These TRI-STATE buffers utilize advanced silicon-gate
CMOS technology. They possess high drive current outputs
which enable high speed operation even when driving large
bus capacitances. These circuits achieve speeds comparable to low power Schottky devices, while retaining the advantage of CMOS circuitry, i.e., high noise immunity, and
low power consumption. Both devices have a fanout of 15
LS-TTL equivalent inputs.
The MM54HC540/MM74HC540 is an inverting buffer and
the MM54HC541/MM74HC541 is a non-inverting buffer.
The TRI-STATE control gate operates as a two-input NOR
such that if either G1
the high-impedance state.
or G2 are high, all eight outputs are in
February 1988
Buffer
In order to enhance PC board layout, the ’HC540 and
’HC541 offers a pinout having inputs and outputs on opposite sides of the package. All inputs are protected from damage due to static discharge by diodes to V
Features
Y
Typical propagation delay: 12 ns
Y
TRI-STATE outputs for connection to system buses
Y
Wide power supply range: 2 –6V
Y
Low quiescent current: 80 mA maximum (74HC Series)
TRI-STATEÉis a registered trademark of National Semiconductor Corporation.
C
1995 National Semiconductor CorporationRRD-B30M105/Printed in U. S. A.
TL/F/5341
Page 2
Absolute Maximum Ratings (Notes1&2)
Operating Conditions
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Supply Voltage (V
CC
)
DC Input Voltage (VIN)
DC Output Voltage (V
OUT
)
Clamp Diode Current (ICD)
DC Output Current, per pin (I
OUT
)
DC VCCor GND Current, per pin (ICC)
Storage Temperature Range (T
STG
b
b
)
b
0.5 toa7.0V
1.5 to V
CC
0.5 to V
CC
g
g
b
g
65§Ctoa150§C
a
1.5V
a
0.5V
20 mA
35 mA
70 mA
Supply Voltage (V
)26V
CC
DC Input or Output Voltage0V
(V
IN,VOUT
)
Operating Temp. Range (TA)
MM74HC
MM54HC
Input Rise or Fall Times
e
V
2.0V(tr,tf)1000ns
CC
e
V
4.5V500ns
CC
e
V
6.0V400ns
CC
Power Dissipation (PD)
(Note 3)600 mW
S.O. Package only500 mW
Lead Temp. (T
) (Soldering 10 seconds)260§C
L
DC Electrical Characteristics (Note 4)
e
T
25§C
SymbolParameterConditionsV
CC
A
TypGuaranteed Limits
V
Minimum High Level2.0V1.51.51.5V
IH
Input Voltage4.5V3.153.153.15V
6.0V4.24.24.2V
V
Maximum Low Level2.0V0.50.50.5V
IL
Input Voltage**4.5V1.351.351.35V
6.0V1.81.81.8V
V
Minimum High LevelV
OH
Output Voltage
e
VIHor V
l
IN
I
OUT
IL
s
20 mA2.0V 2.01.91.91.9V
l
4.5V 4.54.44.44.4V
6.0V 6.05.95.95.9V
e
V
VIHor V
IN
I
l
OUT
I
l
OUT
l
IN
I
OUT
e
V
Maximum Low LevelV
OL
Output Voltage
IL
s
6.0 mA4.5V 4.23.983.843.7V
l
s
7.8 mA6.0V 5.75.485.345.2V
l
VIHor V
IL
s
20 mA2.0V00.10.10.1V
l
4.5V00.10.10.1V
6.0V00.10.10.1V
e
V
VIHor V
IN
I
l
OUT
I
l
OUT
I
IN
I
OZ
Maximum InputV
Current
Maximum TRI-STATE V
Output LeakageV
Current
I
CC
Maximum QuiescentV
Supply CurrentI
Note 1: Absolute Maximum Ratings are those values beyond which damage to the device may occur.
Note 2: Unless otherwise specified all voltages are referenced to ground.
Note 3: Power Dissipation temperature derating Ð plastic ‘‘N’’ package:
Note 4: For a power supply of 5V
with this supply. Worst case V
) occur for CMOS at the higher voltage and so the 6.0V values should be used.
I
OZ
**V
limits are currently tested at 20% of VCC. The above VILspecification (30% of VCC) will be implemented no later than Q1, CY’89.
IL
g
and VILoccur at V
IH
e
IN
e
IN
OUT
e
IN
OUT
10% the worst case output voltages (VOH, and VOL) occur for HC at 4.5V. Thus the 4.5V values should be used when designing
IL
s
6.0 mA4.5V 0.20.260.330.4V
l
s
7.8 mA6.0V 0.20.260.330.4V
l
VCCor GND6.0V
VIHor VIL,GeVIH6.0V
e
VCCor GND
g
0.1
g
0.5
VCCor GND6.0V8.080160mA
e
0 mA
b
12 mW/§C from 65§Cto85§C; ceramic ‘‘J’’ package:b12 mW/§C from 100§Cto125§C.
e
5.5V and 4.5V respectively. (The VIHvalue at 5.5V is 3.85V.) The worst case leakage current (IIN,ICC, and
CC
74HC54HC
eb
T
40 to 85§CT
A
g
1.0
g
5
MinMaxUnits
V
§
§
Units
b
b
40
55
A
eb
CC
a
85
a
125
55 to 125§C
g
1.0mA
g
10mA
C
C
2
Page 3
AC Electrical Characteristics V
CC
e
5V, T
SymbolParameterConditionsTyp
t
PHL,tPLH
t
PHL,tPLH
t
PZH,tPZL
t
PHZ,tPLZ
Maximum PropagationC
Delay (540)
Maximum PropagationC
Delay (541)
Maximum Output EnableR
TimeC
Maximum Output DisableR
TimeC
e
45 pF1218ns
L
e
45 pF1420ns
L
e
1kX1728ns
L
e
45 pF
L
e
1kX1525ns
L
e
5pF
L
e
A
25§C, t
Guaranteed
e
r
Limit
e
t
6ns
f
Units
AC Electrical Characteristics V
e
2.0V to 6.0V, C
CC
SymbolParameterConditions V
t
PHL,tPLH
t
PHL,tPLH
t
PZH,tPZL
t
PHZ,tPLZ
t
THL,tTLH
C
PD
C
IN
C
OUT
Note 5: CPDdetermines the no load dynamic power consumption, P
Maximum PropagationC
Delay (540)C
Maximum PropagationC
Delay (541)C
Maximum Output EnableR
Time
Maximum Output DisableR
TimeC
Maximum Output RiseC
and Fall Time4.5V7121518ns
Power DissipationGeV
Capacitance (Note 5)G
Maximum Input5101010pF
Capacitance
Maximum Output Capacitance15202020pF
e
50 pF2.0V55100126149ns
L
e
150 pF 2.0V83150190224ns
L
e
C
50 pF4.5V12202530ns
L
e
C
150 pF 4.5V22303845ns
L
e
C
50 pF6.0V11172125ns
L
e
C
150 pF 6.0V18263238ns
L
e
50 pF2.0V58115145171ns
L
e
150 pF 2.0V83165208246ns
L
e
C
50 pF4.5V14232934ns
L
e
C
150 pF 4.5V17334249ns
L
e
C
50 pF6.0V11202529ns
L
e
C
150 pF 6.0V14283542ns
L
e
1kX
L
e
C
50 pF2.0V75150189224ns
L
e
C
150 pF 2.0V 100200252298ns
L
e
C
50 pF4.5V15303845ns
L
e
C
150 pF 4.5V30405060ns
L
e
C
50 pF6.0V13263238ns
L
e
C
150 pF 6.0V17344351ns
L
e
1kX2.0V75150189224ns
L
e
50 pF4.5V15303845ns
L
e
50 pF2.0V25607590ns
L
IH
e
V
IL
e
D
CC
e
L
e
T
25§C
A
50 pF, t
e
e
t
6 ns (unless otherwise specified)
r
f
74HC54HC
eb
T
40 to 85§CT
A
A
eb
55 to 125§C
TypGuaranteed Limits
6.0V13263238ns
6.0V6101315ns
10pF
50pF
2
CPDV
faICCVCC, and the no load dynamic current consumption, I
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or2. A critical component is any component of a life
systems which, (a) are intended for surgical implantsupport device or system whose failure to perform can
into the body, or (b) support or sustain life, and whosebe reasonably expected to cause the failure of the life
failure to perform, when properly used in accordancesupport device or system, or to affect its safety or
with instructions for use provided in the labeling, caneffectiveness.
be reasonably expected to result in a significant injury
to the user.
Order Number MM74HC540J, N or MM74HC541J, N
See NS Package N20A
National SemiconductorNational SemiconductorNational SemiconductorNational Semiconductor
CorporationEuropeHong Kong Ltd.Japan Ltd.
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Tel: 1(800) 272-9959Deutsch Tel: (
Fax: 1(800) 737-7018English Tel: (
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.