V54C316162VC
200/183/166/143 MHz 3.3 VOLT, 2K REFRESH
ULTRA HIGH PERFORMANCE
1M X 16 SDRAM 2 BANKS X 512Kbit X 16
V54C316162VC-5-55-6-7Unit
Clock Frequency (tCK)200183166143MHz
Latency3333clocks
CycleTime(t
Access Time (t
)55.567ns
CK
)55.35.55.5ns
AC
Features
■ JEDEC Standard 3.3V Po w er Supply
■ The V54C316162VC is ideally suited for high
performance graphi c s peripheral applica tions
■ Single Pulsed RAS
■ Programmable CAS Latency: 2, 3
■ All Inputs are sampled atthe positive goingedge
of clock
■ Programmable Wrap Sequence: Sequential or
Interleave
■ Programmable B urst Length: 1, 2, 4, 8 and Full
Page for Sequential and 1, 2, 4, 8 for Interleave
■ UDQM & LDQM for byte masking
■ Auto & Self Refresh
■ 2K Refresh Cycles/32 ms
■ Burst Read with Single Write Operat ion
Interface
Description
The V54C316162VC is a 16,777,216 bits synchronous high dat a rate DRAM org anized as 2 x
524,288 words by 16 bits. The device is designed to
comply with JEDEC standards set for synchronous
DRAM products, both electrically and mechanically.
Synchronous design allows precise cycle control
with the system clock. The CAS latency, burst
length and burst sequence must be programmed
into device prior to access operation.
Power(+3.3V)
Ground
Power for I/O’s (+3.3V)
Ground for I/O’s
V54C316162VC Rev. 1.4 December 2001
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MOSEL VITELIC
Block Diagram
V54C316162VC
CLK
CKE
CS
RAS
CAS
WE
DQMi
CLK
Address
Timing
Register
Register
Programming
DQMi
Sense Amplifier
Column Decoder
Latency 8
Burst Length
Write
Control
Logic
Memory Array
Bank 0
512k x 16
Row
Decoder
Column Address
Counter
Column Address
Buffer
A0-A7, BA
Column Addresses
MUX
Sense Amplifier
Column Decoder
Memory Array
Bank 1
512k x 16
Row
Decoder
Row Address
Buffer
A
, BA
0-A10
Row Addresses
Input
UDQM
LDQM
Output
Buffer
Buffer
Refresh
Counter
I/O
-I/O
1
V54C316162V-02
16
V54C316162VC Rev. 1.4 December 2001
3
MOSEL VITELIC
V54C316162VC
Signal Pin Description
PinNameInput Function
CLKClock InputSystemclock input.Activeonthepositiverising edgetosample allinptus
CKEClock EnableActivates the CLK signal when high and deactivatesthe CLK when low.
CKE low initiates the power down mode, suspend mode, or the self
refresh mode
CS
Chip SelectDisables or enablesdeviceoperation by maskingor enablingall inputs
except CLK, CKE and DQMi
RAS
Row Address StrobeLatches row addresses on the positive edge of CLK with RAS low.
Enablesrow access & precharge
CAS
Column Address StrobeLatches column addresses on the positive edge of CLK with CAS low.
Enablescolumnaccess
WE
A
0-A10
WriteEnableEnableswriteoperation
AddressDuring a bank activate command, A0-A10defines the row address.
During a read or write command, A
addition to the column addressA
define the bank to be precharged. A
duringa precharge cycle, If A
if A
is low, the BA is used to decide which bank to precharge. If A10is
10
10
defines the column address. In
0-A7
isused to invokeautoprechargeBA
10
islow, autoprechargeis disabled
10
is high, both bank will be precharged ,
high, all banks will be precharged.
BABank SelectSelectswhichbank to activate. BA low select bank A and high selects
bank B
I/O
1
-I/O
16
Data Input/OutputData inputs/output are multiplexed on the same pins
UDQM, LDQMData Input/Output MaskMakes data output Hi-Z. Blocks data input when DQM is active
VDD/VSSPower Supply/GroundPower Supply. +3.3V ± 0.3V/ground
VDDQ/VSSQData Output Power/GroundProvides isolated power/groundto DQs for improvednoiseimmunity
NCNo Connection
V54C316162VC Rev. 1.4 December 2001
4
MOSEL VITELIC
Address Input for Mode Set (Mode Re gister Operation)
The default power on state of t he mode register is
supplier specific and may be undefined. The
following power on and initialization sequence
guarantees the device is preconditioned to each
users specific needs. Like a convent ional DRAM,
the Synchronous DRAM must be powered up and
initialized in a predefined manner. During power on,
all VCC and VCCQ pins m ust be built up
simultaneously to the specified v oltage when the
input signals are held in the “NOP” state. The power
on voltage must not exceed VCC+0.3 V on any of
the input pins or VCC supplies. The CLK signal
must be s tarted at the same time. After power on,
an initial pause of 200 µs is required followed by a
precharge of both banks using the precharge
command. To prevent data contention on the DQ
bus during power on, it isrequired that the DQM and
CKE pins be held high during the i nitial pause
period. Once all bank s have been precharged, the
Mode Register Set Command must be issued to
initialize the Mode Register. A mini mum of eight
Auto Refresh cycles (CBR) are also required.These
may be done before or after programming the Mode
Register. Failure to follow these st eps may lead to
unpredictable start-up modes.
Programming the Mode Register
The Mode register designates the operation
mode at the read or write cycle. Th is register is di vided into 4 fields. A Burst Length Field to set the
length of the burst , an A ddres s ing Selection bit to
program the column access sequence in a burst
cycle (interleaved or sequential), a CAS Latency
Fieldto set the access time at clockcycle and a Operation m ode field to differentiate between normal
operation (Burst read and burst Write) and a special
Burst Read and Single Write mode. The m ode set
operation must be done before any activate c ommand after the initial power up. Any content of the
mode register can be altered by re-executing the
mode set command. All banks must be in precharged state and CKE must be high at least one
clock before the mode set operation. After themode
register is set, a Standby or NOP command is
required. Lo w signals of RAS
positive edge of the clock activate the mode set
operation. Address input dat a at this timing defines
parameters tobe set asshown in the previous table.
,CAS, and WE at the
V54C316162VC Rev. 1.4 December 2001
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MOSEL VITELIC
V54C316162VC
Read and Write Operation
When RAS is low and both CAS an d WE are high
at the positive edge of the clock, a RAS cycle starts.
According to address data, a word line of the s elected bank is activated and all of sense amplifiers associated to the wordline are set. A CAS
triggered by s et ting RAS
high and CAS low at a
clock timing after a neces s ary delay, t
RAS
timing. W E is us ed to define either a read
(WE
=H)orawrite(WE= L ) at this stage.
SDRAM provides a wide variety of fast access
modes. In a single CAS cycle, serial data read or
write operations are allowed at up to a 166 MHz
data rat e. The numbers of serial data bits are the
burst lengthprogram meda t the mode set operation,
i.e., one of 1, 2, 4, 8 and full page. Column addresses are segmented by the burst length and serial
data accesses are done within this boundary. The
first column address to be accessed is s upplied at
the CAS timing and the subsequent addresses are
generated automatically by the programmed burst
length and its sequence. For example, in a burst
length of 8 w ith interleave sequence, if the first address is ‘2’, t hen the rest of the burst sequence is 3,
0, 1, 6, 7, 4, and 5.
Full page burst operation is only possible using
the sequential burst type and page length is a function of the I/O organi sation and column addressing.
Full page burst operation do not self terminate once
the burst length has been reached. In other words,
unlike burst l ength of 2, 4 or 8, full page burst continues until it is terminated using another command.
,fromthe
RCD
cycle is
Similar t o the page mode of conventional
DRAM’s, burst read or write accesses on any column address a re possible once the RAS cycle
latches the sense amplifiers. The maximu m t
RAS
or
therefresh interval time limits t he number of random
column accesses. A new burs t access can be done
even before the previous b urst ends. The interrupt
operation a t every c lock cycles is supported. When
the previous burs t is interrupted, the remaining addresses are overridden by the new address with the
full burst length. An interrupt which accompanies
with an operation change from a read t o a write is
possible by exploiting DQM to av oid bus contention.
When two or morebanks are activated
sequentially,interleaved bankread or write
operations are possible. With the programmed
burst length, alternate access and precharge
operations on t w o or more banks can realize f as t
serial data access modes among many different
pages. Once two or more banks are activated,
column to c olum n interleave operation can be done
between different pages.
Refresh Mode
SDRAM has two refresh modes, Auto Refresh
and S elf Ref r es h. Auto Refresh is similar tothe CAS
-before-RAS refresh of conventional DRAMs. All of
banks must be precharged before applying any refresh m ode. Anon-chip address counter increments
the wordand the bank addresses and no bank information is required for both refres h modes.
and CAS are held low a nd CKE and WE are
held high at a clock timing. The mode restores word
line after the refresh and no external precharge
command is necess ary . A m inimum tRC time is required between t wo automatic refreshes in a burst
refresh mode. The same rule applies to any access
command after the automatic refres h operation.
The chi p has an on-chip timer and the Self Refresh mode is available. It enters the mode when
RAS
,CAS, and CKE are low and WE is high at a
clock timing. All of external control signals including
the clock are disabled. Returning CKE to high enables the clock and initiates th e refresh exit operation. After the exit command, at least one t
RC
delay
is required prior to any access command.
DQM Function
DQM has two functions for data I/O read a nd
write operations. During reads, when it turns to
“high” at a clock tim ing, data outputs are disabled
and become high impedance after two clock delay
(DQM Data Disable Latency t
). It also provides
DQZ
a d ata mask function for writes. When DQM is activated, the w rite operation at the next clockis prohibited (DQM Write Mask Latencyt
= zero clocks).
DQW
DQM is used for device selection, byte selection
and bus control in a memory system. LDQM controls DQ0 to DQ7, UDQM controls DQ8 to DQ15.
Suspend Mode
Duringnormala ccess mode, CKE is held high enabling the clock. W hen CKE is low, it freezes the internal clock and extends data read and write
operations. One clock delay is required for mode
entry and exit (Clock Suspend L aten cy t
CSL
).
Power Down
In order to reduce standby po wer c onsumption, a
power down mode is available. All banks must be
precharged and the neces s ary Precharge delay
(trp) must occur bef ore the SDRAM can enter the
Power Down mo de. Once the Power Down mode is
initiated by holding CKE low, all of the receiver circuits except CLK andCKE are gated off. The Power
Down mode does not perform any refresh operations, therefore the device can’t remain in P ower
Down mode longer th an the Refresh period (tref) of
the device. Exit from this mode is p erformed by taking CKE “high”. One clock delay is required for
mode ent ry and exit.
Auto Precharge
Two methods areavailable to precharge
SDRAMs. In an automatic precharge mode, the
CAS timing accepts one extra address, A
, to de-
10
termine whether t he chip restores or not after the
operation. If A
is high when a Read Command is
10
issued, the Read with Au to-Precharge function is
initiated. The SDRAM automatically enters the precharge operation one clock before the last data out
for CAS
If A
latencies2, two clocks for CAS latencies 3.
is high wh en a Write Command is i ssue d, the
10
Write with Auto-Precharge function is initiated.
The SDRAM aut omatically enters the precharge operation a time delay equal to t
(Write recovery
WR
time) after the last data in.
Precharge Command
There is also a separate precharge command
available. When RAS
and WE are low and CAS is
high at a clock timing, it triggers the precharge operation. With A
being low, the BA is used select
10
bank toprecharge. The precharge command c an be
imposed one clock before the last data out for CAS
latency = 2, two clock s before the last data out for
CAS latency = 3. Writes require a time delay twr
from the last data out to apply the precharge c ommand. If A
is high, all banks will be precharged.
10
Burst Termination
Once a burst read or write operation has been initiated, there are several methods in which to terminate the burst operation prematurely. These
methods include using another Read or Write Command to interrupt an existing burst operation, u se a
Precharge Command to interrupt a burst cycle and
close the active bank, or using the B urs t Stop Command to terminate the existing burst operation but
leave the bank open for future Read or Write Commands to t he sam e page of the active bank. When
interrupting a burst with another Read or Write
Command care must be taken to avoid I/O contention. The Burst Stop Command, however, has the
fewest restrictions making it the easiest method to
use when terminatinga burst operation before i t has
been completed. If a Burst Stop command is issued
during a bu rst write operation, then any residual
data from the burst write cycle will be ignored. Data
that is presented on the I/O pins before the Burst
Stop Command is registered will be written to the
memory.
V54C316162VC Rev. 1.4 December 2001
7
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