The 2SK3116 is N-channel DMOS FET device that features a
low gate charge and excellent switching characteristics, and
designed for high voltage applications such as switching power
supply, AC adapter.
FEATURES
•Low gate charge
= 26 nC TYP. (ID = 7.5 A, VDD = 450 V, VGS = 10 V)
QG
•Gate voltage rating ±30 V
•Low on-state resistance
= 1.2 Ω MAX. (VGS = 10 V, ID = 3.75 A)
RDS(on)
•Avalanche capability ratings
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage (VGS = 0 V)V
Gate to Source Voltage (VDS = 0 V)V
Drain Current (DC)I
Drain Current (pulse)
Total Power Dissipation (TA
Note1
= 25°C)P
DSS
GSS±30V
D(DC)±7.5A
I
D(pulse)±30A
T1
600V
1.5W
ORDERING INFORMATION
PART NUMBERPACKAGE
2SK3116TO-220AB
2SK3116-STO-262
2SK3116-ZJTO-263
Total Power Dissipation (T
= 25°C)P
C
Channel TemperatureT
Storage TemperatureT
Single Avalanche Current
Single Avalanche Energy
Diode Recovery dv/dt
Notes 1. PW ≤ 10
µ
2. Starting T
≤ 3.0 A, V
F
3. I
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. D13339EJ2V0DS00 (2nd edition)
Date Published May 2002 NS CP (K)
Printed in Japan
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
3.0
Pulsed
2.0
ID = 4.0 A
7.5 A
1.0
- Drain to Source On-State Resistance - Ω
DS (on)
R
0
0
515
GS
- Gate to Source Voltage - V
V
10
| - Forward Transfer Admittance - S
VDS = 10 V
fs
Pulsed
| y
0.1
0.1
1.010
I
D
- Drain Current - A
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
3.0
2.0
VGS = 10 V
20 V
1.0
- Drain to Source On-State Resistance - Ω
DS(on)
R
0
1.0
I
D
- Drain Current - A
Pulsed
10100
Data Sheet D13339EJ2V0DS
3
Page 4
2SK3116
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
4.0
3.0
ID = 7.5 A
2.0
4.0 A
1.0
- Drain to Source On-State Resistance - Ω
DS (on)
R
0
0100−50
T
ch
- Channel Temperature -
50150
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
10000
1000
- Capacitance - pF
100
rss
, C
oss
10
, C
iss
C
1
VGS = 0 V
f = 1 MHz
V
DS
- Drain to Source Voltage - V
VGS = 10 V
Pulsed
˚C
C
iss
C
oss
C
rss
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
100
10
1.0
0.1
- Diode Forward Current - A
SD
I
VGS = 10 V
0 V
Pulsed
1.51.00.50
SD
- Source to Drain Voltage - V
V
SWITCHING CHARACTERISTICS
100
t
d(off)
t
f
t
10
- Switching Time - ns
f
, t
1
d(off)
, t
r
, t
d(on)
t
0.1
1000100101.0
0.1110
I
d(on)
t
r
D
- Drain Current - A
V
DD =
V
GS
R
G = 10
150 V
= 10 V
Ω
10000
1000
100
- Reverse Recovery Time - ns
rr
t
10
0.1
4
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
di/dt = 50 A/ µs
GS
= 0 V
V
1.010100
I
D
- Drain Current - A
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
600
400
200
- Drain to Source Voltage - V
DS
V
01282032
Data Sheet D13339EJ2V0DS
VDD = 450 V
300 V
150 V
V
DS
QG - Gate Charge - nC
ID = 7.5 A
V
GS
16
14
12
10
8
6
4
- Gate to Source Voltage - V
GS
2
V
0
Page 5
2SK3116
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
20
dT - Percentage of Rated Power - %
0
040206010014080120160
T
C
- Case Temperature -
FORWARD BIAS SAFE OPERATING AREA
100
I
D(pulse)
10
R
1
- Drain Current - A
D
I
DS(on)
Limited
I
D(DC)
Power Dissipation Limited
3 ms
1
0
m
30 ms
100
ms
DC
★★
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
80
70
60
50
40
30
20
- Total Power Dissipation - W
T
10
P
080204060100140120160
˚C
PW
= 10
µs
100
µs
1 ms
s
TC - Case Temperature - ˚C
TC = 25˚C
Single Pulse
0.1
1
★
100
101001000
V
DS
- Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
R
th(ch-A)
= 83.3˚C/W
10
R
th(ch-C)
= 1.79˚C/W
1
0.1
- Transient Thermal Resistance - ˚C/W
th(t)
0.01
r
µ
µ
100 m110100100010 m1 m10010
PW - Pulse Width - s
Data Sheet D13339EJ2V0DS
5
Page 6
2SK3116
SINGLE AVALANCHE CURRENT vs.
INDUCTIVE LOAD
100
10
IAS = 7.5 A
1.0
RG = 25 Ω
DD
= 150 V
V
- Single Avalanche Current - A
AS
GS
= 20→ 0 V
V
I
Starting Tch = 25
0.1
10 µ
˚C
100 µ1 m10 m
L - Inductive Load - H
E
AS
= 37.5 mJ
SINGLE AVALANCHE ENERGY
DERATING FACTOR
120
100
80
60
40
Energy Derating Factor - %
20
0
Starting T
5010025
75150125
ch
- Starting Channel Temperature - ˚C
VDD = 150 V
R
G
= 25 Ω
V
GS
= 20 → 0 V
I
AS
≤ 7.5 A
6
Data Sheet D13339EJ2V0DS
Page 7
★
PACKAGE DRAWINGS (Unit: mm)
1) TO-220AB (MP-25)2) TO-262 (MP-25 Fin Cut)
2SK3116
10.6 MAX.
10.0 TYP.
3.0±0.3
4
2 3
1
1.3±0.2
0.75±0.1
2.54 TYP.
2.54 TYP.
3) TO-263 (MP-25ZJ)
10 TYP.
4
φ
3.6±0.2
5.9 MIN.6.0 MAX.
15.5 MAX.12.7 MIN.
0.5±0.2
1.Gate
2.Drain
3.Source
4.Fin (Drain)
4.8 MAX.
4.8 MAX.
1.3±0.2
2.8±0.2
1.3±0.2
10 TYP.
4
2 3
1
1.3±0.2
0.75±0.3
2.54 TYP.2.54 TYP.
1.0±0.5
8.5±0.2
12.7 MIN.
EQUIVALENT CIRCUIT
4.8 MAX.
0.5±0.2
1.Gate
2.Drain
3.Source
4.Fin (Drain)
1.3±0.2
2.8±0.2
1.0±0.5
123
1.4±0.2
0.7±0.2
2.54 TYP.2.54 TYP.
8.5±0.2
5.7±0.4
2.8±0.2
0.5R TYP.
0.8R TYP.
1.Gate
2.Drain
3.Source
4.Fin (Drain)
0.5±0.2
Gate (G)
Drain (D)
Body
Diode
Source (S)
Remark Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately degrade
the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly
dissipate it once, when it has occurred.
Data Sheet D13339EJ2V0DS
7
Page 8
2SK3116
•
The information in this document is current as of May, 2002. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
•
No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
•
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
•
Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
•
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
•
NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
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"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4
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