- 2.7 to 3.6 volt for read, erase, and program operations
• Configuration
- 16,777,216 x 8 / 8,388,608 x 16 switchable
• Sector structure
- 8KB(4KW) x 8 and 64KB(32KW) x 255
• Latch-up protected to 250mA fro m -1V to VCC + 1V
• Low VCC write inhibit is equal to or less than 1.5V
• Compatible with JEDEC standard
- Pin-out and software compatible to single power supply Flash
PERFORMANCE
• High Perf ormance
- Fast access time: 90R/100ns
- Page read time: 25ns
- Sector erase time: 0.5s (typ.)
- 4 word/8 b yte page read buffer
- 16 word/ 32 b yte write buffer: reduces pro gramming
time fo r multiple-wo rd/byte updates
• Low Po wer Consumptio n
- Active read current: 18mA(typ.)
- Active write current: 20mA(typ.)
- Standby current: 20uA(typ.)
• Minimum 100,000 erase/prog ram cycle
• 20-years data retention
SOFTW ARE FEA TURES
• Support Commo n Flash Interf ace (CFI)
- Flash device parameters stored on the device and
provide the host system to access.
• Program Suspend/Pro gram Resume
- Suspend prog ram operatio n to read o ther secto rs
• Erase Suspend/ Erase Resume
- Suspends sector erase operation to read data/program o ther sectors
• Status Reply
- Data# polling & Toggle bits pro vide detectio n o f program and erase operation completion
HARDW ARE FEA TURES
• Ready/Busy (RY/BY#) Output
- Provides a hardware method of detecting program
and erase operation completion
• Hardware Reset (RESET#) Input
- Provides a hardware method to reset the internal
state machine to read mode
• WP#/ACC input
- Write pro tect (WP#) functio n allows pro tection o f all
sectors, regardless o f secto r pro tectio n settings
- ACC (high voltage) accelerates programming time
fo r higher throughput during system
SECURITY
• Sector Pro tection/Chip Unpro tect
- Pro vides sector gro up pro tect function to pre vent program o r erase o peration in the pro tected secto r gro up
- Provides chip unprotect function to allow code
changes
- Provides tempo rary secto r gro up unprotect functio n
fo r code changes in pre viously pro tected secto r groups
• Sector P ermanent Loc k
- A unique lock bit feature allows the content to be
permanently lock ed
(Please contact Macronix sales for specific information regarding this permanent lock feature)
• Secured Silicon Secto r
- Provides a 128-word OTP area for permanent, secure identification
- Can be programmed and lo ck ed at facto ry or by customer
P A CKAGE
• 56-pin TSOP
GENERAL DESCRIPTION
The MX29LA128M T/B is a 128-mega bit Flash memo ry
organiz ed as 16M bytes o f 8 bits or 8M wo rds of 16 bits.
MXIC's Flash memories o ffer the mo st co st-effective and
reliable read/write non-v o latile random access memo ry .
The MX29LA128M T/B is pac kaged in 56-pin TSOP. It is
designed to be reprog rammed and erased in system o r in
standard EPROM pro grammers.
P/N:PM1170REV. 0.04, JUL. 11, 2005
The standard MX29LA128M T/B offers access time as
fast as 90ns, allowing operation of high-speed microprocessors without wait states. To eliminate bus contention, the MX29LA128M T/B has separate chip enable
(CE#) and output enab le (OE#) co ntrols.
with in-circuit electrical erasure and prog ramming. The
MX29LA128M T/B uses a co mmand register to manage
this functionality.
MXIC Flash technology reliably stores memory contents
even after 100,000 er ase and program cycles. The MXIC
cell is designed to optimize the erase and program
mechanisms. In addition, the combination of advanced
tunnel oxide processing and low internal electric fields
for erase and programming operations produces reliable
cycling. The MX29LA128M T/B uses a 2.7V to 3.6V
VCC supply to perform the High Reliability Erase and
auto Progr am/Erase algorithms.
The highest degree of latch-up protection is achieved
with MXIC's proprietary non-epi process. Latch-up protection is proved for stresses up to 100 milliamperes on
address and data pin from -1V to VCC + 1V.
AUTOMATIC PROGRAMMING
The MX29LA128M T/B is b yte/word/page pro grammab le
using the Auto matic Pro gramming algo rithm. The Automatic Programming algorithm makes the external system do not need to ha ve time o ut sequence no r to verify
the data prog rammed.
AUTOMATIC PROGRAMMING ALGORITHM
AUTOMATIC SECTOR ERASE
The MX29LA128M T/B is secto r(s) erasable using MXIC's
Auto Secto r Erase algo rithm. Secto r erase mo des allo w
sectors o f the arra y to be erased in o ne erase cycle. The
Auto matic Sector Er ase algorithm auto matically progr ams
the specified sector(s) prio r to electrical erase. The timing and verificatio n of electrical erase are co ntrolled internally within the device.
AUTOMATIC ERASE ALGORITHM
MXIC's Automatic Erase algorithm requires the user to
write commands to the command register using standard micropro cesso r write timings. The de vice will automatically pre-prog r am and verify the entire array. Then
the device automatically times the erase pulse width,
provides the erase verification, and counts the number
of sequences. A status bit toggling between consecutive read cycles provides feedback to the user as to the
status of the programming operation.
Register contents serve as inputs to an internal statemachine which controls the erase and programming circuitry . During write cycles, the co mmand register internally latches address and data needed for the programming and erase operations. During a system write cycle,
addresses are latched on the falling edge, and data are
latched on the rising edge o f WE# .
MXIC's Automatic Programming algorithm require the user
to only write program set-up commands (including 2 unlock write cycle and A0H) and a program command (program data and address). The de vice automatically times
the programming pulse width, provides the program verification, and counts the number of sequences. A status
bit similar to DATA# polling and a status bit to ggling between consecutive read cycles, provide feedback to the
user as to the status of the programming operation.
AUTOMATIC CHIP ERASE
The entire chip is bulk erased using 50 ms erase pulses
according to MXIC's A utomatic Chip Er ase algorithm. The
Automatic Erase algorithm automatically programs the
entire array prio r to electrical erase. The timing and verification o f electrical erase are co ntro lled internally within
the device.
P/N:PM1170
MXIC's Flash technology combines years of EPROM
experience to pro duce the highest le vels of quality, reliability, and cost effectiveness. The MX29LA128M T/B
electrically erases all bits simultaneously using FowlerNordheim tunneling. The bytes are pro grammed b y using the EPROM programming mechanism of hot electron injection.
During a program cycle, the state-machine will control
the program sequences and command register will not
respond to any command set. During a Sector Erase
cycle, the command register will only respond to Erase
Suspend command. After Erase Suspend is completed,
the device stays in read mode. After the state machine
has completed its task, it will allow the command register to respond to its full command set.
OperationCE# OE# W E #RE-WP#ACCAddressQ0~Q7WordByte
SET#ModeMode
ReadLLHHXXA
IN
D
OUT
D
OUT
Q8-Q14=
High Z
Q15=A-1
Write (Program/Erase)LHLH(Note 3)XA
IN
(No te 4) (Note 4 Q8-Q14=
High Z
Q15=A-1
Accelerated ProgramLHLH(Note 3)V
HH
A
IN
(No t e 4 ) (No t e 4 ) Q8-Q14=
High Z
Q15=A-1
StandbyVC C ±XXVCC±XHXHigh-ZHigh-ZHigh-Z
0.3V0.3V
Output DisableLHHHXXXHigh-ZHigh-ZHigh-Z
ResetXXXLXXXHigh-ZHigh-ZHigh-Z
Sector Group ProtectLHLV
ID
HXSector Addresses, (Note 4)XX
(Note 2)A6=L,A3=L, A2=L,
A1=H,A0=L
Chip unprotectLHLV
ID
HXSector Addresses, (Note 4)XX
(Note 2)A6=H, A3=L, A2=L,
A1=H, A0=L
Temporary SectorXXXV
ID
HXAIN(Note 4) (Note 4)High-Z
Group Unprotect
Legend:
L=Logic LOW=VIL, H=Logic High=VIH, VID=12.0±0.5V, VHH=12.0±0.5V, X=Don't Care, AIN=Address IN, DIN=Data IN,
D
=Data OUT
OUT
No tes:
1. Address are A21:A0 in word mo de; A21:A-1 in byte mo de . Secto r addresses are A21:A15 in bo th mo des.
2 . The sector gro up pro tect and chip unpro tect functio ns may also be implemented via pro gramming equipment. See
the "Sector Gro up Pro tectio n and Chip Unpro tect" section.
3. If WP#=VIL, all the secto rs remain protected. If WP#=VIH, all sectors pro tectio n depends o n whether they were last
protected o r unpro tect using the method described in "Secto r/ Secto r Bloc k Protectio n and Unpro tect".
4. DIN or D
P/N:PM1170
as required by co mmand sequence, Data# po lling or secto r pro tect algo rithm (see Figure 15).
OUT
REV. 0.04, JUL. 11, 2005
19
MX29LA128M T/B
Table 2. AUTOSELECT CODES (High Voltage Method)
A22 A14A8A5A3 Q8 to Q15
DescriptionCE# OE# WE# totoA9toA6totoA1 A0WordByteQ7 t o Q 0
Legend: L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don't care.
P/N:PM1170
REV. 0.04, JUL. 11, 2005
20
MX29LA128M T/B
REQUIREMENTS FOR READING ARRAY
DATA
To read array data from the outputs, the system must
drive the CE# and OE# pins to VIL. CE# is the power
control and selects the device. OE# is the output control
and gates array data to the o utput pins . WE# should remain at VIH.
The internal state machine is set for reading array data
upon device power-up, or after a hardware reset. This
ensures that no spurious alteration of the memory content occurs during the power transition. No command is
necessary in this mode to obtain array data. Standard
micropro cesso r read cycles that assert valid address on
the device address inputs produce valid data on the device data outputs . The de vice remains enabled fo r read
access until the command register contents are altered.
PAGE MODE READ
The MX29LA128M T/B o ffers "f ast page mode read" function. This mode provides faster read access speed for
random locations within a page. The page size of the
device is 4 words/8 bytes. The appropriate page is selected by the higher address bits A0~A1(Wo rd Mo de)/A1~A1(Byte Mode) This is an asynchro nous o peratio n; the
microprocessor supplies the specific word location.
The system perfo rmance could be enhanced by initiating
1 normal read and 3 fast page read (for word mode A0A1) or 7 fast page read (for byte mode A-1~A1). When
CE# is deasserted and reasserted fo r a subsequent access, the access time is tACC or tCE. Fast page mode
accesses are obtained by keeping the "read-page addresses" constant and changing the "intra-read page"
addresses.
WRITING COMMANDS/COMMAND SEQUENCES
T o pro gram data to the device o r erase secto rs of memo ry ,
the system must drive WE# and CE# to VIL, and OE# to
VIH.
An erase operation can erase one sector, multiple sectors, or the entire device. Table indicates the address
space that each sector occupies. A "sector address"
consists o f the address bits required to uniquely select a
sector . The Writing specific address and data commands
or sequences into the co mmand register initiates de vice
operations. Table 1 defines the valid register command
sequences. Writing inco rrect address and data values o r
writing them in the improper sequence resets the device
to reading array data. Section has details on erasing a
sector or the entire chip, or suspending/resuming the erase
operation.
After the system writes the Automatic Select command
sequence, the device enters the Automatic Select mode.
The system can then read Automatic Select codes from
the internal register (which is separate from the memory
array) on Q7-Q0. Standard read cycle timings apply in
this mode. Refer to the Automatic Select Mode and Automatic Select Command Sequence section for more
information.
ICC2 in the DC Characteristics table represents the active current specification for the write mode. The "AC
Characteristics" section contains timing specification
table and timing diagrams for write operations.
WRITE BUFFER
Write Buffer Programming allows the system to write a
maximum of 16 words/32 bytes in one programming operatio n. This results in faster eff ective pro gramming time
than the standard programming algorithms. See "Write
Buffer" for more information.
ACCELERATED PROGRAM OPERATION
The device offers accelerated program operations through
the ACC function. This is one of two functions provided
by the ACC pin. This function is primarily intended to
allow faster manuf acturing throughput at the f actory .
If the system asserts VHH on this pin, the device automatically enters the aforementioned Unlock Bypass
mode, temporarily unprotects any protected sectors, and
uses the higher voltage on the pin to reduce the time
required fo r pro gram oper ations . Remo ving VHH from the
ACC
pin must not be at VHH for operations o ther than accelerated programming, or device damage may result.
P/N:PM1170
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21
MX29LA128M T/B
STANDBY MODE
When using both pins o f CE# and RESET#, the de vice
enter CMOS Standby with bo th pins held at VCC ± 0.3V .
If CE# and RESET# are held at VIH, but not within the
range o f VCC ± 0.3V , the device will still be in the standby
mode, b ut the standby current will be larger. During Auto
Algorithm o peration, VCC active current (ICC2) is required
even CE# = "H" until the operation is completed. The
device can be read with standard access time (tCE) from
either of these standby modes, before it is ready to read
data.
AUTOMATIC SLEEP MODE
The automatic sleep mode minimizes Flash device energy consumptio n. The de vice auto matically enables this
mode when address remain stab le for tA CC+30ns . The
automatic sleep mo de is independent of the CE#, WE#,
and OE# control signals. Standard address access timings pro vide new data when addresses are changed. While
in sleep mode, output data is latched and always available to the system. ICC4 in the DC Characteristics table
represents the automatic sleep mode current specification.
OUTPUT DISABLE
With the OE# input at a logic high level (VIH), output
from the de vices are disabled. This will cause the output
pins to be in a high impedance state.
RESET# OPERATION
but not within VSS±0.3V, the standby current will be
greater.
The RESET# pin may be tied to system reset circuitry.
A system reset would that also reset the Flash memo ry ,
enabling the system to read the boot-up firmware from
the Flash memory.
If RESET# is asserted during a program or erase
operatio n, the R Y/BY# pin remains a "0" (busy) until the
internal reset operation is complete, which requires a time
of tREADY (during Embedded Algo rithms). The system
can thus monito r RY/BY# to determine whether the reset
operation is complete. If RESET# is asserted when a
program or erase operation is completed within a time of
tREAD Y (not during Embedded Algo rithms). The system
can read data tRH after the RESET# pin returns to VIH.
Refer to the AC Characteristics tables for RESET#
parameters and to Figure 3 for the timing diagram.
SECTOR GROUP PROTECT OPERATION
The MX29LA128M T/B f eatures hardw are secto r g roup
protection. This feature will disable both program and
erase operations for these sector group protected. In
this device, a sector group consists of four adjacent sectors which are protected or unprotected at the same time.
T o activ ate this mode, the pro gramming equipment must
fo rce VID o n address pin A9 and contro l pin OE#, (suggest VID = 12V) A6 = VIL and CE# = VIL. (see Tab le 2)
Programming of the protection circuitry begins on the
falling edge of the WE# pulse and is terminated on the
rising edge. Please refer to sector group protect algorithm and waveform.
The RESET# pin provides a hardware method of resetting
the device to reading arra y data. When the RESET# pin
is driven low for at least a period of tRP, the device
immediately terminates any operation in progress,
tristates all output pins, and ignores all read/write
commands for the duration of the RESET# pulse. The
device also resets the internal state machine to reading
array data. The o peratio n that was interrupted should be
reinitiated once the device is ready to accept another
command sequence, to ensure data integrity
Current is reduced for the duration of the RESET# pulse.
When RESET# is held at VSS±0.3V, the device draws
CMOS standby current (ICC4). If RESET# is held at VIL
P/N:PM1170
MX29LA128M T/B also pro vides ano ther metho d. Which
requires VID on the RESET# only. This method can be
implemented either in-system or via programming equipment. This method uses standard microprocessor bus
cycle timing.
T o v erify programming o f the pro tection circuitry , the programming equipment must fo rce VID o n address pin A9
( with CE# and OE# at VIL and WE# at VIH). When
A1=1, it will produce a logical "1" code at device output
Q0 fo r a pro tected sector . Otherwise the device will produce 00H for the unprotected sector. In this mode, the
addresses, except for A1, are don't care. Address locations with A1 = VIL are reserved to read manufacturer
and device codes. (Read Silicon ID)
REV. 0.04, JUL. 11, 2005
22
MX29LA128M T/B
It is also possib le to determine if the gro up is protected
in the system by writing a Read Silicon ID command.
Perf o rming a read operatio n with A1=VIH, it will produce
a logical "1" at Q0 for the protected sector.
CHIP UNPROTECT OPERATION
The MX29LA128M T/B also f eatures the chip unpro tect
mode, so that all sectors are unprotected after chip
unprotect is completed to incorporate any changes in
the code. It is recommended to protect all sectors before
activating chip unprotect mode.
T o activ ate this mode , the programming equipment m ust
force VID on control pin OE# and address pin A9. The
CE# pins must be set at VIL. Pins A6 must be set to
VIH. (see Table 2) Refer to chip unprotect algo rithm and
wavef o rm for the chip unpro tect algo rithm. The unprotect
mechanism begins on the f alling edge o f the WE# pulse
and is terminated on the rising edge.
MX29LA128M T/B also pro vides ano ther metho d. Which
requires VID on the RESET# only. This method can be
implemented either in-system or via programming equipment. This method uses standard microprocessor bus
cycle timing.
It is also possible to determine if the chip is unprotect in
the system by writing the Read Silicon ID command.
Perf orming a read o peratio n with A1=VIH, it will pro duce
00H at data outputs (Q0-Q7) f o r an unpro tect sector . It is
noted that all sectors are unprotected after the chip
unprotect algorithm is completed.
WRITE PROTECT (WP#)
last protected o r unpro tect using the method described in
"Sector/Secto r Gro up Pro tection and Chip Unpro tect".
Note that the WP# pin must no t be left flo ating o r unco nnected; inconsistent behavior of the device may result.
TEMPORARY SECTOR GROUP UNPROTECT
OPERATION
This feature allows temporary unprotect of previously
protected secto r to change data in-system. The Temporary Sector Unprotect mode is activated by setting the
RESET# pin to VID(11.5V -12.5V). During this mo de, fo rmerly protected sectors can be programmed or erased
as unprotect sector. Once VID is remove from the RESET# pin, all the previously protected sectors are protected again.
SILICON ID READ OPERATION
Flash memories are intended for use in applications where
the local CPU alters memory contents. As such, manufacturer and device codes must be accessible while the
device resides in the target system. PROM programmers typically access signature codes by raising A9 to
a high vo ltage. Howe ver , m ultiplexing high v o ltage onto
address lines is not generally desired system design practice.
MX29LA128M T/B pro vides hardware metho d to access
the silicon ID read o peratio n. Which metho d requires VID
on A9 pin, VIL on CE#, OE#, A6, and A1 pins. Which
apply VIL o n A0 pin, the de vice will output MXIC's manufacture co de of which apply VIH o n A0 pin, the device will
output MX29LA128M T/B de vice cod e.
The write protect function provides a hardware method
to protect all sectors witho ut using VID.
If the system asserts VIL on the WP# pin, the device
disables pro gram and erase functio ns in all sectors independently of whether those sectors were protected or
unprotect using the method described in Sector/Sector
Group Pro tectio n and Chip Unpro tect".
If the system asserts VIH on the WP# pin, the device
reverts to whether the sectors were last set to be protected or unprotect. That is, sector protection or
unprotectio n fo r the secto rs depends on whether they w ere
P/N:PM1170
VERIFY SECTOR GROUP PROTECT STATUS
OPERATION
MX29LA128M T/B pro vides hardware metho d f or secto r
group protect status verify. Which method requires VID
on A9 pin, VIH on WE# and A1 pins, VIL on CE#, OE#,
A6, and A0 pins, and secto r address on A16 to A21 pins.
Which the identified sector is protected, the device will
output 01H. Which the identified sector is no t pro tect, the
device will o utput 00H.
REV. 0.04, JUL. 11, 2005
23
MX29LA128M T/B
DATA PROTECTION
The MX29LA128M T/B is designed to offer protection
against accidental erasure or programming caused by
spurious system level signals that may exist during power
transition. During power up the device automatically resets the state machine in the Read mode. In addition,
with its control register architecture, alteration of the
memory contents only occurs after successful completion of specific command sequences. The device also
incorpo rates sev eral features to prev ent inadvertent write
cycles resulting from VCC power-up and pow er-down transition or system noise.
SECURED SILICON SECTOR
The MX29LA128M T/B features a OTP memory region
where the system may access through a command sequence to create a permanent par t identification as so
called Electronic Serial Number (ESN) in the device.
Once this region is programmed, any further modificatio n on the regio n is impo ssible. The secured silicon sector is a 128 words in length, and uses a Secured Silicon
Sector Indicator Bit (Q7) to indicate whether or not the
Secured Silicon Sector is locked when shipped from the
factory. This bit is permanently set at the factory and
cannot be changed, which prevent duplication of a factory locked part. This ensures the security of the ESN
once the product is shipped to the field.
The MX29LA128M T/B offers the device with Secured
Silicon Sector either factory locked or customer lockable. The f actory-lo cked versio n is alwa ys protected when
shipped from the factory , and has the Secured Silicon
Sector Indicator Bit permanently set to a "1". The customer-lockable version is shipped with the Secured Silicon Sector unprotected, allowing customers to utilize that
sector in any form they prefer. The customer-lockable
version has the secured sector Indicator Bit permanently
set to a "0". Theref ore, the Secured Silico n Sector Indicator Bit pre v ents custo mer, lo ckab le device from being
used to replace devices that are factory locked.
The system access the Secured Silicon Sector through
a command sequence (refer to "Enter Secured Silicon/
Exit Secured Silicon Secto r co mmand Sequence). After
the system has written the Enter Secured Silicon Secto r
command sequence, it may read the Secured Silicon
Sector by using the address normally occupied by the
first sector SA0. Once entry the Secured Silicon Secto r
the operatio n o f boo t secto rs is disabled but the o peratio n
of main sectors is as normally. This mode of operation
continues until the system issues the Exit Secured Silicon Secto r co mmand sequence, o r until power is remo ved
from the device. On power-up, or following a hardware
reset, the device rev erts to sending co mmand to secto r
SA0.
Secured SiliconESN factoryCustomer
Sector addresslockedlockable
range
000000h-000007hESNDetermined by
000008h-00007FhUnavailableCustomer
FACTORY LOCKED:Secured Silicon Sector
Programmed and Protected At the Factory
In device with an ESN, the Secured Silicon Sector is
protected when the device is shipped from the factory.
The Secured Silicon Sector cannot be modified in any
way. A f actory lo cked de vice has an 8-wo rd rando m ESN
at address 000000h-000007h.
CUSTOMER LOCKABLE:Secured Silicon
Sector NOT Programmed or Protected At the
Factory
As an alternative to the factory-locked version, the device
may be ordered such that the customer may program
and protect the 128-word Secured Silicon Sector.
Programming and protecting the Secured Silicon Sector
must be used with caution since, once protected, there
is no procedure available for unprotected the Secured
Silicon Sector area and none of the bits in the Secured
Silicon Sector memory space can be modified in any
way.
The Secured Silicon Sector area can be protected using
one of the following procedures:
Write the three-cycle Enter Secured Silicon Sector Region
command sequence, and then follow the in-system
sector protect algorithm as shown in Figure 15, except
that RESET# may be at either VIH or VID . This allo ws insystem protection of the Secured Silicon Sector without
raising any device pin to a high voltage. Note that method
is only applicab le to the Secured Silico n Secto r.
P/N:PM1170
REV. 0.04, JUL. 11, 2005
24
MX29LA128M T/B
Write the three-cycle Enter Secured Silicon Secto r Regio n
co mmand sequence, and then alternate method of secto r
protectio n described in the :Secto r Group Pro tectio n and
Unprotect" section.
Once the Secured Silicon Sector is programmed, locked
and verified, the system must write the Exit Secured
Silicon Sector Region command sequence to return to
reading and writing the remainder of the arra y .
LOW VCC WRITE INHIBIT
When VCC is less than VLKO the device does not accept any write cycles. This protects data during VCC
power-up and power-do wn. The command register and
all internal program/erase circuits are disabled, and the
device resets. Subsequent writes are igno red until VCC
is greater than VLKO . The system must pro vide the proper
signals to the control pins to prevent unintentional write
when VCC is greater than VLK O.
WRITE PULSE "GLITCH" PROTECTION
POWER SUPPLY DE COUPLING
In order to reduce power switching effect, each device
should have a 0.1uF ceramic capacitor connected between its VCC and GND .
Noise pulses of less than 5ns (typical) on CE# or WE#
will not initiate a write cycle.
LOGICAL INHIBIT
Writing is inhibited by holding any one of OE# = VIL,
CE# = VIH o r WE# = VIH. T o initiate a write cycle CE#
and WE# must be a logical zero while OE# is a logical
one.
POWER-UP SEQUENCE
The MX29LA128M T/B pow ers up in the Read only mo de.
In addition, the memory contents may only be altered
after successful completion of the predefined command
sequences.
POWER-UP WRITE INHIBIT
If WE#=CE#=VIL and OE#=VIH during power up, the
device does not accept commands on the rising edge of
WE#. The internal state machine is automatically reset
to the read mode on power-up.
P/N:PM1170
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25
MX29LA128M T/B
SOFTWARE COMMAND DEFINITIONS
Erase Resume (30H) commands are valid only while the
Sector Erase operation is in progress. Either of the two
Device operations are selected by writing specific address and data sequences into the command register.
reset command sequences will reset the device (when
applicable).
Writing incorrect address and data values or writing them
in the improper sequence will reset the device to the
read mod e. Table 3 defines the valid register command
sequences. Note that the Erase Suspend (B0H) and
All addresses are latched on the f alling edge of WE# or
CE#, whichever happens later. All data are latched on
rising edge of WE# o r CE#, whichev er happens first.
TABLE 3. MX29LA128M T/B COMMAND DEFINITIONS
First BusSecond Bus Third Bus Fourth BusFifth BusSixth Bus
CommandBus Cycle Cycle Cycle Cycle Cycle Cycle
Cycles Addr Data Addr Data Addr Data AddrDataAddr Data Addr Data
Read (Note 5)1RAR D
Reset (Note 6)1XXXF0
Automatic Select (Note 7)
Manufacturer IDWord4555AA2AA55555 90X00C2H
Legend:
X=Don't care
RA=Address of the memory location to be read.
RD=Data read from location RA during read operation.
PA=Address o f the memo ry lo catio n to be pro grammed.
Addresses are latched on the f alling edge o f the WE# or
CE# pulse, whichever happen later .
DDI=Data of device identifier
C2H for manufacture code
Notes:
1. See Table 1 f o r descriptions o f b us oper ations .
2. All values are in hexadecimal.
3. Except when reading array or auto matic select data, all bus cycles are write o peratio n.
4. Address bits are do n't care f or unloc k and co mmand cycles , e xcept when PA or SA is required.
5. No unlo ck o r co mmand cycles required when de vice is in read mo de.
6. The Reset co mmand is required to return to the read mo de when the device is in the auto matic select mo de o r if
Q5 goes high.
7. The fourth cycle of the auto matic select command sequence is a read cycle.
8. The device ID m ust be read in three cycles. The data is 01h fo r top bo o t and 00h f or bottom bo o t.
9. If WP# protects the top two address sectors, the data is 98h for factory locked and 18h for not factory locked. If
WP# protects the botto m two address sectors, the data is 88h for facto ry lo c k ed and 08h f or not f actor lo c ked.
10. The data is 00h for an unprotected secto r/secto r blo c k and 01h fo r a pro tected secto r/sector blo c k.
11. The total number o f cycles in the co mmand sequence is determined by the n umber o f words written to the write
buffer . The maximum number o f cycles in the co mmand sequence is 21(W ord Mo de) / 37(Byte Mo de).
12 . Command sequence resets device f or ne xt command after abo rted write-to-buffer o peration.
13. The system may read and prog ram functions in no n-erasing secto rs, o r enter the auto matic select mo de, when in
the erase Suspend mo de. The Erase Suspend co mmand is v alid only during a secto r erase o peratio n.
14. The Erase Resume command is valid only during the Erase Suspend mod e.
15. Command is valid when de vice is ready to read arr ay data or when device is in automatic select mo de.
PD=Data to be programmed at location PA. Data is
latched on the rising edge o f WE# o r CE# pulse .
SA=Address of the sector to be erase or verified (in
autoselect mode).
Address bits A21-A12 uniquely select any secto r .
WBL=Write Buffer Location. Address must be within the
same write buffer page as PA.
WC=Word Count. Number of write buffer locations to load
minus 1.
BC=Byte Count. Number of write buffer locations to load
minus 1.
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MX29LA128M T/B
READING ARRAY DATA
The device is automatically set to reading array data
after device power-up. No commands are required to retrieve data. The device is also ready to read array data
after completing an Automatic Program or Automatic
Erase algorithm.
After the device accepts an Erase Suspend command,
the device enters the Erase Suspend mode. The system can read array data using the standard read timings, except that if it reads at an address within erasesuspended sectors, the device outputs status data. After completing a programming operation in the Erase
Suspend mode, the system may once again read array
data with the same exception. See Erase Suspend/Erase
Resume Commands for more information on this mode.
The system must issue the reset command to re-enable the device for reading array data if Q5 goes high, or
while in the automatic select mode. See the "Reset Command" section, next.
RESET COMMAND
array data (also applies during Erase Suspend).
SILICON ID READ COMMAND SEQUENCE
The SILICON ID READ command sequence allows the
host system to access the manufacturer and devices
codes, and determine whether or not a sector is protected. T ab le 2 shows the address and data requirements.
This method is an alternative to that shown in Table 1,
which is intended for PROM programmers and requires
VID on address bit A9.
The SILICON ID READ command sequence is initiated
by writing two unlock cycles, followed by the SILICON
ID READ command. The device then enters the SILICON ID READ mode, and the system may read at any
address any number of times, without initiating another
command sequence. A read cycle at address XX00h
retrieves the manufacturer code. A read cycle at address
XX01h returns the device code. A read cycle containing
a sector address (SA) and the address 02h returns 01h if
that sector is protected, or 00h if it is unprotected. Refer
to T a ble fo r valid sector addresses.
Writing the reset command to the device resets the device to reading array data. Address bits are don't care for
this command.
The reset command may be written between the sequence cycles in an erase command sequence before
erasing begins. This resets the device to reading array
data. Once er asure begins, howe ver , the device igno res
reset commands until the operation is complete.
The reset command may be written between the sequence cycles in a program command sequence before
programming begins. This resets the device to reading
array data (also applies to programming in Erase Suspend mode). Once programming begins, however, the
device ignores reset commands until the operation is
complete.
The reset command may be written between the sequence cycles in an SILICON ID READ command sequence. Once in the SILICON ID READ mode, the reset
command must be written to return to reading array data
(also applies to SILICON ID READ during Erase Suspend).
The system must write the reset command to exit the
automatic select mode and return to reading array data.
BYTE/WORD PROGRAM COMMAND SEQUENCE
The command sequence requires four bus cycles, and
is initiated by writing two unlock write cycles, followed
by the pro gram set-up co mmand. The pro gram address
and data are written next, which in turn initiate the Embedded Program algorithm. The system is not required
to provide further controls or timings. The device automatically generates the program pulses and verifies the
progr ammed cell margin. Tab le 3 shows the address and
data requirements for the byte program command sequence.
When the Embedded Program algorithm is complete, the
device then returns to reading array data and addresses
are no longer latched. The system can determine the
status of the pro g ram o peratio n b y using Q7, Q6, or R Y/
BY#. See "Write Operation Status" for information on
these status bits.
If Q5 goes high during a program or erase operation,
writing the reset command returns the device to reading
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Any commands written to the device during the Embedded Program Algorithm are ignored. Note that a hard-
REV. 0.04, JUL. 11, 2005
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MX29LA128M T/B
ware reset immediately terminates the programming o peration. The Byte/Word Program command sequence
should be reinitiated once the device has reset to reading array data, to ensure data integrity.
Programming is allowed in any sequence and across
sector boundaries. A bit cannot be programmed from a
"0" back to a "1". Attempting to do so may halt the operation and set Q5 to "1", or cause the Data# Polling
algorithm to indicate the operation was successful. However, a succeeding read will show that the data is still
"0". Only erase operations can convert a "0" to a "1".
Write Buffer Programming
Write Buffer Programming allows the system write to a
maximum of 16 words/32 bytes in one programming operation. This results in faster eff ective pro gramming time
than the standard programming algorithms. The Write
Buffer Programming command sequence is initiated by
first writing two unloc k cycles. This is f ollowed b y a third
write cycle containing the Write Buffer Load command
written at the Sector Address in which programming will
occur. The fourth cycle writes the sector address and
the number of word locations, minus one, to be programmed. For example, if the system will program 6
unique address locations, then 05h should be written to
the device. This tells the device how many write buffer
addresses will be loaded with data and therefore when to
expect the Pro gram Buff er to Flash command. The number of locations to program cannot exceed the size of
the write buffer or the operation will abort.
The fifth cycle writes the first address location and data
to be progr ammed. The write-buff er-page is selected by
address bits A
must fall within the selected-write-buffer-page . The system then writes the remaining address/data pairs into
the write buffer. Write buffer locations may be loaded in
any o rder.
The write-buffer-page address must be the same for all
address/data pairs loaded into the write buffer. (This
means Write Buffer Programming canno t be performed
across m ultiple write-buffer pages. This also means that
Write Buffer Programming cannot be performed across
multiple sectors. If the system attempts to load programming data outside of the selected write-buffer page, the
operation will abo rt.
Note that if a Write Buffer address location is loaded
-4. All subsequent address/data pairs
MAX
multiple times, the address/data pair counter will be
decremented fo r ev ery data load oper ation. The host system must therefore account for loading a write-buffer location mo re than o nce. The co unter decrements f or each
data load operation, not for each unique write-buffer-address location. Note also that if an address location is
loaded mo re than o nce into the buffer , the final data loaded
for that address will be programmed.
Once the specified number of write buffer locations have
been loaded, the system must then write the Program
Buffer to Flash command at the sector address. Any
other address and data combination aborts the Write
Buffer Programming operation. The device then begins
programming. Data polling should be used while monitoring the last address locatio n lo aded into the write buff er.
Q7, Q6, Q5, and Q1 should be monitored to determine
the device status during Write Buff er Pro gramming.
The write-buffer programming operation can be suspended
using the standard program suspend/resume commands.
Upon successful co mpletio n of the Write Buffer Pro gramming operation, the device is ready to execute the next
command.
The Write Buffer Pro gramming Sequence can be abo rted
in the following ways:
•Load a value that is greater than the page buffer size
during the Number of Locations to Program step.
•Write to an address in a sector different than the one
specified during the Write-Buffer-Lo ad co mmand.
•Write an Address/Data pair to a different write-bufferpage than the one selected b y the Starting Address
during the write buffer data loading stage of the operation.
•Write data other than the Confirm Command after the
specified number of data load cycles.
The abort condition is indicated by Q1 = 1, Q7 = D ATA#
(for the last address location loaded), Q6 = toggle, and
Q5=0. A Write-to-Buffer-Abo rt Reset command sequence
must be written to reset the device for the next operation. No te that the full 3-cycle Write-to-Buffer-Abo rt Reset command sequence is required when using WriteBuffer-Programming features in Unlock Bypass mode.
Program Suspend/Program Resume Command
Sequence
The Program Suspend command allows the system to
interrupt a programming operation or a Write to Buffer
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MX29LA128M T/B
prog ramming operatio n so that data can be read fro m any
non-suspended secto r . When the Prog ram Suspend command is written during a programming process, the device halts the program operation within 15us maximum
(5 us typical) and updates the status bits. Addresses are
not required when writing the Program Suspend command.
After the programming operation has been suspended,
the system can read array data from any non-suspended
sector. The Program Suspend command may also be
issued during a programming operation while an erase is
suspended. In this case, data may be read from any
addresses not in Erase Suspend or Program Suspend. If
a read is needed from the Secured Silicon Sector area
(One-time Prog ram area), then user must use the proper
command sequences to enter and e xit this regio n.
The system may also write the autoselect command
sequence when the device is in the Program Suspend
mode. The system can read as many autoselect codes
as required. When the device e xits the auto select mod e,
the device reverts to the Program Suspend mode, and
is ready for another valid operation. See Autoselect Command Sequence for more information.
After the Program Resume command is written, the device reverts to pro gramming. The system can determine
the status of the program operation using the Q7 or Q6
status bits, just as in the standard program operation.
See Write Operatio n Status f or more inf ormation.
AUTOMATIC CHIP/SECTOR ERASE COMMAND
The device does not require the system to preprogram
prior to erase. The A uto matic Er ase algo rithm automatically pre-program and verifies the entire memory for an
all zero data pattern prior to electrical erase. The system
is not required to provide any controls or timings during
these operations. Table 3 shows the address and data
requirements for the chip erase command sequence.
Any commands written to the chip during the Automatic
Erase algorithm are ignored. Note that a hardware reset
during the chip erase operation immediately terminates
the operatio n. The Chip Erase co mmand sequence sho uld
be reinitiated once the device has returned to reading
array data, to ensure data integrity.
The system can determine the status of the erase operatio n by using Q7, Q6, Q2, o r RY/BY#. See "Write Operation Status" f or inf ormatio n o n these status bits. When
the Automatic Erase algorithm is complete, the device
returns to reading array data and addresses are no longer
latched.
Figure 10 illustrates the algorithm for the erase operation. See the Erase/Program Operations tables in "AC
Characteristics" for parameters, and to Figure 9 for timing diagrams.
SETUP AUTOMATIC CHIP/SECTOR ERASE
Chip erase is a six-bus cycle operation. There are two
"unloc k" write cycles. These are f ollowed by writing the
"set-up" command 80H. T w o more "unlo ck" write cycles
are then followed by the chip erase command 10H, or
the sector erase command 30H.
The MX29LA128M T/B contains a Silicon-ID-Read operation to supplement traditional PROM programming
methodo lo gy . The o peratio n is initiated by writing the read
silicon ID command sequence into the command register. Following the command write, a read cycle with
A1=VIL,A0=VIL retrieves the manuf acturer co de. A read
cycle with A1=VIL, A0=VIH returns the device cod e.
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MX29LA128M T/B
SECTOR ERASE COMMANDS
The Automatic Sector Erase does not require the device
to be entirely pre-programmed prior to executing the Automatic Set-up Sector Erase command and Automatic
Sector Erase command. Upon executing the Automatic
Sector Erase command, the device will automatically
program and verify the sector(s) memory for an all-zero
data pattern. The system is no t required to provide an y
control or timing during these operations.
When the sector(s) is automatically verified to contain
an all-zero pattern, a self-timed sector erase and verify
begin. The erase and verify operations are complete
when the data on Q7 is "1" and the data on Q6 stops
toggling for two consecutive read cycles, at which time
the device returns to the Read mod e. The system is no t
required to provide any control or timing during these
operations.
When using the Automatic Sector Erase algorithm, note
that the erase automatically terminates when adequate
erase margin has been achieved for the memory array
(no erase verification command is required). Sector erase
is a six-bus cycle o peratio n. There are two "unlo ck" write
cycles. These are followed by writing the set-up command 80H. Tw o mo re "unlo ck" write cycles are then f o llowed by the sector erase command 30H. The sector
address is latched on the falling edge of WE# or CE#,
whichever happens later , while the command (data) is
latched on the rising edge of WE# or CE#, whichever
happens first. Sector addresses selected are loaded
into internal register on the sixth falling edge of WE# or
CE#, whichever happens later . Each successiv e secto r
load cycle started by the falling edge of WE# or CE#,
whichever happens later must begin within 50us from
the rising edge of the preceding WE# or CE#, whiche ver
happens first. Otherwise, the loading period ends and
internal auto sector erase cycle starts. (Monitor Q3 to
determine if the sector erase timer window is still open,
see section Q3, Secto r Erase Timer.) Any co mmand o ther
than Sector Erase(30H) or Erase Suspend(B0H) during
the time-out period resets the device to read mode.
device requires a maximum 20us to suspend the sector
erase operatio n. Howev er, When the Erase Suspend co mmand is written during the sector erase time-out, the
device immediately terminates the time-out period and
suspends the erase operation. After this command has
been executed, the command register will initiate erase
suspend mode. The state machine will return to read
mode auto matically after suspend is ready. At this time,
state machine only allows the command register to respond to the Erase Resume, program data to, or read
data from any sector not selected for erasure.
The system can determine the status of the program
operation using the Q7 or Q6 status bits, just as in the
standard program operation. After an erase-suspend program operation is complete, the system can once again
read array data within non-suspended blocks.
ERASE RESUME
This command will cause the command register to clear
the suspend state and return back to Sector Erase mode
but only if an Erase Suspend command was previously
issued. Erase Resume will not have any effect in all
other conditions. Another Erase Suspend command can
be written after the chip has resumed erasing.
ERASE SUSPEND
This command only has meaning while the state machine is executing Automatic Sector Erase operation,
and therefore will only be responded during Automatic
Sector Er ase operatio n. When the Er ase Suspend command is issued during the sector erase operation, the
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MX29LA128M T/B
QUERY COMMAND AND COMMON FLASH
INTERFACE (CFI) MODE
The single cycle Query command is valid only when the
device is in the Read mode, including Erase Suspend,
Standby mo de, and Read ID mo de; how ever , it is igno red
MX29LA128M T/B is capab le of o perating in the CFI mode.
otherwise.
This mode all the host system to determine the manufacturer of the device such as operating parameters and
configuratio n. T wo co mmands are required in CFI mo de.
Query command of CFI mode is placed first, then the
Reset command e xits CFI mo de. These are described in
The Reset command exits from the CFI mode to the
Read mode, or Erase Suspend mode, or read ID mode.
The command is valid only when the device is in the CFI
mode.
T able 4.
Table 4-1. CFI mode: Identification Data Values
(All values in these tables are in hexadecimal)
DescriptionAddress h Address hData h
(x16)(x8)
Query-unique ASCII string "QRY"1 0200051
11220052
12240059
Primary vendor command set and control interface ID code1 32 60002
14280000
Address for primary algorithm extended query table1 52 A0040
162C0000
Alternate vendor command set and control interface ID code (none)172E0000
18300000
Address for secondary algorithm extended query table (none)1 9320000
1A340000
Table 4-2. CFI Mode: System Interface Data Values
DescriptionAddress h Address hData h
(x16)(x8)
VCC supply, minimum (2.7V)1B360027
VCC supply, maximum (3.6V)1 C380036
VPP supply, minimum (none)1 D3 A0000
VPP supply, maximum (none)1E3C0000
Typical timeout for single word/byte write (2N us)1F3E0007
Typical timeout for maximum size buffer write (2N us)20400007
Typical timeout for individual block erase (2N ms)2142000A
Typical timeout for full chip erase (2N ms)22440000
Maximum timeout for single word/byte write times (2
Maximum timeout for maximum size buffer write times (2
Maximum timeout for individual block erase times (2
Maximum timeout for full chip erase times (not supported)2 64C0000
2B560000
Number of erase block regions (X=# of Erase Block Regions)2C5 80002
Erase block region 1 information2 D5A0007
[2E,2D] = # of blocks in region -12E5C0000
[30, 2F] = size in multiples of 256-bytes2F5E0020
30600000
316 200FE
Erase Block Region 2 Information (refer to CFI publication 100)326 40000
33660000
34680001
356A0000
Erase Block Region 3 Information (refer to CFI publication 100)366C0000
376E0000
38700000
39720000
Erase Block Region 4 Information (refer to CFI publication 100)3A7 40000
3B760000
3C780000
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MX29LA128M T/B
Table 4-4. CFI Mode: Primary Vendor-Specific Extended Query Data Values
DescriptionAddress h Address hData h
(x16)(x8)
Query-unique ASCII string "PRI"4 08 00050
41820052
42840049
Major version number, ASCII4 38 60031
Minor version number, ASCII4 48 80033
Address sensitive unlock (0=required, 1= not required)4 58A0000
Erase suspend (2= to read and write)4 68C0002
Sector protect (N= # of sectors/group)4 78E0001
Temporary sector unprotect (1=supported)48900001
Sector protect/unprotect scheme4 9920004
Simultaneous R/W operation (0=not supported)4A940000
Burst mode type (0=not supported)4B9 60000
Page mode type (1=4 word page)4 C980001
ACC (Acceleration) Supply Minimum4 D9A00B5
00h=Not Supported, D7-D4: Volt, D3-D0:100mV
ACC (Acceleration) Supply Maximum4E9 C00C5
00h=Not Supported, D7-D4: Volt, D3-D0:100mV
Top/Bottom Boot Sector Flag4F9E0002/
02h=Bottom Boot Device, 03h=Top Boot Device0003
04h=uniform sectors bottom WP# protect,
05h=uniform sectors top WP# protect
Program Suspend50A00001
00h=Not Supported, 01h=Supported
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MX29LA128M T/B
WRITE OPERATION STATUS
The device provides several bits to determine the status
of a write operation: Q2, Q3, Q5, Q6, Q7, and R Y/BY#.
T ab le 5 and the fo llowing subsectio ns describe the functions of these bits. Q7, RY/BY#, and Q6 each offer a
method for determining whether a program or erase operation is complete or in progress. These three bits are
discussed first.
Table 5. Write Operation Status
StatusQ7Q6Q5Q3Q2Q1RY/BY#
Byte/Word Program in Auto Program AlgorithmQ7 #To ggle0N/ANo00
To ggle
Auto Erase Algorithm0T o ggle01T oggleN/A0
Erase Suspend Read1No0N/AT o ggleN/A1
Erase(Erase Suspended Sector)T o ggle
SuspendedErase Suspend ReadDataDataDataDataDataData1
Mode(Non-Erase Suspended Sector)
1. Q5 s witches to "1" when an W ord/Byte Pro gram, Erase , o r Write-to-Buffer operation has e xceeded the maximum
timing limits. Refer to the section on Q5 for more information.
2. Q7 and Q2 require a v alid address when reading status info rmation. Ref er to the appro priate subsection fo r further
details.
3. The Data# Polling algo rithm sho uld be used to mo nitor the last lo aded write-buff er address lo cation.
4. Q1 switches to "1" when the device has abo rted the write-to-buffer operation.
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MX29LA128M T/B
Q7: Data# Polling
The Data# Polling bit, Q7, indicates to the host system
whether an Automatic Algorithm is in progress or completed, or whether the device is in Erase Suspend. Data#
Po lling is valid after the rising edge o f the final WE# pulse
in the program or erase command sequence.
During the Automatic Program algorithm, the device outputs on Q7 the complement of the datum programmed
to Q7. This Q7 status also applies to prog ramming during Erase Suspend. When the A uto matic Pro gram algorithm is complete, the device outputs the datum programmed to Q7. The system must provide the prog r am
address to read valid status information on Q7. If a program address falls within a pro tected secto r , Data# Po lling on Q7 is active for approximately 1 us, then the device returns to reading array data.
During the Auto matic Erase algorithm, Data# P olling produces a "0" o n Q7. When the Auto matic Erase algo rithm
is complete, or if the device enters the Erase Suspend
mode, Data# P o lling pro duces a "1" on Q7. This is analogous to the complement/true datum output described for
the Automatic Program algorithm: the erase function
changes all the bits in a sector to "1" prior to this, the
device o utputs the "complement," o r "0". The system must
pro vide an address within any o f the sectors selected f or
erasure to read valid status info rmatio n o n Q7.
After an erase command sequence is written, if all sectors selected f o r erasing are pro tected, Data# P o lling o n
Q7 is active for approximately 100 us, then the device
returns to reading array data. If not all selected sectors
are protected, the Automatic Erase algorithm erases the
unprotected sectors, and ignores the selected sectors
that are protected.
happens first pulse in the command sequence (prior to
the program or erase operation), and during the sector
time-out.
During an Automatic Program or Erase algorithm operation, successive read cycles to any address cause Q6
to toggle. The system may use either OE# or CE# to
contro l the read cycles. When the o peratio n is co mplete,
Q6 stops toggling.
After an erase command sequence is written, if all sectors selected for erasing are protected, Q6 toggles for
100us and returns to reading array data. If not all selected sectors are protected, the Automatic Erase algorithm erases the unprotected sectors, and ignores the
selected sectors that are protected.
The system can use Q6 and Q2 together to determine
whether a sector is actively erasing or is erase suspended.
When the device is actively erasing (that is, the Automatic Erase algorithm is in pro gress), Q6 to ggling. When
the device enters the Erase Suspend mode, Q6 stops
toggling. However, the system m ust also use Q2 to determine which sectors are erasing or erase-suspended.
Alternatively, the system can use Q7.
If a program address falls within a protected sector , Q6
toggles for approximately 2us after the program command sequence is written, then returns to reading array
data.
Q6 also toggles during the erase-suspend-program mode,
and stops toggling once the Automatic Program algorithm is complete.
Table 5 shows the outputs for Toggle Bit I on Q6.
When the system detects Q7 has changed from the
complement to true data, it can read valid data at Q7-Q0
on the following read cycles. This is because Q7 may
change asynchronously with Q0-Q6 while Output Enable
(OE#) is asserted low.
Q6:Toggle BIT I
Toggle Bit I on Q6 indicates whether an Automatic Program or Erase algorithm is in progress or complete, or
whether the device has entered the Erase Suspend mode.
Toggle Bit I may be read at any address, and is valid
after the rising edge of the final WE# o r CE#, whiche ver
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Q2:Toggle Bit II
The "To ggle Bit II" o n Q2, when used with Q6, indicates
whether a particular sector is actively erasing (that is,
the Automatic Erase algorithm is in process), or whether
that sector is erase-suspended. Toggle Bit II is valid
after the rising edge of the final WE# o r CE#, whiche ver
happens first pulse in the command sequence.
Q2 toggles when the system reads at addresses within
those sectors that have been selected for erasure. (The
system may use either OE# or CE# to control the read
cycles.) But Q2 cannot distinguish whether the sector
is actively erasing or is erase-suspended. Q6, by com-
REV. 0.04, JUL. 11, 2005
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MX29LA128M T/B
parison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which
sectors are selected for erasure . Thus , both status bits
are required for sectors and mode information. Refer to
Table 5 to compare o utputs f or Q2 and Q6.
Reading Toggle Bits Q6/ Q2
Whenever the system initially begins reading toggle bit
status, it must read Q7-Q0 at least twice in a row to
determine whether a toggle bit is to ggling. Typically, the
system would note and store the value of the toggle bit
after the first read. After the second read, the system
would compare the new value of the toggle bit with the
first. If the toggle bit is not toggling, the device has
completed the program o r erase o peration. The system
can read array data on Q7-Q0 on the following read cycle.
However, if after the initial two read cycles, the system
determines that the toggle bit is still toggling, the system also should note whether the value of Q5 is high
(see the section on Q5). If it is, the system should then
determine again whether the toggle bit is toggling, since
the toggle bit may have stopped toggling just as Q5 went
high. If the toggle bit is no longer toggling, the device
has successfully completed the program or erase operation. If it is still toggling, the device did not complete the
operation successfully, and the system must write the
reset command to return to reading array data.
The remaining scenario is that system initially determines
that the toggle bit is toggling and Q5 has not gone high.
The system may continue to monitor the toggle bit and
Q5 through successive read cycles, determining the status as described in the previo us paragraph. Alternatively ,
it may choose to perform other system tasks. In this
case, the system must start at the beginning of the algorithm when it returns to determine the status of the
operation.
Q5:Program/Erase Timing
Q5 will indicate if the program or erase time has exceeded
the specified limits (internal pulse count). Under these
conditio ns Q5 will pro duce a "1". This time-o ut co nditio n
indicates that the program or erase cycle was not successfully completed. Data# Polling and Toggle Bit are
the only operating functions of the device under this condition.
If this time-out conditio n occurs during sector erase operation, it specifies that a particular secto r is bad and it
may no t be reused. Ho wev er, o ther secto rs are still functional and may be used for the program or erase operation. The device must be reset to use other sectors.
Write the Reset command sequence to the device, and
then execute pro gram o r erase co mmand sequence. This
allows the system to continue to use the other active
sectors in the device.
If this time-out condition occurs during the chip erase
operation, it specifies that the entire chip is bad or combination of sectors are bad.
If this time-out condition occurs during the byte/word programming operation, it specifies that the entire sector
containing that byte is bad and this sector may not be
reused, (other sectors are still functional and can be reused).
The time-out condition may also appear if a user tries to
program a non blank location without erasing. In this
case the device locks out and never completes the Automatic Algorithm operation. Hence, the system never
reads a valid data on Q7 bit and Q6 never stops toggling.
Once the Device has exceeded timing limits, the Q5 bit
will indicate a "1". Please note that this is not a device
failure condition since the device was incorrectly used.
The Q5 failure condition may appear if the system tries
to program a to a "1" location that is previously programmed to "0". Only an erase operation can change a
"0" back to a "1". Under this condition, the device halts
the operation, and when the operation has exceeded the
timing limits, Q5 produces a "1".
Q3:Sector Erase Timer
After the completion of the initial sector erase command
sequence, the sector erase time-out will begin. Q3 will
remain low until the time-o ut is co mplete. Data# P o lling
and Toggle Bit are valid after the initial secto r erase co mmand sequence.
If Data# Polling or the Toggle Bit indicates the device
has been written with a valid erase command, Q3 may
be used to determine if the sector erase timer window is
still open. If Q3 is high ("1") the internally controlled
erase cycle has begun; attempts to write subsequent
commands to the device will be ignored until the erase
operation is co mpleted as indicated b y Data# Po lling or
P/N:PM1170
REV. 0.04, JUL. 11, 2005
37
T o ggle Bit. If Q3 is low ("0"), the de vice will accept additional sector erase co mmands. To insure the command
has been accepted, the system software should check
the status of Q3 prior to and following each subsequent
sector erase command. If Q3 were high on the second
status check, the command may not have been accepted.
If the time between additional erase commands from the
system can be less than 50us, the system need not to
monitor Q3.
Q1: Write-to-Buffer Abort
Q1 indicates whether a Write-to-Buffer operation was
aborted. Under these conditio ns Q1 pro duces a "1". The
system must issue the Write-to-Buffer-Abo rt-Reset command sequence to return the device to reading array data.
See Write Buffer section for more details.
MX29LA128M T/B
RY/BY#:READY/BUSY OUTPUT
The RY/BY# is a dedicated, open-drain output pin that
indicates whether an Embedded Algorithm is in progress
or complete. The RY/BY# status is valid after the rising
edge of the final WE# pulse in the co mmand sequence.
Since RY/BY# is an open-drain o utput, se v eral RY/BY#
pins can be tied together in parallel with a pull-up resistor
to VCC .
If the output is low (Busy), the device is actively erasing
or programming. (This includes programming in the Erase
Suspend mode.) If the output is high (Ready), the device
is ready to read array data (including during the Erase
Suspend mode), or is in the standby mode.
with Power Applied. . . . . . . . . . . . . .... -65oC to +125oC
V o ltage with Respect to Gro und
VCC (Note 1) . . . . . . . . . . . . . . . . . -0.5 V to +4.0 V
A9, OE#, and
RESET# (Note 2) . . . . . . . . . . . ....-0.5 V to +12.5 V
All other pins (Note 1) . . . . . . . -0.5 V to VCC +0.5 V
Output Short Circuit Current (No te 3) . . . . . . 200 mA
Notes:
1. Minimum DC voltage on input o r I/O pins is -0.5 V.
During voltage transitions, input or I/O pins may overshoot VSS to -2.0 V for periods of up to 20 ns. Maximum DC voltage on input or I/O pins is VCC +0.5 V.
During voltage transitions, input or I/O pins may overshoot to VCC +2.0 V for periods up to 20ns .
2. Minimum DC input voltage on pins A9, OE#, and
RESET# is -0.5 V. During vo ltage transitio ns, A9, OE#,
and RESET# may overshoot VSS to -2.0 V for periods of up to 20 ns. Maximum DC input voltage on pin
A9 is +12.5 V which ma y oversho o t to 14.0 V f o r periods up to 20 ns.
3. No mo re than o ne o utput may be sho rted to ground at
a time. Duration of the short circuit should not be
greater than one second.
OPERATING RATINGS
Commercial (C) Devices
Ambient Temperature (T
Industrial (I) Devices
Ambient Temperature (T
VCC
Supply Voltages
VCC for full voltage range. . . . . . . . . . . +2.7 V to 3.6 V
Operating ranges define those limits between which the
functionality of the device is guaranteed.
A ) . . . . . . . . . . . . 0°C to +70°C
A ) . . . . . . . . . . -40°C to +85°C
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device.
This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational sections of this data sheet is
not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect
device reliability.
VILInput Low V o ltage-0.50.8V
VIHInput High V o ltage0.7xVCCVCC+0.5V
VHHVo ltage for ACC Progr a mVCC = 2.7V ~ 3.6V11.512.012.5V
Acceleration
VIDVo ltage f o r A utoselect andVCC = 3.0 V ± 10%11.512.012.5V
T empo rary Sector Unpro tect
V OLOutput Low Vo ltageIOL= 4.0mA,VCC=VCC min0.45V
V OH1 Output High V oltageIOH=-2.0mA,VCC=VCC min0.85VCCV
VO H2IOH=-100uA,VCC=VCC minVCC-0.4V
VLK O Low VCC Lock-Out V oltage2.32.5V
(Note 4)
°°
°C to 85
°°
VCC = VCC max
VCC = VCC max
WP# = VIH
°°
°C, VCC=2.7V~3.6V (VCC=3.0V~3.6V for 90R)
°°
1 MHz520mA
Notes:
1. On the WP#/ACC pin only, the maximum input load current when WP# = VIL is ± 5.0uA.
2. Maxim um ICC specifications are tested with VCC = VCC max.
3. The ICC current listed is typically is less than 2 mA/MHz, with OE# at VIH. Typical specifications are for VCC =
3.0V.
4 . ICC active while Embedded Erase or Embedded Program is in progress.
5 . Automatic sleep mode enables the low power mode when addresses remain stable for t ACC + 30 ns.
6 . No t 100% tested.
7 . A9=12.5V when T A=0°C to 85°C, A9=12V when when T A=-40°C to 0°C.
P/N:PM1170
40
REV. 0.04, JUL. 11, 2005
MX29LA128M T/B
SWITCHING TEST CIRCUITS
TEST SPECIFICATIONS
T est Co nditionAll SpeedsUnit
Output Load1 TTL gate
DEVICE UNDER
TEST
2.7K ohm
3.3V
Output Load Capacitance, CL30pF
(including jig capacitance)
Input Rise and Fall Times5ns
tR CRead Cycle Time (No te 1)Min90100ns
tACCAddress to Output DelayCE#, OE#=VILMax90100ns
tCEChip Enable to Output DelayOE#=VILMax9 0100ns
tPA C CPage Access TimeMax252 5ns
tOEOutput Enable to Output DelayMax353 5ns
tDFChip Enable to Output High Z (Note 1)Ma x1 6ns
tDFOutput Enable to Output High Z (Note 1)Max16ns
tOHOutput Ho ld Time Fro m Address, CE#Min0n s
or OE#, whiche v er Occurs First
tOEHOutput Enable Ho ld TimeT o ggle andMin10ns
(No te 1)Data# Po lling
Notes:
1. Not 100% tested.
2. See SWITCHING TEST CIRCUITS and TEST SPECIFICATIONS TABLE for test specifications .
°°
°C to 85
°°
ReadMin35ns
°°
°C, VCC=2.7V~3.6V(VCC=3.0V~3.6V for 90R)
°°
P/N:PM1170
REV. 0.04, JUL. 11, 2005
42
Figure 1. READ TIMING WAVEFORMS
VIH
Addresses
CE#
WE#
VIL
VIH
VIL
VIH
VIL
tRH
tRH
tOEH
MX29LA128M T/B
tRC
ADD Valid
tCE
tOE
tDF
OE#
Outputs
VIH
VIL
HIGH ZHIGH Z
VOH
VOL
VIH
RESET#
VIL
RY/BY#
0V
Figure 2. PAGE READ TIMING WAVEFORMS
A2-A21
tACC
Same Page
tOH
DATA V alid
P/N:PM1170
(A-1), A0~A2
CE#
OE#
Output
tACC
tPACC
tPACC
tPACC
QaQbQcQd
43
REV. 0.04, JUL. 11, 2005
MX29LA128M T/B
AC CHARACTERISTICS
ParameterDescriptionT est SetupAll Speed OptionsUnit
tREADY2RESET# PIN Low (NO T During Auto matic Algo rithms)MAX50 0ns
to Read or Write (See Note)
tRPRESET# Pulse Width (NOT During Auto matic Algo rithms)MIN500ns
tR HRESET# High Time Befo re Read (See Note)MIN50ns
tRBRY/BY# Reco very Time(to CE#, OE# go lo w)MIN0ns
tRPDRESET# Low to Standby ModeMIN20us
tW CWrite Cycle Time (No te 1)Min9010 0ns
tASAddress Setup TimeMin0ns
tASOAddress Setup Time to OE# low during to ggle bit po llingMin15ns
tAHAddress Hold TimeMin45ns
tAHTAddress Hold Time Fro m CE# o r OE# high during toggleMin0ns
bit polling
tDSData Setup TimeMin35ns
tDHData Hold TimeMin0ns
tCEPHCE# High During T o ggle Bit P o llingMin20ns
tOEPHOutput Enable High during toggle bit po llingMin20ns
tGHWLRead Recovery Time Bef ore WriteMin0ns
(OE# High to WE# Low)
tGHELRead Recovery Time Befo re WriteMin0ns
tCSCE# Setup TimeMin0ns
tCHCE# Hold TimeMin0ns
tWPWrite Pulse WidthMin35ns
tWPHWrite Pulse Width HighMin30ns
Write Buffer Pro gram Operatio n (No tes 2,3)T y p240us
Single Wo rd/Byte Pro gramByteTyp60us
tWHWH1Operation (Notes 2,5)W o r dT yp60us
Accelerated Single Wo rd/ByteByteTyp54us
Prog ramming Operation (No tes 2,5)Wo r dT yp54us
tWHWH2Sector Erase Operation (No te 2)T y p0 .5sec
tVCSVCC Setup Time (No te 1)Min50us
tRBWrite Reco very Time from R Y/BY#Min0ns
tBUSYProgram/Er ase V alid to R Y/BY# DelayMin9010 0ns
tVHHVHH Rise and Fall Time (No te 1)Min250ns
tPOLLProgram V alid Befo re Status Po lling (No te 6)Max4us
°°
°C to 85
°°
°°
°C, VCC=2.7V~3.6V (VCC=3.0V~3.6V for 90R)
°°
Notes:
1. Not 100% tested.
2. See the "Erase And Programming P erf ormance" section f or more inf ormation.
3. For 1-16 words/1-32 bytes programmed.
4. Effective write buffer specification is based upon a 16-word/32-byte write buffer operation.
5. Word/Byte programming specification is based upon a single word/byte programming operation not utilizing the
write buffer .
6. When using the pro gram suspend/resume feature, if the suspend co mmand is issued within tPOLL, tPOLL must be
fully re-applied upon resuming the programming operation. If the suspend command is issued after tPOLL, tPOLL
is not required again prior to reading the status bits upon resuming.
P/N:PM1170
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MX29LA128M T/B
ERASE/PROGRAM OPERATION
Figure 4. AUTOMATIC PROGRAM TIMING WAVEFORMS
tWC
tAS
Read Status Data (last two cycle)Program Command Sequence(last two cycle)
Address
CE#
OE#
WE#
Data
RY/BY#
tVCS
XXXh
tCH
tWP
tCStWPH
tDS tDH
A0h
PA
tAH
PD
tBUSY
PAPA
tWHWH1
Status
DOUT
tRB
VCC
Note :
1.PA=Program Address, PD=Program Data, DOUT is the true data the program address
1. When Sector Address is specified, any address in
the selected sector is acceptable. However, when
loading Write-Buffer address locations with data, all
addresses must fall within the selected Write-Buffer
Page.
2. Q7 may change simultaneously with Q5.
Therefore, Q7 should be verified.
3. If this flowchart location was reached because Q5=
"1" then the device FAILED. If this flowchart location
was reached because Q1="1", then the Write to
Buffer operation was ABORTED. In either case, the
proper reset command must be written before the
device can begin another operation. If Q1=1, write
the Write-Buffer-Programming-Abort-Reset command. If Q5=1, write the Reset command.
4. See Table 3 for command sequences required for
write buffer programming.
P/N:PM1170
(Note 2)
(Note 3)
Q7 and Q15 = Data ?
No
FAIL or ABORTPASS
Yes
48
REV. 0.04, JUL. 11, 2005
MX29LA128M T/B
Program Operation
or Write-to-Buffer
Sequence in Progress
Write address/data
XXXh/B0h
Write Program Suspend
Command Sequence
Command is also valid for
Erase-suspended-program
operations
Autoselect and Secured Sector
read operations are also allowed
Data cannot be read from erase-or
program-suspended sectors
Write Program Resume
Command Sequence
Read data as
required
Write address/data
XXXh/30h
Device reverts to
operation prior to
Program Suspend
tW CWrite Cycle Time (No te 1)Min90100ns
tASAddress Setup TimeMin0n s
tAHAddress Hold TimeMin45ns
tDSData Setup TimeMin35ns
tD HData Hold TimeM in0ns
tGHE LRead Recov ery Time Befo re WriteMin0ns
tWHWH2Sector Erase Operation (No te 2)T y p0 .5sec
tR HRESET HIGH Time Before Write (Note 1)Min50ns
tPOLLPro gram Valid Before Status Polling (Note 6)Max4us
°°
°C, VCC=2.7V~3.6V (VCC=3.0V~3.6V for 90R)
°°
(OE# High to WE# Low)
Write Buffer Pro gram Operatio n (No tes 2,3)T y p240us
Single Wo rd/Byte Pro gramByteTyp60us
Accelerated Single W ord/ByteByteTyp54us
Prog ramming Operation (No tes 2,5)W o rdT yp54us
Notes:
1. Not 100% tested.
2. See the "Erase And Programming P erf ormance" section f or mo re inf ormation.
3. For 1-16 words/1-32 bytes programmed.
4. Effective write buffer specification is based upon a 16-word/32-byte write buffer operation.
5. Word/Byte programming specification is based upon a single word/byte programming operation not utilizing the
write buffer .
6 . When using the program suspend/resume f eature, if the suspend co mmand is issued within tPOLL, tPOLL must be
fully re-applied upon resuming the pro gramming o peratio n. If the suspend command is issued after tPOLL, tPOLL is
not required again prio r to reading the status bits upo n resuming.
P/N:PM1170
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MX29LA128M T/B
Figure 13. CE# CONTROLLED PROGRAM TIMING WAVEFORM
Address
WE#
OE#
CE#
Data
555 for program
2AA for erase
tWC
tWH
tGHEL
tWS
tRH
PA for program
SA for sector erase
555 for chip erase
tCP
tDS
tDH
tAS
tAH
tCPH
A0 for program
55 for erase
Data# Polling
tBUSY
PD for program
30 for sector erase
10 for chip erase
tWHWH1 or 2
Q7
PA
DOUT
RESET#
RY/BY#
NOTES:
1.PA=Program Address, PD=Program Data, DOUT=Data Out, Q7=complement of data written to device.
2.Figure indicates the last two bus cycles of the command sequence.
* It is recommended before unprotect whole chip, all sectors should be protected in advance.
REV. 0.04, JUL. 11, 2005
61
MX29LA128M T/B
AC CHARACTERISTICS
ParameterDescriptionT e s tAll Speed Options Unit
Setup
tVIDRVID Rise and Fall Time (see No te)M in500ns
tRSPRESET# Setup Time fo r T emporary Sector UnprotectMin4us
tRRBRESET# Hold Time from R Y/BY# High fo r TemporaryMi n4us
Sector Group Unprotect
Figure 20. TEMPORARY SECTOR GROUP UNPROTECT WAVEFORMS
12V
RESET#
0 or 3V
VIL or VIH
CE#
WE#
RY/BY#
tVIDR
tVIDR
Program or Erase Command Sequence
tRSP
tRRB
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62
MX29LA128M T/B
Figure 21. TEMPORARY SECTOR GROUP UNPROTECT FLOWCHART
Start
RESET# = VID (Note 1)
Perform Erase or Program Operation
Operation Completed
RESET# = VIH
Temporary Sector Unprotect Completed(Note 2)
Notes :
1. All protected sectors are temporary unprotected.
VID=11.5V~12.5V
2. All previously protected sectors are protected again.
VA=Valid address. Figure shows are first status cycle after command sequence, last status read cycle, and array data raed cycle.
High Z
High Z
P/N:PM1170
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66
Figure 25. DATA# POLLING ALGORITHM
MX29LA128M T/B
Start
Read Q7~Q0
Add.=VA(1)
Yes
Yes
(2)
Pass
No
Q7 = Data ?
No
Q5 = 1 ?
Yes
Read Q7~Q0
Add.=VA
Q7 = Data ?
No
FAIL
Notes:
1.V A=valid address f o r pro gramming.
2.Q7 should be rechecked even Q5="1" because Q7 may change simultaneously with Q5.
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67
MX29LA128M T/B
Figure 26. TOGGLE BIT TIMING WAVEFORMS (DURING AUTOMATIC ALGORITHMS)
tRC
Address
CE#
OE#
WE#
Q6/Q2
RY/BY#
tCH
tOEH
tDH
Valid Status
VA
tACC
tCE
tOE
tDF
tOH
Valid Status
(first read)
VA
Valid Status
(second read)(stops toggling)
VA
Valid Data
VA
Valid Data
P/N:PM1170
Note :
VA=Valid address; not required for Q6. Figure shows first two status cycle after command sequence, last status read cycle, and
array data read cycle.
REV. 0.04, JUL. 11, 2005
68
Figure 27. TOGGLE BIT ALGORITHM
MX29LA128M T/B
START
Read Q7~Q0
Read Q7~Q0
Toggle Bit Q6
=Toggle?
NO
Program/Erase Operation Not
Complete, Write Reset Command
Q5=1?
Read Q7~Q0 Twice
Toggle Bit Q6=
Toggle?
(Note 1)
NO
YES
YES
(Note 1,2)
YES
Program/Erase Operation Complete
Notes :
1. Read toggle bit twice to determine whether or not it is toggling.
2. Recheck toggle bit because it may stop toggling as Q5 changes to "1".
P/N:PM1170
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REV. 0.04, JUL. 11, 2005
Figure 28. Q6 versus Q2
MX29LA128M T/B
WE#
Q6
Q2
Enter Embedded
Erasing
Erase
Erase
Suspend
Erase Suspend
Read
Enter Erase
Suspend Program
Erase
Suspend
Program
Erase Suspend
Read
Erase
Resume
Erase
Note :
The system can use OE# or CE# to toggle Q2/Q6, Q2 toggles only when read at an address within an erase-suspended
Erase
Complete
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MX29LA128M T/B
ERASE AND PROGRAMMING PERFORMANCE (1)
PARAMETERTyp (Note 1)Max (Note 2)UnitComments
Sector Erase Time0.52secExcludes 00h
programming
Chip Erase Time12 8 256secprior to erasure
Note 6
Total Write Buffer Program Time (Note 4)24 0usExcludes
Total Accelerated Effective Write Buffer200ussystem level
Program Time (Note 4)overhead
Chip Program Time12 6secNote 7
Notes:
1. T ypical pro gram and er ase times assume the following co nditions: 25°C, 3.0V VCC. Pro gramming specificatio ns
assume checkboard data pattern.
2. Maximum values are measured at VCC = 3.0 V, worst case temperature. Maximum values are valid up to and
including 100,000 program/erase cycles.
3 . Word/Byte programming specification is based upon a single word/byte programming operation not utilizing the
write buffer .
4 . For 1-16 words or 1-32 bytes programmed in a single write buffer programming operation.
5. Effective write buffer specification is calculated on a per-word/per-byte basis for a 16-word/32-byte write buffer
operation.
6 . In the pre-programming step of the Embedded Erase algorithm, all bits are programmed to 00h before erasure.
7 . System-level overhead is the time required to execute the command sequence(s) for the program command. See
T ables 3 f o r further informatio n on co mmand definitio ns.
8 . The device has a minimum erase and program cycle endurance of 100,000 cycles.
LATCH-UP CHARACTERISTICS
MIN.MAX.
Input Voltage with respect to GND on all pins except I/O pins-1.0V13.5V
Input Voltage with respect to GND on all I/O pins-1.0VVCC + 1.0V
Current-100mA+100mA
Includes all pins except VCC. Test conditions: VCC = 3.0V, one pin at a time.
DATA RETENTION
ParameterMinUnit
Minimum Pattern Data Retention Time20Years
P/N:PM1170
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MX29LA128M T/B
TSOP PIN AND BGA PACKAGE CAPACITANCE
Parameter SymbolParameter Description Test SetTYPMAXUNIT
CINInput CapacitanceVIN=0TSOP67.5pF
CSP4.25.0pF
COUTOutput CapacitanceVOUT=0TSOP8.512pF
CSP5.46.5pF
CIN2Control Pin CapacitanceVIN=0TSOP7.59pF
CSP3.94.7pF
Notes:
1. Sampled, not 100% tested.
2. Test co nditions T A=25°C, f=1.0MHz
P/N:PM1170
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72
MX29LA128M T/B
ORDERING INFORMATION
PLASTIC P ACKA GE
PART NO.ACCESS TIMEPACKAGERemark
(ns)
MX29LA128MTTC-90R9056 Pin TSOP
(Normal Type)
MX29LA128MTTC-1010056 Pin TSOP
(Normal Type)
MX29LA128MBTC-90R9056 Pin TSOP
(Normal Type)
MX29LA128MBTC-1010056 Pin TSOP
(Normal Type)
MX29LA128MTTI-90R9056 Pin TSOP
(Normal Type)
MX29LA128MTTI-1010056 Pin TSOP
(Normal Type)
MX29LA128MBTI-90R9056 Pin TSOP
(Normal Type)
MX29LA128MBTI-1010056 Pin TSOP
(Normal Type)
P/N:PM1170
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73
PACKAGE INFORMATION
MX29LA128M T/B
P/N:PM1170
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74
MX29LA128M T/B
REVISION HISTORY
Revision No. DescriptionPageDate
0.011. Revised 90 ns as 90R ns, and added 100 ns optionP1,40,42,DEC/29/2004
P45,54
2. Removed PB free order informationP73
0.021. Changed standby current from 1uA to 20uAP1APR/21/2005
0.031. To modify WP# protect functionP1,19,23JUN/10/2005
0.041. Changed title from "Advanced Information" to "Preliminary"P1JUL/11/2005
2. To add note 7 for ILIT parameter in DC Characteristics tableP40
3. To add comments into performance tableP71
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MX29LA128M T/B
MACRONIX INTERNATIONAL CO., LTD .
Headquarters:
TEL:+886-3-578-6688
FAX:+886-3-563-2888
Europe Office :
TEL:+32-2-456-8020
FAX:+32-2-456-8021
Hong Kong Office :
TEL:+86-755-834-335-79
FAX:+86-755-834-380-78
Japan Office :
Kawasaki Office :
TEL:+81-44-246-9100
FAX:+81-44-246-9105
Osaka Office :
TEL:+81-6-4807-5460
FAX:+81-6-4807-5461
Singapore Office :
TEL:+65-6346-5505
FAX:+65-6348-8096
Taipei Office :
TEL:+886-2-2509-3300
FAX:+886-2-2509-2200
MACRONIX AMERICA, INC.
TEL:+1-408-262-8887
FAX:+1-408-262-8810
http : //www.macronix.com
MACRONIX INTERNATIONAL CO., LTD. reserves the right to change product and specifications without notice.
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