16 M-WORD BY 72-BIT DDR SYNCHRONOUS DYNAMIC RAM MODULE
UNBUFFERED TYPE
Description
The MC-45D16CA721 is a 16,777,216 words by 72 bits DDR synchronous dynamic RAM module on which 9 pieces
of 128M DDR SDRAM: µPD45D128842 are assembled.
These modules provide high density and large quantities of memory in a small space without utilizing the surfacemounting technology on the printed circuit board.
Decoupling capacitors are mounted on power supply line for noise reduction.
Features
• 16,777,216 words by 72 bits organization (ECC type)
• Clock frequency
Part number/CAS latencyClock frequencyModule type
(MAX.)
MC-45D16CA721KF-C75CL = 2.5133 MHzDDR SDRAM
CL = 2100 MHzUnbuffered DIMM
MC-45D16CA721KF-C80CL = 2.5125 MHzDesign specificati on
CL = 2100 MHzRev.0.9 compliant
• Fully Synchronous Dynamic RAM with all signals except DM, DQS and DQ referenced to a positive clock edge
• Double Data Rate interface
Differential CLK (/CLK) input
Data inputs and DM are synchronized with both edges of DQS
Data outputs and DQS are synchronized with a cross point of CLK and /CLK
• Quad internal banks operation
• Possible to assert random column address in every clock cycle
The value of all resistors of DQs, DQSs, DM/DQSs is 22 Ω.
2.
D0 – D8:
µ
PD45D128842 (4M words × 8 bits × 4 banks)
Preliminary Data Sheet M14898EJ2V0DS00
MC-45D16CA721
Electrical Specifications
•All voltages are referenced to VSS (GND).
•After power up, wait more than 1 ms and then, execute
proper device operation is achieved.
Absolute Maximum Ratings
ParameterSymbolConditionRatingUnit
Voltage on power supply pin relative to V
Voltage on input pin relative to V
Short circuit output c urrentI
Power dissipationP
Storage temperatureT
SS
VDD, VDDQ–0.5 to +3.6V
SS
T
V
O
D
stg
CautionExposing the device to stress above those listed in Absolute Maximum Ratings could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Power on sequence and CBR (auto) refresh
–0.5 to +3.6V
50mA
12W
–55 to +125
before
C
°
Recommended Operating Conditions
ParameterSymbolConditionMIN.TYP.MAX.Unit
Supply voltageV
Supply voltage for DQ, DQSVDDQ2.32.52.7V
Input reference voltageV
Termination voltageV
High level dc input voltageVIH (DC)V
Low level dc input voltageV
Input differential volt age (CLK and /CLK)VID (DC)0.36VDDQ + 0.6V
Input crossing point voltage (CLK and /CLK)V
Operating ambient tem peratureT
Capacitance (TA = 25
C, f = 100 MHz)
°°°°
ParameterSymbolTest conditionMIN.TYP.MAX.Unit
Input capacitanceC
Data input/output capaci t anceC
DD
REF
TT
IL
(DC)
IX
A
I1
A0 - A11, BA0, BA1, /RAS,
2.32.52.7V
0.49 × VDDQ0.51 × VDDQV
REF
V
− 0.04V
REF
+ 0.15VDD + 0.3V
0.3V
−
REF
0.5 × VDDQ–0.20.5 × VDDQ+0.2V
070
TBDTBDpF
/CAS, /WE
I2
C
CK0 - CK2, /CK0 - /CK2TBDTBD
I3
C
CKE0TBDTBD
I4
C
/S0TBDTBD
I/O1
DM(0-8)/DQS(9-17),
TBDTBDpF
DQS0 - DQS8
I/O2
C
DQ0 - DQ63, CB0 - CB7TBDTBD
REF
V
+ 0.04V
REF
− 0.15V
C
°
Preliminary Data Sheet M14898EJ2V0DS00
5
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