NIKO P07D03LV Datasheet

NIKO-SEM
Dual N-Channel Enhancement Mode
Field Effect Transistor
SOP-8
PRODUCT SUMMARY
V
(BR)DSS
30
R
DS(ON)
20mΩ
I
D
7A
G : GATE D : DRAIN S : SOURCE
ABSOLUTE MAXIMUM RATINGS (T
= 25 °C Unless Otherwise Noted)
C
PARAMETERS/TEST CONDITIONS SYMBOL LIMITS UNITS
Drain-Source Voltage VDS ±30 V
Gate-Source Voltage VGS ±20 V
Continuous Drain Current
T
= 70 °C
C
Pulsed Drain Current1 I
I
D
40
DM
6
A
TC = 25 °C 2
TC = 25 °C 7
Power Dissipation
T
= 70 °C
C
Junction & Storage Temperature Range Tj, T
P
D
-55 to 150
stg
1.3
W
°C
Lead Temperature (1/16” from case for 10 sec.) TL 275
THERMAL RESISTANCE RATINGS
THERMAL RESISTANCE SYMBOL TYPICAL MAXIMUM UNITS
Junction-to-Ambient
1
Pulse width limited by maximum junction temperature.
2
Duty cycle 1%
R
θJA
62.5 °C / W
ELECTRICAL CHARACTERISTICS (T
PARAMETER SYMBOL TEST CONDITIONS
= 25 °C, Unless Otherwise Noted)
C
LIMITS
MIN TYP MAX
UNIT
STATIC
Drain-Source Breakdown Voltage V
Gate Threshold Voltage V
Gate-Body Leakage I
Zero Gate Voltage Drain Current I
(BR)DSS
GS(th)
V
GSS
DSS
VDS = 20V, VGS = 0V, TJ = 55 °C 10
On-State Drain Current1 I
V
D(ON)
V
= 0V, ID = 250µA
GS
V
= VGS, ID = 250µA
DS
= 0V, VGS = ±20V ±100 nA
DS
30
0.7 1 1.4
VDS = 24V, VGS = 0V 1
= 5V, VGS = 10V 25 A
DS
1
OCT-14-2002
V
µA
NIKO-SEM
Dual N-Channel Enhancement Mode
Field Effect Transistor
Drain-Source On-State Resistance
1
R
DS(ON)
V
Forward Transconductance1 g
V
fs
VGS = 2.5V, ID = 5A 40 48
V
= 4.5V, ID = 6A 23 30
GS
= 10V, ID = 7A 18 25
GS
= 15V, ID = 5A 16 S
DS
DYNAMIC
SOP-8
mΩ
Input Capacitance C
Output Capacitance C
Reverse Transfer Capacitance C
Total Gate Charge2 Q
Gate-Source Charge2 Q
Gate-Drain Charge2 Q
Turn-On Delay Time2 t
Rise Time2 t
Turn-Off Delay Time2 t
Fall Time2 t
830
iss
V
185
oss
rss
9 13
g
2.8
gs
gd
5.7
d(on)
V
r
d(off)
5
f
= 0V, VDS = 15V, f = 1MHz
GS
VDS = 0.5V
I
1A, VGS = 10V, R
D
, VGS = 5V,
(BR)DSS
I
= 7A
D
= 15V 10
DS
GEN
= 6Ω
80
3.1
18
pF
nC
nS
SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS (TC = 25 °C)
Continuous Current IS 3
A
Pulsed Current3 I
Forward Voltage1 V
Reverse Recovery Time trr
6
SM
I
SD
= 1A, VGS = 0V 1 V
F
I
= 5A, dlF/dt = 100A / µS
F
15.5 nS
Reverse Recovery Charge Qrr 7.9 nC
1
Pulse test : Pulse Width 300 µsec, Duty Cycle 2%.
2
Independent of operating temperature.
3
Pulse width limited by maximum junction temperature.
REMARK: THE PRODUCT MARKED WITH “P07D03LV”, DATE CODE or LOT #
2
OCT-14-2002
Loading...
+ 3 hidden pages