National Instruments E Series User Manual

DAQ E Series

E Series User Manual

E Series User Manual
February 2007 370503K-01

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Important Information

Warranty

The E Series devices are warranted against defects in materials and workmanship for a period of one year from the date of shipment, as evidenced by receipts or other documentation. National Instruments will, at its option, repair or replace equipment that proves to be defective during the warranty period. This warranty includes parts and labor.
The media on which you receive National Instruments software are warranted not to fail to execute programming instructions, due to defects in materials and workmanship, for a period of 90 days from date of shipment, as evidenced by receipts or other documentation. National Instruments will, at its option, repair or replace software media that do not execute programming instruc tions if National Instruments receives notice of such defects during the warranty period. National Instruments does not warrant that the operation of the software shall be uninterrupted or error free.
A Return Material Authorization (RMA) number must be obtained from the factory and clearly marked on the outside of the package before any equipment will be accepted for warranty work. National Instruments will pay the shipping costs of returning to the owner parts which are covered by warranty.
National Instruments believes that the information in this document is accurate. The document has been carefully reviewed for technical accuracy. In the event that technical or typographical errors exist, National Instruments reserves the right to make changes to subsequent editions of this document without prior notice to holders of this edition. The reader should consult National Instruments if errors are suspected. In no event shall National Instruments be liable for any damages arising out of or related to this document or the information contained in it.
E
XCEPT AS SPECIFIED HEREIN, NATIONAL INSTRUMENTS MAKES NO WARRANTIES, EXPRESS OR IMPLIED, AND SPECIFICALLY DISCLAIMS ANY WARRANTY OF
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(1) NATIONAL INSTRUMENTS PRODUCTS ARE NOT DESIGNED WITH COMPONENTS AND TESTING FOR A LEVEL OF RELIABILITY SUITABLE FOR USE IN OR IN CONNECTION WITH SURGICAL IMPLANTS OR AS CRITICAL COMPONENTS IN ANY LIFE SUPPORT SYSTEMS WHOSE FAILURE TO PERFORM CAN REASONABLY BE EXPECTED TO CAUSE SIGNIFICANT INJURY TO A HUMAN.
(2) IN ANY APPLICATION, INCLUDING THE ABOVE, RELIABILITY OF OPERATION OF THE SOFTWARE PRODUCTS CAN BE IMPAIRED BY ADVERSE FACTORS, INCLUDING BUT NOT LIMITED TO FLUCTUATIONS IN ELECTRICAL POWER SUPPLY, COMPUTER HARDWARE MALFUNCTIONS, COMPUTER OPERATING SYSTEM SOFTWARE FITNESS, FITNESS OF COMPILERS AND DEVELOPMENT SOFTWARE USED TO DEVELOP AN APPLICATION, INSTALLATION ERRORS, SOFTWARE AND HARDWARE COMPATIBILITY PROBLEMS, MALFUNCTIONS OR FAILURES OF ELECTRONIC MONITORING OR CONTROL DEVICES, TRANSIENT FAILURES OF ELECTRONIC SYSTEMS (HARDWARE AND/OR SOFTWARE), UNANTICIPATED USES OR MISUSES, OR ERRORS ON THE PART OF THE USER OR APPLICATIONS DESIGNER (ADVERSE FACTORS SUCH AS THESE ARE HEREAFTER COLLECTIVELY TERMED “SYSTEM FAILURES”). ANY APPLICATION WHERE A SYSTEM FAILURE WOULD CREATE A RISK OF HARM TO PROPERTY OR PERSONS (INCLUDING THE RISK OF BODILY INJURY AND DEATH) SHOULD NOT BE RELIANT SOLELY UPON ONE FORM OF ELECTRONIC SYSTEM DUE TO THE RISK OF SYSTEM FAILURE. TO AVOID DAMAGE, INJURY, OR DEATH, THE USER OR APPLICATION DESIGNER MUST TAKE REASONABLY PRUDENT STEPS TO PROTECT AGAINST SYSTEM FAILURES, INCLUDING BUT NOT LIMITED TO BACK-UP OR SHUT DOWN MECHANISMS. BECAUSE EACH END-USER SYSTEM IS CUSTOMIZED AND DIFFERS FROM NATIONAL INSTRUMENTS' TESTING PLATFORMS AND BECAUSE A USER OR APPLICATION DESIGNER MAY USE NATIONAL INSTRUMENTS PRODUCTS IN COMBINATION WITH OTHER PRODUCTS IN A MANNER NOT EVALUATED OR CONTEMPLATED BY NATIONAL INSTRUMENTS, THE USER OR APPLICATION DESIGNER IS ULTIMATELY RESPONSIBLE FOR VERIFYING AND VALIDATING THE SUITABILITY OF NATIONAL INSTRUMENTS PRODUCTS WHENEVER NATIONAL INSTRUMENTS PRODUCTS ARE INCORPORATED IN A SYSTEM OR APPLICATION, INCLUDING, WITHOUT LIMITATION, THE APPROPRIATE DESIGN, PROCESS AND SAFETY LEVEL OF SUCH SYSTEM OR APPLICATION.
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Compliance with FCC/Canada Radio Frequency Interference Regulations
Determining FCC Class
The Federal Communications Commission (FCC) has rules to protect wireless communications from interference. The FCC places digital electronics into two classes. These classes are known as Class A (for use in industrial commercial locations only) or Class B (for use in residential or commercial locations). All National Instruments (NI) products are FCC Class A products.
Depending on where it is operated, this Class A product could be subject to restrictions in the FCC rules. (In Canada, the Department of Communications (DOC), of Industry Canada, regulates wireless interference in much the same way.) Digital electronics emit weak signals during normal operation that can affect radio, television, or other wireless products.
All Class A products display a simple warning statement of one paragraph in length regarding interference and undesired operation. The FCC rules have restrictions regarding the locations where FCC Class A products can be operated.
Consult the FCC Web site at
FCC/DOC Warnings
This equipment generates and uses radio frequency energy and, if not installed and used in strict accordance with the instructions in this manual and the CE marking Declaration of Conformity*, may cause interference to radio and television reception. Classification requirements are the same for the Federal Communications Commission (FCC) and the Canadian Department of Communications (DOC).
Changes or modifications not expressly approved by NI could void the user’s authority to operate the equipment under the FCC Rules.
Class A
Federal Communications Commission
This equipment has been tested and found to comply with the limits for a Class A digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference when the equipment is operated in a commercial environment. This equipment generates, uses, and can radiate radio frequency energy and, if not installed and used in accordance with the instruction manual, may cause harmful interference to radio communications. Operation of this equipment in a residential area is likely to cause harmful interference in which case the user is required to correct the interference at their own expense.
www.fcc.gov for more information.
Canadian Department of Communications
This Class A digital apparatus meets all requirements of the Canadian InterferenceCausing Equipment Regulations. Cet appareil numérique de la classe A respecte toutes les exigences du Règlement sur le matériel brouilleur du Canada.
Compliance with EU Directives
Users in the European Union (EU) should refer to the Declaration of Conformity (DoC) for information* pertaining to the CE marking. Refer to the Declaration of Conformity (DoC) for this product for any additional regulatory compliance information. To obtain the DoC for this product, visit and click the appropriate link in the Certification column.
* The CE marking Declaration of Conformity contains important supplementary information and instructions for the user or
installer.
ni.com/certification, search by model number or product line,

Contents

About This Manual
Conventions ...................................................................................................................xv
Related Documentation..................................................................................................xvi
NI-DAQ for Windows.....................................................................................xvi
NI-DAQmx for Linux......................................................................................xvi
NI-DAQmx Base.............................................................................................xvii
LabVIEW ........................................................................................................xvii
LabWindows/CVI............................................................................................xviii
Measurement Studio........................................................................................xviii
ANSI C without NI Application Software ......................................................xix
.NET Languages without NI Application Software ........................................xix
Device Documentation and Specifications......................................................xx
Training Courses .............................................................................................xx
Technical Support on the Web ........................................................................xx
Chapter 1 DAQ System Overview
DAQ Hardware ..............................................................................................................1-2
DAQ-STC........................................................................................................1-3
Calibration Circuitry........................................................................................1-3
Internal or Self-Calibration ...............................................................1-4
External Calibration ..........................................................................1-4
Signal Conditioning .......................................................................................................1-4
Sensors and Transducers .................................................................................1-4
Signal Conditioning Options ...........................................................................1-5
SCXI..................................................................................................1-5
SCC ...................................................................................................1-6
5B Series ...........................................................................................1-6
Cables and Accessories..................................................................................................1-6
Using Accessories with Devices .....................................................................1-7
Custom Cabling ...............................................................................................1-9
Programming Devices in Software ................................................................................1-10
I/O Connector Signal Descriptions ................................................................................1-11
Terminal Name Equivalents ..........................................................................................1-14
+5 V Power Source ........................................................................................................1-16
© National Instruments Corporation vii E Series User Manual
Contents
Chapter 2 Analog Input
Analog Input Circuitry .................................................................................................. 2-1
Input Polarity and Range ............................................................................................... 2-2
Analog Input Terminal Configuration........................................................................... 2-5
Dither............................................................................................................................. 2-8
Multichannel Scanning Considerations ......................................................................... 2-9
Analog Input Triggering................................................................................................ 2-14
Connecting Analog Input Signals.................................................................................. 2-20
Mux ................................................................................................................. 2-1
Instrumentation Amplifier (NI-PGIA) ............................................................ 2-2
A/D Converter................................................................................................. 2-2
AI FIFO........................................................................................................... 2-2
Analog Trigger................................................................................................ 2-2
AI Timing Signals........................................................................................... 2-2
Use Low Impedance Sources.......................................................................... 2-10
Use Short High-Quality Cabling.....................................................................2-11
Carefully Choose the Channel Scanning Order ..............................................2-11
Avoid Switching from a Large to a Small Input Range ................... 2-11
Insert Grounded Channel between Signal Channels ........................ 2-11
Minimize Voltage Step between Adjacent Channels ....................... 2-12
Avoid Scanning Faster than Necessary........................................................... 2-12
Example 1 ......................................................................................... 2-12
Example 2 ......................................................................................... 2-13
AI Data Acquisition Methods .........................................................................2-13
Software-Timed Acquisitions........................................................... 2-13
Hardware-Timed Acquisitions ......................................................... 2-13
AI Start Trigger Signal.................................................................................... 2-15
Using a Digital Source...................................................................... 2-15
Using an Analog Source ................................................................... 2-15
Outputting the AI Start Trigger Signal ........................................................... 2-16
AI Reference Trigger Signal ........................................................................... 2-16
Using a Digital Source...................................................................... 2-18
Using an Analog Source ................................................................... 2-18
Outputting the AI Reference Trigger Signal .................................... 2-18
AI Pause Trigger Signal.................................................................................. 2-19
Using a Digital Source...................................................................... 2-19
Using an Analog Source ................................................................... 2-19
Types of Signal Sources.................................................................................. 2-22
Floating Signal Sources .................................................................... 2-22
Ground-Referenced Signal Sources.................................................. 2-22
E Series User Manual viii ni.com
Contents
Differential Connection Considerations ........................................................................2-22
Differential Connections for Ground-Referenced Signal Sources ..................2-23
Common-Mode Signal Rejection Considerations.............................2-24
Differential Connections for Non-Referenced or
Floating Signal Sources................................................................................2-24
Single-Ended Connection Considerations .....................................................................2-26
Common-Mode Signal Rejection Considerations ...........................................2-26
Single-Ended Connections for Floating Signal Sources
(RSE Configuration).....................................................................................2-27
Single-Ended Connections for Grounded Signal Sources
(NRSE Configuration)..................................................................................2-27
Field Wiring Considerations..........................................................................................2-28
Configuring AI Modes in Software ...............................................................................2-29
Traditional NI-DAQ (Legacy).........................................................................2-29
NI-DAQmx......................................................................................................2-29
Analog Input Timing Signals.........................................................................................2-30
AI Start Trigger Signal ....................................................................................2-32
Using a Digital Source ......................................................................2-33
Using an Analog Source ...................................................................2-33
Outputting the AI Start Trigger Signal .............................................2-33
AI Reference Trigger Signal ...........................................................................2-34
Using a Digital Source ......................................................................2-35
Using an Analog Source ...................................................................2-36
Outputting the AI Reference Trigger Signal.....................................2-36
AI Pause Trigger Signal ..................................................................................2-36
Using a Digital Source ......................................................................2-36
Using an Analog Source ...................................................................2-37
AI Sample Clock Signal ..................................................................................2-37
Using an Internal Source...................................................................2-37
Using an External Source..................................................................2-37
Outputting the AI Sample Clock Signal ...........................................2-38
Other Timing Requirements..............................................................2-39
AI Sample Clock Timebase Signal..................................................................2-40
AI Convert Clock Signal .................................................................................2-41
Using an Internal Source...................................................................2-41
Using an External Source..................................................................2-42
Outputting the AI Convert Clock Signal...........................................2-42
Using a Delay from Sample Clock to Convert Clock.......................2-43
Other Timing Requirements..............................................................2-43
AI Convert Clock Timebase Signal.................................................................2-45
Master Timebase Signal ..................................................................................2-45
AI Hold Complete Event Signal......................................................................2-46
External Strobe Signal.....................................................................................2-46
Getting Started with AI Applications in Software.........................................................2-47
© National Instruments Corporation ix E Series User Manual
Contents
Chapter 3 Analog Output
Analog Output Circuitry................................................................................................ 3-1
DACs............................................................................................................... 3-1
DAC FIFO....................................................................................................... 3-1
AO Sample Clock ........................................................................................... 3-2
Polarity and Reference Selection .................................................................... 3-2
Reference Selection ....................................................................................................... 3-2
Polarity Selection........................................................................................................... 3-3
Reglitch Selection.......................................................................................................... 3-3
Minimizing Glitches on the Output Signal.................................................................... 3-3
AO Data Generation Methods ....................................................................................... 3-4
Software-Timed Generations .......................................................................... 3-4
Hardware-Timed Generations......................................................................... 3-4
Analog Output Triggering .............................................................................................3-5
AO Start Trigger Signal .................................................................................. 3-6
AO Pause Trigger Signal ................................................................................ 3-7
Connecting Analog Output Signals ............................................................................... 3-8
Waveform Generation Timing Signals.......................................................................... 3-9
AO Start Trigger Signal .................................................................................. 3-9
AO Pause Trigger Signal ................................................................................3-10
AO Sample Clock Signal ................................................................................ 3-11
AO Sample Clock Timebase Signal................................................................ 3-13
Master Timebase Signal.................................................................................. 3-14
Getting Started with AO Applications in Software....................................................... 3-15
Buffered ............................................................................................ 3-4
Non-Buffered.................................................................................... 3-5
Using a Digital Source...................................................................... 3-6
Using an Analog Source ................................................................... 3-6
Outputting the AO Start Trigger Signal ...........................................3-6
Using a Digital Source...................................................................... 3-7
Using an Analog Source ................................................................... 3-7
Using a Digital Source...................................................................... 3-9
Using an Analog Source ................................................................... 3-10
Outputting the AO Start Trigger Signal ...........................................3-10
Using a Digital Source...................................................................... 3-10
Using an Analog Source ................................................................... 3-11
Using an Internal Source .................................................................. 3-11
Using an External Source ................................................................. 3-11
Outputting the AO Sample Clock Signal ......................................... 3-12
Other Timing Requirements ............................................................. 3-12
E Series User Manual x ni.com
Chapter 4 Digital I/O
Extended Digital I/O......................................................................................................4-2
Power-On States of the PFI and DIO Lines...................................................................4-9
Connecting Digital I/O Signals......................................................................................4-9
Getting Started with DIO Applications in Software......................................................4-10
Chapter 5 Counters
Counter Triggering ........................................................................................................5-1
Counter Timing Signals.................................................................................................5-2
Getting Started with Counter Applications in Software ................................................5-10
Contents
Port 3 Signal Assignments...............................................................................4-2
Power-On State................................................................................................4-3
Changing DIO Power-On State to Pulled Low .................................4-3
Timing Specifications......................................................................................4-4
Mode 1 Input Timing.......................................................................................4-6
Mode 1 Output Timing....................................................................................4-7
Mode 2 Bidirectional Timing ..........................................................................4-8
Start Trigger.....................................................................................................5-1
Pause Trigger...................................................................................................5-2
Counter 0 Source Signal..................................................................................5-3
Counter 0 Gate Signal .....................................................................................5-4
Counter 0 Internal Output Signal ....................................................................5-5
CTR 0 OUT Pin ................................................................................5-6
Counter 0 Up/Down Signal .............................................................................5-6
Counter 1 Source Signal..................................................................................5-6
Counter 1 Gate Signal .....................................................................................5-7
Counter 1 Internal Output Signal ....................................................................5-8
Counter 1 Up/Down Signal .............................................................................5-9
Frequency Output Signal.................................................................................5-9
Master Timebase Signal ..................................................................................5-9
Chapter 6 Programmable Function Interfaces (PFI)
Inputs .............................................................................................................................6-1
Outputs...........................................................................................................................6-1
© National Instruments Corporation xi E Series User Manual
Contents
Chapter 7 Digital Routing
Timing Signal Routing .................................................................................................. 7-1
Connecting Timing Signals ...........................................................................................7-4
Routing Signals in Software.......................................................................................... 7-5
Chapter 8 Real-Time System Integration Bus (RTSI)
RTSI Triggers................................................................................................................ 8-1
PCI E Series Devices ...................................................................................... 8-1
PXI E Series Devices ...................................................................................... 8-2
Device and RTSI Clocks ............................................................................................... 8-4
Synchronizing Multiple Devices ................................................................................... 8-4
Chapter 9 Bus Interface
MITE and DAQPnP ...................................................................................................... 9-1
Using PXI with CompactPCI ........................................................................................ 9-1
Data Transfer Methods .................................................................................................. 9-2
Direct Memory Access (DMA)....................................................................... 9-2
Interrupt Request (IRQ) .................................................................................. 9-2
Programmed I/O.............................................................................................. 9-2
Changing Data Transfer Methods between DMA and IRQ............................ 9-3
Chapter 10 Triggering
Triggering with a Digital Source................................................................................... 10-1
Triggering with an Analog Source ................................................................................ 10-2
PFI 0/AI START TRIG Pin ............................................................................ 10-3
Analog Input Channel ..................................................................................... 10-3
Analog Trigger Actions .................................................................................. 10-3
Analog Trigger Types.................................................................................................... 10-4
Level Triggering ............................................................................................. 10-4
Level Triggering with Hysteresis.................................................................... 10-5
Window Triggering......................................................................................... 10-5
Analog Trigger Accuracy ..............................................................................................10-6
Appendix A Device-Specific Information
E Series User Manual xii ni.com
Appendix B I/O Connector Pinouts
Appendix C Troubleshooting
Appendix D Technical Support and Professional Services
Glossary
Index
Contents
© National Instruments Corporation xiii E Series User Manual

About This Manual

The E Series User Manual contains information about using the National Instruments E Series and several B Series data acquisition (DAQ) devices with NI-DAQ 8.0 or later. E Series devices feature up to 64 analog input (AI) channels, two counters, eight or 32 lines of digital input/output (DIO), and up to two analog output (AO) channels. The B Series devices discussed in this document are similar to E Series devices, but do not support SCXI, RTSI, or referenced single-ended AI mode.
Conventions
The following conventions are used in this manual:
<> Angle brackets indicate function keys. Angle brackets that contain numbers
separated by an ellipsis represent a range of values associated with a bit or signal name—for example, P0.<3..0>.
» The » symbol leads you through nested menu items and dialog box options
to a final action. The sequence File»Page Setup»Options directs you to pull down the File menu, select the Page Setup item, and select Options from the last dialog box.
This icon denotes a note, which alerts you to important information.
This icon denotes a caution, which advises you of precautions to take to avoid injury, data loss, or a system crash. When this symbol is marked on the product, refer to the Read Me First: Safety and Radio-Frequency Interference document shipped with the product for precautions to take.
bold Bold text denotes items that you must select or click in the software, such
as menu items and dialog box options. Bold text also denotes parameter names.
italic Italic text denotes variables, emphasis, a cross-reference, or an introduction
to a key concept. Italic text also denotes text that is a placeholder for a word or value that you must supply.
monospace Text in this font denotes text or characters you should enter from the
keyboard, the proper names of disk drives, paths, directories, programs, functions, filenames, and extensions.
© National Instruments Corporation xv E Series User Manual
About This Manual
monospace italic
Platform Text in this font denotes a specific platform and indicates that the text
Italic text in this font denotes text that is a placeholder for a word or value that you must supply.
following it applies only to that platform.
Related Documentation
Each application software package and driver includes information about writing applications for taking measurements and controlling measurement devices. The following references to documents assume you have NI-DAQ 8.0 or later, and where applicable, version 7.0 or later of the NI application software.
NI-DAQ for Windows
The DAQ Getting Started Guide describes how to install your NI-DAQmx for Windows software, how to install your NI-DAQmx-supported DAQ device, and how to confirm that your device is operating properly. Select
Start»All Programs»National Instruments»NI-DAQ»DAQ Getting Started Guide.
The NI-DAQ Readme lists which devices are supported by this version of NI-DAQ. Select Start»All Programs»National Instruments»NI-DAQ» NI-DAQ Readme.
The NI-DAQmx Help contains general information about measurement concepts, key NI-DAQmx concepts, and common applications that are applicable to all programming environments. Select Start»All Programs» National Instruments»NI-DAQ»NI-DAQmx Help.
The Traditional NI-DAQ (Legacy) User Manual contains an API overview and general information about measurement concepts. Select Start»All
Programs»National Instruments»NI-DAQ»Traditional NI-DAQ (Legacy) User Manual.
NI-DAQmx for Linux
The DAQ Getting Started Guide describes how to install your NI-DAQmx-supported DAQ device and confirm that your device is operating properly.
E Series User Manual xvi ni.com
Note All NI-DAQmx documentation for Linux is installed at /usr/local/natinst/
NI-DAQmx/docs
NI-DAQmx Base
About This Manual
The NI-DAQ Readme for Linux lists supported devices and includes software installation instructions, frequently asked questions, and known issues.
The C Function Reference Help describes functions and attributes.
The NI-DAQmx for Linux Configuration Guide provides configuration instructions, templates, and instructions for using test panels.
.
The NI-DAQmx Base Getting Started Guide describes how to install your NI-DAQmx Base software, your NI-DAQmx Base-supported DAQ device, and how to confirm that your device is operating properly. Select Start»All
Programs»National Instruments»NI-DAQmx Base»Documentation» Getting Started Guide.
The NI-DAQmx Base Readme lists which devices are supported by this version of NI-DAQmx Base. Select Start»All Programs»National Instruments»NI-DAQmx Base»DAQmx Base Readme.
The NI-DAQmx Base VI Reference Help contains VI reference and general information about measurement concepts. In LabVIEW, select Help» NI-DAQmx Base VI Reference Help.
The NI-DAQmx Base C Reference Help contains C reference and general information about measurement concepts. Select Start»All Programs»
National Instruments»NI-DAQmx Base»Documentation»C Function Reference Help.
LabVIEW
If you are a new user, use the Getting Started with LabVIEW manual to familiarize yourself with the LabVIEW graphical programming environment and the basic LabVIEW features you use to build data acquisition and instrument control applications. Open the Getting Started
with LabVIEW manual by selecting Start»All Programs»National Instruments»LabVIEW»LabVIEW Manuals or by navigating to the
labview\manuals directory and opening LV_Getting_Started.pdf.
Use the LabVIEW Help, available by selecting Help»Search the LabVIEW Help in LabVIEW, to access information about LabVIEW
© National Instruments Corporation xvii E Series User Manual
About This Manual
LabWindows/CVI
programming concepts, step-by-step instructions for using LabVIEW, and reference information about LabVIEW VIs, functions, palettes, menus, and tools. Refer to the following locations on the Contents tab of the LabVIEW Help for information about NI-DAQmx:
Getting Started»Getting Started with DAQ—Includes overview
information and a tutorial to learn how to take an NI-DAQmx measurement in LabVIEW using the DAQ Assistant.
VI and Function Reference»Measurement I/O VIs and Functions—Describes the LabVIEW NI-DAQmx VIs and properties.
Taking Measurements—Contains the conceptual and how-to information you need to acquire and analyze measurement data in LabVIEW, including common measurements, measurement fundamentals, NI-DAQmx key concepts, and device considerations.
The Data Acquisition book of the LabWindows/CVI Help contains measurement concepts for NI-DAQmx. This book also contains Taking an NI-DAQmx Measurement in LabWindows/CVI, which includes step-by-step instructions about creating a measurement task using the DAQ Assistant. In LabWindows Using LabWindows/CVI»Data Acquisition.
/CVI™, select Help»Contents, then select
The NI-DAQmx Library book of the LabWindows/CVI Help contains API overviews and function reference for NI-DAQmx. Select Library Reference»NI-DAQmx Library in the LabWindows/CVI Help.
Measurement Studio
If you program your NI-DAQmx-supported device in Measurement Studio using Visual C++, Visual C#, or Visual Basic .NET, you can interactively create channels and tasks by launching the DAQ Assistant from MAX or from within Visual Studio .NET. You can generate the configuration code based on your task or channel in Measurement Studio. Refer to the DAQ Assistant Help for additional information about generating code. You also can create channels and tasks, and write your own applications in your ADE using the NI-DAQmx API.
For help with NI-DAQmx methods and properties, refer to the NI-DAQmx .NET Class Library or the NI-DAQmx Visual C++ Class Library included in the NI Measurement Studio Help. For general help with programming in Measurement Studio, refer to the NI Measurement Studio Help, which is fully integrated with the Microsoft Visual Studio .NET help. To view
E Series User Manual xviii ni.com
this help file in Visual Studio. NET, select Measurement Studio» NI Measurement Studio Help.
To create an application in Visual C++, Visual C#, or Visual Basic .NET, follow these general steps:
1. In Visual Studio .NET, select File»New»Project to launch the New
Project dialog box.
2. Find the Measurement Studio folder for the language you want to create a program in.
3. Choose a project type. You add DAQ tasks as a part of this step.
The Measurement Studio Reference contains the Traditional NI-DAQ (Legacy) API overview, measurement concepts, and function reference. In Visual Studio .NET, select Measurement Studio»Measurement Studio Reference.
ANSI C without NI Application Software
The Traditional NI-DAQ (Legacy) User Manual and the NI-DAQmx Help contain API overviews. The NI-DAQmx Help also contains general information about measurement concepts. Traditional NI-DAQ (Legacy) Function Reference Help and NI-DAQmx C Reference Help describe the C functions and attributes. Select Start»All Programs»National Instruments»NI-DAQ and the document title for the NI-DAQ API you are using.
About This Manual
.NET Languages without NI Application Software
With the Microsoft .NET Framework version 1.1 or later, you can use NI-DAQmx to create applications using Visual C# and Visual Basic .NET without Measurement Studio. You need Microsoft Visual Studio .NET 2003 or Microsoft Visual Studio 2005 for the API documentation to be installed.
The installed documentation contains the NI-DAQmx API overview, measurement tasks and concepts, and function reference. This help is fully integrated into the Visual Studio .NET documentation. To view the NI-DAQmx .NET documentation, go to Start»Programs»National
Instruments»NI-DAQ»NI-DAQmx .NET Reference Help. Expand NI Measurement Studio Help»NI Measurement Studio .NET Class Library»Reference to view the function reference. Expand NI Measurement Studio Help»NI Measurement Studio .NET Class Library»Using the Measurement Studio .NET Class Libraries to view
© National Instruments Corporation xix E Series User Manual
About This Manual
conceptual topics for using NI-DAQmx with Visual C# and Visual Basic .NET.
To get to the same help topics from within Visual Studio, go to Help» Contents. Select Measurement Studio from the Filtered By drop-down list and follow the previous instructions.
Device Documentation and Specifications
NI-DAQmx includes the Device Document Browser, which contains online documentation for supported DAQ and SCXI devices, such as documents describing device pinouts, features, and operation. You can find, view, and/or print the documents for each device using the Device Document Browser at any time by inserting the CD. After installing the Device Document Browser, device documents are accessible from Start»
All Programs»National Instruments»NI-DAQ»Browse Device Documentation.
Training Courses
If you need more help getting started developing an application with NI products, NI offers training courses. To enroll in a course or obtain a detailed course outline, refer to
ni.com/training.
Technical Support on the Web
For additional support, refer to ni.com/support or zone.ni.com.
Note You can download these documents at ni.com/manuals.
DAQ specifications and some DAQ manuals are available as PDFs. You must have Adobe Acrobat Reader with Search and Accessibility 5.0.5 or later installed to view the PDFs. Refer to the Adobe Systems Incorporated Web site at National Instruments Product Manuals Library at updated documentation resources.
E Series User Manual xx ni.com
www.adobe.com to download Acrobat Reader. Refer to the
ni.com/manuals for
DAQ System Overview
Figure 1-1 shows a typical DAQ system setup, which includes transducers, signal conditioning, cables that connect the various devices to the accessories, the E Series device, and the programming software. Refer to the Using Accessories with Devices section for a list of devices and their compatible accessories.
1
© National Instruments Corporation 1-1 E Series User Manual
Chapter 1 DAQ System Overview
5
4
3
6
7
+ V
2
1 Sensors and Transducers 2 Terminal Block Accessory 3 SCXI Module 4 SCXI Chassis
+
HV
5 Cable Assembly 6DAQ Device 7 Personal Computer
+
1
+
mV

Figure 1-1. DAQ System Overview

DAQ Hardware

DAQ hardware digitizes signals, performs D/A conversions to generate analog output signals, and measures and controls digital I/O signals.
E Series User Manual 1-2 ni.com

DAQ-STC

Chapter 1 DAQ System Overview
E Series devices use the National Instruments DAQ system timing controller (DAQ-STC) for time-related functions. The DAQ-STC consists of the following timing groups.
AI—Two 24-bit, two 16-bit counters
AO—Three 24-bit, one 16-bit counter
General-purpose counter/timer functions —Two 24-bit counters
You can independently configure the groups for timing resolutions of 50 ns or 10 μs. With the DAQ-STC, you can interconnect a wide variety of internal timing signals to other internal blocks. The interconnection scheme is flexible and completely software-configurable.
The DAQ-STC offers PFI lines to import external timing and trigger signals or to export internally generated clocks and triggers. The DAQ-STC also supports buffered operations, such as buffered waveform acquisition, buffered waveform generation, and buffered period measurement. It also supports numerous non-buffered operations, such as single pulse or pulse train generation, digital input, and digital output.

Calibration Circuitry

Calibration is the process of making adjustments to a measurement device to reduce errors associated with measurements. Without calibration, the measurement results of your device will drift over time and temperature. Calibration adjusts for these changes to improve measurement accuracy and ensure that your product meets its required specifications.
DAQ devices have high precision analog circuits that must be adjusted to obtain optimum accuracy in your measurements. Calibration determines what adjustments these analog circuits should make to the device measurements. During calibration, the value of a known, high precision measurement source is compared to the value your device acquires or generates. The adjustment values needed to minimize the difference between the known and measured values are stored in the EEPROM of the device as calibration constants. Before performing a measurement, these constants are read out of the EEPROM and are used to adjust the calibration hardware on the device. NI-DAQ determines when this is necessary and does it automatically. If you are not using NI-DAQ, you must load these values yourself.
You can calibrate E Series devices using either internal calibration or external calibration.
© National Instruments Corporation 1-3 E Series User Manual
Chapter 1 DAQ System Overview
Internal or Self-Calibration
Self-calibration is a process to adjust the device relative to a highly accurate and stable internal reference on the device. Self-calibration is similar to the auto-calibration or auto-zero found on some instruments. You should perform a self-calibration whenever environmental conditions, such as ambient temperature, change significantly. To perform self-calibration, use the self-calibrate function or VI that is included with your driver software. Self-calibration requires no external connections.
External Calibration
External calibration is a process to adjust the device relative to a traceable, high precision calibration standard. The accuracy specifications of your device change depending on how long it has been since your last external calibration. National Instruments recommends that you calibrate your device at least as often as the intervals listed in the accuracy specifications.
For a detailed calibration procedure for E Series devices (and B Series devices such as the NI 6013, NI 6014, NI 6015, and NI 6016) using NI-DAQmx, refer to the E/S/M/B Series Calibration Procedure for NI-DAQmx. For a detailed calibration procedure for B/E Series devices using Traditional NI-DAQ (Legacy), refer to the E Series Calibration
Procedure. These documents can be found by selecting Manual Calibration Procedures at
ni.com/calibration.

Signal Conditioning

Many sensors and transducers require signal conditioning before a computer-based measurement system can effectively and accurately acquire the signal. The front-end signal conditioning system can include functions such as signal amplification, attenuation, filtering, electrical isolation, simultaneous sampling, and multiplexing. In addition, many transducers require excitation currents or voltages, bridge completion, linearization, or high amplification for proper and accurate operation. Therefore, most computer-based measurement systems include some form of signal conditioning in addition to plug-in data acquisition DAQ devices.

Sensors and Transducers

Sensors can generate electrical signals to measure physical phenomena, such as temperature, force, sound, or light. Some commonly used sensors are strain gauges, thermocouples, thermistors, angular encoders, linear encoders, and resistance temperature detectors (RTDs).
E Series User Manual 1-4 ni.com
To measure signals from these various transducers, you must convert them into a form that a DAQ device can accept. For example, the output voltage of most thermocouples is very small and susceptible to noise. Therefore, you may need to amplify or filter the thermocouple output before digitizing it. The manipulation of signals to prepare them for digitizing is called signal conditioning.
For more information about sensors, refer to the following documents.
For general information about sensors, visit
If you are using LabVIEW, refer to the LabVIEW Help by selecting Help»Search the LabVIEW Help in LabVIEW, and then navigate to the Taking Measurements book on the Contents tab.
If you are using other application software, refer to Common Sensors in the NI-DAQmx Help, which you can access from Start»All Programs»National Instruments»NI-DAQ»NI-DAQmx Help, or the LabVIEW 8.x Help.

Signal Conditioning Options

SCXI
SCXI is a front-end signal conditioning and switching system for various measurement devices, including E Series devices. An SCXI system consists of a rugged chassis that houses shielded signal conditioning modules that amplify, filter, isolate, and multiplex analog signals from thermocouples or other transducers. SCXI is designed for large measurement systems or systems requiring high-speed acquisition.
Chapter 1 DAQ System Overview
ni.com/sensors.
System features include:
Modular architecture—Choose your measurement technology
Expandability—Expand your system to 3,072 channels
Integration—Combine analog input, analog output, digital I/O, and switching into a single, unified platform
High bandwidth—Acquire signals at an aggregate rate of up to 333 kHz
Connectivity—Select from SCXI modules with thermocouple connectors or terminal blocks
© National Instruments Corporation 1-5 E Series User Manual
Chapter 1 DAQ System Overview
SCC
SCC is a front-end signal conditioning system for E Series plug-in data acquisition devices. A SCC system consists of a shielded carrier that holds up to 20 single or dual-channel SCC modules for conditioning thermocouples and other transducers. SCC is designed for small measurement systems where you need only a few channels of each signal type, or for portable applications. SCC systems also offer the most comprehensive and flexible signal connectivity options.
System features include:
Modular architecture—Select your measurement technology on a
Small-channel systems—Condition up to 16 analog input and eight
Low-profile/portable—Integrates well with other laptop computer
High bandwidth—Acquire signals at rates up to 1.25 MHz
Connectivity—Incorporates panelette technology to offer custom
per-channel basis
digital I/O lines
measurement technologies
connectivity to thermocouple, BNC, LEMO Spec connectors
(B Series), and MIL
5B Series
5B is a front-end signal conditioning system for plug-in data acquisition devices. A 5B system consists of eight or 16 single-channel modules that plug into a backplane for conditioning thermocouples and other analog signals. National Instruments offers a complete line of 5B modules, carriers, backplanes, and accessories.
Note For more information about SCXI, SCC, and 5B series products, refer to ni.com/
signalconditioning
.

Cables and Accessories

NI offers a variety of products to use with E Series devices, such as:
Cables and cable assemblies, shielded and ribbon
Connector blocks, shielded and unshielded 50- and 68-pin screw terminals
RTSI bus cables
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Chapter 1 DAQ System Overview
SCXI modules and accessories for isolating, amplifying, exciting, and multiplexing signals for relays and analog output; with SCXI you can condition and acquire up to 3,072 channels
Low-channel-count signal conditioning modules, devices, and accessories, including conditioning for strain gauges and RTDs, simultaneous sample-and-hold circuitry, and relays
For more specific information about these products, refer to

Using Accessories with Devices

Complete the following steps to choose a cable to connect an E Series device and an accessory:
1. Select an E Series device.
2. Using Table 1-1 or Table 1-2 as a guide, determine which accessories are appropriate for that device. Select an accessory. Table 1-3 provides descriptions for E Series device accessories.
3. Using Table 1-1 or Table 1-2 as a guide, determine which cable is required to connect your selected device and accessory.
Table 1-1. 68-Pin and DAQCard E Series Accessories and Recommended Cables
TBX-68, CB-68LP,
CB-68LPR, DAQ Signal
Accessory, CA-1000, BNC-2110, BNC-2111, BNC-2120, BNC-2090,
Device
68-pin E Series (except DAQCard)
SH6868EP (shielded) R6868 (unshielded)
Acessories and Recommended Cables
SCB-68
Connects directly to the device (PXI only
TB-2705
)
ni.com.
E Series DAQCards: NI 6024E, NI 6036E, NI 6062E
© National Instruments Corporation 1-7 E Series User Manual
SHC6868EP/M (shielded) RC6868 (unshielded
)
Chapter 1 DAQ System Overview
Table 1-2. 100-Pin E Series Accessories and Recommended Cables
TBX-68,
CB-68LP, CB-68LPR, DAQ Signal
Accessory,
CA-1000,
BNC-2110, BNC-2111, BNC-2120, BNC-2090,
Device
SCB-68
Acessories and Recommended Cables
TBX-68,
CB-68LP,
CB-68LPR,
CA-1000,
BNC-2115
SCB-68
SCB-100
100-pin E Series with 64 AI channels: NI 6071E, NI 6031E, NI 6033E
100-pin E Series with 16 AI channels and 32 DIO lines: NI PCI-6025E
SH1006868 (shielded); splits into two 68-pin connectors; these accessories are used with the first 68-pin connector
SH1006868 (shielded); splits into two 68-pin connectors; these accessories are used with the first 68-pin connector
Table 1-3. E Series DAQ Accessories Overview
SH1006868 (shielded); splits into two 68-pin connectors; these accessories are used with the second 68-pin connector
SH1006868 (shielded); splits into two 68-pin connectors; these accessories are used with the second 68-pin connector
SH1006868 (shielded); splits into two 68-pin connectors; these accessories are used with the second 68-pin connector
SH1006868 (shielded); splits into two 68-pin connectors; these accessories are used with the second 68-pin connector
SH100100 (shielded)
SH100100 (shielded)
Accessory Description
SCXI Signal Conditioning High-channel-count signal conditioning platform
SCC Modular Signal Conditioning Single or dual-channel signal conditioning modules
AMUX-64T, 5B, SSR, ER, and
External signal conditioning accessories
SC-204x Signal Conditioning
BNC-2110 BNC accessory for 68-pin E Series devices
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Chapter 1 DAQ System Overview
Table 1-3. E Series DAQ Accessories Overview (Continued)
Accessory Description
BNC-2111 BNC accessory for 68- or 100-pin E Series devices
BNC-2115 BNC accessory for extended I/O on 100-pin E Series
devices
BNC-2120 BNC accessory with function generator
(for 68-pin E Series devices)
BNC-2090 Rack-mountable BNC accessory (for 68-pin E Series
devices)
CA-1000 enclosure Configurable connectivity enclosure
TB-2705 Latching screw terminal block for PXI E Series modules
SCB-100 100-pin, shielded screw terminal block with breadboard
areas
SCB-68 68-pin, shielded screw terminal block with breadboard
areas
TBX-68 68-pin, DIN rail-mountable screw terminal block
CB-68LP, CB-68LPR 68-pin, low-cost screw terminal block
Signal Source and Demo Accessory DAQ signal accessory to demo and test analog, digital,
and counter/timer functions

Custom Cabling

NI offers a variety of cables and accessories to help you prototype your application or to use if you frequently change device interconnections.
However, if you want to develop your own cable, adhere to the following guidelines for best results.
Use shielded twisted-pair wires for each differential AI pair. Connect the shield for each signal pair to the ground reference at the source.
Route the analog lines separately from the digital lines.
When using a cable shield, use separate shields for the analog and digital halves of the cable. Failure to do so results in noise coupling into the analog signals from transient digital signals.
Mating connectors and a back-shell kit for making custom 68-pin cables are available from NI. For more information about the 68- and 100-pin
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Chapter 1 DAQ System Overview
connectors used for DAQ devices, refer to the KnowledgeBase document, Specifications and Manufacturers for Board Mating Connectors.

Programming Devices in Software

National Instruments measurement devices are packaged with NI-DAQ driver software, an extensive library of functions and VIs you can call from your application software, such as LabVIEW or LabWindows/CVI, to program all the features of your NI measurement devices. Driver software has an application programming interface (API), which is a library of VIs, functions, classes, attributes, and properties for creating applications for your device.
NI-DAQ includes two NI-DAQ drivers, Traditional NI-DAQ (Legacy) and NI-DAQmx. Each driver has its own API, hardware configuration, and software configuration. Refer to the DAQ Getting Started Guide for more information about the two drivers.
Traditional NI-DAQ (Legacy) and NI-DAQmx each include a collection of programming examples to help you get started developing an application. You can modify example code and save it in an application. You can use examples to develop a new application or add example code to an existing application.
To locate LabVIEW and LabWindows/CVI examples, open the National Instruments Example Finder:
In LabVIEW, select Help»Find Examples.
In LabWindows/CVI, select Help»NI Example Finder.
Measurement Studio, Visual Basic, and ANSI C examples are in the following directories:
NI-DAQmx examples for Measurement Studio-supported languages are in the following directories:
MeasurementStudio\VCNET\Examples\NI-DAQ
MeasurementStudio\DotNET\Examples\NI-DAQ
Traditional NI-DAQ (Legacy) examples for Visual Basic are in the following two directories:
NI-DAQ\Examples\Visual Basic with Measurement
Studio
for use with Measurement Studio
E Series User Manual 1-10 ni.com
directory contains a link to the ActiveX control examples
Chapter 1 DAQ System Overview
NI-DAQ\Examples\VBasic directory contains the examples not
associated with Measurement Studio
NI-DAQmx examples for ANSI C are in the
DAQmx ANSI C Dev
directory
NI-DAQ\Examples\
Traditional NI-DAQ (Legacy) examples for ANSI C are in the
NI-DAQ\Examples\VisualC directory
For additional examples, refer to
zone.ni.com.

I/O Connector Signal Descriptions

Table 1-4 describes the signals found on the I/O connectors. For a summary of the I/O signals by device family, refer to the specifications document for your device. Refer to Appendix A, Device-Specific Information, for the I/O pinout for your device.

Table 1-4. I/O Connector Signal Descriptions

Signal Name Reference Direction Description
AI GND AI Ground—These pins are the reference point for
AI <0..15> AI GND Input AI Channels 0 through 15—You can configure each
AI <16..63> AI GND Input AI Channels 16 through 63
single-ended AI measurements in RSE mode and the bias current return point for DIFF measurements. All three ground references—AI GND, AO GND, and D GND—are connected on the device.
channel pair, AI <i, i+8> (i = 0..7), as either one differential input or two single-ended inputs.
(NI PCI-6031E/6033E/6071E only)—Each channel pair, AI <i, i +8> (i = 16..23, 32..39, 48..55), can be configured as either one differential input or two single-ended inputs.
AI SENSE Input AI Sense—This pin is the reference node for AI <0..15> in
AI SENSE 2 Input AI Sense 2—This pin is the reference node for
AO 0 AO GND Output Analog Channel 0 Output—This pin supplies the voltage
AO 1 AO GND Output Analog Channel 1 Output—This pin supplies the voltage
AO GND AO Ground—The AO voltages are referenced to these
© National Instruments Corporation 1-11 E Series User Manual
NRSE mode.
AI <16..63> in NRSE mode.
output of AO channel 0.
output of AO channel 1.
pins. All three ground references—AI GND, AO GND, and D GND—are connected on the device.
Chapter 1 DAQ System Overview
Table 1-4. I/O Connector Signal Descriptions (Continued)
Signal Name Reference Direction Description
D GND Digital Ground—These pins supply the reference for the
digital signals at the I/O connector as well as the +5 VDC supply. All three ground references—AI GND, AO GND, and D GND—are connected on the device.
P0.<0..7> D GND Input or
AO EXT REF AO GND Input External Reference—This is the external reference input
P1.<0..7> D GND Input or
P2.<0..7> D GND Input or
P3.<0..7> D GND Input or
+5 V D GND Output +5 V Power Source—These pins provide +5 V power.
AI HOLD COMP D GND Output AI Hold Complete Event Signal—When enabled, this
EXT STROBE D GND Output External Strobe Signal—You can toggle this output with
PFI 0/AI START TRIG
D GND Input PFI 0—As an input, this pin is a programmable function
Output
Output
Output
Output
Output AI Start Trigger Signal—As an output, this pin is the
Digital I/O Signals—You can individually configure each signal as an input or output. P0.6 and P0.7 can also control the up/down signal of Counters 0 and 1, respectively.
for the AO circuitry.
NI 6025E only—Port 1 bidirectional digital data lines for the 82C55A programmable peripheral interface. P1.7 is the most significant bit (MSB). P1.0 is the least significant bit (LSB).
NI 6025E only—Port 2 bidirectional digital data lines for the 82C55A programmable peripheral interface. P2.7 is the MSB. P2.0 is the LSB.
NI 6025E only—Port 3 bidirectional digital data lines for the 82C55A programmable peripheral interface. P3.7 is the MSB. P3.0 is the LSB.
signal pulses once for each A/D conversion in sampling mode. The low-to-high edge indicates when the input signal can be removed from the input or switched to another signal.
software controls to latch signals or trigger events on external devices. This functionality is not available in LabVIEW or NI-DAQ. EXT STROBE is used for controlling SCXI chassis, and it is not a general-purpose signal. If you want to use or control this signal, you must perform register-level programming.
interface (PFI).
ai/StartTrigger signal. In post-trigger DAQ sequences, a low-to-high transition indicates the initiation of the acquisition sequence. In applications with pre-trigger samples, a low-to-high transition indicates the initiation of the pre-trigger samples.
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Chapter 1 DAQ System Overview
Table 1-4. I/O Connector Signal Descriptions (Continued)
Signal Name Reference Direction Description
PFI 1/AI REF TRIG, PFI 1
D GND Input PFI 1—As an input, this pin is a PFI.
Output AI Reference Trigger Signal—As an output, this pin is
the ai/ReferenceTrigger signal. In applications with pre-trigger samples, a low-to-high transition indicates the initiation of the post-trigger samples. AI Reference Trigger is not used in applications with post-trigger samples.
PFI 2/AI CONV CLK
PFI 3/CTR 1 SRC D GND Input PFI 3—As an input, this pin is a PFI.
PFI 4/CTR 1 GATE
CTR 1 OUT D GND Input CTR 1 OUT—As an input, this pin can be used to route
PFI 5/AO SAMP CLK
PFI 6/AO START TRIG
D GND Input PFI 2—As an input, this pin is a PFI.
Output AI Convert Clock Signal—As an output, this pin is the
ai/ConvertClock signal. A high-to-low edge on AI CONV indicates that an A/D conversion is occurring.
Output Counter 1 Source Signal—As an output, this pin is the
Ctr1Source signal. This signal reflects the actual source connected to the general-purpose Counter 1.
D GND Input PFI 4—As an input, this pin is a PFI.
Output Counter 1 Gate Signal—As an output, this pin is the
Ctr1Gate signal. This signal reflects the actual gate signal connected to the general-purpose Counter 1.
signals directly to the RTSI bus.
Output Counter 1 Output Signal—As an output, this pin emits
the Ctr1InternalOutput signal.
D GND Input PFI 5—As an input, this pin is a PFI.
Output AO Sample Clock Signal—As an output, this pin is the
ao/SampleClock signal. A high-to-low edge on AO SAMP indicates that the AO primary group is being updated.
D GND Input PFI 6—As an input, this pin is a PFI.
Output AO Start Trigger Signal—As an output, this pin is the
ao/StartTrigger signal. In timed AO sequences, a low-to-high transition indicates the initiation of the waveform generation.
PFI 7/AI SAMP CLK
© National Instruments Corporation 1-13 E Series User Manual
D GND Input PFI 7—As an input, this pin is a PFI.
Output AI Sample Clock Signal—As an output, this pin is the
ai/SampleClock signal. This pin pulses once at the start of each AI sample in the interval sample. A low-to-high transition indicates the start of the sample.
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