polarity, current flows through the appropriate 10k resistor to bias the amplifier’s summing point. The bridge switches cleanly and quickly, producing a flat-topped current pulse into the AUT. The circuit’s input pulse char­acteristics do not influence the measurement. A second clamp-bridge arrangement supplies an opposite polarity signal which is nulled against the amplifier’s output at point B. Schottky clamp diodes limit this point’s voltage excursion to ±300mV.
TTL
INPUT
PULSE
15V
50Ω
LT1021-10
IN
2k
GND
OUT
10k
1µF
+
C
(SELECT)
f
10k
A
The Q1-Q5 configuration forms a low input capacitance, high speed buffer to drive the oscilloscope. Q1A’s 1pF to 2pF input capacitance provides very light AC loading, eliminating probe-caused problems. Q1B, running as a current sink, compensates Q1A’s V
drop. Q2-Q5 form
GS
a complementary emitter-follower, which can drive sub­stantial cable capacitance without distortion.
The circuit should be built on a ground planed board with particular care taken to ensure low stray capacitance at points A and B. The AUT socket should be selected for short pin lengths. Very high speed amplifiers (t
SETTLE
< 200ns)
should be directly soldered into the circuit.
USE GROUND PLANE BYPASS SUPPLIES AT AMPLIFIER UNDER TEST AND OUTPUT STAGE. MINIMIMZE STRAY CAPACITANCE AT POINTS A AND B
ALL HP5082-2810
NC
2k
LT1021-10
OUT
GND
10k
10k
10k
2k1µF
–15V
AUT
+
B
1k NULL TRIM
9.76k
Figure 2. Improved Settling Time Test Circuit
Q1A
Q1B
–15V
1/2 U440
50Ω
1/2 U440
100Ω ZERO
15V15V
–15V
15V
–15V –15V
15V
4.7k
Q2 2N5160
Q3 2N3866
4.7k
Q4 2N3866
SETTLE OUTPUT (TO OSCILLOSCOPE)
Q5 2N5160
AN10 F02
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Application Note 10
This circuit, combined with a judiciously chosen oscillo­scope, allows observation of amplifier settling to a millivolt (0.01%) for a 10V step. A good way to gain confidence in the circuit is to test a very fast UHF amplifier. Figure 3 shows response for an amplifier (Teledyne Philbrick 1435) specified to settle in 70ns within a millivolt for a 10V step. Trace A is the input pulse, Trace B is the amplifier output and Trace C is the settle signal. Settling occurs inside 70ns, indicating good agreement between the circuit and the AUT specification. Since most amplifiers are not nearly this fast, it is reasonable to assume that the circuit will always provide reliable results.
A = 5V/DIV
B = 5V/DIV
C = 5mV/DIV
Because this circuit works by nulling opposite polarity sources, it seems unable to test followers—but it can. The AUT is battery-powered and completely floated from the circuit’s power supply (Figure 4). The AUT output is connected to circuit ground and the battery center tap becomes the output. The positive input is driven from the Schottky bridge. The floating power supply lets the follower fool the circuit into thinking it is testing an in­verter. The AUT’s output appears inverted, but this is not a significant penalty.
20ns/DIV
Figure 3. Settling Detail for a Fast Amplifier
+V
AUT
+
15V
+
A = –1
NULL POINT
AN10 F04
TO OUTPUT BUFFER
+
15V
–V
+V
–V
Figure 4. Circuit for Testing Followers
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