V62C2161024L(L)
Ultra Low Power
64K x 16 CMOS SRAM
Features
• Ultra Low-power consumption
- Active: 35mA I
- Stand-by: 5
µA (CMOS input/output)
CC
at 55ns
1 µA (CMOS input/output, L version)
• 55/70/85/100 ns access time
• Equal access and cycle time
• Single +2.2V to 2.7V Power Supply
• Tri-state output
• Automatic power-down when deselected
• Multiple center power and ground pins for
improved noise immunity
• Individual byte controls for both Read and
Write cycles
• Available in 44 pin TSOP (II) Package
Logic Block Diagram
Functional Description
The V62C2161024L is a Low Power CMOS Static RAM
organized as 65,536 words by 16 bits. Easy memory expansion is provided by an active LOW (CE
) and (OE) pin.
This device has an automatic power-down mode feature
when deselected. Separate Byte Enable controls (BLE
and BHE) allow individual bytes to be accessed. BLE
controls the lower bits I/O1 - I/O8. BHE controls the
upper bits I/O9 - I/O16.
Writing to these devices is performed by taking Chip
Enable (CE
(BLE
) with Write Enable (WE) and Byte Enable
/BHE) LOW.
Reading from the device is performed by taking Chip
Enable (CE
(BLE
) with Output Enable (OE) and Byte Enable
/BHE) LOW while Write Enable (WE) is held
HIGH.
TSOP(II)
BHE
BLE
WE
OE
CE
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
I/O1 - I/O8
I/O9 - I/O16
Row Select
Data
Cont
Data
Cont
Pre-Charge Circuit
Memory Array
1024 X 1024
I/O Circuit
Column Select
A10 A11 A12 A13 A14 A15
1
Vcc
Vss
A3
A2
A1
A0
CE
I/O1
I/O2
I/O3
I/O4
Vcc
Vss
I/O5
I/O6
I/O7
I/O8
WE
A15
A14
A13
A12 A11
NC
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
44
A5A4
43
A6
42
A7
OE
41
BHE
40
BLE
39
I/O16
38
I/O15
37
I/O14
36
I/O13
35
Vss
34
Vcc
33
I/O12
32
I/O11
31
I/O10
30
I/O9
29
NC
28
27A9A8
26
A10
25
24
NC
2322
1
REV. 1.1 April 2001 V62C2161024L(L)
V62C2161024L(L)
Absolute Maximum Ratings *
Parameter Symbol Minimum Maximum Unit
Voltage on Any Pin Relative to Gnd Vt -0.5 +4.6 V
Power Dissipation PT − 1.0 W
Storage Temperature (Plastic) Tstg -55 +150
Temperature Under Bias Tbias -40 +85
* Note: Stresses greater than those listed above Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and function operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect reliability.
0
C
0
C
Truth Table
CE OE WE BLE BHE I/O1-I/O8 I/O9-I/O16 Power Mode
H X X X X High-Z High-Z Standby Standby
L L H L H Data Out High-Z Active Low Byte Read
L L H H L High-Z Data Out Active High Byte Read
L L H L L Data Out Data Out Active Word Read
L X L L L Data In Data In Active Word Write
L X L L H Data In High-Z Active Low Byte Write
L X L H L High-Z Data In Active High Byte Write
L H H X X High-Z High-Z Active Output Disable
L X X H H High-Z High-Z Active Output Disable
* Key: X = Don’t Care, L = Low, H = High
Recommended Operating Conditions (T
Parameter Symbol Min Typ Max Unit
Supply Voltage
Input Voltage
* VIL min = -2.0V for pulse width less than tRC/2.
** For Industrial Temperature
REV. 1.1 April 2001 V62C2161024L(L)
= 00C to +700C / -400C to 850C**)
A
V
CC
2.2 2.5 2.7 V
Gnd 0.0 0.0 0.0 V
V
IH
V
IL
2.0 - VCC + 0.2 V
-0.5* - 0.6 V
2
DC Operating Characteristics (V
V62C2161024L(L)
= 2.2 to 2.7V, Gnd = 0V, TA = 00C to +700C / -400C to 850C)
cc
Parameter Sym Test Conditions
Input Leakage Current
Output Leakage
Current
Operating Power
Supply Current
Average Operating
Current
Standby Power Supply
Current (TTL Level)
Standby Power Supply
Current (CMOS Level)
Vcc = Max,
II
II
I
CC
I
CC1
LI
LO
= Gnd to V
V
in
CE = VIH or Vcc= Max,
V
= Gnd to V
OUT
CE = VIL , VIN = V
I
= 0
OUT
I
= 0mA,
OUT
cc
cc
or V
IH
,
IL
Min Cycle, 100% Duty
CE < 0.2V
I
CC2
I
SB
I
SB1
= 0mA,
I
OUT
Cycle Time=1µs, Duty=100%
CE = VIH - 0.5 - 0.5 - 0.5 - 0.5 mA
CE > Vcc - 0.2V L
V
< 0.2V or
IN
V
> Vcc- 0.2V LL
IN
-55 -85 -100
Min Max Min Max Min Max Min Max
-70
Unit
- 1 - 1 - 1 - 1 µA
- 1 - 1 - 1 - 1 µA
- 3 - 3 - 3 - 3
- 35 - 30 - 25 - 25 mA
- 3 - 3 - 3 - 3 mA
-
5
-
5
-
5
-
5
-
1
-
1
-
1
-
1
mA
µA
µA
Output Low Voltage V
Output High Voltage V
Capacitance (f = 1MHz, T
IOL = 2 mA - 0.4 - 0.4 - 0.4 - 0.4 V
OL
IOH = -2 mA 2.0 - 2.0 - 2.0 - 2.0 - V
OH
= 25oC)
A
Parameter* Symbol Test Condition Max Unit
Input Capacitance
I/O Capacitance
* This parameter is guaranteed by device characterization and is not production tested.
AC Test Conditions
Input Pulse Level 0.6V to 2.0V
Input Rise and Fall Time 5ns
Input and Output Timing
Reference Level 1.2V
Output Load Condition
55ns/70ns/85ns C
Load for 100ns C
= 30pf + 1TTL Load
L
= 100pf + 1TTL Load
L
C
in
C
I/O
V
Vin = 0V 7 pF
= V
in
C
Figure A. * Including Scope and Jig Capacitance
= 0V 8 pF
out
*
L
TTL
REV. 1.1 April 2001 V62C2161024L(L)
3