Eon Turn-on switching energy per pulse VCC=1000 V, IC=IE=500 A, - 267.8 -
E
Turn-off switching energy per pulse VGE=±15 V, RG=3.0 Ω, - 138.5 -
off
(Note.1)
E
rr
Reverse recovery energy per pulse Tj=125 °C, Inductive load - 98.1 -
rg Internal gate resistance TC=25 °C - 1.0 - Ω
RG External gate resistance - 3.0 - 10 Ω
Limits
Unit
V
nF
ns
mJ
THERMAL RESISTANCE CHARACTERISTICS
Symbol Item Conditions
R
Junction to case, IGBT part - - 25 K/kW
th(j-c)Q
R
th(j-c)D
R
th(c-s)
Thermal resistance
Contact thermal resistance
(Note.2)
(Note.2)
Junction to case, FWDi part - - 42 K/kW
Case to heat sink,
Thermal grease applied
(Note.7)
Min. Typ. Max.
- 20 - K/kW
Limits
2
Unit
July-2010
MITSUBISHI IGBT MODULES
CM500HA-34A
HIGH POWER SWITCHING USE
Note.1: Represent ratings and characteristics of the anti-parallel, emitter-collector free wheeling diode (FWDi).
Note.2: Case temperature (T
just under the chips. (Refer to the figure of chip location)
The heat sink thermal resistance {R
Note.3: Pulse width and repetition rate should be such that the device junction temperature (T
Note.4: Junction temperature (T
Note.5: Base plate flatness measurement point is as in the following figure.
+: Convex
-: Concave
Bottom
Bottom
Note.6: Pulse width and repetition rate should be such as to cause negligible temperature rise.
(Refer to the figure of test circuit)
Note.7: Typical value is measured by using thermally conductive grease of λ=0.9 W/(m·K).
CHIP LOCATION (Top view)
) and heat sink temperature (Ts) are defined on the each surface of base plate and heat sink
C
} should measure just under the chips.
th(s-a)
) should not increase beyond T
j
Bottom
X
Y
-: Concave
+: Convex
jmax
rating.
) dose not exceed T
j
Dimension in mm, tolerance: ±1 mm
INSULATED TYPE
rating.
jmax
Tr1: IGBT, Di1: FWDi. Each mark points the center position of each chip.
3
July-2010
MITSUBISHI IGBT MODULES
TEST CIRCUIT AND WAVEFORMS
C
VGE=15 V
G
V
Es
E
test circuit
V
CEsat
VCC
iE
Load
vCE
iC
+
i
C
-VGE
R
+V
0 V
-V
G
GE
vGE
GE
Switching characteristics test circuit and waveforms t
I
vCE
CM
CM500HA-34A
HIGH POWER SWITCHING USE
INSULATED TYPE
C
short-
I
C
circuited
V
G
Es
I
E
E
VEC test circuit
v
GE
0 V
〜
〜
90 %
i
0
E
t
=0.5×Irr×t
Q
rr
rr
t
rr
IE
V
CC
i
0 A
t
d(on)
C
〜
〜
90 %
10 %
t
r
t
d(off )
t
f
0 A
Irr
t
, Qrr test waveform
rr
0.5×I
i
i
C
V
CC
ICM
v
CE
E
0 A
IEM
v
EC
t
rr
V
CC
t
0.1×I
0
CM
0.1×VCC
t
ti
IGBT Turn-on switching energy IGBT Turn-off switching energy FWDi Reverse recovery energy
0.1×V
CC
t
i
0.02×I
CM
t0
t0 V
ti
Turn-on, Turn-off switching and Reverse recovery energy test waveforms (integral range)
4
July-2010
MITSUBISHI IGBT MODULES
CM500HA-34A
HIGH POWER SWITCHING USE
INSULATED TYPE
PERFORMANCE CURVES
OUTPUT CHARACTERISTICS
(TYPICAL)
=25 °C
T
1000
(A)
C
COLLECTOR CURRENT I
j
VGE=20 V
15 V
800
600
400
200
0
0246810
13 V
COLLECTOR-EMITTER VOLTAGE V
12 V
CE
11 V
10 V
9 V
8V
(V)
(V)
CEsat
COLLECTOR-EMITTER
SATURATION VOLTAGE V
COLLECTOR-EMITTER SATURATION
VOLTAGE CHARACTERISTICS
(TYPICAL)
VGE=15 V
4
Tj=125 °C
3
2
1
0
02004006008001000
Tj=25 °C
COLLECTOR CURRENT IC (A)
COLLECTOR-EMITTER SATURATION
VOLTAGE CHARACTERISTICS
=25 °C
T
10
j
(TYPICAL)
1000
FREE WHEELING DIODE
FORWARD CHARACTERISTICS
(TYPICAL)
G-E short-circuited
8
(V)
CEsat
6
4
COLLECTOR-EMITTER
2
SATURATION VOLTAGE V
0
5 101520
GATE-EMITTER VOLTAGE V
Tj=125 °C
IC=1000 A
IC=500 A
(A)
E
Tj=25 °C
IC=200 A
100
EMITTER CURRENT I
10
(V)
GE
5
0.51.52.53.5
EMITTER-COLLECTOR VOLTAGE VEC (V)
July-2010
MITSUBISHI IGBT MODULES
V
10000
1000
100
SWITCHING TIME (ns)
SWITCHING CHARACTERISTICS
=1000 V, VGE=±15 V, RG=3.0 Ω, Tj=125 °C
CC
HALF-BRIDGE
(TYPICAL)
INDUCTIVE LOAD
t
d(off)
tf
t
d(on)
tr
SWITCHING CHARACTERISTICS
V
=1000 V, IC=500 A, VGE=±15 V, Tj=125 °C
CC
10000
1000
SWITCHING TIME (ns)
CM500HA-34A
HIGH POWER SWITCHING USE
INSULATED TYPE
HALF-BRIDGE
(TYPICAL)
INDUCTIVE LOAD
t
d(off)
t
d(on)
tf
tr
10
101001000
COLLECTOR CURRENT I
(A)
C
100
110
EXTERNAL GATE RESISTANCE RG (Ω)
SWITCHING ENERGY (mJ)
REVERSE RECOVERY ENERGY (mJ)
SWITCHING CHARACTERISTICS
HALF-BRIDGE
(TYPICAL)
=1000 V, VGE=±15 V, RG=3.0 Ω, Tj=125 °C
V
CC
INDUCTIVE LOAD, PER PULSE
1000
100
E
off
SWITCHING CHARACTERISTICS
VCC=1000 V, IC/IE=500 A, VGE=±15 V, Tj=125 °C
INDUCTIVE LOAD, PER PULSE
1000
E
on
E
rr
100
SWITCHING ENERGY (mJ)
REVERSE RECOVERY ENERGY (mJ)
HALF-BRIDGE
(TYPICAL)
Eon
E
off
Err
10
101001000
COLLECTOR CURRENT I
EMITTER CURRENT I
(A)
E
(A)
C
6
10
110
EXTERNAL GATE RESISTANCE R
G
(Ω)
July-2010
MITSUBISHI IGBT MODULES
G-E short-circuited, T
CAPACITANCE (nF)
CAPACITANCE CHARACTERISTICS
(TYPICAL)
1000
100
10
1
CM500HA-34A
HIGH POWER SWITCHING USE
INSULATED TYPE
GATE CHARGE CHARACTERISTICS
(TYPICAL)
=25 °C IC=500 A, Tj=25 °C
j
C
ies
C
oes
C
res
(V)
GE
20
VCC=800 V
15
10
5
GATE-EMITTER VOLTAGE V
VCC=1000 V
0.1
0.1110100
0
010002000300040005000
COLLECTOR-EMITTER VOLTAGE VCE (V) GATE CHARGE QG (nC)
REVERSE RECOVERY CHARACTERISTICS
FREE WHEELING DIODE
(TYPICAL)
=1000 V, VGE=±15 V, RG=3.0 Ω, Tj=125 °C
V
CC
INDUCTIVE LOAD
1000
trr
(A)
rr
100
(ns), I
rr
t
Irr
Single pulse, T
th(j-c)
0.01
TRANSIENT THERMAL IMPEDANCE
CHARACTERISTICS
(MAXIMUM)
C
1
0.1
=25°C
0.001
10
101001000
EMITTER CURRENT I
(A)
E
7
0.000010.00010.0010.010.1110
NORMALIZED TRANSIENT THERMAL IMPEDANCE Z
R
th(j-c)Q
=25 K/kW, R
TIME (S)
th(j-c)D
=42 K/kW
July-2010
MITSUBISHI IGBT MODULES
CM500HA-34A
HIGH POWER SWITCHING USE
INSULATED TYPE
Keep safety first in your circuit designs!
·Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is
always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property
damage.
Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of
substitutive, auxiliary circuits, (ii) use of non-flammable material or (iii) prevention against any malfunction or mishap.
Notes regarding these materials
·These materials are intended as a reference to assist our customers in the selection of the Mitsubishi semiconductor product best
suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging
to Mitsubishi Electric Corporation or a third party.
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due to product improvements or other reasons. It is therefore recommended that customers contact Mitsubishi Electric Corporation or
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The information described here may contain technical inaccuracies or typographical errors. Mitsubishi Electric Corporation assumes no
responsibility for any damage, liability, or other loss rising from these inaccuracies or errors.
Please also pay attention to information published by Mitsubishi Electric Corporation by various means, including the Mitsubishi
Semiconductor home page (http://www.mitsubishichips.com/Global/index.html).
·When using any or all of the information contained in these materials, including product data, diagrams, charts, programs, and
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the information contained herein.
·Mitsubishi Electric Corporation semiconductors are not designed or manufactured for use in a device or system that is used under
circumstances in which human life is potentially at stake. Please contact Mitsubishi Electric Corporation or an authorized Mitsubishi
Semiconductor product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus
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Any diversion or reexport contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited.
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materials or the products contained therein.
8
July-2010
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