Mosel Vitelic V54C316162VC-7, V54C316162VC-6, V54C316162VC-55, V54C316162VC-5, V54C316162VC Datasheet

MOSEL VITELIC
V54C316162VC 200/183/166/143 MHz 3.3 VOLT, 2K REFRESH ULTRA HIGH PERFORMANCE 1M X 16 SDRAM 2 BANKS X 512Kbit X 16
V54C316162VC -5 -55 -6 -7 Unit
Clock Frequency (tCK) 200 183 166 143 MHz Latency 3333clocks CycleTime(t Access Time (t
)55.567ns
CK
) 5 5.3 5.5 5.5 ns
AC

Features

JEDEC Standard 3.3V Po w er Supply
The V54C316162VC is ideally suited for high
performance graphi c s peripheral applica tions
Single Pulsed RAS
Programmable CAS Latency: 2, 3
All Inputs are sampled atthe positive goingedge
of clock
Programmable Wrap Sequence: Sequential or Interleave
Programmable B urst Length: 1, 2, 4, 8 and Full Page for Sequential and 1, 2, 4, 8 for Interleave
UDQM & LDQM for byte masking
Auto & Self Refresh
2K Refresh Cycles/32 ms
Burst Read with Single Write Operat ion
Interface

Description

The V54C316162VC is a 16,777,216 bits syn­chronous high dat a rate DRAM org anized as 2 x 524,288 words by 16 bits. The device is designed to comply with JEDEC standards set for synchronous DRAM products, both electrically and mechanically. Synchronous design allows precise cycle control with the system clock. The CAS latency, burst length and burst sequence must be programmed into device prior to access operation.
V54C316162VC Rev. 1.4 December 2001
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MOSEL VITELIC
V54C316162VC

50 Pin Plastic TSOP-II PIN CON FIGURATION

Top View

V
V
SSQ
V
CCQ
V
SSQ
V
CCQ
LDQM
CAS RAS
V
I/O I/O
I/O I/O
I/O I/O
I/O I/O
WE
A
CC
CS BA
A A A A
CC
1 2
1
3
2
4 5
3
6
4
7 8
5
9
6
10 11
7
12
8
13 14 15 16 17 18 19 20
10
21
0
22
1
23
2
24
3
25
V54C316162V-01

Pin Names

CLK Clock Input CKE Clock Enable CS
V
50
SS
I/O
49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26
16
I/O
15
V
SSQ
I/O
14
I/O
13
V
CCQ
I/O
12
I/O
11
V
SSQ
I/O
10
I/O
9
V
CCQ
NC UDQM CLK CKE NC A
9
A
8
A
7
A
6
A
5
A
4
V
SS
RAS CAS WE A
0–A10
BA Bank Select I/O
–I/O
1
16
LDQM, UDQM Data Mask V
CC
V
SS
V
CCQ
V
SSQ
NC Not connected
Chip Select Row Address Strobe ColumnAddress Strobe Write Enable AddressInputs
Data Input/Output
Power(+3.3V) Ground Power for I/O’s (+3.3V) Ground for I/O’s
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Block Diagram

V54C316162VC
CLK
CKE
CS RAS CAS
WE
DQMi
CLK
Address
Timing
Register
Register
Programming
DQMi
Sense Amplifier
Column Decoder
Latency 8
Burst Length
Write
Control
Logic
Memory Array
Bank 0
512k x 16
Row
Decoder
Column Address
Counter
Column Address
Buffer
A0-A7, BA
Column Addresses
MUX
Sense Amplifier
Column Decoder
Memory Array
Bank 1
512k x 16
Row
Decoder
Row Address
Buffer
A
, BA
0-A10
Row Addresses
Input
UDQM
LDQM
Output
Buffer
Buffer
Refresh Counter
I/O
-I/O
1
V54C316162V-02
16
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V54C316162VC

Signal Pin Description

Pin Name Input Function
CLK Clock Input Systemclock input.Activeonthepositiverising edgetosample allinptus CKE Clock Enable Activates the CLK signal when high and deactivatesthe CLK when low.
CKE low initiates the power down mode, suspend mode, or the self refresh mode
CS
Chip Select Disables or enablesdeviceoperation by maskingor enablingall inputs
except CLK, CKE and DQMi
RAS
Row Address Strobe Latches row addresses on the positive edge of CLK with RAS low.
Enablesrow access & precharge
CAS
Column Address Strobe Latches column addresses on the positive edge of CLK with CAS low.
Enablescolumnaccess WE A
0-A10
WriteEnable Enableswriteoperation Address During a bank activate command, A0-A10defines the row address.
During a read or write command, A
addition to the column addressA
define the bank to be precharged. A
duringa precharge cycle, If A
if A
is low, the BA is used to decide which bank to precharge. If A10is
10
10
defines the column address. In
0-A7
isused to invokeautoprechargeBA
10
islow, autoprechargeis disabled
10
is high, both bank will be precharged ,
high, all banks will be precharged. BA Bank Select Selectswhichbank to activate. BA low select bank A and high selects
bank B I/O
1
-I/O
16
Data Input/Output Data inputs/output are multiplexed on the same pins UDQM, LDQM Data Input/Output Mask Makes data output Hi-Z. Blocks data input when DQM is active VDD/VSS Power Supply/Ground Power Supply. +3.3V ± 0.3V/ground VDDQ/VSSQ Data Output Power/Ground Provides isolated power/groundto DQs for improvednoiseimmunity NC No Connection
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MOSEL VITELIC

Address Input for Mode Set (Mode Re gister Operation)

V54C316162VC
A10
A9
A8 A7 A6 A5
Write Burst Length
Write Burst Length
A9 Length
0Burst 1 Single Bit
CAS Latency
A6 A5 A4 Latency
000 Reserve 001 Reserve 010 2 011 3 101 Reserve 110 Reserve 111 Reserve
Test
Mode
Test Mode
A8 A7 Mode
00
Mode Reg
Set
A3A4 A2 A1 A0
BT Burst LengthCAS Latency
Burst Type
A3 Type
0 Sequential 1 Interleave
Burst Length
A2 A1 A0
000 1 1 001 2 2 010 4 4 011 8 8 1 0 0 Reserve Reserve 1 0 1 Reserve Reserve 1 1 0 Reserve Reserve 1 1 1 Full Page Reserve
Address Bus (Ax)
Mode Register
Length
Sequential Interleave

Power O n and Initialization

The default power on state of t he mode register is supplier specific and may be undefined. The following power on and initialization sequence guarantees the device is preconditioned to each users specific needs. Like a convent ional DRAM, the Synchronous DRAM must be powered up and initialized in a predefined manner. During power on, all VCC and VCCQ pins m ust be built up simultaneously to the specified v oltage when the input signals are held in the NOPstate. The power on voltage must not exceed VCC+0.3 V on any of the input pins or VCC supplies. The CLK signal must be s tarted at the same time. After power on, an initial pause of 200 µs is required followed by a precharge of both banks using the precharge command. To prevent data contention on the DQ bus during power on, it isrequired that the DQM and CKE pins be held high during the i nitial pause period. Once all bank s have been precharged, the Mode Register Set Command must be issued to initialize the Mode Register. A mini mum of eight Auto Refresh cycles (CBR) are also required.These may be done before or after programming the Mode Register. Failure to follow these st eps may lead to unpredictable start-up modes.

Programming the Mode Register

The Mode register designates the operation mode at the read or write cycle. Th is register is di ­vided into 4 fields. A Burst Length Field to set the length of the burst , an A ddres s ing Selection bit to program the column access sequence in a burst cycle (interleaved or sequential), a CAS Latency Fieldto set the access time at clockcycle and a Op­eration m ode field to differentiate between normal operation (Burst read and burst Write) and a special Burst Read and Single Write mode. The m ode set operation must be done before any activate c om­mand after the initial power up. Any content of the mode register can be altered by re-executing the mode set command. All banks must be in pre­charged state and CKE must be high at least one clock before the mode set operation. After themode register is set, a Standby or NOP command is required. Lo w signals of RAS positive edge of the clock activate the mode set operation. Address input dat a at this timing defines parameters tobe set asshown in the previous table.
,CAS, and WE at the
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V54C316162VC

Read and Write Operation

When RAS is low and both CAS an d WE are high at the positive edge of the clock, a RAS cycle starts. According to address data, a word line of the s elect­ed bank is activated and all of sense amplifiers as­sociated to the wordline are set. A CAS triggered by s et ting RAS
high and CAS low at a clock timing after a neces s ary delay, t RAS
timing. W E is us ed to define either a read
(WE
=H)orawrite(WE= L ) at this stage.
SDRAM provides a wide variety of fast access modes. In a single CAS cycle, serial data read or write operations are allowed at up to a 166 MHz data rat e. The numbers of serial data bits are the burst lengthprogram meda t the mode set operation, i.e., one of 1, 2, 4, 8 and full page. Column address­es are segmented by the burst length and serial data accesses are done within this boundary. The first column address to be accessed is s upplied at the CAS timing and the subsequent addresses are generated automatically by the programmed burst length and its sequence. For example, in a burst length of 8 w ith interleave sequence, if the first ad­dress is ‘2’, t hen the rest of the burst sequence is 3, 0, 1, 6, 7, 4, and 5.
Full page burst operation is only possible using the sequential burst type and page length is a func­tion of the I/O organi sation and column addressing. Full page burst operation do not self terminate once the burst length has been reached. In other words, unlike burst l ength of 2, 4 or 8, full page burst con­tinues until it is terminated using another command.
,fromthe
RCD
cycle is
Similar t o the page mode of conventional DRAMs, burst read or write accesses on any col­umn address a re possible once the RAS cycle latches the sense amplifiers. The maximu m t
RAS
or therefresh interval time limits t he number of random column accesses. A new burs t access can be done even before the previous b urst ends. The interrupt operation a t every c lock cycles is supported. When the previous burs t is interrupted, the remaining ad­dresses are overridden by the new address with the full burst length. An interrupt which accompanies with an operation change from a read t o a write is possible by exploiting DQM to av oid bus contention.
When two or more banks are activated sequentially, interleaved bank read or write operations are possible. With the programmed burst length, alternate access and precharge operations on t w o or more banks can realize f as t serial data access modes among many different pages. Once two or more banks are activated, column to c olum n interleave operation can be done between different pages.

Refresh Mode

SDRAM has two refresh modes, Auto Refresh and S elf Ref r es h. Auto Refresh is similar tothe CAS
-before-RAS refresh of conventional DRAMs. All of banks must be precharged before applying any re­fresh m ode. Anon-chip address counter increments the wordand the bank addresses and no bank infor­mation is required for both refres h modes.

Burst Length and Sequence:

Burst
Length
Page
V54C316162VC Rev. 1.4 December 2001
Starting Address
(A2 A1 A0)
2 xx0
xx1
4x00
x01 x10 x11
8 000
001 010 011 100 101 110 111
Full
nnn Cn, Cn+1, Cn+2,..... not supported
Sequential Burst Addressing (decimal)
0 1 2 3 4 5 6 7 1 2 3 4 5 6 7 0 2 3 4 5 6 7 0 1 3 4 5 6 7 0 1 2 4 5 6 7 0 1 2 3 5 6 7 0 1 2 3 4 6 7 0 1 2 3 4 5 7 0 1 2 3 4 5 6
0, 1 1, 0
0, 1, 2, 3 1, 2, 3, 0 2, 3, 0, 1 3, 0, 1, 2
Interleave Bur st Addressing (decimal)
0, 1 1, 0
0, 1, 2, 3 1, 0, 3, 2 2, 3, 0, 1 3, 2, 1, 0
0 1 2 3 4 5 6 7 1 0 3 2 5 4 7 6 2 3 0 1 6 7 4 5 3 2 1 0 7 6 5 4 4 5 6 7 0 1 2 3 5 4 7 6 1 0 3 2 6 7 4 5 2 3 0 1 7 6 5 4 3 2 1 0
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MOSEL VITELIC
V54C316162VC
The chip enters the Auto Refresh mode, when
RAS
and CAS are held low a nd CKE and WE are held high at a clock timing. The mode restores word line after the refresh and no external precharge command is necess ary . A m inimum tRC time is re­quired between t wo automatic refreshes in a burst refresh mode. The same rule applies to any access command after the automatic refres h operation.
The chi p has an on-chip timer and the Self Re­fresh mode is available. It enters the mode when RAS
,CAS, and CKE are low and WE is high at a clock timing. All of external control signals including the clock are disabled. Returning CKE to high en­ables the clock and initiates th e refresh exit opera­tion. After the exit command, at least one t
RC
delay
is required prior to any access command.

DQM Function

DQM has two functions for data I/O read a nd write operations. During reads, when it turns to highat a clock tim ing, data outputs are disabled and become high impedance after two clock delay (DQM Data Disable Latency t
). It also provides
DQZ
a d ata mask function for writes. When DQM is acti­vated, the w rite operation at the next clockis prohib­ited (DQM Write Mask Latencyt
= zero clocks).
DQW
DQM is used for device selection, byte selection and bus control in a memory system. LDQM con­trols DQ0 to DQ7, UDQM controls DQ8 to DQ15.

Suspend Mode

Duringnormala ccess mode, CKE is held high en­abling the clock. W hen CKE is low, it freezes the in­ternal clock and extends data read and write operations. One clock delay is required for mode entry and exit (Clock Suspend L aten cy t
CSL
).

Power Down

In order to reduce standby po wer c onsumption, a power down mode is available. All banks must be precharged and the neces s ary Precharge delay (trp) must occur bef ore the SDRAM can enter the Power Down mo de. Once the Power Down mode is initiated by holding CKE low, all of the receiver cir­cuits except CLK andCKE are gated off. The Power Down mode does not perform any refresh opera­tions, therefore the device cant remain in P ower Down mode longer th an the Refresh period (tref) of the device. Exit from this mode is p erformed by tak­ing CKE high. One clock delay is required for mode ent ry and exit.

Auto Precharge

Two methods are available to precharge SDRAMs. In an automatic precharge mode, the CAS timing accepts one extra address, A
, to de-
10
termine whether t he chip restores or not after the operation. If A
is high when a Read Command is
10
issued, the Read with Au to-Precharge function is initiated. The SDRAM automatically enters the pre­charge operation one clock before the last data out for CAS If A
latencies2, two clocks for CAS latencies 3.
is high wh en a Write Command is i ssue d, the
10
Write with Auto-Precharge function is initiated. The SDRAM aut omatically enters the precharge op­eration a time delay equal to t
(Write recovery
WR
time) after the last data in.

Precharge Command

There is also a separate precharge command available. When RAS
and WE are low and CAS is high at a clock timing, it triggers the precharge op­eration. With A
being low, the BA is used select
10
bank toprecharge. The precharge command c an be imposed one clock before the last data out for CAS latency = 2, two clock s before the last data out for CAS latency = 3. Writes require a time delay twr from the last data out to apply the precharge c om­mand. If A
is high, all banks will be precharged.
10

Burst Termination

Once a burst read or write operation has been ini­tiated, there are several methods in which to termi­nate the burst operation prematurely. These methods include using another Read or Write Com­mand to interrupt an existing burst operation, u se a Precharge Command to interrupt a burst cycle and close the active bank, or using the B urs t Stop Com­mand to terminate the existing burst operation but leave the bank open for future Read or Write Com­mands to t he sam e page of the active bank. When interrupting a burst with another Read or Write Command care must be taken to avoid I/O conten­tion. The Burst Stop Command, however, has the fewest restrictions making it the easiest method to use when terminatinga burst operation before i t has been completed. If a Burst Stop command is issued during a bu rst write operation, then any residual data from the burst write cycle will be ignored. Data that is presented on the I/O pins before the Burst Stop Command is registered will be written to the memory.
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