The LMH™6570 is a high performance analog multiplexer
optimized for professional grade video and other high fidelity
high bandwidth analog applications. The output amplifier
selects one of two buffered input signals based on the state
of the SEL pin. The LMH6570 provides a 400 MHz bandwidth at 2 V
definition television (HDTV) applications can benefit from the
LMH6570’s 0.1 dB bandwidth of 150 MHz and its 2200 V/µs
slew rate.
The LMH6570 supports composite video applications with its
0.02% and 0.05˚ differential gain and phase errors for NTSC
and PAL video signals while driving a single, back terminated
75Ω load. An 80 mA linear output current is available for
driving multiple video load applications.
The LMH6570 gain is set by external feedback and gain set
resistors for maximum flexibility.
The LMH6570 is available in the 8 pin SOIC package.
output signal levels. Multimedia and high
PP
Connection Diagram
8-Pin SOIC
Features
n 500 MHz, 500 mVPP, −3 dB bandwidth, AV=2
n 400 MHz, 2V
n 8 ns channel switching time
n 70 dB channel to channel isolation
n 0.02%, 0.05˚ diff. gain, diff. phase
n 0.1 dB gain flatness to 150 MHz
n 2200 V/µs slew rate
n Wide supply voltage range: 6V (
n −68 dB HD2
n −84 dB HD3
, −3 dB bandwidth, AV=2
PP
±
@
5 MHz
@
5 MHz
@
10 MHz
3V) to 12V (±6V)
Applications
n Video router
n Multi input video monitor
n Instrumentation / Test equipment
n Receiver IF diversity switch
n Multi channel A/D driver
n Picture in Picture video switch
Top View
20129905
Truth Table
SELSDOUTPUT
10IN1 * (1+RF/RG)
00IN0 * (1+RF/RG)
X1Shutdown
LMH™is a trademark of National Semiconductor Corporation.
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications, see the Electrical Characteristics tables.
Note 2: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of
the device such that T
See Applications Section for information on temperature de-rating of this device. Min/Max ratings are based on product testing, characterization and simulation.
Individual parameters are tested as noted.
Note 3: The maximum output current (I
150˚C). See the Power Dissipation section of the Application Section for more details. A short circuit condition should be limited to 5 seconds or less.
Note 4: Human Body model, 1.5kΩ in series with 100pF. Machine model, 0Ω In series with 200pF
Note 5: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control
(SQC) methods.
Note 6: Parameter guaranteed by design.
Note 7: Positive Value is current into device.
Note 8: Slew Rate is the average of the rising and falling edges.
Note 9: Typical numbers are the most likely parametric norm.
Note 10: Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.
. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self heating where T
J=TA
) is determined by the device power dissipation limitations (The junction temperature cannot be allowed to exceed