The MMA series of silicon capacitive, micromachined accelerometers
features signal conditioning, a 4–pole low pass filter and temperature
compensation. Zero–g offset full scale span and filter cut–off are factory set and
require no external devices. A full system self–test capability verifies system
functionality.
Features
• Integral Signal Conditioning
• Linear Output
• Ratiometric Performance
• 4th Order Bessel Filter Preserves Pulse Shape Integrity
• Calibrated Self–test
• Low Voltage Detect, Clock Monitor, and EPROM Parity Check Status
• Transducer Hermetically Sealed at W afer Level for Superior Reliability
Powered Acceleration (all axes)G
Unpowered Acceleration (all axes)G
Supply VoltageV
Drop Test
Storage Temperature RangeT
NOTES:
(1)
1. Dropped onto concrete surface from any axis.
(Maximum ratings are the limits to which the device can be exposed without causing permanent damage.)
RatingSymbolValueUnit
ELECTRO ST ATIC DISCHARGE (ESD)
WARNING: This device is sensitive to electrostatic
discharge.
Although the Motorola accelerometers contain internal
2kV ESD protection circuitry , extra precaution must be taken
by the user to protect the chip from ESD. A charge of over
500g
2000g
–0.3 to +7.0V
1.2m
–40 to +105°C
D
pd
upd
DD
drop
stg
2000 volts can accumulate on the human body or associated
test equipment. A charge of this magnitude can alter the performance or cause failure of the chip. When handling the
accelerometer, proper ESD precautions should be followed
to avoid exposing the device to discharges which may be
detrimental to its performance.
(Unless otherwise noted: –40°C v TA v +85°C, 4.75 v VDD v 5.25, Acceleration = 0g, Loaded output
Characteristic
Operating Range
Supply Voltage
Supply Current
Operating Temperature Range
Acceleration Range
Output Signal
Zero g (VDD = 5.0 V)
Zero g
Sensitivity (TA = 25°C, VDD = 5.0 V)
Sensitivity
Bandwidth Response
Nonlinearity
Noise
RMS (.01–1 kHz)
Power Spectral Density
Clock Noise (without RC load on output)
Self–Test
Output Response
Input Low
Input High
Input Loading
Response Time
(12)(13)
Status
Output Low (I
Output High (I
Minimum Supply Voltage (LVD Trip)V
Clock Monitor Fail Detection Frequencyf
Output Stage Performance
Electrical Saturation Recovery Time
Full Scale Output Range (I
Capacitive Load Drive
Output Impedance
Mechanical Characteristics
Transverse Sensitivity
Package Resonance
NOTES:
1. For a loaded output the measurements are observed after an RC filter consisting of a 1 kΩ resistor and a 0.01 µF capacitor to ground.
2. These limits define the range of operation for which the part will meet specification.
3. Within the supply range of 4.75 and 5.25 volts, the device operates as a fully calibrated linear accelerometer. Beyond these supply limits
the device may operate as a linear device but is not guaranteed to be in calibration.
4. The device can measure both + and * acceleration. With no input acceleration the output is at midsupply. For positive acceleration the output
will increase above VDD/2 and for negative acceleration the output will decrease below VDD/2.
5. The device is calibrated at 20g.
6. At clock frequency ^ 70 kHz.
7. The digital input pin has an internal pull–down current source to prevent inadvertent self test initiation due to external board level leakages.
8. Time for the output to reach 90% of its final value after a self–test is initiated.
9. Time for amplifiers to recover after an acceleration signal causing them to saturate.
10. Preserves phase margin (60°) to guarantee output amplifier stability.
11. A measure of the device’ s ability to reject an acceleration applied 90° from the true axis of sensitivity.
12. The Status pin output is not valid following power–up until at least one rising edge has been applied to the self–test pin. The Status pin is
high whenever the self–test input is high.
13. The Status pin output latches high if a Low Voltage Detection or Clock Frequency failure occurs, or the EPROM parity changes to odd. The
Status pin can be reset by a rising edge on self–test, unless a fault condition continues to exist.
The Motorola accelerometer is a surface–micromachined
integrated–circuit accelerometer.
The device consists of a surface micromachined capacitive sensing cell (g–cell) and a CMOS signal conditioning
ASIC contained in a single integrated circuit package. The
sensing element is sealed hermetically at the wafer level
using a bulk micromachined “cap’’ wafer .
The g–cell is a mechanical structure formed from semiconductor materials (polysilicon) using semiconductor processes (masking and etching). It can be modeled as two
stationary plates with a moveable plate in–between. The
center plate can be deflected from its rest position by subjecting the system to an acceleration (Figure 2).
When the center plate deflects, the distance from it to one
fixed plate will increase by the same amount that the distance to the other plate decreases. The change in distance is
a measure of acceleration.
The g–cell plates form two back–to–back capacitors
(Figure 3). As the center plate moves with acceleration, the
distance between the plates changes and each capacitor’s
value will change, (C = Aε/D). Where A is the area of the
plate, ε is the dielectric constant, and D is the distance
between the plates.
The CMOS ASIC uses switched capacitor techniques to
measure the g–cell capacitors and extract the acceleration
data from the difference between the two capacitors. The
ASIC also signal conditions and filters (switched capacitor)
the signal, providing a high level output voltage that is ratiometric and proportional to acceleration.
Acceleration
Self–Test
The sensor provides a self–test feature that allows the
verification of the mechanical and electrical integrity of the
accelerometer at any time before or after installation. This
feature is critical in applications such as automotive airbag
systems where system integrity must be ensured over the life
of the vehicle. A fourth “plate’’ is used in the g–cell as a self–
test plate. When the user applies a logic high input to the
self–test pin, a calibrated potential is applied across the
self–test plate and the moveable plate. The resulting electrostatic force (Fe = 1/2 AV2/d2) causes the center plate to
deflect. The resultant deflection is measured by the accelerometer’s control ASIC and a proportional output voltage
results. This procedure assures that both the mechanical
(g–cell) and electronic sections of the accelerometer are
functioning.
Ratiometricity
Ratiometricity simply means that the output offset voltage
and sensitivity will scale linearly with applied supply voltage.
That is, as you increase supply voltage the sensitivity and
offset increase linearly; as supply voltage decreases, offset
and sensitivity decrease linearly. This is a key feature when
interfacing to a microcontroller or an A/D converter because
it provides system level cancellation of supply induced errors
in the analog to digital conversion process.
Status
Motorola accelerometers include fault detection circuitry
and a fault latch. The Status pin is an output from the fault
latch, OR’d with self–test, and is set high whenever one (or
more) of the following events occur:
• Supply voltage falls below the Low Voltage Detect (LVD)
voltage threshold
• Clock oscillator falls below the clock monitor minimum
frequency
• Parity of the EPROM bits becomes odd in number.
The fault latch can be reset by a rising edge on the self–
test input pin, unless one (or more) of the fault conditions
continues to exist.
Figure 2. Transducer
Physical Model
Figure 3. Equivalent
Circuit Model
SPECIAL FEATURES
Filtering
The Motorola accelerometers contain an onboard 4–pole
switched capacitor filter. A Bessel implementation is used
because it provides a maximally flat delay response (linear
phase) thus preserving pulse shape integrity . Because the filter is realized using switched capacitor techniques, there is
no requirement for external passive components (resistors
and capacitors) to set the cut–off frequency.
unconnected.
The power supply ground.
The power supply input.
unconnected.
unconnected.
V
OUT
6
R1
1 kΩ
5
C2
0.01 µF
MMA2201D
STATUS
OUTPUT
SIGNAL
Figure 4. SOIC Accelerometer with Recommended
Connection Diagram
P1STATUS
MICROCONTROLLER
0.1 µF
P0
A/D IN
V
RH
V
SS
C
0.1 µF
V
DD
ST
V
OUT
V
SS
ACCELEROMETER
V
DD
1 kΩ
C
0.1 µF
POWER SUPPLY
R
C
0.01 µF
C
Figure 5. Recommend PCB Layout for Interfacing
Accelerometer to Microcontroller
NOTES:
• Use a 0.1 µF capacitor on VDD to decouple the power
source.
• Physical coupling distance of the accelerometer to the
microcontroller should be minimal.
• Place a ground plane beneath the accelerometer to reduce
noise, the ground plane should be attached to all of the
open ended terminals shown in Figure 5.
• Use an RC filter of 1 kΩ and 0.01 µF on the output of the
accelerometer to minimize clock noise (from the switched
capacitor filter circuit).
• PCB layout of power and ground should not couple power
supply noise.
• Accelerometer and microcontroller should not be a high
current path.
• A/D sampling rate and any external power supply switching
frequency should be selected such that they do not interfere with the internal accelerometer sampling frequency.
This will prevent aliasing errors.