National Semiconductor 54ACTQ08 Technical data
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54ACTQ08
Quiet Series Quad 2-Input AND Gate
General Description
The ’ACTQ08 contains four, 2-input AND gates and utilizes
NSC Quiet Series technology to guarantee quiet output
switching and improved dynamic threshold performance.
FACT Quiet Series
dershoot corrector in addition to a split ground bus for superior ACMOS performance.
Features
n ICCreduced by 50
™
features GTO™output control and un-
%
54ACTQ08 Quiet Series Quad 2-Input AND Gate
September 1998
n Guaranteed simultaneous switching noise level and
dynamic threshold performance
n Improved latch-up immunity
n Minimum 4 kV ESD protection
n Outputs source/sink 24 mA
n ’ACTQ08 has TTL-compatible inputs
n Standard Microcircuit Drawing (SMD) 5962-8954701
Logic Symbol
Pin Names Description
A
n,Bn
O
n
IEEE/IEC
Inputs
Outputs
DS010891-1
Connection Diagrams
Pin Assignment
for DIP and Flatpak
DS010891-2
Pin Assignment
for LCC
DS010891-3
GTO™is a trademark of National Semiconductor Corporation.
™
FACT
and FACT Quiet Series™are trademarks of Fairchild Semiconductor Corporation.
© 1998 National Semiconductor Corporation DS010891 www.national.com
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
DC Input Diode Current (I
=
−0.5V −20 mA
V
I
=
V
V
I
CC
DC Input Voltage (V
DC Output Diode Current (I
=
−0.5V −20 mA
V
O
=
V
V
O
CC
DC Output Voltage (V
DC Output Source
or Sink Current (I
or Ground Current
DC V
CC
per Output Pin (I
Storage Temperature (T
DC Latch-Up
Source or Sink Current
Junction Temperature (T
) −0.5V to +7.0V
CC
)
IK
+ 0.5V +20 mA
) −0.5V to VCC+ 0.5V
I
)
OK
+ 0.5V +20 mA
) −0.5V to VCC+ 0.5V
O
)
O
or I
CC
)
GND
) −65˚C to +150˚C
STG
)
J
±
50 mA
±
50 mA
±
300 mA
CDIP 175˚C
Recommended Operating
Conditions
Supply Voltage (V
’ACTQ 4.5V to 5.5V
Input Voltage (V
Output Voltage (VO) 0VtoV
Operating Temperature (TA)
54ACTQ −55˚C to +125˚C
Minimum Input Edge Rate (dV/dt)
’ACTQ Devices 125 mV/ns
V
IN
V
CC
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recommend operation outside of databook specifications.
Note 2: All commercial packaging is not recommended for applications requiring greater than 2000 temperature cycles from −40˚C to +125˚C.
DC Characteristics for ’ACTQ Family Devices
54ACTQ
Symbol Parameter V
V
IH
Minimum High Level 4.5 2.0 V V
Input Voltage 5.5 2.0 or V
V
IL
Maximum Low Level 4.5 0.8 V V
Input Voltage 5.5 0.8 or V
V
OH
Minimum High Level 4.5 4.4 V I
Output Voltage 5.5 5.4
V
OL
Maximum Low Level 4.5 0.1 V I
Output Voltage 5.5 0.1
I
IN
Maximum Input 5.5
Leakage Current
I
CCT
I
OLD
I
OHD
I
CC
Maximum 5.5 1.6 mA V
I
/Input
CC
Minimum Dynamic 5.5 50 mA V
Output Current (Note 4) 5.5 −50 mA V
Maximum Quiescent 5.5 40.0 µA V
Supply Current or GND (Note 4)
CC
(V) −55˚C to +125˚C
Guaranteed Limits
4.5 3.70 V IOH= −24 mA
5.5 4.70 I
4.5 0.50 V IOL=24mA
5.5 0.50 I
(Note 2)
)
CC
) 0VtoV
I
from 0.8V to 2.0V
@
4.5V, 5.5V
=
T
A
±
1.0 µA V
Units Conditions
OUT
CC
OUT
CC
=
OUT
(Note 3)
=
V
IN
= −24 mA
OH
=
OUT
(Note 3)
=
V
IN
=24mA
OL
=
V
I
=
V
I
OLD
OHD
=
IN
=
0.1V
− 0.1V
=
0.1V
− 0.1V
−50 µA
or V
V
IL
50 µA
or V
V
IL
, GND
CC
− 2.1V
CC
=
1.65V Max
=
3.85V Min
V
CC
CC
CC
IH
IH
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