ADC0820
8-Bit High Speed µP Compatible A/D Converter with
Track/Hold Function
ADC0820 8-Bit High Speed µP Compatible A/D Converter with Track/Hold Function
June 1999
General Description
By using a half-flash conversion technique, the 8-bit
ADC0820 CMOS A/D offers a 1.5 µs conversion time and
dissipates only 75 mW of power. The half-flash technique
consists of 32 comparators, a most significant 4-bitADCand
a least significant 4-bit ADC.
The input to the ADC0820 is tracked and held by the input
sampling circuitry eliminating the need for an external
sample-and-hold for signals moving at less than 100 mV/µs.
For ease of interface to microprocessors, the ADC0820 has
been designed to appear as a memory location or I/O port
without the need for external interfacing logic.
Key Specifications
n Resolution8 Bits
n Conversion Time2.5 µs Max (RD Mode)
1.5 µs Max (WR-RD Mode)
n Low Power75 mW Max
n Total Unadjusted
Error
1
±
⁄2LSB and±1 LSB
Connection and Functional Diagrams
Dual-In-Line, Small Outline
and SSOP Packages
Features
n Built-in track-and-hold function
n No missing codes
n No external clocking
n Single supply —5 V
n Easy interface to all microprocessors, or operates
stand-alone
n Latched TRI-STATE
n Logic inputs and outputs meet both MOS and T
voltage level specifications
n Operates ratiometrically or with any reference value
equal to or less than V
n 0V to 5V analog input voltage range with single 5V
supply
n No zero or full-scale adjust required
n Overflow output available for cascading
n 0.3" standard width 20-pin DIP
n 20-pin molded chip carrier package
n 20-pin small outline package
n 20-pin shrink small outline package (SSOP)
DC
®
output
CC
Molded Chip Carrier
Package
2
L
DS005501-1
Top View
TRI-STATE®is a registeredtrademark of National Semiconductor Corporation.
ADC0820BCVV20A— Molded Chip Carrier0˚C to +70˚C
ADC0820BCWM
ADC0820BCNN20A—Molded DIP0˚C to +70˚C
ADC0820CCJ
ADC0820CCWMM20B— Wide Body Small Outline0˚C to +70˚C
ADC0820CIWMM20B— Wide Body Small Outline−40˚C to +85˚C
ADC0820CCNN20A— Molded DIP0˚C to +70˚C
1
±
⁄2LSBM20B— Wide Body Small Outline0˚C to +70˚C
J20A— Cerdip−40˚C to +85˚C
±
1 LSB
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Absolute Maximum Ratings (Notes 1, 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
Logic Control Inputs−0.2V to V
Voltage at Other Inputs and Output−0.2V to V
Storage Temperature Range−65˚C to +150˚C
Package Dissipation at T
Input Current at Any Pin (Note 5)1 mA
Package Input Current (Note 5)4 mA
ESD Susceptability (Note 9)1200V
Lead Temp. (Soldering, 10 sec.)
Dual-In-Line Package (plastic)260˚C
)10V
CC
=
25˚C875 mW
A
CC
CC
+0.2V
+0.2V
Dual-In-Line Package (ceramic)300˚C
Surface Mount Package
5V, unless otherwise specified. Boldface limits apply from T
CC
ADC0820CCJADC0820BCV, ADC0820BCWM
TypTestedDesignTypTestedDesign
(Note 6)LimitLimit(Note 6)LimitLimit
0.00510.0051µA
−0.005−1−0.005−1µA
=
−360 µA;2.42.82.4V
=
−10 µA;4.54.64.5V
=
1.6 mA;0.40.340.4V
(Note 7)(Note 8)(Note 7)(Note 8)
2.02.02.0V
0.80.80.8V
0.130.10.33µA
−12−6−12−7.2−6mA
−9−4.0−9−5.3−4.0mA
147148.47mA
ADC0820CCWM, ADC0820CIWM
MIN
to T
MAX
; all other
Units
AC Electrical Characteristics
=
=
The following specifications apply for V
fied.
CC
ParameterConditions(Note 6)LimitLimitUnits
, Conversion Time for RD
t
CRD
Mode
t
, Access Time (Delay fromPin 7=0,
ACC0
Pin 7=0,
Falling Edge of RD to Output
Valid)
t
, Conversion Time forPin 7=VCC;t
CWR-RD
WR-RD Modet
RD
tWR, Write TimeMinPin 7=VCC;
Max(Note 4) See Graph50µs
t
, Read TimeMinPin 7=VCC;
RD
(Note 4) See Graph
t
, Access Time (Delay fromPin 7=VCC,t
ACC1
Falling Edge of RD to Output
Valid)
www.national.com4
C
L
C
L
=
5V, t
t
20 ns, V
r
f
Figure 2
Figure 2
=
600 ns,1.52µs
600 ns;
WR
Figures 3, 4
=
Figures 3, 4
Figures 3, 4
<
tI;
Figure 3
=
15 pF190280ns
=
100 pF210320ns
RD
(+)=5V, V
REF
(−)=0V and T
REF
=
25˚C unless otherwise speci-
A
TypTestedDesign
(Note 7)(Note 8)
1.62.5µs
t
+20t
CRD
CRD
600ns
600ns
+50ns
AC Electrical Characteristics (Continued)
=
=
The following specifications apply for V
fied.
CC
5V, t
r
=
t
20 ns, V
f
REF
(+)=5V, V
(−)=0V and T
REF
TypTestedDesign
ParameterConditions(Note 6)LimitLimitUnits
, Access Time (Delay from
t
ACC2
Falling Edge of RD to Output
Valid)
t
, Access Time (Delay from
ACC3
Rising Edge of RDY to Output
Pin 7=V
=
C
15 pF70120ns
L
=
C
100 pF90150ns
L
R
PULLUP
CC,tRD
=
1k and C
>
tI;
Figure 4
=
15 pF30ns
L
Valid)
, Internal Comparison TimePin 7=VCC;
t
I
t
, TRI-STATE ControlR
1H,t0H
C
L
L
Figures 4, 5
=
50 pF
=
=
1k, C
10 pF100200ns
L
8001300ns
(Delay from Rising Edge of RD to
Hi-Z State)
t
, Delay from Rising Edge ofPin 7=VCC,C
INTL
WR to Falling Edge of INT
t
, Delay from Rising Edge of
INTH
RD to Rising Edge of INT
t
, Delay from Rising Edge of
INTHWR
>
t
RD
<
t
RD
Figures 2, 3, 4
=
C
50 pFc
L
Figure 5
tI;
tI;
=
50 pF
L
Figure 4
Figure 3
tRD+200tRD+290ns
125225ns
=
,C
50 pF175270ns
L
WR to Rising Edge of INT
t
, Delay from CS to RDY
RDY
t
, Delay from INT to Output Valid
ID
t
, Delay from RD to INTPin 7=VCC,t
RI
Figure 2
Figure 5
=
,C
50 pF, Pin 7=050100ns
L
2050ns
<
t
RD
I
200290ns
Figure 3
tP, Delay from End of Conversion
Figures 2, 3, 4, 5
to Next Conversion(Note 4) See Graph
Slew Rate, Tracking0.1V/µs
C
, Analog Input Capacitance45pF
VIN
C
, Logic Output Capacitance5pF
OUT
C
, Logic Input Capacitance5pF
IN
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to the GND pin, unless otherwise specified.
Note 3: Total unadjusted error includes offset, full-scale, and linearity errors.
Note 4: Accuracy may degrade if t
Note 5: When the input voltage (V
1 mA or less. The 4 mA package input current limits the number of pins that can exceed the power supply boundaries witha1mAcurrent limit to four.
Note 6: Typicals are at 25˚C and represent most likely parametric norm.
Note 7: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 8: Design limits are guaranteed but not 100%tested. These limits are not used to calculate outgoing quality levels.
Note 9: Human body model, 100 pF discharaged through a 1.5 kΩ resistor.
or tRDis shorter than the minimum value specified. See Accuracy vs tWRand Accuracy vs tRDgraphs.
WR
) at any pin exceeds the power supply rails (V
IN
<
>
V−or V
IN
V+) the absolute value of current at that pin should be limited to
IN
=
25˚C unless otherwise speci-
A
(Note 7)(Note 8)
t
I
500ns
ns
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TRI-STATE Test Circuits and Waveforms
t
1H
Timing Diagrams
DS005501-3
t
0H
DS005501-5
=
t
20 ns
r
=
t
20 ns
r
DS005501-4
DS005501-6
Note: On power-up the state of INT can be high or low.
FIGURE 2. RD Mode (Pin 7 is Low)
www.national.com6
DS005501-7
Timing Diagrams (Continued)
FIGURE 3. WR-RD Mode (Pin 7 is High and t
DS005501-8
<
RD
tI)
FIGURE 4. WR-RD Mode (Pin 7 is High and t
FIGURE 5. WR-RD Mode (Pin 7 is High)
Stand-Alone Operation
DS005501-9
>
RD
DS005501-10
tI)
www.national.com7
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