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products forany particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability,
including without limitation consequential or incidental damages. “Typical” parameters which may be provided in Motorola data sheets and/or specifications can and do vary in
different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
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and reasonableattorney fees arising out of, directly or indirectly,any claim of personal injuryor death associated with such unintended or unauthorizeduse, even if such claim alleges
that Motorola was negligent regarding the design or manufacture of the part. Motorola andare registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal
00.0125.JAN.03 25.JAN.03Original Version. Based on C32 user guide version 01.12
00.0207.FEB.03 07.FEB.03
00.0325.FEB.03 25.FEB.03
00.0415.APR.03 15.APR03
00.0505.MAY.03 05.MAY.03
00.0621.MAY.03 21.MAY.03
01.0015.JUL.0315.JUL03
01.0112.AUG.03 12.AUG.03Updated PARTID listing due to C128 ECO revision
01.0220.NOV.03 20.NOV.03
01.0327.NOV.03 27.NOV.03
01.0427.JAN.04 27.JAN.04
01.0511.FEB.04 11.FEB.04
Revision
Date
Effective
Date
AuthorDescription of Changes
Enhanced PortK description
Part number table revision in preface
QFP112 Emulation pinout correction
Enhanced part number explanation in preface
Reduced pseudo STOP current spec. for C64,C96,C128
Enhanced PortAD signal description
Corrected VDDR description in 2.4.2
Revised pin leakage in electrical parameters
SPI timing parameter table correction
Output drive high value reduced in 3V range
PE[4:2] Pull-Up spec out of reset changed
3V Expansion bus timing parameters not tested in production
Minimum bus frequency specification increased to 0.25MHz.
Parameter classification added to Appendix Table C-2.
IOH changed to 4mA for 3V range.
LVR level defined.for C32. Run IDD changed for C32.
Block guide reference table updated
Added PCB layout guide for Pierce oscillator configuration
IOL parameter updated in 3.3V range
Changed DOC number and CPU DOC reference number
Included separate C32 LVI levels
Changed PortM pull up reset state to enabled.
Added References to the CAN-less GC-Family
No major revision number increment, since silicon functionality is
not changed.
Added VDDX connection in PCB layout figures 8-1.to 8-6
Added Part ID for 2L45J mask set to Part ID table
Table A-4 VDD/VDDPLL min when supplied externally now 2.35V
Reference S12FTS128K1 in Preface (was S12FTS128K)
Reference to CPU Guide corrected to Version2
Corrected flash sector sizes for C-Family devices with >64K Flash
Corrected Preface Table 0-1 16K part listing to GC16 without CAN
Added PPAGE specifications to memory map diagrams
Added flash timing parameters for 1024 byte sector size
TheDeviceUser Guide provides information about the MC9S12C-Family as well the MC9S12GC-Family
devices made up of standard HCS12 blocks and the HCS12 processor core. This document is part of the
customer documentation. A completeset of device manualsalso includes the HCS12Core User Guide and
all the individual Block User Guides of the implemented modules. In an effort to reduce redundancy all
module specific information is located only in the respective Block User Guide. If applicable, special
implementation details of the module are given in the block description sections of this document.
The C-Family and the GC-Family offer an extensive range of package, temperature and speed options.
The members of the GC-Family do not feature a CAN module.
Table 0-1 shows a feature overview of the MC9S12C and MC9S12GC Family members.
Table 0-2 summarizes the package option and size configuration.
Table 0-3 lists the part number coding based on the package, speed and temperature and preliminary die
options for the C-Family.
Table 0-4 lists the part number coding based on the package, speed and temperature and preliminary die
options for the GC-Family.
Table 0-1 List of MC9S12C and MC9S12GC Family members
FlashRAMDeviceCANSCISPIA/DPWM Timer
128K4K
96K4KMC9S12C961118ch6ch8ch
64K4K
32K2K
16K1KMC9S12GC16—118ch6ch8ch
MC9S12C1281118ch6ch8ch
MC9S12GC128—118ch6ch8ch
MC9S12C641118ch6ch8ch
MC9S12GC64—118ch6ch8ch
MC9S12C321118ch6ch8ch
MC9S12GC32—118ch6ch8ch
Table 0-2 MC9S12C-Family Package Option Summary
1
PackageDevicePart Number
48LQFPMC9S12C128MC9S12C1280L09SM, V, C
52LQFPMC9S12C128MC9S12C1280L09SM, V, C35
80QFPMC9S12C128MC9S12C1280L09SM, V, C60
48LQFPMC9S12C96MC9S12C96TBDM, V, C
52LQFPMC9S12C96MC9S12C96TBDM, V, C35
80QFPMC9S12C96MC9S12C96TBDM, V, C60
Mask
set
Options
Temp.
2
FlashRAM
128K4K
96K4K
I/O3,
31
31
4
15
Device User Guide — 9S12C128DGV1/D V01.05
y
1
PackageDevicePart Number
48LQFPMC9S12C64MC9S12C64TBDM, V, C
52LQFPMC9S12C64MC9S12C64TBDM, V, C35
80QFPMC9S12C64MC9S12C64TBDM, V, C60
48LQFPMC9S12C32MC9S12C321L45JM, V, C
52LQFPMC9S12C32MC9S12C321L45JM, V, C35
3. All C-Family derivatives feature 1 CAN, 1 SCI, 1 SPI, an 8-channel A/D, a 6-channel PWM and an 8
4. I/O is the sum of ports capable to act as digital input or output.
= 85˚C, f = 25MHz. V: TA=105˚C, f = 25MHz. M: TA= 125˚C, f = 25MHz
A
channel timer. The GC-Family members do not have the CAN module
Mask
set
Options
Temp.
2
FlashRAM
64K4K
32K2K
128K4K
64K4K
32K2K
16K2K
I/O3,
31
31
31
31
31
31
4
MC9S12 C32 (P)C FU25
Temperature Options
C = -40˚C to85˚C
Speed Option
Package Option
Temperature Option
V = -40˚C to 105˚C
M = -40˚C to 125˚C
Package Options
FU =80QFP
PB = 52LQFP
Preliminary Option
FA = 48LQFP
Speed Options
Device Title
25 = 25MHz bus
16 = 16MHz bus
Controller Famil
Figure 0-1 Order Part number Coding
Table 0-3 MC9S12C-Family Part Number Coding
Part Number
MC9S12C128CFA16TBD-40˚C, 85˚C48LQFP16MHzC128 die
Mask
set
Temp.PackageSpeedDescription
16
Device User Guide — 9S12C128DGV1/D V01.05
Part Number
MC9S12C128CPB16TBD-40˚C, 85˚C52LQFP16MHzC128 die
MC9S12C128CFU16TBD-40˚C, 85˚C80QFP16MHzC128 die
MC9S12C128VFA16TBD-40˚C,105˚C48LQFP16MHzC128 die
MC9S12C128VPB16TBD-40˚C,105˚C52LQFP16MHzC128 die
MC9S12C128VFU16TBD-40˚C, 105˚C80QFP16MHzC128 die
MC9S12C128MFA16TBD-40˚C,125˚C48LQFP16MHzC128 die
MC9S12C128MPB16TBD-40˚C,125˚C52LQFP16MHzC128 die
MC9S12C128MFU16TBD-40˚C, 125˚C80QFP16MHzC128 die
MC9S12C128CFA25TBD-40˚C, 85˚C48LQFP25MHzC128 die
MC9S12C128CPB25TBD-40˚C, 85˚C52LQFP25MHzC128 die
MC9S12C128CFU25TBD-40˚C, 85˚C80QFP25MHzC128 die
MC9S12C128VFA25TBD-40˚C,105˚C48LQFP25MHzC128 die
MC9S12C128VPB25TBD-40˚C,105˚C52LQFP25MHzC128 die
MC9S12C128VFU25TBD-40˚C, 105˚C80QFP25MHzC128 die
MC9S12C128MFA25TBD-40˚C,125˚C48LQFP25MHzC128 die
MC9S12C128MPB25TBD-40˚C,125˚C52LQFP25MHzC128 die
MC9S12C128MFU25TBD-40˚C, 125˚C80QFP25MHzC128 die
MC9S12C96PCFA160L09S-40˚C, 85˚C48LQFP16MHzPreliminary C96 using C128 die
MC9S12C96PCPB160L09S-40˚C, 85˚C52LQFP16MHzPreliminary C96 using C128 die
MC9S12C96PCFU160L09S-40˚C, 85˚C80QFP16MHzPreliminary C96 using C128 die
MC9S12C96CFA16TBD-40˚C, 85˚C48LQFP16MHzFinal C96 using C96 die
MC9S12C96CPB16TBD-40˚C, 85˚C52LQFP16MHzFinal C96 using C96 die
MC9S12C96CFU16TBD-40˚C, 85˚C80QFP16MHzFinal C96 using C96 die
MC9S12C96PVFA160L09S-40˚C, 105˚C48LQFP16MHzPreliminary C96 using C128 die
MC9S12C96PVPB160L09S-40˚C, 105˚C52LQFP16MHzPreliminary C96 using C128 die
MC9S12C96PVFU160L09S-40˚C, 105˚C80QFP16MHzPreliminary C96 using C128 die
MC9S12C96VFA16TBD-40˚C,105˚C48LQFP16MHzFinal C96 using C96 die
MC9S12C96VPB16TBD-40˚C,105˚C52LQFP16MHzFinal C96 using C96die
MC9S12C96VFU16TBD-40˚C, 105˚C80QFP16MHzFinal C96 using C96 die
MC9S12C96PMFA160L09S-40˚C, 125˚C48LQFP16MHzPreliminary C96 using C128 die
MC9S12C96PMPB160L09S-40˚C, 125˚C52LQFP16MHzPreliminary C96 using C128 die
MC9S12C96PMFU160L09S-40˚C, 125˚C80QFP16MHzPreliminary C96 using C128 die
MC9S12C96MFA16TBD-40˚C,125˚C48LQFP16MHzFinal C96 using C96 die
MC9S12C96MPB16TBD-40˚C,125˚C52LQFP16MHzFinal C96 using C96 die
MC9S12C96MFU16TBD-40˚C, 125˚C80QFP16MHzFinal C96 using C96 die
MC9S12C96PCFA250L09S-40˚C, 85˚C48LQFP25MHzPreliminary C96 using C128 die
MC9S12C96PCPB250L09S-40˚C, 85˚C52LQFP25MHzPreliminary C96 using C128 die
MC9S12C96PCFU250L09S-40˚C, 85˚C80QFP25MHzPreliminary C96 using C128 die
MC9S12C96CFA25TBD-40˚C, 85˚C48LQFP25MHzFinal C96 using C96 die
MC9S12C96CPB25TBD-40˚C, 85˚C52LQFP25MHzFinal C96 using C96 die
MC9S12C96CFU25TBD-40˚C, 85˚C80QFP25MHzFinal C96 using C96 die
MC9S12C96PVFA250L09S-40˚C, 105˚C48LQFP25MHzPreliminary C96 using C128 die
MC9S12C96PVPB250L09S-40˚C, 105˚C52LQFP25MHzPreliminary C96 using C128 die
MC9S12C96PVFU250L09S-40˚C, 105˚C80QFP25MHzPreliminary C96 using C128 die
Mask
set
Temp.PackageSpeedDescription
17
Device User Guide — 9S12C128DGV1/D V01.05
Part Number
MC9S12C96VFA25TBD-40˚C,105˚C48LQFP25MHzFinal C96 using C96 die
MC9S12C96VPB25TBD-40˚C,105˚C52LQFP25MHzFinal C96 using C96 die
MC9S12C96VFU25TBD-40˚C, 105˚C80QFP25MHzFinal C96 using C96 die
MC9S12C96PMFA250L09S-40˚C, 125˚C48LQFP25MHzPreliminary C96 using C128 die
MC9S12C96PMPB250L09S-40˚C, 125˚C52LQFP25MHzPreliminary C96 using C128 die
MC9S12C96PMFU250L09S-40˚C, 125˚C80QFP25MHzPreliminary C96 using C128 die
MC9S12C96MFA25TBD-40˚C,125˚C48LQFP25MHzFinal C96 using C96 die
MC9S12C96MPB25TBD-40˚C,125˚C52LQFP25MHzFinal C96 using C96 die
MC9S12C96MFU25TBD-40˚C, 125˚C80QFP25MHzFinal C96 using C96 die
MC9S12C64PCFA160L09S-40˚C, 85˚C48LQFP16MHzPreliminary C64 using C128 die
MC9S12C64PCPB160L09S-40˚C, 85˚C52LQFP16MHzPreliminary C64 using C128 die
MC9S12C64PCFU160L09S-40˚C, 85˚C80QFP16MHzPreliminary C64 using C128 die
MC9S12C64CFA16TBD-40˚C, 85˚C48LQFP16MHzFinal C64 using C64 die
MC9S12C64CPB16TBD-40˚C, 85˚C52LQFP16MHzFinal C64 using C64 die
MC9S12C64CFU16TBD-40˚C, 85˚C80QFP16MHzFinal C64 using C64 die
MC9S12C64PVFA160L09S-40˚C, 105˚C48LQFP16MHzPreliminary C64 using C128 die
MC9S12C64PVPB160L09S-40˚C, 105˚C52LQFP16MHzPreliminary C64 using C128 die
MC9S12C64PVFU160L09S-40˚C, 105˚C80QFP16MHzPreliminary C64 using C128 die
MC9S12C64VFA16TBD-40˚C,105˚C48LQFP16MHzFinal C64 using C64 die
MC9S12C64VPB16TBD-40˚C,105˚C52LQFP16MHzFinal C64 using C64 die
MC9S12C64VFU16TBD-40˚C, 105˚C80QFP16MHzFinal C64 using C64 die
MC9S12C64PMFA160L09S-40˚C, 125˚C48LQFP16MHzPreliminary C64 using C128 die
MC9S12C64PMPB160L09S-40˚C, 125˚C52LQFP16MHzPreliminary C64 using C128 die
MC9S12C64PMFU160L09S-40˚C, 125˚C80QFP16MHzPreliminary C64 using C128 die
MC9S12C64MFA16TBD-40˚C,125˚C48LQFP16MHzFinal C64 using C64 die
MC9S12C64MPB16TBD-40˚C,125˚C52LQFP16MHzFinal C64 using C64 die
MC9S12C64MFU16TBD-40˚C, 125˚C80QFP16MHzFinal C64 using C64 die
MC9S12C64PCFA250L09S-40˚C, 85˚C48LQFP25MHzPreliminary C64 using C128 die
MC9S12C64PCPB250L09S-40˚C, 85˚C52LQFP25MHzPreliminary C64 using C128 die
MC9S12C64PCFU250L09S-40˚C, 85˚C80QFP25MHzPreliminaryC64 using C128 die
MC9S12C64CFA25TBD-40˚C, 85˚C48LQFP25MHzFinal C64 using C64 die
MC9S12C64CPB25TBD-40˚C, 85˚C52LQFP25MHzFinal C64 using C64 die
MC9S12C64CFU25TBD-40˚C, 85˚C80QFP25MHzFinal C64 using C64 die
MC9S12C64PVFA250L09S-40˚C, 105˚C48LQFP25MHzPreliminary C64 using C128 die
MC9S12C64PVPB250L09S-40˚C, 105˚C52LQFP25MHzPreliminary C64 using C128 die
MC9S12C64PVFU250L09S-40˚C, 105˚C80QFP25MHzPreliminary C64 using C128 die
MC9S12C64VFA25TBD-40˚C,105˚C48LQFP25MHzFinal C64 using C64 die
MC9S12C64VPB25TBD-40˚C,105˚C52LQFP25MHzFinal C64 using C64 die
MC9S12C64VFU25TBD-40˚C, 105˚C80QFP25MHzFinal C64 using C64 die
MC9S12C64PMFA250L09S-40˚C, 125˚C48LQFP25MHzPreliminary C64 using C128 die
MC9S12C64PMPB250L09S-40˚C, 125˚C52LQFP25MHzPreliminary C64 using C128 die
MC9S12C64PMFU250L09S-40˚C, 125˚C80QFP25MHzPreliminary C64 using C128 die
MC9S12C64MFA25TBD-40˚C,125˚C48LQFP25MHzFinal C64 using C64 die
MC9S12C64MPB25TBD-40˚C,125˚C52LQFP25MHzFinal C64 using C64 die
Mask
set
Temp.PackageSpeedDescription
18
Device User Guide — 9S12C128DGV1/D V01.05
Part Number
MC9S12C64MFU25TBD-40˚C, 125˚C80QFP25MHzFinal C64 using C64 die
MC9S12C32CFA161L45J-40˚C, 85˚C48LQFP16MHzC32 die
MC9S12C32CPB161L45J-40˚C, 85˚C52LQFP16MHzC32 die
MC9S12C32CFU161L45J-40˚C, 85˚C80QFP16MHzC32 die
MC9S12C32VFA161L45J-40˚C,105˚C48LQFP16MHzC32 die
MC9S12C32VPB161L45J-40˚C,105˚C52LQFP16MHzC32 die
MC9S12C32VFU161L45J-40˚C, 105˚C80QFP16MHzC32 die
MC9S12C32MFA161L45J-40˚C,125˚C48LQFP16MHzC32 die
MC9S12C32MPB161L45J-40˚C,125˚C52LQFP16MHzC32 die
MC9S12C32MFU161L45J-40˚C, 125˚C80QFP16MHzC32 die
MC9S12C32CFA251L45J-40˚C, 85˚C48LQFP25MHzC32 die
MC9S12C32CPB251L45J-40˚C, 85˚C52LQFP25MHzC32 die
MC9S12C32CFU251L45J-40˚C, 85˚C80QFP25MHzC32 die
MC9S12C32VFA251L45J-40˚C,105˚C48LQFP25MHzC32 die
MC9S12C32VPB251L45J-40˚C,105˚C52LQFP25MHzC32 die
MC9S12C32VFU251L45J-40˚C, 105˚C80QFP25MHzC32 die
MC9S12C32MFA251L45J-40˚C,125˚C48LQFP25MHzC32 die
MC9S12C32MPB251L45J-40˚C,125˚C52LQFP25MHzC32 die
MC9S12C32MFU251L45J-40˚C, 125˚C80QFP25MHzC32 die
Mask
set
Temp.PackageSpeedDescription
Table 0-4 MC9S12GC-Family Part Number Coding
Part Number
MC9S12GC128PCFA250L09S-40˚C, 85˚C48LQFP25MHzPreliminary GC128 using C128 die
MC9S12GC128PCPB250L09S-40˚C, 85˚C52LQFP25MHzPreliminary GC128 using C128 die
MC9S12GC128PCFU250L09S-40˚C, 85˚C80QFP25MHzPreliminary GC128 using C128 die
MC9S12GC128CFA25TBD-40˚C, 85˚C48LQFP25MHzFinal GC128 using GC128 die
MC9S12GC128CPB25TBD-40˚C, 85˚C52LQFP25MHzFinal GC128 using GC128 die
MC9S12GC128CFU25TBD-40˚C, 85˚C80QFP25MHzFinal GC128 using GC128 die
MC9S12GC128PVFA250L09S-40˚C, 105˚C48LQFP25MHzPreliminary GC128 using C128 die
MC9S12GC128PVPB250L09S-40˚C, 105˚C52LQFP25MHzPreliminary GC128 using C128 die
MC9S12GC128PVFU250L09S-40˚C, 105˚C80QFP25MHzPreliminary GC128 using C128 die
MC9S12GC128VFA25TBD-40˚C, 105˚C48LQFP25MHzFinal GC128 using GC128 die
MC9S12GC128VPB25TBD-40˚C, 105˚C52LQFP25MHzFinal GC128 using GC128 die
MC9S12GC128VFU25TBD-40˚C, 105˚C80QFP25MHzFinal GC128 using GC128 die
MC9S12GC128PMFA250L09S-40˚C, 125˚C48LQFP25MHzPreliminary GC128 using C128 die
MC9S12GC128PMPB250L09S-40˚C, 125˚C52LQFP25MHzPreliminary GC128 using C128 die
MC9S12GC128PMFU250L09S-40˚C, 125˚C80QFP25MHzPreliminary GC128 using C128 die
MC9S12GC128MFA25TBD-40˚C, 125˚C48LQFP25MHzFinal GC128 using GC128 die
MC9S12GC128MPB25TBD-40˚C, 125˚C52LQFP25MHzFinal GC128 using GC128 die
MC9S12GC128MFU25TBD-40˚C, 125˚C80QFP25MHzFinal GC128 using GC128 die
MC9S12GC64PCFA250L09S-40˚C, 85˚C48LQFP25MHzPreliminary GC64 using C128 die
MC9S12GC64PCPB250L09S-40˚C, 85˚C52LQFP25MHzPreliminary GC64 using C128 die
MC9S12GC64PCFU250L09S-40˚C, 85˚C80QFP25MHzPreliminary GC64 using C128 die
Mask
set
Temp.PackageSpeedDescription
19
Device User Guide — 9S12C128DGV1/D V01.05
Part Number
MC9S12GC64CFA25TBD-40˚C, 85˚C48LQFP25MHzFinal GC64 using GC64 die
MC9S12GC64CPB25TBD-40˚C, 85˚C52LQFP25MHzFinal GC64 using GC64 die
MC9S12GC64CFU25TBD-40˚C, 85˚C80QFP25MHzFinal GC64 using GC64 die
MC9S12GC64PVFA250L09S-40˚C, 105˚C48LQFP25MHzPreliminary GC64 using C128 die
MC9S12GC64PVPB250L09S-40˚C, 105˚C52LQFP25MHzPreliminary GC64 using C128 die
MC9S12GC64PVFU250L09S-40˚C, 105˚C80QFP25MHzPreliminary GC64 using C128 die
MC9S12GC64VFA25TBD-40˚C, 105˚C48LQFP25MHzFinal GC64 using GC64 die
MC9S12GC64VPB25TBD-40˚C, 105˚C52LQFP25MHzFinal GC64 using GC64 die
MC9S12GC64VFU25TBD-40˚C, 105˚C80QFP25MHzFinal GC64 using GC64 die
MC9S12GC64PMFA250L09S-40˚C, 125˚C48LQFP25MHzPreliminary GC64 using C128 die
MC9S12GC64PMPB250L09S-40˚C, 125˚C52LQFP25MHzPreliminary GC64 using C128 die
MC9S12GC64PMFU250L09S-40˚C, 125˚C80QFP25MHzPreliminary GC64 using C128 die
MC9S12GC64MFA25TBD-40˚C, 125˚C48LQFP25MHzFinal GC64 using GC64 die
MC9S12GC64MPB25TBD-40˚C, 125˚C52LQFP25MHzFinal GC64 using GC64 die
MC9S12GC64MFU25TBD-40˚C, 125˚C80QFP25MHzFinal GC64 using GC64 die
MC9S12GC32PCFA251L45J-40˚C, 85˚C48LQFP25MHzPreliminary GC32 using C32 die
MC9S12GC32PCPB251L45J-40˚C, 85˚C52LQFP25MHzPreliminary GC32 using C32 die
MC9S12GC32PCFU251L45J-40˚C, 85˚C80QFP25MHzPreliminary GC32 using C32 die
MC9S12GC32CFA25TBD-40˚C, 85˚C48LQFP25MHzFinal GC32 using GC32 die
MC9S12GC32CPB25TBD-40˚C, 85˚C52LQFP25MHzFinal GC32 using GC32 die
MC9S12GC32CFU25TBD-40˚C, 85˚C80QFP25MHzFinal GC32 using GC32 die
MC9S12GC32PVFA251L45J-40˚C,105˚C48LQFP25MHzPreliminary GC32 using C32 die
MC9S12GC32PVPB251L45J-40˚C,105˚C52LQFP25MHzPreliminary GC32 using C32 die
MC9S12GC32PVFU251L45J-40˚C, 105˚C80QFP25MHzPreliminary GC32 using C32 die
MC9S12GC32VFA25TBD-40˚C,105˚C48LQFP25MHzFinal GC32 using GC32 die
MC9S12GC32VPB25TBD-40˚C,105˚C52LQFP25MHzFinal GC32 using GC32 die
MC9S12GC32VFU25TBD-40˚C, 105˚C80QFP25MHzFinal GC32 using GC32 die
MC9S12GC32PMFA251L45J-40˚C,125˚C48LQFP25MHzPreliminary GC32 using C32 die
MC9S12GC32PMPB251L45J-40˚C,125˚C52LQFP25MHzPreliminary GC32 using C32 die
MC9S12GC32PMFU251L45J-40˚C, 125˚C80QFP25MHzPreliminary GC32 using C32 die
MC9S12GC32MFA25TBD-40˚C,125˚C48LQFP25MHzFinal GC32 using GC32 die
MC9S12GC32MPB25TBD-40˚C,125˚C52LQFP25MHzFinal GC32 using GC32 die
MC9S12GC32MFU25TBD-40˚C, 125˚C80QFP25MHzFinal GC32 using GC32 die
MC9S12GC16PCFA251L45J-40˚C, 85˚C48LQFP25MHzPreliminary GC16 using C32 die
MC9S12GC16PCPB251L45J-40˚C, 85˚C52LQFP25MHzPreliminary GC16 using C32 die
MC9S12GC16PCFU251L45J-40˚C, 85˚C80QFP25MHzPreliminary GC16 using C32 die
MC9S12GC16CFA25TBD-40˚C, 85˚C48LQFP25MHzFinal GC16 using GC16 die
MC9S12GC16CPB25TBD-40˚C, 85˚C52LQFP25MHzFinal GC16 using GC16 die
MC9S12GC16CFU25TBD-40˚C, 85˚C80QFP25MHzFinal GC16 using GC16 die
MC9S12GC16PVFA251L45J-40˚C,105˚C48LQFP25MHzPreliminary GC16 using C32 die
MC9S12GC16PVPB251L45J-40˚C,105˚C52LQFP25MHzPreliminary GC16 using C32 die
MC9S12GC16PVFU251L45J-40˚C, 105˚C80QFP25MHzPreliminary GC16 using C32 die
MC9S12GC16VFA25TBD-40˚C,105˚C48LQFP25MHzFinal GC16 using GC16 die
MC9S12GC16VPB25TBD-40˚C,105˚C52LQFP25MHzFinal GC16 using GC16 die
Mask
set
Temp.PackageSpeedDescription
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Device User Guide — 9S12C128DGV1/D V01.05
Part Number
MC9S12GC16VFU25TBD-40˚C, 105˚C80QFP25MHzFinal GC16 using GC16 die
MC9S12GC16PMFA251L45J-40˚C,125˚C48LQFP25MHzPreliminary GC16 using C32 die
MC9S12GC16PMPB251L45J-40˚C,125˚C52LQFP25MHzPreliminary GC16 using C32 die
MC9S12GC16PMFU251L45J-40˚C, 125˚C80QFP25MHzPreliminary GC16 using C32 die
MC9S12GC16MFA25TBD-40˚C,125˚C48LQFP25MHzFinal GC16 using GC16 die
MC9S12GC16MPB25TBD-40˚C,125˚C52LQFP25MHzFinal GC16 using GC16 die
MC9S12GC16MFU25TBD-40˚C, 125˚C80QFP25MHzFinal GC16 using GC16 die
1. For the GC16 refer to the 16K flash, for the C32 and GC32 refer to the 32K flash, for the C64 and GC64 the 64K flash, for
the C96 the 96K flash and C128 the 128K flash document.
2. Not available on the GC-Family members
1
CPU12 Reference ManualV02S12CPUV2/D
HCS12 Debug (DBG) Block GuideV01S12DBGV1/D
HCS12 Interrupt (INT) Block GuideV01S12INTV1/D
Voltage Regulator (VREG) Block GuideV02S12VREG3V3V2/D
Oscillator (OSC) Block GuideV02S12OSCV2/D
VersionDocument Order Number
2
V02S12MSCANV2/D
Terminology
New or invented terms, symbols, and notations
Acronyms and Abbreviations
21
Device User Guide — 9S12C128DGV1/D V01.05
22
Device User Guide — 9S12C128DGV1/D V01.05
Section 1 Introduction
1.1 Overview
The MC9S12C-Family and the MC9S12GC-Family is a 48/52/80 pin Flash-based Industrial/Automotive
network control MCU family. Members of the MC9S12C-Family and the MC9S12GC-Family deliver the
power and flexibility of our 16 Bit core (CPU12) family to a whole new range of cost and space sensitive,
general purpose Industrial and Automotive network applications. All MC9S12C-Family and
MC9S12GC-Family members are comprised of standard on-chip peripherals including a 16-bit central
processing unit (CPU12), up to 128K bytes of Flash EEPROM, up to 4K bytes of RAM, an asynchronous
serial communications interface (SCI), a serial peripheral interface (SPI), an 8-channel 16-bit timer
module (TIM), a 6-channel 8-bit Pulse Width Modulator (PWM), an 8-channel, 10-bit analog-to-digital
converter (ADC). The MC9S12C-Family members also feature a CAN 2.0 A, B software compatible
module (MSCAN12). The MC9S12C-Family as well as the MC9S12GC-Family has full 16-bit data paths
throughout. The inclusion of a PLL circuit allows power consumption and performance to be adjusted to
suit operational requirements. In addition to the I/O ports available in each module, up to 10 dedicated I/O
port bits are available with Wake-Up capability from STOP or WAIT mode. The MC9S12C-Family and
the MC9S12GC-Family devices are available in 48, 52 and 80 pin QFP packages, with the 80 Pin version
pin compatible to the HCS12 A, B and D- Family derivatives.
1.2 Features
•16-bit HCS12 CORE
–HCS12 CPU
i. Upward compatible with M68HC11 instruction set
ii. Interrupt stacking and programmer’s model identical to M68HC11
iii.Instruction queue
iv.Enhanced indexed addressing
–MMC (memory map and interface)
–INT (interrupt control)
–BDM (background debug mode)
–DBG12 (enhanced debug12 module, including breakpoints and change-of-flow trace buffer)
–MEBI: Multiplexed Expansion Bus Interface (available only in 80 pin package version)
•Wake-up interrupt inputs
–Up to 12-port bits available for wake up interrupt function with digital filtering
•Memory options
–16K or 32KByte Flash EEPROM (erasable in 512-byte sectors)
64K, 96K or 128KByte Flash EEPROM (erasable in 1024-byte sectors)
•Available on MC9S12C-Family:
One 1M bit per second, CAN 2.0 A, B software compatible module
–Five receive and three transmit buffers
–Flexible identifier filter programmable as 2 x 32 bit, 4 x 16 bit or 8x8bit
–Four separate interrupt channels for Rx, Tx, error and wake-up
–Low-pass filter wake-up function
–Loop-back for self test operation
•Timer Module (TIM)
–8-Channel Timer
–Each Channel Configurable as either Input Capture or Output Compare
–Simple PWM Mode
–Modulo Reset of Timer Counter
–16-Bit Pulse Accumulator
–External Event Counting
–Gated Time Accumulation
•6 PWM channels
–Programmable period and duty cycle
–8-bit 6-channel or 16-bit 3-channel
–Separate control for each pulse width and duty cycle
–Center-aligned or left-aligned outputs
–Programmable clock select logic with a wide range of frequencies
–Fast emergency shutdown input
•Serial interfaces
–One asynchronous serial communications interface (SCI)
–One synchronous serial peripheral interface (SPI)
–Pierce or low current Colpitts oscillator
–Phase-locked loop clock frequency multiplier
–Limp home mode in absence of external clock
–Low power 0.5 to 16 MHz crystal oscillator reference clock
•Operating frequency
–32MHz equivalent to 16MHz Bus Speed for single chip
–32MHz equivalent to 16MHz Bus Speed in expanded bus modes
–Option of 9S12C-Family: 50MHz equivalent to 25MHz Bus Speed
–All 9S12GC-Family Members allow a 50MHz operting frequency.
•Internal 2.5V Regulator
–Supports an input voltage range from 2.97V to 5.5V
–Low power mode capability
–Includes low voltage reset (LVR) circuitry
–Includes low voltage interrupt (LVI) circuitry
•48-Pin LQFP, 52-Pin LQFP or 80-Pin QFP package
–Up to 58 I/O lines with 5V input and drive capability (80 pin package)
–Up to 2 dedicated 5V input only lines (IRQ, XIRQ)
–5V 8 A/D converter inputs and 5V I/O
•Development support
–Single-wire background debug™ mode (BDM)
–On-chip hardware breakpoints
–Enhanced DBG12 debug features
1.3 Modes of Operation
User modes (Expanded modes are only available in the 80 pin package version).
The part ID is located in two 8-bit registers PARTIDH and PARTIDL (addresses $001A and $001B after
reset). The read-only value is a unique part ID for each revision of the chip. Table 1-3 shows the assigned
part ID numbers.
1. The coding is as follows:
Bit 15-12: Major family identifier
Bit 11-8: Minor family identifier
Bit 7-4: Major mask set revision number including FAB transfers
Bit 3-0: Minor - non full - mask set revision
Part ID
1
The device memory sizes are located in two 8-bit registers MEMSIZ0 and MEMSIZ1 (addresses $001C
and$001D after reset). Table 1-4shows the read-only values oftheseregisters. Refer to Module Mapping
and Control (MMC) Block Guide for further details.
Figure 2-3 Pin Assignments in 48 LQFP for MC9S12C-Family
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Device User Guide — 9S12C128DGV1/D V01.05
2.2 Signal Properties Summary
Table 2-1 Signal Properties
Internal Pull
Pin Name
Function 1
EXTAL——VDDPLLNANA
XTAL——VDDPLLNANA
RESET——VDDXNoneNoneExternal reset pin
XFC——VDDPLLNANAPLL loop filter pin
TESTVPP—VSSXNANATest pin only
BKGDMODC
PE7NOACC
PE6IPIPE1MODBVDDX
PE5IPIPE0MODAVDDX
PE4ECLK—VDDXPUCR
PE3
PE2R/
PE1IRQ—VDDXPUCRUpPort E input, external interrupt pin
PE0
PA[7:3]
PA[2:1]
PA[0]
PB[7:5]
PB[4]
PB[3:0]
PAD[7:0]AN[7:0]—VDDA
PP[7]KWP[7]—VDDX
PP[6]KWP[6]ROMCTLVDDX
PP[5]KWP[5]PW5VDDX
Pin Name
Function 2
LSTRBTAGLOVDDXPUCR
W—VDDXPUCR
XIRQ—VDDXPUCRUpPort E input, non-maskable interrupt pin
ADDR[15:1/
DATA[15:1]
ADDR[10:9/
DATA[10:9]
ADDR[8]/
DATA[8]
ADDR[7:5]/
DATA[7:5]
ADDR[4]/
DATA[4]
ADDR[3:0]/
DATA[3:0]
Pin Name
Function 3
TAGHIVDDXUpUpBackground debug, mode pin, tag signal high
XCLKSVDDXPUCRUpPort E I/O pin, access, clock select
—VDDXPUCRDisabled Port A I/O pin & multiplexed address/data
Power
Domain
—VDDXPUCRDisabled Port A I/O pin & multiplexed address/data
—VDDXPUCRDisabled Port A I/O pin & multiplexed address/data
—VDDXPUCRDisabled Port B I/O pin & multiplexed address/data
—VDDXPUCRDisabled Port B I/O pin & multiplexed address/data
—VDDXPUCRDisabled Port B I/O pin & multiplexed address/data
PP[4:3]KWP[4:3]PW[4:3]VDDX
Resistor
CTRL
While
pin is low: Down
While RESET
pin is low: Down
PERAD/P
PSAD
PERP/
PPSP
PERP/
PPSP
PERP/
PPSP
PERP/
PPSP
Reset
State
RESET
Mode
Dep
Mode
Dep
Mode
Dep
Disabled Port AD I/O pins and ATD inputs
Disabled Port P I/O Pins and keypad wake-up
Disabled
Disabled Port P I/O Pin, keypad wake-up, PW5 output
Disabled Port P I/O Pin, keypad wake-up, PWM output
Description
Oscillator pins
Port E I/O pin and pipe status
Port E I/O pin and pipe status
Port E I/O pin, bus clock output
1
Port E I/O pin, low strobe, tag signal low
(1)
Port E I/O pin, R/W in expanded modes
(1)
Port P I/O Pins, keypad wake-up and ROMON
enable.
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Device User Guide — 9S12C128DGV1/D V01.05
Internal Pull
Pin Name
Function 1
PP[2:0]KWP[2:0]PW[2:0]VDDX
PJ[7:6]KWJ[7:6]—VDDX
PM5SCK—VDDX
PM4
PM3
PM2
PM1TXCAN—VDDX
PM0RXCAN—VDDX
PS[3:2]——VDDX
PS1TXD—VDDX
PS0RXD—VDDX
PT[7:5]IOC[7:5]—VDDX
PT[4:0]IOC[4:0]PW[4:0]VDDX
NOTES:
1. The PortE output buffer enable signal control at reset is determined by the PEAR register and is mode dependent. E.g. in
special test mode RDWE=LSTRE=1 which enables the PE[3:2] output buffers and disables the pull-ups. Refer to S12_MEBI
user guide for PEAR register details.
2. CAN functionality is not available on the MC9S12GC-Family members
Pin Name
Function 2
MOSI
SS—VDDX
MISO
Pin Name
Function 3
—VDDX
—VDDX
Power
Domain
Resistor
CTRL
PERP/
PPSP
PERJ/
PPSJ
PERM/
PPSM
PERM/
PPSM
PERM/
PPSM
PERM/
PPSM
PERM/
PPSM
PERM/
PPSM
PERS/
PPSS
PERS/
PPSS
PERS/
PPSS
PERT/
PPST
PERT/
PPST
Reset
State
Disabled Port P I/O Pins, keypad wake-up, PWM outputs
Disabled Port J I/O Pins and keypad wake-up
UpPort M I/O Pin and SPI SCK signal
UpPort M I/O Pin and SPI
UpPort M I/O Pin and SPI SS signal
UpPort M I/O Pin and SPI
Up
Up
UpPort S I/O Pins
UpPort S I/O Pin and SCI transmit signal
UpPort S I/O Pin and SCI receive signal
Disabled Port T I/O Pins shared with timer (TIM)
Disabled Port T I/O Pins shared with timer and PWM
Not Bonded Pins If the port pins are not bonded out in the chosen package the user should initialize the
registers to be inputs with enabled pull resistance to avoid excess current consumption. This applies to the
following pins:
(48LQFP): Port A[7:1], Port B[7:5], Port B[3:0], PortE[6,5,3,2], Port P[7:6], PortP[4:0], Port J[7:6],
PortS[3:2]
(52LQFP): Port A[7:3], Port B[7:5], Port B[3:0], PortE[6,5,3,2], Port P[7:6], PortP[2:0], Port J[7:6],
PortS[3:2]
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Device User Guide — 9S12C128DGV1/D V01.05
2.3 Detailed Signal Descriptions
2.3.1 EXTAL, XTAL — Oscillator Pins
EXTAL and XTAL arethe crystal driver and external clock pins.On reset all the device clocks arederived
from the EXTAL input frequency. XTAL is the crystal output.
2.3.2 RESET — External Reset Pin
RESET is an active low bidirectional control signal that acts as an input to initialize the MCU to a known
start-up state. It also acts as an open-drain output to indicate that an internal failure has been detected in
either the clock monitor or COP watchdog circuit. External circuitry connected to the RESET pin should
not include alarge capacitance that would interfere with the ability of this signal to rise to a valid logic one
within 32 ECLK cycles after the low drive is released. Upon detection of any reset, an internal circuit
drives the RESET pin low and a clocked reset sequence controls when the MCU can begin normal
processing.
2.3.3 TEST / VPP — Test Pin
This pin is reserved for test and must be tied to VSS in all applications.
2.3.4 XFC — PLL Loop Filter Pin
Dedicated pin used to create the PLL loop filter. See CRG BUG for more detailed information.PLL loop
filter. Please ask your Motorola representative for the interactive application note to compute PLL loop
filter elements. Any current leakage on this pin must be avoided.
XFC
R
0
MCU
C
S
Figure 2-4 PLL Loop Filter Connections
C
P
VDDPLLVDDPLL
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Device User Guide — 9S12C128DGV1/D V01.05
2.3.5 BKGD / TAGHI / MODC — Background Debug, Tag High & Mode Pin
The BKGD / TAGHI / MODC pin is used as a pseudo-open-drain pin for the background debug
communication. In MCU expanded modes of operation when instruction tagging is on, an input low on
this pin during the falling edge of E-clock tags the high half of the instruction word being read into the
instruction queue. It is also used as a MCU operating mode select pin at the rising edge during reset, when
the state of this pin is latched to the MODC bit.
2.3.6 PA[7:0] / ADDR[15:8] / DATA[15:8] — Port A I/O Pins
PA7-PA0 are general purpose input or output pins,. In MCU expanded modes of operation, these pins are
used for the multiplexed external address and data bus. PA[7:1] pins are not available in the 48 package
version. PA[7:3] are not available in the 52 pin package version.
2.3.7 PB[7:0] / ADDR[7:0] / DATA[7:0] — Port B I/O Pins
PB7-PB0 are general purpose input or output pins. In MCU expanded modes of operation, these pins are
used for the multiplexed external address and data bus. PB[7:5] and PB[3:0] pins are not available in the
48 nor 52 pin package version.
2.3.8 PE7 / NOACC / XCLKS — Port E I/O Pin 7
PE7 is a general purpose input or output pin. During MCU expanded modes of operation, the NOACC
signal, when enabled, is used to indicate that the current bus cycle is an unused or “free” cycle. This signal
will assert when the CPU is not using the bus.The XCLKS is an input signal which controls whether a
crystal in combination with the internal Colpitts (low power) oscillator is used or whether Pierce
oscillator/external clock circuitry is used. The state of this pin is latched at the rising edge of RESET. If
the input is a logic low the EXTAL pin is configured for an external clock drive or a Pierce Oscillator. If
input is a logic high a Colpitts oscillator circuit is configured on EXTAL and XTAL. Since this pin is an
input with a pull-up device during reset, if the pin is left floating, the default configuration is a Colpitts
oscillator circuit on EXTAL and XTAL.
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Device User Guide — 9S12C128DGV1/D V01.05
EXTAL
CDC*
MCU
C
1
Crystal or
ceramic resonator
XTAL
C
2
VSSPLL
* Due to the nature of a translated ground Colpitts oscillator a
DC voltage bias is applied to the crystal
.Please contact the crystal manufacturer for crystal DC
* Rs can be zero (shorted) when use with higher frequency crystals.
Refer to manufacturer’s data.
Figure 2-6 Pierce Oscillator Connections (PE7=0)
MCU
EXTAL
XTAL
not connected
CMOS-COMPATIBLE
EXTERNAL OSCILLATO
(VDDPLL-Level)
R
Figure 2-7 External Clock Connections (PE7=0)
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Device User Guide — 9S12C128DGV1/D V01.05
2.3.9 PE6 / MODB / IPIPE1 — Port E I/O Pin 6
PE6 is a general purpose input or output pin. It is used as a MCU operating mode select pin during reset.
The state of this pin is latched to the MODB bit at the rising edge of RESET. This pin is shared with the
instruction queue tracking signal IPIPE1}. This pin is an input with a pull-down device which is only
active when RESET is low. PE[6] is not available in the 48 / 52 pin package versions.
2.3.10 PE5 / MODA / IPIPE0 — Port E I/O Pin 5
PE5 is a general purpose input or output pin. It is used as a MCU operating mode select pin during reset.
The state of this pin is latched to the MODA bit at the rising edge of RESET. This pin is shared with the
instruction queue tracking signal IPIPE0}. This pin is an input with a pull-down device which is only
active when RESET is low. This pin is not available in the 48 / 52 pin package versions.
2.3.11 PE4 / ECLK— Port E I/O Pin [4] / E-Clock Output
ECLK is the output connection for the internal bus clock. It is used to demultiplex the address and data in
expanded modes and is used as a timing reference. ECLK frequency is equal to 1/2 the crystal frequency
out of reset. The ECLK pin is initially configured as ECLK output with stretch in all expanded modes. The
E clock output function depends upon the settings of the NECLK bit in the PEAR register, the IVIS bit in
the MODE register and the ESTR bit in the EBICTL register. All clocks, including the E clock, are halted
when the MCU is in STOP mode. It is possible to configure the MCU to interface to slow external
memory. ECLK can be stretched for such accesses. Reference the MISC register (EXSTR[1:0] bits) for
more information. In normal expanded narrow mode, the E clock is available for use in external select
decode logic or as a constant speed clock for use in the external application system. Alternatively PE4 can
be used as a general purpose input or output pin.
2.3.12 PE3 / LSTRB — Port E I/O Pin [3] / Low-Byte Strobe (LSTRB)
In all modes this pin can be used as a general-purpose I/O and is an input with an active pull-up out of
reset. If the strobe function is required,it should be enabled by setting the LSTRE bit inthe PEAR register.
This signal is used in write operations. Therefore external low byte writes will not be possible until this
function is enabled. This pin is also used as
LSTRB function. This pin is not available in the 48 / 52 pin package versions.
the
TAGLO in Special Expanded modes and is multiplexed with
2.3.13 PE2 / R/W — Port E I/O Pin [2] / Read/Write
In all modes this pin can be used as a general-purpose I/O and is an input with an active pull-up out of
reset. If the read/write function is required it should be enabled by setting the RDWE bit in the PEAR
register. External writes will not be possible until enabled. This pin is not available in the 48 / 52 pin
package versions.
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Device User Guide — 9S12C128DGV1/D V01.05
2.3.14 PE1 / IRQ — Port E input Pin [1] / Maskable Interrupt Pin
The IRQ input provides a means of applying asynchronous interrupt requests to the MCU. Either falling
edge-sensitive triggering or level-sensitive triggering is program selectable (INTCR register).
always enabled and configured to level-sensitive triggering out of reset. It can be disabled by clearing
IRQEN bit (INTCR register). When the MCU is reset the
register. This pin is always an input and can always be read. There is an active pull-up on this pin while in
reset and immediately out of reset. The pull-up can be turned off by clearing PUPEE in the PUCR register.
IRQ function is masked in the condition code
IRQ is
2.3.15 PE0 / XIRQ — Port E input Pin [0] / Non Maskable Interrupt Pin
The XIRQ input provides a means of requesting a non maskable interrupt after reset initialization. During
reset, the X bit in the condition code register (CCR) is set and any interrupt is masked until MCU software
enables it. Because the
network. This pin is always an input and can always be read. There is an active pull-up on this pin while
in reset and immediately out of reset. The pull-up can be turned off by clearing PUPEE in the PUCR
register.
XIRQ input is level sensitive, it can be connected to a multiple-source wired-OR
2.3.16 PAD[7:0] / AN[7:0] — Port AD I/O Pins [7:0]
PAD7-PAD0 are general purpose I/O pins and also analog inputs for the analog to digital converter. In
order to use a PAD pin as a standard I/O, the corresponding ATDDIEN register bit must be set. These bits
are cleared out of reset to configure the PAD pins for A/D operation.
When the A/D converter is active in multi-channel mode, port inputs are scanned and converted
irrespective of PortAD configuration. Thus PortAD pins that are configured as digital inputs or digital
outputs are also converted in the A/D conversion sequence.
2.3.17 PP[7] / KWP[7] — Port P I/O Pin [7]
PP7 is a general purpose input or output pin, shared with the keypad interrupt function. When configured
as an input, it can generate interrupts causing the MCU to exit STOP or WAIT mode. This pin is not
available in the 48 / 52 pin package versions.
2.3.18 PP[6] / KWP[6]/ROMCTL — Port P I/O Pin [6]
PP6 is a general purpose input or output pin, shared with the keypad interrupt function. When configured
as an input, it can generate interrupts causing the MCU to exit STOP or WAIT mode. This pin is not
available in the 48 / 52 pin package versions. During MCU expanded modes of operation, this pin is used
to enable the Flash EEPROM memory in the memory map (ROMCTL). At the rising edge of RESET, the
state of this pin is latched to the ROMON bit.
PP6=1 in emulation modes equates to ROMON =0 (ROM space externally mapped)
PP6=0 in expanded modes equates to ROMON =0 (ROM space externally mapped)
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Device User Guide — 9S12C128DGV1/D V01.05
2.3.19 PP[5:0] / KWP[5:0] / PW[5:0] — Port P I/O Pins [5:0]
PP[5:0] are general purpose input or output pins, shared with the keypad interrupt function. When
configured as inputs, they can generate interrupts causing the MCU to exit STOP or WAIT mode.
PP[5:0] are also shared with the PWM output signals, PW[5:0]. Pins PP[2:0] are only available in the 80
pin package version. Pins PP[4:3] are not available in the 48 pin package version.
2.3.20 PJ[7:6] / KWJ[7:6] — Port J I/O Pins [7:6]
PJ[7:6] are general purpose input or output pins, shared with the keypad interrupt function. When
configured as inputs, they can generate interrupts causing the MCU to exit STOP or WAIT mode. These
pins are not available in the 48 pin package version nor in the 52 pin package version.
2.3.21 PM5 / SCK — Port M I/O Pin 5
PM5 is a general purpose input or output pin and also the serial clock pin SCK for the Serial Peripheral
Interface (SPI).
2.3.22 PM4 / MOSI — Port M I/O Pin 4
PM4 is a general purpose input or output pin and also the master output (during master mode) or slave
input (during slave mode) pin for the Serial Peripheral Interface (SPI).
2.3.23 PM3 / SS — Port M I/O Pin 3
PM3 is a general purpose input or output pin and also the slave select pin SS for the Serial Peripheral
Interface (SPI).
2.3.24 PM2 / MISO — Port M I/O Pin 2
PM2 is a general purpose input or output pin and also the master input (during master mode) or slave
output (during slave mode) pin for the Serial Peripheral Interface (SPI).
2.3.25 PM1 / TXCAN — Port M I/O Pin 1
PM1 is a general purpose input or output pin and the transmit pin, TXCAN, of the CAN module if
available.
2.3.26 PM0 / RXCAN — Port M I/O Pin 0
PM0 is a generalpurpose input or output pin and thereceive pin, RXCAN, of the CAN moduleif available.
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Device User Guide — 9S12C128DGV1/D V01.05
2.3.27 PS[3:2] — Port S I/O Pins [3:2]
PS3 and PS2 are general purpose input or output pins. These pins are not available in the 48 / 52 pin
package versions.
2.3.28 PS1 / TXD — Port S I/O Pin 1
PS1 is a general purpose input or output pin and the transmit pin,TXD, of SerialCommunication Interface
(SCI).
2.3.29 PS0 / RXD — Port S I/O Pin 0
PS0 is a general purpose input or output pin and the receive pin, RXD, of Serial Communication Interface
(SCI).
2.3.30 PPT[7:5] / IOC[7:5] — Port T I/O Pins [7:5]
PT7-PT5 are general purpose input or output pins. They can also be configured as the timer system input
capture or output compare pins IOC7-IOC5.
2.3.31 PT[4:0] / IOC[4:0] / PW[4:0]— Port T I/O Pins [4:0]
PT4-PT0 are general purpose input or output pins. They can also be configured as the timer system input
capture or output compare pins IOC4-IOC0 or as the PWM outputs PW[4:0].
2.4 Power Supply Pins
2.4.1 VDDX,VSSX — Power & Ground Pins for I/O Drivers
External power and ground for I/O drivers. Bypass requirements depend on how heavily the MCU pins
are loaded.
2.4.2 VDDR, VSSR — Power & Ground Pins for I/O Drivers & for Internal
Voltage Regulator
External power and ground for the internal voltage regulator. Connecting VDDR to ground disables the
internal voltage regulator.
2.4.3 VDD1, VDD2, VSS1, VSS2 — Internal Logic Power Pins
Power is supplied to the MCU through VDD and VSS. This 2.5V supply is derived from the internal
voltage regulator. There is no static load on those pins allowed. The internal voltage regulator is turned
off, if VDDR is tied to ground.
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Device User Guide — 9S12C128DGV1/D V01.05
2.4.4 VDDA, VSSA — Power Supply Pins for ATD and VREG
VDDA, VSSA are the power supply and ground input pins for the voltage regulator reference and the
analog to digital converter.
2.4.5 VRH, VRL — ATD Reference Voltage Input Pins
VRH and VRL are the reference voltage input pins for the analog to digital converter.
2.4.6 VDDPLL, VSSPLL — Power Supply Pins for PLL
Provides operating voltage and ground for the Oscillator and the Phased-Locked Loop. This allows the
supply voltage to the Oscillator and PLL to be bypassed independently. This 2.5V voltage is generated by
the internal voltage regulator.
Table 2-2 MC9S12C-Family Power and Ground Connection Summary
Mnemonic
VDD1
VDD2
VSS1
VSS2
VDDR5.0 V
VSSR0 V
VDDX5.0 V
VSSX0 V
VDDA5.0 VOperating voltage and ground for the analog-to-digital converters and the
VSSA0 V
VRH5.0 V
VRL0 V
VDDPLL2.5 VProvides operating voltage and ground for the Phased-Locked Loop. This
VSSPLL0 V
Nominal
Voltage
2.5 V
0V
Description
Internal power and ground generated by internal regulator. These also
allow an external source to supply the core VDD/VSS voltages and bypass
the internal voltage regulator.
In the 48 and 52 LQFP packages VDD2 and VSS2 are not available.
External power and ground, supply to internal voltage regulator.
External power and ground, supply to pin drivers.
reference for the internal voltageregulator,allowsthe supply voltage to the
A/D to be bypassed independently.
Reference voltage low for the ATD converter.
In the 48 and 52 LQFP packages VRL is bonded to VSSA.
allows the supply voltage to the PLL to be bypassed independently.
Internal power and ground generated by internal regulator.
NOTE:
All VSS pins must be connected together in the application. Because fast signal transitions
place high, short-duration current demands on the power supply, use bypass capacitors with
high-frequency characteristics and place them as close to the MCU as possible. Bypass requirements
depend on MCU pin load.
Section 3 System Clock Description
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Device User Guide — 9S12C128DGV1/D V01.05
The Clock and Reset Generator provides the internal clock signals for the core and all peripheral modules.
Figure 3-1 shows the clock connections from the CRG to all modules. Consult the CRG Block User
Guide for details on clock generation.
EXTAL
XTAL
CRG
core clock
bus clock
oscillator clock
Figure 3-1 Clock Connections
S12_CORE
Flash
RAM
TIM
ATD
PIM
SCI
SPI
MSCAN
Not on 9S12GC
VREG
TPM
Section 4 Modes of Operation
4.1 Overview
Eight possible modes determine the operating configuration of the MC9S12C Family. Each mode has an
associated default memory map and external bus configuration controlled by a further pin.
Three low power modes exist for the device.
4.2 Chip Configuration Summary
The operating mode out ofresetis determined by the statesof the MODC, MODB, andMODApins during
reset. The MODC, MODB, and MODA bits in the MODE register show the current operating mode and
provide limited mode switching during operation. The states of the MODC, MODB, and MODA pins are
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Device User Guide — 9S12C128DGV1/D V01.05
latched into these bits on the rising edge of the reset signal. The ROMCTL signal allows the setting of the
ROMON bit in theMISC register thus controllingwhether the internal Flashis visible in thememory map.
ROMON = 1 mean the Flash is visible in the memory map. The state of the ROMCTL pin is latched into
the ROMON bit in the MISC register on the rising edge of the reset signal.
Table 4-1 Mode Selection
BKGD =
MODC
000X1
001
010X0Special Test (Expanded Wide), BDM allowed
011
100X1Normal Single Chip, BDM allowed
101
110X1
111
PE6 =
MODB
PE5 =
MODA
PP6 =
ROMCTL
01
10
01
10
00
11
00
11
ROMON
Bit
Mode Description
Special Single Chip, BDM allowed and ACTIVE. BDM is
allowed in all other modes but a serial command is
required to make BDM active.
Emulation Expanded Narrow, BDM allowed
Emulation Expanded Wide, BDM allowed
Normal Expanded Narrow, BDM allowed
Peripheral; BDM allowed but bus operations would cause
bus conflicts (must not be used)
Normal Expanded Wide, BDM allowed
For further explanation on the modes refer to the S12_MEBI block guide.
The device will make available a security feature preventing the unauthorized read and write of the
memory contents. This feature allows:
•Protection of the contents of FLASH,
•Operation in single-chip mode,
•Operation from external memory with internal FLASH disabled.
The user must be reminded that part of the security must lie with the user’s code. An extreme example
would be user’s code that dumps the contents of the internal program. This code would defeat the purpose
of security. At the same time the user may also wish to put a back door in the user’s program. An example
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Device User Guide — 9S12C128DGV1/D V01.05
of this is the user downloads a key through the SCI which allows access to a programming routine that
updates parameters.
4.3.1 Securing the Microcontroller
Once the user has programmed the FLASH, the part can be secured by programming the security bits
located in the FLASH module. These non-volatile bits will keep the part secured through resetting the part
and through powering down the part.
The security byte resides in a portion of the Flash array.
Check the Flash Block User Guide for more details on the security configuration.
4.3.2 Operation of the Secured Microcontroller
4.3.2.1 Normal Single Chip Mode
This will be the most commonusage of the secured part. Everything will appear the same as if the part was
not secured with the exception of BDM operation. The BDM operation will be blocked.
4.3.2.2 Executing from External Memory
The user may wish to execute from external space with a secured microcontroller. This is accomplished
by resetting directly into expanded mode. The internal FLASH will be disabled. BDM operations will be
blocked.
4.3.3 Unsecuring the Microcontroller
In order to unsecure the microcontroller, the internal FLASH must be erased. This can be done through an
external program in expanded mode or via a sequence of BDM commands. Unsecuringis also possiblevia
the Backdoor Key Access. Refer to Flash Block Guide for details.
Once the user has erased the FLASH, the part can be reset into special single chip mode. This invokes a
program that verifies the erasure of the internal FLASH. Once this program completes, the user can erase
and program the FLASH security bits to the unsecured state. This is generally done through the BDM, but
the user could also change to expanded mode (by writing the mode bits through the BDM) and jumping to
an external program (again through BDM commands). Note that if the part goes through a reset before the
security bits are reprogrammed to the unsecure state, the part will be secured again.
4.4 Low Power Modes
The microcontroller features three main low power modes. Consult the respective Block User Guide for
information on the module behavior in Stop, Pseudo Stop, and Wait Mode. An important source of
information about the clock system is the Clock and Reset Generator User Guide (CRG).
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Device User Guide — 9S12C128DGV1/D V01.05
4.4.1 Stop
Executing the CPU STOP instruction stops all clocks and the oscillator thus putting the chip in fully static
mode. Wake up from this mode can be done via reset or external interrupts.
4.4.2 Pseudo Stop
This mode is entered by executing the CPU STOP instruction. In this mode the oscillator is still running
and the Real Time Interrupt (RTI) or Watchdog (COP) sub module can stay active. Other peripherals are
turned off. This mode consumes more current than the full STOP mode, but the wake up time from this
mode is significantly shorter.
4.4.3 Wait
This mode is entered by executing the CPU WAI instruction. In this mode the CPU will not execute
instructions.The internal CPU signals (address and databus)willbefully static. All peripherals stay active.
For further power consumption reduction the peripherals can individually turn off their local clocks.
4.4.4 Run
Although this is not a low power mode, unused peripheral modules should not be enabled in order to save
power.
Section 5 Resets and Interrupts
5.1 Overview
Consult the Exception Processing section of the CPU12 Reference Manual for information.
5.2 Vectors
5.2.1 Vector Table
Table 5-1 lists interrupt sources and vectors in default order of priority.
Resets are a subset of the interrupts featured inTable 5-1. The different sources capable of generating a
system reset are summarized in Table 5-2. When a reset occurs, MCU registers and control bits are
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Device User Guide — 9S12C128DGV1/D V01.05
changed to known start-up states. Refer to the respective module Block User Guides for register reset
states.
5.3.1 Reset Summary Table
Table 5-2 Reset Summary
ResetPrioritySourceVector
Power-on Reset1CRG Module$FFFE, $FFFF
External Reset1RESET pin$FFFE, $FFFF
Low Voltage Reset1VREG Module$FFFE, $FFFF
Clock Monitor Reset2CRG Module$FFFC, $FFFD
COP Watchdog Reset3CRG Module$FFFA, $FFFB
5.3.2 Effects of Reset
When a reset occurs, MCU registers and control bits are changed to known start-up states. Refer to the
respective module Block User Guides for register reset states. Refer to the HCS12 Multiplexed External
Bus Interface (MEBI) Block Guide for mode dependent pin configuration of port A, B and E out of reset.
Refer to the PIM Block User Guide for reset configurations of all peripheral module ports.
Refer to Figure 1-2 to Figure 1-5 footnotes for locations of the memories depending on the operating
mode after reset.
The RAM array is not automatically initialized out of reset.
NOTE:
For devices assembled in 48-pin or 52-pinLQFP packages all non-bonded out pins
should be configured as outputs after reset in order to avoid current drawn from
floating inputs. Refer to
Table 2-1
for affected pins.
Section 6 HCS12 Core Block Description
Consult the individual block guides for information about the HCS12 core modules, i.e.central processing
unit (CPU), interrupt module (INT), module mapping control module (MMC), multiplexed external bus
interface (MEBI), debug12 module (DBG12) and background debug mode module (BDM).
Where the CPU12 Reference Manual refers to cycles this is equivalent to device bus clock periods.
6.1 Device-specific information
6.1.1 PPAGE
External paging is not supported on these devices. In order to access the 16K flash blocks in the address
range $8000-$BFFF the PPAGE registermust be loaded with thecorresponding value for this range.Refer
to Table 6-1 for device specific page mapping.
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Device User Guide — 9S12C128DGV1/D V01.05
For all devicesFlash Page 3F is visible in the $C000-$FFFF range if ROMON is set. For all devices (ecept
9S12GC16) Page 3E is also visible in the $4000-$7FFF range if ROMHM is cleared and ROMON is set.
For all devices apart from MC9S12C32 Flash Page 3D is visible in the $0000-$3FFF range if ROMON is
set...
The BDM section of S12 Core User Guide reference to alternate clock is equivalent to oscillator clock.
6.1.3 Extended Address Range Emulation Implications
In order to emulate the MC9S12GC or MC9S12C-Family devices, external addressing of a 128K memory
map is required. This is provided in a 112 LQFP package version which includes the 3 necessary extra
external address bus signals via PortK[2:0]. This package version is for emulation only and not provided
as a general production package.
The reset state of DDRK is $00, configuring the pins as inputs.
The reset state of PUPKE in the PUCR register is “1” enabling the internal PortK pullups.
In this reset state the pull-ups provide a defined state and prevent a floating input, thereby preventing
unnecessary current flow at the input stage.
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Device User Guide — 9S12C128DGV1/D V01.05
To prevent unnecessary current flow in production package options, the states of DDRK and PUPKE
should not be changed by software.
Section 7 Voltage Regulator (VREG) Block Description
Consult the VREG Block User Guide for information about the dual output linear voltage regulator.
7.1 Device-specific information
The VREG is part of the IPBus domain.
7.1.1 VREGEN
VREGEN is connected internally to VDDR.
7.1.2 VDD1, VDD2, VSS1, VSS2
In the 80 pin QFP package versions, both internal VDD and VSS of the 2.5V domain are bonded out on 2
sides of the device as two pin pairs (VDD1, VSS1 & VDD2, VSS2). VDD1 and VDD2 are connected
together internally. VSS1 and VSS2 are connected together internally.
The extra pin pair enables systems using the 80 pin package to employ better supply routing and further
decoupling.
The PCB must be carefully laid out to ensure proper operation of the voltage regulator as well as of the
MCU itself. The following rules must be observed:
•Every supply pair must be decoupled by a ceramic capacitor connected as near as possible to the
corresponding pins (C1 - C6).
•Central point of the ground star should be the VSSR pin.
•Use low ohmic low inductance connections between VSS1, VSS2 and VSSR.
•VSSPLL must be directly connected to VSSR.
•Keep traces of VSSPLL, EXTAL and XTAL as short as possible and occupied board area for C7,
C8, C11 and Q1 as small as possible.
•Do not place other signals or supplies underneath area occupied by C7, C8, C10 and Q1 and the
connection area to the MCU.
•Central power input should be fed in at the VDDA/VSSA pins.
Consult the CRG Block User Guide for information about the Clock and Reset Generator module.
9.1 Device-specific information
The CRG is part of the IPBus domain.
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Device User Guide — 9S12C128DGV1/D V01.05
The Low Voltage Reset feature uses the low voltage reset signal from the VREG module as an input to the
CRG module. When the regulator output voltage supply to the internal chip logic falls below a specified
threshold the LVR signal from the VREG module causes the CRG module to generate a reset. Consult the
VREG Block User Guide for voltage level specifications.
9.1.1XCLKS
The XCLKS input signal is active low (see 2.3.8 PE7 / NOACC / XCLKS — Port E I/O Pin 7).
Section 10 Oscillator (OSC) Block Description
Consult the OSC Block User Guide for information about the Oscillator module.
Section 11 Timer (TIM) Block Description
Consult the TIM_16B8C Block User Guide for information about the Timer module.
Section 12 Analog to Digital Converter (ATD) Block
Description
12.1 Device-specific information
12.1.1 VRL (voltage reference low)
In the 48 and 52 pin package versions, the VRL pad is bonded internally to the VSSA pin.
Consult the ATD_10B8C Block User Guide for further information about the A/D Converter module.
Section 13 Serial Communications Interface (SCI) Block
Description
Consult the SCI Block User Guide for information about the Asynchronous Serial Communications
Interface module.
Section 14 Serial Peripheral Interface (SPI) Block
Description
Consult the SPI Block User Guide for information about the Serial Peripheral Interface module.
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Device User Guide — 9S12C128DGV1/D V01.05
Consult the SPI Block User Guide for information about the Synchronous Serial Communications
Interface module.
Section 15 Flash Block Description
Consult the FTS16K Block User Guide for information about the Flash module for the MC9S12GC16.
Consult the FTS32K Block User Guide for information about the Flash module for the MC9S12C32 or
MC9S12GC32.
Consult the FTS64K Block User Guide for information about the Flash module for the MC9S12C64 or
MC9S12GC64.
Consult the FTS96K Block User Guide for information about the Flash module for the MC9S12C96.
Consult the FTS128K Block User Guide for information about the Flash module for the MC9S12C128or
MC9S12GC128.
Section 16 RAM Block Description
This module supports single-cycle misaligned word accesses without wait states.
The MC912GC16 features a single 1K byte RAM module.
The MC9S12C32 and MC9S12GC32 feature a 2K byte RAM module.
The MC9S12C64, MC9S12GC64, MC9S12C96, MC9S12C128 and MC9S12GC128 versions feature a
Consult the PWM_8B6C Block User Guide for information about the Pulse Width Modulator Module.
Section 18 MSCAN Block Description
Consult the MSCAN Block User Guide for information about the Motorola Scalable CAN Module.
This module is not available on the MC9GC-Family Members.
Section 19 Port Integration Module (PIM) Block Description
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Device User Guide — 9S12C128DGV1/D V01.05
Consult the PIM_9C32 Block User Guide for information about the Port Integration Module for all
versions of the MC9DS12GC and MC9S12C-Family.
The MODRR register within the PIM allows for mapping of PWM channels to PortT in the absence of
PortP pins for the low pin count packages. For the 80QFP package option it is recommended not to use
MODRR since this is intended to support PWM channel availability in low pin count packages. Note that
when mapping PWM channels to PortT in an 80QFP option, the associated PWM channels are then
mapped to both PortP and PortT.
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Device User Guide — 9S12C128DGV1/D V01.05
Appendix A Electrical Characteristics
A.1 General
NOTE:
NOTE:
This supplement contains the most accurate electrical information for the MC9S12C-Family
microcontrollers available at the time of publication. The information should be considered
PRELIMINARY and is subject to change.
This introduction is intended to give an overview on several common topics like power supply, current
injection etc.
The electrical characteristics given in this section are preliminary and should be
used as a guide only. Values cannot be guaranteed by Motorola and are subject to
change without notice.
The parts are specified and tested over the 5V and 3.3V ranges. For the
intermediate range, generally the electrical specifications for the 3.3V range
apply, but the parts are not tested in production test in the intermediate range.
A.1.1 Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the
customer a better understanding the following classification is used and the parameters are tagged
accordingly in the tables where appropriate.
NOTE:
This classification will be added at a later release of the specification
P: Those parameters are guaranteed during production testing on each individual device.
C: Those parameters are achieved by the design characterization by measuring a statistically relevant
sample size across process variations. They are regularly verified by production monitors.
T: Those parameters are achieved by designcharacterization on a smallsample size from typicaldevices.
All values shown in the typical column are within this category.
D: Those parameters are derived mainly from simulations.
A.1.2 Power Supply
The MC9S12C-Family and MC9S12GC-Family members utilize several pins to supply power to the I/O
ports, A/D converter, oscillator and PLL as well as the internal logic.
The VDDA, VSSA pair supplies the A/D converter.
The VDDX, VSSX pair supplies the I/O pins
The VDDR, VSSR pair supplies the internal voltage regulator.
VDD1, VSS1, VDD2 and VSS2 are the supply pins for the digital logic.
VDDPLL, VSSPLL supply the oscillator and the PLL.
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Device User Guide — 9S12C128DGV1/D V01.05
VSS1 and VSS2 are internally connected by metal.
VDD1 and VDD2 are internally connected by metal.
VDDA, VDDX, VDDR as well as VSSA, VSSX, VSSR are connected by anti-parallel diodes for ESD
protection.
NOTE:
In the following context VDD5 is used for either VDDA, VDDR and VDDX; VSS5
is used for either VSSA, VSSR and VSSX unless otherwise noted.
IDD5 denotes the sum of the currents flowing into the VDDA, VDDX and VDDR
pins.
VDD is used for VDD1, VDD2 and VDDPLL, VSS is used for VSS1, VSS2 and
VSSPLL.
IDD is used for the sum of the currents flowing into VDD1 and VDD2.
A.1.3 Pins
There are four groups of functional pins.
A.1.3.1 5V I/O pins
Those I/O pins have a nominal level of 5V. This class of pins is comprised of all port I/O pins, the analog
inputs, BKGD pin and theRESETinputs.The internal structure of allthose pins is identical, howeversome
of the functionality may be disabled. E.g. pull-up and pull-down resistors may be disabled permanently.
A.1.3.2 Analog Reference
This class is made up by the two VRH and VRL pins. In 48 and 52 pin package versions the VRL pad is
bonded to the VSSA pin.
A.1.3.3 Oscillator
The pins XFC, EXTAL, XTAL dedicated to the oscillator have a nominal 2.5V level. They are supplied
by VDDPLL.
A.1.3.4 TEST
This pin is used for production testing only.
A.1.4 Current Injection
Power supply must maintain regulation within operating V
operating maximum current conditions. If positive injection current (V
injection current mayflow out of VDD5 and could result in external power supply going out of regulation.
Insure external VDD5 load will shunt current greater than maximum injection current. This will be the
greatest risk when the MCU is not consuming power; e.g. if no system clock is present, or if clock rate is
very low which would reduce overall power consumption.
or VDD range during instantaneous and
DD5
in
>V
) is greater than I
DD5
DD5
, the
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Device User Guide — 9S12C128DGV1/D V01.05
A.1.5 Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only. A functional operation under or outside those maxima
is not guaranteed. Stress beyond those limits may affect the reliability or cause permanent damage of the
device.
This device contains circuitry protecting against damage due to high static voltage or electrical fields;
however, it is advised that normal precautions be taken to avoid application of any voltages higher than
maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused
inputs are tied to an appropriate logic voltage level (e.g., either V
Table A-1 Absolute Maximum Ratings
NumRatingSymbolMinMaxUnit
SS5
or V
DD5
).
1I/O, Regulator and Analog Supply Voltage
2
Digital Logic Supply Voltage
3
PLL Supply Voltage
(1)
1
4Voltage difference VDDX to VDDR and VDDA
5Voltage difference VSSX to VSSR and VSSA
6Digital I/O Input Voltage
7Analog Reference
8XFC, EXTAL, XTAL inputs
9TEST input
Instantaneous Maximum Current
10
Single pin limit for all digital I/O pins
Instantaneous Maximum Current
11
Single pin limit for XFC, EXTAL, XTAL
Instantaneous Maximum Current
12
Single pin limit for TEST
4
2
3
13Operating Temperature Range (packaged)
14Operating Temperature Range (junction)
15Storage Temperature Range
V
DD5
V
DD
V
DDPLL
∆
VDDX
∆
VSSX
V
IN
V
RH,VRL
V
ILV
V
TEST
I
D
I
DL
I
DT
T
T
T
stg
-0.36.5V
-0.33.0V
-0.33.0V
-0.30.3V
-0.30.3V
-0.36.5V
-0.36.5V
-0.33.0V
-0.310.0V
-25+25mA
-25+25mA
-0.250mA
A
J
– 40125°C
– 40140°C
– 65155°C
NOTES:
1. The device contains an internal voltage regulator to generate the logic and PLL supply out of the I/O supply.
The absolute maximum ratings apply when the device is powered from an external source.
2. All digital I/O pins are internally clamped to V
3. These pins are internally clamped to V
4. This pin is clamped low to V
SSX
SSPLL
, but not clamped high. This pin must be tied low in applications.
and V
SSX
and V
DDPLL
DDX
, V
SSR
and V
DDR
or V
SSA
and V
DDA
.
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Device User Guide — 9S12C128DGV1/D V01.05
A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Table A-2 ESD and Latch-up Test Conditions
ModelDescriptionSymbolValueUnit
Series ResistanceR11500Ohm
Storage CapacitanceC100pF
Human Body
Number of Pulse per pin
positive
negative
Series ResistanceR10Ohm
-
3
3
Storage CapacitanceC200pF
Machine
Latch-up
Number of Pulse per pin
positive
negative
Minimum input voltage limit-2.5V
Maximum input voltage limit7.5V
-
3
3
Table A-3 ESD and Latch-Up Protection Characteristics
NumCRatingSymbolMinMaxUnit
1CHuman Body Model (HBM)
2CMachine Model (MM)
3CCharge Device Model (CDM)
Latch-up Current at 125°C
4C
5C
positive
negative
Latch-up Current at 27°C
positive
negative
V
V
V
HBM
MM
CDM
I
LAT
I
LAT
2000-V
200-V
500-V
+100
-100
+200
-200
-mA
-mA
A.1.7 Operating Conditions
This chapter describes the operating conditions of the devices. Unless otherwise noted those conditions
apply to all the following data.
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Device User Guide — 9S12C128DGV1/D V01.05
NOTE:
Insteadof specifying ambient temperature all parametersarespecified for the more
meaningful silicon junction temperature. For power dissipation calculations refer
to Section A.1.8 Power Dissipation and Thermal Characteristics.
Table A-4 Operating Conditions
RatingSymbolMinTypMaxUnit
I/O, Regulator and Analog Supply Voltage
Digital Logic Supply Voltage
PLL Supply Voltage
Voltage Difference VDDX to VDDA
Voltage Difference VSSX to VSSR and VSSA
Oscillator
Bus Frequency
Operating Junction Temperature Range
NOTES:
1. The device contains an internal voltage regulator to generate the logic and PLL supply out of the I/O supply. The
absolute maximum ratings apply when this regulator is disabled and the device is powered from an external
source.
2. Some blocks e.g. ATD (conversion) and NVMs (program/erase) require higher bus frequencies for proper operation.
(1)
1
V
V
V
DDPLL
∆
VDDX
∆
VSSX
f
f
bus
DD5
DD
osc
T
J
2.9755.5V
2.352.52.75V
2.352.52.75V
-0.100.1V
-0.100.1V
0.5-16MHz
2
0.25-25MHz
-40-140°C
A.1.8 Power Dissipation and Thermal Characteristics
Power dissipation and thermal characteristics are closely related. The user must assure that the maximum
operating junction temperature is not exceeded. The average chip-junction temperature (T
obtained from:
T
T
P
Θ
J
A
D
JA
T
Junction Temperature, [°C]=
Ambient Temperature, [°C]=
Total Chip Power Dissipation, [W]=
Package Thermal Resistance, [°C/W]=
T
J
A
P
D
ΘJA•()+=
The total power dissipation can be calculated from:
P
INT
P
Chip Internal Power Dissipation, [W]=
D
P
+=
INTPIO
)in°C can be
J
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Device User Guide — 9S12C128DGV1/D V01.05
Two cases with internal voltage regulator enabled and disabled must be considered:
1.Internal Voltage Regulator disabled
P
INT
Which is the sum of all output currents on I/O ports associated with VDDX and VDDM.
For R
respectively
2.Internal voltage regulator enabled
I
DDR
additionally contains the current flowing into the external loads with output high.
is valid:
DSON
is the current shown in Table A-8 and not the overall current flowing into VDDR, which
R
DSON
I
⋅I
DDVDD
P
R
DSON
V
------------------------------------ for outputs driven high;=
P
INT
P
DDPLLVDDPLL
R
IO
IO
∑
DSON
i
V
OL
------------ for outputs driven low;=
I
OL
DD5
I
DDRVDDR
VOH–
I
OH
⋅I
R
∑
i
DSON
⋅I
⋅=
DDAVDDA
⋅=
+V
2
I
IO
i
⋅+=
2
I
IO
i
DDA
⋅+=
DDA
88
Device User Guide — 9S12C128DGV1/D V01.05
Which is the sum of all output currents on I/O ports associated with VDDX and VDDR.
Table A-5 Thermal Package Characteristics
NumCRatingSymbolMinTypMaxUnit
1T
2T
Thermal Resistance LQFP48, single layer PCB
Thermal Resistance LQFP48, double sided PCB with
2 internal planes
3
2
3TJunction to Board LQFP48
4TJunction to Case LQFP48
5TJunction to Package Top LQFP48
6TThermal Resistance LQFP52, single sided PCB
7T
Thermal Resistance LQFP52, double sided PCB with
2 internal planes
8TJunction to Board LQFP52
9TJunction to Case LQFP52
10TJunction to Package Top LQFP52
11TThermal Resistance QFP 80, single sided PCB
13TJunction to Board QFP80
14TJunction to Case QFP80
15TJunction to Package Top QFP80
NOTES:
1. The values for thermal resistance are achieved by package simulations
2. PC Board according to EIA/JEDEC Standard 51-2
3. PC Board according to EIA/JEDEC Standard 51-7
θ
JA
θ
JA
θ
JB
θ
JC
Ψ
JT
θ
JA
θ
JA
θ
JB
θ
JC
Ψ
JT
θ
JA
θ
JA
θ
JB
θ
JC
Ψ
JT
1
--69
--53
30
20
4
--65
--49
31
17
3
--52
--42
28
18
4
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
A.1.9 I/O Characteristics
This section describes the characteristics of all I/O pins. All parameters are not always applicable, e.g. not
all pins feature pull up/down resistances.
89
Device User Guide — 9S12C128DGV1/D V01.05
Table A-6 5V I/O Characteristics
Conditions are 4.5< VDDX <5.5V Termperature from -40˚C to +140˚C, unless otherwise noted
NumCRatingSymbolMinTypMaxUnit
1PInput High Voltage
TInput High Voltage
2PInput Low Voltage
TInput Low Voltage
3CInput Hysteresis
V
V
V
V
V
HYS
IH
IH
0.65*V
DD5
--V
--VDD5 + 0.3V
IL
IL
--
VSS5 - 0.3--V
0.35*V
250mV
DD5
Input Leakage Current (pins in high ohmic input
1
4P
5C
6P
7C
8P
9P
10C
11P
12C
mode)
Vin= V
DD5
or V
SS5
Output High Voltage (pins in output mode)
Partial Drive IOH= –2mA
Output High Voltage (pins in output mode)
Full Drive IOH = –10mA
Output Low Voltage (pins in output mode)
Partial Drive IOL = +2mA
Output Low Voltage (pins in output mode)
Full Drive IOL= +10mA
Internal Pull Up Device Current,
tested at V
Max.
IL
Internal Pull Up Device Current,
tested at V
IH
Min.
Internal Pull Down Device Current,
tested at V
IH
Min.
Internal Pull Down Device Current,
tested at V
Max.
IL
13DInput Capacitance
Injection current
14T
Single Pin limit
Total Device Limit. Sum of all injected currents
15P
16P
Port P, J Interrupt Input Pulse filtered
Port P, J Interrupt Input Pulse passed
2
3
3
I
V
V
V
V
I
PUL
I
PUH
I
PDH
I
PDL
C
I
ICS
I
ICP
t
PIGN
t
PVAL
in
OH
OH
OL
OL
in
–1-1µA
V
– 0.8
DD5
V
– 0.8
DD5
--V
--V
--0.8V
--0.8V
---130µA
-10--µA
--130µA
10--µA
7-pF
-2.5
-25
-2.5
25
3µs
10µs
mA
NOTES:
1. Maximum leakage current occurs at maximum operating temperature. Current decreases by approximately one-half for
each 8 C to 12 C in the temperature range from 50 C to 125 C.
2. Refer to Section A.1.4 Current Injection, for more details
3. Parameter only applies in STOP or Pseudo STOP mode.
V
90
Device User Guide — 9S12C128DGV1/D V01.05
Table A-7 3.3V I/O Characteristics
Conditions are VDDX=3.3V +/-10%, Termperature from -40˚C to +140˚C, unless otherwise noted
NumCRatingSymbolMinTypMaxUnit
1PInput High Voltage
TInput High Voltage
2PInput Low Voltage
TInput Low Voltage
3CInput Hysteresis
V
V
V
V
V
HYS
0.65*V
IH
IH
IL
IL
DD5
--VDD5 + 0.3V
--
VSS5 - 0.3--V
--V
0.35*V
250mV
DD5
Input Leakage Current (pins in high ohmic input
1
4P
5C
6P
7C
8P
9P
10C
11P
12C
mode)
Vin= V
DD5
or V
SS5
Output High Voltage (pins in output mode)
Partial Drive IOH= –0.75mA
Output High Voltage (pins in output mode)
Full Drive IOH= –4mA
Output Low Voltage (pins in output mode)
Partial Drive IOL= +0.9mA
Output Low Voltage (pins in output mode)
Full Drive IOL= +4.75mA
Internal Pull Up Device Current,
tested at V
Max.
IL
Internal Pull Up Device Current,
tested at V
IH
Min.
Internal Pull Down Device Current,
tested at V
IH
Min.
Internal Pull Down Device Current,
tested at V
Max.
IL
11DInput Capacitance
2
12T
Injection current
Single Pin limit
Total Device Limit. Sum of all injected currents
13P
14P
Port P, J Interrupt Input Pulse filtered
Port P, J Interrupt Input Pulse passed
3
3
I
V
V
V
V
I
PUL
I
PUH
I
PDH
I
PDL
C
I
ICS
I
ICP
t
PIGN
t
PVAL
in
OH
OH
OL
OL
–1-1µA
V
V
DD5
DD5
– 0.4
– 0.4
--V
--V
--0.4V
--0.4V
-- –60µA
-6--µA
--60µA
6--µA
in
-2.5
-25
7-pF
-2.5
25
3µs
10µs
NOTES:
1. Maximum leakage current occurs at maximum operating temperature. Current decreases by approximately one-half for
each 8 C to 12 C in the temperature range from 50 C to 125 C.
2. Refer to Section A.1.4 Current Injection, for more details
3. Parameter only applies in STOP or Pseudo STOP mode.
V
mA
91
Device User Guide — 9S12C128DGV1/D V01.05
A.1.10 Supply Currents
This section describes the current consumption characteristics of the device as well as the conditions for
the measurements.
A.1.10.1 Measurement Conditions
All measurements are without output loads. Unless otherwise noted the currents are measured in single
chip mode, internal voltage regulator enabled and at 25MHz bus frequency using a 4MHz oscillator.
A.1.10.2 Additional Remarks
In expanded modes the currents flowing in the system are highly dependent onthe load atthe address, data
and control signals as well as on the duty cycle of those signals. No generally applicable numbers can be
given. A very good estimate is to take the single chip currents and add the currents due to the external
loads.
92
Device User Guide — 9S12C128DGV1/D V01.05
Table A-8 Supply Current Characteristics for MC9S12C32
Conditions are shown in Table A-4 with internal regulator enabled unless otherwise noted
NumCRatingSymbolMinTypMaxUnit
1PRun Supply Current Single Chip
Wait Supply current
2
P
P
C
VDDR<4.9V, only RTI enabled
VDDR>4.9V, only RTI enabled
Pseudo Stop Current (RTI and COP disabled)
C
P
C
3
P
"C" Temp Option 100˚C
C
P
"V" Temp Option 120˚C
C
P
"M" Temp Option 140°C
Pseudo Stop Current (RTI and COP enabled)
C
4
C
C
C
C
Stop Current
(3)
C
P
C
5
P
"C" Temp Option 100˚C
C
P
"V" Temp Option 120˚C
C
P
"M" Temp Option 140°C
All modules enabled
(2)
(2)(3)
-40°C
27°C
85°C
105°C
125°C
23
-40°C
27°C
85°C
105°C
125°C
-40°C
27°C
85°C
105°C
125°C
I
DD5
I
DDW
I
DDPS
I
DDPS
I
DDS
(1)
35mA
3.5
30
8
mA
2.5
340
360
1
500
550
450
1450
µA
590
720
1900
780
1100
4500
540
1
700
750
µA
880
1300
10
20
80
100
140
1000
µA
170
300
1400
350
520
4000
NOTES:
1. STOP current measured in production test at increased junction temperature, hence for Temp Option "C" the test is
carried out at 100˚C although the Temperature specification is 85˚C. Similarly for "v" and "M" options the temperature
used in test lies 15˚C above the temperature option specification.
2. PLL off
3. At those low power dissipation levels T
= TA can be assumed
J
93
Device User Guide — 9S12C128DGV1/D V01.05
Table A-9 Supply Current Characteristics for MC9S12C64,MC9S12C96,MC9S12C128
Conditions are shown in Table A-4 with internal regulator enabled unless otherwise noted
NumCRatingSymbolMinTypMaxUnit
1PRun Supply Current Single Chip,
Wait Supply current
2
P
P
C
VDDR<4.9V, only RTI enabled
VDDR>4.9V, only RTI enabled
Pseudo Stop Current (RTI and COP disabled)
C
P
C
6
P
"C" Temp Option 100˚C
C
P
"V" Temp Option 120˚C
C
P
"M" Temp Option 140°C
Pseudo Stop Current (RTI and COP enabled)
C
4
C
C
C
C
Stop Current
(3)
C
P
C
5
P
"C" Temp Option 100˚C
C
P
"V" Temp Option 120˚C
C
P
"M" Temp Option 140°C
All modules enabled
(2)
(2)(3)
-40°C
27°C
85°C
105°C
125°C
23
-40°C
27°C
85°C
105°C
125°C
-40°C
27°C
85°C
105°C
125°C
I
DD5
I
DDW
I
DDPS
I
DDPS
I
DDS
(1)
45mA
2.5
33
8
mA
3.5
190
200
1
300
400
250
1400
µA
450
600
1900
650
1000
4800
370
1
500
590
µA
780
1200
12
25
100
130
160
1200
µA
200
350
1700
400
600
4500
NOTES:
1. STOP current measured in production test at increased junction temperature, hence for Temp Option "C" the test is
carried out at 100˚C although the Temperature specification is 85˚C. Similarly for "v" and "M" options the temperature
used in test lies 15˚C above the temperature option specification.
, active only in Full Performance Mode. Indicates I/O & ADC performance degradation due to low supply
DDA
, active only in Full Performance Mode. MCU is monitored by the POR in RPM (see Figure B-1)
DD
. Active in all modes.
DD
3
V
PORA
V
PORD
0.97
—
—
—
—
2.05
The electrical characteristics given in this section are preliminary and should be
used as a guide only. Values in this section cannot be guaranteed by Motorola and
are subject to change without notice.
V
V
95
Device User Guide — 9S12C128DGV1/D V01.05
B.2 Chip Power-up and LVI/LVR graphical explanation
Voltage regulator sub modules LVI (low voltage interrupt), POR (power-on reset) and LVR (low voltage
reset) handle chip power-up or drops of the supply voltage. Their function is described in Figure B-1.
Figure B-1 Voltage Regulator - Chip Power-up and Voltage Drops (not scaled)
V
PORD
V
LVI
POR
V
V
V
V
LVID
LVIA
LVRD
LVRA
V
DDA
V
DD
t
LVI enabledLVI disabled due to LVR
LVR
B.3 Output Loads
B.3.1 Resistive Loads
The on-chip voltage regulator is intended to supply the internal logic and oscillator circuits allows no
external DC loads.
96
Device User Guide — 9S12C128DGV1/D V01.05
B.3.2 Capacitive Loads
The capacitive loads are specified in Table B-2. Ceramic capacitors with X7R dielectricum are required.
This section describes the characteristics of the analog to digital converter.
VRL is not available as a separate pin in the 48 and 52 pin versions. In this case the internal VRL pad is
bonded to the VSSA pin.
The ATD is specified and tested for both the 3.3V and 5V range. For ranges between 3.3V and 5V the
ATD accuracy is generally the same as in the 3.3V range but is not tested in this range in production test.
B.4.1 ATD Operating Characteristics In 5V Range
The Table B-3 shows conditions under which the ATD operates.
The following constraints exist to obtain full-scale, full range results:
VSSA ≤ VRL ≤ VIN ≤ VRH ≤ VDDA. This constraint exists since the sample buffer amplifier can not
drive beyond the power supply levels that it ties to. If the input level goes outside of this range it will
effectively be clipped.
Table B-3 ATD Operating Characteristics
Conditions are shown in Table A-4 unless otherwise noted. Supply Voltage 5V-10% <= V
<=5V+10%
DDA
NumCRatingSymbolMinTypMaxUnit
Reference Potential
1D
2C
3DATD Clock Frequency
4D
5D
5D
6PReference Supply current
NOTES:
1. Full accuracy is not guaranteed when differential voltage is less than 4.75V
2. The minimum time assumes a final sample period of 2 ATD clocks cycles while the maximum time assumes a final sample
period of 16 ATD clocks.
Differential Reference Voltage
ATD 10-Bit Conversion Period
Conv, Time at 2.0MHz ATD Clock f
ATD 8-Bit Conversion Period
Conv, Time at 2.0MHz ATD Clock f
Recovery Time (V
=5.0 Volts)
DDA
1
Clock Cycles
Clock Cycles
Low
High
ATDCLK
ATDCLK
VRL
VRH
VSSA
VDDA/2
VDDA/2
VDDA
VRH-VRL4.755.05.25V
2
2
f
ATDCLK
N
CONV10
T
CONV10
N
CONV10
T
CONV10
t
REC
I
REF
0.52.0MHz
14
7
12
6
28
14
26
13
20µs
0.375mA
V
V
Cycles
µs
Cycles
µs
B.4.2 ATD Operating Characteristics In 3.3V Range
The Table B-3 shows conditions under which the ATD operates.
The following constraints exist to obtain full-scale, full range results:
V
≤ VRL≤ VIN≤ VRH≤ V
SSA
DDA
. This constraint exists since the sample buffer amplifier can not drive
99
Device User Guide — 9S12C128DGV1/D V01.05
beyond the power supply levels that it ties to. If the input level goes outside of this range it will effectively
be clipped
Table B-4 ATD Operating Characteristics
Conditions are shown in Table A-4 unless otherwise noted; Supply Voltage 3.3V-10% <= V
<= 3.3V+10%
DDA
Num CRatingSymbolMinTypMaxUnit
Reference Potential
1D
2C Differential Reference Voltage
3D ATD Clock Frequency
ATD 10-Bit Conversion Period
4D
Conv, Time at 2.0MHz ATD Clock f
ATD 8-Bit Conversion Period
5D
Conv, Time at 2.0MHz ATD Clock f
6D
7PReference Supply current
NOTES:
1. The minimum time assumes a final sample period of 2 ATD clocks cycles while the maximum time assumes a final sample
Recovery Time (V
period of 16 ATD clocks.
=3.3 Volts)
DDA
Clock Cycles
Clock Cycles
Low
High
ATDCLK
ATDCLK
(1)
1
V
RL
V
RH
VRH-V
f
ATDCLK
N
CONV10
T
CONV10
N
CONV8
T
CONV8
t
REC
I
REF
RL
V
V
DDA
SSA
/2
V
DDA
V
/2
DDA
3.03.33.6V
0.52.0MHz
14
7
12
6
28
14
26
13
Cycles
Cycles
20µs
0.250mA
V
V
µs
µs
B.4.3 Factors influencing accuracy
Three factors - source resistance, source capacitance and current injection - have an influenceon the
accuracy of the ATD.
B.4.3.1 Source Resistance:
Due to the input pin leakage current as specified in Table A-6 in conjunction with the source resistance
there will be a voltage drop from the signal source to the ATD input. The maximum source resistance R
specifies results in an error of less than 1/2 LSB (2.5mV) at the maximum leakage current. If device or
operatingconditions are less than worst case orleakage-inducederror is acceptable, larger values of source
resistance is allowable.
B.4.3.2 Source capacitance
When sampling an additional internal capacitor is switched to the input. This can cause a voltage drop due
to charge sharing with the external and the pin capacitance. For a maximum sampling error of the input
voltage ≤ 1LSB, then the external filter capacitor, C
≥ 1024 * (C
f
INS
- C
INN
).
S
100
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