NEC 2sa1847 Datasets

Page 1
DATA SHEET
PNP SILICON EPITAXIAL TRANSISTOR
FOR HIGH-SPEED SWITCHING
2SA1847
The 2SA1847 is a power transistor developed for high-speed switching and features a high h
at low V
FE
This transistor is ideal for use as a driver in DC/DC converters and actuators.
In addition, this transistor features a package that can be auto-mounted in radial taping specifications, thus
contributing to mounting cost reduction.
FEATURES
• Auto-mount possible in radial taping specifications
• Resin-molded insulation type package with power rating of 1.8 W in stand-alone conditions
• High hFE and low V
V
= −0.3 V MAX. @IC = −6.0 V, IB = −0.3 A
CE(sat)
CE(sat)
:
hFE ≥ 100 @VCE = −2.0 V, IC = −2.0 A
• Fast switching speed
ABSOLUTE MAXIMUM RATINGS (Ta = 25°°°°C)
Parameter Symbol Conditions Ratings Unit
Collector to base voltage V
Collector to emitter voltage V
Emitter to base voltage V
Collector current (DC) I
Collector current (pulse) I
Base current (DC) I
Total power dissipation P
Junction temperature T
Storage temperature T
C(pulse)
CBO
CEO
EBO
C(DC)
B(DC)
stg
PW ≤ 300 µs, duty cycle ≤ 2% −20
Ta = 25°C
T
j
−150
−100
−7.0
−10
−6.0
1.8 W
150
−55 to +150 °C
CE(sat)
V
V
V
A
A
A
°C
.
The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for availability and additional information.
Document No. D15593EJ2V0DS00 (2nd edition) Date Published April 2002 N CP(K) Printed in Japan
2002
1998©
Page 2
ELECTRICAL CHARACTERISTICS (Ta = 25°°°°C)
2
3
Parameter Symbol Conditions MIN. TYP. MAX. Unit
Collector cutoff current I
Collector cutoff current I
Collector cutoff current I
Collector cutoff current I
Emitter cutoff current I
DC current gain h
DC current gain h
DC current gain h
Collector saturation voltage V
Collector saturation voltage V
Base saturation voltage V
Base saturation voltage V
CBO
CER
CEX1
CEX2
EBO
FE1
FE2
FE3
CE(sat)1
CE(sat)2
BE(sat)1
BE(sat)2
Gain bandwidth product f
Collector capacitance C
Turn-on time t
Storage time t
Fall time t
* Pulse test PW ≤ 350 µs, duty cycle ≤ 2%
VCB = −100 V, IE = 0 −10
VCE = −100 V, REB = 50 Ω
Ta = 125°C
VCE = −100 V, V
VCE = −100 V, V
Ta = 125°C
VEB = −5.0 V, IC = 0 −10
= −2.0 V, IC = −0.5 A
V
CE
*
= −2.0 V, IC = −2.0 A
V
CE
*
= −2.0 V, IC = −6.0 A
V
CE
*
= −6.0 A, IB = −0.3 A −0.3
I
C
*
= −8.0 A, IB = −0.4 A −0.5
I
C
*
= −6.0 A, IB = −0.3 A −1.2
I
C
*
= −8.0 A, IB = −0.4 A −1.5
I
C
*
VCE = −10 V, IC = −0.5 A
T
VCB = −10 V, IE = 0, f = 1 MHz
ob
IC = −6.0 A
on
I
= −IB2 = −0.3 A
stg
B1
R
= 8.3 Ω, VCC = −50 V
f
L
= 1.5 V −10
BE(off)
= 1.5 V
BE(off)
100
100 400
60
150 MHz
250 pF
−1.0
−1.0
0.3
1.5
0.4
2SA1847
A
µ
mA
A
µ
mA
A
µ
−
−
−
V
V
V
V
s
µ
s
µ
s
µ
hFE CLASSIFICATION
Marking M L K
h
FE
100 to 200 150 to 300 200 to 400
PACKAGE DRAWING (UNIT: mm) TAPING SPECIFICATION
Electrode Connection
1. Base
. Collector
. Emitter
2
Data Sheet D15593EJ2V0DS
Page 3
TYPICAL CHARACTERISTICS (Ta = 25°°°°C)
(W)
T
Total Power Dissipation P
2SA1847
IC Derating dT (%)
Ambient Temperature Ta (°C)
C/W)
°
Ambient Temperature Ta (°C)
(t) (
(A)
C
th(j-a)
Collector Current I
Single pulse
Transient Thermal Resistance r
Collector to Emitter Voltage VCE (V)
(A)
C
FE
Pulse Width PW (s)
Pulse test
Collector Current I
Collector to Emitter Voltage VCE (V)
DC Current Gain h
Data Sheet D15593EJ2V0DS
Collector Current IC (A)
3
Page 4
2SA1847
µ
(V)
CE(sat )
Pulse test
BE(sat)
Pulse test
Base Saturation Voltage V
Collector Saturation Voltage V
Collector Current IC (A)Collector Current IC (A)
(MHz)
T
(pF)
ob
Gain Bandwidth Product f
Collector Current IC (A)
s)
s)
µ
µ
s)
(
(
on
stg
(
f
Collector Capacitance C
Collector to Base Voltage VCB (V)
Fall Time t
Storage Time t
Turn-On Time t
Collector Current IC (A)
4
Data Sheet D15593EJ2V0DS
Page 5
2SA1847
SWITCHING TIME (ton, t
, tf) TEST CIRCUIT
stg
%DVHFXUUHQW ZDYHIRUP
&ROOHFWRUFXUUHQW ZDYHIRUP
Data Sheet D15593EJ2V0DS
5
Page 6
2SA1847
•
The information in this document is current as of July, 2001. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information.
•
No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
•
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others.
•
Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information.
•
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features.
•
NEC semiconductor products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below. Customers must check the quality grade of each semiconductor product before using it in a particular application. "Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc. The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application. (Note) (1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries. (2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4
Loading...