Mosel Vitelic V54C316162V-55, V54C316162V-5, V54C316162V, V54C316162V-7, V54C316162V-6 Datasheet

MOSEL VITELIC
V54C316162V 200/183/166/143 MHz 3.3 VOLT, 4K REFRESH ULTRA HIGH PERFORMANCE 1M X 16 SDRAM 2 BANKS X 512Kbit X 16
V54C316162V
Clock Frequency(tCK) 200 183 166 143 MHz Latency 3333clocks CycleTime(t Access Time (t
)55.567ns
CK
) 5 5.3 5.5 5.5 ns
AC

Features

JEDEC S tand ard 3.3V Power Supply
The V54C316162V is ideally suited for high per-
formance graphics peripheral applications
Single Pulsed RAS
Programmable CAS Latency: 2, 3
All Inputsare sampled at the positive goingedge
of clock
Programmable Wrap Sequ ence: Sequential or Interleave
Interface

Description

The V54C316162V is a 16, 777,216 bits synchro­nous high data rate DRAM organized as 2 x 524,288 words by 16 bits. The device is designed to comply with JEDEC standards set for synchronous DRAM products, both electrically and mechanically. Synchronous design allows precise cycle control with the system clock. The CAS latency, burst length and burst sequence must be programm ed into device prior to access operation.
Programmable Burst Length: 1, 2, 4, 8 and Full Page for Sequential an d 1, 2, 4, 8 for Interleave
UDQM & LDQM for byte masking
Auto & Self Refresh
4K Refresh Cycles/64 ms
Burst Read with Sing le Write Operation
V54C316162V Rev.2.9 September 2001
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MOSEL VITELIC
V54C316162V

50 Pin Plastic TSOP-II PIN CON FIGURATION

Top View

V
V
SSQ
V
CCQ
V
SSQ
V
CCQ
LDQM
CAS RAS
V
I/O I/O
I/O I/O
I/O I/O
I/O I/O
WE
A
CC
CS BA
A A A A
CC
1 2
1
3
2
4 5
3
6
4
7 8
5
9
6
10 11
7
12
8
13 14 15 16 17 18 19 20
10
21
0
22
1
23
2
24
3
25
V54C316162V-01

Pin Names

CLK Clock Input CKE Clock Enable CS
V
50
SS
I/O
49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26
16
I/O
15
V
SSQ
I/O
14
I/O
13
V
CCQ
I/O
12
I/O
11
V
SSQ
I/O
10
I/O
9
V
CCQ
NC UDQM CLK CKE NC A
9
A
8
A
7
A
6
A
5
A
4
V
SS
RAS CAS WE A
0–A10
BA Bank Select I/O
–I/O
1
16
LDQM, UDQM Data Mask V
CC
V
SS
V
CCQ
V
SSQ
NC Not connected
Chip Select Row Address Strobe ColumnAddress Strobe Write Enable AddressInputs
Data Input/Output
Power(+3.3V) Ground Power for I/O’s (+3.3V) Ground for I/O’s
V54C316162V Rev. 2.9 September 2001
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MOSEL VITELIC

Block Diagram

V54C316162V
CLK
CKE
CS RAS CAS
WE
DQMi
CLK
Address
Timing
Register
Register
Programming
DQMi
Sense Amplifier
Column Decoder
Latency 8
Burst Length
Write
Control
Logic
Memory Array
Bank 0
512k x 16
Row
Decoder
Column Address
Counter
Column Address
Buffer
A0-A7, BA
Column Addresses
MUX
Sense Amplifier
Column Decoder
Memory Array
Bank 1
512k x 16
Row
Decoder
Row Address
Buffer
A
, BA
0-A10
Row Addresses
Input
UDQM LDQM
Output
Buffer
Buffer
Refresh Counter
I/O
-I/O
1
V54C316162V-02
16
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MOSEL VITELIC
V54C316162V

Signal Pin Description

Pin Name Input Function
CLK Clock Input Systemclockinput.Activeonthepositiverisingedgeto sampleallinptus CKE Clock Enable Activates the CLKsignalwhen high anddeactivates the CLKwhen low.
CKE low initiates the power down mode, suspend mode, or the self refresh mode
CS
Chip Select Disablesor enables device operation by maskingor enabling all inputs
except CLK, CKE and DQMi
RAS
Row A ddress Strobe Latches rowaddresseson the positive edge of CLK with RAS low.
Enablesrow access& precharge
CAS
Column Address Strobe Latches column addresses on the positive edge of CLK with CAS low.
Enablescolumn access WE A
0-A10
WriteEnable Enableswriteoperation Address During a bank activate command, A0-A10defines the row address.
During a read or write command, A
addition to thecolumnaddressA
define the bank to be precharged. A
duringa precharge cycle, If A
if A
is low, the BA is used to decide which bank to precharge. If A10is
10
10
defines the column address. In
0-A7
isused to invoke auto prechargeBA
10
islow, auto precharge is disabled
10
is high, both bank will be precharged ,
high, all banks willbe precharged. BA Bank Select Selectswhich bank to activate.BA low select bankA and high selects
bank B I/O
1
-I/O
16
Data Input/Output Data inputs/output are multiplexed on the same pins UDQM, LDQM Data Input/Output Mask Makes data output Hi-Z. Blocks data input when DQM is active VDD/VSS Power Supply/Ground Power Supply. +3.3V ± 0.3V/ground VDDQ/VSSQ Data Output P ower/Ground Providesisolatedpower/ground to DQs forimprovednoise immunity NC No Connection
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MOSEL VITELIC

Address Input for Mode Set (Mode Register Operation)

V54C316162V
A10
A9
A8 A7 A6 A5
Write Burst Length
Write Burst Length
A9 Length
0Burst 1 Single Bit
CAS Latency
A6 A5 A4 Latency
000 Reserve 001 Reserve 010 2 011 3 101 Reserve 110 Reserve 111 Reserve
Test
Mode
Test Mode
A8 A7 Mode
00
Mode Reg
Set
A3A4 A2 A1 A0
BT Burst LengthCAS Latency
Burst Type
A3 Type
0 Sequential 1 Interleave
Burst Length
A2 A1 A0
000 1 1 001 2 2 010 4 4 011 8 8 1 0 0 Reserve Reserve 1 0 1 Reserve Reserve 1 1 0 Reserve Reserve 1 1 1 Full Page Reserve
Address Bus (Ax)
Mode Register
Length
Sequential Interleave

Power O n and Initialization

The default power on state of the mode register is supplier specific and may be undefined. The following power on and initialization sequence guarantees the device is preconditioned to eac h users specific needs. Like a c onv ent ional DRAM, the Synchronous DRAM must be powered up and initialized in a predefined manner. During power on, all VCC and VCCQ pins m ust be built up simultaneously to the specified vol tage when the input signals are held in the NOPstate. The power on voltage must not ex c eed VCC+0.3V on any of the input pins or VCC supplies. The CLK signal must be s tarted at the same time. After power on, an initial pause of 200 µs is required followed by a precharge of both banks using the precharge command. To prevent data contention on the DQ bus during poweron,it is required that the DQM and CKE pins be held high during the i nitial pause period. Once all bank s have been precharged, the Mode Register S et Command mus t be issued to initialize the Mode Register. A minimum of eight Auto Refresh cycles (CBR) are also required.These may be done before or after prog ramm ing the Mode Register. Failure to follow these st eps may l ead to unpredictable start-up modes.

Programming the Mode Register

The Mode register designates the operation mode at the read or write cycle. Th is register is di­vided into 4 fields. A Burst Length Field to set the length of the burst, an Addressing Selection bit to program the column access sequence in a burst cycle (interleaved or sequential), a CAS Latency Fieldtoset the access time at clockcycle and a Op­eration m ode field to differentiate between normal operation (Burst read and burst Write) and a spec ial Burst Read and Single Write mode. The mode set operation must be done before any activate com­mand after the initial power up. Any content of the mode register can be altered by re-executing the mode set command. All banks must be in pre­charged state and CKE must be high at least one clock before the mode set operation. After the mode register is set, a Standby or NOP command is required. Low signals of RAS positive edge of the clock activate the mode set operation. Address input dat a at this timing defines parameters to bes et as shown in the previous table.
,CAS, and WE at the
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V54C316162V

Read and Write Operation

When RAS is low and both CAS and WE arehigh at the positive edge of the clock, a R AS cycle starts. According to address data, a word line of the select­ed bank is activated and all of sense amplifiers as­sociated to the wordline are set. A CAS triggered by setting RAS
high and CAS low at a clock timing after a necessary de lay, t RAS
timing. W E is used to define either a read
(WE
=H)orawrite(WE= L) at this stage .
SDRAM provides a wide variety of fast access modes. In a single CAS cycle, serial data read or write operations are allowed at up to a 166 MHz data rat e. The numbers of s erial data bits are the burst length programmedatth e mode set operation, i.e., one of 1, 2, 4, 8 and full page. Column address­es are segmented by the burst length and serial data accesses are done within this boundary. The first column address to be accessed is supplied at the CAS timing and the subsequent addresses are generated automatically by the programmed burst length and its sequence. For example, in a burst length of 8 with interleave sequence, if th e first ad­dress is ‘2’, then the rest of the burst sequence is 3, 0, 1, 6, 7, 4, and 5.
Full page burst operation is only possible using the sequential burst type and page le ngth is a func­tion of the I/O organisation and column addressing. Full page burst operation do not s elf terminate once the burst length has been reac hed. In other words, unlike burst length of 2, 4 or 8, full page burst c on­tinues until it is te rminated using another command.
,fromthe
RCD
cycle is
Similar t o the page mode of conventional DRAMs, burst read or write accesses on any col­umn address are possible once the RAS cycle latches the sense amplifiers. The maximum t
RAS
or ther ef res h interval time limits the number ofrandom column access es . A new burst access can be done even before the previous b urst ends. The interrupt operation at every clock cycles is supported. When the previous burst is interrupted, the remaining ad­dresses are overridden by the new address with the full burst length. An interrupt which acc ompanies with an operation change from a read to a write is possible by exploiting DQM to avoid bus contention .
When two or more banks are activated sequentially, interleaved bank read or write operations are possible. With the programmed burst length, alternate access and precharge operations on two or more bank s can realize fas t serial da ta access modes among many different pages. Once two or more bank s are activated, column to column interleave operation can b e done between different pages.

Refresh Mode

SDRAM has two refresh modes, Aut o Refresh and Self Refresh. AutoRefresh is similar to the CAS
-before-RAS refresh of conventional DRAMs. All of banks must be precharged before applying any re­fresh mode. An on-chip address counter increments the word and the bankaddresses and no bank infor­mation is required for both ref res h modes.

Burst Length and Sequence:

Burst
Length
Page
V54C316162V Rev. 2.9 September 2001
Starting Address
(A2 A1 A0)
2 xx0
xx1
4x00
x01 x10 x11
8 000
001 010 011 100 101 110 111
Full
nnn Cn, Cn+1, Cn+2,..... not supported
Sequential Burst Addressing (decimal)
0 1 2 3 4 5 6 7 1 2 3 4 5 6 7 0 2 3 4 5 6 7 0 1 3 4 5 6 7 0 1 2 4 5 6 7 0 1 2 3 5 6 7 0 1 2 3 4 6 7 0 1 2 3 4 5 7 0 1 2 3 4 5 6
0, 1 1, 0
0, 1, 2, 3 1, 2, 3, 0 2, 3, 0, 1 3, 0, 1, 2
Interleave Bur st Addressing (decimal)
0, 1 1, 0
0, 1, 2, 3 1, 0, 3, 2 2, 3, 0, 1 3, 2, 1, 0
0 1 2 3 4 5 6 7 1 0 3 2 5 4 7 6 2 3 0 1 6 7 4 5 3 2 1 0 7 6 5 4 4 5 6 7 0 1 2 3 5 4 7 6 1 0 3 2 6 7 4 5 2 3 0 1 7 6 5 4 3 2 1 0
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MOSEL VITELIC
V54C316162V
The chip enters the Auto Refresh mode, when
RAS
and CAS are held low and CKE and WE are held high at a clock timing. The mode restores word line after the refresh and no external precharge command is nec es s ary. A minimum tRC time is re­quired between t wo automatic refreshes in a burst refresh mode. The same rule applies to any ac cess command after the automatic refres h operation.
The chi p has an on-chip timer and the Self Re­fresh mode is available. It enters the mode when RAS
,CAS, and CKE are low and WE is high at a clock timing. All of external control signals including the clock are disabled. Returning CKE to high en­ables the clock and initiates the refresh ex it opera­tion. After the exit command, at least one t
RC
delay
is required prior to any access command.

DQM Function

DQM has two functions for data I/O read and write operations. During reads, when it turns to highat a clock timing, data outputs are disabled and become high impedance after two clock delay (DQM Data Disable Latency t
). It also provides
DQZ
a data mas k function for writes. When DQM is acti­vated, the write operation atthe ne xt clock is prohib­ited (DQMWriteMaskLatencyt
= zero clocks).
DQW
DQM is used for device selection, byte selection and bus control in a memory system. LDQM c on­trols DQ0 to DQ7, UDQM controls D Q8 to DQ15.

Suspend Mode

Duringnormalaccess mode, CKE isheld high en­abling the clo ck. When CKE is low, it freezes t he in­ternal clock and extends data read and write operations. One clock delay is required for mode entry a nd exit (Clock Suspend Latency t
CSL
).

Power Down

In order to reduce standby power consumption, a power down mode is available. All banks m us t be precharged and the necessary Precharge delay (trp) must occur before the SDRAM can enter the Power Down mode. Once the Power Down mode is initiated by holding CKE low, all of the receiver cir­cuits except CLK and CKE are gated off. The Power Down mode does not perform any refresh opera­tions, therefore the device cant remain in Power Down mode longer than the Refresh period (tref) of the device. E x it from this mode is performed by t ak ­ing CKE high. One clock delay is required for mode entry and exit.

Auto Precharge

Two methods are available to precharge SDRAMs. In an automatic precharge m ode, the CAS timing accepts one extra address, A
, to de-
10
termine whether the chip restores or not after the operation. If A
is high when a Rea d Command is
10
issued, the Read with Auto-Precharge function is initiated. The SDRAM automatically enters the pre­charge operation one clock before th e last data out for CAS If A
latencies2, twoclocksfor CAS latencies 3.
is high when a Write Command is issued, t he
10
Write with Auto-Precharge func tion is initiated. The SDRAM automatically enters the prechargeop­eration a time delay equal to t
(Write recovery
WR
time) after the last data in.

Precharge Command

There is also a s eparate precharge command available. When RAS
and WE are low and CAS is high at a clock timing, it triggers the prec harge op­eration. With A
being low, the BA is used select
10
bank toprecharge. Theprecharge command can be imposed one clock before the last da ta out for CAS latency = 2, two clock s before the last data out for CAS latency = 3. Writes require a time delay twr from the last data out to apply the precharge c om­mand. If A
is high , all banks will be precharged.
10

Burst Termination

Once a burst read or write operation has been ini­tiated, there are several methods in which to termi­nate the burst operation prematurely. These methods include using another Read or Write Com­mand to interrupt an existing burst operation, use a Precharge Command to interrupt a burst cycle and close the act ive bank, or using the Burst Stop Com­mand to terminate the existing burst operation but leave the bank open for future Read or Write Com­mands to the same page of the active bank. When interrupting a burst with another Read or Write Command care must be taken to avoid I/O conten­tion. The Burst Stop Command, however, has the fewest restrictions making it the easiest method to use when terminating a burstoperation before ithas been completed. Ifa Burst Stop command is issued during a burst write operation, then any residual data from t he burst write cycle will be ignored . Data that is presented on the I/O pins before the Burst Stop Command is registered will be writte n to the memory.
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