The NI 6509 is a 96-bit, high-drive digital input/output (I/O) device
for PCI, PXI, and CompactPCI chassis. The NI 6509 features
96 TTL/CMOS-compatible digital I/O lines, 24 mA high-drive output,
a watchdog timer, digital filtering, and programmable power-up states.
The NI 6509 device is completely software configurable, so it is not
necessary to set jumpers for I/O configuration.
The PCI-6509 device is fully compliant with the PCI Local Bus Specification, Revision 2.2, and the PXI-6509 device is fully compliant
with the PXI Hardware Specification, Revision 2.1. The PCI/PXI system
automatically allocates all device resources, including the base address
and interrupt level. The device base address is mapped into PCI memory
space. It is not necessary to perform configuration steps after the system
powers up.
Refer to the application software documentation for configuration
instructions.
After the NI 6509 device and the software are installed, the DAQ device
appears under the Devices and Interfaces branch of the MAX
configuration tree.
If the DAQ device does not appear in MAX, use the following
troubleshooting guidelines.
•Verify that you are using the correct version of NI-DAQ (NI-DAQ 7.1
or later). To download the most recent National Instruments drivers, go
to
ni.com/drivers.
•Press <F5> to refresh the MAX window, or close and re-open MAX.
•Reboot the computer.
•Power off and unplug the computer or chassis, and install the device in
a different slot. Refer to the DAQ Getting Started Guide for installation
instructions and safety guidelines.
•NI PCI-6509 devices must be installed into a slot that provides 3.3 V.
Check that the 3.3 V LED (reference designator DS1—located on the
visible edge of the underside of the installed device) is lit. If not, check
that the PC motherboard provides 3.3 V to the PCI bus.
NI 6509 User Guide and Specifications2ni.com
Programming Devices in Software
National Instruments measurement devices are packaged with NI-DAQ
driver software, an extensive library of functions and VIs you can call from
your application software, such as LabVIEW or LabWindows
program all the features of your NI measurement devices. Driver software
has an application programming interface (API), which is a library of VIs,
functions, classes, attributes, and properties for creating applications for
your device.
NI-DAQ 8.x includes two NI-DAQ drivers, Traditional NI-DAQ (Legacy)
and NI-DAQmx. Each driver has its own API, hardware configuration, and
software configuration. Refer to the DAQ Getting Started Guide for more
information about the two drivers.
Traditional NI-DAQ (Legacy) and NI-DAQmx each include a collection of
programming examples to help you get started developing an application.
You can modify example code and save it in an application. You can use
examples to develop a new application or add example code to an existing
application.
To locate LabVIEW and LabWindows/CVI examples, open the National
Instruments Example Finder:
•In LabVIEW, select Help»Find Examples.
•In LabWindows/CVI, select Help»NI Example Finder.
™
/CVI™, to
Measurement Studio, Visual Basic, and ANSI C examples are in the
following directories:
•NI-DAQmx examples for Measurement Studio-supported languages
are in the following directories:
–
MeasurementStudio\VCNET\Examples\NIDaq
–MeasurementStudio\DotNET\Examples\NIDaq
•Traditional NI-DAQ (Legacy) examples for Visual Basic are in the
following two directories:
NI-DAQ\Examples\Visual Basic with Measurement
–
Studio
directory contains a link to the ActiveX control examples
for use with Measurement Studio
–
NI-DAQ\Examples\VBasic directory contains the examples not
associated with Measurement Studio
•NI-DAQmx examples for ANSI C are in the
DAQmx ANSI C Dev
directory
NI-DAQ\Examples\
•Traditional NI-DAQ (Legacy) examples for ANSI C are in the
Figure 1 shows the key functional components of the NI 6509 device.
24 mA DIO
Tranceivers
Por t 0
Por t 1
Por t 2
Por t 3
Por t 4
Por t 5
96 DIO96 DIO
I/O Connector
Por t 6
Por t 7
Por t 8
Por t 9
Por t 10
Por t 11
10 MHz
Clock
Industrial Digital
I/O Control FPGA
Programmable
Power-Up States
Watchdog Timer
DIO Lines
Digital
Filtering
Change
Detection
Figure 1. NI 6509 Block Diagram
Flash
Memory
Data/Control
Configuration
Control
PCI Bus
Interface
Data/Control
PCI/PXI/CompactPCI Bus
Safety Information
The following section contains important safety information that you must
follow when installing and using National Instruments DIO devices.
Do not operate the device in a manner not specified in this help file. Misuse
of the DIO device can result in a hazard. You can compromise the safety
protection built into the DIO device if it is damaged in any way. If the DIO
device is damaged, return it to National Instruments for repair.
Do not substitute parts or modify the DIO device except as described in this
help file. Use the DIO device only with the chassis, modules, accessories,
and cables specified in the installation instructions. You must have all
covers and filler panels installed during operation of the DIO device.
Do not operate the DIO device in an explosive atmosphere or where there
may be flammable gases or fumes. If you must operate the DIO device in
such an environment, it must be in a suitably rated enclosure.
NI 6509 User Guide and Specifications4ni.com
If you need to clean the DIO device, use a soft, nonmetallic brush. Make
sure that the DIO device is completely dry and free from contaminants
before returning it to service.
Operate the DIO device only at or below Pollution Degree 2. Pollution is
foreign matter in a solid, liquid, or gaseous state that can reduce dielectric
strength or surface resistivity. The following is a description of pollution
degrees:
•Pollution Degree 1 means no pollution or only dry, nonconductive
pollution occurs. The pollution has no influence.
•Pollution Degree 2 means that only nonconductive pollution occurs in
most cases. Occasionally, however, a temporary conductivity caused
by condensation must be expected.
•Pollution Degree 3 means that conductive pollution occurs, or dry,
nonconductive pollution occurs that becomes conductive due to
condensation.
You must insulate signal connections for the maximum voltage for which
the DIO device is rated. Do not exceed the maximum ratings for the DIO
device. Do not install wiring while the DIO device is live with electrical
signals. Do not remove or add connector blocks when power is connected
to the system. Avoid contact between your body and the connector block
signal when hot swapping modules. Remove power from signal lines
before connecting them to or disconnecting them from the DIO device.
Operate the DIO device at or below the measurement category
1
marked
on the hardware label. Measurement circuits are subjected to working
voltages
2
and transient stresses (overvoltage) from the circuit to which they
are connected during measurement or test. Installation categories establish
standard impulse withstand voltage levels that commonly occur in
electrical distribution systems. The following is a description of installation
categories:
•Measurement Category I is for measurements performed on circuits
not directly connected to the electrical distribution system referred to
as MAINS
3
voltage. This category is for measurements of voltages
from specially protected secondary circuits. Such voltage
measurements include signal levels, special equipment, limited-energy
parts of equipment, circuits powered by regulated low-voltage sources,
and electronics.
1
Measurement categories, also referred to as installation categories, are defined in electrical safety standard IEC 61010-1.
2
Working voltage is the highest rms value of an AC or DC voltage that can occur across any particular insulation.
3
MAINS is defined as a hazardous live electrical supply system that powers equipment. Suitably rated measuring circuits may
be connected to the MAINS for measuring purposes.
•Measurement Category II is for measurements performed on circuits
directly connected to the electrical distribution system. This category
refers to local-level electrical distribution, such as that provided by a
standard wall outlet (for example, 115 V for U.S. or 230 V for Europe).
Examples of Measurement Category II are measurements performed
on household appliances, portable tools, and similar DIO devices.
•Measurement Category III is for measurements performed in the
building installation at the distribution level. This category refers to
measurements on hard-wired equipment such as equipment in fixed
installations, distribution boards, and circuit breakers. Other examples
are wiring, including cables, bus-bars, junction boxes, switches,
socket-outlets in the fixed installation, and stationary motors with
permanent connections to fixed installations.
•Measurement Category IV is for measurements performed at the
primary electrical supply installation (<1,000 V). Examples include
electricity meters and measurements on primary overcurrent
protection devices and on ripple control units.
Related Documentation
The following documents contain information that you may find helpful as
you use this user guide:
•DAQ Getting Started Guide—This guide describes how to install the
NI-DAQ software, the DAQ device, and how to confirm that the device
is operating properly.
•NI-DAQmx Help—This help file contains information about using
NI-DAQmx to program National Instruments devices. NI-DAQmx
is the software you use to communicate with and control NI DAQ
devices.
•Measurement & Automation Explorer Help for NI-DAQmx—This
help file contains information about configuring and testing DAQ
devices using Measurement & Automation Explorer (MAX) for
NI-DAQmx, and information about special considerations for
operating systems.
•DAQ Assistant Help—This help file contains information about
creating and configuring channels, tasks, and scales using the
DAQ Assistant.
Note You can download these documents from ni.com/manuals.
NI 6509 User Guide and Specifications6ni.com
Features
Digital Filtering
The NI 6509 features digital filtering, programmable power-up states,
change detection, and a watchdog timer.
Use the digital filter option available on the NI 6509 input lines to eliminate
glitches on input data. When used with change detection, filtering can also
reduce the number of changes to examine and process.
You can configure the digital input channels to pass through a digital filter,
and you can control the timing interval the filter uses. The filter blocks
pulses that are shorter than half of the specified timing interval and passes
pulses that are longer than the specified interval. Intermediate-length
pulses—pulses longer than half of the interval but less than the
interval—may or may not pass the filter.
Table 1 lists the pulse widths guaranteed to be passed and blocked.
Table 1. NI 6509 Digital Filtering
Pulse Width PassedPulse Width Blocked
Filter Interval
t
interval
Low PulseHigh PulseLow PulseHigh Pulse
t
interval
t
interval
t
/2t
interval
interval
/2
You can enable filtering on as many input lines as necessary for your
application. All filtered lines share the same timing interval, which ranges
from 400 ns to 200 ms.
Internally, the filter uses two clocks: the sample clock and the filter clock.
The sample clock has a 100 ns period. The filter clock is generated by a
counter and has a period equal to one half of the specified timing interval.
The input signal is sampled on each rising edge of the sample clock, which
is every 100 ns. However, a change in the input signal is recognized only
if it maintains its new state for at least two consecutive rising edges of the
filter clock.
The filter clock is programmable and allows you to control how long a
pulse must last to be recognized. The sample clock provides a fast sample
rate to ensure that input pulses remain constant between filter clocks.