National Semiconductor LM26LV User Manual

Page 1
Revision A
July 16,2007
LM26LV Evaluation Board User’s Guide
LM26LV Evaluation Board User’s Guide
© Copyright 2007 National Semiconductor Corporation 1 www.national.com
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LM26LV Evaluation Board User’s Guide
Table of Contents
Table of Contents 2
References 3
1.0 Introduction 4
1.1 Block Diagram 4
2.0 Quick Start 5
2.1 Quick Start Diagram 5
3.0 Functional Description 6
3.1 LM26LV Evaluation Board Connection Table 6
4.0 Electrical and Mechanical Specifications 7
4.1 Electrical Specifications 7
4.2 Electrical Schematic 7
4.3 Evaluation Board Layout 8
4.4 Bill of Materials 9
4.5 Mechanical Specifications 9
© Copyright 2007 National Semiconductor Corporation 2 www.national.com
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LM26LV Evaluation Board User’s Guide
References
1. “LM26LV 1.6V, LLP-6, Factory Preset Temperature Switch and Temperature Sensor”
datasheet.
The latest copy of the LM26LV datasheet can be obtained by going to the National Semiconductor website
www.national.com, by searching on “LM26LV”, and then
downloading the LM26LV.pdf file.
© Copyright 2007 National Semiconductor Corporation 3 www.national.com
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1.0 Introduction
The LM26LV Evaluation Board offers the user a convenient way to experiment with the operation of the LM26LV Temperature Switch and Temperature Sensor.
There are jumpers that allow the insertion of an output series resistor, the measurement of IDD, and the selection of the TRIP TEST mode.
By default, jumpers J3 (IDD) and J4 (VOUT) are installed. Resistor R3 can be installed and J4 removed to insert it in series with the output. See the datasheet for recommended values for R3. By default J2
1.1 Block Diagram
is left open but a jumper is provided so that the user can use the TRIP TEST mode.
Note that R1 is only in the circuit for protection. This resistor is not required in actual operation. The TRIP TEST Pin can be connected directly to VDD to select the TRIP TEST Mode.
R2, the pull-up resistor for the open-drain output OVERTEMP#, is 100k on the board. See the datasheet for more details about this value. If this pin is not used by the customer it may be left open.
The block diagram below shows the jumpers in the default condition.
R1
100k
J2
TRIP
TEST
Default = Not
Jumpered
TRIP TEST
J1
VDD GND
J3
IDD
1
LM26LV
4
Default =
Jumpered
Default =
Jumpered
6
5
R2
100k
R3
Optional Resistor
J4
J5
OVERTEMP
Under Test
3
OVERTEMP
TRIP TEST
2
© Copyright 2007 National Semiconductor Corporation 4 www.national.com
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2.0 Quick Start
The diagram below shows how the LM26LV is connected in a typical bench test configuration.
Before applying power directly to the LM26LV Evaluation Board, make sure that the voltage is between +1.6 VDC and +5.5 VDC. Also make sure that J3 and J4 are
2.1 Quick Start Diagram
POWER SUPPLY
+
1.6V to 5.5V
POWER IN
VDD
GND
J1
C3
C2
Jumper J2 for
TRIP TEST Only
J2
TRIP
TEST
R2
J3
IDD
Jumper Both J3 and J4
for Normal Operation
R1
VOUT
U1
C1
R3
J4
jumpered for normal operation. Jumpering J2 will put the LM26LV in TRIP TEST mode, not for normal operation.
Apply power to the LM26LV evaluation board. Measure the output voltage connected between to output pin (J4) and ground for the VTEMP Output voltage.
VDD
GND
VOUT
OT
OT#
TRIP TEST
J5
Output Test Pins Only
Do Not Inject Signals Here
N
National Semiconductor
LM26LVEB Evaluation Board
!
© Copyright 2007 National Semiconductor Corporation 5 www.national.com
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3.0 Functional Description
See the details of the normal operation and the TRIP TEST mode operation in the datasheet.
3.1 LM26LVEB Evaluation Board Connection Table
Connector
Label
J1 POWER IN
J2 TRIP TEST 1 -2
J3 IDD
J4 V
J5 Test Pins
Connector
Name
Output
OUT
Pin
Number
1 VDD Supply +1.6 to 5.5 VDC to this pin. 2 GND This is Power Supply return for VDD Input
See the datasheet for details regarding the VTEMP inversely proportional output voltage vs temperature characteristic.
Description
If pins 1 and 2 are jumpered then TRIP TEST Mode is selected. Jumper is installed unless a milliammeter is used to measure the actual IDD. Jumper is installed across pins 1 and 2 by default. Otherwise resistor R3 is in series with the output. Use these pins to test and monitor the signals on the board. Do not inject signals here.
© Copyright 2007 National Semiconductor Corporation 6 www.national.com
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4.0 Electrical and Mechanical Specifications
4.1 Electrical Specifications
Power Requirements
The Board uses the +1.6 VDC to +5.5 VDC and GND lines from an external low-noise power supply.
4.2 Electrical Schematic
+1.6 VDC to
+5.5 VDC
Figure 4.2 Schematic Diagram of the LM26LV Evaluation Board
© Copyright 2007 National Semiconductor Corporation 7 www.national.com
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4.3 Evaluation Board Layout
Figure 4.3 Layout diagram of the LM26LV Evaluation Board
© Copyright 2007 National Semiconductor Corporation 8 www.national.com
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4.4 Bill of Materials for LM26LV Evaluation Board
Item Quantity Reference Part
1 2 C1, C2 Capacitor, Ceramic, 0.01 uF 2 1 C3 Capacitor Ceramic, 2.2 uF 3 4 J1, J2, J3, J4 Header, 1X2, 0.1 in centers 4 1 J5 Header, 1X6, 0.1 in centers 6 2 R1, R2 Resistor, 100k 7 1 R3 Resistor, (not stuffed) 8 1 U1 LM26LVCISD Device Under Test (DUT) 9 1 -- Circuit Board, Fabricated, LM26LVEB Evaluat i on B oa rd ,
Rev. 1
4.5 Mechanical Specifications
4.5.1 Operating Mechanical and Environmental Specifications
Minimum Typical Maximum
Temperature
4.5.2 Evaluation Board Basic Dimensions
0°C 25°C 70°C
1.650 in/ 4.191 cm
1.050 in/ 2.667 cm
4.5.3 Electrostatic Discharge (ESD) Precautions
The user shall use ESD precautions as specified in National Semiconductor ESD document (SC)CSI-3-038 available through www.national.com.
© Copyright 2007 National Semiconductor Corporation 9 www.national.com
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© Copyright 2007 National Semiconductor Corporation 10 www.national.com
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