The MCM6709BR is a 262,144 bit static random access memory organized as
65,536 words of 4 bits. Static design eliminates the need for external clocks or
timing strobes.
Output enable (G
) is a special control feature that provides increased system
flexibility and eliminates bus contention problems.
The MCM6709BR meets JEDEC standards and is available in a revolutionary
pinout 300 mil, 28 lead plastic surface–mount SOJ package.
• Single 5 V ± 10% Power Supply
• Fully Static — No Clock or Timing Strobes Necessary
This document contains information on a new product under development. Motorola reserves the right to change or discontinue this product without notice.
Power Supply VoltageV
Voltage Relative to VSS for Any Pin
Except V
Output Current (per I/O)I
Power DissipationP
Temperature Under BiasT
Operating TemperatureT
Storage Temperature — PlasticT
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
CC
exceeded. Functional operation should be restricted to RECOMMENDED OPERATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
SymbolValueUnit
CC
Vin, V
out
bias
stg
out
D
A
– 0.5 to + 7.0V
– 0.5 to VCC + 0.5V
± 30mA
2.0W
– 10 to + 85°C
0 to + 70°C
– 55 to + 125°C
This device contains circuitry to protect the
inputs against damage due to high static voltages or electric fields; however, it is advised
that normal precautions be taken to avoid application of any voltage higher than maximum
rated voltages to this high–impedance circuit.
This BiCMOS memory circuit has been designed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established. The circuit is in a test
socket or mounted on a printed circuit board
and transverse air flow of at least 500 linear feet
per minute is maintained.
DC OPERA TING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 10%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
ParameterSymbolMinTypMaxUnit
Supply Voltage (Operating Voltage Range)V
Input High VoltageV
Input Low VoltageV
*VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width ≤ 2.0 ns) or I ≤ 30.0 mA.
** VIL (min) = – 0.5 V dc @ 30.0 mA; VIL (min) = – 2.0 V ac (pulse width ≤ 2.0 ns) or I ≤ 30.0 mA.
CC
IH
IL
DC CHARACTERISTICS
ParameterSymbolMinMaxUnit
Input Leakage Current (All Inputs, Vin = 0 to VCC)I
Output Leakage Current (E = VIH, V
Output High Voltage (IOH = – 4.0 mA)V
Output Low Voltage (IOL = 8.0 mA)V
Read Cycle Timet
Address Access Timet
Chip Enable Access Timet
Output Enable Access Timet
Output Hold from Address Changet
Chip Enable Low to Output Activet
Output Enable Low to Output Activet
Chip Enable High to Output High–Zt
Output Enable High to Output High–Zt
NOTES:
1. W
is high for read cycle.
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus
contention conditions during read and write cycles.
3. All read cycle timings are referenced from the last valid address to the first transitioning address.
4. At any given voltage and temperature, t
device and from device to device.
5. Transition is measured 200 mV from steady–state voltage with load of Figure 1b.
The table of timing values shows either a
minimum or a maximum limit for each parameter. Input requirements are specified from
the external system point of view. Thus, address setup time is shown as a minimum
since the system must supply at least that
much time. On the other hand, responses
from the memory are specified from the device point of view. Thus, the access time is
shown as a maximum since the device never
provides data later than that time.
TIMING LIMITS
Figure 1. AC Test Loads
MCM6709BR
3
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