MXIC MX29F004TPC-12, MX29F004TPC-70, MX29F004TPC-90, MX29F004TQC-12, MX29F004TQC-70 Datasheet

...
FEATURES
MX29F004T/B
4M-BIT [512KX8] CMOS FLASH MEMORY
• 524,288 x 8 only
• Single power supply operation
- 5.0V only operation for read, erase and program operation
• Low power consumption
- 30mA maximum active current(5MHz)
- 1uA typical standby current
• Command register architecture
- Byte Programming (7us typical)
- Sector Erase (Sector structure:16KB/8KB/8KB/32KB and 64KBx7)
• Auto Erase (chip & sector) and Auto Program
- Automatically erase any combination of sectors with Erase Suspend capability.
- Automatically program and verify data at specified address
• Erase suspend/Erase Resume
GENERAL DESCRIPTION
The MX29F004T/B is a 4-mega bit Flash memory organized as 512K bytes of 8 bits. MXIC's Flash memories offer the most cost-effective and reliable read/ write non-volatile random access memory. The MX29F004T/B is packaged in 32-pin PLCC, TSOP, PDIP. It is designed to be reprogrammed and erased in system or in standard EPROM programmers.
The standard MX29F004T/B offers access time as fast as 70ns, allowing operation of high-speed microprocessors without wait states. To eliminate bus contention, the MX29F004T/B has separate chip enable (CE) and output enable (OE ) controls.
- Suspends an erase operation to read data from, or program data to, another sector that is not being erased, then resumes the erase.
• Status Reply
- Data polling & Toggle bit for detection of program and erase cycle completion.
• Chip protect/unprotect for 5V only system or 5V/ 12V system.
• 100,000 minimum erase/program cycles
• Latch-up protected to 100mA from -1V to VCC+1V
• Low VCC write inhibit is equal to or less than 3.2V
• Package type:
- 32-pin PLCC, TSOP or PDIP
• Compatibility with JEDEC standard
- Pinout and software compatible with single-power supply Flash
• 20 years data retention
during erase and programming, while maintaining maximum EPROM compatibility.
MXIC Flash technology reliably stores memory contents even after 100,000 erase and program cycles. The MXIC cell is designed to optimize the erase and programming mechanisms. In addition, the combination of advanced tunnel oxide processing and low internal electric fields for erase and program operations produces reliable cycling. The MX29F004T/B uses a 5.0V±10% VCC supply to perform the High Reliability Erase and auto Program/Erase algorithms.
MXIC's Flash memories augment EPROM functionality with in-circuit electrical erasure and programming. The MX29F004T/B uses a command register to manage this functionality. The command register allows for 100% TTL level control inputs and fixed power supply levels
P/N:PM0554 REV. 1.4, JUN. 12, 2001
The highest degree of latch-up protection is achieved with MXIC's proprietary non-epi process. Latch-up protection is proved for stresses up to 100 milliamps on address and data pin from -1V to VCC + 1V.
1
PIN CONFIGURATIONS
MX29F004T/B
32 PDIP
A18 A16 A15 A12
GND
A7 A6 A5 A4 A3 A2 A1 A0 Q0 Q1 Q2
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
MX29F004T/B
VCC
32
WE
31
A17
30
A14
29
A13
28
A8
27
A9
26
A11
25
OE
24
A10
23
CE
22
Q7
21
Q6
20
Q5
19
Q4
18
Q3
17
32 TSOP (Standard Type) (8mm x 20mm)
1
A11
2
A9
3
A8
4
A13
5
A14
6
A17
7
WE
A18 A16 A15 A12
8 9 10 11 12 13
A7
14
A6
15
A5
16
A4
MX29F004T/B
VCC
32 PLCC
A12
A15
A16
A18
VCCWEA17
4
5
A7 A6 A5 A4
9
A3 A2 A1 A0
13
Q0
14 17 20
Q1
32
OE
31
A10
30
CE
29
Q7
28
Q6
27
Q5
26
Q4
25
Q3
24
GND
23
Q2
22
Q1
21
Q0
20
A0
19
A1
18
A2
17
A3
1
32
MX29F004T/B
Q2
Q3Q4Q5
GND
30
29
A14 A13 A8 A9
25
A11 OE A10 CE
21
Q7
Q6
PIN DESCRIPTION
SYMBOL PIN NAME
A0~A18 Address Input Q0~Q7 Data Input/Output CE Chip Enable Input WE Write Enable Input OE Output Enable Input GND Ground Pin VCC +5.0V single power supply
P/N:PM0554 REV. 1.4, JUN. 12, 2001
2
MX29F004T/B
SECTOR STRUCTURE
MX29F004T TOP BOOT SECTOR ADDRESS TABLE
Sector Size Address Range (in hexadecimal)
Sector A18 A17 A16 A15 A14 A13 (Kbytes) (x8) Address Range
SA0000XXX 64 00000h-0FFFFh SA1001XXX 64 10000h-1FFFFh SA2010XXX 64 20000h-2FFFFh SA3011XXX 64 30000h-3FFFFh SA4100XXX 64 40000h-4FFFFh SA5101XXX 64 50000h-5FFFFh SA6110XXX 64 60000h-6FFFFh SA71110 XX 32 70000h-77FFFh SA81111 00 8 78000h-79FFFh SA91111 01 8 7A000h-7BFFFh SA10 1111 1X 16 7C000h-7FFFFh
MX29F004B BOTTEM BOOT SECTOR ADDRESS TABLE
Sector Size Address Range (in hexadecimal)
Sector A18 A17 A16 A15 A14 A13 (Kbytes) (x8) Address Range
SA00000 0X 16 00000h-03FFFh SA10000 10 8 04000h-05FFFh SA20000 11 8 06000h-07FFFh SA30001 XX 32 08000h-0FFFFh SA4001XXX 64 10000h-1FFFFh SA5010XXX 64 20000h-2FFFFh SA6011XXX 64 30000h-3FFFFh SA7100XXX 64 40000h-4FFFFh SA8101XXX 64 50000h-5FFFFh SA9110XXX 64 60000h-6FFFFh SA10 111XXX 64 70000h-7FFFFh
P/N:PM0554 REV. 1.4, JUN. 12, 2001
3
BLOCK DIAGRAM
CE OE
WE
CONTROL INPUT
LOGIC
PROGRAM/ERASE
HIGH VOLTAGE
MX29F004T/B
WRITE
STATE
MACHINE
(WSM)
A0-A18
ADDRESS
LATCH
AND
BUFFER
X-DECODER
MX29F004T/B
FLASH ARRA Y
Y-DECODER
Y-PASS GATE
SENSE
AMPLIFIER
STATE
REGISTER
ARRAY
SOURCE
HV
COMMAND
DATA DECODER
PGM
DATA
HV
COMMAND
DATA LATCH
PROGRAM
DATA LATCH
Q0-Q7
P/N:PM0554 REV. 1.4, JUN. 12, 2001
I/O BUFFER
4
MX29F004T/B
AUTOMATIC PROGRAMMING
The MX29F004T/B is byte programmable using the Automatic Programming algorithm. The Automatic Programming algorithm makes the external system do not need to have time out sequence nor to verify the data programmed. The typical chip programming time at room temperature of the MX29F004T/B is less than 4 seconds.
AUTOMATIC CHIP ERASE
The entire chip is bulk erased using 10 ms erase pulses according to MXIC's Automatic Chip Erase algorithm. Typical erasure at room temperature is accomplished in less than 4 second. The Automatic Erase algorithm automatically programs the entire array prior to electrical erase. The timing and verification of electrical erase are controlled internally within the device.
AUTOMATIC SECTOR ERASE
The MX29F004T/B is sector(s) erasable using MXIC's Auto Sector Erase algorithm. Sector erase modes allow sectors of the array to be erased in one erase cycle. The Automatic Sector Erase algorithm automatically programs the specified sector(s) prior to electrical erase. The timing and verification of electrical erase are controlled internally within the device.
AUTOMATIC ERASE ALGORITHM
MXIC's Automatic Erase algorithm requires the user to write commands to the command register using standard microprocessor write timings. The device will automatically pre-program and verification the entire array. Then the device automatically times the erase pulse width, provides the erase verify, and counts the number of sequences. A status bit toggling between consecutive read cycles provides feedback to the user as to the status of the programming operation.
Register contents serve as inputs to an internal state­machine which controls the erase and programming circuitry. During write cycles, the command register internally latches address and data needed for the programming and erase operations. During a system write cycle, addresses are latched on the falling edge of WE or CE, whicheven happens later, and data are latched on the rising edge of WE or CE, whicheven happens first.
MXIC's Flash technology combines years of EPROM experience to produce the highest levels of quality, reliability, and cost effectiveness. The MX29F004T/B electrically erases all bits simultaneously using Fowler­Nordheim tunneling. The bytes are programmed by using the EPROM programming mechanism of hot electron injection.
AUTOMATIC PROGRAMMING ALGORITHM
MXIC's Automatic Programming algorithm requires the user to only write program set-up commands (including 2 unlock write cycle and A0H) and a program command (program data and address). The device automatically times the programming pulse width, provides the program verification, and counts the number of sequences. A status bit similar to DATA polling and a status bit toggling between consecutive read cycles, provide feedback to the user as to the status of the programming operation.
P/N:PM0554 REV. 1.4, JUN. 12, 2001
During a program cycle, the state-machine will control the program sequences and command register will not respond to any command set. During a Sector Erase cycle, the command register will only respond to Erase Suspend command. After Erase Suspend is completed, the device stays in read mode. After the state machine has completed its task, it will allow the command register to respond to its full command set.
5
MX29F004T/B
TABLE1. SOFTWARE COMMAND DEFINITIONS
First Bus Second Bus Third Bus Fourth Bus Fifth Bus Sixth Bus
Command Bus Cycle Cycle Cycle Cycle Cycle Cycle
Cycle Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data Reset 1 XXXH F0H Read 1 RA RD Read Silicon ID 4 555H AAH 2AAH 55H 555H 90H ADI DDI Chip Protect Verify 4 555H AAH 2AAH 55H 555H 90H SA 00H
x02 01H Porgram 4 555H AAH 2AAH 55H 555H A0H PA PD Chip Erase 6 555H AAH 2AAH 55H 555H 80H 555H AAH 2AAH 55H 555H 10H Sector Erase 6 555H AAH 2AAH 55H 555H 80H 555H AAH 2AAH 55H SA 30H Sector Erase Suspend 1 XXXH B0H Sector Erase Resume 1 XXXH 30H Unlock for chip 6 555H AAH 2AAH 55 H 555H 80H 555H AAH 2AAH 55H 555H 20H protect/unprotect
Note:
1. ADI = Address of Device identifier; A1=0, A0 = 0 for manufacture code,A1=0, A0 =1 for device code A2~A18=Do not care. (Refer to table 3) DDI = Data of Device identifier : C2H for manufacture code, 45H/46H for device code. X = X can be VIL or VIH RA=Address of memory location to be read. RD=Data to be read at location RA.
2. PA = Address of memory location to be programmed. PD = Data to be programmed at location PA. SA = Address to the sector to be erased.
3. The system should generate the following address patterns: 555H or 2AAH to Address A10~A0. Address bit A11~A18=X=Don't care for all address commands except for Program Address (PA) and Sector Address (SA). Write Sequence may be initiated with A11~A18 in either state.
4. For Chip Protect Verify Operation :If read out data is 01H, it means the chip has been protected.If read out data is 00H, it means the chip is still not being protected.
COMMAND DEFINITIONS
Device operations are selected by writing specific address and data sequences into the command register. Writing incorrect address and data values or writing them in the improper sequence will reset the device to the read mode. Table 1 defines the valid register command sequences. Note that the Erase Suspend (B0H) and Erase Resume (30H) commands are valid only while the Sector Erase operation is in progress. Either of the two reset command sequences will reset the device(when applicable).
P/N:PM0554 REV. 1.4, JUN. 12, 2001
6
MX29F004T/B
TABLE 2. MX29F004T/B BUS OPERATION
Mode Pins
CE OE WE A0 A1 A6 A9 Q0 ~ Q7 Read Silicon ID L L H L L X VID(2) C2H Manfacturer Code(1) Read Silicon ID L L H H L X VID(2) 45H/46H Device Code(1) Read L L H A0 A1 A6 A9 D Standby H X X X X X X HIGH Z Output Disable L H H X X X X HIGH Z Write L H L A0 A1 A6 A9 DIN(3) Chip Protect with 12V L VID(2) L X X L VID(2) X system(6) Chip Unprotect with 12V L VID(2) L X X H VID(2) X system(6) Verify Chip Protect L L H X H X VID(2) Code(5) with 12V system Chip Protect without 12V L H L X X L H X system (6) Chip Unprotect without 12V L H L X X H H X system (6) Verify Chip Protect/Unprotect L L H X H X H Code(5) without 12V system (7) Reset X X X X X X X HIGH Z
OUT
NOTES:
1. Manufacturer and device codes may also be accessed via a command register write sequence. Refer to Table 1.
2. VID is the Silicon-ID-Read high voltage, 11.5V to 12.5V.
3. Refer to Table 1 for valid Data-In during a write operation.
4. X can be VIL or VIH.
5. Code=00H means unprotected. Code=01H means protected.
6. Refer to chip protect/unprotect algorithm and waveform. Must issue "unlock for chip protect/unprotect" command before "chip protect/unprotect without 12V system" command.
7. The "verify chip protect/unprotect without 12V sysytem" is only following "Chip protect/unprotect without 12V system" command.
P/N:PM0554 REV. 1.4, JUN. 12, 2001
7
MX29F004T/B
READ/RESET COMMAND
The read or reset operation is initiated by writing the read/reset command sequence into the command register. Microprocessor read cycles retrieve array data. The device remains enabled for reads until the command register contents are altered.
If program-fail or erase-fail happen, the write of F0H will reset the device to abort the operation. A valid command must then be written to place the device in the desired state.
SILICON-ID-READ COMMAND
Flash memories are intended for use in applications where the local CPU alters memory contents. As such, manufacturer and device codes must be accessible while the device resides in the target system. PROM programmers typically access signature codes by raising A9 to a high voltage. However, multiplexing high voltage onto address lines is not generally desired system design practice.
The MX29F004T/B contains a Silicon-ID-Read operation to supplement traditional PROM programming methodology. The operation is initiated by writing the read silicon ID command sequence into the command register. Following the command write, a read cycle with A1=VIL,A0=VIL retrieves the manufacturer code of C2H. A read cycle with A1=VIL, A0=VIH returns the device code of 45H/46H for MX29F004T/B.
SET-UP AUTOMATIC CHIP/SECTOR ERASE
Chip erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the "set-up" command 80H. Two more "unlock" write cycles are then followed by the chip erase command 10H.
The Automatic Chip Erase does not require the device to be entirely pre-programmed prior to executing the Automatic Chip Erase. Upon executing the Automatic Chip Erase, the device will automatically program and verify the entire memory for an all-zero data pattern. When the device is automatically verified to contain an all-zero pattern, a self-timed chip erase and verify begin. The erase and verify operations are completed when the data on Q7 is "1" at which time the device returns to the Read mode. The system is not required to provide any control or timing during these operations.
When using the Automatic Chip Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array(no erase verification command is required).
If the Erase operation was unsuccessful, the data on Q5 is "1"(see Table 4), indicating the erase operation exceed internal timing limit.
The automatic erase begins on the rising edge of the last WE or CE, whicheven happens first pulse in the command sequence and terminates when the data on Q7 is "1" and the data on Q6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode.
TABLE 3. EXPANDED SILICON ID CODE
Pins A0 A1 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Code(Hex) Manufacture code VIL VIL 11000010C2H Device code for MX29F004T VIH VIL 0100010145H Device code for MX29F004B VIH VIL 0100011046H Chip Protection Verification X VIH 0000000101H(Protected)
XVIH0000000000H(Unprotected)
P/N:PM0554 REV. 1.4, JUN. 12, 2001
8
SECTOR ERASE COMMANDS
MX29F004T/B
The Automatic Sector Erase does not require the device to be entirely pre-programmed prior to executing the Automatic Set-up Sector Erase command and Automatic Sector Erase command. Upon executing the Automatic Sector Erase command, the device will automatically program and verify the sector(s) memory for an all-zero data pattern. The system is not required to provide any control or timing during these operations.
When the sector(s) is automatically verified to contain an all-zero pattern, a self-timed sector erase and verify begin. The erase and verify operations are complete when the data on Q7 is "1" and the data on Q6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode. The system is not required to provide any control or timing during these operations.
When using the Automatic Sector Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the
memory array (no erase verifIcation command is required). Sector erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the set-up command 80H. Two more "unlock" write cycles are then followed by the sector erase command 30H. The sector address is latched on the falling edge of WE or CE, whicheven happens later, while the command(data) is latched on the rising edge of WE or CE, whicheven happens first. Sector addresses selected are loaded into internal register on the sixth falling edge of WE or CE, whicheven happens later. Each successive sector load cycle started by the falling edge of WE or CE, whicheven happens later must begin within 30us from the rising edge of the preceding WE or CE, whicheven happens first. Otherwise, the loading period ends and internal auto sector erase cycle starts. (Monitor Q3 to determine if the sector erase timer window is still open, see section Q3, Sector Erase Timer.) Any command other than Sector Erase(30H) or Erase Suspend(B0H) during the time-out period resets the device to read mode.
Table 4. Write Operation Status
Status Q7 Q6 Q5 Q3 Q2
Note1 Note2
Byte Program in Auto Program Algorithm Q7 Toggle 0 N/A No Toggle Auto Erase Algorithm 0 Toggle 0 1 Toggle
Erase Suspend Read 1 N o 0 N/A Toggle
In Progress (Erase Suspended Sector) Toggle
Erase Suspended Mode Erase Suspend Read Data Data Data Data Data
(Non-Erase Suspended Sector) Erase Suspend Program Q7 Toggle 0 N/A N/A
Byte Program in Auto Program Algorithm Q7 Toggle 1 N/A No Toggle Exceeded Auto Erase Algorithm 0 Toggle 1 1 Toggle Time Limits Erase Suspend Program Q7 Toggle 1 N/A N/A
Note:
1. Q7 and Q2 require a valid address when reading status information. Refer to the appropriate subsection for further details.
2. Q5 switches to '1' when an Auto Program or Auto Erase operation has exceeded the maximum timing limits. See "Q5:Exceeded Timing Limits " for more information.
P/N:PM0554 REV. 1.4, JUN. 12, 2001
9
MX29F004T/B
ERASE SUSPEND
This command only has meaning while the state machine is executing Automatic Sector Erase operation, and therefore will only be responded during Automatic Sector Erase operation. When the Erase Suspend command is written during a sector erase operation, the device requires a maximum of 100us to suspend the erase operations. However, When the Erase Suspend command is written during the sector erase time-out, the device immediately terminates the time-out period and suspends the erase operation. After this command has been executed, the command register will initiate erase suspend mode. The state machine will return to read mode automatically after suspend is ready. At this time, state machine only allows the command register to respond to the Read Memory Array, Erase Resume and program commands.
The system can determine the status of the program operation using the Q7 or Q6 status bits, just as in the standard program operation. After an erase-suspend program operation is complete, the system can once again read array data within non-suspended sectors.
ERASE RESUME
If the program opetation was unsuccessful, the data on Q5 is "1"(see Table 4), indicating the program operation exceed internal timing limit. The automatic programming operation is completed when the data read on Q6 stops toggling for two consecutive read cycles and the data on Q7 and Q6 are equivalent to data written to these two bits, at which time the device returns to the Read mode(no program verify command is required).
DATA POLLING-Q7
The MX29F004T/B also features Data Polling as a method to indicate to the host system that the Automatic Program or Erase algorithms are either in progress or completed.
While the Automatic Programming algorithm is in operation, an attempt to read the device will produce the complement data of the data last written to Q7. Upon completion of the Automatic Program Algorithm an attempt to read the device will produce the true data last written to Q7. The Data Polling feature is valid after the rising edge of the fourth WE or CE, whicheven happens first pulse of the four write pulse sequences for automatic program.
This command will cause the command register to clear the suspend state and return back to Sector Erase mode but only if an Erase Suspend command was previously issued. Erase Resume will not have any effect in all other conditions.Another Erase Suspend command can be written after the chip has resumed erasing.
SET-UP AUTOMATIC PROGRAM COMMANDS
To initiate Automatic Program mode, A three-cycle command sequence is required. There are two "unlock" write cycles. These are followed by writing the Automatic Program command A0H.
Once the Automatic Program command is initiated, the next WE or CE pulse causes a transition to an active programming operation. Addresses are latched on the falling edge, and data are internally latched on the rising edge of the WE or CE, whicheven happens first pulse. The rising edge of WE or CE, whicheven happens first also begins the programming operation. The system is not required to provide further controls or timings. The device will automatically provide an adequate internally generated program pulse and verify margin.
While the Automatic Erase algorithm is in operation, Q7 will read "0" until the erase operation is competed. Upon completion of the erase operation, the data on Q7 will read "1". The Data Polling feature is valid after the rising edge of the sixth WE or CE, whicheven happens first pulse of six write pulse sequences for automatic chip/ sector erase.
The Data Polling feature is active during Automatic Program/Erase algorithm or sector erase time-out.(see section Q3 Sector Erase Timer)
P/N:PM0554 REV. 1.4, JUN. 12, 2001
10
Q6:Toggle BIT I
Toggle Bit I on Q6 indicates whether an Automatic Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address, and is valid after the rising edge of the final WE or CE, whicheven happens first pulse in the command sequence(prior to the program or erase operation), and during the sector time-out.
During an Automatic Program or Erase algorithm operation, successive read cycles to any address cause Q6 to toggle. The system may use either OE or CE to control the read cycles. When the operation is complete, Q6 stops toggling.
After an erase command sequence is written, if the chip has been protected, Q6 toggles and returns to reading array data.
The system can use Q6 and Q2 together to determine whether a sector is actively erasing or is erase suspended. When the device is actively erasing (that is, the Automatic Erase algorithm is in progress), Q6 toggling. When the device enters the Erase Suspend mode, Q6 stops toggling. However, the system must also use Q2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use Q7.
If a program address falls within a protected sector, Q6 toggles for approximately 2us after the program command sequence is written, then returns to reading array data.
Q6 also toggles during the erase-suspend-program mode, and stops toggling once the Automatic Program algorithm is complete.
Table 4 shows the outputs for Toggle Bit I on Q6.
Q2:Toggle Bit II
The "Toggle Bit II" on Q2, when used with Q6, indicates whether a particular sector is actively eraseing (that is, the Automatic Erase alorithm is in process), or whether that sector is erase-suspended. Toggle Bit I is valid after the rising edge of the final WE or CE, whicheven happens first pulse in the command sequence.
MX29F004T/B
Q2 toggles when the system reads at addresses within those sectors that have been selected for erasure. (The system may use either OE or CE to control the read cycles.) But Q2 cannot distinguish whether the sector is actively erasing or is erase-suspended. Q6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sectors and mode information. Refer to Table 4 to compare outputs for Q2 and Q6.
Reading Toggle Bits Q6/ Q2
Whenever the system initially begins reading toggle bit status, it must read Q7-Q0 at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on Q7-Q0 on the following read cycle.
However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of Q5 is high (see the section on Q5). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as Q5 went high. If the toggle bit is no longer toggling, the device has successfuly completed the program or erase operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data.
The remaining scenario is that system initially determines that the toggle bit is toggling and Q5 has not gone high. The system may continue to monitor the toggle bit and Q5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation.
P/N:PM0554 REV. 1.4, JUN. 12, 2001
11
MX29F004T/B
Q5 Exceeded Timing Limits
Q5 will indicate if the program or erase time has exceeded the specified limits(internal pulse count). Under these conditions Q5 will produce a "1". This time-out condition indicates that the program or erase cycle was not successfully completed. Data Polling and Toggle Bit are the only operating functions of the device under this condition.
If this time-out condition occurs during sector erase operation, it specifies that a particular sector is bad and it may not be reused. However, other sectors are still functional and may be used for the program or erase operation. The device must be reset to use other sectors. Write the Reset command sequence to the device, and then execute program or erase command sequence. This allows the system to continue to use the other active sectors in the device.
If this time-out condition occurs during the chip erase operation, it specifies that the entire chip is bad or combination of sectors are bad.
If this time-out condition occurs during the byte programming operation, it specifies that the entire sector containing that byte is bad and this sector maynot be reused, (other sectors are still functional and can be reused).
with its control register architecture, alteration of the memory contents only occurs after successful completion of specific command sequences. The device also incorporates several features to prevent inadvertent write cycles resulting from VCC power-up and power­down transition or system noise.
Q3 Sector Erase Timer
After the completion of the initial sector erase command sequence, the sector erase time-out will begin. Q3 will remain low until the time-out is complete. Data Polling and Toggle Bit are valid after the initial sector erase command sequence.
If Data Polling or the Toggle Bit indicates the device has been written with a valid erase command, Q3 may be used to determine if the sector erase timer window is still open. If Q3 is high ("1") the internally controlled erase cycle has begun; attempts to write subsequent commands to the device will be ignored until the erase operation is completed as indicated by Data Polling or Toggle Bit. If Q3 is low ("0"), the device will accept additional sector erase commands. To insure the command has been accepted, the system software should check the status of Q3 prior to and following each subsequent sector erase command. If Q3 were high on the second status check, the command may not have been accepted.
The time-out condition may also appear if a user tries to program a non blank location without erasing. In this case the device locks out and never completes the Automatic Algorithm operation. Hence, the system never reads a valid data on Q7 bit and Q6 never stops toggling. Once the Device has exceeded timing limits, the Q5 bit will indicate a "1". Please note that this is not a device failure condition since the device was incorrectly used.
WRITE PULSE "GLITCH" PROTECTION
Noise pulses of less than 5ns(typical) on CE or WE will not initiate a write cycle.
LOGICAL INHIBIT
Writing is inhibited by holding any one of OE = VIL, CE = VIH or WE = VIH. To initiate a write cycle CE and WE must be a logical zero while OE is a logical one.
DATA PROTECTION
POWER SUPPLY DECOUPLING
The MX29F004T/B is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transition. During power up the device automatically resets the state machine in the Read mode. In addition,
P/N:PM0554 REV. 1.4, JUN. 12, 2001
In order to reduce power switching effect, each device should have a 0.1uF ceramic capacitor connected between its VCC and GND.
12
Loading...
+ 27 hidden pages