Mosel Vitelic V62C3161024LL-85T, V62C3161024LL-70T, V62C3161024LL-55T, V62C3161024LL-100T, V62C3161024L-85T Datasheet

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V62C3161024L(L)
Ultra Low Power
64K x 16 CMOS SRAM
Features
• Ultra Low-power consumption
- Active: 40mA I
- Stand-by: 5
µA (CMOS input/output)
CC
at 55ns
1 µA (CMOS input/output, L version)
• 55/70/85/100 ns access time
• Equal access and cycle time
• Single +2.7V to 3.3V Power Supply
• Tri-state output
• Automatic power-down when deselected
• Multiple center power and ground pins for improved noise immunity
• Individual byte controls for both Read and Write cycles
• Available in 44 pin TSOP (II) Package
Logic Block Diagram
Functional Description
TheV62C3161024L is a Low Power CMOS Static RAM organized as 65,536 words by 16 bits. Easy memory exp­ansion is provided by an active LOW (CE
) and (OE) pin.
This device has an automatic power-down mode feature when deselected. Separate Byte Enable controls (BLE and BHE) allow individual bytes to be accessed. BLE controls the lower bits I/O1 - I/O8. BHE controls the upper bits I/O9 - I/O16.
Writing to these devices is performed by taking Chip Enable (CE (BLE
) with Write Enable (WE) and Byte Enable
/BHE) LOW.
Reading from the device is performed by taking Chip Enable (CE (BLE
) with Output Enable (OE) and Byte Enable
/BHE) LOW while Write Enable (WE) is held
HIGH.
TSOP(II)
BLE
BHE
WE OE
CE
A0 A1 A2 A3 A4 A5 A6 A7 A8 A9
I/O1 - I/O8
I/O9 - I/O16
Row Select
Data Cont
Data Cont
Pre-Charge Circuit
Memory Array
1024 X 1024
I/O Circuit
Column Select
A10 A11 A12 A13 A14 A15
1
A3 A2 A1
A0
CE I/O1 I/O2 I/O3 I/O4 Vcc Vss I/O5 I/O6 I/O7 I/O8 WE A15 A14 A13 A12 A11
NC
2 3 4 5 6 7 8
9 10 11 12 13 14 15 16 17 18 19 20 21
44
A5A4
43
A6
42
A7 OE
41
BHE
40
BLE
39
I/O16
38
I/O15
37
I/O14
36
I/O13
35
Vss
34
Vcc
33
I/O12
32
I/O11
31
I/O10
30
I/O9
29
NC
28 27A9A8 26
A10
25 24
NC
2322
REV. 1.1 April 2001 V62C3161024L(L)
1
V62C3161024L(L)
Absolute Maximum Ratings *
Parameter Symbol Minimum Maximum Unit
Voltage on Any Pin Relative to Gnd Vt -0.5 +4.6 V Power Dissipation PT 1.0 W Storage Temperature (Plastic) Tstg -55 +150
Temperature Under Bias Tbias -40 +85
* Note: Stresses greater than those listed above Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rat­ing only and function operation of the device at these or any other conditions outside those indicated in the operational sections of this spec­ification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect reliability.
0
C
0
C
Truth Table
CE OE WE BLE BHE I/O1-I/O8 I/O9-I/O16 Power Mode
H X X X X High-Z High-Z Standby Standby
L L H L H Data Out High-Z Active Low Byte Read L L H H L High-Z Data Out Active High Byte Read L L H L L Data Out Data Out Active Word Read L X L L L Data In Data In Active Word Write L X L L H Data In High-Z Active Low Byte Write L X L H L High-Z Data In Active High Byte Write L H H X X High-Z High-Z Active Output Disable L X X H H High-Z High-Z Active Output Disable
* Key: X = Don’t Care, L = Low, H = High
Recommended Operating Conditions (T
Parameter Symbol Min Typ Max Unit
Supply Voltage
Input Voltage
* VIL min = -2.0V for pulse width less than tRC/2. ** For Industrial Temperature
REV. 1.1 April 2001 V62C3161024L(L)
= 00C to +700C / -400C to 850C**)
A
V
CC
2.7 3.0 3.3 V
Gnd 0.0 0.0 0.0 V
V
IH
V
IL
2.2 - VCC + 0.5 V
-0.5* - 0.6 V
2
DC Operating Characteristics (V
V62C3161024L(L)
= 3V+10%, Gnd = 0V, TA = 00C to +700C / -400C to 850C)
cc
Parameter Sym Test Conditions
Input Leakage Current
Output Leakage Current
Operating Power Supply Current
Average Operating Current
Standby Power Supply
Current (TTL Level)
Standby Power Supply
Current (CMOS Level)
Vcc = Max,
II II
I
CC
I
CC1
LI
LO
= Gnd to V
V
in
CE = VIH or Vcc= Max,
V
= Gnd to V
OUT
CE = VIL , VIN = V
I
= 0
OUT
I
= 0mA,
OUT
cc
cc
or V
IH
,
IL
Min Cycle, 100% Duty CE < 0.2V
I
CC2
I
SB
I
SB1
= 0mA,
I
OUT
Cycle Time=1µs, Duty=100%
CE = VIH - 0.5 - 0.5 - 0.5 - 0.5 mA
CE > Vcc - 0.2V L V
< 0.2V or
IN
V
> Vcc- 0.2V LL
IN
-55 -85 -100
Min Max Min Max Min Max Min Max
-70
- 1 - 1 - 1 - 1 µA
- 1 - 1 - 1 - 1 µA
- 3 - 3 - 3 - 3
- 40 - 35 - 30 - 30 mA
- 3 - 3 - 3 - 3 mA
-
5
-
5
-
5
-
-
1
-
1
-
1
-
Unit
mA
5
µA
1
µA
Output Low Voltage V Output High Voltage V
Capacitance (f = 1MHz, T
IOL = 2 mA - 0.4 - 0.4 - 0.4 - 0.4 V
OL
IOH = -2 mA 2.4 - 2.4 - 2.4 - 2.4 - V
OH
= 25oC)
A
Parameter* Symbol Test Condition Max Unit
Input Capacitance I/O Capacitance
* This parameter is guaranteed by device characterization and is not production tested.
AC Test Conditions
Input Pulse Level 0.6V to 2.2V Input Rise and Fall Time 5ns Input and Output Timing Reference Level 1.4V
Output Load Condition 55ns/70ns/85ns C Load for 100ns C
= 30pf + 1TTL Load
L
= 100pf + 1TTL Load
L
C
in
C
I/O
V
Vin = 0V 7 pF
= V
in
C
Figure A. * Including Scope and Jig Capacitance
= 0V 8 pF
out
*
L
TTL
REV. 1.1 April 2001 V62C3161024L(L)
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