MOTOROLA MC10E1651 Technical data


SEMICONDUCTOR TECHNICAL DATA
2–1
REV 1
Motorola, Inc. 1996
12/93
     
The MC10E1651 is functionally and pin-for-pin compatible with the MC1651 in the MECL III family, but is fabricated using Motorola’s advanced MOSAIC III process. The MC10E1651 incorporates a fixed level of input hysteresis as well as output compatibility with 10KH logic devices. In addition, a latch is available allowing a sample and hold function to be performed. The device is available in both a 16-pin DIP and a 20-pin surface mount package.
The latch enable (LEN
a
and LENb) input pins operate from standard ECL 10KH logic levels. When the latch enable is at a logic high level the MC10E1651 acts as a comparator, hence Q will be at a logic high level if V1 > V2 (V1 is more positive than V2). Q
is the complement of Q. When the latch enable input goes to a low logic level, the outputs are latched in their present state providing the latch enable setup and hold time constraints are met.
Typ. 3.0 dB Bandwidth > 1.0 GHz
Typ. V to Q Propagation Delay of 775 ps
Typ. Output Rise/Fall of 350 ps
Common Mode Range –2.0 V to +3.0 V
Individual Latch Enables
Differential Outputs
28mV Input Hysteresis
Qa
Qa
LEN
a
V2a
V1a
Qb
Qb
LEN
b
V2b
V1b
LOGIC DIAGRAM
VEE = –5.2 V VCC = +5.0 V
FN SUFFIX
PLASTIC PACKAGE
CASE 775-02

DUAL ECL OUTPUT
COMPARATOR
WITH LATCH
L SUFFIX
CERAMIC PACKAGE
CASE 620-10
FUNCTION TABLE
LEN V1, V2 Function
H H
L
V1 > V2 V1 < V2
X
H
L
Latched
MC10E1651
MOTOROLA ECLinPS and ECLinPS Lite
DL140 — Rev 4
2–2
Pinout: 20-Lead PLCC (Top View)
Qb
GND
NC
GND
Qa
Qb LEN
b
NC V1b V2b
V
CC
NC
NC
V
EE
V
CC
Qa
LENaNC V2a V1a
Pinout: 16-Pin Ceramic DIP (Top View)
87654321
910111213141516
NCV
CC
V2bV1bLEN
b
QbQbGND
V
EE
V
CC
V1aV2aLEN
a
QaQaGND
19
181317 16 15 14
12
11
10
9
4 5 6 7 8
20
1
2 3
ABSOLUTE MAXIMUM RATINGS (Beyond which device life may be impaired)
Symbol Characteristic Min Typ Max Unit
VSUP Total Supply Voltage
|VEE| + |VCC|
12.0
V
VPP Differential Input Voltage
|V1 – V2|
3.7
V
DC CHARACTERISTICS (VEE = –5.2 V ±5%; VCC = +5.0 V ±5%)
0°C 25°C 85°C
Symbol Characteristic Min Typ Max Min Typ Max Min Typ Max Unit Condition
V
OH
Output HIGH Voltage –1020 –840 –980 –810 –920 –735 mV
V
OL
Output Low Voltage –1950 –1630 –1950 –1630 –1950 –1600 mV
II I
IH
Input Current (V1, V2) Input HIGH Current (LEN
)
65
150
65
150
65
150
µA
I
CC
I
EE
Positive Supply Current Negative Supply Current
50
–55
50
–55
50
–55
mA
VCMR Common Mode Range –2.0 3.0 –2.0 3.0 –2.0 3.0 V Hys Hysteresis 27 27 30 mV V
skew
Hysteresis Skew –1.0 –1.0 0 mV 1
C
in
Input Capacitance DIP PLCC
3 2
3 2
3 2
pF
1. Hysteresis skew (V
skew
) is provided to indicate the offset of the hysteresis window. For example, at 25°C the nominal hysteresis value is 27mV
and the V
skew
value indicates that the hysteresis was skewed from the reference level by 1mV in the negative direction. Hence the hysteresis window ranged from 14mV below the reference level to 13mV above the reference level. All hysteresis measurements were determined using a reference voltage of 0mV.
MC10E1651
2–3 MOTOROLAECLinPS and ECLinPS Lite
DL140 — Rev 4
AC CHARACTERISTICS (V
EE
= –5.2 V ±5%; VCC = +5.0 V ±5%)
0°C 25°C 85°C
Symbol Characteristic Min Typ Max Min Typ Max Min Typ Max Unit Condition
t
PLH
t
PHL
Propagation Delay to Output V to Q LEN
to Q
600 400
750 575
900 750
625 400
775 575
925 750
700 500
850 650
1050
850
ps 1
t
s
Setup Time V
450 300 450 300 550 350
ps
t
h
Enable Hold Time V
–50 –250 –50 –250 –100 –250
ps
t
pw
Minimum Pulse Width LEN
400 400 400
ps
t
skew
Within Device Skew 15 15 15 ps 2
T
DE
Delay Dispersion (ECL Levels)
100
60
ps
3, 4 3, 5
T
DL
Delay Dispersion (TTL Levels)
350 100
ps
6, 7 5, 6
t
r
t
f
Rise/Fall Times 20-80%
225 325 475 225 325 475 250 375 500
ps
1. The propagation delay is measured from the crosspoint of the input signal and the threshold value to the crosspoint of the Q and Q output signals. For propagation delay measurements the threshold level (V
THR
) is centered about an 850mV input logic swing with a slew rate of 0.75 V/NS.
There is an insignificant change in the propagation delay over the input common mode range.
2. t
skew
is the propagation delay skew between comparator A and comparator B for a particular part under identical input conditions.
3. Refer to figure 4 and note that the input is at 850mV ECL levels with the input threshold range between the 20% and 80% points. The delay is measured from the crosspoint of the input signal and the threshold value to the crosspoint of the Q and Q
output signals.
4. The slew rate is 0.25 V/NS for input rising edges.
5. The slew rate is 0.75 V/NS for input rising edges.
6. Refer to Figure 5 and note that the input is at 2.5 V TTL levels with the input threshold range between the 20% and 80% points. The delay is measured from the crosspoint of the input signal and the threshold value to the crosspoint of the Q and Q
output signals.
7. The slew rate is 0.3 V/NS for input rising edges.
APPLICATIONS INFORMATION
The timing diagram (Figure 3) is presented to illustrate the MC10E1651’s compare and latch features. When the signal on the LEN
pin is at a logic high level, the device is operating in the “compare mode,” and the signal on the input arrives at the output after a nominal propagation delay (t
PHL
, t
PLH
). The input signal must be asserted for a time, ts, prior to the negative going transition on LEN and held for a time, th, after the LEN transition. After time th, the latch is operating in the “latch mode,” thus transitions on the input do not appear at the output. The device continues to operate in the “latch mode” until the latch is asserted once again. Moreover, the LEN
pulse must meet the minimum pulse width (tpw) requirement to effect the correct input-output relationship. Note that the LEN waveform in Figure 3 shows the LEN signal swinging around a reference labeled VBB
INT
; this
waveform emphasizes the requirement that LEN
follow
typical ECL 10KH logic levels because VBB
INT
is the
internally generated reference level, hence is nominally at the ECL VBB level.
Finally, VOD is the input voltage overdrive and represents
the voltage level beyond the threshold level (V
THR
) to which the input is driven. As an example, if the threshold level is set on one of the comparator inputs as 80mV and the input signal swing on the complementary input is from zero to 100mV , the positive going overdrive would be 20mV and the negative going overdrive would be 80mV. The result of differing overdrive levels is that the devices have shorter propagation delays with greater overdrive because the threshold level is crossed sooner than the case of lower overdrive levels. Typically, semiconductor manufactures refer to the threshold voltage as the input offset voltage (VOS) since the threshold voltage is the sum of the externally supplied reference voltage and inherent device offset voltage.
MC10E1651
MOTOROLA ECLinPS and ECLinPS Lite
DL140 — Rev 4
2–4
Figure 3. Input/Output Timing Diagram
Q
Q
V
THR
V
LEN
VBB
INT
V
OD
t
pw
t
h
t
s
t
PHL
t
PLH(LEN
)
V
IN
DELAY DISPERSION
Under a constant set of input conditions comparators have a specified nominal propagation delay. However, since propagation delay is a function of input slew rate and input voltage overdrive the delay dispersion parameters, TDE and TDT, are provided to allow the user to adjust for these variables (where TDE and TDT apply to inputs with standard ECL and TTL levels, respectively).
Figure 4 and Figure 5 define a range of input conditions which incorporate varying input slew rates and input voltage overdrive. For input parameters that adhere to these constraints the propagation delay can be described as:
T
NOM
± TDE (or TDT)
where T
NOM
is the nominal propagation delay. T
NOM
accounts for nonuniformity introduced by temperature and voltage variability, whereas the delay dispersion parameter takes into consideration input slew rate and input voltage overdrive variability. Thus a modified propagation delay can be approximated to account for the effects of input conditions that differ from those under which the parts where tested. For example, an application may specify an ECL input with a slew rate of 0.25 V/NS, an overdrive of 17mV and a temperature of 25°C, the delay dispersion parameter would be 100 ps. The modified propagation delay would be
775ps ± 100ps
Figure 4. ECL Dispersion Test Input Conditions
Figure 5. TTL Dispersion Test Input Conditions
0 V
0.5 V
2.0 V
2.5 V
– 1.75 V
– 1.58 V
– 1.07 V
–0.9 V
SLEW RATE = 0.75 V/NS
SLEW RATE = 0.75 V/NS
SLEW RATE =
0.25 V/NS
SLEW RATE =
0.30 V/NS
INPUT
THRESHOLD
RANGE
INPUT
THRESHOLD
RANGE
MC10E1651
2–5 MOTOROLAECLinPS and ECLinPS Lite
DL140 — Rev 4
OUTLINE DIMENSIONS
FN SUFFIX
PLASTIC PLCC PACKAGE
CASE 775–02
ISSUE C
A B C E F G H J K R U V
W
X Y
Z G1 K1
MIN MINMAX MAX
INCHES MILLIMETERS
DIM
9.78
9.78
4.20
2.29
0.33
0.66
0.51
0.64
8.89
8.89
1.07
1.07
1.07 — 2
°
7.88
1.02
10.03
10.03
4.57
2.79
0.48
0.81 — —
9.04
9.04
1.21
1.21
1.42
0.50
10
°
8.38 —
0.385
0.385
0.165
0.090
0.013
0.026
0.020
0.025
0.350
0.350
0.042
0.042
0.042 —
2
°
0.310
0.040
0.395
0.395
0.180
0.110
0.019
0.032 — —
0.356
0.356
0.048
0.048
0.056
0.020
10
°
0.330 —
1.27 BSC0.050 BSC
NOTES:
1. DATUMS -L-, -M-, AND -N- DETERMINED WHERE TOP OF LEAD SHOULDER EXITS PLASTIC BODY AT MOLD PARTING LINE.
2. DIM G1, TRUE POSITION TO BE MEASURED AT DATUM -T-, SEATING PLANE.
3. DIM R AND U DO NOT INCLUDE MOLD FLASH. ALLOWABLE MOLD FLASH IS 0.010 (0.250) PER SIDE.
4. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
5. CONTROLLING DIMENSION: INCH.
6. THE PACKAGE TOP MAY BE SMALLER THAN THE PACKAGE BOTTOM BY UP TO 0.012 (0.300). DIMENSIONS R AND U ARE DETERMINED AT THE OUTERMOST EXTREMES OF THE PLASTIC BODY EXCLUSIVE OF MOLD FLASH, TIE BAR BURRS, GATE BURRS AND INTERLEAD FLASH, BUT INCLUDING ANY MISMATCH BETWEEN THE TOP AND BOTTOM OF THE PLASTIC BODY.
7. DIMENSION H DOES NOT INCLUDE DAMBAR PROTRUSION OR INTRUSION. THE DAMBAR PROTRUSION(S) SHALL NOT CAUSE THE H DIMENSION TO BE GREATER THAN 0.037 (0.940). THE DAMBAR INTRUSION(S) SHALL NOT CAUSE THE H DIMENSION TO BE SMALLER THAN 0.025 (0.635).
-N-
Y BRK
-M-
-L-
W
V
D
D
20
1
A
R
Z
C
G
G1
E
J
VIEW S
B
U
Z
G1
X
H
F
VIEW S
K
K1
VIEW D-D
0.007 (0.180) T L
–M
SNSM
0.007 (0.180) T L
–M
SNSM
SEATING PLANE
-T-
0.010 (0.250) T L
–M
SNSS
0.007 (0.180) T L
–M
SNSM
0.007 (0.180) T L
–M
SNSM
0.010 (0.250) T L
–M
SNSS
0.007 (0.180) T L
–M
SNSM
0.007 (0.180) T L
–M
SNSM
0.004 (0.100)
MC10E1651
MOTOROLA ECLinPS and ECLinPS Lite
DL140 — Rev 4
2–6
OUTLINE DIMENSIONS
L SUFFIX
CERAMIC DIP PACKAGE
CASE 620–10
ISSUE V
19.05
6.10 —
0.39
1.40
0.21
3.18
19.93
7.49
5.08
0.50
1.65
0.38
4.31
0
°
0.51
15
°
1.01
1.27 BSC
2.54 BSC
7.62 BSC
MIN MINMAX MAX
INCHES MILLIMETERS
DIM
0.750
0.240 —
0.015
0.055
0.008
0.125
0.785
0.295
0.200
0.020
0.065
0.015
0.170
0.050 BSC
0.100 BSC
0.300 BSC
A B C D E
F G J K L M N
0
°
0.020
15
°
0.040
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN FORMED PARALLEL.
4. DIMENSION F MAY NARROW TO 0.76 (0.030) WHERE THE LEAD ENTERS THE CERAMIC BODY.
1 8
916
-A-
-B-
C
KN
G
E
F
D 16 PL
-T-
SEATING
PLANE
M
L
J 16 PL
0.25 (0.010) T A
M
S
0.25 (0.010) T B
M
S
MC10E1651
2–7 MOTOROLAECLinPS and ECLinPS Lite
DL140 — Rev 4
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MC10E1651/D
*MC10E1651/D*
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