The LM760 is a differential voltage comparator offering considerable speed improvement over the LM710 family and
operates from symmetric supplies of
LM760 can be used in high speed analog-to-digital conversion systems and as a zero crossing detector in disc file and
tape amplifiers. The LM760 output features balanced rise
and fall times for minimum skew and close matching between the complementary outputs. The outputs are TTL
compatible with a minimum sink capability of two gate loads.
g
4.5V tog6.5V. The
Connection Diagram
8-Lead DIP
Top View
Ordering Information
Temperature RangeNSC
CommercialPackage TypePackage
0
Ctoa70§CDrawing
§
LM760CN8-lead Plastic DIPN08E
Features
Y
Guaranteed high speedÐ 25 ns response time
Y
Guaranteed delay matching on both outputs
Y
Complementary TTL compatible outputs
Y
High sensitivity
Y
Standard supply voltages
Applications
Y
High speed A-to-D
Y
Peak or zero detector
TL/H/10067– 3
C
1995 National Semiconductor CorporationRRD-B30M115/Printed in U. S. A.
TL/H/10067
Absolute Maximum Ratings
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Storage Temperature Range
Metal Can and Ceramic DIP
Molded DIP
Operating Temperature Range
Military (LM760)
Commercial (LM760C)0
b
65§Ctoa175§C
b
65§Ctoa150§C
b
55§Ctoa125§C
Ctoa70§C
§
Lead Temperature
Metal Can and Ceramic DIP
(Soldering, 60 sec.)300
Molded DIP (Soldering, 10 sec.)265
Positive Supply Voltage
Negative Supply Voltage
Peak Output Current10 mA
Differential Input Voltage
Input VoltageV
ESD SusceptibilityTBD
C
§
C
§
a
8.0V
b
8.0V
g
5.0V
a
t
t
V
I
LM760
Electrical Characteristics
e
g
V
CC
4.5V tog6.5V, T
SymbolParameterConditionsMinTypMaxUnits
V
IO
I
IO
I
IB
R
O
t
PD
Dt
PD
Input Offset VoltageR
Input Offset Current0.57.5mA
Input Bias Current8.060mA
Output Resistance (Either Output)V
Response TimeT
Response Time Difference
between Outputs (Note 1)
ofaVI1)b(tPDofbVI2)T
(t
PD
(tPDofaVI2)b(tPDofbVI1)T
(tPDofaVI1)b(tPDofaVI2)T
(tPDofbVI1)b(tPDofbVI2)T
R
I
C
I
DVIO/DTAverage Temperature CoefficientR
DIIO/DTAverage Temperature CoefficientT
V
IR
V
IDR
V
OH
V
OL
a
I
b
I
Input Resistancefe1.0 MHz12kX
Input Capacitancefe1.0 MHz8.0pF
of Input Offset VoltageT
of Input Offset Current
Input Voltage RangeV
Differential Input Voltage Range
Output Voltage HIGH0 mAsI
(Either Output)V
Output Voltage LOWI
(Either Output)
Positive Supply CurrentV
Negative Supply CurrentV
eb
55§Ctoa125§C, T
A
e
25§C for typical figures, unless otherwise specified
A
s
200X1.06.0mV
S
e
V
O
OH
e
25§C (Note 3)1830
A
e
T
25§C (Note 4)25ns
A
100X
(Note 5)16
e
25§C5.0
A
e
25§C5.0ns
A
e
25§C7.5
A
e
25§C7.5
A
e
50X,
S
eb
55§Ctoa125§C
A
ea
25§Ctoa125§C2.0
A
ea
25§Ctob55§C7.0
T
A
e
g
6.5V
CC
s
5.0 mA
OH
ea
5.0VV
CC
e
I
80 mA, V
OH
e
3.2 mA
OL
e
g
CC
e
g
CC
e
g
4.5V2.43.0
CC
6.5V1832mA
6.5V9.016mA
g
4.0
2.43.2
3.0mV/
g
4.5V
g
5.0V
0.250.4V
nA/
b
V
C
§
C
§
2
LM760C
Electrical Characteristics
e
g
V
CC
4.5V tog6.5V, T
SymbolParameterConditionsMinTypMaxUnits
V
IO
I
IO
I
IB
R
O
t
PD
Dt
PD
Input Offset VoltageR
Input Offset Current0.57.5mA
Input Bias Current8.060mA
Output Resistance (Either Output)V
Response TimeT
Response Time Difference
between Outputs (Note 1)
ofaVI1)b(tPDofbVI2)T
(t
PD
(tPDofaVI2)b(tPDofbVI1)T
(tPDofaVI1)b(tPDofaVI2)T
(tPDofbVI1)b(tPDofbVI2)T
R
I
C
I
DVIO/DTAverage Temperature CoefficientR
DIIO/DTAverage Temperature CoefficientT
V
IR
V
IDR
V
OH
V
OL
a
I
b
I
Note 1: T
Note 2: Ratings apply to ambient temperature at 25
Note 3: Response time measured from the 50% point of a 30 mV
Note 4: Response time measured from the 50% point of a 2.0 V
Note 5: Response time measured from the start of a 100 mV input step with 5.0 mV overdrive to the time when the output crosses the logic threshold.
Input Resistancefe1.0 MHz12kX
Input Capacitancefe1.0 MHz8.0pF
of Input Offset VoltageT
of Input Offset Current
Input Voltage RangeV
Differential Input Voltage Range
Output Voltage HIGH0 mAsI
(Either Output)V
Output Voltage LOWI
(Either Output)
Positive Supply CurrentV
Negative Supply CurrentV
e
150§C.
J Max
e
0§Ctoa70§C, T
A
e
25§C for typical figures, unless otherwise specified
A
s
200X1.06.0mV
S
e
V
O
OH
e
25§C (Note 3)1830
A
e
T
25§C (Note 4)25ns
A
100X
(Note 5)16
e
25§C5.0
A
e
25§C5.0ns
A
e
25§C10
A
e
25§C10
A
e
50X,
S
e
0§Ctoa70§C
A
ea
25§Ctoa70§C5.0
A
ea
25§Cto0§C10
T
A
e
g
6.5V
CC
s
5.0 mA
OH
ea
5.0VV
CC
e
I
80 mA, V
OH
e
3.2 mA
OL
e
g
CC
e
g
CC
C.
§
10 MHz sinusoidal input to the 50% point of the output.
P–P
10 MHz sinusoidal input to the 50% point of the output.
P–P
e
g
4.5V2.53.0
CC
6.5V1834mA
6.5V9.016mA
g
4.0
2.43.2
3.0mV/
nA/
g
4.5V
g
5.0V
0.250.4V
C
§
C
§
3
Typical Performance Characteristics
Response Time for
Various Output Overdrives
Response Time vs
Input Voltage
Voltage Gain vs
Supply Voltage
Response Time for
Various Input Overdrives
Voltage Transfer
Characteristic
Voltage Gain
vs Temperature
Response Time vs
Input Voltage
Voltage Transfer
Characteristic
Input Bias Current
vs Temperature
Input Offset Current
vs Temperature
Response Time
vs Temperature
4
Output Voltage Levels
vs Temperature
TL/H/10067– 5
Typical Performance Characteristics (Continued)
Rise Time vs
Capacitive Load
Equivalent Circuit
Fall Time vs
Capacitive Load
Common Mode Range
vs Supply Voltage
Input Bias Current vs
Differential Input Voltage
TL/H/10067– 6
TL/H/10067– 4
5
Typical Applications (Note 1)
Fast Positive Peak Detector
Level Detector with Hysteresis
Line Receiver with High Common Mode Range
TL/H/10067– 7
TL/H/10067– 8
Common mode range
Differential Input Sensitivity
must be adjusted for optimum common mode rejection.
P
1
e
For R
200X:
S
Common mode range
e
Sensitivity
Zero Crossing Detector (Note 2)
20 mV
R
S
e
c
g
4
V
50
R
S
e
c
5
mV
50
e
g
16V
TL/H/10067– 10
Note 1: Lead numbers shown are for Metal Package only.
Note 2: All resistor values in ohms.
Total delaye30 ns
Input Frequency
Minimum input voltage
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or2. A critical component is any component of a life
systems which, (a) are intended for surgical implantsupport device or system whose failure to perform can
into the body, or (b) support or sustain life, and whosebe reasonably expected to cause the failure of the life
failure to perform, when properly used in accordancesupport device or system, or to affect its safety or
with instructions for use provided in the labeling, caneffectiveness.
be reasonably expected to result in a significant injury
to the user.
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