Datasheet 33888, 33888A Datasheet (MOTOROLA)

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Freescale Semiconductor, Inc.
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Rev 3.0, 10/2004
Product Preview
Quad High-Side and Octal Low-Side Switch for Automotive
The 33888 is a single-package combination of a power die with four discrete high-side MOSFETs (two 10 m and two 40 mΩ) and an integrated IC control die consisting of eight low-side drivers (600 meach) with appropriate control, protection, and diagnostic features.
Programming, control, and diagnostics are accomplished using a 16-bit SPI interface. Additionally, each high-side output has its own parallel input for pulse-width modulation (PWM) control if desired. The low sides share a single configurable direct input.
The 33888 is available in two power packages.
Features
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• Dual 10 mΩ High Side, Dual 40 mΩ High Side, Octal 600 m Low Side
• Full Operating Voltage of 6.0 V to 27 V
• SPI Control of High-Side Overcurrent Limit, High Side Current Sense, Output OFF Open Load Detection, Output ON/OFF Control, Watchdog Timeout
• SPI Reporting of Program Status and Fault
• High-Side Analog Current Feedback with Selectable Ratio
• Enhanced 16 V Reverse Polarity V
Protection
PWR
emiconduct
33888 Simplified Application Diagram
33888
33888A
SOLID STATE RELAY FOR
AUTOMOTIVE APPLICATIONS
Bottom View
PNB SUFFIX APNB SUFFIX CASE 1438-06
36-TERMINAL PQFN
(12 x 12)
ORDERING INFORMATION
Device
PC33888PNB/R2
PC33888APNB/R2
MC33888FB/R2 64 PQFP
Temperature
Range (T
-40°C to 125°C
Top View
FB SUFFIX
CASE 1315-03
64-TERMINAL PQFP
Package
)
A
36 PQFN
eescale S
+5.0 V +5.0 V
Fr
4
MCU
A/D A/D CSNS0-1
This document contains certain information on a new product. Specifications and information herein are subject to change without notice.
© Motorola, Inc. 2004
4
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FS IHS0:IHS3 ILS RST
SPI WDIN CSNS2-3
FSI
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V
PWR
8 x Relay or LED
33888
V
DD
GND
V
PWR
LS4:LS11
HS3 HS2 HS1 HS0
Loads
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Table 1. Features Comparison: 33888 and 33888A
Parameter Symbol Condition 33888 33888A
Undervoltage Low-Side Output Shutdown V
Low-Side Drain-to-Source ON Resistance R
Recommended Frequency of SPI Operation
V
I
UP
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emiconduct
CS
SCLK
SO
RST
WAKE
FS
IN0
IN1 IN2
IN3 ILS
SI
R
DWN
I
DWN
I
DWN
SPI
3.0 MHz
eescale S Fr
WDIN
FSI
Watchdog
DD
V
IC
PWRUV
DS(ON)
f
SPI
Internal
Regulator
Logic
5.0 V 3.0 V
V
= 4.5 V;
PWR
= 3.5 V
V
DD
Extended Mode,
V
= 3.4 V
DD
V
IC
Gate Driver
Selectable Current Limit
Open Load
Detection
Overtemperature
Detection
Gate Control and Fault 10 m
HS1
Gate Control and Fault 40 m
HS2
Gate Control and Fault 40 m
HS3
Gate
Control
Not specified 8.0
Not specified 2.1 MHz
Over/Undervoltage
Protection
Selectable Output Current
Recopy (Analog MUX)
Selectable Output Current
Recopy (Analog MUX)
Clamp
Over-
temperature
I
LIM
Open Load
10 m
x 8
V
PWR
(max)
HS0
For details,
see page
11
14
17
HS0
CSNS0-1
HS1
HS2
CSNS2-3
HS3
LS4 LS5
LS6 LS7
LS8 LS9 LS10 LS11
GND
Figure 1. 33888 Simplified Internal Block Diagram
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 2
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Transparent Top View of Package
SO
DD
LS11
V
GND
LS10
LS9
LS8
LS7
LS6
LS5
GND
LS4
PWR
V
FS
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eescale S Fr
CS
SCLK
ILS
GND
IHS3
IHS2
CSNS2-3
14
16
17
18
SI
19
20
21
22
23
24
V
PWR
25 26 27 28
HS3
15
GND
(Control Die)
Internally Connected to V
(Power Die)
HS1
PWR
HS0
1
2313 1112 10 9 8 7 6 5 4
36
WDIN
35
FSI
34
RST
33
WAKE
32
GND
IHS1
31
30
IHS0
CSNS0-1
29
HS2
TERMINAL DEFINITIONS FOR PQFN
Functional descriptions of many of these terminals can be found in the System/Application Information section beginning on
page 19
.
Terminal
1
2, 24 V
3 6 8
10
4, 11, 15,
20, 32
5 7 9
12
13 V
Terminal
Name
FS
PWR
LS4 LS6 LS8
LS10
GND Ground These terminals serve as the ground for the source of the low-side output
LS5 LS7 LS9
LS11
DD
Formal Name Definition
Fault Status (Active Low)
Positive Power Supply
Low-Side Output 4 Low-Side Output 6 Low-Side Output 8
Low-Side Output 10
Low-Side Output 5 Low-Side Output 7 Low-Side Output 9
Low-Side Output 11
Digital Drain Voltage (Power)
This output terminal is an open drain indication that goes active low when a fault mode is detected by the device. Specific device fault indication is given via the SO terminal.
These terminal connects to the positive power supply and are the source input of operational power for the device.
Each low-side terminal is one 0.6 low-side output MOSFET drain, which pulls current through the connected loads. Each of the outputs is actively clamped at 53 V. These outputs are current and thermal overload protected. Maximum steady state current through each of these outputs is 500 mA.
transistors as well as the logic portion of the device.
Each low-side terminal is one 0.6 low-side output MOSFET drain, which pulls current through the connected loads. Each of the outputs is actively clamped at 53 V. These outputs are current and thermal overload protected. Maximum steady state current through each of these outputs is 800 mA.
This is an external input terminal used to supply power to the SPI circuit.
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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TERMINAL DEFINITIONS FOR PQFN (continued)
Functional descriptions of many of these terminals can be found in the System/Application Information section beginning on
page 19
.
Terminal
14 SO Serial Output
16
17 SCLK Serial Clock
Terminal
Name
CS
Formal Name Definition
Chip Select
(Active Low)
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18 SI Serial Input
19 ILS Low-Side Input
emiconduct
21 22 30 31
23 29
IHS3 IHS2 IHS0 IHS1
CSNS2-3 CSNS0-1
High-Side Input 3 High-Side Input 2 High-Side Input 0 High-Side Input 1
Current Sense 2-3 Current Sense 0-1
eescale S Fr
25 28
26 27
33 WAKE Wake
HS3 HS2
HS1 HS0
High-Side Output 3 High-Side Output 2
High-Side Output 1 High-Side Output 0
This is an output terminal connected to the SPI Serial Data Input terminal of the MCU or to the SI terminal of the next device in a daisy chain. This output will remain tri-stated unless the device is selected by a low generated will have CMOS logic levels and the output data will transition on the rising edges of SCLK. The serial output data provides fault information for each output and is returned MSB first when the device is addressed. OD11 through OD0 are output fault bits for outputs 11 through 0, respectively.
This is an input terminal connected to a chip select output of a microcontroller (MCU). This IC controls which device is addressed (selected) by pulling the terminal of the desired device logic Low, enabling the SPI communication with the device, while other devices on the serial link keep their serial outputs tri-stated. This input has an internal active pullup and requires CMOS logic levels.
This input terminal is connected to the SCLK terminal of the master MCU, which is a bit (shift) clock for the SPI port. It transitions one time per bit transferred at an operating frequency, f
cycle and has CMOS logic levels. This signal is used to shift data to and from the
33888.
This input terminal is connected to the SPI Serial Data Output terminal of the MCU from which it receives output command data. This input has an internal active pull-down and requires CMOS logic levels. The serial data transmitted on this line is a 16-bit control command sent MSB first, which controls the twelve output channels. Bits D3:D0 control the high-side outputs HS3:HS0, respectively. Bits D11:D4 control the low-side outputs LS11:LS4, respectively. The MUC will ensure that data is available on the falling edge of SCLK.
This input terminal is used to directly control a number of the low-side devices as configured by SPI. This terminal may or may not be activated depending on the configured state of the internal logic.
Each high-side input terminal is used to directly control only one designated high­side output. These inputs may or may not be activated depending on the configured state of the internal logic.
These terminals deliver a ratioed amount of the high-side output current that can be used to generate signal ground referenced output voltages for use by the MCU. Each respective CSNS terminal can be configured via SPI to deliver current from either of the two assigned outputs, or the currents could be the sum of the two. Current from HS0 and/or HS1 are sensed via CSNS0- 1. Current from HS2 and/or HS3 are sensed via CSNS2-3.
Each terminal is the source of a 40 m MOSFET high-side driver, which delivers current through the connected loads. These outputs can be controlled via SPI or using the IHS terminals depending on the internal configuration. These outputs are current limited and thermally protected. During fail-safe mode, output HS2 will be turned on until the device is reinitialized and then immediately followed by normal operation.
Each terminal is the source of a 10 m MOSFET high-side driver, which delivers current through the connected loads. These outputs can be controlled via SPI or using the IHS terminals depending on the internal configuration. These outputs are current limited and thermally protected. During fail-safe mode, output HS0 will be turned on until the device is reinitialized and then immediately followed by normal operation.
This terminal is used to input a logic [1] signal in order to enable the watchdog timer function. An internal clamp protects the terminal from high voltages when current is limited with an external resistor. This input has a passive internal pulldown.
, and is idle between command transfers. It is 50% duty
SPI
CS terminal. The output signal
CS
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 4
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TERMINAL DEFINITIONS FOR PQFN (continued)
Functional descriptions of many of these terminals can be found in the System /Application Information section beginning on
page 19.
Terminal
34
35 FSI Fail-Safe Input
36 WDIN Watchdog Input
Terminal
Name
RST
Formal Name Definition
Reset (Active Low)
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This input terminal is used to initialize the device configuration and fault registers, as well as place the device in a low current standby mode. This terminal also starts the watchdog timeout when transitioned from logic [0] to logic [1]. This terminal should not be allowed to be at logic [1] until V
internal passive pulldown.
The Fail-Safe input terminal level determines the state of the outputs after a watchdog timeout occurs. This terminal has an internal pullup. If the FSI terminal is left to float to a logic [1], then HS0 and HS2 will turn on when in the Fail-Safe state. If the FSI terminal is tied to GND, the watchdog circuit and fail-safe operation will be disabled, thus allowing operation without a watchdog signal.
This input terminal is a CMOS logic level input that is used to monitor system operation. If the incoming watchdog signal does not transition within the normal watchdog timeout range, the device will operate in the Fail-Safe mode. This input has an active internal pulldown.
is in regulation. This input has an
DD
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MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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IHS0
IHS1
616059
PWR
V
CSNS0-1
RST
WAKE
64
62
63
1
FSI
2
WDIN
3
FS
4
V
PWR
5
LS4
6
GND
7
LS5
8
LS6
9
GND
10
LS7
11
LS8
12
GND
13
LS9
14
LS10
15
GND
16
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LS11
V
DD
SO
CS
SCLK
17 18 19 20
PWR
V
HS2
58
57
HS2
56
NC
NC
555453
NC
52
NC
51
NC
50
NC
49
HS0
48
HS0
47
HS0
46
HS0
45
HS0
44
HS0
43
HS0
42
HS1
41
HS1
40
HS1
39
HS1
38
HS1
37
HS1
36
HS1
35
NC
34
NC
33
NC
or
27
303132
29
21
242526
23
22
SI
ILS
IHS2
IHS3
PWR
V
CSNS2-3
TERMINAL DEFINITIONS FOR PQFP
Functional descriptions of many of these terminals can be found in the System/Application Information section beginning on
page 19
emiconduct
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6, 9, 12, 15 GND Ground These terminals serve as the ground for the source of the low-side output
.
Terminal
1 FSI Fail-Safe Input
2 WDIN Watchdog Input
3
4, 26, 27,
58, 59
5
8 11 14
Terminal
Name
FS
V
PWR
LS4 LS6 LS8
LS10
Formal Name Definition
Fault Status (Active Low)
Positive Power Supply
Low-Side Output 4 Low-Side Output 6 Low-Side Output 8
Low-Side Output 10
The Fail-Safe input terminal level determines the state of the outputs after a watchdog timeout occurs. This terminal has an internal pullup. If the FSI terminal is left to float to a logic [1], then HS0 and HS2 will turn on when in the Fail-Safe state. If the FSI terminal is tied to GND, the watchdog circuit and fail-safe operation will be disabled, thus allowing operation without a watchdog signal.
This input terminal is a CMOS logic level input that is used to monitor system operation. If the incoming watchdog signal does not transition within the normal watchdog timeout range, the device will operate in the Fail-Safe mode. This input has an active internal pulldown.
This output terminal is an open drain indication that goes active low when a fault mode is detected by the device. Specific device fault indication is given via the SO terminal.
These terminal connects to the positive power supply and are the source input of operational power for the device.
Each low-side terminal is one 0.6 low-side output MOSFET drain, which pulls current through the connected loads. Each of the outputs is actively clamped at 53 V. These outputs are current and thermal overload protected. Maximum steady state current through each of these outputs is 500 mA.
transistors as well as the logic portion of the device.
28
NC
NC
NC
PWR
HS3
HS3
V
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 6
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eescale S Fr
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TERMINAL DEFINITIONS FOR PQFP (continued)
Functional descriptions of many of these terminals can be found in the System /Application Information section beginning on
page 19.
Terminal
7 10 13 16
17 V
18 SO Serial Output
19
20 SCLK Serial Clock
21 SI Serial Input
22 ILS Low-Side Input
23 24 61 62
25 60
28, 29 56, 57
30– 35,
50– 55
Terminal
Name
LS5 LS7 LS9
LS11
DD
CS
IHS3 IHS2 IHS0 IHS1
CSNS2-3 CSNS0-1
HS3 HS2
NC Not Connected
Formal Name Definition
Low-Side Output 5 Low-Side Output 7 Low-Side Output 9
Low-Side Output 11
Digital Drain Voltage (Power)
Chip Select
(Active Low)
High-Side Input 3 High-Side Input 2 High-Side Input 0 High-Side Input 1
Current Sense 2-3 Current Sense 0-1
High-Side Output 3 High-Side Output 2
Each low-side terminal is one 0.6 low-side output MOSFET drain, which pulls current through the connected loads. Each of the outputs is actively clamped at 53 V. These outputs are current and thermal overload protected. Maximum steady state current through each of these outputs is 800 mA.
This is an external input terminal used to supply power to the SPI circuit.
This is an output terminal connected to the SPI Serial Data Input terminal of the MCU or to the SI terminal of the next device in a daisy chain. This output will remain tri-stated unless the device is selected by a low generated will have CMOS logic levels and the output data will transition on the rising edges of SCLK. The serial output data provides fault information for each output and is returned MSB first when the device is addressed. OD11 through OD0 are output fault bits for outputs 11 through 0, respectively.
This is an input terminal connected to a chip select output of a microcontroller (MCU). This IC controls which device is addressed (selected) by pulling the terminal of the desired device logic Low, enabling the SPI communication with the device, while other devices on the serial link keep their serial outputs tri-stated. This input has an internal active pullup and requires CMOS logic levels.
This input terminal is connected to the SCLK terminal of the master MCU, which is a bit (shift) clock for the SPI port. It transitions one time per bit transferred at an operating frequency, f
cycle and has CMOS logic levels. This signal is used to shift data to and from the
33888.
This input terminal is connected to the SPI Serial Data Output terminal of the MCU from which it receives output command data. This input has an internal active pull-down and requires CMOS logic levels. The serial data transmitted on this line is a 16-bit control command sent MSB first, which controls the twelve output channels. Bits D3:D0 control the high-side outputs HS3 :HS0, respectively. Bits D11:D4 control the low-side outputs LS11:LS4, respectively. The MUC will ensure that data is available on the falling edge of SCLK.
This input terminal is used to directly control a number of the low-side devices as configured by SPI. This terminal may or may not be activated depending on the configured state of the internal logic.
Each high-side input terminal is used to directly control only one designated high­side output. These inputs may or may not be activated depending on the configured state of the internal logic.
These terminals deliver a ratioed amount of the high-side output current that can be used to generate signal ground referenced output voltages for use by the MCU. Each respective CSNS terminal can be configured via SPI to deliver current from either of the two assigned outputs, or the currents could be the sum of the two. Current from HS0 and/or HS1 are sensed via CSNS0- 1. Current from HS2 and/or HS3 are sensed via CSNS2-3.
Each terminal is the source of a 40 m MOSFET high-side driver, which delivers current through the connected loads. These outputs can be controlled via SPI or using the IHS terminals depending on the internal configuration. These outputs are current limited and thermally protected. During fail-safe mode, output HS2 will be turned on until the device is reinitialized and then immediately followed by normal operation.
These terminals are not connected internally.
, and is idle between command transfers. It is 50% duty
SPI
CS terminal. The output signal
CS
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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TERMINAL DEFINITIONS FOR PQFP (continued)
Functional descriptions of many of these terminals can be found in the System/Application Information section beginning on
page 19
.
Terminal
36– 42 43– 49
63 WAKE Wake
64
Terminal
Name
HS1 HS0
RST
Formal Name Definition
High-Side Output 1 High-Side Output 0
Reset (Active Low)
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Each terminal is the source of a 10 m MOSFET high-side driver, which delivers current through the connected loads. These outputs can be controlled via SPI or using the IHS terminals depending on the internal configuration. These outputs are current limited and thermally protected. During fail-safe mode, output HS0 will be turned on until the device is reinitialized and then immediately followed by normal operation.
This terminal is used to input a logic [1] signal in order to enable the watchdog timer function. An internal clamp protects the terminal from high voltages when current is limited with an external resistor. This input has a passive internal pulldown.
This input terminal is used to initialize the device configuration and fault registers, as well as place the device in a low current standby mode. This terminal also starts the watchdog timeout when transitioned from logic [0] to logic [1]. This terminal should not be allowed to be at logic [1] until V
internal passive pulldown.
is in regulation. This input has an
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33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 8
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MAXIMUM RATINGS
All voltages are with respect to ground unless otherwise noted.
Rating Symbol Value Unit
ELECTRICAL RATINGS
Power Supply Voltage
Steady State
Input Terminal Voltage (Note 1)
WAKE Input Terminal Clamp Current
Continuous per Output Current (Note 2)
Low-Sides 4, 6, 8, 10
Low-Sides 5, 7, 9, 11
Continuous per Output Current (Note 3)
High-Sides 0, 1
High-Sides 2, 3
Output Clamp Energy
High-Sides 0, 1 (Note 4)
High-Sides 2, 3 (Note 5)
Low-Sides (Note 6)
ESD Voltage
Human Body Model (Note 7)
Machine Model (Note 8)
Notes
1. Exceeding voltage limits on SCLK, SI, device.
2. Continuous low-side output current rating so long as maximum junction temperature is not exceeded. Operation at 125°C ambient temperature will require calculation of maximum output current using package thermal resistance.
3. Continuous high-side output current rating so long as maximum junction temperature is not exceeded. Operation at 125°C ambient temperature will require calculation of maximum output current using package thermal resistance.
4. Active HS0 and HS1 clamp energy using the following conditions: single nonrepetitive pulse, V
5. Active HS2 and HS3 clamp energy using the following conditions: single nonrepetitive pulse, V
6. Active low-side clamp energy using the following conditions: single nonrepetitive pulse, 450 mA, T
7. ESD1 testing is performed in accordance with the Human Body Model (C
8. ESD2 testing is performed in accordance with the Machine Model (C
V
PWR
-16 to 41
VIN - 0.3 to 7.0 V
I
WICI
I
OUTLS
I
OUTHS
E
HS
E
HS
E
LS
V
ESD1
V
ESD2
CS, WDIN, RST, IHS, FSI, or ILS terminals may cause a malfunction or permanent damage to the
PWR
PWR
ZAP
= 200 pF, R
ZAP
=100 pF, R
ZAP
= 1500 Ω).
ZAP
= 0 Ω).
2.5 mA
500
800
10
5.0
450
120
50
±2000
±200
= 16.0 V, L = 40 mH, TJ = 150°C.
= 16.0 V, L = 10 mH, TJ = 150°C.
= 150°C.
J
V
mA
A
mJ
V
Fr
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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MAXIMUM RATINGS (continued)
All voltages are with respect to ground unless otherwise noted.
Rating Symbol Value Unit
THERMAL RATINGS
Operating Temperature
Ambient
Junction
Storage Temperature
Control Die Thermal Resistance (Note 9)
PQFP
One Low-Side ON
Two Low-Side ON
Three Low-Side ON
Four Low Side ON
All Low-Sides ON
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PQFN
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One Low-Side ON
Two Low-Side ON
Three Low-Side ON
Four Low Side ON
All Low-Sides ON
Power Die Thermal Resistance (Note 9)
PQFP
One High-Side 2, 3 ON
All High-Sides ON
PQFN
One High-Side 2, 3 ON
All High-Sides ON
Thermal Resistance, Junction to Ambient, Natural Convection, Four-Layer Board (Note 9)
PQFP
PQFN
Peak Terminal Reflow Temperature During Solder Mounting (Note 10)
PQFP
PQFN
Notes
9. Board dimensions are 8.0 cm x 8.0 cm x 1.5 mm with a 300 mm
10. Terminal soldering temperature limit is 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause malfunction or permanent damage to the device.
T
A
T
J
T
STG
R
CJC
θ
R
PJC
θ
R
JA
θ
T
SOLDER
2
copper area on the bottom layer.
-40 to 125
-40 to 150
-55 to 150 °C
12.5
9.3
7.3
5.9
3.2
8.6
6.0
4.6
3.8
2.0
0.5
0.15
0.5
0.1
33
37
225
240
°C
°C/W
°C/W
°C/W
°C
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 10
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STATIC ELECTRICAL CHARACTERISTICS
Characteristics noted under conditions 6.0 V V
27 V, 4.5 V VDD 5.5 V, -40°C TJ 150°C unless otherwise noted. Typical
PWR
values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic Symbol Min Typ Max Unit
POWER INPUT
Supply Voltage Range
Fully Operational
Supply Current
V
PWR
> 125°C
T
J
125°C
T
J
V
Standby Current (All Outputs OFF, Open Load Detection Disabled,
PWR
WAKE = H,
T
T
Sleep State Supply Current (V
HS[0:3] = 0 V) (Note 11)
T
T
Logic Supply Voltage Range
Logic Supply Current
T
T
Logic Supply Sleep State Current
Sleep State Low-Side Output Leakage Current (per Low-Side Output,
RST = LOW)
T
T
Overvoltage Shutdown Threshold
Overvoltage Shutdown Hysteresis
Undervoltage High-Side Output Shutdown (Note 12)
Undervoltage Low-Side Output Shutdown
APNB Suffix Only (Note 12)
PNB and FB Suffixes
Undervoltage High-Side Shutdown Hysteresis
Notes
11. This parameter is tested at 125°C with a maximum value of 10 µA.
12. SPI/IO and internal logic operational. Outputs will recover in instructed state when V
RST = H)
> 125°C
J
125°C
J
= 85°C
J
= 25°C
J
> 125°C
J
125°C
J
= 85°C
J
= 25°C
J
does not go below V
< 12.6 V, RST < 0.5 V, WAKE < 0.5 V,
PWR
.
PWRUV
V
PWR
I
PWR(ON)
I
PWR(SBY)
I
PWR(SS)
V
DD
I
DD(ON)
I
DD(SS)
I
SLK(SS)
V
PWROV
V
PWROV(HYS)
V
PWRUV
V
PWRUV
V
PWRUV(HYS)
PWR
6.0 27
4.5 5.0 5.5 V
––5.0µA
28.532 36V
0.2 0.6 1.5 V
5.0 5.6 6.0 V
3.0
5.0
0.1 0.3 0.5 V
voltage level returns to normal as long as the level
17
4.2
2.9
1.0
4.2
2.9
4.0
5.6
25
20
7.0
5.0
80
25
7.0
5.0
3.0
1.0
4.4
6.0
V
mA
mA
µA
mA
µA
V
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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STATIC ELECTRICAL CHARACTERISTICS (continued)
V
Characteristics noted under conditions 6.0 V values noted reflect the approximate parameter mean at T
Characteristic Symbol Min Typ Max Unit
27 V, 4.5 V VDD 5.5 V, -40°C TJ 150°C unless otherwise noted. Typical
PWR
= 25°C under nominal conditions unless otherwise noted.
A
POWER INPUT (continued)
Current Sense Ratio (9.0 V < V
CSNS0-1/HS0, CSNS0 - 1 / HS1
Current Sense Ratio (C
HS[0:1] Output Current
1.0 A
2.0 A
5.0 A
6.5 A
10 A
Current Sense Ratio (V
nc...
CSNS2- 3 / HS2, CSNS2 - 3 / HS3
, I
Current Sense Ratio (C
HS[2:3] Output Current
or
0.5 A
1.0 A
3.0 A
3.7 A
5.0 A
Current Sense Clamp Voltage
I
= 15 mA Generated by the Device
CNS
HS0 AND HS1 POWER OUTPUTS
emiconduct
Drain-to-Source ON Resistance (I
= 25°C
T
J
= 6.0 V
V
PWR
= 9.0 V
V
PWR
= 13 V
V
PWR
= 150°C
T
J
= 6.0 V
eescale S Fr
V
PWR
= 9.0 V
V
PWR
= 13 V
V
PWR
Reverse Battery Source-to-Drain ON Resistance (I
= -12 V
V
PWR
Output Self-Limiting Peak Current
Outputs ON, V
Output Self-Limiting Sustain Current
Outputs ON, V
Open Load Detection Current (Note 13)
Notes
13. Output OFF Open Load Detection Current is the current required to flow through the load for the purpose of detecting the existence of an open load condition when the specific output is commanded OFF.
OUT
OUT
SR[0:1]
PWR
SR[2:3]
= V
= V
PWR
PWR
< 16 V, CSNS < 4.5 V)
PWR
) Accuracy
= 9.0 V – 16 V, CSNS < 4.5 V)
) Accuracy
= 5.5 A)
OUT
= -5.5 A, TJ= 25°C)
OUT
-2.0 V
-2.0 V
C
SR[0:1]
C
SR[0:1]_ACC
C
SR
C
SR[2:3]_ACC
V
SENSE
R
DS(ON)
R
DS(ON)REV
I
LIM(PK)
I
LIM(SUS)
I
OLDC
1/1400
-35
-19
-14
-12
-12
1/880
-30
-19
-13.5
-12
-9.0
4.5 6.0 7.0
0.02
33 49 66
13 25 34
30 100 µA
35
19
14
12
12
30
19
13.5
12
9.0
0.02
0.01
0.01
0.034
0.017
0.017
%
%
V
A
A
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 12
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STATIC ELECTRICAL CHARACTERISTICS (continued)
Characteristics noted under conditions 6.0 V V
27 V, 4.5 V VDD 5.5 V, -40°C TJ 150°C unless otherwise noted. Typical
PWR
values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic Symbol Min Typ Max Unit
HS0 AND HS1 POWER OUTPUTS (continued)
Output Fault Detection Threshold (Note 14)
Output Programmed OFF
Output Negative Clamp Voltage
0.5 A <
I
< 2.0 A, Output OFF
OUT
Overtemperature Shutdown (Outputs OFF) (Note 15)
Overtemperature Shutdown Hysteresis (Note 15)
V
OFD(THRES)
V
CL
T
SD
T
SD(HYS)
2.0 3.0 4.0
-20
160 175 190 °C
10 30 °C
HS2 AND HS3 POWER OUTPUTS
Drain-to-Source ON Resistance (I
= 25°C
T
J
= 6.0 V
V
PWR
V
= 9.0 V
PWR
V
= 13 V
PWR
= 150°C
T
J
= 6.0 V
V
PWR
V
= 9.0 V
PWR
V
= 13 V
PWR
Reverse Battery Source-to-Drain ON Resistance (I
= -12 V
V
PWR
Output Self-Limiting Peak Current
Outputs ON, V
Output Self-Limiting Sustain Current
Outputs ON, V
Open Load Detection Current (Note 16)
Output Fault Detection Threshold (Note 17)
Outputs Programmed OFF
Output Negative Clamp Voltage
0.5 A <
I
OUT
Overtemperature Shutdown (Outputs OFF) (Note 18)
Overtemperature Shutdown Hysteresis (Note 18)
Notes
14. Output fault detection threshold with outputs programmed OFF. For the Low-Side Outputs, fault detection thresholds are the same for output open and battery shorts.
15. Guaranteed by design. Not production tested.
16. Output OFF Open Load Detection Current is the current required to flow through the load for the purpose of detecting the existence of an open load condition when the specific output is commanded OFF.
17. Output fault detection threshold with outputs programmed OFF.
18. Guaranteed by design. Not production tested.
= V
OUT
PWR
= V
OUT
PWR
< 2.0 A, Outputs OFF
OUT
-2.0 V
-2.0 V
= 4.5 A)
= 4.5 A, TJ = 25°C)
OUT
R
DS(ON)
R
DS(ON)REV
I
LIM(PK)
I
LIM(SUS)
I
OLDC
V
OFD(THRES)
V
CL
T
SD
T
SD(HYS)
0.08
15 23 35
6.0 10 15
25 100 µA
2.0 3.0 4.0
-20
160 170 190 °C
10 30 °C
0.08
0.04
0.04
0.136
0.068
0.068
V
V
A
A
V
V
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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STATIC ELECTRICAL CHARACTERISTICS (continued)
V
Characteristics noted under conditions 6.0 V values noted reflect the approximate parameter mean at T
Characteristic Symbol Min Typ Max Unit
27 V, 4.5 V VDD 5.5 V, -40°C TJ 150°C unless otherwise noted. Typical
PWR
= 25°C under nominal conditions unless otherwise noted.
A
LOW-SIDE POWER OUTPUTS
Drain-to-Source ON Resistance (I
= 25°C
T
J
= 4.5 V; V
V
PWR
V
= 6.0 V
PWR
V
= 9.0 V
PWR
V
= 13 V
PWR
T
= 150°C
J
= 4.5 V; V
V
PWR
V
= 6.0 V
PWR
V
= 9.0 V
PWR
nc... , I
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emiconduct
eescale S
V
= 13 V
PWR
Output Self-Limiting Current (Outputs Programmed ON, V
Low-Side 4, 6, 8, 10
Low-Side 5, 7, 9, 11
Output OFF Open Load Detection Current (Note 19)
Output Programmed OFF, V
Output Fault Detection Threshold (Note 20)
Output Programmed OFF
Output Clamp Voltage
2.0 mA <
Low-Side Body Diode Voltage (I = -300 mA, T
Overtemperature Shutdown (Outputs OFF) (Note 21)
Overtemperature Shutdown Hysteresis (Note 21)
Notes
19. Output OFF Open Load Detection Current is the current required to flow through the load for the purpose of detecting the existence of an
20. Output fault detection threshold with outputs programmed OFF. For the low-side outputs, fault detection thresholds are the same for output
21. Guaranteed by design. Not production tested.
I
< 200 mA, Outputs OFF
OUT
open load condition when the specific output is commanded OFF.
open and battery shorts.
= 3.5 V, 33888A Only
DD
= 3.5 V, 33888A Only
DD
OUT
OUT
= 3.0 V
= 0.3 A)
= 125°C)
J
OUT
= 3.0 V)
R
DS(ON)
I
LIM
I
OLDC
V
OFD(THRES)
V
CL
V
BD
T
LIM
T
LIM(HYS)
0.5
0.8
25 50 100
2.0 3.0 4.0
41 53 60
0.5 0.7 0.9 V
160 170 190 °C
10 20 30 °C
0.9
1.3
8.0
1.0
0.7
0.6
8.0
1.8
1.1
0.9
1.5
2.0
Fr
µA
A
V
V
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 14
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STATIC ELECTRICAL CHARACTERISTICS (continued)
Characteristics noted under conditions 6.0 V V
27 V, 4.5 V VDD 5.5 V, -40°C TJ 150°C unless otherwise noted. Typical
PWR
values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic Symbol Min Typ Max Unit
CONTROL INTERFACE
Input Logic High Voltage (Note 22)
Input Logic Low Voltage (Note 22)
Input Logic Voltage Hysteresis (SI,
Input Logic Pulldown Current (SI, SCLK, IHS[0:3], ILS, WDIN)
Input Logic Pulldown Resistor (WAKE,
Input Logic Pullup Current (
Input Logic Pullup Current (FSI, V
Wake Input Clamp Voltage (I
Wake Input Forward Voltage (I
SO High-State Output Voltage (I
FS, SO Low-State Output Voltage (I
SO Tri-State Leakage Current (
Input Capacitance (Note 26)
FS Tri-State Capacitance (Note 23)
SO,
Notes
22. Upper and lower logic threshold voltage range applies to SI, FSI, and
23. Parameter is guaranteed by design but is not production tested.
24.
CS is pulled up to V
25. The current must be limited by a series resistor when using voltages higher than the W
26. Input capacitance of SI, production tested.
RST signals are derived from an internal supply.
DD
CS, SCLK, IHS[0:3], ILS) (Note 23)
RST)
CS, V
= 0.7 VDD) (Note 24)
IN
= 3.5 V)
IN
< 2.5 mA) (Note 25)
WICI
= -2.5 mA)
WICI
= 1.0 mA)
OH
= -1.6 mA)
OL
CS 3.5 V)
CS, SCLK, RST, IHS[0:3], ILS, WAKE, and WDIN input signals. The WAKE,
.
CS, SCLK, RST, IHS[0:3], ILS, WAKE, and WDIN. This parameter is guaranteed by process monitoring but is not
V
V
V
IN(HYS)
I
DWN
R
DWN
I
UPC
I
UPF
V
V
V
SOH
V
SOL
I
SOLK
C
C
IH
IL
WIC
WIF
IN
SO
ICV
0.7 V
DD
––1.0V
100 350 750 mV
5.0 20 µA
100 200 400 k
5.0 20 µA
5.0 20 µA
7.0 14 V
-2.0–-0.3V
0.8 V
DD
–0.20.4V
-5.0 0 5.0 µA
4.0 12 pF
20 pF
.
––V
––V
eescale S Fr
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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DYNAMIC ELECTRICAL CHARACTERISTICS
Characteristics noted under conditions 6.0 V V
≤ 27 V, 4.5 V ≤ VDD ≤ 5.5 V, -40°C ≤ TJ ≤ 150°C unless otherwise noted. Typical
PWR
values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic Symbol Min Typ Max Unit
POWER OUTPUT TIMING
High-Side Output Rising Fast Slew Rate (Note 27)
6.0 V < V
9.0 V < V
16 V < V
High-Side Output Rising Slow Slew Rate (Note 28)
6.0 V < V
9.0 V < V
16 V < V
High-Side Output Falling Fast Slew Rate (Note 27)
nc...
6.0 V < V
9.0 V < V
, I
16 V < V
or
High-Side Output Falling Slow Slew Rate (Note 28)
6.0 V < V
9.0 V < V
16 V < V
High-Side Output Turn ON Delay Time (Note 29)
High-Side Output Turn OFF Delay Time (Note 30)
Low-Side Output Falling Slew Rate (Note 31)
emiconduct
Low-Side Output Rising Slew Rate (Note 31)
Low-Side Output Turn ON Delay Time (Note 32)
Low-Side Output Turn OFF Delay Time (Note 33)
Low-Side Output Fault Delay Timer (Note 34)
Watchdog Timeout (Note 35)
Notes
eescale S
27. High-side output rise and fall fast slew rates measured across a 5.0 Ω resistive load at high-side output = 0.5 V to V
Fr
page 18). These parameters are guaranteed by process monitoring.
28. High-side output rise and fall slow slew rates measured across a 5.0 resistive load at high-side output = 0.5 V to V
Figure 2
29. High-side output turn-ON delay time measured from 50% of the rising IHS to 0.5 V of output OFF with R page 18).
30. High-side output turn-OFF delay time measured from 50% of the falling IHS to V (see Figure 2
31. Low-side output rise and fall slew rates measured across a 5.0 resistive load at low-side output = 10% to 90% (see Figure 3
32. Low-side output turn-ON delay time measured from 50% of the rising ILS to 90% of V page 18).
33. Low-side output turn-OFF delay time measured from 50% of the falling ILS to 10% of V page 18). These parameters are guaranteed by process monitoring.
34. Propagation time of Short Fault Disable Report Delay measured from rising edge of configured for low-side output overcurrent latchoff using CLOCCR.
35. Watchdog timeout delay is measured from the rising edge of WAKE or driven OFF and the FSI floating. The accuracy of
< 9.0 V
PWR
< 16 V
PWR
< 27 V
PWR
< 9.0 V
PWR
< 16 V
PWR
< 27 V
PWR
< 9.0 V
PWR
< 16 V
PWR
< 27 V
PWR
< 9.0 V
PWR
< 16 V
PWR
< 27 V
PWR
, page 18). These parameters are guaranteed by process monitoring.
, page 18).
t
is maintained for all configured watchdog timeouts.
WDTO
SR
R_FAST
0.03
0.05
0.1
SR
R_SLOW
0.01
0.01
0.01
SR
F_FAST
0.2
0.3
0.5
SR
F_SLOW
0.05
0.08
0.08
t
DLY(ON)
t
DLY(OFF)
SR
F
SR
R
t
DLY(ON)
t
DLY(OFF)
t
DLY(FS)
t
WDTO
-2.0 V of the output OFF with RL = 27 resistive load
PWR
CS to output disabled, low-side = 5.0 V, and device
RST from the sleep state to the HS[0:1] turn-ON with the outputs
5.0 30 150 µs
5.0 80 150 µs
0.5 3.0 10 V/µs
1.0 6.0 20 V/µs
0.5 2.0 10 µs
0.5 4.0 10 µs
70 150 250 µs
340 584 770 ms
with RL = 27 Ω resistive load (see Figure 3,
OUT
with RL = 27 resistive load (see Figure 3,
OUT
0.5
0.08
0.8
0.15
PWR
= 27 resistive load (see Figure 2,
L
V/µs
0.6
0.8
1.1
V/µs
0.14
0.18
0.2
V/µs
1.0
1.5
2.2
V/µs
0.3
0.4
0.5
-3.0 V (see Figure 2,
-3.0 V (see
PWR
, page 18).
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 16
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DYNAMIC ELECTRICAL CHARACTERISTICS (continued)
Characteristics noted under conditions 6.0 V V
≤ 27 V, 4.5 V ≤ VDD ≤ 5.5 V, -40°C ≤ TJ ≤ 150°C unless otherwise noted. Typical
PWR
values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions unless otherwise noted.
Characteristic Symbol Min Typ Max Unit
POWER OUTPUT TIMING (continued)
Peak Current Limit Timer (Note 36)
Direct Input Switching Frequency (Note 37)
t
PCT
f
PWM
40 70 100 ms
125 Hz
SPI INTERFACE TIMING (Note 38)
Recommended Frequency of SPI Operation
Normal Mode
Extended Mode: V
Required Low State Duration for
Rising Edge of
Rising Edge of
Falling Edge of
Required High State Duration of SCLK (Required Setup Time) (Note 40)
Required Low State Duration of SCLK (Required Setup Time) (Note 40)
Falling Edge of SCLK to Rising Edge of
SI to Falling Edge of SCLK (Required Setup Time) (Note 40)
Falling Edge of SCLK to SI (Required Hold Time) (Note 40)
SO Rise Time
C
= 200 pF
L
SO Fall Time
= 200 pF
C
L
CS, SCLK, Incoming Signal Rise Time (Note 41)
SI,
SI,
CS, SCLK, Incoming Signal Fall Time (Note 41)
Time from Falling Edge of
Time from Rising Edge of
Time from Rising Edge of SCLK to SO Data Valid (Note 44)
0.2 V
Notes
t
36.
37. This frequency is a typical value. Maximum switching frequencies are dictated by the turn-ON delay, turn-OFF delay, output rise and fall times, and the maximum allowable junction temperature.
38. Symmetrical 50% duty cycle SCLK clock period of 333 ns.
39.
RST low duration measured with outputs enabled and going to OFF or disabled condition.
40. Maximum setup time required for the 33888 is the minimum guaranteed time needed from the MCU.
41. Rise and fall time of incoming SI,
42. Time required for output status data to be available for use at SO. 1.0 k pullup on
43. Time required for output status data to be terminated at SO. 1.0 k pullup on CS.
44. Time required to obtain valid data out from SO following the rise of SCLK.
CS to Falling Edge of CS (Required Setup Time) (Note 40)
RST to Falling Edge of CS (Required Setup Time) (Note 40)
CS to Rising Edge of SCLK (Required Setup Time) (Note 40)
SO 0.8 VDD, CL = 200 pF
DD
measured from the rising edge of CS to 90% of I
PCT
= 3.4 V; V
DD
CS to SO Low Impedance (Note 42)
CS to SO High Impedance (Note 43)
= 4.5 V, APNB Suffix Only
PWR
RST (Note 39)
CS (Required Setup Time) (Note 40)
CS, and SCLK signals suggested for design consideration to prevent the occurrence of double pulsing.
LIMPKHS[x,x]
when the peak current limit is enabled.
f
SPI
t
WRST
t
CS
t
ENBL
t
LEAD
t
WSCLKh
t
WSCLKl
t
LAG
t
SI(SU)
t
SI(HOLD)
t
RSO
t
FSO
t
RSI
t
FSI
t
SO(EN)
t
SO(DIS)
t
VALID
CS.
50 167 ns
300 ns
––5.0µs
50 167 ns
167 ns
167 ns
50 167 ns
–2583ns
–2583ns
–2550
–2550
50 ns
50 ns
145 ns
65 145 ns
65 105
3.0
2.1
MHz
ns
ns
ns
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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Timing Diagrams
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eescale S Fr
Direct input or
Direct Input or SPI Bit
V
PWR
VPWR VPWR - 0.5V
V
PWR
VPWR - 3V
V
PWR
0.5V
V
PWR
VPWR
90%
90%
10%
10%
-0.5 V
-3.0 V
0.5 V
t
DLY(ON)
Tdly
(on)
Direct input or SPI bit
t
Tdly(on)
DLY(ON)
spi bit
SR
SRr_fast
R_FAST
Figure 2. Output Slew Rates and Time Delays, High Side
Direct Input or SPI Bit
SRf
SR
F
Figure 3. Output Slew Rates and Time Delays, Low Side
SR
R_SLOW
SRr_slow
Tdly(off)
t
DLY(OFF)
Tdly(off)
t
DLY(OFF)
SRr
SR
SRf_slow
R
SR
F_SLOW
SR
F_FAST
SRf_fast
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 18
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SYSTEM/APPLICATION INFORMATION
INTRODUCTION
This 33888 is a single-package combination of a power die with four discrete high-side MOSFETs and an integrated IC control die consisting of eight low-side drivers with appropriate control, protection, and diagnostic features. The high-side drivers are useful for both internal and external vehicle lighting applications as well as capable of driving inductive solenoid loads. The low-side drivers are capable of controlling low­current on/off type inductive loads, such as relays and solenoids as well as LED indicators and small lamps (see
SPI Interface and Protocol Description
nc... , I
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emiconduct
eescale S Fr
The SPI interface has full duplex, three-wire synchronous data transfer and has four I/O lines associated with it: Serial Clock (SCLK), Serial Input (SI), Serial Output (SO), and Chip Select (
(D15/D0) protocol with both input and output words transferring the most significant bit first. All inputs are compatible with 5.0 V CMOS logic levels. During SPI output control, a logic [0] in a message word will result in the designated output being turned off. Similarly, a logic [1] will turn on a corresponding output.
Serial Clock (SCLK)
33888. The serial input (SI) terminal accepts data into the input shift register on the falling edge of the SCLK signal while the serial output terminal (SO) shifts data information out of the SO line driver on the rising edge of the SCLK signal. It is important that the SCLK terminal be in a logic [0] state whenever the chip select ( recommended that the SCLK terminal be kept in a logic [0] state as long as the device is not accessed ( SCLK has an active internal pulldown, I
logic [1], signals at the SCLK and SI terminals are ignored and SO is tri-stated (high impedance). (See Figures 4
page 20.)
Serial Interface (SI)
CS).
The SI/SO terminals of the 33888 follow a first-in first-out
The SPI lines perform the following functions:
The SCLK terminal clocks the internal shift registers of the
CS) makes any transition. For this reason, it is
CS in logic [1] state).
. When CS is
DWN
simplified application diagram, page 2 body control, instrumentation, and other high-power switching applications and systems.
The 33888 is available in two packages: a power-enhanced 12 x 12 nonleaded Power QFN package with exposed tabs and a 64-lead Power QFP plastic package. Both packages are intended to be soldered directly onto the printed circuit board.
The 33888 differs from the 33888A as explained in Table 1 page 2.
FUNCTIONAL DESCRIPTION
Serial Output (SO)
The SO data terminal is a tri-stateable output from the shift register. The SO terminal remains in a high-impedance state until the report the status of the outputs as well as provide the capability to reflect the state of the direct inputs. The SO terminal changes states on the rising edge of SCLK and reads out on the falling edge of SCLK. When an output is ON or OFF and not faulted, the corresponding SO bit, OD11:OD0, is a logic [0]. If the output is faulted, the corresponding SO state is a logic [1]. SO OD14:OD12 reflect the state of six various inputs (three at a time) depending upon the reported state of the previously written watchdog bit OD15.
Chip Select (
microcontroller (MCU). When this terminal is in a logic [0] state, the 33888 is capable of transferring information to and receiving information from the MCU. The 33888 latches in data from the input shift registers to the addressed registers on the rising edge of power outputs to the shift registers on the falling edge of The output driver on the SO terminal is enabled when logic [0]. logic [0] state when SCLK is a logic [0]. CS has an active internal pullup, I
and 5 on
MCU via the 16-bit SPI protocol as described in the next section.
CS terminal is put into a logic [0] state. The SO data
CS terminal enables communication with the master
The
CS. The 33888 transfers status information from the
CS is only transitioned from a logic [1] state to a
The 33888 is capable of communicating directly with the
CS)
UP
). The device is useful in
,
CS.
CS is
.
This is a serial interface (SI) command data input terminal. Each SI bit is read on the falling edge of SCLK. A 16-bit stream of serial data is required on the SI terminal, starting with D15 to D0. The 12 outputs of the 33888 are configured and controlled using the 3-bit addressing scheme and the 12 assigned data bits designed into the 33888. SI has an active internal pulldown, I
.
DWN
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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CSB
CS
SCLK
SI
Freescale Semiconductor, Inc.
D15 D1 D2 D3 D4 D5 D6 D7 D8 D9 D14 D13 D12 D11 D10
D0
SO
Notes
OD12
OD13 OD14 OD15 OD6 OD7 OD8 OD9 OD10 OD11 OD1 OD2 OD3 OD4 OD5
1. RST is in a logic [1] state during the above operation.
2. D15:D0 relate to the most recent ordered entry of program data into the 33888.
3. OD15: OD0 relate to the first 16 bits of ordered fault and status data out of the 33888.
Figure 4. Single 16-Bit Word SPI Communication
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CS
or
CSB
SCLK
SI
SO
D15 D1* D2* D13*D14*D15*D0 D1 D14 D13 D2 D0*
OD13 OD14 OD15 D14 D15 OD0 OD1 OD2 D1 D2 D13 D0
emiconduct
Notes
1. RST is a logic [1] state during the above operation.
2. D15:D0 relate to the most recent ordered entry of program data into the 33888.
3. D15*:D0* relate to the first 16 bits of ordered entry data out of the 33888.
4. OD15:OD0 relate to the first 16 bits of ordered fault and status data out of the 33888.
Figure 5. Multiple 16-Bit Word SPI Communication
eescale S
Serial Input Communication
Fr
SPI communication is accomplished using 16-bit messages. A message is transmitted by the MCU starting with the MSB, D15, and ending with the LSB, D0 (refer to Table 2 Each incoming command message on the SI terminal can be interpreted using the following bit assignments: the first twelve LSBs, D11:D0, control each of the twelve outputs; the next three bits, D14:D12, determine the command mode; and the MSB, D15, is the watchdog bit.
, page 21).
OD0
Multiple messages can be transmitted in succession to accommodate those applications where daisy chaining is desirable or to confirm transmitted data, as long as the messages are all multiples of 16 bits. Any attempt made to latch in a message that is not 16 bits will be ignored.
The 33888 has six registers that are used to configure the device and control the state of the four high-side and eight low-side outputs (Table 3 addressed via D14:D12 of the incoming SPI word (Table 2 page 21).
, page 21). The registers are
,
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 20
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nc... , I
or
emiconduct
.
Table 2. SI Message Bit Assignment
Bit Sig SI Msg Bit
MSB D15
D14:12
D11
D10
D9
D8
D7
D6
WD Address Low-Side High-Side
SI
Register
SOCR x 0 0 0 LS11 LS10 LS9 LS8 LS7 LS6 LS5 LS4 HS3 HS2 HS1 HS0
DICR x 1 0 0 PWB11 PWB10 PWB9 PWB8 PWB7 PWB6 PWB5 PWB4 PWB3 PWB2
LFCR x 0 1 0 A/OB11 A/OB10 A/OB9 A/OB8 A/OB7 A/OB6 A/OB5 A/OB4 A/OB3 A/OB2 A/OB1 A/OB0
WDCSCR x 1 1 0 NA NA NA NA NA NA WDH WDL CS3 CS2 CS1 CS0
OLCR x 0 0 1 OL11 OL10 OL9 OL8 OL7 OL6 OL5 OL4 OLB3 OLB2 OLB1 OLB0
CLOCCR x 1 0 1 OC11 OC10 OC9 OC8 OC7 OC6 OC5 OC4 ILIM3 ILIM2 ILIM1 ILIM0
NOT
USED
TEST x 1 1 1 ILIMPK WD ILIM OT
x= Don’t care. NA=Not applicable.
D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
x 0 1 1
Watchdog in: toggled to satisfy watchdog requirements.
Register address bits.
Used to configure Low-Side Output LS11.
Used to configure Low-Side Output LS10.
Used to configure Low-Side Output LS9.
Used to configure Low-Side Output LS8.
Used to configure Low-Side Output LS7.
Used to configure Low-Side Output LS6.
Message Bit Description
Table 3. Serial Input Address and Configuration Bit Map
Table 2. SI Message Bit Assignment (continued)
Bit Sig SI Msg Bit
D5
D4
D3
D2
D1
LSB D0
Used to configure Low-Side Output LS5 (Watchdog timeout MSB during WDCSCR configuration).
Used to configure Low-Side Output LS4 (Watchdog timeout LSB during WDCSCR configuration).
Used to configure High-Side Output HS3.
Used to configure High-Side Output HS2.
Used to configure High-Side Output HS1.
Used to configure High-Side Output HS0.
Message Bit Description
PWB1
PWB0
Device Register Addressing
The following section describes the possible register
eescale S
addresses and their impact on device operation.
Fr
Address 000—SPI Output Control Register (SOCR)
The SOCR register allows the MCU to control the outputs via the SPI. Incoming message bits D3:D0 reflect the desired states of high-side outputs HS3:HS0. Message bits D11: D4 reflect the desired state of low-side outputs LS11:LS4, respectively.
Address 100—Direct Input Control Register (DICR)
The DICR register is used by the MCU to enable direct input control of the outputs. For the outputs, a logic [0] on bits D11:D0 will enable the corresponding output for direct control. A logic [1] on a D11:D0 bit will disable the output from direct control.
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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Address 010— Logic Function Control Register (LFCR)
The LFCR register is used by the MCU to configure the relationship between SOCR bits D11:D0 and the direct inputs IHS[0:3] and ILS. While addressing this register (if the direct inputs were enabled for direct control with the DICR), a logic [1] on any or all of the D3:D0 bits will result in a Boolean AND of the IHS[0:3] terminal(s) with its (their) corresponding D3:D0 message bit(s) when addressing the SOCR. A logic [1] on any or all of the D11:D4 bits will result in a Boolean AND of the ILS and the corresponding D11:D4 message bits when addressing the SOCR. Similarly, a logic [0] on the D3:D0 bits will result in a Boolean OR of the IHS[0:3] terminal(s) with their corresponding message bits when addressing the SOCR register, and the ILS will be Boolean ORed with message bits D11:D4 when addressing the SOCR register (if ILS is enabled).
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Address 110— Watchdog and Current Sense Configuration Register (WDCSCR)
The WDCSCR register is used by the MCU to configure the watchdog timeout and the CSNS0-1 and CSNS2-3 terminals. The watchdog timeout is configured using bits D4 and D5. The state of D4 and D5 determine the divided value of the WDTO. For example, if D5 and D4 are logic [0] and logic [0], respectively, then the WDTO will be in the default state as specified in Table 3 logic [1] will result in a watchdog timeout of WDTO ÷ 2. Similarly, a D5 and a D4 of logic [1] and logic [0] result in a watchdog timeout of WDTO ÷ 4, and a D5 and a D4 of logic [1] and logic [1] result in a watchdog timeout of WDTO ÷ 8. Note that when D5 and D4 bits are programmed for the desired watchdog timeout period, the WD bit (D15) should be toggled as well to ensure that the new timeout period is programmed at the beginning of a new count sequence.
CSNS0-1 is the current sense output for the HS0 and HS1 outputs. Similarly, the CSNS2-3 terminal is the current sense
nc...
output for the HS2 and HS3 outputs. In this mode, a logic [1] on
, I
any or all of the message bits that control the high-side outputs will result in the sensed current from the corresponding output
or
being directed out of the appropriate CSNS output. For example, if D1 and D0 are both logic [1], then the sensed current from HS0 and HS1 will be summed into the CSNS0 - 1. If D2 is logic [1] and D3 is logic [0], then only the sensed current from HS2 will be directed out of CSNS2-3.
, page 21. A D5 and a D4 of logic [0] and
Address 001—Open Load Configuration Register (OLCR)
The OLCR register allows the MCU to configure each of the outputs for open load fault detection. While in this mode, a logic [1] on any of the D3:D0 message bits will disable the corresponding outputs’ circuitry that allows the device to detect open load faults while the output is OFF. For the low-side drivers, a logic [1] on any of the D11:D4 bits will enable the open load detection circuitry. This feature allows the MCU to minimize load current in some applications and may be useful to diagnose output shorts to battery (for HS).
Address 101—Current Limit Overcurrent Configuration Register (CLOCCR)
The CLOCCR register allows the MCU to individually override the peak current limit levels for each of the high-side outputs. A logic [1] on any or all of the D3:D0 bit(s) results in the corresponding HS3:HS0 output terminals to current limit at the sustain current limit level. This register also allows the MCU to enable or disable the overcurrent shutdown of the low-side output terminals. A logic [1] on any or all of the D11:D4 message bit(s) will result in the corresponding LS11:LS4 terminals latching off if the current exceeds I
of t
Address 011—Not Used
.
DLY(FS)
Not currently used.
after a timeout
LIM
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Serial Output Communication (Devise Status Return Data)
When the CS terminal is pulled low, the output status register for each output is loaded into the output register and the fault data is clocked out MSB (OD15) first as the new message data is clocked into the SI terminal.
OD15 reflects the state of the watchdog bit (D15) that was
eescale S
addressed during the prior SOCR communication (refer to
Table 4
Fr
, page 23). If bit OD15 is logic [0], then the three MSBs OD14:OD12 will reflect the logic states of the IHS0, IHS1, and FSI terminals, respectively. If bit OD15 is logic [1], then the same three MSB bits will reflect the logic states of the IHS2, IHS3, and WAKE terminals. The next twelve bits clocked out of SO following a low transition of the will reflect the state of each output, with a logic [1] in any of the
CS terminal (OD11:OD0)
Address 111—TEST
The TEST register is reserved for test and is not accessible
via SPI during normal operation.
bits indicating that the respective output experienced a fault condition prior to the SO terminal after the first 16 will be representative of the initial message bits that were clocked into the SI terminal since the terminal first transitioned to a logic [0]. This feature is useful for daisy chaining devices as well as message verification.
Following a CS transition logic [0] to logic [1], the device determines if the message was of a valid length (a valid message length is one that is a multiple of 16 bits) and if so, latches the data into the appropriate registers. At this time, the SO terminal is tri-stated and the fault status register is now able to accept new fault status information.
CS transition. Any bits clocked out of the
CS
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Table 4. Serial Output Bit Assignment
Bit Sig
MSB
nc...
SO
Msg Bit
OD15 Reflects the state of the Watchdog bit from the
previously clocked-in message.
OD14 If OD15 is logic [0], then this bit will reflect the state
of the direct input IHS0. If OD15 is logic [1], then this bit will reflect the state of IHS2.
OD13 If OD15 is logic [0], then this bit will reflect the state
of the direct input IHS1. If OD15 is logic [1], then this bit will reflect the state of IHS3.
OD12 If OD15 is logic [0], then this bit will reflect the state
of the input FSI. If OD15 is logic [1], then this bit will reflect the state of the input WAKE.
OD11 Reports the absence or presence of a fault on LS11.
OD10 Reports the absence or presence of a fault on LS10.
Message Bit Description
, I or
Watchdog and Fail-Safe Operation
The watchdog is enabled and a timeout is started when the WAKE or input is capable of being pulled up to V
resistance that limits the internal clamp current. The timeout is a multiple of an internal oscillator. As long as the WDIN terminal or the WD bit (D15) of an incoming SPI message is toggled within the minimum watchdog timeout, WDTO (or a divided value configured during a WDCSCR message), then the device
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will operate normally. If the watchdog timeout occurs before the WD bit or the WDIN terminal is toggled, then the device will revert to a Fail-Safe mode until the device is reinitialized (if the FSI terminal is left disconnected).
HS0 and HS2, which will be driven ON regardless of the state of the various direct inputs and modes (Table 5 can be brought out of the Fail-Safe mode by transitioning the
eescale S
WAKE and the WAKE terminal was not transitioned to a logic [1] during
Fr
normal operation and the watchdog times out, then the device can be brought out of fail-safe by bringing the If the FSI terminal is tied to GND, then the watchdog, and therefore fail-safe operation, will be disabled.
RST transitions from logic [0] to logic [1]. The WAKE
with a series limiting
PWR
During Fail-Safe mode, all outputs will be OFF except for
RST terminals from logic [1] to logic [0]. In the event
RST to a logic [0].
Bit Sig
MODES OF OPERATION
WAKE RST WDTO HS0 HS2
). The device
Table 4. Serial Output Bit Assignment (continued)
SO
Msg Bit
OD9 Reports the absence or presence of a fault on LS9.
OD8 Reports the absence or presence of a fault on LS8.
OD7 Reports the absence or presence of a fault on LS7.
OD6 Reports the absence or presence of a fault on LS6.
OD5 Reports the absence or presence of a fault on LS5.
OD4 Reports the absence or presence of a fault on LS4.
OD3 Reports the absence or presence of a fault on HS3.
OD2 Reports the absence or presence of a fault on HS2.
OD1 Reports the absence or presence of a fault on HS1.
LSB
Assumptions: Normal operating voltage and junction temperatures, FSI terminal floating. x=Don’t care. S=State determined by SPI and/or direct input configurations.
OD0 Reports the absence or presence of a fault on HS0.
Table 5. Fail-Safe Operation and Transitions
to Other 33888 Modes
0 0 x OFF OFF OFF Device in Sleep mode.
1 0 NO OFF OFF OFF All outputs are OFF.
1 0 YES ON ON OFF Fail-Safe mode.
0 1 NO S S S Device in Normal
0 1 YES ON ON OFF Fail-Safe mode.
1 1 NO S S S Device in Normal
1 1 YES ON ON OFF Fail-Safe mode.
Message Bit Description
LS[4:11],
HS[1,3]
Comments
When
RST transitions
to logic [1], device is in default.
Device reset into Default mode by transitioning WAKE to logic [0].
operating mode.
Device reset into Default mode by transitioning logic [0].
operating mode.
Device reset into Default mode by transitioning WAKE to logic [0].
RST to
RST and
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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Default Mode
The default mode describes the state of the device after first
applying V logic [1] prior to SPI communication. In the default mode, all
outputs will be off (assuming that the direct inputs ILS and IHS[0:3] and the WAKE terminal are at logic [0]). All of the specific terminal functions will operate as though all of the addressable configuration register bits were set to logic [0]. This means, for example, that all of the low-side outputs will be controllable by the ILS terminal, and that all high-side outputs will be controllable via their respective IHS terminals. During the default mode, all high-side drivers will default with open load detection enabled. All low-side drivers will default with open load detection disabled. This mode allows limited control of the 33888 with the direct inputs in the absence of an SPI.
Returning the device to the default state after a period of
normal operation, followed by the removal of the V requires that the RST input be held at a logic [0] state until V
nc...
falls to a level below 2.0 V. If the RST and VDD input levels are normal, then failure to allow V
, I
in an internal bias circuit clamping the V
or
approximately 3.5 V. Once V be returned to 5.0 V without re-enabling the bias circuit.
voltage or a reset transition from logic [0] to
PWR
to fall below 2.0 V will result
PWR
terminal to
PWR
falls below 2.0 V, the RST can
PWR
PWR
voltage,
Fault Logic Requirements
The 33888 indicates all of the following faults as they occur:
• Overtemperature Fault
• Overvoltage Fault
• Open Load Fault
• Overcurrent Fault
emiconduct
With the exception of the overvoltage, these faults are output specific. The overvoltage fault is a global fault. The overcurrent fault is only reported for the low-side outputs.
The 33888 low-side outputs incorporate an internal fault
filter, t transients for overcurrent faults when the output is ON and
open load faults when the output is OFF. All faults are latched and indicated by a logic [1] for each output in the 33888 status
eescale S
word (Table 4 the faulted output will be cleared by a rising edge on
Fr
The any of the outputs. overvoltage fault. For the high-side outputs, time monitoring of the open load and overtemperature. For the low-side outputs, the overtemperature, and overcurrent faults. The latch is cleared by toggling the state of the faulted output or by bringing
. The fault timer filters noise and switching
DLY(FS)
, page 23). If the fault is removed, the status bit for
CS.
FS terminal is driven to a logic [0] when a fault exists on
FS provides real time monitoring of the
FS provides real
FS is latched to a logic [0] for open load,
RST low.
PWR
Overtemperature Fault
The 33888 incorporates overtemperature detection and shutdown circuitry into each individual output structure. Overtemperature detection occurs when an output is in the ON state. When an output is shut down due to an overtemperature condition, no other output is affected. The output experiencing the fault is shut down to protect itself from damage. A fault bit is loaded into the status register if the overtemperature condition is removed, and the fault bit is cleared upon the rising edge of
CS.
For the low-side outputs, the faulted output is latched OFF during an overtemperature condition. If the temperature falls below the recovery level, T
turned back ON only after the output has first been commanded OFF either through the SPI or the ILS, depending on the logic configuration.
For the high-side output(s), an overtemperature condition will result in the output(s) turning OFF until the temperature falls below the T
action is taken by the MCU to shut the output(s) OFF.
Overvoltage Fault
The 33888 shuts down all outputs during an overvoltage condition on the V
state until the overvoltage condition is removed. Fault status for all outputs is latched into the status register. Following an overvoltage condition, the next write cycle sent by the SO terminal of the 33888 is logic [1] on OD11:OD0, indicating all outputs have shut down. If the overvoltage condition is removed, the status register can be cleared by a rising edge on
CS.
Open Load Fault
The 33888 incorporates open load detection circuitry on every output. A high-side or low-side output open load fault is detected and reported as a fault condition when the corresponding output is disabled (OFF) if it was configured for open load detection by setting the appropriate bit to logic [0] (HS3:HS0) or logic [1] (LS11: LS4) in the OLFCR register (Figure 6
The high-side open load fault is detected and latched into the status register after the internal gate voltage is pulled low enough to turn off the output. If the open load fault is removed or if the faulted output is commanded ON, the status register can be cleared by a rising edge on default state will enable the high-side open load detection and disable the low-side open load detection circuits, respectively.
LIM(HYS)
PWR
, page 25).
LIM(HYS)
. This cycle will continue indefinitely until
terminal. The outputs remain in the OFF
, then the output can be
CS. Note that the device
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 24
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LOW = Logic 0
V
THRES
Figure 6. Low-Side Output OFF Open Load Detection
+
V
OFD(THRES)LS
2.0 V–4.0 V
33888
MOSFET
50 mA
V
PWR
R
L
OUT
V
R
PWR
L
OUTPUT
Overcurrent Fault Requirements: Low-Side Output
An overcurrent condition is defined as any current value
greater than I
nc...
LS11, and 800 mA minimum value for LS4, LS6, LS8, LS10).
, I
The status of the corresponding bit in the CLOCCR register determines whether a specific output shuts down or continues
or
to operate in an analog current limited mode until either the overcurrent condition is removed or the thermal shutdown limit is reached (Figure 7 mode is disabled, the fault reporting is disabled as well.
For the low-side output of interest, if a D11: D4 bit was set to a logic [1] in the OLCR register, the overcurrent protection shutdown circuitry will be enabled for that output. When a low­side output is commanded ON either from the SPI or the ILS terminal, the drain of the low-side driver will be monitored for a voltage greater than the fault detection threshold (3.0 V typical).
emiconduct
If the drain voltage exceeds this threshold, a timer will start and the output will be turned off and a fault latched in the status register after the timeout expires. The faulted output can be retried only by commanding the output OFF and back ON either through the SPI or the ILS terminal, depending on the logic configuration. If the fault is gone, the retried output will return to normal operation and the status register can be cleared on a rising edge of latch off after the fault timer expires and the fault bit will remain
eescale S
set in the status register.
Fr
For the low-side output of interest, if a D11 : D4 bit was set to a logic [0] in the OLCR register, the output experiencing an overcurrent condition is not disabled until an overtemperature fault threshold has been reached. The specific output goes into an analog current limit mode of operation, I
overtemperature shutdown to protect all outputs in this mode of operation. If the overcurrent condition is removed before the output has reached its overtemperature limit, the output will function as if no fault has occurred.
(500 mA minimum value for LS5, LS7, LS9,
LIM
, page 26). If the overcurrent shutdown
CS. If the fault remains, the retried output will
. The 33888 uses
LIM
Note that each pair of low-side drivers, LS4:LS5, LS6:LS7, LS8:LS9, and LS10:LS11, consists of a 500 mA and a 800 mA output. Each pair of outputs shares ground bondwires. The bondwires are not rated to handle both outputs in current limit mode simultaneously.
Overcurrent Fault Requirements: High-Side Output
For the high-side output of interest, the output current is limited to one of four levels depending on the type of high-side output, the amount of time that has elapsed since the output was switched on, and the state of the CLOCCR register. Assuming that bits D3:D0 of the CLOCCR register are at logic [0], the current limit levels of the outputs will be initially at their peak levels as specified by the I
high-side output is switched on, the peak current timer starts. After a period of time t
sustain levels I
For the high-side output of interest, if a D3 : D0 bit of the CLOCCR is at logic [1], then the assigned output will only current limit at the sustain level specified by I
Current is limited until the overtemperature circuitry shuts OFF the device. The device turns ON automatically when the temperature fails below the T
indefinitely until action is taken by the master to shut the output(s) OFF.
LIMSUSHS[x,x]
, the current limit level changes to the
PCT
.
LIM(HYS)
LIM(PK)HS[0:3]
. This cycle continues
. After the
LIMSUSHS[x,x]
.
Reverse Battery Requirements
The low-side and high-side outputs survive the application of reverse battery as low as -16 V.
Ground Disconnect Protection
In the event that the 33888 ground is disconnected from load ground, the device protects itself and safely turns OFF the outputs, regardless of the state of the output at the time of disconnection.
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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Drain-S
Freescale Semiconductor, Inc.
HIGH = Fault
Digital
+
V
THRES
Analog
nc... , I
Figure 7. Low-Side Short Circuit Detection and Analog Current Limit
or
Undervoltage Shutdown Requirements
All outputs turn off at some battery voltage below 6.0 V; For
the A version, the low side shutdown at a lower value, however, as long as the level stays above 5.0 V, the internal
logic states within the device are designed to be sustained. This ensures that when the battery level then rises above 6.0 V, the device will return to the state that it was in prior to the excursion between 5.0 V and 6.0 V (assuming that there was no SPI communication or direct input changes during the event). If the
emiconduct
battery voltage falls to a level below 5.0 V, then the internal logic is reinitialized and the device is then in the default state upon the return of levels in excess of 6.0 V.
V
eescale S Fr
33888
+
V
REF
V
OFD(THRES)LS
2.0 V–4.0 V
.
PWRUV
V
PWR
R
MOSFET ON
L
OUT
Output Voltage Clamping
Each output has an internal clamp to provide protection and dissipate the energy stored in inductive loads. Each clamp independently limits the drain-to-source voltage to the range specified in the Power Outputs section of the STATIC
ELECTRICAL CHARACTERISTICS table beginning on
page 12. Also see Figure 8
ource
Clamp Voltage
= 53 V)
(V
CL
Drain Current
= 0.5 A)
(I
D
Drain-Source ON Voltage (V
GND
DS(ON)
)
Current Area (I
.
Drain Voltage
Clamp Energy
= IA x VCL x t)
(E
J
V
PWR
)
A
Time
Figure 8. Low-Side Output Voltage Clamping
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 26
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PACKAGE INFORMATION
Soldering Information
The 33888 is packaged in a surface mount power package
intended to be soldered directly onto the printed circuit board.
The device was qualified in accordance with JEDEC standards JESD22-A113-B and J-STD-020A. The recommended reflow conditions are as follows:
• Convection: 225°C +5.0°C/-0°C
• Vapor Phase Reflow (VPR): 215°C to 219°C
• Infrared (IR)/Convection: 225°C +5.0°C/-0°C
Typical Application
nc...
Figure 9 shows a typical application for the 33888.
, I or
+5.0 V
10 k
4
MCU
4
emiconduct
A/D
A/D
R
C2
R
C1
+5.0 V
V
FS
DD
IHS0: IHS3
ILS
RST
SPI WDIN
CSNS2-3
CSNS0-1
FSI
The maximum peak temperature during the soldering process should not exceed 230°C. The time at maximum temperature should range from 10 seconds to 40 seconds maximum.
APPLICATIONS
V
PWR
V
DD
33888
V
PWR
8 x 0.5
40 m
40 m
10 m
GND
10 m
8 x Relay or LED
65 W
65 W
21 W
Loads
5.0 W
21 W
5.0 W
eescale S Fr
Figure 9. 33888 Typical Application Diagram
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
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PACKAGE DIMENSIONS
PNB SUFFIX
APNB SUFFIX
36-TERMINAL PQFN
NONLEADED PACKAGE
CASE 1438-06
ISSUE E
(Top View)
nc... , I
or
emiconduct
eescale S Fr
(0.3)
6
10X
2 PLACES
7X 0.8
1
3
2X
(0.25)
16
12
23
25 28
2X
B
1.60
10X
1.35
1.20
0.95
36
2.875
0.6
29
1.625
2.8
2.3
28 27 26 25
(0.05)
1
C0.1
4.05
2X
6
0.4
13X 0.8
0.5
(2X 0.75)
2X
3.75
8.70
8.30
0.1 B C
(Bottom View)
12
PIN NUMBER REFERENCE ONLY
7.3
6.9
A0.1 B C
(2X 1.25)
A
11.7
11.3
A0.1 B C
VIEW M-M
A
2.20
1.95
M
M
DETAIL G
NOTES:
ALL DIMENSIONS ARE IN MILLIMETERS.
1. DIMENSIONING AND TOLERANCING PER ASME
2. Y14.5M, 1994. THE COMPLETE JEDEC DESIGNATOR FOR
3. THIS PACKAGE IS: HF-PQFP-N. COPLANARITY APPLIES TO LEADS AND
4. CORNER LEADS. METAL PADS CONNECTED TO THE GND.
5. MINIMUM METAL GAP SHOULD BE 0.25MM.
6.
C0.1
SEATING PLANE
C
C0.05
4
PIN 1 INDEX AREA
DETAIL G
0.62
30X
30X
0.48
0.1 C
0.05 C
0.4±0.2
X0.5±0.2
0.1 B C
1.25
6X
1.00
0.2
0.0
2X 0.5)
2X
0.1 C
0.05 C
4X
A
2.95
2.55
C0.1
2.2
2.0
0.05
0.00
M
A B
M
0.90
0.65
3.85
5
3.45
0.1 B C
A
1.45
1.05
4X
M
M
2.0
1.5
A B
4.45
4.05
0.1 B C
2.2
2X
1.8
M
0.1 C
M
0.05 C
A
A B
114
36
29
14
16
15
23
24
4X
(
(2X 0.75)
CASE 1438-06
ISSUE E
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 28
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PIN ONE
Freescale Semiconductor, Inc.
FB SUFFIX
64-TERMINAL PQFP
PLASTIC PACKAGE
CASE 1315-03
ISSUE B
4
h
ID
64
h
1
E1
2X
E2
53
A
6
52
58X
e
D3D4
nc... , I
or
emiconduct
eescale S Fr
D1
B
4
D2
2X
e/2
DETAIL Y
A2
A
C
20
6
SEATING PLANE
GAUGE PLANE
21 32
0.35
θ
4X
e1
E
M
bbb C A
64X
5
b
M
aaa C A B
E3
W
A1
W
L
DETAIL Y
A3
(1.6)
ccc
E3
BOTTOM VIEW
b
c
b1
SECTION W-W
c1
33
D
M
bbb C B
NOTES:
1. DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES PER ASME Y14.5M, 1994.
3. DATUM PLANE -H- IS LOCATED AT BOTTOM OF LEAD AND IS COINCIDENT WITH THE LEAD WHERE THE LEAD EXITS THE PLASTIC BODY AT THE BOTTOM OF THE PARTING LINE.
4. DIMENSIONS "D1" AND "E1" DO NOT INCLUDE MOLD PROTRUSION. ALLOWABLE PROTRUSION
DATUM
H
3
PLANE
A4
IS 0.15 PER SIDE. DIMENSION "D1" AND "E1" DO INCLUDE MOLD MISMATCH AND ARE DETERMINED AT DATUM PLANE -H-.
5. DIMENSION "b" DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 TOTAL IN EXCESS OF THE "b" DIMENSION AT MAXIMUM MATERIAL CONDITION.
6. DATUMS -A- AND -B- TO BE DETERMINED AT DATUM PLANE -H-.
MILLIMETERS
DIM MIN MAX
A --- 3.15 A1 --- 0.25 A2 2.5 2.9 A3 0 0.1 A4
0.8 1
D
16.95 17.45
D1
13.9 14.1
D2 12.5 12.9 D3 9.3 9.7 D4 13.4 13.6
E
16.95 17.45
E1
13.9 14.1
E2
2.35 2.65
E3
9.3 9.7
L 0.8 1.1
b
0.22 0.38
b1 0.22 0.33
c
0.23 0.32
c1
0.23 0.29
e 0.65 BSC
2.925 BSC
e1
h --- 0.8
θ
aaa 0.12
bbb 0.2
ccc 0.1
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
For More Information On This Product,
29
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NOTES
nc... , I
or
emiconduct
eescale S Fr
33888 MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 30
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Freescale Semiconductor, Inc.
NOTES
nc... , I
or
emiconduct
eescale S Fr
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA 33888
For More Information On This Product,
Go to: www.freescale.com
31
Freescale Semiconductor, Inc.
nc... , I
or
emiconduct
eescale S Fr
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