BH3541F, BH3544F, BH3547F, BH3548F is headphone amplifiers suitable for portable products.
BH3541F has a fixed gain of 0 dB and BH3544F, BH3547F, BH3548F has a fixed gain of 6 dB.
External resistors for gain setting are not needed. Package of BH3541F, BH3544F, BH3547F, BH3548F is pin-to-pin
compatible (SOP8), enable to replace each other easily.
BH3541F, BH3544F, BH3547F, BH3548F also has mute functions that make it easy to prevent pop noise when power
supply turns on/off. Moreover, thermal shutdown function is built-in.
BH3541F, BH3544F, BH3547F can drive 16/32 load, BH3548F can drive 8/16/32 . So, BH3548F is suitable for 8
receiver.
Features
1) Built-in mute function for preventing pop noise when power supply turns on/off
2) Built-in thermal shutdown function
3) BH3541F, BH3544F, BH3547F, BH3548F are pin-to-pin compatible
4) SOP8 small package
Applications
TV, Desktop PC, Notebook PC, Camcorder and other equipment having headphone output
Line up
Supply voltage +2.8 +6.5 +4.5 +5.5 +4.0 +5.5 V
Quiescent current 7.0 3.7 6.5 mA
Amplifier gain 0 6 dB
Output [RL=16 ] 62 77 62 mW
load impedance 16 / 32 8/16/32
Operating temperature range -25 +75 -40 +85
,B
Part No. BH3541F BH3544F BH3547F BH3548F Unit
No.10102EAT02
Absolute maximum ratings(Ta=25°C)
Parameter Symbol
Applied voltage
Power dissipation
Storage temperature
*1 Derating is done at 5.5mW/°C above Ta=25°C. (When mounted on a 70mm×70mm×1.6mm PCB board, FR4)
Operating conditions (Ta=25°C)
Parameter Symbol
Supply voltage VCC
Temperature Range Topr -25 +75 -40 +85
* These product are not designed for protection against radioactive rays.
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Page 63
BH3541F,BH3544F,BH3547F,BH3548F
Application circuit
C7
V
CC
C8
+
µ
10
330
+
µ
V CC
TSD
OUT2
MUTE
Technical Note
C5
180k
(90k)
1
µ
V
2
IN
C6
47
µ
+
BIAS
0dB
(6dB)
0dB
(6dB)
BIAS
R5
IN2
5 6 7 8
180k
(90k)
VMUTE
H : Active
L : Mute
C1
330
µ
OUT1
+
100k
R2
2 1
MUTE
C2
1
µ
3 4
IN1
R3
( ) are BH3544F, BH3547F, BH3548F values.
GND
C3
1
µ
V
IN
1
Fig. 15
Description of external components.
1) Input coupling capacitors (C3, C5)
These are determined according to the lower cutoff frequency fc. Moreover, since lowering the capacitance can cause
the occurrence of pop noise, when changing this, determine it after adequate checking.
Since the input impedance of the BH3541F is 180k and that of the BH3544F,BH3547F,BH3548F is 90k , these are
found by the expressions below, although drift, temperature characteristics, and other considerations are necessary.
(Layered ceramic capacitors are recommended.)
2) Bias capacitor (C6)
When VCC=5V, 47 F is recommended. Since lowering the capacitance too much can cause worsening of electrical
characteristics or the occurrence of pop noise, when changing this, determine it after checking this adequately.
3) Mute pin pop noise countermeasures (R2, C2)
Since the BH3541F,BH3544F,BH3548F has an impedance of 190k against GND and the BH3547F has 200k , it may
be impossible to cancel mute mode if R2 is made too large.
4) Output coupling capacitors (C1, C7)
These are determined by the lower cutoff frequency. If RL is the output load resistance (assuming a resistance RX is
put in for output protection or current restriction), these are found by the expression below.
C1(C7)=1/(2 ×(RL+R )× fc)
5) Input gain adjustment resistances (R3, R5) (BH3544F,BH3547F)
Externally attached resistances (R3, R5) make input gain adjustment possible. The gain found by the expression
below can be set.
GVC=6+20log(90k /(90k +R3[R5])) [dB]
When input gain is not accommodated, these resistors have no use.
Notes for use
1) Numbers and data in entries are representative design values and are not guaranteed values of the items.
2) Although we are confident in recommending the sample application circuits, carefully check their characteristics further
when using them. When modifying externally attached component constants before use, determine them so that they
have sufficient margins by taking into account variations in externally attached components and the Rohm LSI, not only
for static characteristics but also including transient characteristics.
3) Absolute maximum ratings
If applied voltage, operating temperature range, or other absolute maximum ratings are exceeded, the LSI may be
damaged. Do not apply voltages or temperatures that exceed the absolute maximum ratings. If you think of a case in
which absolute maximum ratings are exceeded, enforce fuses or other physical safety measures and investigate how
not to apply the conditions under which absolute maximum ratings are exceeded to the LSI.
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2010.05 - Rev.A
Page 64
BH3541F,BH3544F,BH3547F,BH3548F
(Inp
4) GND potential
Make the GND pin voltage such that it is the lowest voltage even when operating below it. Actually confirm that the
voltage of each pin does not become a lower voltage than the GND pin, including transient phenomena.
5) Thermal design
Perform thermal design in which there are adequate margins by taking into account the allowable power dissipation in
actual states of use.
6) Shorts between pins and misinstallation
When mounting the LSI on a board, pay adequate attention to orientation and placement discrepancies of the LSI.
If it is misinstalled and the power is turned on, the LSI may be damaged. It also may be damaged if it is shorted by a
foreign substance coming between pins of the LSI or between a pin and a power supply or a pin and a GND.
7) Operation in strong magnetic fields
Adequately evaluate use in a strong magnetic field, since there is a possibility of malfunction.
8) Pop noise countermeasures
In order to prevent the pop noise that occurs when the power supply turns ON or OFF, make the rise and fall with
reference to the timing diagram shown below.
1)BH3541F/ BH3544F/ BH3548F
Rise time
VCC
OUT
MUTE
(A):Mute period (Use as pop noise countermeasure when power supply turns ON/OFF by makingVMUTE=Lo.)
(B):Mute cancellation period (This has a time constant because it is used by the externally attached C2 and R2 as
a pop noise countermeasure on mute cancellation, so be careful of the timing.)
(C):Mute start time (As on cancellation, this has a time constant.)
2)BH3547F
(Rise time)
VCC
(A)
Vmute
SG
ut Signal)
OUT
(A):Before VCC rise (or at the same time as VCC) make mute cancelled (VMUTE=Hi).
(B):Soft mute period (This time can be set by externally attached R2 and C2)
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2010.05 - Rev.A
Page 66
TC58NVG0S3HTA00
TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS
1G BIT (128M 8 BIT) CMOS NAND E2PROM
DESCRIPTION
The TC58NVG0S3HTA00 is a single 3.3V 1Gbit (1,140,850,688bits) NAND Electrically Erasable and
Programmable Read-Only Memory (NAND E2PROM) organized as (2048 128) bytes 64 pages 1024blocks.
The device has a 2176-byte static registers which allow program and read data to be transferred between the
register and the memory cell array in 2176-byte increments. The Erase operation is implemented in a single block
unit (128 Kbytes 8 Kbytes: 2176 bytes 64 pages).
The TC58NVG0S3HTA00 is a serial-type memory device which utilizes the I/O pins for both address and data
input/output as well as for command inputs. The Erase and Program operations are automatically executed making
the device most suitable for applications such as solid-state file storage, voice recording, image file memory for still
cameras and other systems which require high-density non-volatile memory data storage.
Input /Output Voltage 0.6 to VCC 0.3 ( 4.6 V) V
Power Dissipation 0.3 W
Soldering Temperature (10 s) 260 °C
Storage Temperature 55 to 150 °C
Operating Temperature 0 to 70 °C
CAPACITANCE
SYMB0L PARAMETER CONDITION MIN MAX UNIT
CIN Input VIN 0 V 10 pF
C
Output V
OUT
* This parameter is periodically sampled and is not tested for every device.
*(Ta 25°C, f 1 MHz)
0 V 10 pF
OUT
3
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Page 69
TC58NVG0S3HTA00
VALID BLOCKS
SYMBOL PARAMETER MIN TYP. MAX UNIT
NVB Number of Valid Blocks 1004 1024 Blocks
NOTE: The device occasionally contains unusable blocks. Refer to Application Note (13) toward the end of this document.
The first block (Block 0) is guaranteed to be a valid block at the time of shipment.
The specification for the minimum number of valid blocks is applicable over lifetime
RECOMMENDED DC OPERATING CONDITIONS
SYMBOL PARAMETER MIN TYP. MAX UNIT
VCC Power Supply Voltage 2.7 3.6 V
VIH High Level input Voltage Vcc x 0.8 VCC 0.3 V
VIL Low Level Input Voltage 0.3*Vcc x 0.2 V
*2 V (pulse width lower than 20 ns)
DC CHARACTERISTICS
(Ta 0 to 70℃, VCC 2.7 to 3.6V)
SYMBOL PARAMETER CONDITION MIN TYP. MAX UNIT
IIL Input Leakage Current VIN 0 V to VCC 10 A
ILO Output Leakage Current V
I
Serial Read Current
CCO1
I
Programming Current 30 mA
CCO2
I
Erasing Current 30 mA
CCO3
I
Standby Current
CCS
VOH High Level Output Voltage IOH 0.1 mA Vcc – 0.2V
VOL Low Level Output Voltage IOL 0.1 mA 0.2 V
IOL
(
BY/RY
Output current of
)
pin
BY/RY
0 V to VCC 10 A
OUT
CE
VIL, I
CE
VCC 0.2 V, WP 0 V/VCC 50 A
VOL 0.2 V 4 mA
0 mA, tcycle 25 ns 30 mA
OUT
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TC58NVG0S3HTA00
AC CHARACTERISTICS AND RECOMMENDED OPERATING CONDITIONS
(Ta 0 to 70℃, VCC 2.7 to 3.6V)
SYMBOL PARAMETER MIN MAX UNIT
t
CLE Setup Time 12 ns
CLS
t
CLE Hold Time 5 ns
CLH
tCS
tCH
tWP Write Pulse Width 12 ns
t
ALE Setup Time 12 ns
ALS
t
ALE Hold Time 5 ns
ALH
tDS Data Setup Time 12 ns
tDH Data Hold Time 5 ns
tWC Write Cycle Time 25 ns
tWH
tWW
tRR Ready to RE Falling Edge 20 ns
tRW Ready to WE Falling Edge 20 ns
tRP Read Pulse Width 12 ns
tRC Read Cycle Time 25 ns
t
REA
tCEA
t
CLE Low to
CLR
tAR ALE Low to RE Low 10 ns
t
RHOH
t
RLOH
t
RHZ
t
CHZ
t
CSD
t
REH
tIR Output-High-impedance-to-RE Falling Edge 0 ns
t
RHW
t
WHC
t
WHR
CE
Setup Time 20 ns
CE
Hold Time 5 ns
High Hold Time 10 ns
WE
High to WE Low 100 ns
WP
Access Time 20 ns
RE
CE
Access Time 25 ns
Low 10 ns
RE
High to Output Hold Time 25 ns
RE
Low to Output Hold Time 5 ns
RE
High to Output High Impedance 60 ns
RE
CE
High to Output High Impedance 20 ns
CE
High to ALE or CLE Don’t Care 0 ns
High Hold Time 10 ns
RE
High to WE Low 30 ns
RE
High toCE Low 30 ns
WE
High to RE Low 60 ns
WE
tR Memory Cell Array to Starting Address 25 s
t
DCBSYR1
t
DCBSYR2
tWB
t
Device Reset Time (Ready/Read/Program/Erase) 5/5/10/500 s
RST
Data Cache Busy in Read Cache (following 31h and
3Fh)
Data Cache Busy in Page Copy (following 3Ah) 30 s
High to Busy 100 ns
WE
25 s
*1: tCLS and tALS can not be shorter than tWP
*2: tCS should be longer than tWP + 8ns.
5
2012-07-06C
Page 71
AC TEST CONDITIONS
TC58NVG0S3HTA00
PARAMETER
Input level VCC 0.2 V, 0.2 V
Input pulse rise and fall time 3 ns
Input comparison level Vcc / 2
Output data comparison level Vcc / 2
Output load CL (50 pF) 1 TTL
CONDITION
VCC: 2.7 to 3.6V
Note: Busy to ready time depends on the pull-up resistor tied to the
(Refer to Application Note (9) toward the end of this document.)
pin.
BY/RY
PROGRAMMING AND ERASING CHARACTERISTICS
(Ta 0 to 70℃, VCC 2.7 to 3.6V)
SYMBOL PARAMETER MIN TYP. MAX UNIT NOTES
t
Average Programming Time 300 700 s
PROG
t
DCBSYW2
Data Cache Busy Time in Write Cache (following 15h) 700s (2)
N Number of Partial Program Cycles in the Same Page 4 (1)
t
(1) Refer to Application Note (12) toward the end of this document.
(2) t
Block Erasing Time 2.5 5 ms
BERASE
DCBSYW2
depends on the timing between internal programming time and data in time.
Data Output
When tREH is long, output buffers are disabled by /RE=High, and the hold time of data output depend on tRHOH
(25ns MIN). On this condition, waveforms look like normal serial read mode.
When tREH is short, output buffers are not disabled by /RE=High, and the hold time of data output depend on
tRLOH (5ns MIN). On this condition, output buffers are disabled by the rising edge of CLE,ALE,/CE or falling
edge of /WE, and waveforms look like Extended Data Output Mode.
6
2012-07-06C
Page 72
TIMING DIAGRAMS
Latch Timing Diagram for Command/Address/Data
CLE
ALE
CE
RE
WE
I/O
Command Input Cycle Timing Diagram
CLE
CE
WE
ALE
I/O
t
t
ALS
CLS
t
CS
t
WP
t
DS
Setup Time
t
CLH
t
CH
t
ALH
t
DH
t
DS
Hold Time
t
DH
TC58NVG0S3HTA00
: VIH or V
IL
: VIH or V
IL
7
2012-07-06C
Page 73
Address Input Cycle Timing Diagram
t
CLS
CLE
t
WP
t
CH
t
CE
CS
WE
t
ALS
ALE
t
t
DS
DH
I/O
CA0 to 7
Data Input Cycle Timing Diagram
t
CLS
CLE
t
CS
CE
t
ALS
ALE
WE
I/O
t
WH
t
WP
TC58NVG0S3HTA00
t
CLH
t
CS
t
WP
t
WC
t
t
DH
DS
DIN0
t
t
DH
DS
CA8 to 11
t
WH
t
WH
t
WP
t
DS
t
WP
t
t
CH
DIN1
t
WC
DS
PA0 to 7
t
DH
t
DH
t
WH
t
CS
t
WP
t
t
WP
t
DS
PA8 to 15
t
t
DH
DS
DIN2175
t
CH
t
ALH
t
DH
: VIH or V
t
t
CH
ALH
IL
CLH
8
2012-07-06C
Page 74
Serial Read Cycle Timing Diagram
t
RC
CE
t
RP
RE
t
CEA
t
RR
t
REA
I/O
BY/RY
Status Read Cycle Timing Diagram
CLE
CE
WE
RE
I/O
BY/RY
*: 70h represents the hexadecimal number
t
CLS
t
CS
t
WP
t
DS
70h*
t
CLH
t
t
DH
t
t
RHOH
CH
t
REH
RHZ
t
WHC
t
REA
t
RP
t
WHR
t
RHZ
t
RHOH
t
CLR
t
CEA
TC58NVG0S3HTA00
t
t
RHZ
t
RHOH
: VIH or V
t
CHZ
t
RHZ
: VIH or V
CHZ
t
IL
RHOH
IL
t
RP
t
REA
t
CEA
t
IR
t
REA
Status
output
9
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Page 75
Read Cycle Timing Diagram
CLE
CE
t
CLS tCLH
t
t
CS
CH
t
WC
WE
t
ALH
t
ALS
ALE
RE
t
t
DS
DH
t
DS
DH
DS
DH
t
DS
t
t
t
t
DH
t
DS
I/O
00h
CA0
to 7
BY/RY
CA8
to 11
Col. Add. N
PA0
to 7
PA8
to 15
Read Cycle Timing Diagram: When Interrupted by
CLE
CE
WE
ALE
RE
I/O
BY/RY
t
CLS tCLH
t
t
CS
CH
t
t
t
DH
DS
00h
ALH
t
ALS
t
WC
t
t
DH
DS
CA0
to 7
Col. Add. N
t
DS
CA8
to 11
t
DH
t
DS
PA0
to 7
t
DH
t
DS
PA8
to 15
t
t
t
DH
t
DH
ALH
ALH
t
CLS tCLH
t
CS
t
ALS
t
CE
t
CLS tCLH
t
CS
t
ALS
t
DS
DS
30h
30h
t
t
t
DH
t
t
t
DH
CH
WB
CH
WB
TC58NVG0S3HTA00
t
CLR
t
RR
t
REA
D
Data out from
Col. Add. N
t
CLR
t
RC
t
CEA
RR
t
REA
D
Col. Add. N
t
RC
CEA
OUT
N
OUT
N
D
OUT
N 1
t
CHZ
t
RHZ
t
RHOH
D
OUT
N 1
t
CSD
t
R
t
t
R
t
10
2012-07-06C
Page 76
Read Cycle with Data Cache Timing Diagram (1/2)
t
CLR
TC58NVG0S3HTA00
t
CLR
CLE
t
CLS
t
CS
t
CLH
t
CH
t
CLS
t
CS
t
CLH
t
CH
t
CLS
t
CS
t
CLH
t
CH
t
t
CS
CLS
t
CLH
t
CH
CE
t
WC
WE
t
t
ALH
t
ALS
ALH
t
ALS
t
RW
tCEA
tCEA
ALE
t
R
t
t
DS
30h
t
DH
WB
RE
t
to 7
t
DH
M
t
DS
PA8
to 15
DH
t
DS
CA0
to 7
DH
DS
CA8
to 11
Column address
DH
t
DS
PA0
Page address
I/O
t
DS
00h
t
DH
t
t
t
N *
BY/RY
t
DS
t
DCBSYR1
t
WB
t
DH
t
RR
t
RC
t
REA
D
D
OUT
0
Page address M
OUT
1
D
31h
OUT
t
DS
31h
t
DCBSYR1
t
WB
t
DH
t
RR
Page address
M 1
Col. Add. 0 Col. Add. 0
t
REA
D
OUT
0
* The column address will be reset to 0 by the 31h command input.
11
1
Continues to of next page
1
2012-07-06C
Page 77
Read Cycle with Data Cache Timing Diagram (2/2)
RR
CLE
WE
ALE
CE
t
CLS
t
CS
t
CLH
t
CH
t
DCBSYR1
t
CLR
tCEA
t
RC
t
t
CS
CLS
t
CLH
t
CH
t
DCBSYR1
t
CLR
tCEA
t
RC
t
t
CS
CLS
t
CLH
t
CH
t
DCBSYR1
TC58NVG0S3HTA00
t
CLR
tCEA
t
RC
t
t
DS
31h
t
DH
WB
t
t
REA
D
OUT
D
OUT
0
1
D
OUT
RE
D
OUT
I/O
Page address M 1
BY/RY
Col. Add. 0 Col. Add. 0
1
Continues from of last page
1
t
DS
t
31h
t
DH
WB
t
RR
12
t
REA
D
D
OUT
OUT
0
Page address
M 2
t
WB
t
t
DH
DS
D
1
OUT
3Fh
t
RR
Make sure to terminate the operation with 3Fh command.
t
REA
D
OUT
0
Page address M x
Col. Add. 0
D
OUT
1
D
OUT
2012-07-06C
Page 78
Column Address Change in Read Cycle Timing Diagram (1/2)
CLE
CE
WE
ALE
RE
I/O
BY/RY
t
CLS tCLH
t
t
CS
t
DS
00h
CH
t
t
DH
ALH
t
ALS
t
DS
t
WC
t
CA0
to 7
DH
t
DS
CA8
to 11
t
DH
t
DS
t
PA0
to 7
DH
t
CLS tCLH
t
CS
t
t
ALH
t
t
DH
DS
PA8
to 15
Page address
P
ALS
t
DS
30h
t
t
CH
DH
t
WB
TC58NVG0S3HTA00
t
CLR
tCEA
t
R
t
RC
t
RR
t
REA
D
D
OUT
A
A 1
Page address
Column address
A
Continues from of next page
OUT
1
D
P
1
OUT
A N
13
2012-07-06C
Page 79
Column Address Change in Read Cycle Timing Diagram (2/2)
CLE
CE
t
RHW
t
CLS
t
CS
t
CLH
t
CH
t
WC
t
CLS tCLH
t
CS
WE
t
ALH
t
ALS
t
ALH
t
ALS
ALE
RE
t
t
t
t
t
DH
DS
D
I/O
BY/RY
OUT
A N
05h
t
DS
CA0
to 7
Column address
DH
DS
CA8
to 11
B
DH
t
DS
t
E0h
1
Continues from of last page
1
t
CLR
t
CH
tCEA
t
WHR
DH
t
RC
t
REA
tIR
D
Column address
TC58NVG0S3HTA00
D
OUT
B
OUT
B 1
B
Page address
D
OUT
B N’
P
14
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Page 80
Data Output Timing Diagram
CLE
CE
WE
ALE
RE
I/O
BY/RY
t
RC
t
RP
t
CEA
t
REA
t
RR
t
REH
t
RHOH
t
RP
t
RLOH
t
REA
TC58NVG0S3HTA00
t
CLS tCLH
t
t
CHZ
t
RP
t
RLOH
Dout Dout
t
REA
t
RHZ
t
RHOH
CS
t
DS
Command
t
t
t
DH
CH
ALH
15
2012-07-06C
Page 81
Auto-Program Operation Timing Diagram
t
CLE
t
CLS
t
CLH
CLS
TC58NVG0S3HTA00
t
ALH
t
CH
t
ALS
t
CS
t
ALH
t
ALS
t
WB
t
PROG
CE
WE
t
CS
ALE
RE
I/O
t
DS
80h
t
t
DH
DS tDH
Column address
CA0
to 7
CA8
to 11
PA0
to 7
PA8
to 15
t
DS
DINN
t
DH
D
IN
N+1
DINM*
10h 70h
t
DS
t
DH
Status
output
N
BY/RY
: Do not input data while data is being output.
: VIH or V
IL
*) M: up to 2175 (byte input data for 8 device).
16
2012-07-06C
Page 82
Auto-Program Operation with Data Cache Timing Diagram (1/3)
CLE
CE
WE
ALE
t
CLS
t
CS
t
CLH
t
ALH
t
CH
t
t
ALS
CLS
t
CS
t
ALH
t
ALS
TC58NVG0S3HTA00
t
DCBSYW2
t
WB
RE
I/O
BY/RY
t
DS
80h
t
DH
t
DS tDH
CA0
to 7
t
DS
CA8
PA0
to 11
CA0 to CA11 is 0 in this diagram.
PA8
to 7
to 15
: Do not input data while data is being output.
: VIH or V
IL
t
DH
DINN
D
IN
N+1
DIN2175
t
DS
t
DH
15h
80h
1
Continues to 1 of next page
CA0
to7
17
2012-07-06C
Page 83
Auto-Program Operation with Data Cache Timing Diagram (2/3)
t
CLS
CLE
t
CLS
t
CLH
TC58NVG0S3HTA00
CE
WE
ALE
RE
I/O
BY/RY
t
CS
t
DS
1
t
80h
t
ALH
t
DH
t
CS
CH
t
ALH
t
ALS
t
DS tDH
CA0
to 7
Repeat a max of 62 times (in order to program pages 1 to 62 of a block).
CA8
to 11
PA0
to 7
PA8
to 15
t
ALS
t
DS
DINN
t
DH
D
IN
N+1
DIN2175
t
15h
WB
t
DCBSYW2
2
t
DS
t
80h
DH
CA0
to 7
Continued from 1 of last page
: Do not input data while data is being output.
: VIH or V
IL
18
2012-07-06C
Page 84
Auto-Program Operation with Data Cache Timing Diagram (3/3)
CLE
t
CLS
t
CE
CS
WE
ALE
RE
t
DS
I/O
BY/RY
2
Continued from 2 of last page
(Note) Make sure to terminate the operation with 80h-10h- command sequence.
t
CLS
t
CLH
t
CS
t
CH
t
t
80h
ALH
DH
t
ALS
t
DS tDH
CA0
to 7
CA8
to 11
PA0
to 7
t
ALH
t
ALS
t
DS
t
DH
PA8
to 15
: Do not input data while data is being output.
: VIH or V
(*1) t
PROG
program, the t
t
t
PROG
A (command input cycle address input cycle data input cycle time of the last page)
If “A” exceeds the t
DINN
IL
: Since the last page programming by 10h command is initiated after the previous cache
PROG
of the last page t
PROG
D
IN
during cache programming is given by the following equation.
PROG
of previous page, t
PROG
If the operation is terminated by 80h-15h command sequence, monitor I/O 6 (Ready / Busy) by
issuing Status Read command (70h) and make sure the previous page program operation is
completed. If the page program operation is completed issue FFh reset before next operation.
TC58NVG0S3HTA00
t
PROG (*1)
t
WB
10h Status
DIN2175
of the previous page A
of the last page is t
PROG
t
DS
70h
PROG
t
DH
max.
19
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Page 85
Auto Block Erase Timing Diagram
TC58NVG0S3HTA00
CLE
CE
WE
ALE
RE
I/O
BY/RY
t
CLS
t
CS
t
DS tDH
60h
Auto Block
Erase Setup
command
t
CLH
t
CLS
t
ALS
PA0
PA8
to 15
t
ALH
t
WB
D0h 70h
Erase Start
command
t
BERASE
Busy
Status
output
Status Read
command
: V
IH
or V
IL
: Do not input data while data is being output.
20
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Page 86
ID Read Operation Timing Diagram
t
CLS
TC58NVG0S3HTA00
CLE
CE
WE
ALE
RE
I/O
t
CLS
t
REA
CEA
t
CS
t
CH
t
t
DH
t
DS
90h 00h 98h
ID Read
command
ALH
t
ALS
t
CS tCH
Address
00
t
ALH
tAR
t
t
REA
Maker code
Device code
F1h
t
t
REA
REA
See
Table 5
t
REA
See
Table 5
: VIH or V
See
Table 5
IL
21
2012-07-06C
Page 87
TC58NVG0S3HTA00
PIN FUNCTIONS
The device is a serial access memory which utilizes time-sharing input of address information.
Command Latch Enable: CLE
The CLE input signal is used to control loading of the operation mode command into the internal command
register. The command is latched into the command register from the I/O port on the rising edge of the
signal while CLE is High.
Address Latch Enable: ALE
The ALE signal is used to control loading address information into the internal address register. Address
information is latched into the address register from the I/O port on the rising edge of
Chip Enable:
The device goes into a low-power Standby mode when CE goes High during the device is in Ready state. The
signal is ignored when device is in Busy state (
CE
operation, and will not enter Standby mode even if the CE input goes High.
Write Enable:
The
WE
Read Enable:
The RE signal controls serial data output. Data is available t
The internal column address counter is also incremented (Address = Address + l) on this falling edge.
CE
L), such as during a Program or Erase or Read
BY/RY
WE
signal is used to control the acquisition of data from the I/O port.
RE
after the falling edge of RE.
REA
I/O Port: I/O1 to 8
The I/O1 to 8 pins are used as a port for transferring address, command and input/output data to and from
the device.
Write Protect:
TheWP signal is used to protect the device from accidental programming or erasing. The internal voltage
regulator is reset when
sequence when input signals are invalid.
Ready/Busy:
The
in Busy state (
(
pulled-up to Vccq with an appropriate resister.
If
= H) after completion of the operation. The output buffer for this signal is an open drain and has to be
BY/RY
WP
is Low. This signal is usually used for protecting the data during the power-on/off
WP
BY/RY
output signal is used to indicate the operating condition of the device. The
BY/RY
= L) during the Program, Erase and Read operations and will return to Ready state
BY/RY
signal is not pulled-up to Vccq( “Open” state ), device operation can not guarantee.
BY/RY
while ALE is High.
WE
BY/RY
WE
signal is
22
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TC58NVG0S3HTA00
Page Buffer
Schematic Cell Layout and Address Assignment
The Program operation works on page units while the Erase operation works on block units.
Data Cache
65536
pages
1024 blocks
Table 1. Addressing
2048
2048
2176
128
128
8I/O
I/O1
I/O8
64 Pages1 block
A page consists of 2176 bytes in which 2048 bytes are
used for main memory storage and 128 bytes are for
redundancy or for other uses.
First cycle CA7 CA6 CA5 CA4 CA3 CA2 CA1 CA0
Second cycle L L L L CA11 CA10 CA9 CA8
Third cycle PA7 PA6 PA5 PA4 PA3 PA2 PA1 PA0
Fourth cycle PA15 PA14 PA13 PA12 PA11 PA10 PA9 PA8
CA0 to CA11: Column address
PA0 to PA15: Page address
PA6 to PA15: Block address
PA0 to PA5: NAND address in block
23
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TC58NVG0S3HTA00
Operation Mode: Logic and Command Tables
The operation modes such as Program, Erase, Read and Reset are controlled by command operations shown
in Table 3. Address input, command input and data input/output are controlled by the CLE, ALE, CE,
and
RE
Table 2. Logic Table
Command Input H L L H *
Data Input L L L H H
Address input L H L H *
Serial Data Output L L L H *
During Program (Busy) * * * * * H
During Erase (Busy) * * * * * H
signals, as shown in Table 2.
WP
CLE ALE
CE
WE
RE
WP
*1
WE
,
During Read (Busy)
Program, Erase Inhibit * * * * * L
Standby * * H * * 0 V/VCC
H: VIH, L: VIL, *: VIH or V
*1: Refer to Application Note (10) toward the end of this document regarding the
*2: If CEis low during read busy, WE and REmust be held High to avoid unintended command/address input to the device or
read to device. Reset or Status Read command can be input during Read Busy.
IL
* * H * * *
* * L H (*2) H (*2) *
signal when Program or Erase Inhibit
WP
24
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TC58NVG0S3HTA00
Table 3. Command table (HEX)
First Cycle Second Cycle Acceptable while Busy
Serial Data Input 80
Read 00 30
Column Address Change in Serial Data Output 05 E0
Read with Data Cache 31
Read Start for Last Page in Read Cycle with Data Cache 3F
Auto Page Program 80 10
Column Address Change in Serial Data Input 85
Auto Program with Data Cache 80 15
Read for Page Copy (2) with Data Out 00 3A
Auto Program with Data Cache during Page Copy (2) 8C 15
Auto Program for last page during Page Copy (2) 8C 10
Auto Block Erase 60 D0
ID Read 90
Status Read 70
Reset FF
(Example)
HEX data bit assignment
Serial Data Input: 80h
Table 4. Read mode operation states
CLE ALE
Output select L L L H L Data output Active
Output Deselect L L L H H High impedance Active
H: VIH, L: V
IL
1 0 0 0 0 0 0 0
8 7 6 5 4 3 2 I/O1
CE
WE
RE
I/O1 to I/O8 Power
25
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TC58NVG0S3HTA00
WE
DEVICE OPERATION
Read Mode
Read mode is set when the "00h" and “30h” commands are issued to the Command register. Between the two
commands, a start address for the Read mode needs to be issued. After initial power on sequence, “00h”
command is latched into the internal command register. Therefore read operation after power on sequence is
excuted by the setting of only five address cycles and “30h” command. Refer to the figures below for the
sequence and the block diagram (Refer to the detailed timing chart.).
CLE
CE
ALE
RE
BY/RY
I/O
Data Cache
Page Buffer
Select page
N
Column Address M
00h
Start-address input
M m
I/O1 to 8: m 2175
Page Address N
Cell array
Random Column Address Change in Read Cycle
CLE
30h
Busy
A data transfer operation from the cell array to the Data
Cache via Page Buffer starts on the rising edge of WE in the
30h command input cycle (after the address information has
been latched). The device will be in the Busy state during this
transfer period.
After the transfer period, the device returns to Ready state.
Serial data can be output synchronously with the RE clock
from the start address designated in the address input cycle.
tR
M
Page Address N
M+1
M+2
CE
WE
ALE
RE
BY/RY
00h
I/O
Select page
N
Col. M Page N
Start-address input
M M’
Busy
30h 05h
tR
Col. M
M
M1
M2 M3
Start from Col. M Start from Col. M’
Page N
During the serial data output from the Data Cache, the column
address can be changed by inputting a new column address
using the 05h and E0h commands. The data is read out in serial
starting at the new column address. Random Column Address
Change operation can be done multiple times within the same
page.
26
Col. M’
E0h
M’ M’1 M’2 M’3 M’4
Page N
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TC58NVG0S3HTA00
Page Buffer
clock
Read Operation with Read Cache
The device has a Read operation with Data Cache that enables the high speed read operation shown below. When the block address changes, this sequence has to be
started from the beginning.
CLE
CE
WE
ALE
RE
BY/RY
I/O
00h
30h
tR
1 2 4
31h 31h
t
DCBSYR1
0
t
1
2 3
3 5
2175
DCBSYR1
0
1
t
6
2 3
2175 0
3Fh
DCBSYR1
1
2 3
7
2175
Data Cache
Cell Array
Col. M
1
Page N
If the 31h command is issued to the device, the data content of the next page is transferred to the Page Buffer during serial data out from the Data Cache, and therefore the tR (Data transfer from memory
cell to data register) will be reduced.
1 Normal read. Data is transferred from Page N to Data Cache through Page Buffer. During this time period, the device outputs Busy state for tR max.
2 After the Ready/Busy returns to Ready, 31h command is issued and data is transferred to Data Cache from Page Buffer again. This data transfer takes tDCBSYR1 max and the completion of this time
period can be detected by Ready/Busy signal.
3 Data of Page N 1 is transferred to Page Buffer from cell while the data of Page N in Data cache can be read out by /RE clock simultaneously.
4 The 31h command makes data of Page N 1 transfer to Data Cache from Page Buffer after the completion of the transfer from cell to Page Buffer. The device outputs Busy state for tDCBSYR1 max..
This Busy period depends on the combination of the internal data transfer time from cell to Page buffer and the serial data out time.
5 Data of Page N 2 is transferred to Page Buffer from cell while the data of Page N + 1 in Data cache can be read out by /RE clock simultaneously
6 The 3Fh command makes the data of Page N 2 transfer to the Data Cache from the Page Buffer after the completion of the transfer from cell to Page Buffer. The device outputs Busy state for
tDCBSYR1 max.. This Busy period depends on the combination of the internal data transfer time from cell to Page buffer and the serial data out time.
7 Data of Page N 2 in Data Cache can be read out, but since the 3Fh command does not transfer the data from the memory cell to Page Buffer, the device can accept new command input immediately
after the completion of serial data out.
Page N
2
Page N 1
1
30h 31h & RE clock
Column 0
Page N
Page Address N
3
3
Page N
4
Page N 2
27
Page Address N 1
Page N 1
31h & RE clock
5
Page N 1
5
Page Address N 2
Page N 2
6
3Fh & RE
Page N 2
7
2012-07-06C
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TC58NVG0S3HTA00
Reading & verification
Auto Page Program Operation
The device carries out an Automatic Page Program operation when it receives a "10h" Program command
after the address and data have been input. The sequence of command, address and data input is shown below.
(Refer to the detailed timing chart.)
CLE
CE
WE
ALE
RE
BY/RY
Din
80h
I/O
Din Din
Din
10h
Col. M
Page P
Data
Data input
Selected
page
Program
Read& verification
The data is transferred (programmed) from the register to the
selected page on the rising edge of WE following input of the
“10h” command. After programming, the programmed data is
transferred back to the register to be automatically verified by the
device. If the programming does not succeed, the Program/Verify
operation is repeated by the device until success is achieved or until
the maximum loop number set in the device is reached.
Random Column Address Change in Auto Page Program Operation
The column address can be changed by the 85h command during the data input sequence of the Auto Page Program
operation.
Two address input cycles after the 85h command are recognized as a new column address for the data input. After
the new data is input to the new column address, the 10h command initiates the actual data program into the
selected page automatically. The Random Column Address Change operation can be repeated multiple times within
the same page.
70h
Status
Out
80h
Page N Col. M
Data input
Selected
page
Din Din Din Din
Col. M Col. M’
Program
85h Din Din 10h
Col. M’
Din Din 70h
28
Status
BUSY
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TC58NVG0S3HTA00
Auto Page Program Operation with Data Cache
The device has an Auto Page Program with Data Cache operation enabling the high speed program operation shown below. When the block address changes this
sequenced has to be started from the beginning.
CLE
CE
WE
ALE
RE
BY/RY
t
DCBSYW2
t
DCBSYW2
t
PROG (NOTE)
I/O
Data Cache
Page Buffer
80h
AddAdd
Page N
1
Add
Din
Din Din
Data for Page N
15h 70h
1
2
Status Output
2
Data for Page N
80h
3
AddAdd Add
Data for Page N 1
Add
Page N 1
Din
Din Din
15h 70h
3 4
4
Data for Page N 1
Status Output
AddAdd Add
80h
5
Data for Page N P
Add
Page N P
Din
Din Din
5 6
10h 70h
3
Cell Array
Page N
5
6
Page N 1
Page N P 1
Issuing the 15h command to the device after serial data input initiates the program operation with Data Cache
1 Data for Page N is input to Data Cache.
2 Data is transferred to the Page Buffer by the 15h command. During the transfer the Ready/Busy outputs Busy State (t
DCBSYW2
).
3 Data is programmed to the selected page while the data for page N 1 is input to the Data Cache.
4 By the 15h command, the data in the Data Cache is transferred to the Page Buffer after the programming of page N is completed. The device output busy state from the 15h command
until the Data Cache becomes empty. The duration of this period depends on timing between the internal programming of page N and serial data input for Page N 1 (t
DCBSYW2
5 Data for Page N P is input to the Data Cache while the data of the Page N P 1 is being programmed.
6 The programming with Data Cache is terminated by the 10h command. When the device becomes Ready, it shows that the internal programming of the Page P is completed.
NOTE: Since the last page programming by the 10h command is initiated after the previous cache program, the tPROG during cache programming is given by the following;
t
PROG
t
for the last page t
PROG
of the previous page ( command input cycle address input cycle data input cycle time of the previous page)
PROG
29
Status Output
Page N P
).
2012-07-06C
Page 95
Pass/fail status for each page programmed by the Auto Page Programming with Data Cache operation can be detected by the Status Read operation.
The Pass/Fail status on I/O1 and I/O2 are valid under the following conditions.
Example)
I/O1 : Pass/fail of the current page program operation.
I/O2 : Pass/fail of the previous page program operation.
Status on I/O1: Page Buffer Ready/Busy is Ready State.
The Page Buffer Ready/Busy is output on I/O6 by Status Read operation or
Status on I/O2: Data Cache Read/Busy is Ready State.
The Data Cache Ready/Busy is output on I/O7 by Status Read operation or
I/O2 =>
I/O1 =>
Invalid
Invalid
Page 1
Invalid
Page 1
Page 2
pin after the 10h command
BY/RY
pin after the 15h command.
BY/RY
Page N 2
Invalid
TC58NVG0S3HTA00
invalid
invalid
Page N 1
Page N
pin
BYRY/
Data Cache Busy
Page Buffer Busy
80h…15h
Page 1
70h
Status
Page 1
Out
Status
80h…15h
Page 2
If the Page Buffer Busy returns to Ready before the next 80h command input, and if Status Read is done during
this Ready period, the Status Read provides pass/fail for Page 2 on I/O1 and pass/fail result for Page1 on I/O2
70h
Out
Page 2
70h
Status
Out
80h…15h
Page N 1
70h
Page N 1
Status
Out
80h…10h
Page N
30
70h
Page N
Status
Out
Status
70h
Out
2012-07-06C
Page 96
Page Copy (2)
By using Page Copy (2), data in a page can be copied to another page after the data has been read out.
When the block address changes (increments) this sequenced has to be started from the beginning.
Command
input
00
BYRY/
Address input
Address
CA0 to CA11, PA0 to PA15
(Page N)
30
tR
2
Data output
Col = 0 start
1
3
8C
Address input
Address
CA0 to CA11, PA0 to PA15
(Page M)
Data input
When changing data,
changed data is input.
15 00
4 5
t
DCBSYW2
Address input
Address
CA0 to CA11, PA0 to PA15
(Page N+P1)
3A
TC58NVG0S3HTA00
Data output
Col = 0 start
t
DCBSYR2
A
A
1 2 3 4 5
Data for Page N
Data Cache
Page Buffer
Cell Array
Page N
Page Copy (2) operation is as following.
1 Data for Page N is transferred to the Data Cache.
2 Data for Page N is read out.
3 Copy Page address M is input and if the data needs to be changed, changed data is input.
4 Data Cache for Page M is transferred to the Page Buffer.
5 After the Ready state, Data for Page N P1 is output from the Data Cache while the data of Page M is being programmed.
Data for Page N
Data for Page M
31
Data for Page N + P1
Page M
Page N + P1
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TC58NVG0S3HTA00
age
A
BY/RY
Data Cache
Page Buffer
Cell Array
Command
input
8C Data input 15 00
Page N P1
Address input
Address
CA0 to CA11, PA0 to PA15
(Page M+R1)
6
Data for Page M R1 Data for P
Page M
6
When changing data,
changed data is input.
7
00
7
t
DCBSYW2
Address input
Address
CA0 to CA11, PA0 to PA15
(Page N+P2)
t
M R1 Data for Page N P2 Data for Page N Pn
Page M R1
Page N + P2
8
3A Data output
Col = 0 start
8
DCBSYR2
t
Page M Rn 1
Address input
Address
CA0 to CA11, PA0 to PA15
(Page N+Pn)
9
Page N Pn
3A Data output
Col = 0 start
9
DCBSYR2
Page M + Rn 1
B
B A
6 Copy Page address (M R1) is input and if the data needs to be changed, changed data is input.
7 After programming of page M is completed, Data Cache for Page M R1 is transferred to the Page Buffer.
8 By the 15h command, the data in the Page Buffer is programmed to Page M R1. Data for Page N P2 is transferred to the Data cache.
9 The data in the Page Buffer is programmed to Page M Rn 1. Data for Page N Pn is transferred to the Data Cache.
32
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TC58NVG0S3HTA00
B
BY/RY
B
Data Cache
Page Buffer
Page M Rn 1
Cell Array
Command
input
8C Data input 10 70 Status output
10
10 Copy Page address (M Rn) is input and if the data needs to be changed, changed data is input.
11 By issuing the 10h command, the data in the Page Buffer is programmed to Page M Rn.
(*1) Since the last page programming by the 10h command is initiated after the previous cache program, the t
NOTE)
Data input is required only if previous data output needs to be altered.
If the data has to be changed, locate the desired address with the column and page address input after the 8Ch command, and change only the data that needs be changed.
If the data does not have to be changed, data input cycles are not required.
Make sureWPis held to High level when Page Copy (2) operation is performed.
Also make sure the Page Copy operation is terminated with 8Ch-10h command sequence
Address input
Address
CA0 to CA11, PA0 to PA15
(Page M+Rn)
Data for Page M Rn
t
t
PROG
PROG
10
11
t
(*1)
PROG
Data for Page M Rn
11
Page M + Rn
here will be expected as the following,
of the last page tPROG of the previous page ( command input cycle address input cycle + data output/input cycle time of the last page)
PROG
33
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Page 99
TC58NVG0S3HTA00
Auto Block Erase
The Auto Block Erase operation starts on the rising edge of
follows the Erase Setup command “60h”. This two-cycle process for Erase operations acts as an extra layer of
protection from accidental erasure of data due to external noise. The device automatically executes the Erase
and Verify operations.
60 D0 70
Block Address
input: 2 cycles
Erase Start
command
after the Erase Start command “D0h” which
WE
Pass
I/O
Status Read
command
Fail
BY/RY
Busy
34
2012-07-06C
Page 100
TC58NVG0S3HTA00
REA
ID Read
The device contains ID codes which can be used to identify the device type, the manufacturer, and features of
the device. The ID codes can be read out under the following timing conditions: