
DATA SHEET
MOS FIELD EFFECT TRANSISTOR
P-CHANNEL MOS FIELD EFFECT TRANSISTOR
FOR SWITCHING
2SJ557
DESCRIPTION
The 2SJ557 is a switching device which can be driven directly
by a 4 V power source.
The 2SJ557 features a low on-state resistance and excellent
switching characteristics, and is suitable for applications such
as power switch of portable machine and so on.
FEATURES
• Can be driven by a 4
• Low on-state resistance
R
= 155 mΩ MAX. (VGS = –10 V, ID = –1.0 A)
DS(on)1
R
= 255 mΩ MAX. (VGS = –4.5 V, ID = –1.0 A)
DS(on)2
R
= 290 mΩ MAX. (VGS = –4.0 V, ID = –1.0 A)
DS(on)3
V power source
ORDERING INFORMATION
PART NUMBER PACKAGE
★
2SJ557 SC-96 (Mini Mold Thin Type)
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage V
Gate to Source Voltage VGSS
Drain Current (DC) ID(DC)
Drain Current (pulse)
Note1
Total Power Dissipation PT1
Total Power Dissipation
Note2
Channel Temperature Tch
Storage Temperature Tstg
DSS
I
D(pulse)
P
T2
–30 V
–20 / +5 V
±2.5 A
±10 A
0.2 W
1.25 W
150 °C
–55 to +150 °C
PACKAGE DRAWING (Unit : mm)
+0.1
0.4
–0.05
+0.1
–0.15
0.65
1.5
2.8 ±0.2
1
0.95
3
0.95
1.9
2.9 ±0.2
2
1
: Gate
2 : Source
3 : Drain
EQUIVALENT CIRCUIT
Gate
Gate
Protection
Diode
Marking: XB
0.9 to 1.1
Drain
Source
0.65
0.16
0 to 0.1
Body
Diode
+0.1
–0.06
Notes 1.
PW ≤ 10 µs, Duty Cycle ≤ 1 %
2. Mounted on FR-4 Board, t ≤ 5
sec.
Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When
this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated
voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. D13292EJ2V0DS00 (2nd edition)
Date Published May 2001 NS CP(K)
Printed in Japan
The mark ★ shows major revised points.
©
1998, 1999

ELECTRICAL CHARACTERISTICS (TA = 25°C)
CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
2SJ557
Drain Cut-off Current I
Gate Leakage Current I
Gate Cut-off Voltage V
DSS
VDS = –30 V, VGS = 0 V –10
GSS
VGS = ±16 V, VDS = 0 V ±10
GS(off)VDS
= –10 V, ID = –1 mA –1.0 –1.7 –2.5 V
A
µ
A
µ
Forward Transfer Admittance | yfs |VDS = –10 V, ID = –1.5 A12.5S
Drain to Source On-state Resi stance R
Input Capacitance C
Output Capacitance C
Reverse Transfer Capacitance C
Turn-on Delay Time t
Rise Time t
Turn-off Delay Time t
Fall Time t
Total Gate Charge Q
Gate to Source Charge Q
Gate to Drain Charge Q
Diode Forward Voltage V
Reverse Recovery Time t
Reverse Recovery Charge Q
DS(on)1VGS
DS(on)2VGS
R
DS(on)3VGS
R
iss
oss
rss
d(on)
r
d(off)
f
G
GS
GD
F(S-D)IF
rr
rr
= –10 V, ID = –1.0 A 114 155 mΩ
= –4.5 V, ID = –1.0 A 178 255 mΩ
= –4.0 V, ID = –1.0 A 212 290 mΩ
VDS = –10 V 312 pF
VGS = 0 V 117 pF
f = 1 MHz 56 pF
VDD = –10 V12ns
ID = –1.0 A7ns
GS(on)
V
= –10 V 133 ns
RG = 10
Ω 85 ns
VDD= –10 V2.8nC
ID = –2.5 A1.0nC
VGS = –4.0 V1.2nC
= 2.5 A, VGS = 0 V0.84V
IF = 2.5 A, VGS = 0 V28ns
di/dt = 50 A /
s7.8nC
µ
TEST CIRCUIT 1 SWITCHING TIME TEST CIRCUIT 2 GATE CHARGE
IG = 2 mA
50 Ω
D.U.T.
RL
VDD
PG.
V
GS
RG = 10 Ω
0
τ
τ = 1 s
µ
Duty Cycle ≤ 1 %
2
R
G
D.U.T.
R
VDD
L
V
GS
Wave Form
ID
Wave Form
V
GS
10 %
0
D
I
10 %
0
t
d(on)
V
GS(on)
90 %
I
D
t
r
t
t
on
Data Sheet D13292EJ2V0DS
d(off)
t
off
90 %
90 %
10 %
t
f
PG.

TYPICAL CHARACTERISTICS (TA = 25°C)
30
150
60
90
20
60
80
40
0
100
120
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
dT - Derating Factor - %
TA - Ambient Temperature -
˚C
FORWARD BIAS SAFE OPERATING AREA
−10 −100
I
D
- Drain Current - A
−1
V
DS
- Drain to Source Voltage - V
−100
−10
−1
−0.1
−0.1
−0.01
5 s
100
ms
10
ms
PW
=
1
ms
R
DS(on)
Limited
(@V
GS
=
−10
V)
I
D
(pulse)
I
D
(
DC
)
Single Pulse
Mounted on FR-4 Board of
50mm x 50mm x 1.6mm
−0.01
−0.001
−0.0001
−0.00001
−1
0
−2 −3 −4 −5
−10
−1
−0.1
VGS - Gate to Sorce Voltage - V
−
25˚C
25˚C
75˚C
T
A
= 125˚C
VDS = −10 V
TRANSFER CHARACTERISTICS
I
D
- Drain Current - A
−1
−10−0.1
VDS = −10V
TA = −25
˚C
25
˚C
ID - Drain Current - A
| y
fs
| - Forward Transfer Admittance - S
1
10
0.1
0.01
−0.01
100
75
˚C
125
˚C
FORWARD TRANSFER ADMMITTANCE Vs.
DRAIN CURRENT
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
−1
−0.1
−0.01
−10
I
D
- Drain Current - A
R
DS(on)
- Drain to Source On-State Resistance - mΩ
200
100
TA = 125˚C
75˚C
−25˚C
25˚C
300
400
500
V
GS
= −4.0 V
GATE TO SOURCE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
T
ch
- Channel Temperature - ˚C
V
GS(off)
- Gate to Source Cut-off Voltage - V
V
DS
= −10 V
I
D
= −1 mA
−50
50 1000
150
−2.0
−1.6
−1.8
−1.4
−1.2
2SJ557
★
Data Sheet D13292EJ2V0DS
3

2SJ557
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
−1
−0.1−0.01
−10
I
D
- Drain Current - A
R
DS(on)
- Drain to Source On-State Resistance - mΩ
TA = 125˚C
100
300
200
500
400
V
GS
= −4.5 V
75˚C
25˚C
−25˚C
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
−1
−0.1−0.01
−10
I
D
- Drain Current - A
R
DS(on)
- Drain to Source On-State Resistance - mΩ
50
TA = 125˚C
100
200
150
250
V
GS
= −10 V
75˚C
25˚C
−25˚C
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
T
ch
- Channel Temperature -˚C
ID = −1.0 A
−50
0 50 100 150
50
150
100
350
250
300
200
R
DS (on)
- Drain to Source On-state Resistance - mΩ
−10 V
V
GS
= −4.0 V
−4.5 V
0
0
200
100
300
400
500
−
4
−
8
−
12
−
16
−
20
R
DS (on)
- Drain to Source On-state Resistance - mΩ
VGS - Gate to Source Voltage - V
ID = −1.0 A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
V
DS
- Drain to Source Voltage - V
C
iss
, C
oss
, C
rss
- Capacitance - pF
10
100
1000
−1 −10 −100
f = 1 MHz
V
GS
= 0V
C
iss
C
rss
C
oss
−0.1
−1
−10
I
D
- Drain Current - A
t
d(on)
, t
r
, t
d(off)
, t
f
- Switching Time - ns
1000
100
10
1
t
r
SWITCHING CHARACTERISTICS
V
DD
= −10 V
V
GS
(on) = −10 V
R
G
= 10 Ω
t
f
t
d(off)
t
d(on)
4
Data Sheet D13292EJ2V0DS

2SJ557
0.01
0.1
1
10
0.4 0.6 0.8 1.0 1.2
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
I
F
- Source to Drain Current - A
V
F(S-D)
- Source to Drain Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
PW - Pulse Width - S
r
th(ch-A)
- Transient Thermal Resistance - ˚C/W
10
1
100
1000
10.001 0.01 0.1 10 100 1000
Single Pulse
Without Board
Mounted on 250 mm x 35 m
Copper Pad
Connected to Drain Electrode
in 50 mm x 50 mm x 1.6 mm
FR-4 Board
µ
2
QG - Gate Charge - nC
0
13542
DYNAMIC INPUT CHARACTERISTICS
V
GS
- Gate to Source Voltage - V
0
−4
−2
−6
−8
−10
V
DD
= −10 V
−6 V
ID = −2.5 A
★
Data Sheet D13292EJ2V0DS
5

2SJ557
M8E 00. 4
The information in this document is current as of May, 2001. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
•
•
•
•
•
•